
CD4014BC
8-Stage Static Shift Register
CD4014BC 8-Stage Static Shift Register
October 1987
Revised January 1999
General Description
The CD4014BC is an 8-stage parallel input/serial output
shift register. A parallel/serial cont rol input enabl es individual JAM inputs to each of 8 stages. Q outputs are available
from the sixth, seventh and eighth stages. All ou tputs have
equal source and sink current capabilities and conform to
standard “B” series output drive.
When the parallel/serial control input is in the logical “0”
state, data is serially shifted into the register synchronously
with the positive transition of the clock. When the parallel/
serial control input is in the logical “1” state, data is jammed
into each stage of the register synchronously with the positive transition of the clock.
All inputs are protected against static discharge with diodes
to V
and VSS.
DD
Features
■ Wide supply voltage range: 3.0V to 15V
■ High noise immunity: 0.45 V
■ Low power TTL compatibility: Fan out of 2 driving 74L
or 1 driving 74LS
■ 5V–10V–15V parametric ratings
■ Symmetrical output characteristics
■ Maximum input leakage:
1 µA at 15V over full temperature range
DD
(typ.)
Ordering Code:
Order Number Package Number Package Description
CD4014BCM M16A 16-Lead Small Outline Integrated Circuit (SOIC), JEDEC MS-012, 0.150” Narrow
CD4014BCN N16E 16-Lead Plastic Dual-In-Line Package (PDIP), JEDEC MS-100, 0.300” Wide
Devices also available in Tape and Reel. Specify by appending the suffix letter “x” to the ordering code.
Connection Diagram
Pin Assignments for DIP
Truth Table
CL
Serial
Input
X 10000
X 11010
X 10101
X 11111
00XX0Q
10XX1Q
XXXXQ1Q
(Note 1)
X = Don't care case
No Change
Note 1: Level change
Parallel/
Serial
Control
PI 1 PI n
Q1
(Internal)
Q
n
n−1
n−1
n
Top View
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Absolute Maximum Ratings(Note 2)
(Note 3)
Supply Voltage (VDD) −0.5V to +18V
Input Voltage (V
Storage Temperature Range (T
Power Dissipation (P
Dual-In-Line 700 mW
Small Outline 500 mW
Lead Temperature (T
(Soldering, 10 seconds ) 260°C
) −0.5 to VDD + 0.5V
IN
)
D
)
L
) −65°C to +150°C
S
Recommended Operating
Conditions
Supply Voltage (V
Input Voltage (V
Operating Temperature Range (TA) −40°C to +85°C
Note 2: “Absolute Maximum Rat ings” are tho se values beyond which the
safety of the device cannot be guaranteed. E x c ept for “ Operating Temperature Range” they are not mea nt to imply that the devices sh ould be operated at these limits. The table of “Electrical Characteristics” provides
conditions for actual device o peration.
= 0V unless otherw is e s pecified.
Note 3: V
SS
(Note 3)
) 3.0V to 15V
DD
) 0 to V
IN
DC Electrical Characteristics (Note 3)
Symbol Parameter Conditions
I
Quiescent Device VDD = 5V, VIN = VDD or V
DD
Current VDD = 10V, VIN = VDD or V
V
LOW Level VDD = 5V 0.05 0 0.05 0.05 V
OL
Output Voltage VDD = 10V |IO| < 1 µA 0.05 0 0.05 0.05 V
V
HIGH Level VDD = 5V 4.95 4.95 5 4.95 V
OH
Output Voltage VDD = 10V |IO| < 1 µA 9.95 9.95 10 9.95 V
V
LOW Level VDD = 5V, VO = 0.5V or 4.5V 1.5 2 1.5 1.5 V
IL
Input Voltage VDD = 10V, VO = 1.0V or 9.0V 3.0 4 3.0 3.0 V
V
HIGH Level VDD = 5V, VO = 0.5V or 4.5V 3.5 3.5 3 3.5 V
IH
Input Voltage VDD = 10V, VO = 1.0V or 9.0V 7.0 7.0 6 7.0 V
I
LOW Level Output VDD = 5V, VO = 0.4V 0.52 0.44 0.88 0.36 mA
OL
Current (Note 4) VDD = 10V, VO = 0.5V 1.3 1.1 2.2 0.9 mA
I
HIGH Level Output VDD = 5V, VO = 4.6V −0.52 −0.44 −0.88 −0.36 mA
OH
Current (Note 4) VDD = 10V, VO = 9.5V −1.3 −1.1 −2.2 −0.90 mA
I
Input Current VDD = 15V, VIN = 0V −0.3 −10−5−0.3 −1.0 µA
IN
Note 4: IOL and IOH are tested one output at a ti m e.
