Any sensitive equipment requiring protection
against lightning strikes and power crossing.
These devices are dedicated to central office protection as they comply with the most stressfull
standards.
Their Low Capacitances make them suitable for
ADSL.
DESCRIPTION
The SMP100LC is a series of low capacitance
transient surge arrestors designed for the protection of high debit rate communication equipment.
Its low capacitance avoids any distortion of the signal and is compatible with digital transmission line
cards (xDSL, ISDN...).
SMP100LC series tested and confirmed compatible with Cooper Bussmann Telecom Circuit Protector TCP 1.25A.
BENEFITS
Trisils are not subject to ageing and provide a fail
safe mode in short circuit for a better protection.
They are used to help equipment to meet main
standards such as UL60950, IEC950 / CSA C22.2
and UL1459. They have UL94 V0 approved resin.
SMB package is JEDEC registered (DO-214AA).
Trisils comply with the following standards GR1089 Core, ITU-T-K20/K21, VDE0433, VDE0878,
IEC61000-4-5 and FCC part 68.
= 2µA max
R
= 150 mA min
H
SMP100LC
SMB
(JEDEC DO-214AA)
Table 1: Order Codes
Part NumberMarking
SMP100LC-8PL8
SMP100LC-25L25
SMP100LC-35L35
SMP100LC-65L06
SMP100LC-90L09
SMP100LC-120L12
SMP100LC-140L14
SMP100LC-160L16
SMP100LC-200L20
SMP100LC-230L23
SMP100LC-270L27
SMP100LC-320L32
SMP100LC-360L36
SMP100LC-400L40
Figure 1: Schematic Diagram
June 2005
REV. 11
1/10
Page 2
SMP100LC
Table 2: In compliance with the following standards
STANDARD
GR-1089 Core
First level
GR-1089 Core
Second level
GR-1089 Core
Intra-building
ITU-T-K20/K21
ITU-T-K20
(IEC61000-4-2)
VDE0433
VDE0878
IEC61000-4-5
FCC Part 68, lightning
surge type A
FCC Part 68, lightning
surge type B
Peak Surge
Voltag e
(V)
2500
1000
50002/10 µs5002/10 µs0
15002/10 µs1002/10 µs0
6000
1500
8000
15000
4000
2000
4000
2000
4000
4000
1500
800
10009/720 µs255/320 µs0
Waveform
Voltag e
2/10 µs
10/1000 µs
10/700 µs
1/60 ns
10/700 µs
1.2/50 µs
10/700 µs
1.2/50 µs
10/160 µs
10/560 µs
Required
peak current
(A)
500
100
150
37.5
Current
waveform
2/10 µs
10/1000 µs
5/310 µs
ESD contact discharge
ESD air discharge
100
50
100
50
100
100
200
100
5/310 µs
1/20 µs
5/310 µs
8/20 µs
10/160 µs
10/560 µs
Minimum serial
resistor to meet
standard (Ω)
0
0
0
0
0
0
0
0
0
0
0
0
0
0
Table 3: Absolute Ratings (T
amb
= 25°C)
SymbolParameterValueUnit
I
PP
I
FS
I
TSM
I
T
T
T
Note 1: in fail safe mode, the device acts as a short circuit
Repetitive peak pulse current (see figure 2)10/1000 µs
Fail-safe mode : maximum current (note 1)
Non repetitive surge peak on-state current (sinusoidal)t = 0.2 s
2
tI2t value for fusing
Storage temperature range
stg
Maximum junction temperature
j
Maximum lead temperature for soldering during 10 s.
