This MOSFET is the result o f STMicroelectronic s’s well
established and consolidated STripFET technology utilizing the most recent layout optimization. The device exhibits extremely low on-resis tance, gate char ge and diode’s
INTERNAL SCHEMATIC DIAGRAM
reverse recovery c harge Qrr ma king it t he idea l switc h in
a very large spectrum of applications such as Automotive,
Consumer, Telecom and Industrial.
APPLICATIONS
■ PRIMARY SWITCH IN TELECOM DC-DC
CONVERTER
■ HIGH-EFFICIENCY DC-DC CONVERTERS
■ 42V AUTOMOTIVE APPLICATIONS
■ SYNCHRONOUS RECTIFICATION
■ DIESEL INJECTION
■ PWM UPS AND MOTOR CONTROL
ABSOLUTE MAXIMUM RATINGS
SymbolParameterValueUnit
V
DS
V
DGR
V
GS
(*)
I
D
I
D
(1)
I
DM
P
tot
dv/dt
E
AS
T
stg
T
(1)
(*)
j
Pulse w i dt h l i mited by safe operating area.
Value limited by wi re bonding
July 2003
This is preliminary information on a new product forseen to be developped. Details are subject to change without notice
Drain-source Voltage (VGS = 0)
Drain-gate Voltage (RGS = 20 kΩ)
100V
100V
Gate- source Voltage± 20V
Drain Current (continuous) at TC = 25°C
Drain Current (continuous) at TC = 100°C
135A
96A
Drain Current (pulsed)540A
Total Dissipation at TC = 25°C
150W
Derating Factor1W/°C
(2)
Peak Diode Recovery voltage slopeTBDV/ns
(3)
Single Pulse Avalanche EnergyTBDmJ
Storage Temperature
Operating Junction Temperature
≤ 40A, di/dt ≤ 600A/µs , VDD ≤B
(2) I
SD
(3) Starting Tj = 25 oC, ID = 40A, VDD = 50V
-55 to 175°C
VDSS
, Tj ≤ T
JMAX.
3
2
1
1/8
Page 2
STB135N10 STP135N10
THERMA L D ATA
Rthj-case
Rthj-amb
T
Thermal Resistance Junction-case
Thermal Resistance Junction-ambient
Maximum Lead Temperature For Soldering Purpose
l
Max
Max
1
62.5
300
°C/W
°C/W
°C
ELECTRICAL CHARACTERISTICS (T
= 25 °C UNLESS OTHERWISE SPECIFIED)
CASE
OFF
SymbolParameterTest ConditionsMin.Typ.Max.Unit
= 250 µA, VGS = 0
V
(BR)DSS
Drain-source
I
D
100V
Breakdown Voltage
= Max Rating
V
DS
V
= Max Rating TC = 125°C
DS
V
= ± 20V
GS
1
10
±100nA
ON
(5)
I
DSS
I
GSS
Zero Gate Voltage
Drain Current (V
GS
Gate-body Leakage
Current (V
DS
= 0)
= 0)
SymbolParameterTest ConditionsMin.Typ.Max.Unit
V
GS(th)
R
DS(on)
Gate Threshold Voltage
Static Drain-source On
= VGS I
DS
V
= 10 V ID = 67.5 A
GS
= 250 µA
D
24V
0.0070.009
V
Resistance
DYNAMIC
SymbolParameterTest ConditionsMin.Typ.Max.Unit
(5)
g
fs
C
iss
C
oss
C
rss
Forward Transconductance
Input Capacitance
Output Capacitance
Reverse Transfer
Capacitance
V
25 V
DS =
V
DS
ID
= 25V f = 1 MHz VGS = 0
= 67.5 A
TBDS
6350
890
250
µA
µA
Ω
pF
pF
pF
2/8
Page 3
STB135N10 STP135N10
ELECTRICAL CHARACTERISTICS (continued)
SWITCHING ON
SymbolParameterTest ConditionsMin.Typ.Max.Unit
= 50 V ID = 67.5 A
t
d(on)
Turn-on Delay Time
t
r
Rise Time
V
DD
R
= 4.7 Ω VGS = 10 V
G
(Resistive Load, Figure 3)
Q
Q
gs
Q
gd
Total Gate Charge
g
Gate-Source Charge
Gate-Drain Charge
= 50 V ID= 135 A VGS= 5 V
V
DD
SWITCHING OFF
SymbolParameterTest ConditionsMin.Typ.Max.Unit
= 50 VID = 67.5 A
t
d(off)
Turn-off Delay Time
t
f
Fall Time
V
DD
R
= 4.7Ω, V
G
GS
= 10 V
(Resistive Load, Figure 3)
SOURCE DRAIN DIODE
SymbolParameterTest ConditionsMin.Typ.Max.Unit
I
SD
I
SDM
V
SD
t
rr
Q
rr
I
RRM
(1 )
Pulse width limited by safe operating area.
(5)
Pulsed: P ul se duration = 300 µs, duty cycle 1.5 %.
Source-drain Current
(1)
Source-drain Current (pulsed)
(5)
Forward On Voltage
Reverse Recovery Time
Reverse Recovery Charge
Reverse Recovery Current
I
= 135 A VGS = 0
SD
= 135 Adi/dt = 100A/µs
I
SD
V
= 25 VTj = 150°C
DD
(see test circuit, Figure 5)
TBD
TBD
TBD
TBD
TBD
TBD
TBD
TBD
TBD
TBD
95nC
135
540
1.3V
ns
ns
nC
nC
ns
ns
A
A
ns
µ
A
C
3/8
Page 4
STB135N10 STP135N10
Fig. 1: Unclamped Inductive Load Test CircuitFig. 1: Unclamped Inductive Load Test CircuitFig. 2: Unclamped Inductive Waveform
Fig. 3: Switching Times Test Circuits For Resistive
Load
Fig. 5: Test Circuit For Inductive Load Switching
And Diode Recovery Times
Information furnished is believed to be accurate and reliable. However, STMicroelectronics assumes no responsibility for the consequences
of use of such information nor for any infringement of patents or other rights of third parties which may result from its use. No license is granted
by implic ation or otherwise under any patent or p atent rights of STMi croelectr oni cs. Spec i fications mentioned i n this publicatio n are subject
to change without notice. This publication supersedes and replaces all information previously supplied. STMicroelectronics products are not
authorized for use as cri tical comp onents in life support dev i ces or systems wi t hout expres s written approval of STMi croelectr o nics.
The ST logo is registered trademark of STMicroelectronics
2003 STMi croelectr onics - All Rights Rese rved
All other na m es are the prop erty of their respectiv e owners.
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Singap ore - Spain - Sw eden - Switze rl and - United Kingdom - U n i t ed States.
STMicroelectronics GROUP OF COMPANIES
http:// www.st.com
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