The SPT7922 A/D converter is the industry's first 12-bit
monolithic analog-to-digital converter capable of sample
rates of greater than 30 MSPS. On board input buffer and
track/hold function assures excellent dynamic performance without the need for external components. Drive
requirement problems are minimized with an input capacitance of only 5 pF.
Logic inputs and outputs are TTL. An overrange output
signal is provided to indicate overflow conditions. Output
APPLICATIONS
• Radar Receivers
• Professional Video
• Instrumentation
• Medical Imaging
• Electronic Warfare
• Digital Communications
• Digital Spectrum Analyzers
• Electro-Optics
data format is straight binary. Power dissipation is very low
at only 1.1 watts with power supply voltages of +5.0 and
-5.2 volts. The SPT7922 also provides a wide input voltage
range of ±2.0 volts.
The SPT7922 is available in 32-lead ceramic sidebrazed
DIP and 44-lead cerquad packages over the commercial
temperature range. Consult the factory for availability of
die, military temperature and /883 versions.
BLOCK DIAGRAM
V
IN
Input
Buffer
Analog Gain
Compression
Processor
Signal Processing Technologies, Inc.
4-Bit Flash
Converter
Track-and-Hold
Amplifiers
Asynchronous
SAR
4
8
4755 Forge Road, Colorado Springs, Colorado 80907, USA
Phone: (719) 528-2300 FAX: (719) 528-2370
Error
Correction,
Decoding
and
Output TTL
Drivers
Digital
Output
12
Page 2
ABSOLUTE MAXIMUM RATINGS (Beyond which damage may occur)1 25 °C
Supply Voltages
VCC...........................................................................+6 V
Output
Digital Outputs .............................................. 0 to -30 mA
VEE........................................................................... -6 V
Temperature
Input Voltages
Analog Input .............................................. VFB≤VIN≤V
VFT, VFB. ...................................................+3.0 V, -3.0 V
Reference Ladder Current....................................... 12 m
CLK IN ...................................................................... V
FT
CC
Operating Temperature .................................0 to +70 °C
Junction Temperature.........................................+175 °C
Lead Temperature, (soldering 10 seconds) .......+300 °C
Storage Temperature ...............................-65 to +150 °C
Note:1. Operation at any Absolute Maximum Rating is not implied. See Electrical Specifications for proper nominal
applied conditions in typical applications.
ELECTRICAL SPECIFICATIONS
TA=T
unless otherwise specified.
PARAMETERSCONDITIONSLEVELMINTYPMAXUNITS
Resolution12Bits
DC AccuracyT
Analog Inputf
Reference Inputf
Timing Characteristics
Dynamic Performance
to T
MIN
Integral Nonlinearity± Full ScaleV±2.0LSB
Differential Nonlinearity100 kHz Sample RateV±0.8LSB
No Missing CodesVIGuaranteed
Input Voltage RangeVI±2.0V
Input Bias CurrentTA=+25 °CI3060µA
Input ResistanceT
Input CapacitanceV5pF
Input Bandwidth3 dB Small SignalV120MHz
+FS ErrorV±5.0LSB
Power DissipationVI1.11.3W
Power Supply Rejection 5 V ±0.25 V, -5.2 ±0.25 VV1.0LSB
Typical thermal impedances (unsoldered, in free air):
32L sidebrazed DIP:
θ
= +50 °C/W
ja
44L cerquad:
= +78 °C/W
θ
ja
θ
at 1 M/s airflow = +58 °C/W
ja
= +3.3 °C/W
θ
jc
1
fIN = 1 MHz.
2
fIN = 3.58 and 4.35 MHz.
SPT
SPT7922
33/10/97
Page 4
TEST LEVEL CODES
TEST LEVEL
TEST PROCEDURE
All electrical characteristics are subject to the
following conditions:
All parameters having min/max specifications
are guaranteed. The Test Level column indicates the specific device testing actually performed during production and Quality Assurance inspection. Any blank section in the data
column indicates that the specification is not
tested at the specified condition.
Figure 1A: Timing Diagram
N
tt
pwHpwL
III
IV
V
VI
I
II
100% production tested at the specified temperature.
100% production tested at TA = +25 °C, and sample
tested at the specified temperatures.
QA sample tested only at the specified temperatures.
