Datasheet SPT7755AIK, SPT7755BIK Datasheet (SPT)

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SPT7755
8-BIT, 750 MSPS FLASH A/D CONVERTER
FEATURES
• 1:2 Demuxed ECL Compatible Outputs
• Wide Input Bandwidth - 900 MHz
• Low Input Capacitance - 15 pF (MQUAD)
• Metastable Errors Reduced to 1 LSB
• Monolithic for Low Cost
• Gray Code Output
GENERAL DESCRIPTION
The SPT7755 is a full parallel (flash) analog-to-digital con­verter capable of digitizing full scale (0 to -2 V) inputs into eight-bit digital words at an update rate of 750 MSPS. The ECL-compatible outputs are demultiplexed into two separate output banks, each with differential data ready outputs to ease the task of data capture. The SPT7755's wide input bandwidth and low capacitance eliminate the need for exter­nal track-and-hold amplifiers for most applications. A propri-
CLK CLK
BLOCK DIAGRAM
CLOCK
Analog
V
RT
Input
Preamp Comparator
256
BUFFER
APPLICATIONS
• Digital Oscilloscopes
• Transient Capture
• Radar, EW, ECM
• Direct RF Down-Conversion
etary decoding scheme reduces metastable errors to the 1 LSB level. The SPT7755 operates from a single -5.2 V supply, with a nominal power dissipation of 5.5 W.
The SPT7755 is available in an 80L surface-mount MQUAD package over the industrial temperature range of -25 to +85 °C. Contact the factory for availability of die and /883 versions.
DEMUX CLOCK
BUFFER
255
152
151
128
V
RM
V
RB
127
64
63
2
1
D8
(OVR)
D7
(MSB)
D6
D5
D4
D3
WITH METASTABLE ERROR CORRECTION
D2
D1
DO
(LSB)
D8B D7B
D5B
D2B D1B D0B D8A D7A
1:2 DEMULTIPLEXER
D5A
D2A D1A D0A
DRB (DATA READY) DRB (DATA READY) D8B (OVR) D7B (MSB) D6B D5B D4B D3B D2B D1B D0B (LSB) DRA (DATA READY) DRA (DATA READY) D8A (OVR) D7A (MSB) D6A D5A
ECL OUTPUT BUFFERS AND LATCHES
D4A D3A D2A D1A D0A (LSB)
BANK B
BANK A
Signal Processing Technologies, Inc.
4755 Forge Road, Colorado Springs, Colorado 80907, USA
Phone: (719) 528-2300 FAX: (719) 528-2370
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ABSOLUTE MAXIMUM RATINGS (Beyond which damage may occur)1 25 °C
Supply Voltages Negative Supply Voltage (V
TO GND)........ .-7.0 to +0.5 V
EE
Output
Digital Output Current ........................................ 0 to -28 mA
Ground Voltage Differential............................. .-0.5 to +0.5 V
Temperature
Input Voltage
Analog Input Voltage....................................... +0.5 V to V
Reference Input Voltage ................................. +0.5 V to V
Digital Input Voltage ........................................ +0.5 V to V
EE EE EE
Reference Current VRT to VRB................................. 35 mA
Operating Temperature, ambient .......................-25 to +85 °C
case ................................... +125 °C
junction...............................+150 °C
Lead Temperature, (soldering 10 seconds). ............. +300 °C
Storage Temperature ......................................-65 to +150 °C
Notes: 1. Operation at any Absolute Maximum Rating is not implied. See Electrical Specifications for proper nominal applied condi-
tions in typical applications.
