Datasheet STB160NF03L Datasheet (SGS Thomson Microelectronics)

Page 1
STB160NF03L
N-CHANNEL 30V - 0.0021- 160A D2 PAK
STripFET™ POWER MOSFET
TYPE V
DSS
STB160NF03L 30 V < 0.0030
TYPICAL R
LOW THRESHOLD DRIVE
ULTRA LOW ON-RESISTANCE
VERY LOW GATE CHARGE
100% AVALANCHE TESTED
(on) = 0.0021
DS
R
DS(on)
I
D
160 A
DESCRIPTION
This Power MOSFET is the latest dev elo pment of
STMicroelectronics unique “Single Feature
™” strip-based process. The re sulting tran-
Size
sistor shows extremely high packing density with ultra low on-resistance, superior switching charac­teristics and less critical alignment steps therefore a remarkable manufacturing reproducibility. This device is particularly suitable for high current, low voltage switching application where efficiency is crucial.
APPLICATIONS
BUCK CONVERTERS IN HIGH
PERFORMANCE TELECOM AND VRMs
DC-DC CONVERTERS
3
1
D2PAK
(TO-263)
INTERNAL SCHEMATIC DIAGRAM
ABSOLUTE MAXIMUM RATINGS
Symbol Parameter Value Unit
V
DS
V
DGR
V
GS
I
(1) Drain Current (continuos) at TC = 25°C
D
I
D
I
DM
P
TOT
E
AS
T
stg
T
j
() Pulse width limited by safe operating area
Drain-source Voltage (VGS = 0) Drain-gate Voltage (RGS = 20 kΩ)
30 V 30 V
Gate- source Voltage ±15 V
160 A
Drain Current (continuos) at TC = 100°C
(●)
Drain Current (pulsed) 640 A Total Dissipation at TC = 25°C
113 A
300 W
Derating Factor 2 W/°C
(2)
Single Pulse Avalanche Energy 2 J Storage Temperature –65 to 175 °C Max. Operating Junction Temperature 175 °C
(1) Limited by Package
≤100A, di/dt ≤300A/µs, VDD ≤ V
(2) I
SD
(BR)DSS
, Tj ≤ T
JMAX.
1/9February 2001
Page 2
STB160NF03L
THERMA L D ATA
Rthj-case Thermal Resistance Junction-case Max 0.5 °C/W
Rthj-amb Thermal Resistance Junction-ambient Max 62.5 °C/W
T
l
ELECTRICAL CHARACTERISTICS (TCASE = 25 °C UNLESS OTHERWISE SPECIFIED) OFF
Symbol Parameter Test Conditions Min. Typ. Max. Unit
V
(BR)DSS
I
DSS
I
GSS
ON
(1)
Symbol Parameter Test Conditions Min. Typ. Max. Unit
V
GS(th)
R
DS(on)
I
D(on)
Maximum Lead Temperature For Soldering Purpose 300 °C
Drain-source
ID = 250 µA, VGS = 0 30 V
Breakdown Voltage Zero Gate Voltage
Drain Current (V
GS
= 0)
Gate-body Leakage Current (V
DS
= 0)
Gate Threshold Voltage Static Drain-source On
Resistance On State Drain Current VDS > I
V
= Max Rating
DS
V
= Max Rating, TC = 125 °C
DS
V
= ±15V ±100 nA
GS
V
= VGS, ID = 250µA
DS
VGS = 10 V, ID = 80 A VGS = 5 V, ID = 80 A
x R
D(on)
DS(on)max,
1V
0.0021 0.0030
0.0042 0.0070
160 A
A
10 µA
VGS=10V
Ω Ω
DYNAMIC
Symbol Parameter Test Conditions Min. Typ. Max. Unit
(1) Forward Transconductance VDS > I
g
fs
C
iss
C
oss
C
rss
Input Capacitance Output Capacitance 1720 pF Reverse Transfer
Capacitance
ID=80 A
V
DS
D(on)
x R
DS(on)max,
= 25V, f = 1 MHz, VGS = 0
210 S
5600 pF
310 pF
2/9
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STB160NF03L
ELECTRICAL CHARACTERISTICS (CONTINUED)
SWITCHING ON
Symbol Parameter Test Conditions Min. Typ. Max. Unit
V
t
d(on)
Q Q Q
t
r
g gs gd
Turn-on Delay Time Rise Time 285 ns Total Gate Charge
Gate-Source Charge Gate-Drain Charge
SWITCHING OFF
Symbol Parameter Test Conditions Min. Typ. Max. Unit
t
d(off)
t
d(off)
t
f
t
f
t
c
Turn-off-Delay Time Fall Time
Off-voltage Rise Time Fall Time Cross-over Time
SOURCE DRAIN DIODE
Symbol Parameter Test Conditions Min. Typ. Max. Unit
I
SD
I
SDM
VSD (2)
t
rr
Q
rr
I
RRM
Note: 1. Pulsed: Pu l se duration = 300 µs, duty cyc l e 1.5 %.
