Datasheet SN74ALVC7803-20DL, SN74ALVC7803-25DL, SN74ALVC7803-40DL Datasheet (Texas Instruments)

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SN74ALVC7803
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Copyright 1995, Texas Instruments Incorporated
1
POST OFFICE BOX 655303 DALLAS, TEXAS 75265
Operates at 3-V to 3.6-V V
Free-Running Read and Write Clocks Can
Be Asynchronous or Coincident
Read and Write Operations Synchronized to
Independent System Clocks
Low-Power Advanced CMOS Technology
Half-Full Flag and Programmable
Almost-Full/Almost-Empty Flag
Bidirectional Configuration and Width
Expansion Without Additional Logic
Input-Ready Flag Synchronized to Write
Clock
Output-Ready Flag Synchronized to Read
Clock
Fast Access Times of 13 ns With a 50-pF
Load and All Data Outputs Switching Simultaneously
Data Rates From 0 to 50 MHz
Pin Compatible With SN74ACT7803
Packaged in Shrink Small-Outline 300-mil
Package (DL) Using 25-mil Center-to-Center Lead Spacing
description
The SN74ALVC7803 FIFO is suited for buffering asynchronous data paths at 50-MHz clock rates and 13-ns access times and is designed for 3-V to
3.6-V V
operation. The 56-pin shrink small­outline (DL) package offers greatly reduced board space over DIP, PLCC, and conventional SOIC packages. Two devices can be configured for bidirectional data buffering without additional logic.
The write clock (WRTCLK) and read clock (RDCLK) should be free running and can be asynchronous or coincident. Data is written to memory on the rising edge of WRTCLK when WRTEN1 is high, WRTEN2
is low,
and input ready (IR) is high. Data is read from memory on the rising edge of RDCLK when RDEN
, OE1, and
OE2
are low and output ready (OR) is high. The first word written to memory is clocked through to the output
buffer regardless of the RDEN
, OE1, and OE2 levels. The OR flag indicates that valid data is present on the
output buffer. The FIFO can be reset asynchronously to WRTCLK and RDCLK. RESET
must be asserted while at least four WRTCLK and four RDCLK rising edges occur to clear the synchronizing registers. Resetting the FIFO initializes the IR, OR, and half-full (HF) flags low and the almost-full/almost-empty (AF/AE) flag high. The FIFO must be reset upon power up.
PRODUCTION DATA information is current as of publication date. Products conform to specifications per the terms of Texas Instruments standard warranty. Production processing does not necessarily include testing of all parameters.
1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 25 26 27 28
56 55 54 53 52 51 50 49 48 47 46 45 44 43 42 41 40 39 38 37 36 35 34 33 32 31 30 29
RESET
D17 D16 D15 D14 D13 D12 D11 D10
V
CC
D9 D8
GND
D7 D6 D5 D4 D3 D2 D1 D0 HF
PEN
AF/AE WRTCLK WRTEN2 WRTEN1
IR
OE1 Q17 Q16 Q15 GND Q14 V
CC
Q13 Q12 Q11 Q10 Q9 GND Q8 Q7 Q6 Q5 V
CC
Q4 Q3 Q2 GND Q1 Q0 RDCLK RDEN OE2 OR
DL PACKAGE
(TOP VIEW)
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logic symbol
Almost Full/Empty
FIFO 512 × 18
Φ
WRTEN
&
RDEN
&
0
21
D0
20
D1
19
D2
18
D3
17
D4
16
D5
15
D6
14
D7
12
D8
Q0
33
0
Q1
34
Q2
36
Q3
37
Q4
38
IR
28
In RDY
HF
22
Half Full
AF/AE
24
OR
29
Out RDY
Q5
40
Q6
41
Q7
42
Q8
43
Data
1
11
D9
9
D10
8
D11
7
D12
6
D13
5
D14
4
D15
3
D16
17
2
D17
Q9
45
Q10
46
Q11
47
Q12
48
Q13
49
Q14
51
Q15
53
Q16
54
Q17
55
17
RESET
WRTEN2
OE1 OE2
RDEN
30
EN1
&
56
PEN
RESET
1 25
WRTCLK
WRTCLK
Data
27
WRTEN1
26
Program Enable
23
31
32
RDCLK
RDCLK
This symbol is in accordance with ANSI/IEEE Std 91-1984 and IEC Publication 617-12.
