The ’LV165A devices are parallel-load, 8-bit shift
registers designed for 2-V to 5.5-V V
operation.
CC
When the device is clocked, data is shifted toward
the serial output Q
. Parallel-in access to each
H
stage is provided by eight individual direct data
inputs that are enabled by a low level at the
shift/load (SH/LD
) input. The ’LV165A devices
feature a clock inhibit function and a
complemented serial output Q
.
H
Clocking is accomplished by a low-to-high transition of the clock (CLK) input while SH/LD
E
5
F
6
NC
7
G
8
H
NC – No internal connection
CLK
3212019
910111213
H
Q
SH/LD
NC
NC
GND
CC
V
CLK INH
D
18
17
C
16
NC
15
B
14
A
H
Q
SER
is held high and clock
inhibit (CLK INH) is held low. The functions of the CLK and CLK INH inputs are interchangeable. Since a low
CLK input and a low-to-high transition of CLK INH accomplishes clocking, CLK INH should be changed to the
high level only while CLK is high. Parallel loading is inhibited when SH/LD
the register are enabled while SH/LD
is held low, independently of the levels of CLK, CLK INH, or SER.
is held high. The parallel inputs to
The SN54L V165A is characterized for operation over the full military temperature range of –55°C to 125°C. The
SN74LV165A is characterized for operation from –40°C to 85°C.
FUNCTION TABLE
INPUTS
SH/LDCLKCLK INH
LXXParallel load
HHXQ
HXHQ
HL↑Shift
H↑LShift
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
EPIC is a trademark of Texas Instruments Incorporated.
UNLESS OTHERWISE NOTED this document contains PRODUCTION
DATA information current as of publication date. Products conform to
specifications per the terms of Texas Instruments standard warranty.
Production processing does not necessarily include testing of all
parameters.
Pin numbers shown are for the D, DB, DGV , J, NS, PW, and W packages.
typical shift, load, and inhibit sequences
CLK
CLK INH
SER
SH/LD
A
L
H
S
1D
R
C1
S
1D
R
C1
S
1D
R
C1
S
1D
R
C1
S
1D
R
C1
9
Q
H
7
Q
H
Data
Inputs
B
C
D
E
F
G
H
Q
H
Q
H
L
H
L
H
L
H
H
L
H
H
L
L
H
L
H
L
H
L
H
L
H
L
H
Serial ShiftInhibit
Load
2
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
Page 3
UNIT
VIHHigh-level input voltage
V
VILLow-level input voltage
V
IOHHigh-level output current
IOLLow-level output current
SN54LV165A, SN74LV165A
PARALLEL-LOAD 8-BIT SHIFT REGISTERS
SCLS402B – APRIL 1998 – REVISED JUL Y 1998
absolute maximum ratings over operating free-air temperature range (unless otherwise noted)
Supply voltage range, V
Input voltage range, V
Output voltage range, V
Input clamp current, I
Output clamp current, I
Continuous output current, I
Continuous current through V
Package thermal impedance, θ
Stresses beyond those listed under “absolute maximum ratings” may cause permanent damage to the device. These are stress ratings only, and
functional operation of the device at these or any other conditions beyond those indicated under “recommended operating conditions” is not
implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
NOTES: 1. The input and output voltage ratings may be exceeded if the input and output current ratings are observed.
2. This value is limited to 7 V maximum.
3. The package thermal impedance is calculated in accordance with JESD 51.
NOTE 4: All unused inputs of the device must be held at VCC or GND to ensure proper device operation. Refer to the TI application report,
Supply voltage25.525.5V
CC
VCC = 2 V1.51.5
p
p
Input voltage05.505.5V
I
Output voltage0V
O
p
p
Operating free-air temperature–55125–4085°C
A
Implications of Slow or Floating CMOS Inputs
VCC = 2.3 V to 2.7 VVCC × 0.7VCC × 0.7
VCC = 3 V to 3.6 VVCC × 0.7VCC × 0.7
VCC = 4.5 V to 5.5 VVCC × 0.7VCC × 0.7
VCC = 2 V0.50.5
VCC = 2.3 V to 2.7 VVCC × 0.3VCC × 0.3
VCC = 3 V to 3.6 VVCC × 0.3VCC × 0.3
VCC = 4.5 V to 5.5 VVCC × 0.3VCC × 0.3
CC
VCC = 2 V–50–50µ A
VCC = 2.3 V to 2.7 V–2–2
VCC = 3 V to 3.6 V–6–6
VCC = 4.5 V to 5.5 V–12–12
VCC = 2 V5050µA
VCC = 2.3 V to 2.7 V22
VCC = 3 V to 3.6 V66
VCC = 4.5 V to 5.5 V1212
VCC = 2.3 V to 2.7 V02000200
VCC = 3 V to 3.6 V
VCC = 4.5 V to 5.5 V020020
, literature number SCBA004.