ELECTRICAL SPECIFICATIONS
TJ = TC = TA = +25 °C , VEE=-5.2 V, VRB=-2.00 V, VRM=-1.0 V, VRT=0.00 V, f
TEST TEST SPT7755A SPT7755B
PARAMETERS CONDITIONS LEVEL MIN TYP MAX MIN TYP MAX UNITS
Resolution 8 8 Bits DC Accuracy (+25 °C)
Integral Nonlinearity f Differential Nonlinearity f
= 100 kHz I -1.0 +1.0 -1.5 +1.5 LSB
CLK
= 100 kHz I -0.85 +0.95 -0.95 +1.5 LSB
CLK
No Missing Codes Guaranteed Guaranteed
Analog Input
Input Voltage Range I V Input Bias Current V
=0 V I .75 2.0 .75 2.0 mA
IN
Input Resistance V 15 15 k Input Capacitance Over Full Input Range V 15 15 pF Input Bandwidth
Small Signal V 900 900 MHz
Large Signal V 500 500 MHz Offset Error V Offset Error V
RT RB
Input Slew Rate V 5 5 V/ns Clock Synchronous
Input Current V 2 2 µA
Reference Input
Ladder Resistance I 60 80 60 80 Reference Bandwidth V 30 30 MHz
Timing Characteristics
Maximum Sample Rate I 750 750 MHz Aperture Jitter V 2 2 ps Acquisition Time V 250 250 ps CLK to Data Ready Delay IV 0.9 1.4 1.9 0.9 1.4 1.9 ns Clock to Data Delay IV 1.25 1.75 2.25 1.25 1.75 2.25 ns
Dynamic Performance
Signal-To-Noise Ratio (without Harmonics)
= 50 MHz I 46 44 dB
f
IN
= 250 MHz I 44 42 dB
f
IN
Total Harmonic Distortion
f
= 50 MHz I -45 -43 dBc
IN
f
= 250 MHz I -37 -35 dBc
IN
=750 MHz, Duty Cycle=50%, unless otherwise specified.
clk
RB
V
RT
V
RB
VRTV
IV -30 +30 -30 +30 mV IV -30 +30 -30 +30 mV
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ELECTRICAL SPECIFICATIONS
TJ = TC = TA = +25 °C , VEE=-5.2 V, VRB=-2.00 V, VRM=-1.0 V, VRT=0.00 V, f
TEST TEST SPT7755A SPT7755B
PARAMETERS CONDITIONS LEVEL MIN TYP MAX MIN TYP MAX UNITS
Dynamic Performance
Signal-to-Noise and Distortion
= 50 MHz I 43 41 dB
f
IN
= 250 MHz I 36 34 dB
f
IN
Spurious Free Dynamic Range
f
= 50 MHz I 48 44 dB
IN
f
= 250 MHz I 40 36 dB
IN
Digital Inputs
Input High Voltage
(CLK, NCLK) I -1.1 -0.7 -1.1 -0.7 V Input Low Voltage
(CLK, NCLK) I -1.8 -1.5 -1.8 -1.5 V Clock Pulse Width High (t Clock Pulse Width Low (t
Digital Outputs
Logic "1" Voltage I -1.1 -0.9 -1.1 -0.9 V Logic "0" Voltage I -1.8 -1.5 -1.8 -1.5 V Rise Time 20 to 80% V 450 450 ps Fall Time 20 to 80% V 450 450 ps
Power Supply Requirements
Voltage V Current I Power Dissipation I 5.5 6.25 5.5 6.25 W
EE
EE
) I 0.67 0.5 0.67 0.5 ns
PWH
) I 0.67 0.5 0.67 0.5 ns
PWL
=750 MHz, Duty Cycle=50%, unless otherwise specified.
clk
IV -4.95 -5.2 -5.45 -4.95 -5.2 -5.45 V
I 1.05 1.2 1.05 1.2 A
Typical Thermal Impedance: θJC = +4 °C/W.
TEST LEVEL CODES
All electrical characteristics are subject to the following conditions:
All parameters having min/max specifications are guaranteed. The Test Level column indi­cates the specific device testing actually per­formed during production and Quality Assur­ance inspection. Any blank section in the data column indicates that the specification is not tested at the specified condition.
Unless otherwise noted, all tests are pulsed tests; therefore, TJ = TC = TA.
