Datasheet SM320MCM42DHFNM40, SM320MCM42CHFNM40 Datasheet (Texas Instruments)

Page 1
SMJ320MCM42C, SMJ320MCM42D
DUAL SMJ320C40 MULTICHIP MODULE
SGKS001B – JULY 1997 – REVISED FEBRUARY 2000
1
POST OFFICE BOX 1443 HOUSTON, TEXAS 77251–1443
D Performance:
– 80 Million Floating-Point Operations Per
Second (MFLOPS) With 496-MBps-Burst I/O Rate for 40-MHz Modules
– Zero-Wait-State Local Memory for Each
Processor
D Organization:
– 128K-Word × 32-Bit Static
Random-Access Memory (SRAM) (SMJ320MCM42D)
– 256K-Word × 32-Bit SRAM
(SMJ320MCM42C)
D Compliant With MIL-PRF-38535 QML D Dual ’C40 Performance With Local Memory
Requiring Only 8.7 Square Inches of Board Space
D Enhanced Performance Offered By
Multichip-Module Solution – SMJ320MCM42C
– 67% Reduction in Number of
Interconnects
– 54% Reduction (Minimum) in Board
Area
– Estimated 38% Reduction in Power
Dissipation Due to Reduced Parasitic Capacitance and Interconnect Lengths
– SMJ320MCM42D
– 56% Reduction in Number of
Interconnects
– 30% Reduction (Minimum) in Board
Area
– Estimated 20% Reduction in Power
Dissipation Due to Reduced Parasitic Capacitance and Interconnect Lengths
D Four Memory Ports for High Data
Bandwidth – Two Full 2G-Word External Buses
D Two Internal Buses Mapped to Memory
– 128K-Word × 32-Bit SRAM for Each ’C40
Local Bus (SMJ320MCM42D)
– 256K-Word × 32-Bit SRAM for Each ’C40
Local Bus (SMJ320MCM42C)
D Ten External Communication Ports for
Direct Processor-to-Processor Communication
D IEEE-1149.1
(JTAG) Boundary-Scan
Compatible
D 408-Lead Ceramic Quad Flatpack Package
(HFN Suffix)
D Operating Free-Air Temperature Ranges:
–55°C to 125°C . . . (Military)
0°C to 70°C . . . (Commercial)
D Communication-Port Connection Provided
Between ’C40s for Interprocessor Communication
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
Terminal assignment information is provided by the terminal assignments table. Package is shown for pinout reference only.
HFN PACKAGE
(TOP VIEW)
306
1
102 205
408 307
103 204
PRODUCTION DATA information is current as of publication date. Products conform to specifications per the terms of Texas Instruments standard warranty. Production processing does not necessarily include testing of all parameters.
Copyright 2000, Texas Instruments Incorporated
IEEE Standard 1149.1–1990 Standard Test-Access Port and Boundary-Scan Architecture
On products compliant to MIL-STD-PRF-38535, all parameters are tested unless otherwise noted. On all other products, production processing does not necessarily include testing of all parameters.
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SMJ320MCM42C, SMJ320MCM42D DUAL SMJ320C40 MULTICHIP MODULE
SGKS001B – JULY 1997 – REVISED FEBRUARY 2000
2
POST OFFICE BOX 1443 HOUSTON, TEXAS 77251–1443
description
The ’42 dual ’C40 multichip module (MCM) contains two SMJ320C40 digital signal processors (DSPs) with 128K words × 32 bits (’42D) or 256K words × 32 bits (’42C) of zero-wait-state SRAMs mapped to each local bus. Global address and data buses with two sets of control signals are routed externally for each processor, allowing external memory to be accessed. The external global bus provides a continuous address reach of 2G words.
The dual ’C40 configuration allows standard microprocessor initialization using the bootstrap loader. Both reset-vector-control terminals are brought out to external terminals for each processor. A single CLKIN line and a RESET line feed both processors in parallel, minimizing clock skew and allowing easy synchronization for interlocked operations.
Communication port 0 of CPU #1 connects to communication port 3 of CPU #2 for direct processor-to-processor communication.
The IEEE-1 149.1 (JT AG) test ports of the ’C40s are connected serially to allow scan operations and emulation of the module as a whole. T estability of the ’42 adds value and reduces development and support costs. Texas Instruments (TI) offers a wide variety of ANSI/IEEE-1149.1 products and support.
The ’42 dual ’C40 MCM is packaged in a 408-pin ceramic quad flat pack. The ’42 dual ’C40 MCM is available in both a commercial temperature range (0°C to 70°C) and a military temperature range (–55°C to 125°C) option.
TI is a trademark of Texas Instruments Incorporated.
