Datasheet SN74ABT162827ADGGR, SN74ABT162827ADGVR, SN74ABT162827ADL, SN74ABT162827ADLR Datasheet (Texas Instruments)

Page 1
SN54ABT162827A, SN74ABT162827A
20-BIT BUFFERS/DRIVERS
WITH 3-STATE OUTPUTS
SCBS248E – JULY 1993 – REVISED MAY 1997
D
Widebus
D
Output Ports Have Equivalent 25- Series
Family
Resistors, So No External Resistors Are Required
D
High-Impedance State During Power Up and Power Down
D
State-of-the-Art
EPIC-ΙΙB
BiCMOS Design
Significantly Reduces Power Dissipation
D
Typical V < 1 V at V
D
High-Impedance State During Power Up
(Output Ground Bounce)
OLP
= 5 V, TA = 25°C
CC
and Power Down
D
Distributed VCC and GND Pin Configuration Minimizes High-Speed Switching Noise
D
Flow-Through Architecture Optimizes PCB Layout
D
Latch-Up Performance Exceeds 500 mA Per JEDEC Standard JESD-17
D
ESD Protection Exceeds 2000 V Per MIL-STD-883, Method 3015; Exceeds 200 V Using Machine Model (C = 200 pF, R = 0)
D
Package Options Include Plastic 300-mil Shrink Small-Outline (DL), Thin Shrink Small-Outline (DGG), and Thin Very Small-Outline (DGV) Packages and 380-mil Fine-Pitch Ceramic Flat (WD) Package
description
The ’ABT162827A are noninverting 20-bit buffers composed of two 10-bit buffers with separate output-enable signals. For either 10-bit buffer , the two output-enable (1OE1 2OE2) inputs must both be low for the corresponding Y outputs to be active. If either output-enable input is high, the outputs of that 10-bit buffer are in the high-impedance state.
and 1OE2, or 2OE1 and
SN54ABT162827A ...WD PACKAGE
SN74ABT162827A . . . DGG, DGV, OR DL PACKAGE
1OE1
1Y1 1Y2
GND
1Y3 1Y4
V
CC
1Y5 1Y6 1Y7
GND
1Y8 1Y9
1Y10
2Y1 2Y2 2Y3
GND
2Y4 2Y5 2Y6
V
CC
2Y7 2Y8
GND
2Y9
2Y10
2OE1
(TOP VIEW)
1
56
2
55
3
54
4
53
5
52
6
51
7
50
8
49
9
48
10
47
11
46
12
45
13
44
14
43
15
42
16
41
17
40
18
39
19
38
20
37
21
36
22
35
23
34
24
33
25
32
26
31
27
30
28
29
1OE2 1A1 1A2 GND 1A3 1A4 V
CC
1A5 1A6 1A7 GND 1A8 1A9 1A10 2A1 2A2 2A3 GND 2A4 2A5 2A6 V
CC
2A7 2A8 GND 2A9 2A10 2OE2
The outputs, which are designed to source or sink up to 12 mA, include equivalent 25- series resistors to reduce overshoot and undershoot.
When VCC is between 0 and 2.1 V , the device is in the high-impedance state during power up or power down. However, to ensure the high-impedance state above 2.1 V, OE
should be tied to VCC through a pullup resistor;
the minimum value of the resistor is determined by the current-sinking capability of the driver. The SN54ABT162827A is characterized for operation over the full military temperature range of –55°C to
125°C. The SN74ABT162827A is characterized for operation from –40°C to 85°C.
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
Widebus and EPIC-ΙΙB are trademarks of Texas Instruments Incorporated.
UNLESS OTHERWISE NOTED this document contains PRODUCTION DATA information current as of publication date. Products conform to specifications per the terms of Texas Instruments standard warranty. Production processing does not necessarily include testing of all parameters.