Parameter is guaranteed (but not tested) by design
and characterization data.
Parameter is a typical value for information purposes
only.
100% production tested at TA = +25 °C. Parameter is
guaranteed over specified temperature range.
N+1
N+2
CLK
OUTPUT
DATA
Figure 1B: Single Event Clock
CLK
OUTPUT
DATA
Table I - Timing Parameters
PARAMETERSDESCRIPTIONMINTYPMAXUNITS
t
d
t
pwH
t
d
N-2N-1
t
d
DATA VALID
N
DATA VALID
DATA VALID
N+1
CLK to Data Valid Prop Delay-1418ns
CLK High Pulse Width15-300ns
SPT
t
pwL
CLK Low Pulse Width15--ns
SPT7922
43/10/97
Page 5
SPECIFICATION DEFINITIONS
APERTURE DELAY
Aperture delay represents the point in time, relative to the
rising edge of the CLOCK input, that the analog input is
sampled.
APERTURE JITTER
The variations in aperture delay for successive samples.
DIFFERENTIAL GAIN (DG)
A signal consisting of a sine wave superimposed on various
DC levels is applied to the input. Differential gain is the
maximum variation in the sampled sine wave amplitudes at
these DC levels.
DIFFERENTIAL PHASE (DP)
A signal consisting of a sine wave superimposed on various
DC levels that is applied to the input. Differential phase is the
maximum variation in the sampled sine wave phases at
these DC levels.
EFFECTIVE NUMBER OF BITS (ENOB)
SINAD = 6.02N + 1.76, where N is equal to the effective
number of bits.
DIFFERENTIAL NONLINEARITY (DNL)
Error in the width of each code from its theoretical value.
(Theoretical = VFS/2N)
INTEGRAL NONLINEARITY (INL)
Linearity error refers to the deviation of each individual code
(normalized) from a straight line drawn from -Fs through
+Fs. The deviation is measured from the edge of each
particular code to the true straight line.
OUTPUT DELAY
Time between the clock's triggering edge and output data
valid.
OVERVOLTAGE RECOVERY TIME
The time required for the ADC to recover to full accuracy after
an analog input signal 125% of full scale is reduced to 50%
of the full-scale value.
SIGNAL-TO-NOISE RATIO (SNR)
The ratio of the fundamental sinusoid power to the total noise
power. Harmonics are excluded.
SINAD - 1.76
N =
+/- FULL-SCALE ERROR (GAIN ERROR)
Difference between measured full scale response
[(+Fs) - (-Fs)] and the theoretical response (+4 V -2 LSBs)
where the +FS (full scale) input voltage is defined as the
output transition between 1-10 and 1-11 and the -FS input
voltage is defined as the output transition between 0-00 and
0-01.
INPUT BANDWIDTH
Small signal (50 mV) bandwidth (3 dB) of analog input stage.
6.02
SIGNAL-TO-NOISE AND DISTORTION (SINAD)
The ratio of the fundamental sinusoid power to the total noise
and distortion power.
TOTAL HARMONIC DISTORTION (THD)
The ratio of the total power of the first 64 harmonics to the
power of the measured sinusoidal signal.
SPURIOUS FREE DYNAMIC RANGE (SFDR)
The ratio of the fundamental sinusoidal amplitude to the
single largest harmonic or spurious signal.
SPT
SPT7922
53/10/97
Page 6
50
20
30
40
60
70
80
10
0
10
1
10
2
THD vs Input Frequency
Input Frequency (MHz)
Total Harmonic Distortion (dB)
fs = 30 MSPS
80
20
30
40
50
60
70
80
10
0
10
1
10
2
SNR, THD, SINAD vs Sample Rate
Sample Rate (MSPS)
SNR, THD, SINAD (dB)
SNR,
THD
SINAD
f
IN
= 1 MHz
SNR, THD, SINAD vs Temperature
Temperature
SNR, THD, SINAD (dB)
55
60
65
70
75
50
f
S
= 30 MSPS
f
IN
= 1 MHz
SINAD
THD
SNR
-
25
0+25+50+75
70
60
50
40
Signal-to-Noise Ratio (dB)
30
20
0
10
80
70
PERFORMANCE CHARACTERISTICS
SNR vs Input Frequency
fs = 30 MSPS
1
Input Frequency (MHz)
SINAD vs Input Frequency
10
2
10
60
50
40
30
Signal-to-Noise and Distortion (dB)
20
0
10
0 dB
-30 dB
-60 dB
Amplitude (dB)
-90 dB
-120 dB
SPT
012345
1
10
Input Frequency (MHz)
Spectral Response
Frequency (MHz)
fs =30 MSPS
2
10
SPT7922
63/10/97
Page 7
TYPICAL INTERFACE CIRCUIT
The SPT7922 requires few external components to achieve
the stated operation and performance. Figure 2 shows the
typical interface requirements when using the SPT7922 in
normal circuit operation. The following section provides a
description of the pin functions and outlines critical performance criteria to consider for achieving the optimal device
performance.