01000100
0V
CC
V
mA
mA
ns/V
PRODUCT PREVIEW information concerns products in the formative or
design phase of development. Characteristic data and other
specifications are design goals. Texas Instruments reserves the right to
change or discontinue these products without notice.
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
3
Page 4
SN54LV165A, SN74LV165A
PARAMETER
TEST CONDITIONS
V
UNIT
V
V
V
V
UNIT
twPulse duration
ns
t
Set
ns
UNIT
twPulse duration
ns
t
Set
ns
PARALLEL-LOAD 8-BIT SHIFT REGISTERS
SCLS402B – APRIL 1998 – REVISED JUL Y 1998
electrical characteristics over recommended operating free-air temperature range (unless
otherwise noted)
SN54LV165ASN74LV165A
MINTYPMAXMINTYPMAX
I
I
I
C
OH
OL
I
CC
off
i
CC
IOH = –50 µA2 V to 5.5 VVCC–0.1VCC–0.1
IOH = –2 mA2.3 V22
IOH = –6 mA3 V2.482.48
IOH = –12 mA4.5 V3.83.8
IOL = 50 µA2 V to 5.5 V0.10.1
IOL = 2 mA2.3 V0.40.4
IOL = 6 mA3 V0.440.44
IOL = 12 mA4.5 V0.550.55
VI = VCC or GND5.5 V±1±1µA
VI = VCC or GND,IO = 05.5 V2020µA
VI or VO = 0 to 5.5 V0 V55µA
VI = VCC or GND3.3 V1.71.7pF
timing requirements over recommended operating free-air temperature range, V
(unless otherwise noted) (see Figure 1)
TA = 25°CSN54LV165ASN74LV165A
MINMAXMINMAXMINMAX
CLK high or low8.599
SH/LD low111313
SH/LD high before CLK↑78.58.5
su
t
h
up time
Hold time
SER before CLK↑8.59.59.5
CLK INH before CLK↑
Data before SH/LD↑11.51212
SER data after CLK↑–100
Parallel data after SH/LD
SH/LD high after CLK↑000
↑00.50.5
777
timing requirements over recommended operating free-air temperature range, V
(unless otherwise noted) (see Figure 1)
TA = 25°CSN54LV165ASN74LV165A
MINMAXMINMAXMINMAX
CLK high or low677
SH/LD low7.599
SH/LD high before CLK↑566
su
t
h
up time
Hold time
SER before CLK↑566
CLK INH before CLK↑
Data before SH/LD↑7.58.58.5
SER data after CLK↑000
Parallel data after SH/LD
SH/LD high after CLK↑000
↑0.50.50.5
555
= 2.5 V ±0.2 V
CC
= 3.3 V ±0.3 V
CC
ns
ns
PRODUCT PREVIEW information concerns products in the formative or
design phase of development. Characteristic data and other
specifications are design goals. Texas Instruments reserves the right to
change or discontinue these products without notice.
4
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
Page 5
UNIT
twPulse duration
ns
t
Set
ns
PARAMETER
UNIT
f
MH
PARAMETER
UNIT
f
MH
HH
L
SN54LV165A, SN74LV165A
PARALLEL-LOAD 8-BIT SHIFT REGISTERS
SCLS402B – APRIL 1998 – REVISED JUL Y 1998
timing requirements over recommended operating free-air temperature range, V
CC
(unless otherwise noted) (see Figure 1)
TA = 25°CSN54LV165ASN74LV165A
MINMAXMINMAXMINMAX
CLK high or low444
SH/LD low566
SH/LD high before CLK↑444
su
t
h
up time
Hold time
SER before CLK↑444
CLK INH before CLK↑
Data before SH/LD↑555
SER data after CLK↑0.50.50.5
Parallel data after SH/LD
SH/LD high after CLK↑0.50.50.5
↑111
3.53.53.5
switching characteristics over recommended operating free-air temperature range,
= 2.5 V ± 0.2 V (unless otherwise noted) (see Figure 1)
V
CC
FROMTOLOAD
(INPUT)(OUTPUT)CAPACITANCE
max
CLK12.219.8122122
tpd*
t
pd
* On products compliant to MIL-PRF-38535, this parameter is not production tested.
