LVTTL-to-GTL/GTL+ and GTL/GTL+-to-LVTTL
signal-level translation. They combine D-type
flip-flops and D-type latches to allow for transparent, latched, clocked, and clocked-enabled modes of data
transfer identical to the ’16601 function. Additionally, they provide for a copy of CLKAB at GTL/GTL+ signal
levels (CLKOUT) and conversion of a GTL/GTL+ clock to L VTTL logic levels (CLKIN). The devices provide an
interface between cards operating at L VTTL logic levels and a backplane operating at GTL/GTL+ signal levels.
Higher-speed operation is a direct result of the reduced output swing (<1 V), reduced input threshold levels, and
output edge control (OEC).
The user has the flexibility of using this device at either GTL (V
higher noise margin GTL+ (VTT = 1.5 V and V
= 1 V) signal levels. GTL+ is the T exas Instruments derivative
REF
= 1.2 V and V
TT
= 0.8 V) or the preferred
REF
of the Gunning transceiver logic (GTL) JEDEC standard JESD 8-3. The B port normally operates at GTL or
GTL+ signal levels, while the A-port and control inputs are compatible with LVTTL logic levels and are 5-V
tolerant. V
V
(3.3 V) supplies the LVTTL output buffers.
CC
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
Widebus, OEC, and UBT are trademarks of Texas Instruments Incorporated.
UNLESS OTHERWISE NOTED this document contains PRODUCTION
DATA information current as of publication date. Products conform to
specifications per the terms of Texas Instruments standard warranty.
Production processing does not necessarily include testing of all
parameters.
is the reference input voltage for the B port. VCC (5 V) supplies the internal and GTL circuitry while
REF
Copyright 1999, Texas Instruments Incorporated
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
1
Page 2
SN54GTL16616, SN74GTL16616
MODE
Latched storage of A data
Transparent
Clocked storage of A data
17-BIT LVTTL-TO-GTL/GTL+ UNIVERSAL BUS TRANSCEIVERS
WITH BUFFERED CLOCK OUTPUTS
SCBS481F – JUNE 1994 – REVISED NOVEMBER 1999
description (continued)
Data flow in each direction is controlled by output-enable (OEAB and OEBA), latch-enable (LEAB and LEBA),
and clock (CLKAB and CLKBA) inputs. The clock can be controlled by the clock-enable (CEAB and CEBA)
inputs. For A-to-B data flow, the device operates in the transparent mode when LEAB is high. When LEAB is
low, the A data is latched if CEAB
data is stored in the latch/flip-flop on the low-to-high transition of CLKAB if CEAB also is low. When OEAB is
low, the outputs are active. When OEAB is high, the outputs are in the high-impedance state. Data flow for B
to A is similar to that of A to B, but uses OEBA, LEBA, CLKBA, and CEBA.
is low and CLKAB is held at a high or low logic level. If LEAB is low, the A-bus
These devices are fully specified for partial-power-down applications using I
. The I
off
circuitry disables the
off
outputs, preventing damaging current backflow through the device when it is powered down.
Active bus-hold circuitry holds unused or undriven L VTTL inputs at a valid logic state. Use of pullup or pulldown
resistors with the bus-hold circuitry is not recommended.
T o ensure the high-impedance state during power up or power down, OE should be tied to VCC through a pullup
resistor; the minimum value of the resistor is determined by the current-sinking capability of the driver.
The SN54GTL16616 is characterized for operation over the full military temperature range of –55°C to 125°C.
The SN74GTL16616 is characterized for operation from –40°C to 85°C.
FUNCTION TABLE
INPUTS
CEAB OEAB LEABCLKABA
XHXXXZIsolation
LLLH or LXB
LLLH or LXB
XLHXLL
XLH XH H
LLL↑LL
LLL ↑HH
HLLXXB
†
A-to-B data flow is shown. B-to-A data flow is similar, but uses OEBA, LEBA, CLKBA,
and CEBA
‡
Output level before the indicated steady-state input conditions were established, provided
that CLKAB was high before LEAB went low
§
Output level before the indicated steady-state input conditions were established
.