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functional block diagram
Q0–Q17
IR
AF/AE
HF
Register
512 × 18
OE2
D0–D17
RDCLK
OE1
RDEN
WRTCLK WRTEN1
WRTEN2
RESET
PEN
Synchronous-
Read
Control
Synchronous-
Write
Control
Reset Logic
Read
Pointer
Write
Pointer
Status-
Flag
Logic
Output
Control
OR
RAM
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Terminal Functions
TERMINAL
NAME NO.
I/O
DESCRIPTION
AF/AE 24 O
Almost-full/almost-empty flag. Depth offset values can be programmed for AF/AE, or the default value of 64 can be used for both the almost-empty offset (X) and the almost-full offset (Y). AF/AE is high when memory contains X or less words or (512 minus Y) or more words. AF/AE is high after reset.
D0–D17
21–14, 12–1 1,
9–2
I 18-bit data input port
HF 22 O Half-full flag. HF is high when the FIFO memory contains 256 or more words. HF is low after reset.
IR 28 O
Input ready flag. IR is synchronized to the low-to-high transition of WRTCLK. When IR is low , the FIFO is full and writes are disabled. IR is low during reset and goes high on the second low-to-high transition of WRTCLK after reset.
OE1, OE2 56, 30 I
Output enables. When OE1, OE2, and RDEN are low and OR is high, data is read from the FIFO on a low-to-high transition of RDCLK. When either OE1
or OE2 is high, reads are disabled and
the data outputs are in the high-impedance state.
OR 29 O
Output ready flag. OR is synchronized to the low-to-high transition of RDCLK. When OR is low, the FIFO is empty and reads are disabled. Ready data is present on Q0–Q17 when OR is high. OR is low during reset and goes high on the third low-to-high transition of RDCLK after the first word is loaded to empty memory.
PEN 23 I
Program enable. After reset and before the first word is written to the FIFO, the binary value on D0–D7 is latched as an AF/AE offset value when PEN
is low and WRTCLK is high.
Q0–Q17
33–34, 36–38, 40–43, 45–49,
51, 53–55
O
18-bit data output port. After the first valid write to empty memory, the first word is output on Q0–Q17 on the third rising edge of RDCLK. OR is also asserted high at this time to indicate ready data. When OR is low, the last word read from the FIFO is present on Q0–Q17.
RDCLK 32 I
Read clock. RDCLK is a continuous clock and can be asynchronous or coincident to WRTCLK. A low-to-high transition of RDCLK reads data from memory when OE1
, OE2, and RDEN are low
and OR is high. OR is synchronous to the low-to-high transition of RDCLK.
RDEN 31 I
Read enable. When RDEN, OE1, and OE2 are low and OR is high, data is read from the FIFO on the low-to-high transition of RDCLK.
RESET 1 I
Reset. T o reset the FIFO, four low-to-high transitions of RDCLK and four low-to-high transitions of WRTCLK must occur while RESET
is low. This sets HF, IR, and OR low and AF/AE high.
WRTCLK 25 I
Write clock. WRTCLK is a continuous clock and can be asynchronous or coincident to RDCLK. A low-to-high transition of WRTCLK writes data to memory when WRTEN2
is low, WRTEN1 is
high, and IR is high. IR is synchronous to the low-to-high transition of WRTCLK.
WRTEN1,
WRTEN2
27, 26 I
Write enables. When WRTEN1 is high, WRTEN2 is low , and IR is high, data is written to the FIFO on a low-to-high transition of WRTCLK.
