Datasheet SMJ27C010A-12JM, SMJ27C010A-15JM, SMJ27C010A-20JM Datasheet (AUSTIN)

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Austin Semiconductor, Inc.
UVEPROM
SMJ27C010A
1 MEG UVEPROM
UV Erasable Programmable Read-Only Memory
A VAILABLE AS MILITA R Y SPECIFICATIONS
• SMD 5962-89614
• MIL-STD-883
FEATURES
• Single +5V ±10% power supply
• Operationally compatible with existing megabit EPROMs
• Industry standard 32-pin ceramic dual-in-line package
• All inputs/outputs fully TTL compatible
• 8-bit output for use in microprocessor-based systems
• Very high-speed SNAP! Pulse Programming
• Power-saving CMOS technology
• 3-state output buffers
• 400mV minimum DC noise immunity with standard TTL loads
• Latchup immunity of 250 mA on all input and output pins
• No pullup resistors required
• Low power dissipation (Vcc = 5.5V)
PActive - 165 mW Worst Case PStandby - 0.55 mW Worst Case (CMOS-input levels)
OPTIONS MARKING
• Timing
120ns access -1 2 150ns access -1 5 200ns access -2 0
• Package(s)
Ceramic DIP (600mils) J No. 114
• Operating Temperature Ranges
Military (-55oC to +125oC) M
For more products and information
please visit our web site at
www.austinsemiconductor.com
SMJ27C010A
Rev. 1.0 9/01
PIN ASSIGNMENT
(Top View)
32-Pin DIP (J)
(600 MIL)
1
V
PP
2
A16
3
A15
4
A12
5
A7
6
A6
7
A5
8
A4
9
A3
10
A2
11
A1
12
A0
13
DQ0
14
DQ1
15
DQ2
16
GND
Pin Name Function
A0 - A18 Address Inputs
DA0-DQ7 Inputs (programming)/Outputs
E\ Chip Enable G\ Output Enable
GND Ground
PGM\ Program
V
5V Supply
CC
V
13V Power Supply*
PP
*Only in program mode.
Vcc
32
PGM\
31
NC
30
A14
29
A13
28
A8
27
A9
26
A11
25
G\
24
A10
23 22
E\
21
DQ7
20
DQ6
19
DQ5
18
DQ4
17
DQ3
GENERAL DESCRIPTION
The SMJ27C010A series are 131072 by 8-bit (1048576­bit), ultaviolet (UV) light erasable, electrically programmable read-only memories (EPROMs). These devices are fabricated using power-saving CMOS technology for high speed and simple interface with MOS and bipolar circuits. All inputs (including program data inputs) can be driven by Series 54 TTL circuits without the use of external pullup resistors. Each output can drive one Series 54 TTL circuit without external resistors. The SMJ27C010A EPROM is offered in a ceramic dual-in-line package (J suffix) designed for insertion in mounting-hole rows on 15.2mm (600mil) centers. These EPROMs operate from a single 5V supply (in the read mode), and therefore, are ideal for use in microprocessor-based systems. One other 13V supply is needed for programming. All programming signals are TTL level. These devices are programmable using the SNAP! Pulse programming algorithm. The SNAP! Pulse programming
algorithm uses a VPP of 13V and a VCC of 6.5V for a nominal programming time of thirteen seconds. For programming outside the system, existing EPROM programmers can be used. Locations can be programmed singly, in blocks, or at random.
Austin Semiconductor, Inc. reserves the right to change products or specifications without notice.
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Austin Semiconductor, Inc.
FUNCTIONAL BLOCK DIAGRAM*
EPROM 131,072 x 8
12
A0
11
A1
10
A2
9
A3
8
A4
7
A5 DQ0
6
A6 DQ1
5
A7 DQ2
27
A8 DQ3
26
A9 DQ4
E\
G\
23 25
4
28 29 3
2 22
24
A10 DQ5 A11 DQ6 A12 DQ7 A13 A14 A15 A16
0
A
16 [PWR DWN]
&
EN
0
131,071
A A A A A A A A
UVEPROM
SMJ27C010A
13 14 15 17 18
19 20 21
* This symbol is in accordance with ANSI/IEEE Std 91-1984 and IEC Publication 617-12. J package illustrated.
