Figure 5.Power supplies constraints (–0.3 V V
Figure 6.Independent ADC supply (–0.3 V V
Figure 7.Power supplies constraints (3.0 V V
Figure 8.Independent ADC supply (3.0 V V
This document provides electrical specifications, pin assignments, and package diagrams
for the SPC560P44/50 series of microcontroller units (MCUs). It also describes the device
features and highlights important electrical and physical characteristics. For functional
characteristics, refer to the device reference manual.
1.2 Description
This 32-bit system-on-chip (SoC) automotive microcontroller family is the latest
achievement in integrated automotive application controllers. It belongs to an expanding
range of automotive-focused products designed to address chassis applications—
specifically, electrical hydraulic power steering (EHPS) and electric power steering (EPS)—
as well as airbag applications.
This family is one of a series of next-generation integrated automotive microcontrollers
based on the Power Architecture technology.
The advanced and cost-efficient host processor core of this automotive controller family
complies with the Power Architecture embedded category. It operates at speeds of up to
64 MHz and offers high performance processing optimized for low power consumption. It
capitalizes on the available development infrastructure of current Power Architecture
devices and is supported with software drivers, operating systems and configuration code to
assist with users implementations.
1.3 Device comparison
Ta bl e 2 provides a summary of different members of the SPC560P44Lx, SPC560P50Lx
family and their features—relative to full-featured version—to enable a comparison among
the family members and an understanding of the range of functionality offered within this
family.
3.3 V or 5 V single supply with external transistor
Analog power supply3.3 V or 5 V
Supply
Internal RC oscillator16 MHz
External crystal oscillator4–40 MHz
Packages
LQFP100
LQFP144
TemperatureStandard ambient temperature–40 to 125 °C
1. 32 message buffers, selectable single or dual channel support
2. Each FlexCAN module has 32 message buffers.
3. One FlexCAN module can act as a Safety Port with a bit rate as high as 7.5 Mbit/s.
4. Four channels shared between the two ADCs
5. The different supply voltages vary according to the part number ordered.
SPC560P44Lx, SPC560P50Lx is available in two configurations having different features:
full-featured and airbag. Ta bl e 3 shows the main differences between the two versions.
Provides a myriad of miscellaneous control functions for the device including
Error correction status module
(ECSM)
program-visible information about configuration and revision levels, a reset
status register, wakeup control for exiting sleep modes, and optional features
such as information on memory errors reported by error-correcting codes
External oscillator (XOSC)
Provides an output clock used as input reference for FMPLL_0 or as reference
clock for specific modules depending on system needs
Fault collection unit (FCU)Provides functional safety to the device
Flash memoryProvides non-volatile storage for program code, constants and variables
Frequency-modulated phaselocked loop (FMPLL)
Generates high-speed system clocks and supports programmable frequency
modulation
Interrupt controller (INTC)Provides priority-based preemptive scheduling of interrupt requests
JTAG controller
LINFlex controller
Provides the means to test chip functionality and connectivity while remaining
transparent to system logic when not in test mode
Manages a high number of LIN (Local Interconnect Network protocol)
messages efficiently with minimum load on CPU
Provides a mechanism for controlling the device operational mode and mode
Mode entry module (MC_ME)
transition sequences in all functional states; also manages the power control
unit, reset generation module and clock generation module, and holds the
configuration, control and status registers accessible for applications
Periodic interrupt timer (PIT)Produces periodic interrupts and triggers
Peripheral bridge (PBRIDGE)Interface between the system bus and on-chip peripherals
Power control unit (MC_PCU)
Reduces the overall power consumption by disconnecting parts of the device
from the power supply via a power switching device; device components are
grouped into sections called “power domains” which are controlled by the PCU
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Table 4.SPC560P44Lx, SPC560P50Lx series block summary (continued)
BlockFunction
Pulse width modulator
(FlexPWM)
Reset generation module
(MC_RGM)
Static random-access memory
(SRAM)
Contains four PWM submodules, each of which is capable of controlling a
single half-bridge power stage and two fault input channels
Centralizes reset sources and manages the device reset sequence of the
device
Provides storage for program code, constants, and variables
Provides control over all the electrical pad controls and up 32 ports with 16 bits
System integration unit lite (SIUL)
of bidirectional, general-purpose input and output signals and supports up to 32
external interrupts with trigger event configuration
System status and configuration
module (SSCM)
System timer module (STM)
Provides system configuration and status data (such as memory size and
status, device mode and security status), device identification data, debug
status port enable and selection, and bus and peripheral abort enable/disable
Provides a set of output compare events to support AUTOSAR
system tasks
System watchdog timer (SWT)Provides protection from runaway code
Supports up to 18 external sources that can generate interrupts or wakeup
Wakeup unit (WKPU)
events, 1 of which can cause non-maskable interrupt requests or wakeup
events
1. AUTOSAR: AUTomotive Open System ARchitecture (see www.autosar.org)
(1)
and operating
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1.5 Feature details
1.5.1 High performance e200z0 core processor
The e200z0 Power Architecture core provides the following features:
●High performance e200z0 core processor for managing peripherals and interrupts
●Single issue 4-stage pipeline in-order execution 32-bit Power Architecture CPU
●Harvard architecture
●Variable length encoding (VLE), allowing mixed 16-bit and 32-bit instructions
–Results in smaller code size footprint
–Minimizes impact on performance
●Branch processing acceleration using lookahead instruction buffer
●Load/store unit
–1 cycle load latency
–Misaligned access support
–No load-to-use pipeline bubbles
●Thirty-two 32-bit general purpose registers (GPRs)
●Separate instruction bus and load/store bus Harvard architecture
●Hardware vectored interrupt support
●Reservation instructions for implementing read-modify-write constructs
●Long cycle time instructions, except for guarded loads, do not increase interrupt
latency
●Extensive system development support through Nexus debug port
●Non-maskable interrupt support
1.5.2 Crossbar switch (XBAR)
The XBAR multi-port crossbar switch supports simultaneous connections between four
master ports and three slave ports. The crossbar supports a 32-bit address bus width and a
32-bit data bus width.
The crossbar allows for two concurrent transactions to occur from any master port to any
slave port; but one of those transfers must be an instruction fetch from internal flash
memory. If a slave port is simultaneously requested by more than one master port,
arbitration logic will select the higher priority master and grant it ownership of the slave port.
All other masters requesting that slave port will be stalled until the higher priority master
completes its transactions. Requesting masters will be treated with equal priority and will be
granted access to a slave port in round-robin fashion, based upon the ID of the last master
to be granted access.
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The crossbar provides the following features:
●4 master ports:
–e200z0 core complex Instruction port
–e200z0 core complex Load/Store Data port
–eDMA
–FlexRay
●3 slave ports:
–Flash memory (code flash and data flash)
–SRAM
–Peripheral bridge
●32-bit internal address, 32-bit internal data paths
●Fixed Priority Arbitration based on Port Master
●Temporary dynamic priority elevation of masters
1.5.3 Enhanced direct memory access (eDMA)
The enhanced direct memory access (eDMA) controller is a second-generation module
capable of performing complex data movements via 16 programmable channels, with
minimal intervention from the host processor. The hardware micro architecture includes a
DMA engine which performs source and destination address calculations, and the actual
data movement operations, along with an SRAM-based memory containing the transfer
control descriptors (TCD) for the channels. This implementation is utilized to minimize the
overall block size.
The eDMA module provides the following features:
●16 channels support independent 8, 16 or 32-bit single value or block transfers
●Supports variable sized queues and circular queues
●Source and destination address registers are independently configured to either post-
increment or to remain constant
●Each transfer is initiated by a peripheral, CPU, or eDMA channel request
●Each eDMA channel can optionally send an interrupt request to the CPU on completion
of a single value or block transfer
●DMA transfers possible between system memories, DSPIs, ADC, FlexPWM, eTimer
and CTU
●Programmable DMA channel multiplexer for assignment of any DMA source to any
available DMA channel with as many as 30 request sources
●eDMA abort operation through software
1.5.4 Flash memory
The SPC560P44Lx, SPC560P50Lx provides as much as 576 KB of programmable, nonvolatile, flash memory. The non-volatile memory (NVM) can be used for instruction and/or
data storage. The flash memory module interfaces the system bus to a dedicated flash
memory array controller. It supports a 32-bit data bus width at the system bus port, and a
128-bit read data interface to flash memory. The module contains four 128-bit wide prefetch
buffers. Prefetch buffer hits allow no-wait responses. Normal flash memory array accesses
are registered and are forwarded to the system bus on the following cycle, incurring two
wait-states.
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The flash memory module provides the following features:
●Hardware and software configurable read and write access protections on a per-master
basis
●Configurable access timing allowing use in a wide range of system frequencies
●Multiple-mapping support and mapping-based block access timing (up to 31 additional
cycles) allowing use for emulation of other memory types.
●Software programmable block program/erase restriction control
●Erase of selected block(s)
●Read page sizes
–Code flash memory: 128 bits (4 words)
–Data flash memory: 32 bits (1 word)
●ECC with single-bit correction, double-bit detection for data integrity
–Code flash memory: 64-bit ECC
–Data flash memory: 64-bit ECC
●Embedded hardware program and erase algorithm
●Erase suspend, program suspend and erase-suspended program
●Censorship protection scheme to prevent flash memory content visibility
●Hardware support for EEPROM emulation
1.5.5 Static random access memory (SRAM)
The SPC560P44Lx, SPC560P50Lx SRAM module provides up to 40 KB of general-purpose
memory.
The SRAM module provides the following features:
●Supports read/write accesses mapped to the SRAM from any master
●Up to 40 KB general purpose SRAM
●Supports byte (8-bit), half word (16-bit), and word (32-bit) writes for optimal use of
memory
●Typical SRAM access time: 0 wait-state for reads and 32-bit writes; 1 wait state for 8-
and 16-bit writes if back to back with a read to same memory block
1.5.6 Interrupt controller (INTC)
The interrupt controller (INTC) provides priority-based preemptive scheduling of interrupt
requests, suitable for statically scheduled hard real-time systems. The INTC handles 147
selectable-priority interrupt sources.
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For high priority interrupt requests, the time from the assertion of the interrupt request from
the peripheral to when the processor is executing the interrupt service routine (ISR) has
been minimized. The INTC provides a unique vector for each interrupt request source for
quick determination of which ISR has to be executed. It also provides a wide number of
priorities so that lower priority ISRs do not delay the execution of higher priority ISRs. To
allow the appropriate priorities for each source of interrupt request, the priority of each
interrupt request is software configurable.
When multiple tasks share a resource, coherent accesses to that resource need to be
supported. The INTC supports the priority ceiling protocol (PCP) for coherent accesses. By
providing a modifiable priority mask, the priority can be raised temporarily so that all tasks
which share the same resource can not preempt each other.
The INTC provides the following features:
●Unique 9-bit vector for each separate interrupt source
●8 software triggerable interrupt sources
●16 priority levels with fixed hardware arbitration within priority levels for each interrupt
source
●Ability to modify the ISR or task priority: modifying the priority can be used to implement
the Priority Ceiling Protocol for accessing shared resources.
●2 external high priority interrupts directly accessing the main core and I/O processor
(IOP) critical interrupt mechanism
1.5.7 System status and configuration module (SSCM)
The system status and configuration module (SSCM) provides central device functionality.
The SSCM includes these features:
●System configuration and status
–Memory sizes/status
–Device mode and security status
–Determine boot vector
–Search code flash for bootable sector
–DMA status
●Debug status port enable and selection
●Bus and peripheral abort enable/disable
1.5.8 System clocks and clock generation
The following list summarizes the system clock and clock generation on the SPC560P44Lx,
SPC560P50Lx:
●Lock detect circuitry continuously monitors lock status
The FMPLL allows the user to generate high speed system clocks from a 4–40 MHz input
clock. Further, the FMPLL supports programmable frequency modulation of the system
clock. The PLL multiplication factor, output clock divider ratio are all software configurable.
