Distributed VCC and GND Pin Configuration
Minimizes High-Speed Switching Noise
D
Flow-Through Architecture Optimizes PCB
Layout
D
High-Drive Outputs (–32-mA IOH, 64-mA IOL)
D
Package Options Include Plastic Shrink
Small-Outline (DL), Thin Shrink
Small-Outline (DGG) Packages and 380-mil
Fine-Pitch Ceramic Flat (WD) Package
Using 25-mil Center-to-Center Spacings
description
The ’ABT16646 devices consist of
bus-transceiver circuits, D-type flip-flops, and
control circuitry arranged for multiplexed
transmission of data directly from the input bus or
from the internal registers.
These devices can be used as two 8-bit
transceivers or one 16-bit transceiver. Data on the
A or B bus is clocked into the registers on the
low-to-high transition of the appropriate clock
(CLKAB or CLKBA) input. Figure 1 illustrates the
four fundamental bus-management functions that
can be performed with the ’ABT16646 devices.
) and direction-control (DIR) inputs are provided to control the transceiver functions. In the
transceiver mode, data present at the high-impedance port may be stored in either register or in both. The
select-control (SAB and SBA) inputs can multiplex stored and real-time (transparent mode) data. The circuitry
used for select control eliminates the typical decoding glitch that occurs in a multiplexer during the transition
between stored and real-time data. The direction control (DIR) determines which bus receives data when OE
is low. In the isolation mode (OE high), A data can be stored in one register and/or B data can be stored in the
other register.
When an output function is disabled, the input function is still enabled and can be used to store and transmit
data. Only one of the two buses, A or B, can be driven at a time.
T o ensure the high-impedance state during power up or power down, OE should be tied to VCC through a pullup
resistor; the minimum value of the resistor is determined by the current-sinking capability of the driver.
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
Widebus and EPIC-ΙΙB are trademarks of Texas Instruments Incorporated.
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of Texas Instruments
standard warranty. Production processing does not necessarily include
testing of all parameters.
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
Copyright 1999, Texas Instruments Incorporated
On products compliant to MIL-PRF-38535, all parameters are tested
unless otherwise noted. On all other products, production
processing does not necessarily include testing of all parameters.
1
Page 2
SN54ABT16646, SN74ABT16646
OPERATION OR FUNCTION
16-BIT BUS TRANSCEIVERS AND REGISTERS
WITH 3-STATE OUTPUTS
SCBS212D – JUNE 1992 – REVISED JUL Y 1999
description (continued)
The SN54ABT16646 is characterized for operation over the full military temperature range of –55°C to 125°C.
The SN74ABT16646 is characterized for operation from –40°C to 85°C.
FUNCTION TABLE
INPUTS
OEDIRCLKABCLKBASABSBAA1–A8B1–B8
XX↑XXXInputUnspecifiedStore A, B unspecified
XXX ↑XXUnspecifiedInputStore B, A unspecified
HX↑↑XXInputInputStore A and B data
HXH or LH or LXXInput disabledInput disabledIsolation, hold storage
LLXXXLOutputInputReal-time B data to A bus
LLXH or LXHOutputInputStored B data to A bus
LHXXLXInputOutputReal-time A data to B Bus
LHH or LXHXInputOutputStored A data to bus
†
The data-output functions can be enabled or disabled by various signals at OE or DIR. Data-input functions always are enabled, i.e., data at the
bus terminals is stored on every low-to-high transition of the clock inputs.
DATA I/O
†
{{
2
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
Page 3
SN54ABT16646, SN74ABT16646
16-BIT BUS TRANSCEIVERS AND REGISTERS
WITH 3-STATE OUTPUTS
SCBS212D – JUNE 1992 – REVISED JUL Y 1999
BUS A
DIRLCLKABXCLKBAXSABXSBA
OE
L
REAL-TIME TRANSFER
BUS B TO BUS A
BUS B
L
OE
L
BUS A
DIRHCLKABXCLKBAXSABLSBA
REAL-TIME TRANSFER
BUS A TO BUS B
BUS B
X
BUS A
DIRXCLKAB CLKBAXSABXSBA
X
X
H
X
X
↑
XX
STORAGE FROM
A, B, OR A AND B
↑
↑↑
BUS B
OEOE
X
X
X
X
BUS A
DIRLCLKABXCLKBA
L
LHH or LXHX
TRANSFER STORED DA TA
Figure 1. Bus-Management Functions
H or L
TO A AND/OR B
BUS B
SABXSBA
H
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
3
Page 4
SN54ABT16646, SN74ABT16646
16-BIT BUS TRANSCEIVERS AND REGISTERS
WITH 3-STATE OUTPUTS
SCBS212D – JUNE 1992 – REVISED JUL Y 1999
logic symbol
†
56
1OE
2OE
1A1
1A2
1A3
1A4
1A5
1A6
1A7
1A8
2A1
2A2
2A3
2A4
2A5
2A6
2A7
2A8
1
55
54
2
3
29
28
30
31
27
26
5
6
8
9
10
12
13
14
15
16
17
19
20
21
23
24
1DIR
1CLKBA
1SBA
1CLKABC6
1SAB
2DIR
2CLKBA
2SBA
2CLKABC13
2SAB
G3
3 EN1 [BA]
3 EN2 [AB]
C4
G5
G7
G10
10 EN8 [BA]
10 EN9 [AB]
C11
G12
G14
≥1
1
6D
177
≥1
8
13D
11414
≥1
≥1
155
11D
11212
4D
2
9
52
51
49
48
47
45
44
43
42
41
40
38
37
36
34
33
1B1
1B2
1B3
1B4
1B5
1B6
1B7
1B8
2B1
2B2
2B3
2B4
2B5
2B6
2B7
2B8
†
This symbol is in accordance with ANSI/IEEE Std 91-1984 and IEC Publication 617-12.