TEST LEVEL
I
II
III IV
V
VI
TEST PROCEDURE
100% production tested at the specified temperature. 100% production tested at TA=25 °C, and sample
tested at the specified temperatures. QA sample tested only at the specified temperatures. Parameter is guaranteed (but not tested) by design
and characterization data. Parameter is a typical value for information purposes
only. 100% production tested at TA = 25 °C. Parameter is
guaranteed over specified temperature range.
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GENERAL DESCRIPTION
The SPT7755 is one of the fastest monolithic 8-bit parallel flash A/D converters available today. The nominal conver­sion rate is 750 MSPS and the analog bandwidth is in excess of 900 MHz. A major advance over previous flash converters is the inclusion of 256 input preamplifiers between the reference ladder and input comparators (see block dia­gram). This not only reduces clock transient kickback to the input and reference ladder due to a low AC beta but also reduces the effect of the dynamic state of the input signal on the latching characteristics of the input comparators. The preamplifiers act as buffers and stabilize the input capaci­tance so that it remains constant over different input voltage
Figure 1 - SPT7755 Typical Interface Circuit
**
V
IN
50
V
IN
V
IN
and frequency ranges and therefore makes the part easier to drive than previous flash converters. The preamplifiers also add a gain of two to the input signal so that each comparator has a wider overdrive or threshold range to "trip" into or out of the active state. This gain reduces metastable states that can cause errors at the output.
The SPT7755 has true differential analog and digital data paths from the preamplifiers to the output buffers (Current Mode Logic) for reducing potential missing codes while rejecting common mode noise.
Signature errors are also reduced by careful layout of the analog circuitry. The output drive capability of the device can provide full ECL swings into 50 loads.
-2.0 V
Reference
Convert
V
RTF
V
*
*
50
RTS
V
RM
V
RBS
V
RBF
CLK NCLK
-5.2 V
50
.1 µF
EE
V
AGND
DGND
FB
*
FB=  Ferrite bead U1= OP291 or equivalent with low offset/noise. R = 1 k ; 0.1% matched.  = AGND  = DGND U2= Motorola ECLinPS Lite, MC10EL16, differential receiver
  with 250 ps (typ) propagation delay. *  = 10 µF Tantalum Capacitor and 0.1 µF Chip Capacitor ** = Care must be taken to avoid exceeding the maximum rating
  for the input, especially during power up sequencing of the   analog input driver.
R
22
+
U1
-
R
2N2907
22
-
U1
+
50
-5.2 V
-2 V
Pulldown
(Analog)
-5.2 V
U2
DRB (DATA READY) DRB (DATA READY) D8B (OVR) D7B (MSB) D6B D5B D4B D3B D2B D1B D0B (LSB) DRA (DATA READY) DRA (DATA READY) D8A (OVR) D7A (MSB) D6A D5A D4A D3A D2A D1A D0A (LSB)
50
-2.0 V
Pulldown
(Digital)
BANK B
A
BANK
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TYPICAL INTERFACE CIRCUIT
The circuit in figure 1 is intended to show the most elaborate method of achieving the least error by correcting for integral linearity, input induced distortion and power supply/ground noise. This is achieved by the use of external reference ladder tap connections, input buffer and supply decoupling. Please contact the factory for the SPT7755 evaluation board applications note that contains more details on interfacing the SPT7755. The function of each pin and external connections to other components is as follows:
(VRM) and AGND (VRT force and sense). The reference pins and tap can be driven by op amps as shown in figure 1 or V may be bypassed for limited temperature operation. These voltage inputs can be bypassed to AGND for further noise suppression if so desired.
Table I - Output Coding
V
IN
> -0.5 LSB
D8
D7 • • • D0
1
1 0 0 0 0 0 0 0
RM
VEE, AGND, DGND
VEE is the supply pin with AGND as ground for the device. The power supply pins should be bypassed as close to the device as possible with at least a .01 µF ceramic capacitor. A 1 µF tantalum can also be used for low frequency suppression. DGND is the ground for the ECL outputs and is to be referenced to the output pulldown voltage and appropriately bypassed as shown in figure 5.