Page 3
SMJ320MCM42C, SMJ320MCM42D
DUAL SMJ320C40 MULTICHIP MODULE
SGKS001B – JULY 1997 – REVISED FEBRUARY 2000
3
POST OFFICE BOX 1443 HOUSTON, TEXAS 77251–1443
device symbol nomenclature
Example: SMJ 320 MCM 4 2 C HFN M 40
Process-Level Prefix (See Table 1)
320 DSP Family Designator
Multichip Module Processor Family
Number of CPUs per Module Module Revision
Package
HFN = 408-Lead Ceramic Quad Flatpack
Temperature Range
L=0°C to 70°C M= –55°C to 125°C
Speed Designator
40 = 40 MHz
’42C = 256K-word × 32-bit SRAM ’42D = 128K-word
× 32-bit SRAM
Table 1. MCM Processing Matrix
PROCESS
LEVEL
TEMPERATURE RANGE DIE
100%
PROCESSED
SPEED
TEST
TEST
TEMPERATURE
RANGE
QUALIFICATION
TESTING
L version 0°C to 70°C Probed No No 25°C to 70°C Package
SM
M version –55°C to 125°C Probed No Yes –55°C to 125°C Package
SMJ
M version –55°C to 125°C KGD
Yes Yes –55°C to 125°C MIL-H-38534
SMJ-level product is full MIL-PRF-38535 QML compliant.
KGD stands for the known-good-die strategy as defined in the reference documentation section.
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SMJ320MCM42C, SMJ320MCM42D DUAL SMJ320C40 MULTICHIP MODULE
SGKS001B – JULY 1997 – REVISED FEBRUARY 2000
4
POST OFFICE BOX 1443 HOUSTON, TEXAS 77251–1443
Terminal Assignments
TERMINAL TERMINAL TERMINAL TERMINAL
NO. NAME NO. NAME NO. NAME NO. NAME
1 2 3 4 5 6 7 8
9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 25 26 27 28 29 30 31 32 33 34 35 36 37 38 39 40 41 42 43 44 45 46 47 48 49 50 51
ROMEN_C40_#1 IIOF0_C40_#1 IIOF1_C40_#1 IIOF2_C40_#1 IIOF3_C40_#1 NMI_C40_#1 VCC_DR VSS_CL TCLK0_C40_#1 TCLK1_C40_#1 H3_C40_#1 H1_C40_#1 VSS_CL IACK_C40_#1 CLKIN_COMM VCC_DR VCC_CL VCC_DR VSS_CL VSS_DR VCC_DR VCC_DR VCC_CL VSS_CL VSS_DR VSS_CL VCC_DR A30_C40_#1 A29_C40_#1 A28_C40_#1 VCC_DR A27_C40_#1 A26_C40_#1 A25_C40_#1 A24_C40_#1 A23_C40_#1 A22_C40_#1 A21_C40_#1 A20_C40_#1 A19_C40_#1 A18_C40_#1 A17_C40_#1 VCC_DR VSS_CL VSS_DR A16_C40_#1 A15_C40_#1 A14_C40_#1 A13_C40_#1 A12_C40_#1 A11_C40_#1
52 53 54 55 56 57 58 59 60 61 62 63 64 65 66 67 68 69 70 71 72 73 74 75 76 77 78 79 80 81 82 83 84 85 86 87 88 89 90 91 92 93 94 95 96 97 98
99 100 101 102
A10_C40_#1 A9_C40_#1 A8_C40_#1 A7_C40_#1 A6_C40_#1 A5_C40_#1 A4_C40_#1 VCC_DR A3_C40_#1 A2_C40_#1 A1_C40_#1 A0_C40_#1 D31_C40_#2 D30_C40_#2 D29_C40_#2 D28_C40_#2 D27_C40_#2 D26_C40_#2 VCC_DR D25_C40_#2 D24_C40_#2 D23_C40_#2 D22_C40_#2 D21_C40_#2 D20_C40_#2 D19_C40_#2 D18_C40_#2 D17_C40_#2 D16_C40_#2 VSS_CL VSS_CL VCC_DR VSS_DR D15_C40_#2 D14_C40_#2 D13_C40_#2 D12_C40_#2 D11_C40_#2 D10_C40_#2 D9_C40_#2 D8_C40_#2 D7_C40_#2 D6_C40_#2 D5_C40_#2 VCC_DR D4_C40_#2 D3_C40_#2 D2_C40_#2 D1_C40_#2 D0_C40_#2 CE1_C40_#2