OPERATION
The seven modes of operation are listed in Table 1. The read mode requires a single 5V supply. All inputs are TTL level except for VPP during programming (13V for SNAP! Pulse), and 12V on A9 for signature mode.
TABLE 1. OPERATION MODES
MODE*
FUNCTION
E\
G\
READ
V V
PGM\ X X X
V
PP
V
CC
V
V A9 X X X X X X A0 X X X X X X
DQ0-DQ7 Data Out High-Z High-Z Data In Data Out High-Z
* X can be VIL or VIH.
= 12V ± 0.5V
**V
H
SMJ27C010A
Rev. 1.0 9/01
IL IL
CC CC
OUTPUT
DISABLE
V
IL
V
IH
V
CC
V
CC
STANDBY PROGRAMMING VERIFY
V
IH
X
V
CC
V
CC
V
IL
V
IH
V
IL
V
PP
V
CC
V
IL
V
IL
V
IH
V
PP
V
CC
Austin Semiconductor, Inc. reserves the right to change products or specifications without notice.
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PROGRAM
INHIBIT
V
IH
X X
V
PP
V
CC
SIGNATURE MODE
V
IL
V
IL
X
V
CC
V
CC
** VH**
V
H
V
IL
V
IH
CODE
MFG DEVICE
97 D6
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Austin Semiconductor, Inc.
UVEPROM
SMJ27C010A
READ/OUTPUT DISABLE
When the outputs of two or more SMJ27C010As are connected in parallel on the same bus, the output of any particular device in the circuit can be read with no interference from competing outputs of the other devices. To read the output of a single device, a low level signal is applied to the E\ and G\ pins. All other devices in the circuit should have their outputs disabled by applying a high-level signal to one of these pins.
LA TCHUP IMMUNITY
Latchup immunity on the SMJ27C010A is a minimum of 250mA on all inputs and outputs. This feature provides latchup immunity beyond any potential transients at the printed circuit board level when the devices are interfaced to industry-standard TTL or MOS logic devices. The input/ output layout approach controls latchup without compromising performance or packing density.
POWER DOWN
Active ICC supply current can be reduced from 30mA to 500µA by applying a high TTL input on E\ and to 100µA by applying a high CMOS input on E\. In this mode all outputs are in the high-impedance state.
ERASURE
Before programming, the SMJ27C010A EPROM is erased by exposing the chip through the transparent lid to a high­intensity ultraviolet light (wavelength 2537 Å). The recommended minimum exposure dose (UV intensity x
exposure time) is 15-W.s/cm2. A typical 12-mW/cm2, filterless UV lamp erases the device in 21 minutes. The lamp should be located about 2.5cm above the chip during erasure. After erasure, all bits are in the high state. It should be noted that normal ambient light contains the correct wavelength for erasure; therefore, when using the SMJ27C010A, the window should be covered with an opaque label. After erasure (all bits in logic high state), logic lows are programmed into the desired locations. A programmed low can be erased only by ultraviolet light.
SNAP! PULSE PROGRAMMING
The SMJ27C010A is programmed by using the SNAP! Pulse programming algorithm as illustrated by the flow chart (Figure 1). This algorithm programs in a nominal time of thirteen seconds. Actual programming time varies as a function of the programmer used.
The SNAP! Pulse programming algorithm uses an initial pulse of 100 microseconds (µs) followed by a byte verification to determine when the addressed byte has been successfully programmed. Up to ten 100µs pulses per byte are provided before a failure is recognized.
The programming mode is achieved when V VCC= 6.5V, E\ = VIL, and G\ = VIH. Data is presented in
parallel (eight bits) on pins DQ0 through DQ7. Once addresses and data are stable, PGM\ is pulsed low.