VIN (ANALOG INPUT)
There are two analog input pins that are tied to the same point internally. Either one may be used as an analog input sense and the other for input force. This is convenient for testing the source signal to see if there is sufficient drive capability. The pins can also be tied together and driven by the same source. The SPT7755 is superior to similar devices due to a pream­plifier stage before the comparators. This makes the device easier to drive because it has constant capacitance and induces less slew rate distortion.
CLK
CLK,
The clock inputs are designed to be driven differentially with ECL levels. The duty cycle of the clock should be kept at 50% to avoid causing larger second harmonics. If this is not important to the intended application, then duty cycles other than 50% may be used.
(CLOCK INPUTS)
-0.5 LSB
-1.5 LSB
-1.0 V
-2.0 V+
< (-2.0 V +1/2 LSB)
THERMAL MANAGEMENT
The typical thermal impedance is as follows:
1/2 LSB
Indicates the transition between the two codes
1
1 0 0 0 0 0 0 0
0
1 0 0 0 0 0 0 0
0
1 0 0 0 0 0 0 0
0
1 0 0 0 0 0 0 1
0
1 1 0 0 0 0 0 0
0
0 1 0 0 0 0 0 0
0
0 0 0 0 0 0 0 1
0
0 0 0 0 0 0 0 0
0
0 0 0 0 0 0 0 0
D0 TO D8, DR, NDR (A AND B)
The digital outputs can drive 50 to ECL levels when pulled down to -2 V. When pulled down to -5.2 V, the outputs can drive 130 to 1 k loads. All digital outputs are grey code with the coding as shown in table 1.
V
, V
RBF
(REFERENCE INPUTS)
There are two reference inputs and one external reference voltage tap. These are -2 V (VRB force and sense), mid-tap
RBS
, V
RTF
, V
RTS
, V
RM
SPT
ΘCA = +17 °C/W in still air with no heat sink
We highly recommend that a heat sink be used for this device with adequate air flow to ensure rated performance of the device. We have found that a Thermalloy 17846 heat sink with a minimum air flow of 1 meter/second (200 linear feet per minute) provides adequate thermal performance under labo­ratory tests. Application specific conditions should be taken into account to ensure that the device is properly heat sinked.
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OPERATION
The SPT7755 has 256 preamp/comparator pairs which are each supplied with the voltage from VRT to VRB divided equally by the resistive ladder as shown in the block diagram. This voltage is applied to the positive input of each preampli­fier/comparator pair. An analog input voltage applied at VIN is connected to the negative inputs of each preamplifier/com­parator pair. The comparators are then clocked through each one's individual clock buffer. When the CLK pin is in the low state, the master or input stage of the comparators compare the analog input voltage to the respective reference voltage. When the CLK pin changes from low to high the comparators
are latched to the state prior to the clock transition and output logic codes in sequence from the top comparators, closest to VRT (0 V), down to the point where the magnitude of the input signal changes sign (thermometer code). The output of each comparator is then registered into four 64-to-6 bit decoders when the CLK is changed from high to low. At the output of the decoders is a set of four 7-bit latches which are enabled ("track") when the clock changes from high to low. From here, the output of the latches are coded into 6 LSBs from 4 columns and 4 columns are coded into 2 MSBs. Finally, 8 ECL output latches and buffers are used to drive the external loads. The conversion takes one clock cycle from the input to the data outputs.