103 104 105 106 107 108 109 110 111 112 113 114 115 116 117 118 119 120 121 122 123 124 125 126 127 128 129 130 131 132 133 134 135 136 137 138 139 140 141 142 143 144 145 146 147 148 149 150 151 152 153
RDY1_C40_#2 VSS_DR VSS_CL LOCK_C40_#2 VCC_CL VSS_CL CE0_C40_#2 RDY0_C40_#2 DE_C40_#2 TCK_COMM TDO_C40_#2 TMS_COMM TRST_COMM EMU0_COMM EMU1_COMM PAGE1_C40_#2 R/W
1_C40_#2 STRB1_C40_#2 STAT0_C40_#2 STAT1_C40_#2 VSS_CL STAT2_C40_#2 STAT3_C40_#2 PAGE0_C40_#2 R/W0_C40_#2 STRB0_C40_#2 AE_C40_#2 RESETLOC1_C40_#2 VCC_DR RESETLOC0_C40_#2 RESET_COMM CRDY5_C40_#2 CSTRB5_C40_#2 CACK5_C40_#2 CREQ5_C40_#2 CRDY4_C40_#2 CSTRB4_C40_#2 CACK4_C40_#2 CREQ4_C40_#2 VCC_DR C5D7_C40_#2 C5D6_C40_#2 C5D5_C40_#2 C5D4_C40_#2 C5D3_C40_#2 C5D2_C40_#2 C5D1_C40_#2 C5D0_C40_#2 VCC_DR C4D7_C40_#2 C4D6_C40_#2
154 155 156 157 158 159 160 161 162 163 164 165 166 167 168 169 170 171 172 173 174 175 176 177 178 179 180 181 182 183 184 185 186 187 188 189 190 191 192 193 194 195 196 197 198 199 200 201 202 203 204
C4D5_C40_#2 C4D4_C40_#2 C4D3_C40_#2 C4D2_C40_#2 C4D1_C40_#2 C4D0_C40_#2 VCC_DR VCC_DR VSS_CL C2D7_C40_#2 C2D6_C40_#2 C2D5_C40_#2 C2D4_C40_#2 C2D3_C40_#2 C2D2_C40_#2 C2D1_C40_#2 C2D0_C40_#2 CRDY2_C40_#2 CSTRB2_C40_#2 CACK2_C40_#2 CREQ2_C40_#2 VCC_DR CRDY1_C40_#2 CSTRB1_C40_#2 CACK1_C40_#2 CREQ1_C40_#2 CRDY0_C40_#2 CSTRB0_C40_#2 CACK0_C40_#2 CREQ0_C40_#2 VSS_DR VSS_CL VSS_DR VCC_DR C1D7_C40_#2 C1D6_C40_#2 C1D5_C40_#2 C1D4_C40_#2 C1D3_C40_#2 C1D2_C40_#2 C1D1_C40_#2 C1D0_C40_#2 VCC_DR C0D7_C40_#2 C0D6_C40_#2 C0D5_C40_#2 C0D4_C40_#2 C0D3_C40_#2 C0D2_C40_#2 C0D1_C40_#2 C0D0_C40_#2
Page 5
SMJ320MCM42C, SMJ320MCM42D
DUAL SMJ320C40 MULTICHIP MODULE
SGKS001B – JULY 1997 – REVISED FEBRUARY 2000
5
POST OFFICE BOX 1443 HOUSTON, TEXAS 77251–1443
Terminal Assignments (Continued)
TERMINAL TERMINAL TERMINAL TERMINAL
NO. NAME NO. NAME NO. NAME NO. NAME
205 206 207 208 209 210
211 212 213 214 215 216 217 218 219 220 221 222 223 224 225 226 227 228 229 230 231 232 233 234 235 236 237 238 239 240 241 242 243 244 245 246 247 248 249 250 251 252 253 254 255