VDD = 15V, VIN = VDD or V
VDD = 15V 0.05 0 0.05 0.05 V
VDD = 15V 14.95 14.95 15 14.95 V
VDD = 15V, VO = 1.5V or 13.5V 4.0 6 4.0 4.0 V
VDD = 15V, VO = 1.5V or 13.5V 11.0 11.0 9 11.0 V
VDD = 15V, VO = 1.5V 3.6 3.0 8 2.4 mA
VDD = 15V, VO = 13.5V −3.6 −3.0 −8 −2.4 mA
VDD = 15V, VIN = 15V 0.3 10
SS
SS
SS
−40°C +25°C +85°C
Min Max Min Typ Max Min Max
20 0.1 20 150 µA
40 0.2 40 300 µA
80 0.3 80 600 µA
−5
0.3 1.0 µA
CD4014BC
DD
Units
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AC Electrical Charac teristics (Note 5)
TA = 25°C, input tr, tf = 20 ns, CL = 50 pF, RL = 200 kΩ
Symbol Parameter Conditions Min Typ Max Units
t
, t
PHL
PLH
CD4014BC
t
, t
THL
TLH
f
CL
t
W
t
, t
rCL
fCL
t
S
t
H
C
I
C
PD
Note 5: AC Parameters are guara nt eed by DC correlated testing.
Note 6: If more than one unit is cascaded t
mated capacitive load.
Note 7: Setup times are measured with referen c e to c lock and a fixed hold time (t
Note 8: C
AN-90.
Propagation Delay Time VDD = 5V 200 320 ns
VDD = 10V 80 160 ns
VDD = 15V 60 120 ns
Transition Time VDD = 5V 100 200 ns
VDD = 10V 50 100 ns
VDD = 15V 40 80 ns
Maximum Clock VDD = 5V 2.8 4 MHz
Input Frequency VDD = 10V 6 12 MHz
VDD = 15V 8 16 MHz
Minimum Clock VDD = 5V 90 180 ns
Pulse Width VDD = 10V 40 80 ns
VDD = 15V 25 50 ns
Clock Rise and VDD = 5V 15 µs
Fall Time (Note 6) VDD = 10V 15 µs
VDD = 15V 15 µs
Minimum Set-Up Time VDD = 5V 60 120 ns
(Note 7) Serial Input VDD = 10V 40 80 ns
tH ≥ 200 ns VDD = 15V 30 60 ns
Parallel Inputs VDD = 5V 80 160 ns
tH ≥ 200 ns VDD = 10V 40 80 ns
VDD = 15V 30 60 ns
Parallel/Serial Control VDD = 5V 100 200 ns
tH ≥ 200 ns VDD = 10V 50 100 ns
VDD = 15V 40 80 ns
Minimum Hold Time VDD = 5V 0 ns
Serial In, Parallel In, tS ≥ 400 ns VDD = 10V 10 ns
Parallel/Serial Control VDD = 15V 15 ns
Average Input Capacitance Any Input 5 7.5 pF
(Note 8)
Power Dissipation Capacitance 110 pF
(Note 8)
should be made less than or equal to the fixed propagation delay of the out put of the driving stage for the esti-
rCL
) as specified.
determines the n o load AC power consumption of any CMOS device. For complete exp lanation, see 74C family characteristics application note
PD
H
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Typical Performance Characteristics
CD4014BC
5 www.fairchildsemi.com

Physical Dimensions in ches (millimeters) unless otherwise noted
CD4014BC
16-Lead Small Outline Integrated Circuit (SOIC), JEDEC MS-012, 0.150” Narrow
Package Number M16A
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Physical Dimensions inches (millimeters) unless otherwise noted (Continued)
CD4014BC 8-Stage Static Shift Register
16-Lead Plastic Dual-In-Line Package (PDIP), JEDEC MS-001, 0.300” Wide
LIFE SUPPORT POLICY
FAIRCHILD’S PRODUCTS ARE NOT AUTHORIZED FOR USE AS CRITICAL COMPONENTS IN LIFE SUPPORT
DEVICES OR SYSTEMS WITHOUT THE EXPRESS WRITTEN APPROVAL OF THE PRESIDENT OF FAIRCHILD
SEMICONDUCTOR CORPORATION. As used herein:
1. Life support devices or system s a re devices or syste ms
which, (a) are intended for surgical implant into the
body, or (b) support or sustain life, and (c) whose failure
to perform when properly used in accordance with
instructions for use provided in the labeling, can be reasonably expected to result in a significant injur y to the
user.
Package Number N16E
2. A critical comp onent in any com ponent of a l ife support
device or system whose failure to perform can be reasonably expected to cause the failure of the life suppor t
device or system, or to affect its safety or effectiveness.
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