●Reduced frequency divider (RFD) for reduced frequency operation without forcing the
PLL to relock
●Frequency-modulated PLL
–Modulation enabled/disabled through software
–Triangle wave modulation
●Programmable modulation depth (±0.25% to ±4% deviation from center frequency):
programmable modulation frequency dependent on reference frequency
●Self-clocked mode (SCM) operation
1.5.10 Main oscillator
The main oscillator provides these features:
●Input frequency range: 4–40 MHz
●Crystal input mode or oscillator input mode
●PLL reference
1.5.11 Internal RC oscillator
This device has an RC ladder phase-shift oscillator. The architecture uses constant current
charging of a capacitor. The voltage at the capacitor is compared by the stable bandgap
reference voltage.
The RC oscillator provides these features:
●Nominal frequency 16 MHz
●±5% variation over voltage and temperature after process trim
●Clock output of the RC oscillator serves as system clock source in case loss of lock or
loss of clock is detected by the PLL
●RC oscillator is used as the default system clock during startup
1.5.12 Periodic interrupt timer (PIT)
The PIT module implements these features:
●4 general purpose interrupt timers
●32-bit counter resolution
●Clocked by system clock frequency
●Each channel can be used as trigger for a DMA request
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1.5.13 System timer module (STM)
The STM module implements these features:
●One 32-bit up counter with 8-bit prescaler
●Four 32-bit compare channels
●Independent interrupt source for each channel
●Counter can be stopped in debug mode
1.5.14 Software watchdog timer (SWT)
The SWT has the following features:
●32-bit time-out register to set the time-out period
●Programmable selection of system or oscillator clock for timer operation
●Programmable selection of window mode or regular servicing
●Programmable selection of reset or interrupt on an initial time-out
●Master access protection
●Hard and soft configuration lock bits
●Reset configuration inputs allow timer to be enabled out of reset
1.5.15 Fault collection unit (FCU)
The FCU provides an independent fault reporting mechanism even if the CPU is
malfunctioning.
The FCU module has the following features:
●FCU status register reporting the device status
●Continuous monitoring of critical fault signals
●User selection of critical signals from different fault sources inside the device
●Critical fault events trigger 2 external pins (user selected signal protocol) that can be
used externally to reset the device and/or other circuitry (for example, safety relay or
FlexRay transceiver)
●Faults are latched into a register
1.5.16 System integration unit – Lite (SIUL)
The SPC560P44Lx, SPC560P50Lx SIUL controls MCU pad configuration, external
interrupt, general purpose I/O (GPIO), and internal peripheral multiplexing.
The pad configuration block controls the static electrical characteristics of I/O pins. The
GPIO block provides uniform and discrete input/output control of the I/O pins of the MCU.
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The SIU provides the following features:
●Centralized general purpose input output (GPIO) control of as many as 80 input/output
pins and 26 analog input-only pads (package dependent)
●All GPIO pins can be independently configured to support pull-up, pull down, or no pull
●Reading and writing to GPIO supported both as individual pins and 16-bit wide ports
●All peripheral pins (except ADC channels) can be alternatively configured as both
general purpose input or output pins
●ADC channels support alternative configuration as general purpose inputs
●Direct readback of the pin value is supported on all pins through the SIUL
●Configurable digital input filter that can be applied to some general purpose input pins
for noise elimination: as many as 4 internal functions can be multiplexed onto 1 pin
1.5.17 Boot and censorship
Different booting modes are available in the SPC560P44Lx, SPC560P50Lx: booting from
internal flash memory and booting via a serial link.
The default booting scheme uses the internal flash memory (an internal pull-down is used to
select this mode). Optionally, the user can boot via FlexCAN or LINFlex (using the boot
assist module software).
A censorship scheme is provided to protect the content of the flash memory and offer
increased security for the entire device.
A password mechanism is designed to grant the legitimate user access to the non-volatile
memory.
Boot assist module (BAM)
The BAM is a block of read-only one-time programmed memory and is identical for all
SPC560Pxx devices that are based on the e200z0h core. The BAM program is executed
every time the device is powered on if the alternate boot mode has been selected by the
user.
The BAM provides the following features:
●Serial bootloading via FlexCAN or LINFlex
●Ability to accept a password via the used serial communication channel to grant the
legitimate user access to the non-volatile memory
1.5.18 Error correction status module (ECSM)
The ECSM provides a myriad of miscellaneous control functions regarding program-visible
information about the platform configuration and revision levels, a reset status register, a
software watchdog timer, wakeup control for exiting sleep modes, and information on
platform memory errors reported by error-correcting codes and/or generic access error
information for certain processor cores.
The Error Correction Status Module supports a number of miscellaneous control functions
for the platform. The ECSM includes these features:
●Registers for capturing information on platform memory errors if error-correcting codes
(ECC) are implemented
●For test purposes, optional registers to specify the generation of double-bit memory
errors are enabled on the SPC560P44Lx, SPC560P50Lx.
●Checker applied on PBRIDGE output toward periphery
●Byte endianess swap capability
1.5.20 Controller area network (FlexCAN)
The SPC560P44Lx, SPC560P50Lx MCU contains one controller area network (FlexCAN)
module. This module is a communication controller implementing the CAN protocol
according to Bosch Specification version 2.0B. The CAN protocol was designed to be used
primarily as a vehicle serial data bus, meeting the specific requirements of this field: realtime processing, reliable operation in the EMI environment of a vehicle, cost-effectiveness
and required bandwidth. The FlexCAN module contains 32 message buffers.
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The FlexCAN module provides the following features:
●Full implementation of the CAN protocol specification, version 2.0B
–Standard data and remote frames
–Extended data and remote frames
–Up to 8-bytes data length
–Programmable bit rate up to 1 Mbit/s
●32 message buffers of up to 8-bytes data length
●Each message buffer configurable as Rx or Tx, all supporting standard and extended
●Programmable transmit-first scheme: lowest ID or lowest buffer number
●Time stamp based on 16-bit free-running timer
●Global network time, synchronized by a specific message
●Maskable interrupts
●Independent of the transmission medium (an external transceiver is assumed)
●High immunity to EMI
●Short latency time due to an arbitration scheme for high-priority messages
●Transmit features
–Supports configuration of multiple mailboxes to form message queues of scalable
depth
–Arbitration scheme according to message ID or message buffer number
–Internal arbitration to guarantee no inner or outer priority inversion
–Transmit abort procedure and notification
●Receive features
–Individual programmable filters for each mailbox
–8 mailboxes configurable as a six-entry receive FIFO
–8 programmable acceptance filters for receive FIFO
●Programmable clock source
–System clock
–Direct oscillator clock to avoid PLL jitter
1.5.21 Safety port (FlexCAN)
The SPC560P44Lx, SPC560P50Lx MCU has a second CAN controller synthesized to run at
high bit rates to be used as a safety port. The CAN module of the safety port provides the
following features:
●Identical to the FlexCAN module
●Bit rate as fast as 7.5 Mbit/s at 60 MHz CPU clock using direct connection between
CAN modules (no physical transceiver required)
●32 message buffers of up to 8 bytes data length
●Can be used as a second independent CAN module
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1.5.22 FlexRay
The FlexRay module provides the following features:
●Full implementation of FlexRay Protocol Specification 2.1
●32 configurable message buffers can be handled
●Dual channel or single channel mode of operation, each as fast as 10 Mbit/s data rate
●Message buffers configurable as Tx, Rx or RxFIFO
●Message buffer size configurable
●Message filtering for all message buffers based on FrameID, cycle count and message
ID
●Programmable acceptance filters for RxFIFO message buffers
1.5.23 Serial communication interface module (LINFlex)
The LINFlex (local interconnect network flexible) on the SPC560P44Lx, SPC560P50Lx
features the following:
●Supports LIN Master mode, LIN Slave mode and UART mode
●LIN state machine compliant to LIN1.3, 2.0, and 2.1 specifications
●Handles LIN frame transmission and reception without CPU intervention
●LIN features
–Autonomous LIN frame handling
–Message buffer to store Identifier and as much as 8 data bytes
–Supports message length as long as 64 bytes
–Detection and flagging of LIN errors (sync field, delimiter, ID parity, bit framing,
checksum, and time-out)
–Classic or extended checksum calculation
–Configurable Break duration as long as 36-bit times
–Diagnostic features: Loop back; Self Test; LIN bus stuck dominant detection
–Interrupt-driven operation with 16 interrupt sources
●LIN slave mode features
–Autonomous LIN header handling
–Autonomous LIN response handling
●UART mode
–Full-duplex operation
–Standard non return-to-zero (NRZ) mark/space format
–Data buffers with 4-byte receive, 4-byte transmit
–Configurable word length (8-bit or 9-bit words)
–Error detection and flagging
–Parity, Noise and Framing errors
–Interrupt-driven operation with four interrupt sources
–Separate transmitter and receiver CPU interrupt sources
–16-bit programmable baud-rate modulus counter and 16-bit fractional
–2 receiver wake-up methods
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1.5.24 Deserial serial peripheral interface (DSPI)
The deserial serial peripheral interface (DSPI) module provides a synchronous serial
interface for communication between the SPC560P44Lx, SPC560P50Lx MCU and external
devices.
The DSPI modules provide these features:
●Full duplex, synchronous transfers
●Master or slave operation
●Programmable master bit rates
●Programmable clock polarity and phase
●End-of-transmission interrupt flag
●Programmable transfer baud rate
●Programmable data frames from 4 to 16 bits
●Up to 20 chip select lines available
–8 on DSPI_0
–4 each on DSPI_1, DSPI_2 and DSPI_3
●8 clock and transfer attributes registers
●Chip select strobe available as alternate function on one of the chip select pins for
deglitching
●FIFOs for buffering as many as 5 transfers on the transmit and receive side
●Queueing operation possible through use of the eDMA
●General purpose I/O functionality on pins when not used for SPI
1.5.25 Pulse width modulator (FlexPWM)
The pulse width modulator module (PWM) contains four PWM submodules, each capable of
controlling a single half-bridge power stage. There are also four fault channels.
This PWM is capable of controlling most motor types: AC induction motors (ACIM),
permanent magnet AC motors (PMAC), both brushless (BLDC) and brush DC motors
(BDC), switched (SRM) and variable reluctance motors (VRM), and stepper motors.
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The FlexPWM block implements the following features:
●16-bit resolution for center, edge-aligned, and asymmetrical PWMs
●Maximum operating clock frequency of 120 MHz
●PWM outputs can operate as complementary pairs or independent channels
●Can accept signed numbers for PWM generation
●Independent control of both edges of each PWM output
●Synchronization to external hardware or other PWM supported
●Double buffered PWM registers
–Integral reload rates from 1 to 16
–Half cycle reload capability
●Multiple ADC trigger events can be generated per PWM cycle via hardware
●Write protection for critical registers
●Fault inputs can be assigned to control multiple PWM outputs
●Programmable filters for fault inputs
●Independently programmable PWM output polarity
●Independent top and bottom deadtime insertion
●Each complementary pair can operate with its own PWM frequency and deadtime
values
●Individual software-control for each PWM output
●All outputs can be programmed to change simultaneously via a “Force Out” event
●PWMX pin can optionally output a third PWM signal from each submodule
●Channels not used for PWM generation can be used for buffered output compare
functions
●Channels not used for PWM generation can be used for input capture functions
●Enhanced dual-edge capture functionality
●eDMA support with automatic reload
●2 fault inputs
●Capture capability for PWMA, PWMB, and PWMX channels not supported
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1.5.26 eTimer
The SPC560P44Lx, SPC560P50Lx includes two eTimer modules. Each module provides
six 16-bit general purpose up/down timer/counter units with the following features:
●Maximum operating clock frequency of 120 MHz
●Individual channel capability
–Input capture trigger
–Output compare
–Double buffer (to capture rising edge and falling edge)
–Result alignment circuitry (left justified; right justified)
–32-bit read mode allows to have channel ID on one of the 16-bit part
–DMA compatible interfaces
1.5.28 Cross triggering unit (CTU)
The cross triggering unit allows automatic generation of ADC conversion requests on user
selected conditions without CPU load during the PWM period and with minimized CPU load
for dynamic configuration.