2. Pulse width li mited by safe o perating area .
Source-drain Current 160 A
(1)
Source-drain Current (pulsed) 640 A Forward On Voltage Reverse Recovery Time
Reverse Recovery Charge Reverse Recovery Current
= 15V, ID = 80A
DD
RG= 4.7Ω VGS = 10V (see test circuit, Figure 3)
= 24V, ID = 160A,
V
DD
VGS = 10V
VDD = 15V, ID = 80A, RG=4.7Ω, V
GS
= 10V
(see test circuit, Figure 5)
GS
=40A
D
= 10V
Vclamp =24V, I RG=4.7Ω, V
ISD = 160A, VGS = 0
= 80A, di/dt = 100A/µs,
I
SD
VDD = 15V, Tj = 25°C (see test circuit, Figure 5)
28 ns
123
21 40
110
65
110
35 70
1.3 V
80
180
4.5
nC nC nC
ns ns
ns ns ns
ns
nC
A
Safe Operating Area
Ther m al Imp e d ance
3/9
Page 4
STB160NF03L
Output Characteristics
Tranconductance
Tranfer Characteristics
Static Drain-Source On Resistance
4/9
Capacitance VariationsGate Charge vs Gate-source Voltage
Page 5
STB160NF03L
Normalized Gate Thereshold Voltage vs Temp.
Source-drain Diode Forward Characteristics
Normalized On Resistance vs Temperatur e
5/9
Page 6
STB160NF03L
Fig. 2: Unclamped Inductive WaveformFig. 1: Unclamped Inductive Load Test Circuit
Fig. 3: Switching Times Test Circuit For
Resistive Load
Fig. 5: Test Circuit For Inductive Load Switching And Diode Recovery Times
Fig. 4: Gate Charge test Circuit
6/9
Page 7
2
D
PAK MECHANICAL DATA
STB160NF03L
DIM.
MIN. TYP MAX. MIN. TYP. MAX.
A 4.4 4.6 0.173 0.181 A1 2.49 2.69 0.098 0.106 A2 0.03 0.23 0.001 0.009
B 0.7 0.93 0.027 0.036 B2 1.14 1.7 0.044 0.067
C 0.45 0.6 0.017 0.023 C2 1.23 1.36 0.048 0.053
D 8.95 9.35 0.352 0.368 D1 8 0.315
E 10 10.4 0.393 E1 8.5 0.334
G 4.88 5.28 0.192 0.208
L 15 15.85 0.590 0.625 L2 1.27 1.4 0.050 0.055 L3 1.4 1.75 0.055 0.068
mm. inch
M 2.4 3.2 0.094 0.126 R 0.4 0.015
V2 0º8º
3
7/9
1
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STB160NF03L
D2PAK FOOTPRINT
TAPE AND REEL SHIPMENT (suffix ”T4”)*
TUBE SHIPMENT (no suffix)*
REEL MECHANICAL DATA
DIM.
A 330 12.992 B 1.5 0.059 C 12.8 13.2 0.504 0.520
D 20.2 0795 G 24.4 26.4 0.960 1.039 N 100 3.937
T 30.4 1.197
mm inch
MIN. MAX. MIN. MAX.
TAPE MECHANICAL DATA
DIM.
A0 10.5 10.7 0.413 0.421 B0 15.7 15.9 0.618 0.626
D 1.5 1.6 0.059 0.063
D1 1.59 1.61 0.062 0.063
E 1.65 1.85 0.065 0.073
F 11.4 11.6 0.449 0.456 K0 4.8 5.0 0.189 0.197 P0 3.9 4.1 0.153 0.161 P1 11.9 12.1 0.468 0.476 P2 1.9 2.1 0.075 0.082
R 50 1.574
T 0.25 0.35 0.0098 0.0137
W 23.7 24.3 0.933 0.956
* on sales type
8/9
mm inch
MIN. MAX. MIN. MAX.
BASE QTY BULK QTY
1000 1000
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STB160NF03L
Information furnished is believed to be accurate and reliable. However, STMicroelectronics assumes no responsibility for the consequences of use of such informa tion n or for an y infring ement of patent s or other rig hts of third part ies which may resu lt from its use . No l i cen se i s granted by implication or otherwise under any patent or patent rights of STMicroelectronics. Specification mentioned in this publication are subject to change without notice. This publication supersedes and replaces all information previously supplied. STMicroelectronics products are not authorized for use as critical compo nents in life support devices or systems without express written approval of STMicroelectronics.
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