ROMEN_C40_#2 IIOF0_C40_#2 IIOF1_C40_#2 IIOF2_C40_#2 IIOF3_C40_#2 NMI_C40_#2 VCC_DR VSS_CL TCLK0_C40_#2 TCLK1_C40_#2 H3_C40_#2 H1_C40_#2 VSS_CL IACK_C40_#2 VCC_DR VCC_DR VCC_DR VSS_CL VSS_DR VCC_DR VCC_DR VCC_CL VSS_CL VSS_DR VSS_CL VCC_DR A30_C40_#2 A29_C40_#2 A28_C40_#2 VCC_DR A27_C40_#2 A26_C40_#2 A25_C40_#2 A24_C40_#2 A23_C40_#2 A22_C40_#2 A21_C40_#2 A20_C40_#2 A19_C40_#2 A18_C40_#2 A17_C40_#2 VCC_DR VSS_CL VSS_DR A16_C40_#2 A15_C40_#2 A14_C40_#2 A13_C40_#2 A12_C40_#2 A11_C40_#2 A10_C40_#2
256 257 258 259 260 261 262 263 264 265 266 267 268 269 270 271 272 273 274 275 276 277 278 279 280 281 282 283 284 285 286 287 288 289 290 291 292 293 294 295 296 297 298 299 300 301 302 303 304 305 306
A9_C40_#2 A8_C40_#2 A7_C40_#2 A6_C40_#2 A5_C40_#2 A4_C40_#2 VCC_DR A3_C40_#2 A2_C40_#2 A1_C40_#2 A0_C40_#2 D31_C40_#1 D30_C40_#1 D29_C40_#1 D28_C40_#1 D27_C40_#1 D26_C40_#1 VCC_DR D25_C40_#1 D24_C40_#1 D23_C40_#1 D22_C40_#1 D21_C40_#1 D20_C40_#1 D19_C40_#1 D18_C40_#1 D17_C40_#1 D16_C40_#1 VSS_CL VSS_CL VCC_DR VSS_DR D15_C40_#1 D14_C40_#1 D13_C40_#1 D12_C40_#1 D11_C40_#1 D10_C40_#1 D9_C40_#1 D8_C40_#1 D7_C40_#1 D6_C40_#1 D5_C40_#1 VCC_DR D4_C40_#1 D3_C40_#1 D2_C40_#1 D1_C40_#1 D0_C40_#1 CE1_C40_#1 RDY1_C40_#1
307 308 309 310 311 312 313 314 315 316 317 318 319 320 321 322 323 324 325 326 327 328 329 330 331 332 333 334 335 336 337 338 339 340 341 342 343 344 345 346 347 348 349 350 351 352 353 354 355 356 357
VSS_DR VSS_CL LOCK_C40_#1 VCC_CL VSS_CL CE0_C40_#1 RDY0_C40_#1 DE_C40_#1 TDI_C40_#1 PAGE1_C40_#1 R/W1_C40_#1 STRB1_C40_#1 STAT0_C40_#1 STAT1_C40_#1 VSS_CL STAT2_C40_#1 STAT3_C40_#1 PAGE0_C40_#1 R/W
0_C40_#1 STRB0_C40_#1 AE_C40_#1 RESETLOC1_C40_#1 VCC_DR RESETLOC0_C40_#1 CRDY5_C40_#1 CSTRB5_C40_#1 CACK5_C40_#1 CREQ5_C40_#1 CRDY4_C40_#1 CSTRB4_C40_#1 CACK4_C40_#1 CREQ4_C40_#1 VSS_DR VCC_DR C5D7_C40_#1 C5D6_C40_#1 C5D5_C40_#1 C5D4_C40_#1 C5D3_C40_#1 C5D2_C40_#1 C5D1_C40_#1 C5D0_C40_#1 VCC_DR C4D7_C40_#1 C4D6_C40_#1 C4D5_C40_#1 C4D4_C40_#1 C4D3_C40_#1 C4D2_C40_#1 C4D1_C40_#1 C4D0_C40_#1
358 359 360 361 362 363 364 365 366 367 368 369 370 371 372 373 374 375 376 377 378 379 380 381 382 383 384 385 386 387 388 389 390 391 392 393 394 395 396 397 398 399 400 401 402 403 404 405 406 407 408
VSS_DR VCC_DR C3D7_C40_#1 C3D6_C40_#1 C3D5_C40_#1 C3D4_C40_#1 C3D3_C40_#1 C3D2_C40_#1 C3D1_C40_#1 C3D0_C40_#1 VCC_DR VSS_CL C2D7_C40_#1 C2D6_C40_#1 C2D5_C40_#1 C2D4_C40_#1 C2D3_C40_#1 C2D2_C40_#1 C2D1_C40_#1 C2D0_C40_#1 VSS_DR VCC_DR CRDY3_C40_#1 CSTRB3_C40_#1 CACK3_C40_#1 CREQ3_C40_#1 VCC_CL VSS_CL CRDY2_C40_#1 CSTRB2_C40_#1 CACK2_C40_#1 CREQ2_C40_#1 VCC_DR CRDY1_C40_#1 CSTRB1_C40_#1 CACK1_C40_#1 CREQ1_C40_#1 VSS_DR VSS_CL VSS_DR VCC_DR C1D7_C40_#1 C1D6_C40_#1 C1D5_C40_#1 C1D4_C40_#1 C1D3_C40_#1 C1D2_C40_#1 C1D1_C40_#1 C1D0_C40_#1 VCC_DR VSS_DR