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123412
Don’t Care
Don’t Care
Don’t Care
1234
Don’t Care
Don’t Care
Don’t Care
Invalid
Don’t Care
Don’t Care
Don’t Care
Don’t Care
RESET
WRTCLK
PEN
WRTEN1
WRTEN2
D0–D17
RDCLK
OE1
OE2
RDEN
Q0–Q17
OR
AF/AE
HF
IR
Define the AF/AE Flag Using
the Default Value of X = Y = 64
Figure 1. Reset Cycle
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123
Invalid
RESET
WRTCLK
PEN
WRTEN1
WRTEN2
D0–D17
RDCLK
OE1
OE2
RDEN
Q0–Q17
OR
AF/AE
HF
IR
1 0
1 0
1 0
W1 W2 W3 W4 W(X+2) A B C
1 0
1 0 1 0
W1
DATA WORD NUMBER FOR FLAG TRANSITIONS
TRANSITION WORD
DEVICE
A B C
SN74ALVC7803 W257 W((513–Y) W513
Figure 2. FIFO Write
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SN74ALVC7803
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ЙЙЙЙЙЙЙЙЙЙЙЙЙЙЙЙЙЙЙЙЙЙЙЙЙЙЙЙЙ
B
ЙЙЙЙЙЙЙЙЙЙЙЙЙЙЙЙЙЙЙЙЙЙЙЙЙЙЙЙЙ
RESET
WRTCLK
PEN
WRTEN1
WRTEN2
D0–D17
RDCLK
OE1
OE2
RDEN
Q0–Q17
OR
AF/AE
HF
IR
1 0
1 0
1 0
W513
1 0
1
2
W1 W2 W3 W(Y+1) W(Y+2) A C DE F
DATA WORD NUMBERS FOR FLAG TRANSITIONS
TRANSITION WORD
DEVICE
A B C D E F
SN74ALVC7803 W257 W258 W(512–X) W(513–X) W512 W513
Figure 3. FIFO Read
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offset values for AF/AE
The AF/AE flag has two programmable limits: the almost-empty offset value (X) and the almost-full offset value (Y). They can be programmed after the FIFO is reset and before the first word is written to memory . If the offsets are not programmed, the default values of X = Y = 64 are used. The AF/AE flag is high when the FIFO contains X or less words or (512 minus Y) or more words.
Program enable (PEN
) should be held high throughout the reset cycle. PEN can be brought low only when IR is high. On the following low-to-high transition of WRTCLK, the binary value on D0–D7 is stored as the almost empty offset value (X) and the almost full offset value (Y). Holding PEN
low for another low-to-high transition of WRTCLK reprograms Y to the binary value on D0 – D7 at the time of the second WRTCLK low-to-high transition. When the offsets are being programmed, writes to the FIFO memory are disabled regardless of the state of WRTEN1 and WRTEN2
. A maximum value of 255 can be programmed for either X or Y
(see Figure 4). To use the default values of X = Y = 64, PEN
must be held high.
34
RESET
WRTCLK
PEN
WRTEN1
WRTEN2
D0–D7
IR
X and Y Y
Figure 4. Programming X and Y Separately
absolute maximum ratings over operating free-air temperature range (unless otherwise noted)
Supply voltage range, V
–0.5 V to 4.6 V. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Input voltage range, V
I
(see Note 1) –0.5 V to 4.6 V. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Output voltage range, V
O
(see Notes 1 and 2) –0.5 V to V
+ 0.5 V. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Input clamp current, I
IK
( V
I
< 0 ) *50 mA. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Output clamp current, I
OK
( V
O
< 0 or V
O
> V
)
"
50 mA. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Continuous output current, I
O
( V
O
= 0 to V
) "50 mA. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Continuous current through V
or GND "100 mA. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Voltage applied to a disabled 3-state output 3.6 V. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Operating free-air temperature range, T
A
0°C to 70°C. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Storage temperature range –65°C to 150°C. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Stresses beyond those listed under “absolute maximum ratings” may cause permanent damage to the device. These are stress ratings only, and functional operation of the device at these or any other conditions beyond those indicated under “recommended operating conditions” is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
NOTES: 1. The input and output voltage ratings can be exceeded if the input and output clamp current ratings are observed.