POST OFFICE BOX 655303 DALLAS, TEXAS 75265
Copyright 1997, Texas Instruments Incorporated
1
Page 2
SN54ABT162827A, SN74ABT162827A 20-BIT BUFFERS/DRIVERS WITH 3-STATE OUTPUTS
SCBS248E – JULY 1993 – REVISED MAY 1997
OE1 OE2 A
FUNCTION TABLE
(each 10-bit buffer) INPUTS
L L L L
L LH H H XX Z X H X Z
OUTPUT
Y
logic symbol
1OE1 1OE2
2OE1 2OE2
1A1 1A2 1A3 1A4 1A5 1A6 1A7 1A8 1A9
1A10
2A1 2A2 2A3 2A4 2A5 2A6 2A7 2A8 2A9
2A10
1 56
28 29
55 54 52 51 49 48 47 45 44 43 42 41 40 38 37 36 34 33 31 30
&
&
11
12
EN1
EN2
10 12 13 14 15 16 17 19 20 21 23 24 26 27
2
1Y1
3
1Y2
5
1Y3
6
1Y4
8
1Y5
9
1Y6 1Y7 1Y8 1Y9 1Y10 2Y1 2Y2 2Y3 2Y4 2Y5 2Y6 2Y7 2Y8 2Y9 2Y10
This symbol is in accordance with ANSI/IEEE Std 91-1984 and IEC Publication 617-12.
2
POST OFFICE BOX 655303 DALLAS, TEXAS 75265
Page 3
UNIT
logic diagram (positive logic)
SN54ABT162827A, SN74ABT162827A
20-BIT BUFFERS/DRIVERS
WITH 3-STATE OUTPUTS
SCBS248E – JULY 1993 – REVISED MAY 1997
1OE1 1OE2
1A1
1 56
55
2
1Y1
To Nine Other Channels To Nine Other Channels
2OE1 2OE2
2A1
28 29
42
15
2Y1
absolute maximum ratings over operating free-air temperature range (unless otherwise noted)
Supply voltage range, VCC –0.5 V to 7 V. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Input voltage range, V
Voltage range applied to any output in the high or power-off state, VO –0.5 V to 5.5 V. . . . . . . . . . . . . . . . . . .
Current into any output in the low state, IO 30 mA. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Input clamp current, I Output clamp current, I Package thermal impedance, θ
Storage temperature range, T
Stresses beyond those listed under “absolute maximum ratings” may cause permanent damage to the device. These are stress ratings only, and functional operation of the device at these or any other conditions beyond those indicated under “recommended operating conditions” is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
NOTES: 1. The input and output negative-voltage ratings may be exceeded if the input and output clamp-current ratings are observed.
2. The package thermal impedance is calculated in accordance with EIA/JEDEC Std JESD51.
(see Note 1) –0.5 V to 7 V. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
I
(V
< 0) –18 mA. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
IK
I
(V
< 0) –50 mA. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
OK
O
(see Note 2): DGG package 81°C/W. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
JA
DGV package 86°C/W. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
DL package 74°C/W. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
–65°C to 150°C. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
stg
recommended operating conditions (see Note 3)
SN54ABT162827A SN74ABT162827A
MIN MAX MIN MAX
V
CC
V
IH
V
IL
V
I
I
OH
I
OL
t/V Input transition rise or fall rate 10 10 ns/Vt/V
T
A
NOTE 3: Unused inputs must be held high or low to prevent them from floating.
Supply voltage 4.5 5.5 4.5 5.5 V High-level input voltage 2 2 V Low-level input voltage 0.8 0.8 V Input voltage 0 V High-level output current –12 –12 mA Low-level output current 12 12 mA
Power-up ramp rate 200 200 µs/V
CC
Operating free-air temperature –55 125 –40 85 °C
CC
0 V
CC
V
PRODUCT PREVIEW information concerns products in the formative or design phase of development. Characteristic data and other specifications are design goals. Texas Instruments reserves the right to change or discontinue these products without notice.
POST OFFICE BOX 655303 DALLAS, TEXAS 75265
3
Page 4
SN54ABT162827A, SN74ABT162827A
PARAMETER
TEST CONDITIONS
UNIT
V
V
V
4.5 V
VOLV
V
V
V
CC
#
,
20-BIT BUFFERS/DRIVERS WITH 3-STATE OUTPUTS
SCBS248E – JULY 1993 – REVISED MAY 1997
electrical characteristics over recommended operating free-air temperature range (unless otherwise noted)
TA = 25°C SN54ABT162827A SN74ABT162827A
MIN TYP†MAX MIN MAX MIN MAX
V
IK
OH
V
hys
I
I
I
OZPU
I
OZPD
§
I
OZH
§
I
OZL
I
off
I
CEX
I
O
I
CC
Data
I
C C
All typical values are at VCC = 5 V.