Page 6
SMJ320MCM42C, SMJ320MCM42D DUAL SMJ320C40 MULTICHIP MODULE
SGKS001B – JULY 1997 – REVISED FEBRUARY 2000
6
POST OFFICE BOX 1443 HOUSTON, TEXAS 77251–1443
functional block diagram
The following terminals have 10-k pullup resistors added within the module:
D CREQx_C40_#1, CACKx_C40_#1, CSTRBx_C40_#1, CRDYx_C40_#1, where x = 1, 2, 3, 4, or 5 D CREQy_C40_#2, CACKy_C40_#2, CSTRBy_C40_#2, CRDYy_C40_#2, where y = 0, 1, 2, 4, or 5 D LCE1_C40_#1, LCE2_C40_#2 (internal connections)
A total of 18 decoupling capacitors have been connected within the module. Between clean power and ground, the following capacitors have been connected:
D Two 0.1-µF capacitors D Two 0.01-µF capacitors
Between dirty power and ground, the following capacitors have been connected:
D Twelve 0.1-µF capacitors D Two 0.01-µF capacitors
Page 7
SMJ320MCM42C, SMJ320MCM42D
DUAL SMJ320C40 MULTICHIP MODULE
SGKS001B – JULY 1997 – REVISED FEBRUARY 2000
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POST OFFICE BOX 1443 HOUSTON, TEXAS 77251–1443
functional block diagram (continued)
TDI_C40_#1 TCK_COMM TMS_COMM
TRST_COMM EMU0_COMM EMU1_COMM
TDO_C40_#2
D31–D0 A30–A0
AE DE
STAT3 –STAT0
LOCK
STRB0–STRB1
R/W0–R/W1
PAGE0–PAGE1
RDY0
–RDY1
CE0–CE1
TCLK0–TCLK1
NMI
IACKH1H3
IIOF3–IIOF0
RESETLOC0-
ROMEN
CREQ
CACK
CSTRB
CRDY
CD7–CD0
TDI
TDO
COMM0
COMM3
’C40_#1
ADDR
DATA CNTL
ADDR
DATA CNTL
’C40_ #2
TDI
TDO
CLKIN_COMM
RESET_COMM
VSS_CL VCC_CL VSS_DR
VCC_DR
SRAM
128K × 8 ×4
(’42D)
or
128K × 8 × 8
(’42C)
SRAM
128K × 8 ×4
(’42D)
or
128K × 8 × 8
(’42C)
D31–D0 A30–A0
AE DE
STAT3 –STAT0
LOCK
STRB0–STRB1
R/W0–R/W1
PAGE0–PAGE1
RDY0
–RDY1
CE0–CE1
TCLK0–TCLK1
NMI
IACK
H1
H3
IIOF3–IIOF0
RESETLOC0–
ROMEN
CREQ
CACK
CSTRB
CRDY
CD7–CD0
’C40_ #2
Global Bus
IEEE 1149.1
’C40_ #1
Global Bus
’C40_ #2
Control
Communication Ports
(0–2, 4–5)
Communication Ports
(1–5)
’C40_#1 Control
’C40_#1
’C40_#2
RESETLOC1
RESETLOC1
Local Bus Local Bus
Page 8
SMJ320MCM42C, SMJ320MCM42D DUAL SMJ320C40 MULTICHIP MODULE
SGKS001B – JULY 1997 – REVISED FEBRUARY 2000
8
POST OFFICE BOX 1443 HOUSTON, TEXAS 77251–1443
operational overview
Treatment of the detailed operation of the ’C40 device is not included in the scope of this document. See the
TMS320C4x User’s Guide
(literature number SPRU063) for a detailed description of this DSP . See Figure 1 and
Figure 2 for the memory map.