More than one device can be programmed when the devices are connected in parallel. Locations can be programmed in any order. When the SNAP! Pulse programming routine is
complete, all bits are verified with VCC = VPP = 5V ± 10%.
= 13V,
PP
PROGRAM INHIBIT
Programming can be inhibited by maintaining high level inputs on the E\ or the PGM\ pins.
PROGRAM VERIFY
Programmed bits can be verified with VPP = 13V when G\ = VIL, and E\ = VIL, and PGM\ = VIH.
SIGNA TURE MODE
The signature mode provides access to a binary code identifying the manufacturer and type. This mode is activated when A9 (pin 26) is forced to 12V. Two identifier bytes are accessed by toggling A0. All other addresses must be held low. The signature code for these devices is 97D6. A0 low selects the manufacturer’s code 97 (Hex), and A0 high selects the device code D6 (Hex), as shown in Table 2.
TABLE 2. SIGNATURE MODES
IDENTIFIER*
MANUFACTURER CODE DEVICE CODE
* E\ = G\ = VIL, A1 - A8 = VIL, A9 = VH, A10 - A16 = VIL, VPP = VCC.
SMJ27C010A
Rev. 1.0 9/01
A0 DQ7 DQ6 DQ5 DQ4 DQ3 DQ2 DQ1 DQ0 HEX
V
IL
V
IH
1001011197 11010110D6
3
PINS
Austin Semiconductor, Inc. reserves the right to change products or specifications without notice.
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UVEPROM
SMJ27C010A
Austin Semiconductor, Inc.
FIGURE 1. SNAP! PULSE PROGRAMMING FLOW CHART
START
Address = First Location
Increment
Address
VCC = 6.5V ± 0.25V, VPP = 13V ± 0.25V
Program One Pulse = tW = 100µs
Last
Address?
Yes
Address = First Location
X = 0
Verify
One Byte
Pass
Fail
Increment Address
Program One Pulse = tW = 100µs
No
X = X+1
X = 10?
Program
Mode
Interactive
Mode
SMJ27C010A
Rev. 1.0 9/01
No
VCC = VPP = 5V ± 0.5V
Last
Address?
Yes
Compare All Bytes
to Original
Data
Pass
Device Passed
Fail
Yes
Device Failed
Final
Verification
Austin Semiconductor, Inc. reserves the right to change products or specifications without notice.
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Austin Semiconductor, Inc.
UVEPROM
SMJ27C010A
ABSOLUTE MAXIMUM RATINGS*
Supply Voltage Range, VCC**...........................-0.6V to +7.0V
Supply Voltage Range, Vpp**.........................-0.6V to +14.0V
Input Voltage Range, All inputs except A9**..-0.6V to VCC+1
A9.....-0.6V to +13.5V
Output Voltage Range,
with respect to VSS**..................................-0.6V to VCC +1
*Stresses greater than those listed under "Absolute Maximum Ratings" may cause permanent damage to the device. This is a stress rating only and functional operation of the device at these or any other conditions above those indicated in the operation section of this specification is not implied. Exposure to absolute maximum rating conditions for extended periods may affect reliability. ** All voltage values are with respect to GND.
Operating Free-air Temperature Range, TA....-55°C to 125°C
Storage Temperature Range, T
.....................-65°C to 150°C
stg
RECOMMENDED OPERATING CONDITIONS
V
V
Supply Voltage
CC
Supply Voltage
PP
Read Mode SNAP! Pulse programming algorithm
Read Mode SNAP! Pulse programming algorithm
1
2
TTL 2
High-level DC input voltageV
IH
V
T
NOTES:
1. VCC must be applied before or at the same time as VPP and removed after or at the same time as VPP. The deivce must not be inserted into or removed from the board when VPP or VCC is applied.