L
8/20 µs
10/560 µs
5/310 µs
10/160 µs
1/20 µs
2/10 µs
8/20 µs5
t = 1 s
t = 2 s
t = 15 mn
t = 16.6 ms
t = 20 ms
100
400
140
150
200
400
500
24
15
12
4
20
21
-55 to 150
150
260
A
A
kA
A
°C
°C
2
s
2/10
Page 3
SMP100LC
Table 4: Thermal Resistances
SymbolParameterValueUnit
R
R
th(j-a)
th(j-l)
Junction to ambient (with recommended footprint)100°C/W
Junction to leads20°C/W
Table 5: Electrical Characteristics (T
amb
= 25°C)
SymbolParameter
V
V
V
I
I
I
Stand-off voltage
RM
Breakdown voltage
BR
Breakover voltage
BO
Leakage current
RM
Peak pulse current
PP
Breakover current
BO
I
Holding current
H
V
Continuous reverse voltage
R
Leakage current at V
I
R
R
CCapacitance
Types
I
RM
@ V
RM
IR @ V
R
Dynamic
V
BO
max.max.max.max.max.min.typ.typ.
note1note 2note 3note 4note 5note 6
V
BO
Static
@ I
BO
I
H
CC
µAVµAVVVmAmApFpF
SMP100LC-8
SMP100LC-2522254035
6
82515
50 (typ.)NA75
NA65
SMP100LC-3532355555NA55
SMP100LC-65556585854590
SMP100LC-9081901201254080
SMP100LC-1201081201551603575
SMP100LC-1401201401851903065
SMP100LC-1601441602052003065
2
5
800
150
SMP100LC-2001802002552503060
SMP100LC-2302072302952853060
SMP100LC-2702432703453353060
SMP100LC-3202903204003902550
SMP100LC-3603253604604502550
SMP100LC-4003604005405302045
Note 1: IR measured at VR guarantee VBR min ≥ VR
Note 2: see functional test circuit 1
Note 3: see test circuit 2
Note 4: see functional holding current test circuit 3
Note 5: V
Note 6: V
= 50V bias, V
R
= 2V bias, V
R
RMS
=1V, F=1MHz
RMS
=1V, F=1MHz
3/10
Page 4
SMP100LC
Figure 2: Pulse waveformFigure 3: Non repetitive surge peak on-state
current versus overload duration
I(A)
TSM
70
60
50
40
30
20
10
0
1E-21E-11E+01E+11E+21E+3
t(s)
F=50Hz
T initial = 25°C
j
100
50
0
%I
PP
Repetitive peak pulse current
tr = rise time (µs)
tp = pulse duration time (µs)
t
r
t
p
t
Figure 4: On-state voltage versus on-state
current (typical values)
I (A)
T
100
V (V)
10
012345678
T
T initial = 25°C
j
Figure 6: Relative variation of breakover
voltage versus junction temperature
V [ ] / V [ =25°C]
TT
BOBO
1.08
1.06
1.04
1.02
jj
Figure 5: Relative variation of holding current
versus junction temperature
I [T ] / I [T =25°C]
HH
jj
2.0
1.8
1.6
1.4
1.2
1.0
0.8
0.6
0.4
0.2
0.0
-250255075100125
T (°C)
j
Figure 7: Relative variation of leakage current
versus junction temperature (typical values)
I [ ] / I [ =25°C]
TT
RR
2000
1000
jj
100
1.00
0.98
0.96
4/10
T (°C)
j
-250255075100125
10
T (°C)
1
255075100125
j
Page 5
SMP100LC
Figure 8: Variation of thermal impedance
junction to ambient versus pulse duration
(Printed circuit board FR4, SCu=35µm,
Figure 9: Relative variation of junction
capacitance versus reverse voltage applied
(typical values)
recommended pad layout)
C [V ] / C [V =2V]
Z/R
th(j-a) th(j-a)
100
10
t (s)
1
1E-31E-21E-11E+01E+11E+25E+2
p
RR
1.4
1.2
1.0
0.8
0.6
0.4
0.2
0.0
12
F =1MHz
V= 1V
RMS
T = 25°C
j
V (V)
R
5102050100300
APPLICATION NOTE
In wireline applications, analog or digital, both central office and subscriber sides have to be protected.
This function is assumed by a combined series / parallel protection stage.