000000000h 000000FFFh
000001000h
0000FFFFFh 000100000h
0001000FFh 000100100h
0001FFFFFh 000200000h
0002FF7FFh 0002FF800h
0002FFBFFh 0002FFC00h
0002FFFFFh 000300000h
0007FFFFFh 000800000h
00081FFFFh 000820000h
07FFFFFFFh 080000000h
0FFFFFFFFh
Reserved
Peripherals (internal)
Reserved
Reserved
1K RAM BLK 0 (internal)
1K RAM BLK 1 (internal)
Reserved
Local Bus Module RAM
Reserved
Global Bus (external)
(a) INTERNAL ROM DISABLED
(ROMEN = 0)
Reserved
Peripherals (internal)
Reserved
Reserved
1K RAM BLK 0 (internal)
1K RAM BLK 1 (internal)
Reserved
Local Bus Module RAM
Reserved
Global Bus (external)
(b) INTERNAL ROM ENABLED
(ROMEN = 1)
1M
4K ROM (reserved)
1M
1M
5M
128K
Structure
Depends On
ROMEN Bit
Structure
Identical
2G
2G
Figure 1. Memory Map for Each ’C40 Within the Multichip Module (’42D)
Page 9
SMJ320MCM42C, SMJ320MCM42D
DUAL SMJ320C40 MULTICHIP MODULE
SGKS001B – JULY 1997 – REVISED FEBRUARY 2000
9
POST OFFICE BOX 1443 HOUSTON, TEXAS 77251–1443
operational overview (continued)
000000000h 000000FFFh
000001000h
0000FFFFFh 000100000h
0001000FFh 000100100h
0001FFFFFh 000200000h
0002FF7FFh 0002FF800h
0002FFBFFh 0002FFC00h
0002FFFFFh 000300000h
000FDFFFFh 000FE0000h
000FFFFFFh 001000000h
00101FFFFh 001020000h
07FFFFFFFh 080000000h
0FFFFFFFFh
Reserved
Peripherals (internal)
Reserved
Reserved
1K RAM BLK 0 (internal)
1K RAM BLK 1 (internal)
Reserved
Local Bus Module RAM
(LSTRB0)
Reserved
Global Bus (external)
(a) INTERNAL ROM DISABLED
(ROMEN = 0)
Reserved
Peripherals (internal)
Reserved
Reserved
1K RAM BLK 0 (internal)
1K RAM BLK 1 (internal)
Reserved
Local Bus Module RAM
(LSTRB0)
Reserved
Global Bus (external)
(b) INTERNAL ROM ENABLED
(ROMEN = 1)
1M
4K ROM (reserved)
1M
1M
5M
128K
Structure
Depends On
ROMEN Bit
Structure
Identical
Local Bus Module RAM
(LSTRB1)
Local Bus Module RAM
(LSTRB1)
128K
256K
2G
2G
See section titled ”application note”.
Figure 2. Memory Map for Each ’C40 Within the Multichip Module (’42C)
Page 10
SMJ320MCM42C, SMJ320MCM42D DUAL SMJ320C40 MULTICHIP MODULE
SGKS001B – JULY 1997 – REVISED FEBRUARY 2000
10
POST OFFICE BOX 1443 HOUSTON, TEXAS 77251–1443
application note
For the ’MCM42C, the location of the local memory has changed from that of the ’MCM42D. In addition, to make proper use of the local memory, it is necessary to understand how it is controlled.
In the case of the ’MCM42C, the lower 128K of memory is controlled by LSTRB0, while the upper 128K of memory is controlled by LSTRB1. Since the upper 128K begins at address 1000000h, it is necessary to load the value 101 1 1 (binary) into the STRB ACTIVE area (bits 28–24) of the local memory interface control register (LMICR). This process ensures that the ’C40 uses LSTRB0
to control the lower 128K and LSTRB1 to control
the upper 128K. In the case of the ’MCM42D, LSTRB0 controls the entire 128K. The value loaded into the STRB ACTIVE area
of the LMICR after reset is sufficient to control the memory . This value is 1 110, and tells the ’C40 that the entire local memory is controlled by LSTRB0.
This subject is discussed in depth in Chapter 9 of the
1996 TMS320C4x User’s Guide
(literature number
SPRU063). In particular, section 9.3 discusses the proper use of the memory interface control registers.
reference documentation and data sheet scope
The SMJ320MCM42 is qualified to MIL-PRF-38535. Electrical continuity of the module is ensured through the use of IEEE-1149.1-compatible boundary-scan testing and functional checkout of the local SRAM space.
KGD refers to TI known-good-die strategy. TI KGDs are fully tested over the military temperature range per MIL-PRF-38535 QML. Electrical tests ensure compliance of the ’C40 KGD components to the SMJ320C40 data sheet (literature number SGUS017) over the operating temperature range. Module timings are virtually unchanged from the SMJ320C40 data sheet timings. An SMJ320C40 data sheet is provided for customer reference only and does not imply MCM compliance to published timings.
For a description of the ’C40 operation and application information, see the
TMS320C4x User’s Guide
(literature
number SPRU063).
Page 11
SMJ320MCM42C, SMJ320MCM42D
DUAL SMJ320C40 MULTICHIP MODULE
SGKS001B – JULY 1997 – REVISED FEBRUARY 2000
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POST OFFICE BOX 1443 HOUSTON, TEXAS 77251–1443
absolute maximum ratings over operating free-air temperature range (unless otherwise noted)
Supply voltage range, VCC (see Note 1) – 0.3 V to 7 V. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Voltage range on any terminal – 0.3 V to 7 V. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Output voltage range, VO – 0.3 V to 7 V. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Operating free-air temperature range (commercial [L version]), TA 0°C to 70°C. . . . . . . . . . . . . . . . . . . . . . .
(military [M version]), TA – 55°C to 125°C. . . . . . . . . . . . . . . . . . . . . .