POWER SUPPLIES AND GROUNDING
The SPT7922 requires -5.2 V and +5 V analog supply
voltages. The +5 V supply is common to analog VCC and
digital DVCC. A ferrite bead in series with each supply line is
intended to reduce the transient noise injected into the analog
VCC. These beads should be connected as closely as possible to the device. The connection between the beads and
the SPT7922 should not be shared with any other device.
Each power supply pin should be bypassed as closely as
possible to the device. Use 0.1 µF for VEE and VCC, and
0.01 µF for DVCC (chip caps are preferred).
AGND and DGND are the two grounds available on the
SPT7922. These two internal grounds are isolated on the
device. The use of ground planes is recommended to achieve
optimum device performance. DGND is needed for the DV
return path (40 mA typical) and for the return path for all digital
output logic interfaces. AGND and DGND should be separated from each other and connected together only at the
device through a ferrite bead.
CC
A Schottky or hot carrier diode connected between AGND
and VEE is required. The use of separate power supplies
between VCC and DVCC is not recommended due to potential power supply sequencing latch-up conditions. Using the
recommended interface circuit shown in figure 2 will provide
optimum device performance for the SPT7922.
VOLTAGE REFERENCE
The SPT7922 requires the use of two voltage references:
VFT and VFB. VFT is the force for the top of the voltage
reference ladder (+2.5 V typ), VFB (-2.5 V typ) is the force for
the bottom of the voltage reference ladder. Both voltages
are applied across an internal reference ladder resistance of
800 ohms. The +2.5 V voltage source for reference V
FT
must be current limited to 20 mA maximum if a different
driving circuit is used in place of the recommended reference
circuit shown in figures 2 and 3. In addition, there are five
reference ladder taps (VST, V
RT1, VRT2, VRT3,
and VSB).
VST is the sense for the top of the reference ladder (+2.0 V),
V
is the midpoint of the ladder (0.0 V typ) and VSB is the
RT2
sense for the bottom of the reference ladder (-2.0 V). V
and V
are quarter point ladder taps (+1.0 and -1.0 V
RT3
RT1
typical, respectively). The voltages seen at VST and VSB are
the true full scale input voltages of the device when VFT and
VFB are driven to the recommended voltages (+2.5 V and
-2.5 V typical respectively). V
and VSB should be used to
ST
monitor the actual full scale input voltage of the device.
V
RT1, VRT2
and V
should not be driven to the expected
RT3
ideal values as is commonly done with standard flash
converters. When not being used, a decoupling capacitor of
.01 µF connected to AGND from each tap is recommended
to minimize high frequency noise injection.
Figure 2 - Typical Interface Circuit
CLK
(TTL)
V
IN
(±2 V)
2
V
+ 5 V
C19
1 µF
+5 V
Notes to prevent latch-up due to power sequencing:
1) D1 = Schottky or hot carrier diode, P/N IN5817.
2) FB = Ferrite bead, Fair Rite P/N 2743001111
to be mounted as close to the device as possible. The ferrite bead to the ADC
connection should not be shared with any other device.
3) C1-C13 = Chip cap (recommended) mounted as close to the device's pin as
possible.
4) Use of a separate supply for VCC and DVCC is not recommended.
5) R1 provides current limiting to 45 mA.
6) C8, C9, C10 and C11 should be ten times larger than C12 and C13.
7) C10 = C11 = 0.1 µF cap in parallel with a 4.7 µF cap.