It implements the following features:
●Double buffered trigger generation unit with as many as eight independent triggers
generated from external triggers
●Trigger generation unit configurable in sequential mode or in triggered mode
●Each Trigger can be appropriately delayed to compensate the delay of external low
pass filter
●Double buffered global trigger unit allowing eTimer synchronization and/or ADC
command generation
●Double buffered ADC command list pointers to minimize ADC-trigger unit update
●Double buffered ADC conversion command list with as many as 24 ADC commands
●Each trigger has the capability to generate consecutive commands
●ADC conversion command allows to control ADC channel from each ADC, single or
synchronous sampling, independent result queue selection
1.5.29 Nexus development interface (NDI)
The NDI (Nexus Development Interface) block provides real-time development support
capabilities for the SPC560P44Lx, SPC560P50Lx Power Architecture based MCU in
compliance with the IEEE-ISTO 5001-2003 standard. This development support is supplied
for MCUs without requiring external address and data pins for internal visibility. The NDI
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block is an integration of several individual Nexus blocks that are selected to provide the
development support interface for this device. The NDI block interfaces to the host
processor and internal busses to provide development support as per the IEEE-ISTO 50012003 Class 2+ standard. The development support provided includes access to the MCU’s
internal memory map and access to the processor’s internal registers during run time.
The Nexus Interface provides the following features:
●Configured via the IEEE 1149.1
●All Nexus port pins operate at V
●Nexus 2+ features supported
(no dedicated power supply)
DDIO
–Static debug
–Watchpoint messaging
–Ownership trace messaging
–Program trace messaging
–Real time read/write of any internally memory mapped resources through JTAG
pins
–Overrun control, which selects whether to stall before Nexus overruns or keep
executing and allow overwrite of information
–Watchpoint triggering, watchpoint triggers program tracing
●Auxiliary Output Port
–4 MDO (Message Data Out) pins
–MCKO (Message Clock Out) pin
–2 MSEO
–EVTO
●Auxiliary Input Port
–EVTI
(Message Start/End Out) pins
(Event Out) pin
(Event In) pin
1.5.30 Cyclic redundancy check (CRC)
The CRC computing unit is dedicated to the computation of CRC off-loading the CPU. The
CRC module features:
●Support for CRC-16-CCITT (x25 protocol):
16
–x
●Support for CRC-32 (Ethernet protocol):
–x
●Zero wait states for each write/read operations to the CRC_CFG and CRC_INP
The JTAG controller (JTAGC) block provides the means to test chip functionality and
connectivity while remaining transparent to system logic when not in test mode. All data
input to and output from the JTAGC block is communicated in serial format. The JTAGC
block is compliant with the IEEE standard.
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The JTAG controller provides the following features:
●IEEE Test Access Port (TAP) interface with 4 pins (TDI, TMS, TCK, TDO)
●Selectable modes of operation include JTAGC/debug or normal system operation.
●A 5-bit instruction register that supports the following IEEE 1149.1-2001 defined
instructions:
–BYPASS, IDCODE, EXTEST, SAMPLE, SAMPLE/PRELOAD
●A 5-bit instruction register that supports the additional following public instructions:
–ACCESS_AUX_TAP_NPC, ACCESS_AUX_TAP_ONCE
●3 test data registers: a bypass register, a boundary scan register, and a device
identification register.
●A TAP controller state machine that controls the operation of the data registers,
instruction register and associated circuitry.
1.5.32 On-chip voltage regulator (VREG)
The on-chip voltage regulator module provides the following features:
Note: Availability of port pin alternate functions depends on product selection.
Figure 4.100-pin LQFP pinout – Full featured configuration (top view)
2.2 Pin description
2.2.1 Power supply and reference voltage pins
The following sections provide signal descriptions and related information about the
functionality and configuration of the SPC560P44Lx, SPC560P50Lx devices.
Ta bl e 5 lists the power supply and reference voltage for the SPC560P44Lx, SPC560P50Lx
devices.
Doc ID 14723 Rev 831/115
Page 32
Package pinouts and signal descriptionsSPC560P44Lx, SPC560P50Lx
Table 5.Supply pins
SupplyPin
SymbolDescription100-pin144-pin
VREG control and power supply pins. Pins available on 100-pin and 144-pin package.
BCTRLVoltage regulator external NPN ballast base control pin4769
or 5.0 V)
(3.3 V
Voltage regulator supply voltage5072
V
DD_HV_REG
1.2 V decoupling pins for core logic and regulator feedback.
V
DD_LV_REGCOR
Decoupling capacitor must be connected between this pins
and V
SS_LV_REGCOR
.
4870
1.2 V decoupling pins for core logic and regulator feedback.
V
SS_LV_REGCOR
Decoupling capacitor must be connected between this pins
and V
DD_LV_REGCOR
.
4971
ADC_0/ADC_1 reference and supply voltage. Pins available on 100-pin and 144-pin package.
V
DD_HV_ADC0
V
SS_HV_ADC0
V
DD_HV_ADC1
V
SS_HV_ADC1
(1)
ADC_0 supply and high reference voltage3350
ADC_0 ground and low reference voltage3451
ADC_1 supply and high reference voltage3956
ADC_1 ground and low reference voltage4057
Power supply pins (3.3 V or 5.0 V). All pins available on 144-pin package.
; VSS) available on 100-pin package.
DD
V
DD_HV_IO0
V
SS_HV_IO0
V
DD_HV_IO1
V
SS_HV_IO1
V
DD_HV_IO2
V
SS_HV_IO2
V
DD_HV_IO3
V
SS_HV_IO3
V
DD_HV_FL
V
SS_HV_FL
V
DD_HV_OSC
V
SS_HV_OSC
Five pairs (V
(2)
Input/Output supply voltage—6
(2)
Input/Output ground—7
Input/Output supply voltage1321
Input/Output ground1422
Input/Output supply voltage6391
Input/Output ground6290
Input/Output supply voltage87126
Input/Output ground88127
Code and data flash supply voltage6997
Code and data flash supply ground6896
Crystal oscillator amplifier supply voltage1627
Crystal oscillator amplifier ground1728
Power supply pins (1.2 V). All pins available on 100-pin and 144-pin package.
1.2 V Decoupling pins for core logic. Decoupling capacitor
V
DD_LV_COR0
must be connected between these pins and the nearest
V
SS_LV_COR
pin.
1218
1.2 V Decoupling pins for core logic. Decoupling capacitor
V
SS_LV_COR0
must be connected between these pins and the nearest
V
DD_LV_COR
pin.
1117
32/115Doc ID 14723 Rev 8
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SPC560P44Lx, SPC560P50LxPackage pinouts and signal descriptions
Table 5.Supply pins (continued)
SupplyPin
SymbolDescription100-pin144-pin
1.2 V Decoupling pins for core logic. Decoupling capacitor
V
DD_LV_COR1
must be connected between these pins and the nearest
V
SS_LV_COR
pin.
1.2 V Decoupling pins for core logic. Decoupling capacitor
V
SS_LV_COR1
must be connected between these pins and the nearest
V
DD_LV_COR
pin.
1.2 V Decoupling pins for core logic. Decoupling capacitor
V
DD_LV_COR2
must be connected between these pins and the nearest
V
SS_LV_COR
pin.
1.2 V Decoupling pins for core logic. Decoupling capacitor
V
SS_LV_COR2
must be connected between these pins and the nearest
V
DD_LV_COR
pin.
1.2 V Decoupling pins for on-chip PLL modules. Decoupling
V
DD_LV_COR3
capacitor must be connected between this pin and
V
SS_LV_COR3
.
1.2 V Decoupling pins for on-chip PLL modules. Decoupling
V
SS_LV_COR3
1. Analog supply/ground and high/low reference lines are internally physically separate, but are shorted via a double-bonding
connection on V
2. Not available on 100-pin package.
capacitor must be connected between this pin and
V
DD_LV_COR3
DD_HV_ADCx/VSS_HV_ADCx
.
pins.
6593
6694
92131
93132
2536
2435
2.2.2 System pins
Ta bl e 5 and Ta bl e 6 contain information on pin functions for the SPC560P44Lx,
SPC560P50Lx devices. The pins listed in Ta bl e 6 are single-function pins. The pins shown
in Ta bl e 7 are multi-function pins, programmable via their respective Pad Configuration
Register (PCR) values.
Table 6.System pins
SymbolDescriptionDirection
MDO[0]Nexus Message Data Output—line 0Output onlyFast—9
NMINon-Maskable InterruptInput onlySlow—11
XTAL
EXTAL
Dedicated pins. Available on 100-pin and 144-pin package.
Analog output of the oscillator amplifier
circuit; needs to be grounded if oscillator
is used in bypass mode
– Analog input of oscillator amplifier
circuit, when oscillator not in bypass
mode
– Analog input for clock generator when
oscillator in bypass mode
Pad speed
(1)
Pin
SRC = 0 SRC = 1100-pin144-pin
———1829
———1930
Doc ID 14723 Rev 833/115
Page 34
Package pinouts and signal descriptionsSPC560P44Lx, SPC560P50Lx
Table 6.System pins (continued)
Pad speed
SymbolDescriptionDirection
SRC = 0 SRC = 1100-pin144-pin
TMSJTAG state machine controlBidirectionalSlowFast5987
TCKJTAG clockInput onlySlow—6088
TDITest Data InInput onlySlowMedium5886
TDOTest Data OutOutput onlySlowFast6189
Reset pin, available on 100-pin and 144-pin package.
RESET
VPP_TEST
1. SCR values refer to the value assigned to the Slew Rate Control bits of the pad configuration register.
Bidirectional reset with Schmitt trigger
characteristics and noise filter
Test pin, available on 100-pin and 144-pin package.
Pin for testing purpose only. To be tied
to ground in normal operating mode.
BidirectionalMedium—2031
———74107
(1)
Pin
2.2.3 Pin muxing
Ta bl e 7 defines the pin list and muxing for the SPC560P44Lx, SPC560P50Lx devices.
Each row of Ta bl e 7 shows all the possible ways of configuring each pin, via alternate
functions. The default function assigned to each pin after reset is the ALT0 function.
SPC560P44Lx, SPC560P50Lx devices provide four main I/O pad types, depending on the
associated functions:
●Slow pads are the most common, providing a compromise between transition time and
low electromagnetic emission.
●Medium pads provide fast enough transition for serial communication channels with
controlled current to reduce electromagnetic emission.
●Fast pads provide maximum speed. They are used for improved NEXUS debugging
capability.
●Symmetric pads are designed to meet FlexRay requirements.
Medium and Fast pads can use slow configuration to reduce electromagnetic emission, at
the cost of reducing AC performance. For more information, see the datasheet’s “Pad AC
Specifications” section.
