This Power MOSFET is the latest dev elo pment of
STMicroelectronis unique "Single Feature Size™"
strip-based process. The resulting transistor
shows extremely high packing density for low onresistance, rugged avalanche characteristics and
less critical alignment steps therefore a remarkable manufacturing reproducibility.
APPLICATIONS
■ HIGH CURRENT, HIGH SWITCHING SPEED
■ MOTOR CONTROL, AUDIO AMPLIFIERS
■ DC-DC & DC-AC CONVERTERS
■ SOLENOID AND RELAY DRIVERS
3
1
D2PAK
TO-263
(Suffix “T4”)
INTERNAL SCHEMATIC DIAGRAM
ABSOLUTE MAXIMUM RATINGS
SymbolParameterValueUnit
V
DS
V
DGR
V
GS
∗
I
(
D
I
D
(
I
DM
P
tot
E
AS
T
stg
T
j
(
Pulse width limited by safe operating area.
•)
(*) Curren t Lim i ted by Pack age
May 2002
This is preliminary information on a new product now in development or undergoing evaluation. Details are subject to change without notice.
Drain-source Voltage (VGS = 0)
Drain-gate Voltage (RGS = 20 kΩ)
30V
30V
Gate- source Voltage± 15V
Drain Current (continuous) at T
)
Drain Current (continuous) at TC = 100°C
•)
Drain Current (pulsed)640A
Total Dissipation at TC = 25°C
= 25°C
C
160A
160A
300W
Derating Factor2W/°C
(1)
Single Pulse Avalanche Energy1.2J
Storage Temperature
Max. Operating Junction Temperature
(1) Starting Tj = 25 oC, ID = 80A, VDD = 20V
-55 to 175°C
1/7
Page 2
STB160NF3LL
THERMA L D ATA
Rthj-case
Rthj-amb
T
l
Thermal Resistance Junction-case
Thermal Resistance Junction-ambient
Maximum Lead Temperature For Soldering Purpose
Max
Max
0.5
62.5
300
°C/W
°C/W
°C
ELECTRICAL CHARACTERISTICS (T
= 25 °C unless otherwise specified)
case
OFF
SymbolParameterTest ConditionsMin.Typ.Max.Unit
= 250 µA VGS = 0
V
(BR)DSS
Drain-source
I
D
30V
Breakdown Voltage
= Max Rating
V
DS
= Max Rating TC = 125°C
V
DS
= ± 15 V
V
GS
1
10
±100nA
ON
(*)
I
DSS
I
GSS
Zero Gate Voltage
Drain Current (V
GS
Gate-body Leakage
Current (V
DS
= 0)
= 0)
SymbolParameterTest ConditionsMin.Typ.Max.Unit
V
V
GS(th)
R
DS(on)
Gate Threshold Voltage
Static Drain-source On
Resistance
= V
DS
GS
= 10 V ID = 80 A
V
GS
= 4.5 V ID = 80 A
V
GS
ID = 250 µA
1V
0.0026
0.0032
0.0030
0.0043
DYNAMIC
SymbolParameterTest ConditionsMin.Typ.Max.Unit
(*)
g
fs
C
iss
C
oss
C
rss
Forward Transconductance
Input Capacitance
Output Capacitance
Reverse Transfer
Capacitance
V
= 15 VID =80 A
DS
= 25V f = 1 MHz VGS = 0
V
DS
60S
6200
1720
300
µA
µA
Ω
Ω
pF
pF
pF
2/7
Page 3
STB160NF3LL
ELECTRICAL CHARACTERISTICS (continued)
SWITCHING ON
SymbolParameterTest ConditionsMin.Typ.Max.Unit
t
d(on)
t
r
Q
g
Q
gs
Q
gd
(*)
Turn-on Time
Rise Time
Total Gate Charge
Gate-Source Charge
Gate-Drain Charge
= 15 VID = 80 A
V
DD
= 4.7
R
Ω
G
VGS = 4.5 V
(Resistive Load, Figure 3)
=24V ID=160A VGS=5V
V
DD
50
350
95
25
45
125nC
ns
ns
nC
nC
SWITCHING OFF
(*)
SymbolParameterTest ConditionsMin.Typ.Max.Unit
t
d(off)
t
f
Turn-off Delay Time
Fall Time
SOURCE DRAIN DIODE
(*)
V
DD
= 4.7Ω, V
R
G
GS
(Resistive Load, Figure 3)
= 4.5 V
150
120
= 15 V ID = 80 A
SymbolParameterTest ConditionsMin.Typ.Max.Unit
I
SD
I
SDM
V
SD
t
rr
Q
rr
I
RRM
(*)
Pulsed: P ul se duration = 300 µs, duty cycle 1.5 %.
(
•)
Pulse width limited by T
Source-drain Current
(
•)
Source-drain Current (pulsed)
(*)
Forward On Voltage
Reverse Recovery Time
Reverse Recovery Charge
Reverse Recovery Current
jmax
I
= 160 A VGS = 0
SD
I
= 160 Adi/dt = 100A/µs
SD
= 15 VTj = 150°C
V
DD
(see test circuit, Figure 5)
160
640
1.3V
90
200
5
ns
ns
A
A
ns
nC
A
3/7
Page 4
STB160NF3LL
Fig. 1: Unclamped Inductive Load Test CircuitFig. 1: Unclamped Inductive Load Test CircuitFig. 2: Unclamped Inductive Waveform
Fig. 3: Switching Times Test Circuits For Resistive
Load
Fig. 5: Test Circuit For Inductive Load Switching
And Diode Recovery Times
Information furnished is believed to be accurate and reliable. However, STMicroelectronics assumes no responsibility for the consequences
of use of such information nor for any infringement of patents or other rights of third parties which may result from its use. No license is granted
by implic ation or otherwise under any patent or p atent rights of STMi croelectr oni cs. Spec i fications mentioned i n this publicatio n are subject
to change without notice. This publication supersedes and replaces all information previously supplied. STMicroelectronics products are not
authorized for use as cri tical comp onents in life support dev i ces or systems wi t hout expres s written approval of STMi croelectr o nics.
The ST logo is registered trademark of STMicroelectronics
2002 STMi croelectr onics - All Rights Rese rved
All other na m es are the prop erty of their respectiv e owners.
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http:// www.st.com
7/7
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