SH/LD
H12.921.7124124
CLK15.323.3126126
SH/LD
H15.925.3128128
QH or Q
QH or Q
H
H
CL = 15 pF*50804545
CL = 50 pF40653535
CL = 15 pF
CL = 50 pF
TA = 25°CSN54LV165ASN74LV165A
MINTYPMAXMINMAXMINMAX
13.121.5123.5123.5
16.125.1128128
= 5 V ± 0.5 V
ns
ns
ns
z
switching characteristics over recommended operating free-air temperature range,
= 3.3 V ± 0.3 V (unless otherwise noted) (see Figure 1)
V
CC
FROMTOLOAD
(INPUT)(OUTPUT)CAPACITANCE
max
CLK8.615.4118118
tpd*
t
pd
* On products compliant to MIL-PRF-38535, this parameter is not production tested.
PRODUCT PREVIEW information concerns products in the formative or
design phase of development. Characteristic data and other
specifications are design goals. Texas Instruments reserves the right to
change or discontinue these products without notice.
SH/LD
H
CLK10.918.9121.5121.5
SH/LD
H11.117.6120120
QH or Q
QH or Q
H
H
CL = 15 pF*651155555
CL = 50 pF60905050
CL = 15 pF
CL = 50 pF
TA = 25°CSN54LV165ASN74LV165A
MINTYPMAXMINMAXMINMAX
9.115.8118.5118.5
8.914.1116.5116.5
11.319.3122122
z
ns
ns
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
5
Page 6
SN54LV165A, SN74LV165A
PARAMETER
UNIT
f
MH
HH
L
C
d
Power dissi ation ca acitance
C
L
MHz
F
PARALLEL-LOAD 8-BIT SHIFT REGISTERS
SCLS402B – APRIL 1998 – REVISED JUL Y 1998
switching characteristics over recommended operating free-air temperature range,
= 5 V ± 0.5 V (unless otherwise noted) (see Figure 1)
V
CC
FROMTOLOAD
(INPUT)(OUTPUT)CAPACITANCE
max
CLK69.9111.5111.5
tpd*
t
pd
* On products compliant to MIL-PRF-38535, this parameter is not production tested.
SH/LD
H
CLK7.711.9113.5113.5
SH/LD
H7.611112.5112.5
QH or Q
QH or Q
H
H
CL = 15 pF*1101659090
CL = 50 pF951258585
CL = 15 pF
CL = 50 pF
operating characteristics, TA = 25°C
PARAMETERTEST CONDITIONSV
p
p
p
TA = 25°CSN54LV165ASN74LV165A
MINTYPMAXMINMAXMINMAX
69.9111.5111.5
69110.5110.5
7.711.9113.5113.5
CC
p
= 50 F,f = 10
3.3 V36.1
5 V37.5
z
ns
ns
TYPUNIT
p
PRODUCT PREVIEW information concerns products in the formative or
design phase of development. Characteristic data and other
specifications are design goals. Texas Instruments reserves the right to
change or discontinue these products without notice.
6
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
Page 7
From Output
Under Test
(see Note A)
SN54LV165A, SN74LV165A
PARALLEL-LOAD 8-BIT SHIFT REGISTERS
SCLS402B – APRIL 1998 – REVISED JUL Y 1998
PARAMETER MEASUREMENT INFORMATION
V
Test
Point
C
L
From Output
Under Test
(see Note A)
C
L
RL = 1 kΩ
S1
CC
Open
GND
TESTS1
t
PLH/tPHL
t
PLZ/tPZL
t
PHZ/tPZH
Open Drain
Open
V
CC
GND
V
CC
LOAD CIRCUIT FOR
TOTEM-POLE OUTPUTS
t
w
Input
Input
In-Phase
Output
Out-of-Phase
Output
INVERTING AND NONINVERTING OUTPUTS
NOTES: A. CL includes probe and jig capacitance.