†
OUTPUT
B
‡
0
§
0
§
0
p
Clock inhibit
2
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
Page 3
logic diagram (positive logic)
35
V
REF
SN54GTL16616, SN74GTL16616
17-BIT LVTTL-TO-GTL/GTL+ UNIVERSAL BUS TRANSCEIVERS
WITH BUFFERED CLOCK OUTPUTS
SCBS481F – JUNE 1994 – REVISED NOVEMBER 1999
OEAB
CEAB
CLKAB
LEAB
LEBA
CLKBA
CEBA
OEBA
A1
1
56
55
2
28
30
29
27
3
CLK
CE
1D
C1
CE
1D
C1
CLK
1 of 17 Channels
54
B1
CLKIN
26
31
CLKOUT
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
3
Page 4
SN54GTL16616, SN74GTL16616
UNIT
VCCSuppl
oltage
V
V
V
V
Suppl
oltage
V
VIInput voltage
V
V
g
V
V
V
I
mA
17-BIT LVTTL-TO-GTL/GTL+ UNIVERSAL BUS TRANSCEIVERS
WITH BUFFERED CLOCK OUTPUTS
SCBS481F – JUNE 1994 – REVISED NOVEMBER 1999
absolute maximum ratings over operating free-air temperature range (unless otherwise noted)
Stresses beyond those listed under “absolute maximum ratings” may cause permanent damage to the device. These are stress ratings only, and
functional operation of the device at these or any other conditions beyond those indicated under “recommended operating conditions” is not
implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
NOTES: 1. The input and output negative-voltage ratings may be exceeded if the input and output clamp-current ratings are observed.
2. This current flows only when the output is in the high state and VO > VCC.
3. The package thermal impedance is calculated in accordance with JESD 51.
(see Note 1): A-port and control inputs –0.5 V to 7 V. . . . . . . . . . . . . . . . . . . . . . . . . . .
recommended operating conditions (see Notes 4 through 6)
SN54GTL16616SN74GTL16616
MINNOMMAXMINNOMMAX
pp
y v
Termination
TT
voltage
pp
REF
IH
IL
I
IK
I
OH
OL
T
A
NOTES: 4. All unused inputs of the device must be held at VCC or GND to ensure proper device operation. Refer to the TI application report,
y v
p
High-level
input voltage
Low-level
input voltage
Input clamp current–18–18mA
High-level
output current
Low-level
output current
Operating free-air temperature–55125–4085°C
Implications of Slow or Floating CMOS Inputs
5. Normal connection sequence is GND first, VCC = 5 V second, and VCC = 3.3 V , I/O, control inputs, VTT and V
6. VTT and RTT can be adjusted to accommodate backplane impedances as long as they do not exceed the DC absolute IOL ratings.
Similarly , V
3.3 V3.153.33.453.153.33.45
5 V4.7555.254.7555.25
GTL1.141.21.261.141.21.26
GTL+
GTL0.740.80.870.740.80.87
GTL+0.8711.10.8711.1
B portV
Except B port5.55.5
B portV
Except B port
B portV
Except B port
A port–32–32mA
A port6464
B port
can be adjusted to optimize noise margins, but normally is 2/3 VTT.
REF
1.351.51.651.351.51.65
TT
+50 mVV
REF
22
–50 mVV
REF
0.80.8
4040
, literature number SCBA004.
REF
+50 mV
REF
V
TT
–50 mV
REF
(any order) last.
PRODUCT PREVIEW information concerns products in the formative or
design phase of development. Characteristic data and other
specifications are design goals. Texas Instruments reserves the right to
change or discontinue these products without notice.
4
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
Page 5
PARAMETER
TEST CONDITIONS
UNIT
VOHA ort
V
CC
(),
A port
CC
(),
V
OL
V
µ
I
V
CC
V
µ
B port
CC
(),
()
V
CC
V
I
A
I
A
V
CC
3V) = 3.45 V
(3.3V)
ort
V
CC
3V) = 3.45 V
(5 V)
ort
C
pF
SN54GTL16616, SN74GTL16616
17-BIT LVTTL-TO-GTL/GTL+ UNIVERSAL BUS TRANSCEIVERS
WITH BUFFERED CLOCK OUTPUTS
SCBS481F – JUNE 1994 – REVISED NOVEMBER 1999
electrical characteristics over recommended operating free-air temperature range (unless
otherwise noted)
SN54GTL16616SN74GTL16616
MINTYP†MAXMINTYP†MAX
V
IK
B port
Control
inputs
I
I
off
I
I(hold)
OZH
OZL
I
CC
I
CC
∆I
C
†
All typical values are at VCC (3.3 V) = 3.3 V, VCC (5 V) = 5 V, TA = 25°C.
‡
This is the bus-hold maximum dynamic current. It is the minimum overdrive current required to switch the input from one state to another.