This parameter is characterized, but not production tested.
§
The parameters I
Not more than one output should be tested at a time, and the duration of the test should not exceed one second.
#
This is the increase in supply current for each input that is at the specified TTL voltage level rather than VCC or GND.
inputs
CC
Control inputs
i o
VCC = 4.5 V, II = –18 mA –1.2 –1.2 –1.2 V VCC = 4.5 V, IOH = –1 mA 3.35 3.35 3.35 VCC = 5 V, IOH = –1 mA 3.85 3.85 3.85
=
CC
= 4.5
CC
VCC = 0 to 5.5 V, VI = VCC or GND ±1 ±1 ±1 µA VCC = 0 to 2.1 V,
VO = 0.5 V to 2.7 V, OE VCC = 2.1 V to 0,
VO = 0.5 V to 2.7 V, OE VCC = 2.1 V to 5.5 V,
VO = 2.7 V, OE VCC = 2.1 V to 5.5 V,
VO = 0.5 V, OE VCC = 0, VI or VO 4.5 V ±100 ±100 µA VCC = 5.5 V,
VO = 5.5 V VCC = 5.5 V, VO = 2.5 V –25 –75 –100 –25 –100 –25 –100 mA
=
= 5.5 V, IO = 0, VI = VCC or GND
VCC = 5.5 V, One input at 3.4 V, Other inputs at VCC or GND
VCC = 5.5 V, One input at 3.4 V, Other inputs at VCC or GND
VI = 2.5 V or 0.5 V 4 pF VO = 2.5 V or 0.5 V 7 pF
OZH
and I
include the input leakage current.
OZL
IOH = –3 mA 3.1 3.1 3.1 IOH = –12 mA 2.6 2.6 2.6 IOL = 8 mA 0.4 0.8 0.8 0.65 IOL = 12 mA 0.8
100 mV
= X
= X
2 V
2 V
Outputs high 50 50 50 µA
Outputs high 2 2 2 Outputs low 32 32 32 Outputs disabled 2 2 2
Outputs enabled 1 1.5 1
Outputs disabled 0.05 1 0.05
±50 ±50 ±50 µA
±50 ±50 ±50 µA
10 10 10 µA
–10 –10 –10 µA
1.5 1.5 1.5
mA
mA
PRODUCT PREVIEW information concerns products in the formative or design phase of development. Characteristic data and other specifications are design goals. Texas Instruments reserves the right to change or discontinue these products without notice.
4
POST OFFICE BOX 655303 DALLAS, TEXAS 75265
Page 5
(INPUT)
(OUTPUT)
A
Y
ns
OE
Y
ns
OE
Y
ns
SN54ABT162827A, SN74ABT162827A
20-BIT BUFFERS/DRIVERS
WITH 3-STATE OUTPUTS
SCBS248E – JULY 1993 – REVISED MAY 1997
switching characteristics over recommended ranges of supply voltage and operating free-air temperature, C
PARAMETER
t
PLH
t
PHL
t
PZH
t
PZL
t
PHZ
t
PLZ
= 50 pF (unless otherwise noted) (see Figure 1)
L
FROM
TO
VCC = 5 V,
TA = 25°C
MIN TYP MAX MIN MAX MIN MAX
1 2.1 3.6 1 4.1 1 3.9
1.1 2.8 4.2 1.1 5 1.1 4.7
1.5 3.4 6.3 1.5 7.2 1.5 6.9
1.6 3.5 5.3 1.6 6.6 1.6 6.3
2.1 4.1 6.5 2.1 6.8 2.1 6.6
1.5 3.5 5.9 1.5 7.3 1.5 6.3
SN54ABT162827A SN74ABT162827A
UNIT
PRODUCT PREVIEW information concerns products in the formative or design phase of development. Characteristic data and other specifications are design goals. Texas Instruments reserves the right to change or discontinue these products without notice.