34/115Doc ID 14723 Rev 8
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SPC560P44Lx, SPC560P50LxPackage pinouts and signal descriptions
Table 7.Pin muxing
Port
pin
Pad
configuration
register (PCR)
Alternate
function
A[0]PCR[0]
A[1]PCR[1]
(6)
(6)
(6)
PCR[2]
PCR[3]
PCR[4]
A[2]
A[3]
A[4]
(2)
ALT0
ALT1
ALT2
ALT3
—
ALT0
ALT1
ALT2
ALT3
—
ALT0
ALT1
ALT2
ALT3
—
—
—
ALT0
ALT1
ALT2
ALT3
—
—
ALT0
ALT1
ALT2
ALT3
—
—
(1),
FunctionsPeripheral
Port A (16-bit)
GPIO[0]
ETC[0]
SCK
F[0]
EIRQ[0]
GPIO[1]
ETC[1]
SOUT
F[1]
EIRQ[1]
GPIO[2]
ETC[2]
—
A[3]
SIN
ABS[0]
EIRQ[2]
GPIO[3]
ETC[3]
CS0
B[3]
ABS[2]
EIRQ[3]
GPIO[4]
ETC[0]
CS1
ETC[4]
FAB
EIRQ[4]
SIUL
eTimer_0
DSPI_2
FCU_0
SIUL
SIUL
eTimer_0
DSPI_2
FCU_0
SIUL
SIUL
eTimer_0
—
FlexPWM_0
DSPI_2
MC_RGM
SIUL
SIUL
eTimer_0
DSPI_2
FlexPWM_0
MC_RGM
SIUL
SIUL
eTimer_1
DSPI_2
eTimer_0
MC_RGM
SIUL
(3)
I/O
direction
(4)
I/O
I/O
O
O
I
I/O
I/O
O
O
I
I/O
I/O
—
O
I
I
I
I/O
I/O
I/O
O
I
I
I/O
I/O
O
I/O
I
I
Pad speed
(5)
Pin No.
SRC = 0SRC = 1
100-pin
SlowMedium5173
SlowMedium5274
SlowMedium5784
SlowMedium6492
SlowMedium75 108
144-pin
A[5]PCR[5]
A[6]PCR[6]
ALT0
ALT1
ALT2
ALT3
—
ALT0
ALT1
ALT2
ALT3
—
GPIO[5]
CS0
ETC[5]
CS7
EIRQ[5]
GPIO[6]
SCK
—
—
EIRQ[6]
SIUL
DSPI_1
eTimer_1
DSPI_0
SIUL
SIUL
DSPI_1
—
—
SIUL
I/O
I/O
I/O
O
I/O
I/O
—
—
SlowMedium814
I
SlowMedium22
I
Doc ID 14723 Rev 835/115
Page 36
Package pinouts and signal descriptionsSPC560P44Lx, SPC560P50Lx
Table 7.Pin muxing (continued)
Port
pin
Pad
configuration
register (PCR)
A[7]PCR[7]
A[8]PCR[8]
Alternate
function
(2)
ALT0
ALT1
ALT2
ALT3
—
ALT0
ALT1
ALT2
ALT3
—
—
(1),
FunctionsPeripheral
GPIO[7]
SOUT
—
—
EIRQ[7]
GPIO[8]
—
—
—
SIN
EIRQ[8]
SIUL
DSPI_1
—
—
SIUL
SIUL
—
—
—
DSPI_1
SIUL
(3)
I/O
direction
(4)
I/O
O
—
—
I
I/O
—
—
—
I
I
Pad speed
SRC = 0SRC = 1
SlowMedium410
SlowMedium612
(5)
Pin No.
100-pin
144-pin
A[9]PCR[9]
A[10]PCR[10]
A[11]PCR[11]
A[12]PCR[12]
A[13]PCR[13]
ALT0
ALT1
ALT2
ALT3
—
ALT0
ALT1
ALT2
ALT3
—
ALT0
ALT1
ALT2
ALT3
—
ALT0
ALT1
ALT2
ALT3
—
ALT0
ALT1
ALT2
ALT3
—
—
—
GPIO[9]
CS1
—
B[3]
FAULT[0]
GPIO[10]
CS0
B[0]
X[2]
EIRQ[9]
GPIO[11]
SCK
A[0]
A[2]
EIRQ[10]
GPIO[12]
SOUT
A[2]
B[2]
EIRQ[11]
GPIO[13]
—
B[2]
—
SIN
FAULT[0]
EIRQ[12]
SIUL
DSPI_2
—
FlexPWM_0
FlexPWM_0
SIUL
DSPI_2
FlexPWM_0
FlexPWM_0
SIUL
SIUL
DSPI_2
FlexPWM_0
FlexPWM_0
SIUL
SIUL
DSPI_2
FlexPWM_0
FlexPWM_0
SIUL
SIUL
—
FlexPWM_0
—
DSPI_2
FlexPWM_0
SIUL
I/O
O
—
O
I/O
I/O
O
I/O
I/O
I/O
O
O
I/O
O
O
O
I/O
—
O
—
SlowMedium94 134
I
SlowMedium81 118
I
SlowMedium82 120
I
SlowMedium83 122
I
SlowMedium95 136
I
I
I
36/115Doc ID 14723 Rev 8
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SPC560P44Lx, SPC560P50LxPackage pinouts and signal descriptions
Table 7.Pin muxing (continued)
Port
pin
Pad
configuration
register (PCR)
A[14]PCR[14]
A[15]PCR[15]
B[0]PCR[16]
B[1]PCR[17]
B[2]PCR[18]
B[3]PCR[19]
B[6]PCR[22]
Alternate
function
(2)
ALT0
ALT1
ALT2
ALT3
—
ALT0
ALT1
ALT2
ALT3
—
—
ALT0
ALT1
ALT2
ALT3
—
ALT0
ALT1
ALT2
ALT3
—
—
ALT0
ALT1
ALT2
ALT3
—
ALT0
ALT1
ALT2
ALT3
—
ALT0
ALT1
ALT2
ALT3
—
(1),
FunctionsPeripheral
GPIO[14]
TXD
ETC[4]
—
EIRQ[13]
GPIO[15]
—
ETC[5]
—
RXD
EIRQ[14]
Port B (16-bit)
GPIO[16]
TXD
ETC[2]
DEBUG[0]
EIRQ[15]
GPIO[17]
—
ETC[3]
DEBUG[1]
RXD
EIRQ[16]
GPIO[18]
TXD
—
DEBUG[2]
EIRQ[17]
GPIO[19]
—
—
DEBUG[3]
RXD
GPIO[22]
CLKOUT
CS2
—
EIRQ[18]
(3)
SIUL
Safety Port_0
eTimer_1
—
SIUL
SIUL
—
eTimer_1
—
Safety Port_0
SIUL
SIUL
FlexCAN_0
eTimer_1
SSCM
SIUL
SIUL
—
eTimer_1
SSCM
FlexCAN_0
SIUL
SIUL
LIN_0
—
SSCM
SIUL
SIUL
—
—
SSCM
LIN_0
SIUL
MC_CGL
DSPI_2
—
SIUL
I/O
direction
(4)
I/O
O
I/O
—
I
I/O
—
I/O
—
I
I
I/O
O
I/O
—
I
I/O
—
I/O
—
I
I
I/O
O
—
—
I
I/O
—
—
—
I
I/O
O
O
—
I
Pad speed
SRC = 0SRC = 1
SlowMedium99 143
SlowMedium100 144
SlowMedium76 109
SlowMedium77 110
SlowMedium79 114
SlowMedium80 116
SlowMedium96 138
(5)
Pin No.
100-pin
144-pin
Doc ID 14723 Rev 837/115
Page 38
Package pinouts and signal descriptionsSPC560P44Lx, SPC560P50Lx
Table 7.Pin muxing (continued)
Port
pin
Pad
configuration
register (PCR)
B[7]PCR[23]
Alternate
function
(2)
ALT0
ALT1
ALT2
ALT3
—
—
(1),
FunctionsPeripheral
GPIO[23]
—
—
—
AN[0]
RXD
SIUL
—
—
—
ADC_0
LIN_0
Pad speed
SRC = 0SRC = 1
(3)
I/O
direction
(4)
Input only——2943
(5)
Pin No.
100-pin
144-pin
B[8]PCR[24]
B[9]PCR[25]
B[10]PCR[26]
B[11]PCR[27]
B[12]PCR[28]
ALT0
ALT1
ALT2
ALT3
—
—
ALT0
ALT1
ALT2
ALT3
—
ALT0
ALT1
ALT2
ALT3
—
ALT0
ALT1
ALT2
ALT3
—
ALT0
ALT1
ALT2
ALT3
—
GPIO[24]
—
—
—
AN[1]
ETC[5]
GPIO[25]
—
—
—
AN[11]
GPIO[26]
—
—
—
AN[12]
GPIO[27]
—
—
—
AN[13]
GPIO[28]
—
—
—
AN[14]
SIUL
—
—
—
ADC_0
eTimer_0
SIUL
—
—
—
ADC_0 / ADC_1
SIUL
—
—
—
ADC_0 / ADC_1
SIUL
—
—
—
ADC_0 / ADC_1
SIUL
—
—
—
ADC_0 / ADC_1
Input only——3147
Input only——3552
Input only——3653
Input only——3754
Input only——3855
SIUL
—
—
—
ADC_1
LIN_1
B[13]PCR[29]
ALT0
ALT1
ALT2
ALT3
—
—
GPIO[29]
—
—
—
AN[0]
RXD
38/115Doc ID 14723 Rev 8
Input only——4260
Page 39
SPC560P44Lx, SPC560P50LxPackage pinouts and signal descriptions
Table 7.Pin muxing (continued)
Port
pin
Pad
configuration
register (PCR)
B[14]PCR[30]
B[15]PCR[31]
Alternate
function
(2)
ALT0
ALT1
ALT2
ALT3
—
—
—
ALT0
ALT1
ALT2
ALT3
—
—
(1),
FunctionsPeripheral
GPIO[30]
—
—
—
AN[1]
ETC[4]
EIRQ[19]
GPIO[31]
—
—
—
AN[2]
EIRQ[20]
Port C (16-bit)
SIUL
—
—
—
ADC_1
eTimer_0
SIUL
SIUL
—
—
—
ADC_1
SIUL
Pad speed
SRC = 0SRC = 1
(3)
I/O
direction
(4)
Input only——4464
Input only——4362
(5)
Pin No.
100-pin
144-pin
C[0]PCR[32]
C[1]PCR[33]
C[2]PCR[34]
C[3]PCR[35]
C[4]PCR[36]
ALT0
ALT1
ALT2
ALT3
—
ALT0
ALT1
ALT2
ALT3
—
ALT0
ALT1
ALT2
ALT3
—
ALT0
ALT1
ALT2
ALT3
—
ALT0
ALT1
ALT2
ALT3
—
GPIO[32]
—
—
—
AN[3]
GPIO[33]
—
—
—
AN[2]
GPIO[34]
—
—
—
AN[3]
GPIO[35]
CS1
ETC[4]
TXD
EIRQ[21]
GPIO[36]
CS0
X[1]
DEBUG[4]
EIRQ[22]
SIUL
—
—
—
ADC_1
SIUL
—
—
—
ADC_0
SIUL
—
—
—
ADC_0
SIUL
DSPI_0
eTimer_1
LIN_1
SIUL
SIUL
DSPI_0
FlexPWM_0
SSCM
SIUL
Input only——4566
Input only——2841
Input only——3045
I/O
O
I/O
SlowMedium1016
O
I
I/O
I/O
I/O
SlowMedium511
—
I
Doc ID 14723 Rev 839/115
Page 40
Package pinouts and signal descriptionsSPC560P44Lx, SPC560P50Lx
Table 7.Pin muxing (continued)
Port
pin
Pad
configuration
register (PCR)
C[5]PCR[37]
Alternate
function
(2)
ALT0
ALT1
ALT2
ALT3
—
—
(1),
FunctionsPeripheral
GPIO[37]
SCK
—
DEBUG[5]
FAULT[3]
EIRQ[23]
SIUL
DSPI_0
—
SSCM
FlexPWM_0
SIUL
(3)
I/O
direction
(4)
I/O
I/O
—
—
I
I
Pad speed
SRC = 0SRC = 1
SlowMedium713
(5)
Pin No.