§
This is the increase in supply current for each input that is at the specified TTL voltage level rather than VCC or GND.
A port
A port
A portVCC (3.3 V) = 3.45 V, VCC (5 V) = 5.25 V, VO = 3 V11
B portVCC (3.3 V) = 3.45 V, VCC (5 V) = 5.25 V, VO = 1.2 V1010
A portVCC (3.3 V) = 3.45 V, VCC (5 V) = 5.25 V, VO = 0.5 V–1–1
B portVCC (3.3 V) = 3.45 V, VCC (5 V) = 5.25 V, VO = 0.4 V–10–10
A or B
p
A or B
p
§
CC
Control
i
inputs
A portVO = 3.15 V or 01212
io
B portPer IEEE Std 1194.155
VCC (3.3 V) = 3.15 V, VCC (5 V) = 4.75 V, II = –18 mA–1.2–1.2V
VCC (3.3 V)= 3.15 V to
3.45 V ,
VCC (5 V) = 4.75 V to 5.25 V
p
V
(3.3 V) = 3.15 V,
VCC (5 V) = 4.75 V
V
p
p
(3.3 V) = 3.15 V,
VCC (5 V) = 4.75 V
VCC (3.3 V) = 3.15 V,
VCC (5 V) = 4.75 V
VCC = 0 or 3.45 V,
VCC (5 V) = 0 or 5.25 V
VCC (3.3 V) = 3.45 V,
(5 V) = 5.25
V
(3.3 V) = 3.45 V,
VCC (5 V) = 5.25 V
VCC = 0, VI or VO = 0 to 4.5 V100100µA
VCC (3.3 V) = 3.15 V,
(5 V) = 4.75
=
(3.
VCC (5 V) = 5.25 V, IO = 0,
VI = VCC (3.3 V) or GND
(3.
VCC (5 V) = 5.25 V, IO = 0,
VI = VCC (3.3 V) or GND
VCC (3.3 V) = 3.45 V, VCC (5 V) = 5.25 V,
A-port or control inputs at VCC (3.3 V) or GND,
One input at 2.7 V
PRODUCT PREVIEW information concerns products in the formative or
design phase of development. Characteristic data and other
specifications are design goals. Texas Instruments reserves the right to
change or discontinue these products without notice.
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
5
Page 6
SN54GTL16616, SN74GTL16616
UNIT
twPulse duration
ns
tsuSetup time
ns
thHold time
ns
17-BIT LVTTL-TO-GTL/GTL+ UNIVERSAL BUS TRANSCEIVERS
WITH BUFFERED CLOCK OUTPUTS
SCBS481F – JUNE 1994 – REVISED NOVEMBER 1999
timing requirements over recommended ranges of supply voltage and operating free-air
temperature, V
f
clock
Clock frequency9595MHz
p
= 1.2 V and V
TT
= 0.8 V for GTL (unless otherwise noted) (see Figure 1)
REF
SN54GTL16616 SN74GTL16616
MINMAXMINMAX
LEAB or LEBA high3.33.3
CLKAB or CLKBA high or low5.55.5
A before CLKAB↑1.31.3
B before CLKBA↑2.52.5
A before LEAB↓00
B before LEBA↓1.11.1
CEAB before CLKAB↑2.22.2
CEBA before CLKBA↑2.72.7
A after CLKAB↑1.61.6
B after CLKBA↑0.40.4
A after LEAB↓44
B after LEBA↓3.53.5
CEAB after CLKAB↑1.11.1
CEBA after CLKBA↑0.90.9
PRODUCT PREVIEW information concerns products in the formative or
design phase of development. Characteristic data and other
specifications are design goals. Texas Instruments reserves the right to
change or discontinue these products without notice.
6
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
Page 7
PARAMETER
UNIT
A
B
ns
LEAB
B
ns
CLKAB
B
ns
CLKAB
CLKOUT
ns
OEAB
B or CLKOUT
ns
B
A
ns
LEBA
A
ns
CLKBA
A
ns
CLKOUT
CLKIN
ns
OEBA
A or CLKIN
ns
SN54GTL16616, SN74GTL16616
17-BIT LVTTL-TO-GTL/GTL+ UNIVERSAL BUS TRANSCEIVERS
WITH BUFFERED CLOCK OUTPUTS
SCBS481F – JUNE 1994 – REVISED NOVEMBER 1999
switching characteristics over recommended ranges of supply voltage and operating free-air
temperature, V
f
max
t
PLH
t
PHL
t
PLH
t
PHL
t
PLH
t
PHL
t
PLH
t
PHL
t
dis
t
en
t
r
t
f
t
PLH
t
PHL
t
PLH
t
PHL
t
PLH
t
PHL
t
PLH
t
PHL
t
en
t
dis
†
All typical values are at VCC (3.3 V) = 3.3 V, VCC (5 V) = 5 V, TA = 25°C.