POST OFFICE BOX 655303 DALLAS, TEXAS 75265
5
Page 6
SN54ABT162827A, SN74ABT162827A 20-BIT BUFFERS/DRIVERS WITH 3-STATE OUTPUTS
SCBS248E – JULY 1993 – REVISED MAY 1997
PARAMETER MEASUREMENT INFORMATION
From Output
Under Test
CL = 50 pF
(see Note A)
Input
500
500
LOAD CIRCUIT
t
w
1.5 V 1.5 V
VOLTAGE WAVEFORMS
PULSE DURATION
S1
7 V
Open
GND
3 V
0 V
Timing Input
Data Input
TEST S1
t
PLH/tPHL
t
PLZ/tPZL
t
PHZ/tPZH
t
su
1.5 V 1.5 V
VOLTAGE WAVEFORMS
SETUP AND HOLD TIMES
Open
Open
1.5 V
t
7 V
h
3 V
0 V
3 V
0 V
Input
t
PLH
Output
t
PHL
Output
INVERTING AND NONINVERTING OUTPUTS
NOTES: A. CL includes probe and jig capacitance.
B. Waveform 1 is for an output with internal conditions such that the output is low except when disabled by the output control.
Waveform 2 is for an output with internal conditions such that the output is high except when disabled by the output control. C. All input pulses are supplied by generators having the following characteristics: PRR 10 MHz, ZO = 50 , tr 2.5 ns, tf≤ 2.5 ns. D. The outputs are measured one at a time with one transition per measurement.
1.5 V 1.5 V
1.5 V
1.5 V1.5 V
VOLTAGE WAVEFORMS
PROPAGATION DELAY TIMES
Figure 1. Load Circuit and Voltage Waveforms
t
PHL
1.5 V
t
PLH
3 V
0 V
V
V
V
V
OH
OL
OH
OL
Output
Control
Output
Waveform 1
S1 at 7 V
(see Note B)
Output
Waveform 2
S1 at Open
(see Note B)
1.5 V
t
PZL
t
PLZ
1.5 V
t
t
PZH
ENABLE AND DISABLE TIMES
LOW- AND HIGH-LEVEL ENABLING
PHZ
1.5 V
VOLTAGE WAVEFORMS
1.5 V
VOL + 0.3 V
VOH – 0.3 V
3 V
0 V
3.5 V
V
OL
V
OH
0 V
6
POST OFFICE BOX 655303 DALLAS, TEXAS 75265
Page 7
IMPORTANT NOTICE
T exas Instruments and its subsidiaries (TI) reserve the right to make changes to their products or to discontinue any product or service without notice, and advise customers to obtain the latest version of relevant information to verify, before placing orders, that information being relied on is current and complete. All products are sold subject to the terms and conditions of sale supplied at the time of order acknowledgement, including those pertaining to warranty, patent infringement, and limitation of liability.
TI warrants performance of its semiconductor products to the specifications applicable at the time of sale in accordance with TI’s standard warranty. Testing and other quality control techniques are utilized to the extent TI deems necessary to support this warranty . Specific testing of all parameters of each device is not necessarily performed, except those mandated by government requirements.
CERTAIN APPLICA TIONS USING SEMICONDUCT OR PRODUCTS MAY INVOLVE POTENTIAL RISKS OF DEATH, PERSONAL INJURY, OR SEVERE PROPERTY OR ENVIRONMENTAL DAMAGE (“CRITICAL APPLICATIONS”). TI SEMICONDUCTOR PRODUCTS ARE NOT DESIGNED, AUTHORIZED, OR WARRANTED TO BE SUITABLE FOR USE IN LIFE-SUPPORT DEVICES OR SYSTEMS OR OTHER CRITICAL APPLICA TIONS. INCLUSION OF TI PRODUCTS IN SUCH APPLICATIONS IS UNDERST OOD TO BE FULLY AT THE CUSTOMER’S RISK.
In order to minimize risks associated with the customer’s applications, adequate design and operating safeguards must be provided by the customer to minimize inherent or procedural hazards.
TI assumes no liability for applications assistance or customer product design. TI does not warrant or represent that any license, either express or implied, is granted under any patent right, copyright, mask work right, or other intellectual property right of TI covering or relating to any combination, machine, or process in which such semiconductor products or services might be or are used. TI’s publication of information regarding any third party’s products or services does not constitute TI’s approval, warranty or endorsement thereof.
Copyright 1998, Texas Instruments Incorporated
Loading...