100-pin
144-pin
C[6]PCR[38]
C[7]PCR[39]
C[8]PCR[40]
C[9]PCR[41]
C[10]PCR[42]
C[11]PCR[43]
C[12]PCR[44]
ALT0
ALT1
ALT2
ALT3
—
ALT0
ALT1
ALT2
ALT3
—
ALT0
ALT1
ALT2
ALT3
—
ALT0
ALT1
ALT2
ALT3
—
ALT0
ALT1
ALT2
ALT3
—
ALT0
ALT1
ALT2
ALT3
ALT0
ALT1
ALT2
ALT3
GPIO[38]
SOUT
B[1]
DEBUG[6]
EIRQ[24]
GPIO[39]
—
A[1]
DEBUG[7]
SIN
GPIO[40]
CS1
—
CS6
FAULT[2]
GPIO[41]
CS3
—
X[3]
FAULT[2]
GPIO[42]
CS2
—
A[3]
FAULT[1]
GPIO[43]
ETC[4]
CS2
CS0
GPIO[44]
ETC[5]
CS3
CS1
SIUL
DSPI_0
FlexPWM_0
SSCM
SIUL
SIUL
—
FlexPWM_0
SSCM
DSPI_0
SIUL
DSPI_1
—
DSPI_0
FlexPWM_0
SIUL
DSPI_2
—
FlexPWM_0
FlexPWM_0
SIUL
DSPI_2
—
FlexPWM_0
FlexPWM_0
SIUL
eTimer_0
DSPI_2
DSPI_3
SIUL
eTimer_0
DSPI_2
DSPI_3
I/O
I/O
O
—
I/O
—
O
—
I/O
O
—
O
I/O
O
—
I/O
I/O
O
—
O
I/O
I/O
O
I/O
I/O
I/O
O
O
SlowMedium98 142
I
SlowMedium915
I
SlowMedium91 130
I
SlowMedium84 123
I
SlowMedium78 111
I
SlowMedium5580
SlowMedium5682
40/115Doc ID 14723 Rev 8
Page 41
SPC560P44Lx, SPC560P50LxPackage pinouts and signal descriptions
Table 7.Pin muxing (continued)
Port
pin
Pad
configuration
register (PCR)
C[13]PCR[45]
Alternate
function
(2)
ALT0
ALT1
ALT2
ALT3
—
—
(1),
FunctionsPeripheral
GPIO[45]
ETC[1]
—
—
EXT_IN
EXT_SYNC
SIUL
eTimer_1
—
—
CTU_0
FlexPWM_0
(3)
I/O
direction
(4)
I/O
I/O
—
—
I
I
Pad speed
SRC = 0SRC = 1
SlowMedium71 101
(5)
Pin No.
100-pin
144-pin
C[14]PCR[46]
C[15]PCR[47]
D[0]PCR[48]
D[1]PCR[49]
D[2]PCR[50]
ALT0
ALT1
ALT2
ALT3
ALT0
ALT1
ALT2
ALT3
—
—
ALT0
ALT1
ALT2
ALT3
ALT0
ALT1
ALT2
ALT3
—
ALT0
ALT1
ALT2
ALT3
—
GPIO[46]
ETC[2]
EXT_TGR
—
GPIO[47]
CA_TR_EN
ETC[0]
A[1]
EXT_IN
EXT_SYNC
GPIO[48]
CA_TX
ETC[1]
B[1]
GPIO[49]
—
ETC[2]
EXT_TRG
CA_RX
GPIO[50]
—
ETC[3]
X[3]
CB_RX
SIUL
eTimer_1
CTU_0
—
SIUL
FlexRay_0
eTimer_1
FlexPWM_0
CTU_0
FlexPWM_0
Port D (16-bit)
SIUL
FlexRay_0
eTimer_1
FlexPWM_0
SIUL
—
eTimer_1
CTU_0
FlexRay_0
SIUL
—
eTimer_1
FlexPWM_0
FlexRay_0
I/O
I/O
O
—
I/O
O
I/O
O
I/O
O
I/O
O
I/O
—
I/O
O
I/O
—
I/O
I/O
SlowMedium72 103
SlowSymmetric 85 124
I
I
SlowSymmetric 86 125
SlowMedium33
I
SlowMedium97 140
I
D[3]PCR[51]
D[4]PCR[52]
ALT0
ALT1
ALT2
ALT3
ALT0
ALT1
ALT2
ALT3
GPIO[51]
CB_TX
ETC[4]
A[3]
GPIO[52]
CB_TR_EN
ETC[5]
B[3]
SIUL
FlexRay_0
eTimer_1
FlexPWM_0
SIUL
FlexRay_0
eTimer_1
FlexPWM_0
I/O
O
I/O
O
I/O
O
I/O
O
SlowSymmetric 89 128
SlowSymmetric 90 129
Doc ID 14723 Rev 841/115
Page 42
Package pinouts and signal descriptionsSPC560P44Lx, SPC560P50Lx
Table 7.Pin muxing (continued)
Port
pin
Pad
configuration
register (PCR)
D[5]PCR[53]
D[6]PCR[54]
D[7]PCR[55]
Alternate
function
(2)
ALT0
ALT1
ALT2
ALT3
ALT0
ALT1
ALT2
ALT3
—
ALT0
ALT1
ALT2
ALT3
—
(1),
FunctionsPeripheral
GPIO[53]
CS3
F[0]
SOUT
GPIO[54]
CS2
SCK
—
FAULT[1]
GPIO[55]
CS3
F[1]
CS4
SIN
SIUL
DSPI_0
FCU_0
DSPI_3
SIUL
DSPI_0
DSPI_3
—
FlexPWM_0
SIUL
DSPI_1
FCU_0
DSPI_0
DSPI_3
(3)
I/O
direction
(4)
I/O
O
O
O
I/O
O
I/O
—
I
I/O
O
O
O
I
Pad speed
SRC = 0SRC = 1
SlowMedium2233
SlowMedium2334
SlowMedium2637
(5)
Pin No.
100-pin
144-pin
D[8]PCR[56]
D[9]PCR[57]
D[10]PCR[58]
D[11]PCR[59]
D[12]PCR[60]
ALT0
ALT1
ALT2
ALT3
—
ALT0
ALT1
ALT2
ALT3
ALT0
ALT1
ALT2
ALT3
ALT0
ALT1
ALT2
ALT3
ALT0
ALT1
ALT2
ALT3
—
GPIO[56]
CS2
—
CS5
FAULT[3]
GPIO[57]
X[0]
TXD
—
GPIO[58]
A[0]
CS0
—
GPIO[59]
B[0]
CS1
SCK
GPIO[60]
X[1]
—
—
RXD
SIUL
DSPI_1
—
DSPI_0
FlexPWM_0
SIUL
FlexPWM_0
LIN_1
—
SIUL
FlexPWM_0
DSPI_3
—
SIUL
FlexPWM_0
DSPI_3
DSPI_3
SIUL
FlexPWM_0
—
—
LIN_1
I/O
O
—
O
I/O
I/O
O
—
I/O
O
I/O
—
I/O
O
O
I/O
I/O
I/O
—
—
SlowMedium2132
I
SlowMedium1526
SlowMedium5376
SlowMedium5478
SlowMedium7099
I
D[13]PCR[61]
ALT0
ALT1
ALT2
ALT3
GPIO[61]
A[1]
CS2
SOUT
SIUL
FlexPWM_0
DSPI_3
DSPI_3
42/115Doc ID 14723 Rev 8
I/O
O
O
O
SlowMedium6795
Page 43
SPC560P44Lx, SPC560P50LxPackage pinouts and signal descriptions
Table 7.Pin muxing (continued)
Port
pin
Pad
configuration
register (PCR)
D[14]PCR[62]
D[15]PCR[63]
Alternate
function
(2)
ALT0
ALT1
ALT2
ALT3
—
ALT0
ALT1
ALT2
ALT3
—
(1),
FunctionsPeripheral
GPIO[62]
B[1]
CS3
—
SIN
GPIO[63]
—
—
—
AN[4]
Port E(16-bit)
SIUL
FlexPWM_0
DSPI_3
—
DSPI_3
SIUL
—
—
—
ADC_1
Pad speed
SRC = 0SRC = 1
(3)
I/O
direction
(4)
I/O
O
O
SlowMedium73 105
—
I
Input only——4158
(5)
Pin No.
100-pin
144-pin
E[0]PCR[64]
E[1]PCR[65]
E[2]PCR[66]
E[3]PCR[67]
E[4]PCR[68]
ALT0
ALT1
ALT2
ALT3
—
ALT0
ALT1
ALT2
ALT3
—
ALT0
ALT1
ALT2
ALT3
—
ALT0
ALT1
ALT2
ALT3
—
ALT0
ALT1
ALT2
ALT3
—
GPIO[64]
—
—
—
AN[5]
GPIO[65]
—
—
—
AN[4]
GPIO[66]
—
—
—
AN[5]
GPIO[67]
—
—
—
AN[6]
GPIO[68]
—
—
—
AN[7]
SIUL
—
—
—
ADC_1
SIUL
—
—
—
ADC_0
SIUL
—
—
—
ADC_0
SIUL
—
—
—
ADC_0
SIUL
—
—
—
ADC_0
Input only——4668
Input only——2739
Input only——3249
Input only———40
Input only———42
Doc ID 14723 Rev 843/115
Page 44
Package pinouts and signal descriptionsSPC560P44Lx, SPC560P50Lx
Table 7.Pin muxing (continued)
Port
pin
Pad
configuration
register (PCR)
E[5]PCR[69]
E[6]PCR[70]
E[7]PCR[71]
E[8]PCR[72]
E[9]PCR[73]
E[10]PCR[74]
E[11]PCR[75]
E[12]PCR[76]
Alternate
function
(2)
ALT0
ALT1
ALT2
ALT3
—
ALT0
ALT1
ALT2
ALT3
—
ALT0
ALT1
ALT2
ALT3
—
ALT0
ALT1
ALT2
ALT3
—
ALT0
ALT1
ALT2
ALT3
—
ALT0
ALT1
ALT2
ALT3
—
ALT0
ALT1
ALT2
ALT3
—
ALT0
ALT1
ALT2
ALT3
—
(1),
FunctionsPeripheral
GPIO[69]
—
—
—
AN[8]
GPIO[70]
—
—
—
AN[9]
GPIO[71]
—
—
—
AN[10]
GPIO[72]
—
—
—
AN[6]
GPIO[73]
—
—
—
AN[7]
GPIO[74]
—
—
—
AN[8]
GPIO[75]
—
—
—
AN[9]
GPIO[76]
—
—
—
AN[10]
SIUL
—
—
—
ADC_0
SIUL
—
—
—
ADC_0
SIUL
—
—
—
ADC_0
SIUL
—
—
—
ADC_1
SIUL
—
—
—
ADC_1
SIUL
—
—
—
ADC_1
SIUL
—
—
—
ADC_1
SIUL
—
—
—
ADC_1
Pad speed
SRC = 0SRC = 1
(3)
I/O
direction
(4)
Input only———44
Input only———46
Input only———48
Input only———59
Input only———61
Input only———63
Input only———65
Input only———67
(5)
Pin No.