Figure 2 - Timing Diagram
V
IN
CLK
NCLK
DRA
NDRA
Data Bank A
DRB
NDRB
Data Bank B
Figure 3 - Subcircuit Schematics
N
N+1
1.3 ns
1.4 ns typ
N+5
N+2
N+3
N-2 N N+2 N+4
1.75 ns typ
1.4 ns typ
N-1 N+1 N+3
1.75 ns typ
N+4
N+6
N+7
V
IN
SPT
INPUT CIRCUIT OUTPUT CIRCUIT
AGND
AGND
V
R
V
EE
6
DGND
Data Out
CLOCK INPUT
CLK
AGND
V
CLK
EE
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A
B
F
G
PACKAGE OUTLINE
80-PIN MQUAD
H
I
SYMBOL MI N MA X MIN MAX
J
INCHES MILLIMETERS
A 0.937 0.945 23.80 24.00 B 0.777 0.785 19.72 19.93 C 0.472 TYP 12.0 TYP D 0.541 0.549 13.73 13.94 E 0.701 0.709 17.80 18.00 F 0.032 TYP 0.80 TYP G 0.014 TYP 0.36 TYP H 0.114 0.122 2.90 3.10
I .006 TYP 0.15 TYP
J 0.724 TYP 18.4 TYP K 0.099 0.109 2.51 2.77 L7° 7° M 0.026 0.036 0.66 0.91
C D
E
K
M
L
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PIN ASSIGNMENTS
PIN FUNCTIONS
D2B D3B D4B V
EE
V
EE
D5B DGND D6B DGND D7B DGND D8B N/C N/C AGND AGND AGND AGND V
EE
V
EE
V
RBF
V
EE
V
EE
V
RBS
10
12 13 14 15 16 17 18 19 20 21 22 23 24
D1B
80
EE
V
79
DØB
78
DRB
DGND
76
77
NDRB
DGND
74
75
D8A
DGND
72
73
D7A
DGND
70
71
D6A
DGND
68
69
V
EE
67
D5A
66
D4A
65
NAME FUNCTION
V
EE
Negative Supply Nominally -5.2 V
AGND Analog Ground
1 2 3 4 5 6 7 8 9
1 1
MQUAD
25
27
29
31
33
35
37
26
28
30
32
34
V
AGND
AGND
V
EE
EE
AGND
V
N/C
V
AGND
IN
V
N/C
IN
RM
36 AGND
39
38 V
AGND
V
EE
EE
EE
40 V
64 63 62 61 60 59 58 57 56 55 54 53 52 51 50 49 48 47 46 45 44 43 42 41
N/C N/C D3A D2A V
EE
D1A DGND DØA DGND NDRA
DGND DRA AGND AGND CLK V
EE
NCLK V
EE
V
EE
AGND AGND V
RTS
V
RTF
N/C
V
RTF
V
RTS
V
RM
V
RBF
V
RBS
V
IN
DGND Digital Ground D0-D7A Data Output Bank A D0-D7B Data Output Bank B DRA Data Ready Bank A NDRA Not Data Ready Bank A DRB Data Ready Bank B NDRB Not Data Ready Bank B D8A Overrange Output Bank A D8B Overrange Output Bank B CLK Clock Input
Reference Voltage Force Top, Nominally 0 V Reference Voltage Sense Top Reference Voltage Middle, Nominally -1 V Reference Voltage Force Bottom, Nominally -2 V Reference Voltage Sense Bottom Analog Input Voltage, Can Be Either Voltage or Sense
NCLK Clock Input
ORDERING INFORMATION
PART NUMBER DESCRIPTION TEMPERATURE RANGE PACKAGE TYPE
SPT7755AIK INL = 1.0 LSB -25 to +85 °C 80L MQUAD SPT7755BIK INL = 1.5 LSB -25 to +85 °C 80L MQUAD
Signal Processing Technologies, Inc. reserves the right to change products and specifications without notice. Permission is hereby expressly granted to copy this literature for informational purposes only. Copying this material for any other use is strictly prohibited.
WARNING - LIFE SUPPORT APPLICATIONS POLICY - SPT products should not be used within Life Support Systems without the specific written consent of SPT. A Life Support System is a product or system intended to support or sustain life which, if it fails, can be reasonably expected to result in significant personal injury or death.
Signal Processing Technologies believes that ultrasonic cleaning of its products may damage the wire bonding, leading to device failure. It is therefore not recommended, and exposure of a device to such a process will void the product warranty.
SPT7755
3/5/97
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