4
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
Page 5
logic diagram (positive logic)
56
1OE
1
1DIR
1CLKBA
1SBA
1CLKAB
1SAB
55
54
2
3
SN54ABT16646, SN74ABT16646
16-BIT BUS TRANSCEIVERS AND REGISTERS
WITH 3-STATE OUTPUTS
SCBS212D – JUNE 1992 – REVISED JUL Y 1999
1A1
2OE
2DIR
2CLKBA
2SBA
2CLKAB
2SAB
One of Eight Channels
5
1D
C1
29
28
30
31
27
26
To Seven Other Channels
C1
1D
52
1B1
2A1
15
One of Eight Channels
1D
C1
To Seven Other Channels
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
C1
1D
42
2B1
5
Page 6
SN54ABT16646, SN74ABT16646
UNIT
16-BIT BUS TRANSCEIVERS AND REGISTERS
WITH 3-STATE OUTPUTS
SCBS212D – JUNE 1992 – REVISED JUL Y 1999
absolute maximum ratings over operating free-air temperature range (unless otherwise noted)
Stresses beyond those listed under “absolute maximum ratings” may cause permanent damage to the device. These are stress ratings only, and
functional operation of the device at these or any other conditions beyond those indicated under “recommended operating conditions” is not
implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
NOTES: 1. The input and output negative-voltage ratings may be exceeded if the input and output clamp-current ratings are observed.
2. The package thermal impedance is calculated in accordance with JESD 51.
SN54ABT16646, SN74ABT16646
16-BIT BUS TRANSCEIVERS AND REGISTERS
WITH 3-STATE OUTPUTS
SCBS212D – JUNE 1992 – REVISED JUL Y 1999
timing requirements over recommended ranges of supply voltage and operating free-air
temperature (unless otherwise noted) (see Figure 2)
SN54ABT16646
VCC = 5 V,
f
clock
t
w
t
su
t
h
TA = 25°C
MINMAX
Clock frequency125125MHz
Pulse duration, CLK high or low4.34.3ns
Setup time, A or B before CLKAB↑ or CLKBA↑3.54ns
Hold time, A or B after CLKAB↑ or CLKBA↑0.50.5ns
MINMAX
timing requirements over recommended ranges of supply voltage and operating free-air
temperature (unless otherwise noted) (see Figure 2)
SN74ABT16646
VCC = 5 V,
f
clock
t
w
t
su
t
h
TA = 25°C
MINMAX
Clock frequency125125MHz
Pulse duration, CLK high or low4.34.3ns
Setup time, A or B before CLKAB↑ or CLKBA↑33ns
Hold time, A or B after CLKAB↑ or CLKBA↑00ns
MINMAX
UNIT
UNIT
8
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
Page 9
CLKBA or CLKAB
A or B
ns
A or B
B or A
ns
SAB
SBA
†
B or A
ns
OE
A or B
ns
OE
A or B
ns
DIR
A or B
ns
DIR
A or B
ns
CLKBA or CLKAB
A or B
ns
A or B
B or A
ns
SAB
SBA
†
B or A
ns
OE
A or B
ns
OE
A or B
ns
DIR
A or B
ns
DIR
A or B
ns
SN54ABT16646, SN74ABT16646
16-BIT BUS TRANSCEIVERS AND REGISTERS
WITH 3-STATE OUTPUTS
SCBS212D – JUNE 1992 – REVISED JUL Y 1999
switching characteristics over recommended ranges of supply voltage and operating free-air
temperature, C
PARAMETER
f
max
t
PLH
t
PHL
t
PLH
t
PHL
t
PLH
t
PHL
t
PZH
t
PZL
t
PHZ
t
PLZ
t
PZH
t
PZL
t
PHZ
t
PLZ
†
These parameters are measured with the internal output state of the storage register opposite that of the bus input.