100-pin
144-pin
44/115Doc ID 14723 Rev 8
Page 45
SPC560P44Lx, SPC560P50LxPackage pinouts and signal descriptions
Table 7.Pin muxing (continued)
Port
pin
Pad
configuration
register (PCR)
E[13]PCR[77]
E[14]PCR[78]
E[15]PCR[79]
F[0]PCR[80]
F[1]PCR[81]
F[2]PCR[82]
Alternate
function
(2)
ALT0
ALT1
ALT2
ALT3
—
ALT0
ALT1
ALT2
ALT3
—
ALT0
ALT1
ALT2
ALT3
—
—
ALT0
ALT1
ALT2
ALT3
—
ALT0
ALT1
ALT2
ALT3
—
ALT0
ALT1
ALT2
ALT3
(1),
FunctionsPeripheral
GPIO[77]
SCK
—
—
EIRQ[25]
GPIO[78]
SOUT
—
—
EIRQ[26]
GPIO[79]
—
—
—
SIN
EIRQ[27]
Port F (16-bit)
GPIO[80]
DBG0
CS3
—
EIRQ[28]
GPIO[81]
DBG1
CS2
—
EIRQ[29]
GPIO[82]
DBG2
CS1
—
SIUL
DSPI_3
—
—
SIUL
SIUL
DSPI_3
—
—
SIUL
SIUL
—
—
—
DSPI_3
SIUL
SIUL
FlexRay_0
DSPI_3
—
SIUL
SIUL
FlexRay_0
DSPI_3
—
SIUL
SIUL
FlexRay_0
DSPI_3
—
(3)
I/O
direction
(4)
I/O
I/O
—
—
I
I/O
O
—
—
I
I/O
—
—
—
I
I
I/O
O
O
—
I
I/O
O
O
—
I
I/O
O
O
—
Pad speed
SRC = 0SRC = 1
SlowMedium—117
SlowMedium—119
SlowMedium—121
SlowMedium—133
SlowMedium—135
SlowMedium—137
(5)
Pin No.
100-pin
144-pin
F[3]PCR[83]
F[4]PCR[84]
ALT0
ALT1
ALT2
ALT3
ALT0
ALT1
ALT2
ALT3
GPIO[83]
DBG3
CS0
—
GPIO[84]
MDO[3]
—
—
SIUL
FlexRay_0
DSPI_3
—
SIUL
NEXUS_0
—
—
I/O
O
I/O
—
I/O
O
—
—
SlowMedium—139
SlowFast—4
Doc ID 14723 Rev 845/115
Page 46
Package pinouts and signal descriptionsSPC560P44Lx, SPC560P50Lx
Table 7.Pin muxing (continued)
Port
pin
Pad
configuration
register (PCR)
F[5]PCR[85]
F[6]PCR[86]
Alternate
function
(2)
ALT0
ALT1
ALT2
ALT3
ALT0
ALT1
ALT2
ALT3
(1),
FunctionsPeripheral
GPIO[85]
MDO[2]
—
—
GPIO[86]
MDO[1]
—
—
SIUL
NEXUS_0
—
—
SIUL
NEXUS_0
—
—
(3)
I/O
direction
(4)
I/O
O
—
—
I/O
O
—
—
Pad speed
SRC = 0SRC = 1
SlowFast—5
SlowFast—8
(5)
Pin No.
100-pin
144-pin
F[7]PCR[87]
F[8]PCR[88]
F[9]PCR[89]
F[10]PCR[90]
F[11]PCR[91]
F[12]PCR[92]
ALT0
ALT1
ALT2
ALT3
ALT0
ALT1
ALT2
ALT3
ALT0
ALT1
ALT2
ALT3
ALT0
ALT1
ALT2
ALT3
ALT0
ALT1
ALT2
ALT3
—
ALT0
ALT1
ALT2
ALT3
GPIO[87]
MCKO
—
—
GPIO[88]
MSEO1
—
—
GPIO[89]
MSEO0
—
—
GPIO[90]
EVTO
—
—
GPIO[91]
—
—
—
EVTI
GPIO[92]
ETC[3]
—
—
SIUL
NEXUS_0
—
—
SIUL
NEXUS_0
—
—
SIUL
NEXUS_0
—
—
SIUL
NEXUS_0
—
—
SIUL
—
—
—
NEXUS_0
SIUL
eTimer_1
—
—
I/O
O
—
—
I/O
O
—
—
I/O
O
—
—
I/O
O
—
—
I/O
—
—
—
I/O
I/O
—
—
SlowFast—19
SlowFast—20
SlowFast—23
SlowFast—24
SlowMedium—25
I
SlowMedium—106
F[13]PCR[93]
ALT0
ALT1
ALT2
ALT3
GPIO[92]
ETC[4]
—
—
SIUL
eTimer_1
—
—
46/115Doc ID 14723 Rev 8
I/O
I/O
—
—
SlowMedium—112
Page 47
SPC560P44Lx, SPC560P50LxPackage pinouts and signal descriptions
Table 7.Pin muxing (continued)
Port
pin
Pad
configuration
register (PCR)
F[14]PCR[94]
F[15]PCR[95]
Alternate
function
(2)
ALT0
ALT1
ALT2
ALT3
ALT0
ALT1
ALT2
ALT3
—
(1),
FunctionsPeripheral
GPIO[94]
TXD
—
—
GPIO[95]
—
—
—
RXD
Port G (12-bit)
SIUL
LIN_1
—
—
SIUL
—
—
—
LIN_1
(3)
I/O
direction
(4)
I/O
O
—
—
I/O
—
—
—
I
Pad speed
SRC = 0SRC = 1
SlowMedium—115
SlowMedium—113
(5)
Pin No.
100-pin
144-pin
G[0]PCR[96]
G[1]PCR[97]
G[2]PCR[98]
G[3]PCR[99]
G[4]PCR[100]
G[5]PCR[101]
G[6]PCR[102]
ALT0
ALT1
ALT2
ALT3
—
ALT0
ALT1
ALT2
ALT3
—
ALT0
ALT1
ALT2
ALT3
ALT0
ALT1
ALT2
ALT3
ALT0
ALT1
ALT2
ALT3
ALT0
ALT1
ALT2
ALT3
ALT0
ALT1
ALT2
ALT3
GPIO[96]
F[0]
—
—
EIRQ[30]
GPIO[97]
F[1]
—
—
EIRQ[31]
GPIO[98]
X[2]
—
—
GPIO[99]
A[2]
—
—
GPIO[100]
B[2]
—
—
GPIO[101]
X[3]
—
—
GPIO[102]
A[3]
—
—
SIUL
FCU_0
—
—
SIUL
SIUL
FCU_0
—
—
SIUL
SIUL
FlexPWM_0
—
—
SIUL
FlexPWM_0
—
—
SIUL
FlexPWM_0
—
—
SIUL
FlexPWM_0
—
—
SIUL
FlexPWM_0
—
—
I/O
O
—
—
I/O
O
—
—
I/O
I/O
—
—
I/O
O
—
—
I/O
O
—
—
I/O
I/O
—
—
I/O
O
—
—
SlowMedium—38
I
SlowMedium—141
I
SlowMedium—102
SlowMedium—104
SlowMedium—100
SlowMedium—85
SlowMedium—98
Doc ID 14723 Rev 847/115
Page 48
Package pinouts and signal descriptionsSPC560P44Lx, SPC560P50Lx
Table 7.Pin muxing (continued)
Port
pin
Pad
configuration
register (PCR)
G[7]PCR[103]
G[8]PCR[104]
G[9]PCR[105]
Alternate
function
(2)
ALT0
ALT1
ALT2
ALT3
ALT0
ALT1
ALT2
ALT3
—
ALT0
ALT1
ALT2
ALT3
—
(1),
FunctionsPeripheral
GPIO[103]
B[3]
—
—
GPIO[104]
—
—
—
FAULT[0]
GPIO[105]
—
—
—
FAULT[1]
SIUL
FlexPWM_0
—
—
SIUL
—
—
—
FlexPWM_0
SIUL
—
—
—
FlexPWM_0
(3)
I/O
direction
(4)
I/O
O
—
—
I/O
—
—
—
I
I/O
—
—
—
I
Pad speed
SRC = 0SRC = 1
SlowMedium—83
SlowMedium—81
SlowMedium—79
(5)
Pin No.
100-pin
144-pin
ALT0
ALT1
G[10]PCR[106]
ALT2
ALT3
—
ALT0
ALT1
G[11]PCR[107]
ALT2
ALT3
—
1. ALT0 is the primary (default) function for each port after reset.
2. Alternate functions are chosen by setting the values of the PCR[PA] bitfields inside the SIU module.
PCR[PA] = 00 ALT0; PCR[PA] = 01 ALT1; PCR[PA] = 10 ALT2; PCR[PA] = 11 ALT3. This is intended to select
the output functions; to use one of the input-only functions, the PCR[IBE] bit must be written to ‘1’, regardless of the values
selected in the PCR[PA] bitfields. For this reason, the value corresponding to an input only function is reported as “—”.
3. Module included on the MCU.
4. Multiple inputs are routed to all respective modules internally. The input of some modules must be configured by setting the
values of the PSMI[PADSELx] bitfields inside the SIUL module.
5. Programmable via the SRC (Slew Rate Control) bits in the respective Pad Configuration Register.
This section contains device electrical characteristics as well as temperature and power
considerations.
This microcontroller contains input protection against damage due to high static voltages.
However, it is advisable to take precautions to avoid application of any voltage higher than
the specified maximum rated voltages.
To enhance reliability, unused inputs can be driven to an appropriate logic voltage level
(V
or VSS). This can be done by the internal pull-up or pull-down resistors, which are
DD
provided by the device for most general purpose pins.
The following tables provide the device characteristics and its demands on the system.
In the tables where the device logic provides signals with their respective timing
characteristics, the symbol “CC” for Controller Characteristics is included in the Symbol
column.
In the tables where the external system must provide signals with their respective timing
characteristics to the device, the symbol “SR” for System Requirement is included in the
Symbol column.
Caution:All of the following parameter values can vary depending on the application and must be
confirmed during silicon characterization or silicon reliability trial.
3.2Parameter classification
The electrical parameters are guaranteed by various methods. To give the customer a
better understanding, the classifications listed in Ta b le 8 are used and the parameters are
tagged accordingly in the tables where appropriate.
Table 8.Parameter classifications
Classification tagTag description
Note:The classification is shown in the column labeled “C” in the parameter tables where
PThose parameters are guaranteed during production testing on each individual device.
C
T
DThose parameters are derived mainly from simulations.
Those parameters are achieved by the design characterization by measuring a statistically
relevant sample size across process variations.
Those parameters are achieved by design characterization on a small sample size from typical
devices under typical conditions unless otherwise noted. All values shown in the typical
column are within this category.
1. Functional operating conditions are given in the DC electrical characteristics. Absolute maximum ratings are stress ratings
only, and functional operation at the maxima is not guaranteed. Stress beyond the listed maxima may affect device
reliability or cause permanent damage to the device.
2. Absolute maximum voltages are currently maximum burn-in voltages. Absolute maximum specifications for device stress
have not yet been determined.
3. The difference between each couple of voltage supplies must be less than 300 mV,
|V
DD_HV_IOy
4. The difference between ADC voltage supplies must be less than 100 mV, |V
5. Guaranteed by device validation
6. Not allowed to refer this voltage to V
7. Not allowed to refer this voltage to V
Injected input current on any pin
SR
during overload condition
Absolute sum of all injected input
SR
currents during overload condition
Low voltage static current sink
SR
through V
DD_LV
SR Storage temperature—–55150°C
SR Junction temperature under bias—–40150°C
– V
DD_HV_IOx
| < 300 mV.
DD_HV_ADV1
DD_HV_ADV0
, V
SS_HV_ADV1
, V
SS_HV_ADV0
>
V
SS_HV_ADV0
V
0.3
<
>
V
V
SS_HV_ADV0
SS_HV_ADV1
V
V
0.3
<
V
SS_HV_ADV1
V
—–1010mA
—–5050 mA
——155mA
DD_HV_ADC1
– V
DD_HV_ADC0
(2)
DD_HV_ADV0
0.3
DD_HV_ADV0
DD_HV_ADV1
0.3
DD_HV_ADV1
| < 100 mV.
+
+
Unit
V
V
V
V
Figure 5 shows the constraints of the different power supplies.
1. Parametric figures can be out of specification when voltage drops below 4.5 V, however, guaranteeing the full functionality.
In particular, ADC electrical characteristics and I/Os DC electrical specification may not be guaranteed.