2. This value is limited to 4.6 V maximum.
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recommended operating conditions
VCC = 3.3 V " 0.3 V VCC = 3.3 V " 0.3 V VCC = 3.3 V " 0.3 V
MIN MAX MIN MAX MIN MAX
UNIT
V
IH
High-level input voltage 2 2 2 V
V
IL
Low-level input voltage 0.8 0.8 0.8 V High-level output current,
I
OH
g,
Q outputs, flags
V
CC
=
3V
8–8–8
Low-level output current,
mA
I
OL
,
Q outputs, flags
V
CC
= 3
V
161616
f
clock
Clock frequency 50 40 25 MHz
D0–D17 high or low 9 10 14 WRTCLK high or
low
7 8 12
RDCLK high or low 7 8 12
t
w
Pulse duration
PEN
low 9 9 12
ns
w
WRTEN1 high,
g,
WRTEN2 low
8812
OE1, OE2 low 9 9 12 RDEN low 8 8 12 D0–D17 before
WRTCLK
5 5 5
WRTEN1, WRTEN2 before WRTCLK
5 5 5
OE1, OE2 before RDCLK
5 6 6
t
su
Setup time
RDEN
before
RDCLK
5 5 7
ns
Reset: RESET low before first WRTCLK and RDCLK
6 6 6
PEN before WRTCLK
6 6 6
D0–D17 after WRTCLK
0 0 0
WRTEN1, WRTEN2 after WRTCLK
0 0 0
OE1, OE2, RDEN after RDCLK
0 0 0
thHold time
Reset: RESET low after fourth WRTCLK and RDCLK
2 2 2
ns
PEN low after WRTCLK
2 2 2
T
A
Operating free-air temperature 0 70 0 70 0 70 °C
To permit the clock pulse to be utilized for reset purposes
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electrical characteristics over recommended operating free-air temperature range (unless otherwise noted)
PARAMETER TEST CONDITIONS
MIN TYP‡MAX UNIT
V
IK
VCC = 3 V , IIK = – 18 mA –1.2 V
Flags VCC = MIN to MAX, IOH = –100 µA VCC
–0.2
V
OH
Q outputs VCC= 3 V, IOH = –8 mA 2.4
V
Flags, Q outputs VCC = MIN to MAX, IOL = 100 µA 0.2
V
OL
Flags VCC = 3 V , IOL = 8 mA 0.4
V
Q outputs VCC = 3 V, IOL = 16 mA 0.55
I
I
VCC = 3.6 V, VI =VCC or GND ±5 µA
I
OZ
VCC = 3.6 V, VO =VCC or GND ±10 µA
I
CC
VI = VCC or 0, IO = 0 40 µA
I
CC
§
VCC = 3.6 V, One input at VCC – 0.6 V
Other inputs at VCC or GND,
500 µA
C
i
VCC = 3.3 V, VI = VCC or GND, f = 1 MHz 2.5 pF
C
o
VCC = 3.3 V, VO = VCC or GND, f = 1 MHz 5.5 pF
For conditions shown as MIN or MAX, use the appropriate value specified under recommended operating conditions.
All typical values are at VCC = 3.3 V, TA = 25°C.