IC1
IN
+
(REF-03)
4
GND
32
+
1
IC2
10 kΩ
OP-07
8
7
C18
.01 µF
V
OUT
Tri m
6
-
R1
100 Ω
± 2.5 V Max
6
5
- 5.2 V
4
C17
.01 µF
10 kΩ
30 kΩ
30 kΩ
C16
1 µF
CLK
17
14
D12
(OVERRANGE)
13
D11
V
IN
24
V
FT
21
+2.5 V
C1
+
.01 µF
C2
1 µF
.01 µF
C3
.01 µF
C4
.01 µF
C5
.01 µF
C6
.01 µF
-2.5 V
C7
.01 µF
+
R
V
ST
22
2R
V
RT3
23
2R
V
RT2
25
2R
V
26
RT1
2R
V
27
SB
R
V
28
FB
EE
EE
V
V
18 3119 3020 2916 321 15
C8
.1 µF
C9
.1 µF
D1
C15
10 µF
-5.2 V
(Analog)
+
AGND
COARSE
ANALOG
PRESCALER
SUCCESSIVE
INTERPOLATION
STAGE # 1
SUCCESSIVE
INTERPOLATION
STAGE # N
AGND
AGND
C10
C11
C14
10 µF
A/D
CC
V
FB
+
(Analog)
+5 V
4
D E C O D I N G N E T W O R K
CC
CC
CC
V
DGND
DV
DV
C12
.01 µF
C13
.01 µF
FB
DGND
D10
DGND
(MSB)
12
D9
11
10
D8
D7
9
8
D6
D5
7
6
D4
5
D3
4
D2
D1
3
2
D0
(LSB)
FB
D I G I T A L O U T P U T S
SPT
SPT7922
73/10/97
Page 8
Figure 3 - Analog Equivalent Input Circuit
VCC
VIN
ANALOG PRESCALER
VEE
V
FT
The analog input range will scale proportionally with respect
to the reference voltage if a different input range is required.
The maximum scaling factor for device operation is ± 20% of
the recommended reference voltages of VFT and VFB. However, because the device is laser trimmed to optimize performance with ± 2.5 V references, the accuracy of the device
will degrade if operated beyond a ± 2% range.
An example of a recommended reference driver circuit is
shown in figure 2. IC1 is REF-03, the +2.5 V reference with
a tolerance of 0.6% or +/- 0.015 V. The potentiometer R1 is
10 kΩ and supports a minimum adjustable range of up to
150 mV. IC2 is recommended to be an OP-07 or equivalent
device. R2 and R3 must be matched to within 0.1% with good
TC tracking to maintain a 0.3 LSB matching between VFT and
VFB. If 0.1% matching is not met, then potentiometer R4 can be
used to adjust the VFB voltage to the desired level. R1 and R4
should be adjusted such that VST and VSB are exactly +2.0 V
and -2.0 V respectively.
The following errors are defined:
+FS error = top of ladder offset voltage = ∆(+FS -VST)
-FS error = bottom of ladder offset voltage = ∆(-FS -VSB)
Where the +FS (full scale) input voltage is defined as the
output 1 LSB above the transition of 1—10 and 1—11 and
the -FS input voltage is defined as the output 1 LSB below the
transition of 0—00 and 0—01.
ANALOG INPUT
VIN is the analog input. The full scale input range will be 80%
of the reference voltage or ±2 volts with VFB=-2.5 V and
VFT=+2.5 V.
The drive requirements for the analog inputs are minimal when
compared to conventional Flash converters due to the
SPT7922’s extremely low input capacitance of only 5 pF and
very high input impedance of 300 kΩ. For example, for an input
signal of ± 2 V p-p with an input frequency of 10 MHz, the peak
output current required for the driving circuit is only 628 µA.
CLOCK INPUT
The SPT7922 is driven from a single-ended TTL input (CLK).
The CLK pulse width (tpwH) must be kept between 15 ns and
300 ns to ensure proper operation of the internal track-andhold amplifier. (See timing diagram.) When operating the
SPT7922 at sampling rates above 3 MSPS, it is recommended that the clock input duty cycle be kept at 50% to
optimize performance. (See figure 4.) The analog input
signal is latched on the rising edge of the CLK.
The clock input must be driven from fast TTL logic (VIH ≤4.5 V,
T
<6 ns). In the event the clock is driven from a high
RISE
current source, use a 100 Ω resistor in series to current limit
to approximately 45 mA.