2. The difference between each couple of voltage supplies must be less than 100 mV, |V
3. The difference between ADC voltage supplies must be less than 100 mV, |V
4. To be connected to emitter of external NPN. Low voltage supplies are not under user control—they are produced by an onchip voltage regulator—but for the device to function properly the low voltage grounds (V
voltage grounds (V
emitter.
5. The low voltage supplies (V
V
DD_LV_COR1
and V
SS_HV_xxx
DD_LV_COR2
voltage supply to the data flash module. Similarly, V
V
DD_LV_REGCOR
Table 11.Recommended operating conditions (3.3 V)
and V
) and the low voltage supply pins (V
DD_LV_xxx
) are not all independent.
are shorted internally via double bonding connections with lines that provide the low
Note: IO AC and DC characteristics are guaranteed only in the range of 3.0–3.6 V when
PAD3V5V is low, and in the range of 4.5–5.5 V when PAD3V5V is high.
1. Parametric figures can be out of specification when voltage drops below 4.5 V, however, guaranteeing the full functionality.
In particular, ADC electrical characteristics and I/Os DC electrical specification may not be guaranteed.
2. The difference between each couple of voltage supplies must be less than 100 mV, |V
3. The difference between each couple of voltage supplies must be less than 100 mV, |V
mV. As long as that condition is met, ADC_0 and ADC_1 can be operated at 5 V with the rest of the device operating at 3.3
V.
4. To be connected to emitter of external NPN. Low voltage supplies are not under user control—they are produced by an onchip voltage regulator—but for the device to function properly the low voltage grounds (V
voltage grounds (V
emitter.
SS_HV_xxx
5. The low voltage supplies (V
V
DD_LV_COR1
and V
DD_LV_COR2
voltage supply to the data flash module. Similarly, V
V
DD_LV_REGCOR
and V
) and the low voltage supply pins (V
DD_LV_xxx
) are not all independent.
are shorted internally via double bonding connections with lines that provide the low
DD_LV_REGCORx
are physically shorted internally, as are V
DD_LV_xxx
SS_LV_COR1
) must be connected to the external ballast
and V
DD_HV_IOy
DD_HV_ADC1
SS_LV_COR2
SS_LV_REGCOR
– V
DD_HV_IOx
– V
SS_LV_xxx
) must be shorted to high
are internally shorted.
| < 100 mV.
DD_HV_ADC0
and V
SS_LV_CORx
Unit
°C
| < 100
.
Figure 7 shows the constraints of the different power supplies.
2. Junction-to-board thermal resistance determined per JEDEC JESD51-8. Thermal test board meets JEDEC
specification for the specified package.
3. Junction-to-case at the top of the package determined using MIL-STD 883 Method 1012.1. The cold plate
temperature is used for the case temperature. Reported value includes the thermal resistance of the
interface layer.
4. Thermal characterization parameter indicating the temperature difference between the board and the
junction temperature per JEDEC JESD51-2. When Greek letters are not available, the thermal
characterization parameter is written as Psi-JB.
5. Thermal characterization parameter indicating the temperature difference between the case and the
junction temperature per JEDEC JESD51-2. When Greek letters are not available, the thermal
characterization parameter is written as Psi-JC.
Table 13.Thermal characteristics for 100-pin LQFP
SymbolParameterConditionsTypical value Unit
R
Thermal resistance junction-to-ambient,
JA
natural convection
(1)
Four layer board—2s2p35.3
Single layer board—1s47.3
(5)
(2)
Four layer board—2s2p19.1
Single layer board—1s9.7
(4)
Operating conditions19.1
Operating conditions0.8
R
R
JCtop
1. Junction-to-ambient thermal resistance determined per JEDEC JESD51-7. Thermal test board meets
JEDEC specification for this package.
2. Junction-to-board thermal resistance determined per JEDEC JESD51-8. Thermal test board meets JEDEC
specification for the specified package.
3. Junction-to-case at the top of the package determined using MIL-STD 883 Method 1012.1. The cold plate
temperature is used for the case temperature. Reported value includes the thermal resistance of the
interface layer.
4. Thermal characterization parameter indicating the temperature difference between the board and the
junction temperature per JEDEC JESD51-2. When Greek letters are not available, the thermal
characterization parameter is written as Psi-JB.
5. Thermal characterization parameter indicating the temperature difference between the case and the
junction temperature per JEDEC JESD51-2. When Greek letters are not available, the thermal
characterization parameter is written as Psi-JC.
Thermal resistance junction-to-board
JB
Thermal resistance junction-to-case
(3)
(top)
Junction-to-board, natural convection
JB
Junction-to-case, natural convection
JC
°C/
W
°C/
W
°C/
W
°C/
W
°C/
W
°C/
W
3.5.2 General notes for specifications at maximum junction temperature
An estimation of the chip junction temperature, TJ, can be obtained from Equation 1:
Equation 1 T
where:
T
A
R
JA
P
D
The junction to ambient thermal resistance is an industry standard value that provides a
quick and easy estimation of thermal performance. Unfortunately, there are two values in
common usage: the value determined on a single layer board and the value obtained on a
board with two planes. For packages such as the PBGA, these values can be different by a
factor of two. Which value is closer to the application depends on the power dissipated by
other components on the board. The value obtained on a single layer board is appropriate
for the tightly packed printed circuit board. The value obtained on the board with the internal
planes is usually appropriate if the board has low power dissipation and the components are
well separated.
When a heat sink is used, the thermal resistance is expressed in Equation 2 as the sum of a
junction to case thermal resistance and a case to ambient thermal resistance:
Equation 2 R
JA
= R
JC
+ R
CA
where:
R
= junction to ambient thermal resistance (°C/W)
JA
R
JC
R
CA
R
is device related and cannot be influenced by the user. The user controls the thermal
JC
environment to change the case to ambient thermal resistance, R
= junction to case thermal resistance (°C/W)
= case to ambient thermal resistance (°C/W)
. For instance, the user
CA
can change the size of the heat sink, the air flow around the device, the interface material,
the mounting arrangement on printed circuit board, or change the thermal dissipation on the
printed circuit board surrounding the device.
To determine the junction temperature of the device in the application when heat sinks are
not used, the Thermal Characterization Parameter (
) can be used to determine the
JT
junction temperature with a measurement of the temperature at the top center of the
package case using Equation 3:
Equation 3 T
= TT + (JT x PD)
J
where:
T
T
JT
P
D
= thermocouple temperature on top of the package (°C)
= thermal characterization parameter (°C/W)
= power dissipation in the package (W)
The thermal characterization parameter is measured per JESD51-2 specification using a 40
gauge type T thermocouple epoxied to the top center of the package case. The
thermocouple should be positioned so that the thermocouple junction rests on the package.
A small amount of epoxy is placed over the thermocouple junction and over about 1 mm of
wire extending from the junction. The thermocouple wire is placed flat against the package
case to avoid measurement errors caused by cooling effects of the thermocouple wire.
References:
Semiconductor Equipment and Materials International
3081 Zanker Road
San Jose, CA 95134U.S.A.
(408) 943-6900
MIL-SPEC and EIA/JESD (JEDEC) specifications are available from Global
Engineering Documents at 800-854-7179 or 303-397-7956.
JEDEC specifications are available on the WEB at http://www.jedec.org.
Device configuration, test
conditions and EM testing per
standard IEC61967-2
Supply voltage = 5 V DC
Ambient temperature = 25 °C
Worst-case orientation
8MHz
f
OSC
64 MHz
f
CPU
No PLL frequency
modulation
8MHz
f
OSC
64 MHz
f
CPU
1% PLL frequency
modulation
150 kHz–150 MHz16
150–1000 MHz15
IEC LevelM—
150 kHz–150 MHz15
150–1000 MHz14
IEC LevelM—
3.7 Electrostatic discharge (ESD) characteristics
Table 15.ESD ratings
SymbolParameterConditionsValueUnit
V
ESD(HBM)
V
ESD(CDM)
S
R
S
R
(1),(2)
Electrostatic discharge (Human Body Model)—2000V
750 (corners)
Electrostatic discharge (Charged Device Model)—
500 (other)
Level
(Max)
Unit
dBµV
dBµV
V
1. All ESD testing is in conformity with CDF-AEC-Q100 Stress Test Qualification for Automotive Grade Integrated Circuits.
2. A device will be defined as a failure if after exposure to ESD pulses the device no longer meets the device specification
requirements. Complete DC parametric and functional testing shall be performed per applicable device specification at
room temperature followed by hot temperature, unless specified otherwise in the device specification.
3.8 Power management electrical characteristics
3.8.1 Voltage regulator electrical characteristics
The internal voltage regulator requires an external NPN ballastto be connected as shownin
Figure 9. Ta bl e 1 6 contains all approved NPN ballast components. Capacitances should be
placed on the board as near as possible to the associated pins. Care should also be taken
Note:The voltage regulator output cannot be used to drive external circuits. Output pins are used
only for decoupling capacitances.
V
DD_LV_COR
not possible to provide V
must be generated using internal regulator and external NPN transistor. It is
DD_LV_COR
through external regulator.
For the SPC560P44Lx, SPC560P50Lxmicrocontroller, capacitors, with total values not
below C
ballast transistor emitter. 4 capacitors, with total values not below C
close to microcontroller pins between each V
V
DD_LV_REGCOR/VSS_LV_REGCOR
C
DEC3
, should be placed between V
DEC1
pair . Additionally, capacitors with total values not below
, should be placed between the V
DD_LV_CORx/VSS_LV_CORx
DD_LV_CORx/VSS_LV_CORx
DD_HV_REG/VSS_HV_REG
close to external
, should be placed
DEC2
supply pairs and the
pins close to ballast
collector. Capacitors values have to take into account capacitor accuracy, aging and
variation versus temperature.
All reported information are valid for voltage and temperature ranges described in
recommended operating condition, Ta bl e 1 0 and Ta b le 1 1 .
60/115Doc ID 14723 Rev 8
Figure 9.Configuration with resistor on base
Table 16.Approved NPN ballast components (configuration with resistor on base)
The device implements a Power-on Reset module to ensure correct power-up initialization,
as well as three low voltage detectors to monitor the V
device is supplied:
●POR monitors V
during the power-up phase to ensure device is maintained in a safe
DD
reset state
●LVDHV3 monitors V
●LVDHV5 monitors V
●LVDLVCOR monitors low voltage digital power domain
Table 19.Low voltage monitor electrical characteristics
to ensure device reset below minimum functional supply
DD
when application uses device in the 5.0 V ± 10 % range
DD
and the V
DD
voltage while
DD_LV
SymbolCParameter
V
PORH
V
PORUP
V
REGLVDMOK_H
V
REGLVDMOK_L
V
FLLVDMOK_H
V
FLLVDMOK_L
V
IOLVDMOK_H
V
IOLVDMOK_L
V
IOLVDM5OK_H
V
IOLVDM5OK_L
V
MLVDDOK_H
V
MLVDDOK_L
1. VDD = 3.3V ± 10% / 5.0V ± 10%, TA = –40 °C to T
TPower-on reset threshold—1.52.7V
PSupply for functional POR moduleTA = 25 °C1.0—V
PRegulator low voltage detector high threshold——2.95V
PRegulator low voltage detector low threshold—2.6—V
PFlash low voltage detector high threshold——2.95V
PFlash low voltage detector low threshold—2.6—V
PI/O low voltage detector high threshold——2.95V
PI/O low voltage detector low threshold—2.6—V
PI/O 5V low voltage detector high threshold——4.4V
PI/O 5V low voltage detector low threshold—3.8—V
PDigital supply low voltage detector high——1.145V
PDigital supply low voltage detector low—1.08—V
, unless otherwise specified
A MAX
3.9 Power up/down sequencing
Conditions
(1)
Value
Unit
MinMax
To prevent an overstress event or a malfunction within and outside the device, the
SPC560P44Lx, SPC560P50Lx implements the following sequence to ensure each module
is started only when all conditions for switching it ON are available:
●A POWER_ON module working on voltage regulator supply controls the correct start-
up of the regulator. This is a key module ensuring safe configuration for all voltage
regulator functionality when supply is below 1.5V. Associated POWER_ON (or POR)
signal is active low.