Junction temperature, T
J
150°C. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Storage temperature range, T
stg
65°C to 150°C. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Stresses beyond those listed under “absolute maximum ratings” may cause permanent damage to the device. These are stress ratings only, and functional operation of the device at these or any other conditions beyond those indicated under “recommended operating conditions” is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
NOTE 1: All voltage values are with respect to VSS.
recommended operating conditions
MIN MAX UNIT
’42-33 4.5 5.5
V
CC
Supply voltage
’42-40
4.75 5.25
V
CLKIN_COMM 2.6 VCC+ 0.3
V
IH
High-level input voltage
CSTRBx
, CRDYx, CREQx, CACKx 2.2 VCC+ 0.3
V
VIHHigh level in ut voltage
All others 2 VCC+ 0.3
V
V
IL
Low-level input voltage – 0.3 0.8 V
I
OH
High-level output current – 300 µA
I
OL
Low-level output current 2 mA
p
p
L version 0 70
°
T
A
Operating free-air temperature range
M version – 55 125
°C
electrical characteristics over recommended ranges of supply voltage and operating free-air temperature (see Note 2)
PARAMETER TEST CONDITIONS
MIN TYP MAX UNIT
V
OH
High-level output voltage VCC = MIN, IOH = MAX 2.4 3 V
V
OL
Low-level output voltage VCC = MIN, IOL = MAX 0.3 0.6 V
’42D
0.7 1.1
I
CC
Supply current
’42C
VCC = MAX
0.8 1.5
A
I
Z
3-state current VI = VSS to V
CC
– 20 20 µA
I
I
Input current VI = VSS to V
CC
– 10 10 µA
I
I2
Input current, COMM signal (see Note 3) VI = VSS to V
CC
– 20 20 µA
I
IP
Input current, internal pullup (see Note 4) VI = VSS to V
CC
– 400 30 µA
I
IP2
Input current, dual internal pullup (see Note 5) VI = VSS to V
CC
– 800 60 µA
I
IC
Input current, CLKIN_COMM VI = VSS to V
CC
– 60 60 µA
For conditions shown as MIN/MAX, use the appropriate value specified under recommended operating conditions.
NOTES: 2. Electrical characteristics are calculated algebraically from the SMJ320C40 data sheet limits.
3. Includes signals EMU0_COMM, EMU1_COMM, and RESET_COMM
4. Applies to TDI_C40_#1
5. Includes signals TCK_COMM, TMS_COMM, and TRST_COMM
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SMJ320MCM42C, SMJ320MCM42D DUAL SMJ320C40 MULTICHIP MODULE
SGKS001B – JULY 1997 – REVISED FEBRUARY 2000
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POST OFFICE BOX 1443 HOUSTON, TEXAS 77251–1443
capacitance
Capacitance of a ’C40 die is specified by design to be 15 pF maximum for both inputs and outputs. Module networks add up to 5 pF. Characterization of die or substance capacitance is performed after any design change. Power measurements taken for a ’C40 die are made with an additional 80-pF load capacitance. Refer to the SMJ320C40 data sheet (literature number SGUS017) for the test load circuit.
operational timings and module testing
Texas Instruments processing assures that operation is verified to published data sheet specifications on the ’C40 in die form. All voltage, timing, speed, and temperature specifications are met before any die is placed into a multichip module. For this reason, all ’C40 voltage and timing parameters at the module level need not be verified.
Characterization of the ’42 substrate shows that the module performs as an equivalent system of discretely packaged ’C40 devices. This performance is assured through a full-frequency functional checkout of the module that verifies selected worst-case timings. An additional propagation delay is introduced by the substrate. This value is assured by design to be less than 1 ns, but it is not tested. See the SMJ320C40 data sheet (literature number SGUS017) for a complete listing of timing diagrams and limits.
module test capability (future compatibility)
The ’C40 supports the IEEE-1149.1 testability standard, and the test access port (TAP) is brought out to the module footprint. TDI is connected to ’C40_#1, TDO of ’C40_#1 is connected to TDI of ’C40_#2, and TDO of ’C40_#2 is brought out to the T AP. TCK_COMM, TMS_COMM, and TRST_COMM
are routed to both ’C40s in the module. This configuration allows users to test the module using third-party JT AG testability tools or other boundary-scan control software. Proper software configuration allows users to debug or launch code on the module by way of the ’C40 emulator and extended development system (XDS) pod. Both of these tools are used as part of outgoing module testing.
The ’42 supports third-party JT AG diagnostic families of products for verification and debug of boundary-scan circuits, boards, and systems. Further information on JTAG testability tools is available through any TI sales representative or authorized TI distributor.
XDS is a trademark of Texas Instruments Incorporated.