B. Waveform 1 is for an output with internal conditions such that the output is low except when disabled by the output control.
Waveform 2 is for an output with internal conditions such that the output is high except when disabled by the output control.
C. All input pulses are supplied by generators having the following characteristics: PRR ≤ 1 MHz, ZO = 50 Ω, tr ≤ 3 ns, tf ≤ 3 ns.
D. The outputs are measured one at a time with one input transition per measurement.
E. t
F. t
G. t
50% V
CC
VOLTAGE WAVEFORMS
PULSE DURATION
50% V
CC
t
PLH
50% V
CC
t
PHL
50% V
CC
VOLTAGE WAVEFORMS
PROPAGATION DELAY TIMES
PLZ
PZL
PHL
and t
and t
and t
are the same as t
PHZ
are the same as ten.
PZH
are the same as tpd.
PLH
3-STATE AND OPEN-DRAIN OUTPUTS
50% V
50% V
dis
CC
t
PHL
50% V
t
PLH
50% V
.
LOAD CIRCUIT FOR
V
CC
CC
0 V
V
CC
0 V
V
OH
CC
V
OL
V
OH
CC
V
OL
Timing Input
Data Input
Output
Control
Output
Waveform 1
S1 at V
(see Note B)
Waveform 2
(see Note B)
CC
Output
S1 at GND
50% V
CC
t
CC
CC
h
50% V
50% V
VOL + 0.3 V
VOH – 0.3 V
CC
CC
t
su
50% V
CC
VOLTAGE WAVEFORMS
SETUP AND HOLD TIMES
50% V
CC
t
PZL
t
PZH
VOLTAGE WAVEFORMS
ENABLE AND DISABLE TIMES
LOW- AND HIGH-LEVEL ENABLING
t
PLZ
50% V
t
PHZ
50% V
V
CC
0 V
V
CC
0 V
V
CC
0 V
≈ V
V
OL
V
OH
≈ 0 V
CC
Figure 1. Load Circuit and Voltage Waveforms
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
7
Page 8
IMPORTANT NOTICE
T exas Instruments and its subsidiaries (TI) reserve the right to make changes to their products or to discontinue
any product or service without notice, and advise customers to obtain the latest version of relevant information
to verify, before placing orders, that information being relied on is current and complete. All products are sold
subject to the terms and conditions of sale supplied at the time of order acknowledgement, including those
pertaining to warranty, patent infringement, and limitation of liability.
TI warrants performance of its semiconductor products to the specifications applicable at the time of sale in
accordance with TI’s standard warranty. Testing and other quality control techniques are utilized to the extent
TI deems necessary to support this warranty . Specific testing of all parameters of each device is not necessarily
performed, except those mandated by government requirements.
CERT AIN APPLICATIONS USING SEMICONDUCTOR PRODUCTS MAY INVOLVE POTENTIAL RISKS OF
DEATH, PERSONAL INJURY, OR SEVERE PROPERTY OR ENVIRONMENTAL DAMAGE (“CRITICAL
APPLICATIONS”). TI SEMICONDUCTOR PRODUCTS ARE NOT DESIGNED, AUTHORIZED, OR
WARRANTED TO BE SUITABLE FOR USE IN LIFE-SUPPORT DEVICES OR SYSTEMS OR OTHER
CRITICAL APPLICA TIONS. INCLUSION OF TI PRODUCTS IN SUCH APPLICATIONS IS UNDERST OOD TO
BE FULLY AT THE CUSTOMER’S RISK.
In order to minimize risks associated with the customer’s applications, adequate design and operating
safeguards must be provided by the customer to minimize inherent or procedural hazards.
TI assumes no liability for applications assistance or customer product design. TI does not warrant or represent
that any license, either express or implied, is granted under any patent right, copyright, mask work right, or other
intellectual property right of TI covering or relating to any combination, machine, or process in which such
semiconductor products or services might be or are used. TI’s publication of information regarding any third
party’s products or services does not constitute TI’s approval, warranty or endorsement thereof.
Copyright 1998, Texas Instruments Incorporated
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