§
This is the supply current for each input that is at one of the specified TTL voltage levels rather than 0 V or VCC.
switching characteristics over recommended ranges of supply voltage and operating free-air temperature, C
L
= 50 pF (unless otherwise noted) (see Figure 7)
FROM TO
VCC = 3.3 V " 0.3 V VCC = 3.3 V " 0.3 V VCC = 3.3 V " 0.3 V
PARAMETER
(OUTPUT) (INPUT)
MIN MAX MIN MAX MIN MAX
UNIT
f
max
WRTCLK or
RDCLK
50 40 25 MHz
t
pd
4 13 4 15 4 20
t
pd
RDCLK
Any Q
ns
t
pd
WRTCLK IR 3 11 3 13 3 15 ns
t
pd
RDCLK OR 3 11 3 13 3 15 ns
t
pd
WRTCLK AF/AE 7 19 7 21 7 23 ns
t
pd
RDCLK AF/AE 7 19 7 21 7 23 ns
t
PLH
WRTCLK
7 17 7 19 7 21
t
PHL
RDCLK
HF
7 18 7 20 7 22
ns
t
PLH
AF/AE
2 11 2 13 2 15
t
PHL
RESET l
ow
HF
2 12 2 14 2 16
ns
t
en
2 11 2 11 2 14
t
dis
OE1, OE2
Any Q
2 11 2 14 2 14
ns
This parameter is measured with a 50-pF load (see Figure 7).
operating characteristics, VCC = 3.3 V, TA = 25°C
PARAMETER TEST CONDITIONS TYP UNIT
C
pd
Power dissipation capacitance Outputs enabled CL = 50 pF, f = 5 MHz 53 pF
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APPLICATION INFORMATION
WRTCLK
WRTEN1
RDCLK
SN74ALVC78xx
WRTEN2
OE1
RDEN
WRTCLK
WRTEN1
RDCLK
WRTEN2
OE1 RDEN
A0–A17
CLOCK A
W/R
A
CSA
CLOCK B W/R
B
CSB
B0–B17
OE2
OE2
SN74ALVC78xx
D0–D17
D0–D17
Q0–Q17
Q0–Q17
18
18
Figure 5. Bidirectional Configuration
IR
RDCLK
OR
WRTCLK
WRTEN1 WRTEN2
D0–D35
OE1
WRTCLK
WRTEN1
IR
RDCLK
OR
WRTEN2
RDEN
OE1
WRTCLK
WRTEN1
IR
RDCLK
OR
WRTEN2
OE1
RDEN
OE2
OE2
SN74ALVC78xx
SN74ALVC78xx
D0–D17
D0–D17
Q0–Q17
Q0–Q17
Q0–Q35
OE2
36
36
Figure 6. Word-Width Expansion: 512 36 Bit , 256 36 Bit, and 64 36 Bit
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TYPICAL CHARACTERISTICS
0
20
40
60
80
100
120
140
0 102030405060708090
I – Supply Current – mA
CCf
SUPPLY CURRENT
vs
CLOCK FREQUENCY
f
clock
– Clock Frequency – MHz
VCC = 3.6 V
VCC = 3.3 V
VCC = 3 V
f
data
= 1/2 f
clock
TA = 75°C
CL = 0 pF
Figure 7
calculating power dissipation
With I
CCf
taken from Figure 7, the dynamic power (Pd), based on all data outputs changing states on each read,
can be calculated by using:
P
d
= VCC × [I
CC(f)
+ (N × ICC × dc)] + (CL × V
2
× fo)
A more accurate total power (P
T
) can be calculated if quiescent power (Pq) is also taken into consideration.