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SMJ320MCM42C, SMJ320MCM42D
DUAL SMJ320C40 MULTICHIP MODULE
SGKS001B – JULY 1997 – REVISED FEBRUARY 2000
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module test circuit
Figure 3 illustrates the basic circuits for the ’42. See the
TMS320C4x User’s Guide
(literature number
SPRU063) for more detailed information.
TDI TDO
’C40_#1
TDI TDO
’C40_#2
TDO_C40_#2
TMS_COMM TCK_COMM TRST_COMM EMU0_COMM EMU1_COMM TDI_C40_#1
5 V
CLKIN_COMM = Clock Pulse as shown in the Data Sheet RESET_COMM
= Reset Pulse as shown in the Data Sheet
Test Header
SMJ320MCM42
All VCC to 5 V All VSS to GND
4.7 k–10 k
Suggested
The test header normally consists of the XDS510 for the ’C40 emulation or ASSET hardware for interconnect testing.
Figure 3. Sample Test Circuit
XDS510 is a trademark of Texas Instruments Incorporated.
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SMJ320MCM42C, SMJ320MCM42D DUAL SMJ320C40 MULTICHIP MODULE
SGKS001B – JULY 1997 – REVISED FEBRUARY 2000
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POST OFFICE BOX 1443 HOUSTON, TEXAS 77251–1443
thermal analysis
Thermal conduction of components in the SMJ320MCM42 is dependent on thermal resistance of the material under each die as well as die area thermally connected to the heat-dissipating medium. Since these properties vary with layout and die size, ’C40 and SRAM components should be considered separately. Table 2 lists primary parameters required for thermal analysis of the module. T
J
, the maximum junction temperature, is not
to be exceeded for the ’C40s or the SRAM die.
T able 2. Thermal Characteristics
PARAMETER MIN TYP MAX UNIT
T
J
Maximum allowable junction temperature under operating condition 150 °C
P
MCM
Module power dissipation 3.5 5.8 W
T
JC_pkg
Average thermal impedance (junction to case) for the package 2.1 °C/W
T
JA
Thermal impedance (junction to ambient air, 0 cfm) of package 20.5 °C/W
T
SOL
Maximum solder temperature (10 s duration) 260 °C
TJC package data was taken under the following conditions: two ’C40s dissipating 1.05 W each and eight SRAMs dissipating 0.175 W each.
power estimation
During the operation verification, the power requirements of the SMJ320MCM42 are characterized over the operating free-air temperature range. See the application report
Calculation of TMS320C40 Power Dissipation
(literature number SPRA032) as reference for power estimation of the ’C40 components. Typical power dissipation is measured with both ’C40s executing a 64-point fast Fourier transform (FFT)
algorithm. Input and output data arrays reside in module SRAM, and output data is written out to the global-address space. The global databus is loaded with 80-pF test loads, and both local and global writes are configured for zero-wait-state memory. Under typical conditions of 25°C, 5-V VCC, and 40-MHz CLKIN frequency, the power dissipation is measured to be 3.5 W.
Maximum power dissipation is measured under worst-case conditions. The global databus is loaded with 80-pF test loads, and simultaneous zero-wait-state writes are performed to both local and global buses. Under worst-case environment conditions of – 55°C, 5.25-V V
CC
, and 40-MHz CLKIN frequency , the power dissipation is determined to be 5.9 W. The algorithm executed during these tests consists of parallel writes of alternating 0xAAs and 0x55s to both local SRAM and global-address spaces. This algorithm is not considered to be a practical use of the ’C40’s resources; therefore, the associated power measurement must be considered absolute maximum only.
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SMJ320MCM42C, SMJ320MCM42D
DUAL SMJ320C40 MULTICHIP MODULE
SGKS001B – JULY 1997 – REVISED FEBRUARY 2000
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MECHANICAL DATA
HFN (S-CQFP-F408) CERAMIC QUAD FLATPACK WITH TIE-BAR
0.225 (5,72)
0.175 (4,45)
408
2.810 (71,37)
2.820 (71,73)
307
4.050 (102,87)
”B”
DETAIL ”B”
0.012 (0,30)
0.006 (0,15)
0.095 (2,41)
0.070 (1,78)
0.140 (3,56)
0.175 (4,45)
4073431/B 10/98
3.850 (97,79) TYP SQ
1
102
2.626 (66,70)
2.525 (64,13) TYP
2.674 (67,92)
”A”
103
204
306
0.012 (0,30)
0.007 (0,18)
205
DETAIL ”A”
0.020 (0,51) MAX
0.005 (0,13)
0.009 (0,23)
0.025 (0,65)
NOTES: A. All linear dimensions are in inches (millimeters).
B. This drawing is subject to change without notice.
Page 16
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