= 1.2 V and V
TT
Transition time, B outputs (0.5 V to 1 V)1.21.2ns
Transition time, B outputs (1 V to 0.5 V)0.70.7ns
PRODUCT PREVIEW information concerns products in the formative or
design phase of development. Characteristic data and other
specifications are design goals. Texas Instruments reserves the right to
change or discontinue these products without notice.
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
7
Page 8
SN54GTL16616, SN74GTL16616
UNIT
twPulse duration
ns
tsuSetup time
ns
thHold time
ns
17-BIT LVTTL-TO-GTL/GTL+ UNIVERSAL BUS TRANSCEIVERS
WITH BUFFERED CLOCK OUTPUTS
SCBS481F – JUNE 1994 – REVISED NOVEMBER 1999
timing requirements over recommended ranges of supply voltage and operating free-air
temperature, V
f
clock
Clock frequency9595MHz
p
= 1.5 V and V
TT
= 1 V for GTL+ (unless otherwise noted) (see Figure 1)
REF
SN54GTL16616 SN74GTL16616
MINMAXMINMAX
LEAB or LEBA high3.33.3
CLKAB or CLKBA high or low5.55.5
A before CLKAB↑1.31.3
B before CLKBA↑2.32.3
A before LEAB↓00
B before LEBA↓1.31.3
CEAB before CLKAB↑2.22.2
CEBA before CLKBA↑2.72.7
A after CLKAB↑1.61.6
B after CLKBA↑0.60.6
A after LEAB↓44
B after LEBA↓3.53.5
CEAB after CLKAB↑1.11.1
CEBA after CLKBA↑0.90.9
PRODUCT PREVIEW information concerns products in the formative or
design phase of development. Characteristic data and other
specifications are design goals. Texas Instruments reserves the right to
change or discontinue these products without notice.
8
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
Page 9
PARAMETER
UNIT
A
B
ns
LEAB
B
ns
CLKAB
B
ns
CLKAB
CLKOUT
ns
OEAB
B or CLKOUT
ns
B
A
ns
LEBA
A
ns
CLKBA
A
ns
CLKOUT
CLKIN
ns
OEBA
A or CLKIN
ns
SN54GTL16616, SN74GTL16616
17-BIT LVTTL-TO-GTL/GTL+ UNIVERSAL BUS TRANSCEIVERS
WITH BUFFERED CLOCK OUTPUTS
SCBS481F – JUNE 1994 – REVISED NOVEMBER 1999
switching characteristics over recommended ranges of supply voltage and operating free-air
temperature, V
f
max
t
PLH
t
PHL
t
PLH
t
PHL
t
PLH
t
PHL
t
PLH
t
PHL
t
PLH
t
PHL
t
r
t
f
t
PLH
t
PHL
t
PLH
t
PHL
t
PLH
t
PHL
t
PLH
t
PHL
t
en
t
dis
†
All typical values are at VCC (3.3 V) = 3.3 V, VCC (5 V) = 5 V, TA = 25°C.
= 1.5 V and V
TT
Transition time, B outputs (0.5 V to 1 V)1.41.4ns
Transition time, B outputs (1 V to 0.5 V)11ns
PRODUCT PREVIEW information concerns products in the formative or
design phase of development. Characteristic data and other
specifications are design goals. Texas Instruments reserves the right to
change or discontinue these products without notice.