Figure 4 - SNR vs Clock Duty Cycle
67
65
63
61
Duty
t
59
57
55
Signal-to-Noise Ratio (dB)
53
51
30354045505560657075
Duty Cycle of Positive Clock Pulse (%)
Cycle
pwH
=
t
pwL
tpwLtpwH
DIGITAL OUTPUTS
The format of the output data (D0-D11) is straight binary.
(See table II.) The outputs are latched on the rising edge of
CLK with a propagation delay of 14 ns (typ). There is a one
clock cycle latency between CLK and the valid output data.
(See timing diagram.)
Table II - Output Data Information
ANALOG INPUTOVERRANGEOUTPUT CODE
D12D11-DO
>+2.0 V + 1/2 LSB11111 1111 1111
+2.0 V -1 LSBO1111 1111 111Ø
0.0 VOØØØØ ØØØØ ØØØØ
-2.0 V +1 LSBOOOOO OOOO OOOØ
<-2.0 VOOOOO OOOO OOOO
(Ø indicates the flickering bit between logic 0 and 1).
The rise times and fall times of the digital outputs are not
symmetrical. The propagation delay of the rise time is
typically 14 ns and the fall time is typically 6 ns. (See figure
5.) The nonsymmetrical rise and fall times create approximately 8 ns of invalid data.
SPT
SPT7922
83/10/97
Page 9
Figure 5 - Digital Output Characteristics
N
CLK IN
DATA OUT
(Actual)
DATA OUT
(Equivalent)
2.4 V
3.5 V
2.4 V
0.8 V
0.5 V
6 ns
typ.
(N-2)
(N-2)
Invalid
Data
tpd1
(14 ns typ.)
Invalid
Data
OVERRANGE OUTPUT
The overrange output (D12) is an indication that the analog
input signal has exceeded the full scale input voltage by
1 LSB. When this condition occurs, the outputs will switch to
logic 1s. All other data outputs are unaffected by this operation. This feature makes it possible to include the SPT7922
into higher resolution systems.
N+1
Rise Time
≤ 6 ns
Invalid
(N-1)
(N-1)
Data
Invalid
Data
(N)
(N-1)
EVALUATION BOARD
The EB7922 evaluation board is available to aid designers in
demonstrating the full performance of the SPT7922. This
board includes a reference circuit, clock driver circuit, output
data latches and an on-board reconstruction of the digital
data. An application note (AN7922) describing the operation
of this board as well as information on the testing of the
SPT7922 is also available. Contact the factory for price and
availability.
-5.2 V Supply
+5.0 V supply
Voltage Reference Taps
Analog Input
Digital +5.0 V Supply (TTL Outputs)
Force for Top of Reference Ladder
Sense for Top of Reference Ladder
Force for Bottom of Reference Ladder
Sense for Bottom of Reference Ladder
D10
D11
N/C
1
D2
2
D3
D4
3
D5
4
5
D6
D7
6
D8
7
8
D9
9
10
11
12
N/C
13
D12
14
DGND
44L Cerquad
17
18
15
DV
CC
16
N/C
CLK
N/C
19
V
EE
20
N/C
21
AGND
33
N/C
V
32
FB
V
31
SB
V
30
RT1
V
29
RT2
V
28
IN
V
27
RT3
V
26
ST
V
25
FT
N/C
24
V
23
CC
22
N/C
ORDERING INFORMATION
PART NUMBERTEMPERATURE RANGEPACKAGE
SPT7922SCJ0 to +70 °C32L Sidebrazed DIP
SPT7922SCQ0 to +70 °C44L Cerquad
Signal Processing Technologies, Inc. reserves the right to change products and specifications without notice. Permission is hereby expressly
granted to copy this literature for informational purposes only. Copying this material for any other use is strictly prohibited.
WARNING - LIFE SUPPORT APPLICATIONS POLICY - SPT products should not be used within Life Support Systems without the specific
written consent of SPT. A Life Support System is a product or system intended to support or sustain life which, if it fails, can be reasonably
expected to result in significant personal injury or death.
Signal Processing Technologies believes that ultrasonic cleaning of its products may damage the wire bonding, leading to device
failure. It is therefore not recommended, and exposure of a device to such a process will void the product warranty.
SPT7922
SPT
113/10/97
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