SN54ABT16646, SN74ABT16646
16-BIT BUS TRANSCEIVERS AND REGISTERS
WITH 3-STATE OUTPUTS
SCBS212D – JUNE 1992 – REVISED JUL Y 1999
PARAMETER MEASUREMENT INFORMATION
500 Ω
t
w
1.5 V
500 Ω
1.5 V
1.5 V1.5 V
From Output
Under Test
CL = 50 pF
(see Note A)
LOAD CIRCUIT
Input
Input
Output
Output
INVERTING AND NONINVERTING OUTPUTS
NOTES: A. CL includes probe and jig capacitance.
B. Waveform 1 is for an output with internal conditions such that the output is low except when disabled by the output control.
Waveform 2 is for an output with internal conditions such that the output is high except when disabled by the output control.
C. All input pulses are supplied by generators having the following characteristics: PRR ≤ 10 MHz, ZO = 50 Ω, tr ≤ 2.5 ns, tf≤ 2.5 ns.
D. The outputs are measured one at a time with one transition per measurement.
1.5 V
VOLTAGE WAVEFORMS
PULSE DURATION
1.5 V1.5 V
t
PLH
t
PHL
VOLTAGE WAVEFORMS
PROPAGATION DELAY TIMES
S1
t
PHL
1.5 V
t
PLH
3 V
0 V
V
V
V
V
7 V
GND
OH
OL
OH
OL
Open
3 V
0 V
Timing Input
Data Input
Output
Output
Control
Control
Output
Waveform 1
S1 at 7 V
(see Note B)
Output
Waveform 2
S1 at Open
(see Note B)
TESTS1
t
PLH/tPHL
t
PLZ/tPZL
t
PHZ/tPZH
t
su
1.5 V1.5 V
VOLTAGE WAVEFORMS
SETUP AND HOLD TIMES
t
PZL
1.5 V
t
PZH
1.5 V
VOLTAGE WAVEFORMS
ENABLE AND DISABLE TIMES
LOW- AND HIGH-LEVEL ENABLING
Open
Open
1.5 V
t
7 V
h
1.5 V1.5 V
VOL + 0.3 V
VOH – 0.3 V
t
PLZ
t
PHZ
3 V
0 V
3 V
0 V
3 V
0 V
3.5 V
V
OL
V
OH
≈ 0 V
10
Figure 2. Load Circuit and Voltage Waveforms
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
Page 11
IMPORTANT NOTICE
T exas Instruments and its subsidiaries (TI) reserve the right to make changes to their products or to discontinue
any product or service without notice, and advise customers to obtain the latest version of relevant information
to verify, before placing orders, that information being relied on is current and complete. All products are sold
subject to the terms and conditions of sale supplied at the time of order acknowledgement, including those
pertaining to warranty, patent infringement, and limitation of liability.
TI warrants performance of its semiconductor products to the specifications applicable at the time of sale in
accordance with TI’s standard warranty. Testing and other quality control techniques are utilized to the extent
TI deems necessary to support this warranty . Specific testing of all parameters of each device is not necessarily
performed, except those mandated by government requirements.
CERTAIN APPLICA TIONS USING SEMICONDUCT OR PRODUCTS MAY INVOLVE POTENTIAL RISKS OF
DEATH, PERSONAL INJURY, OR SEVERE PROPERTY OR ENVIRONMENTAL DAMAGE (“CRITICAL
APPLICATIONS”). TI SEMICONDUCTOR PRODUCTS ARE NOT DESIGNED, AUTHORIZED, OR
WARRANTED TO BE SUITABLE FOR USE IN LIFE-SUPPORT DEVICES OR SYSTEMS OR OTHER
CRITICAL APPLICA TIONS. INCLUSION OF TI PRODUCTS IN SUCH APPLICATIONS IS UNDERST OOD TO
BE FULLY AT THE CUSTOMER’S RISK.
In order to minimize risks associated with the customer’s applications, adequate design and operating
safeguards must be provided by the customer to minimize inherent or procedural hazards.
TI assumes no liability for applications assistance or customer product design. TI does not warrant or represent
that any license, either express or implied, is granted under any patent right, copyright, mask work right, or other
intellectual property right of TI covering or relating to any combination, machine, or process in which such
semiconductor products or services might be or are used. TI’s publication of information regarding any third
party’s products or services does not constitute TI’s approval, warranty or endorsement thereof.
Copyright 1999, Texas Instruments Incorporated
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