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
9
Page 10
SN54GTL16616, SN74GTL16616
17-BIT LVTTL-TO-GTL/GTL+ UNIVERSAL BUS TRANSCEIVERS
WITH BUFFERED CLOCK OUTPUTS
SCBS481F – JUNE 1994 – REVISED NOVEMBER 1999
PARAMETER MEASUREMENT INFORMATION
= 1.2 V , V
V
TT
= 0.8 V FOR GTL AND VTT = 1.5 V , V
REF
= 1 V FOR GTL+
REF
From Output
Under Test
CL = 50 pF
(see Note A)
LOAD CIRCUIT FOR A OUTPUTS
Input
Input
(see Note B)
Output
Input
(see Note B)
Output
500 Ω
500 Ω
t
w
VM VV
VOLTAGE WAVEFORMS
(VM = 1.5 V for A port and V
t
PLH
t
PLH
PULSE DURATION
1.5 V1.5 V
V
REF
VOLTAGE WAVEFORMS
PROPAGATION DELAY TIMES
(A port to B port)
V
REF
1.5 V1.5 V
VOLTAGE WAVEFORMS
PROPAGATION DELAY TIMES
(B port to A port)
S1
for B port)
REF
†
V
6 V
GND
M
REF
Open
V
V
†
t
PHL
REF
t
PHL
3 V
0 V
3 V
0 V
V
V
V
0 V
V
V
TT
OL
TT
OH
OL
TEST
t
PLH/tPHL
t
PLZ/tPZL
t
PHZ/tPZH
(see Note B)
Waveform 1
(see Note C)
Waveform 2
(see Note C)
Timing
Input
Data Input
A Port
Data Input
B Port
Output
Control
Output
S1 at 6 V
Output
S1 at GND
S1
Open
6 V
GND
VOLTAGE WAVEFORMS
SETUP AND HOLD TIMES
t
PZL
t
PZH
VOLTAGE WAVEFORMS
ENABLE AND DISABLE TIMES
From Output
Under Test
LOAD CIRCUIT FOR B OUTPUTS
t
su
1.5 V
V
REF
1.5 V1.5 V
1.5 V
1.5 V
(A port and CLKIN)
CL = 30 pF
(see Note A)
1.5 V
t
h
VOL + 0.3 V
VOH – 0.3 V
V
TT
1.5 V
V
REF
t
PLZ
t
PHZ
25 Ω
Test
Point
3 V
0 V
3 V
0 V
V
TT
0 V
3 V
0 V
3 V
V
V
≈0 V
OL
OH
†
All control inputs are TTL levels.
NOTES: A. CL includes probe and jig capacitance.
B. All input pulses are supplied by generators having the following characteristics: PRR ≤ 10 MHz, ZO = 50 Ω, tr ≤ 2.5 ns, tf≤ 2.5 ns.
C. Waveform 1 is for an output with internal conditions such that the output is low except when disabled by the output control.
Waveform 2 is for an output with internal conditions such that the output is high except when disabled by the output control.
D. The outputs are measured one at a time with one transition per measurement.
Figure 1. Load Circuits and Voltage Waveforms
10
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
Page 11
IMPORTANT NOTICE
T exas Instruments and its subsidiaries (TI) reserve the right to make changes to their products or to discontinue
any product or service without notice, and advise customers to obtain the latest version of relevant information
to verify, before placing orders, that information being relied on is current and complete. All products are sold
subject to the terms and conditions of sale supplied at the time of order acknowledgement, including those
pertaining to warranty, patent infringement, and limitation of liability.
TI warrants performance of its semiconductor products to the specifications applicable at the time of sale in
accordance with TI’s standard warranty. Testing and other quality control techniques are utilized to the extent
TI deems necessary to support this warranty . Specific testing of all parameters of each device is not necessarily
performed, except those mandated by government requirements.
CERTAIN APPLICA TIONS USING SEMICONDUCT OR PRODUCTS MAY INVOLVE POTENTIAL RISKS OF
DEATH, PERSONAL INJURY, OR SEVERE PROPERTY OR ENVIRONMENTAL DAMAGE (“CRITICAL
APPLICATIONS”). TI SEMICONDUCTOR PRODUCTS ARE NOT DESIGNED, AUTHORIZED, OR
WARRANTED TO BE SUITABLE FOR USE IN LIFE-SUPPORT DEVICES OR SYSTEMS OR OTHER
CRITICAL APPLICA TIONS. INCLUSION OF TI PRODUCTS IN SUCH APPLICATIONS IS UNDERST OOD TO
BE FULLY AT THE CUSTOMER’S RISK.
In order to minimize risks associated with the customer’s applications, adequate design and operating
safeguards must be provided by the customer to minimize inherent or procedural hazards.
TI assumes no liability for applications assistance or customer product design. TI does not warrant or represent
that any license, either express or implied, is granted under any patent right, copyright, mask work right, or other
intellectual property right of TI covering or relating to any combination, machine, or process in which such
semiconductor products or services might be or are used. TI’s publication of information regarding any third
party’s products or services does not constitute TI’s approval, warranty or endorsement thereof.
Copyright 1999, Texas Instruments Incorporated
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