Ring
relay
Line
Protection stage
Ex. Analog line cardEx. ADSL line card or terminal
Line
Protection stage
In such a stage, parallel function is assumed by one or several Trisil, and is used to protect against short
duration surge (lightning). During this kind of surges the Trisil limits the voltage across the device to be
protected at its break over value and then fires. The fuse assumes the series function, and is used to protect the module against long duration or very high current mains disturbances (50/60Hz). It acts by safe
circuits opening. Lightning surge and mains disturbance surges are defined by standards like GR1089,
FCC part 68, ITU-T K20.
Fuse TCP 1.25A
Tip S
SMP100LC-xxx
Gnd
SMP100LC-xxx
Ring S
Fuse TCP 1.25A
Typical circuit for subscriber side
T1
SMP100LC-xxx
T2
Tip L
Gnd
Fuse TCP 1.25A
Ring L
Typical circuit for central office side
5/10
Page 6
SMP100LC
Following figure shows the test method of the
board having Fuse and Trisil.
Surge
Generator
Current probe
I surge
Line side
Test board
Oscilloscope
Device to be protected
V
Voltage probe
These topologies, using SMP100LC from ST and
TCP1.25A from Cooper Bussmann, have been
functionally validated with a Trisil glued on the
PCB. Following example was performed with
SMP100LC-270 Trisil. For more information, see
Application Note AN2064.
Following curve shows the turn on of the Trisil during
lightning surge.
I surge (100A/div)
V (50V/div)
Test conditions:
2/10µs + and -2.5 and 5kV 500A (10 pulses of each
polarity), T
amb
= 25°C
Test result:
Fuse and Trisil OK after test in accordance with
GR1089 requirements
Following curve shows Trisil action while the fuse
remains operational.
I surge (2A/div)
V (100V/div)
Test conditions:
600V 3A 1.1s (first level), T
amb
= 25°C
Test result:
Fuse and Trisil OK after test in accordance with
GR1089 requirements
In case of high current power cross test, the fuse acts
like a switch by opening the circuit.
I surge (10A/div)
V (100V/div)
Test conditions:
277V 25A (second level), T
amb
= 25°C
Test result:
Fuse safety opened and Trisil OK after test in
accordance with GR1089 requirements
6/10
Page 7
Figure 10: Test circuit 1 for Dynamic IBO and VBO parameters
100 V / µs, di /dt < 10 A / µs, Ipp = 100 A
SMP100LC
U
KeyTek 'System 2' generator with PN246I module
10 µF
1 kV / µs, di/dt < 10 A / µs, Ipp = 10 A
26 µH
U
KeyTek 'System 2' generator with PN246I module
60 µF
Figure 11: Test circuit 2 for I
2 Ω
12 Ω
and VBO parameters
BO
45 Ω
250 Ω
83 Ω
66 Ω
470 Ω
47 Ω
K
46 µH
0.36 nF
46 µH
ton = 20ms
220V 50Hz
Vout
1/4
TEST PROCEDURE
Pulse test duration (tp = 20ms):
●
for Bidirectional devices = Switch K is closed
●
for Unidirectional devices = Switch K is open
Vselection:
OUT
●
Device with V < 200V V= 250 V, R1 = 140
●
Device with V200VV= 480 V, R2 = 240
➔Ω
BOOUTRMS
➔Ω≥
BOOUTRMS
R1 = 140Ω
R2 = 240Ω
IBO
measurement
DUT
VBO
measurement
7/10
Page 8
SMP100LC
Figure 12: Test circuit 3 for dynamic I
V
=-48V
BAT
This is a GO-NOGO test which allows to confirm the holding current (I ) level in a
functional test circuit.
TEST PROCEDURE
1/ Adjust the current level at the I value by short circuiting the AK of the D.U.T.
2/ Fire the D.U.T. with a surge current
3/ The D.U.T. will come back off-state within 50ms maximum.
09-Nov-20049Absolute ratings values, table 3 on page 2, updated.
07-Dec-200410
SMP100LC-320, SMP100LC-360 and SMP100LC-400
addition.
20-Jun-200511Telecom Circuit Protector added
9/10
Page 10
SMP100LC
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