2. During programming, VPP must be maintained at 13V ± 0.25V .
Low-level DC input voltage
IL
Operating free-air temperature
A
CMOS TTL -0.5 0.8 V
CMOS -0.5 GND+0.2 V
MIN NOM MAX UNIT
4.5 5 5.5 V
6.25 6.5 6.75 V
V
-0.6 V
CC
CC
VCC+0.6
12.75 13 13.25 V V
+0.5
CC
V
-0.2 VCC+0.5
CC
-55 125 °C
V
V V
ELECTRICAL CHARACTERISTICS O VER RECOMMENDED RANGES OF SUPPLY VOLTAGE AND OPERA TING FREE-AIR TEMPERA TURE
PARAMETER
V
V
I
I
NOTES:
1. Minimum cycle time = maximum access time.
SMJ27C010A
Rev. 1.0 9/01
High-level DC output voltage
OH
Low-level DC output voltage
OL
Input current (leakage)
I
I
Output current (leakage)
I
O
supply current
V
I
PP1
I
PP2
CC1VCC
CC2
PP
V
supply current (during program pulse)
PP
supply current (standby)
supply current (active) (output open)
V
CC
TTL-Input Level CMOS-Input Level
TEST CONDITIONS MIN MAX UNIT
I
= -20µA VCC-0.2
OH
I
= -2.5mA
OH
I
= 2.1mA
OL
= 20µA
I
OL
VI = 0V to 5.5V VO = 0V to V VPP = VCC = 5.5V VPP = 13V V
= 5.5V, E\=V
CC
V
= 5.5V, E\=VCC±0.2V
CC
E\=VIL, VCC=5.5V
= minimum cycle time,
t
cycle
outputs open
CC
IH
1
Austin Semiconductor, Inc. reserves the right to change products or specifications without notice.
3.5
0.4
0.1 ±1 µA ±1 µA 10 µA 50 mA
500 100
30 mA
5
V
V
µA
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UVEPROM
SMJ27C010A
Austin Semiconductor, Inc.
CAPACITANCE OVER RECOMMENDED RANGES OF SUPPLY VOLT AGE AND OPER­ATING FREE-AIR TEMPERATURE, f = 1MHz*
PARAMETER
C
C
* Capacitance measurements are made on sample basis only. ** All typical values are at T
Input capacitance
I
Output capacitance
O
= 25°C and nominal voltages.
A
SWITCHING CHARACTERISTICS OVER RECOMMENDED RANGES OF OPERATING CONDITIONS
PARAMETER
Access time from address 120 150 200 ns
t
a(A)
Access time from chip enable 120 150 200 ns
t
a(E)
t
NOTES:
1. For all switching characteristics, the input pulse levels are 0.4V to 2.4V . T iming measurements are made at 2V for logic hi gh and 0.8V for logic low . (Reference AC testing waveform)
2. Common test conditions apply for t
3. V alue calculated from 0.5V delta to measured output level.
Output enable time from G\ 55 75 75 ns
en(G)
Output disable time from G\ or E\, whichever
t
dis
occurs first Output data valid time after change of
t
v(A)
address, E\, or G\, whichever occurs first
3
dis
TEST CONDITIONS TYP** MAX UNIT
= 0V, f = 1MHz
V
I
= 0V, f= 1 MHz
V
O
1,2
3
except during programming.
CONDITIONS
Input t
Input t
48pF 610pF
TEST
C
= 100pF
L
1 Series 74
TTL Load,
< 20ns,
r
< 20ns
f
-12
MIN MAX MIN MAX MIN MAX
0 50 0 60 0 60 ns
000 ns
-15 -20 UNIT
SWITCHING CHARACTERISTICS FOR PROGRAMMING: VCC = 6.5V and VPP = 13V (SNAP! Pulse), TA = 25°C
PARAMETER
t
dis(G)
t
en(G)
NOTE: 1. For all switching characteristics, the input pulse levels are 0.4V to 2.4V . T iming measurements are made at 2V for logic high and 0.8V for logic low (reference AC testing waveform).