●Several low voltage detectors, working on voltage regulator supply monitor the voltage
of the critical modules (voltage regulator, I/Os, flash memory and low voltage domain).
LVDs are gated low when POWER_ON is active.
●A POWER_OK signal is generated when all critical supplies monitored by the LVD are
available. This signal is active high and released to all modules including I/Os, flash
Portions of the device configuration, such as high voltage supply, and watchdog
enable/disable after reset are controlled via bit values in the non-volatile user options
(NVUSRO) register.
For a detailed description of the NVUSRO register, please refer to the device reference
manual.
NVUSRO[PAD3V5V] field description
The DC electrical characteristics are dependent on the PAD3V5V bit value. Ta b le 2 0 shows
how NVUSRO[PAD3V5V] controls the device configuration.
Table 20.PAD3V5V field description
1. Default manufacturing value before flash initialization is ‘1’ (3.3 V).
3. Code fetched from RAM, PLL_0: 64 MHz system clock (x4 multiplier with 16 MHz XTAL), PLL_1 is ON at
PHI_div2 = 120 MHz and PHI_div3 = 80 MHz, auxiliary clock sources set that all peripherals receive maximum frequency,
all peripherals enabled.
4. Halt mode configurations: code fetched from RAM, code and data flash memories in low power mode, OSC/PLL_0/PLL_1
are OFF, core clock frozen, all peripherals are disabled.
5. STOP “P” mode Device Under Test (DUT) configuration: code fetched from RAM, code and data flash memories OFF,
OSC/PLL_0/PLL_1 are OFF, core clock frozen, all peripherals are disabled.
TOscillatorV
DD_OSC
at 5.0 V8 MHz2.63.2
3.10.3 DC electrical characteristics (3.3 V)
Ta bl e 2 3 gives the DC electrical characteristics at 3.3 V (3.0 V < V
3. Code fetched from RAM, PLL_0: 64 MHz system clock (x4 multiplier with 16 MHz XTAL), PLL_1 is ON at
PHI_div2 = 120 MHz and PHI_div3 = 80 MHz, auxiliary clock sources set that all peripherals receive maximum frequency,
all peripherals enabled.
4. Halt mode configurations: code fetched from RAM, code and data flash memories in low power mode, OSC/PLL_0/PLL_1
are OFF, core clock frozen, all peripherals are disabled.
5. STOP “P” mode Device Under Test (DUT) configuration: code fetched from RAM, code and data flash memories OFF,
OSC/PLL_0/PLL_1 are OFF, core clock frozen, all peripherals are disabled.
TOscillatorV
at 3.3V8MHz2.43
DD_OSC
3.10.4 Input DC electrical characteristics definition
Figure 14 shows the DC electrical characteristics behavior as function of time.
1. The start-up time is dependent upon crystal characteristics, board leakage, etc., high ESR and excessive
capacitive loads can cause long start-up time.
2. Value captured when amplitude reaches 90% of XTAL
3. “Loss of Reference Frequency” window is the reference frequency range outside of which the PLL is in self-clocked mode.
4. Self-clocked mode frequency is the frequency that the PLL operates at when the reference frequency falls outside the f
window.
5. f
VCO
mode.
6. This value is determined by the crystal manufacturer and board design.
7. Jitter is the average deviation from the programmed frequency measured over the specified interval at maximum f
Measurements are made with the device powered by filtered supplies and clocked by a stable external clock signal. Noise
injected into the PLL circuitry via V
percentage for a given interval.
8. Proper PC board layout procedures must be followed to achieve specifications.
9. Values are with frequency modulation disabled. If frequency modulation is enabled, jitter is the sum of C
fCS or f
10. Short term jitter is measured on the clock rising edge at cycle n and cycle n+4.
11. This value is determined by the crystal manufacturer and board design. For 4 MHz to 20 MHz crystals specified for this
PLL, load capacitors should not exceed these limits.
12. This specification applies to the period required for the PLL to relock after changing the MFD frequency control bits in the
synthesizer control register (SYNCR).
13. This value is true when operating at frequencies above 60 MHz, otherwise f
14. Modulation depth will be attenuated from depth setting when operating at modulation frequencies above 50 kHz.
DPLL lock time
D Duty cycle of reference
D Frequency LOCK range—66% f
D Frequency un-LOCK range—-1818% f
D Modulation depth
D Modulation frequency
= 1.2 V ±10%; VSS = 0 V; TA = –40 to 125 °C, unless otherwise specified
self clock range is 20–150 MHz. f
(depending on whether center spread or down spread modulation is enabled).
DS
(11), (12)
SCM
DDPLL
(14)
represents f
and V
SSPLL
(10)
f
maximum44%f
SYS
= 16 MHz
f
PLLIN
(resonator), f
PLLCLK
at
—10 ns
64 MHz, 4000 cycles
——200µs
—4060%
Center spread±0.25±4.0
(13)
Down spread0.58.0
——70kHz
after PLL output divider (ERFD) of 2 through 16 in enhanced
SYS
and variation in crystal oscillator frequency increase the C
Figure 15. ADC characteristics and error definitions
3.14.1 Input impedance and ADC accuracy
To preserve the accuracy of the A/D converter, it is necessary that analog input pins have
82/115Doc ID 14723 Rev 8
low AC impedance. Placing a capacitor with good high frequency characteristics at the input
pin of the device can be effective: the capacitor should be as large as possible, ideally
infinite. This capacitor contributes to attenuating the noise present on the input pin; further, it
sources charge during the sampling phase, when the analog signal source is a highimpedance source.
A real filter can typically be obtained by using a series resistance with a capacitor on the
input pin (simple RC filter). The RC filtering may be limited according to the source
impedance value of the transducer or circuit supplying the analog signal to be measured.
The filter at the input pins must be designed taking into account the dynamic characteristics
of the input signal (bandwidth) and the equivalent input impedance of the ADC itself.
In fact a current sink contributor is represented by the charge sharing effects with the
sampling capacitance: C
and CP2 being substantially two switched capacitances, with a
S
frequency equal to the ADC conversion rate, it can be seen as a resistive path to ground.
For instance, assuming a conversion rate of 1 MHz, with C
of 330 k is obtained (R
= 1 / (fc × (CS+CP2)), where fc represents the conversion rate at
EQ
equal to 3 pF, a resistance
S+CP2
the considered channel). To minimize the error induced by the voltage partitioning between
this resistance (sampled voltage on C
) and the sum of RS + RF, the external circuit
S+CP2
must be designed to respect the Equation 4:
Equation 4
Equation 4 generates a constraint for external network design, in particular on resistive
A second aspect involving the capacitance network shall be considered. Assuming the three
capacitances C
, CP1 and C
F
are initially charged at the source voltage VA (refer to the
P2
equivalent circuit reported in Figure 16): A charge sharing phenomenon is installed when
the sampling phase is started (A/D switch closed).
Figure 17. Transient behavior during sampling phase
In particular two different transient periods can be distinguished:
●A first and quick charge transfer from the internal capacitance C
sampling capacitance C
occurs (CS is supposed initially completely discharged):
S
and CP2 to the
P1
considering a worst case (since the time constant in reality would be faster) in which
C
is reported in parallel to C
P2
C
are in series, and the time constant is
S
(call CP = CP1 + CP2), the two capacitances CP and
P1
Equation 5
Equation 5 can again be simplified considering only CS as an additional worst
condition. In reality, the transient is faster, but the A/D converter circuitry has been
designed to be robust also in the very worst case: the sampling time T
is always much
S
longer than the internal time constant:
Equation 6
The charge of C
voltage V
A1
and CP2 is redistributed also on CS, determining a new value of the
were in parallel to CP1 (since the time constant in reality would be faster), the
S
(that is typically bigger than the on-chip
F
: again considering the worst case in which CP2
L
time constant is:
Equation 8
In this case, the time constant depends on the external circuit: in particular imposing
that the transient is completed well before the end of sampling time T
R
sizing is obtained:
L
, a constraints on
S
Equation 9
Of course, R
combination with R
definitively bigger than C
charge transfer transient) will be much higher than V
(charge balance assuming now C
shall be sized also according to the current limitation constraints, in
L
(source impedance) and RF (filter resistance). Being CF
S
, CP2 and CS, then the final voltage V
P1
already charged at VA1):
S
. Equation 10 must be respected
A1
(at the end of the
A2
Equation 10
The two transients above are not influenced by the voltage source that, due to the presence
of the R
C
with respect to the ideal source VA; the time constant RFCF of the filter is very high with
S
filter, is not able to provide the extra charge to compensate the voltage drop on
FCF
respect to the sampling time (T
Figure 18. Spectral representation of input signal
). The filter is typically designed to act as anti-aliasing.
Calling f0 the bandwidth of the source signal (and as a consequence the cut-off frequency of
the anti-aliasing filter, f
at least 2f
; it means that the constant time of the filter is greater than or at least equal to
0
twice the conversion period (T
sampling time T
S
), according to the Nyquist theorem the conversion rate fC must be
F
). Again the conversion period TC is longer than the
C
, which is just a portion of it, even when fixed channel continuous
conversion mode is selected (fastest conversion rate at a specific channel): in conclusion it
is evident that the time constant of the filter R
sampling time T
, so the charge level on CS cannot be modified by the analog signal source
S
is definitively much higher than the
FCF
during the time in which the sampling switch is closed.
The considerations above lead to impose new constraints on the external circuit, to reduce
the accuracy error due to the voltage drop on C
above, it is simple to derive Equation 11 between the ideal and real sampled voltage on C
; from the two charge balance equations
S
S
Equation 11
:
From this formula, in the worst case (when V
assuming to accept a maximum error of half a count, a constraint is evident on C
Equation 12
3.14.2 ADC conversion characteristics
Table 33.ADC conversion characteristics
SymbolCParameterConditions
V
INAN0
V
INAN1
f
CK
f
s
t
ADC_S
t
ADC_C
ADC0 and shared ADC0/1
SR
analog input voltage
ADC1 analog input voltage
SR
(4)
(2), (3)
(2),
—
—
ADC clock frequency
(depends on ADC
configuration)
1. Typical program and erase times assume nominal supply values and operation at 25 °C. All times are subject to change
pending device characterization.
3. The maximum program and erase times occur after the specified number of program/erase cycles. These maximum values
are characterized but not guaranteed.
4. Actual hardware programming times. This does not include software overhead.
5. Typical Bank programming time assumes that all cells are programmed in a single pulse. In reality some cells will require
more than one pulse, adding a small overhead to total bank programming time (see Initial Max column).
P Double Word (64 bits) Program Time
P Bank Program (512 KB)
P Bank Program (64 KB)
(4)(5)
(4)(5)
P 16 KB Block Pre-program and Erase Time—3005005000ms
P 32 KB Block Pre-program and Erase Time—4006005000ms
128 KB Block Pre-program and Erase
P
Time
(4)
—2250500µs
—1.451.6533s
—0.180.214.10s
—80013007500ms
(1)
Initial
max
(2)
Max
(3)
Unit
Table 35.Flash memory module life
Value
SymbolCParameterConditions
MinTyp
Number of program/erase cycles per block
P/EC
for 16 KB blocks over the operating
temperature range (T
)
J
—100000—cycles
Number of program/erase cycles per block
P/EC
for 32 KB blocks over the operating
temperature range (T
)
J
—10000100000 cycles
Number of program/erase cycles per block
P/EC
Retention C
1. Ambient temperature averaged over duration of application, not to exceed recommended product operating temperature
range.
for 128 KB blocks over the operating
temperature range (T
Minimum data retention at 85 °C average
ambient temperature