Quiescent power (P
q
) can be calculated using:
P
q
= VCC × [I
CCI
+ (N × ICC × dc)]
Total power would be:
P
T
= Pd + P
q
The above equations provide worst-case power calculations. Where:
N = number of inputs driven by TTL levels I
= increase in power supply current for each input at a TTL high level dc = duty cycle of inputs at a TTL high level of 3.4 V C
L
= output capacitance load f
o
= switching frequency of an output I
CCI
= idle current, supply current when FIFO is idle pF × f
clock
= 0.2 × f
clock
(current is due to free-running clocks) pF = power factor (the slope of idle current versus clock frequency). I
CCf
= active current, supply current when FIFO is transferring data
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PARAMETER MEASUREMENT INFORMATION
V
OH
V
OL
t
h
t
su
From Output
Under Test
CL = 50 pF
(see Note A)
LOAD CIRCUIT FOR OUTPUTS
S1
6 V
Open
GND
500
500
t
PLH
t
PHL
Output
Control
(low-level
enabling)
Output
Waveform 1
S1 at 6 V
(see Note C)
Output
Waveform 2
S1 at GND
(see Note C)
t
PZL
t
PZH
t
PLZ
t
PHZ
1.5 V1.5 V
1.5 V 1.5 V
3 V
0 V
1.5 V 1.5 V
V
OH
V
OL
0 V
1.5 V
VOL + 0.3 V
1.5 V
VOH – 0.3 V
0 V
1.5 V
3 V
0 V
1.5 V 1.5 V 0 V
3 V
0 V
1.5 V 1.5 V
t
w
Input
(see Note B)
3 V
3 V
3 V
VOLTAGE WAVEFORMS
SETUP AND HOLD TIMES
VOLTAGE WAVEFORMS
PROPAGATION DELAY TIMES
VOLTAGE WAVEFORMS
PULSE DURATION
VOLTAGE WAVEFORMS
ENABLE AND DISABLE TIMES
Timing
Input
Data
Input
Output
Input
NOTES: A. CL includes probe and jig capacitance.
B. All input pulses are supplied by generators having the following characteristics: PRRv10 MHz, ZO = 50 , trv
2.5 ns, tfv
2.5 ns.
C. Waveform 1 is for an output with internal conditions such that the output is low except when disabled by the output control.
Waveform 2 is for an output with internal conditions such that the output is high except when disabled by the output control.
3-STATE OUTPUTS (ANY Q)
PARAMETER
R1, R2 C
L
S1
t
PZH
p
GND
t
en
t
PZL
500 Ω
50 pF
6 V
t
PHZ
p
GND
t
dis
t
PLZ
500 Ω
50 pF
6 V
t
pd
t
PLH/tPHL
500 50 pF Open
Includes probe and test-fixture capacitance
Figure 8. Standard CMOS Outputs (FULL, EMPTY, HF, AF/AE)
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IMPORTANT NOTICE
T exas Instruments and its subsidiaries (TI) reserve the right to make changes to their products or to discontinue any product or service without notice, and advise customers to obtain the latest version of relevant information to verify, before placing orders, that information being relied on is current and complete. All products are sold subject to the terms and conditions of sale supplied at the time of order acknowledgement, including those pertaining to warranty, patent infringement, and limitation of liability.
TI warrants performance of its semiconductor products to the specifications applicable at the time of sale in accordance with TI’s standard warranty. Testing and other quality control techniques are utilized to the extent TI deems necessary to support this warranty. Specific testing of all parameters of each device is not necessarily performed, except those mandated by government requirements.
CERT AIN APPLICATIONS USING SEMICONDUCTOR PRODUCTS MAY INVOLVE POTENTIAL RISKS OF DEATH, PERSONAL INJURY, OR SEVERE PROPERTY OR ENVIRONMENTAL DAMAGE (“CRITICAL APPLICATIONS”). TI SEMICONDUCTOR PRODUCTS ARE NOT DESIGNED, AUTHORIZED, OR WARRANTED TO BE SUITABLE FOR USE IN LIFE-SUPPORT DEVICES OR SYSTEMS OR OTHER CRITICAL APPLICATIONS. INCLUSION OF TI PRODUCTS IN SUCH APPLICA TIONS IS UNDERST OOD TO BE FULLY AT THE CUSTOMER’S RISK.
In order to minimize risks associated with the customer’s applications, adequate design and operating safeguards must be provided by the customer to minimize inherent or procedural hazards.
TI assumes no liability for applications assistance or customer product design. TI does not warrant or represent that any license, either express or implied, is granted under any patent right, copyright, mask work right, or other intellectual property right of TI covering or relating to any combination, machine, or process in which such semiconductor products or services might be or are used. TI’s publication of information regarding any third party’s products or services does not constitute TI’s approval, warranty or endorsement thereof.
Copyright 1999, Texas Instruments Incorporated
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