Disable, Output disable time from G\ 0 130 ns Enable, Output enable time from G\ 150 ns
1
MIN MAX UNIT
TIMING REQUIREMENTS FOR PROGRAMMING
MIN TYP MA X UNIT
t
w(PGM)
t
su(A)
t
su(E)
t
su(G)
t
su(D)
t
su(Vpp)
t
su(Vcc)
t t
SMJ27C010A
Rev. 1.0 9/01
Pulse duration, program SNAP! Pulse Programming Algorithm 95 100 105 µs Setup Time, Address Setup Time, E\ Setup Time, G\ Setup Time, Data Setup Time, V Setup Time, V Hold time, address
h(A)
Hold time, data
h(D)
PP CC
Austin Semiconductor, Inc. reserves the right to change products or specifications without notice.
s 2µs 2µs 2µs 2µs 2µs 0µs 2µs
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Austin Semiconductor, Inc.
PARAMETER MEASUREMENT INFORMATION
2.08V
RL = 800
Output Under Test
UVEPROM
SMJ27C010A
CL = 100 pF
NOTES:
1. CL includes probe and fixture capacitance.
1
FIGURE 2. AC TEST OUTPUT LOAD CIRCUIT WAVEFORM
AC testing inputs are driven at 2.4V for logic high and 0.4V for logic low . Timing measurements are made at 2V for logic high and 0.8V for logic low for both inputs and outputs.
FIGURE 3. READ-CYCLE TIMING
SMJ27C010A
Rev. 1.0 9/01
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UVEPROM
SMJ27C010A
Austin Semiconductor, Inc.
FIGURE 4. PROGRAM-CYCLE TIMING (SNAP! PULSE PROGRAMMING)
* t
and t
dis(G)
** 13V V
SMJ27C010A
Rev. 1.0 9/01
are characteristics of the device but must be accommodated by the programmer.
en(G)
and 6.5V VCC for SNAP! Pulse programming.
PP
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Austin Semiconductor, Inc.
MECHANICAL DEFINITION*
ASI Case #114 (Package Designator J)
SMD 5962-89614, Case Outline X
UVEPROM
SMJ27C010A
Pin 1
D
e
E
E1
b2
SMD Specifications
SYMBOL
MIN MAX
A --- 0.225
b 0.014 0.026 b1 0.045 0.065 b2 0.008 0.018
D --- 1.680 E 0.510 0.620
e
E1
0.100 BSC
0.600 BSC
L1 0.125 0.200
L 0.015 0.070
A
L
L1
b
b1
NOTE: These dimensions are per the SMD. ASI's package dimensional limits may differ, but they will be within the SMD limits.
*All measurements are in inches.
SMJ27C010A
Rev. 1.0 9/01
Austin Semiconductor, Inc. reserves the right to change products or specifications without notice.
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Austin Semiconductor, Inc.
ORDERING INFORMATION
UVEPROM
SMJ27C010A
EXAMPLE:
Device Number Speed ns
SMJ27C010A -12 J * SMJ27C010A -15 J * SMJ27C010A -20 J *
SMJ27C010A-12JM
Package
Type
Process
*A VAILABLE PROCESSES
M = Extended T emperature Range -55oC to +125oC
SMJ27C010A
Rev. 1.0 9/01
Austin Semiconductor, Inc. reserves the right to change products or specifications without notice.
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Austin Semiconductor, Inc.
ASI TO DSCC PART NUMBER
CROSS REFERENCE*
ASI Pac kage Designator J
TI Part #** SMD Part #
SMJ27C010A-12JM 5962-8961406QXA SMJ27C010A-15JM 5962-8961405QXA SMJ27C010A-20JM 5962-8961403QXA
UVEPROM
SMJ27C010A
* ASI part number is for reference only. Orders received referencing the SMD part number will be processed per the SMD. ** Parts are listed on SMD under the old Texas Instruments part number. ASI purchased this product line in November of 1999.
SMJ27C010A
Rev. 1.0 9/01
11
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