Datasheet sir402dp Datasheet

Page 1
N-Channel 30-V (D-S) MOSFET
SiR402DP
Vishay Siliconix
PRODUCT SUMMARY
VDS (V) R
0.006 at V
30
0.008 at V
PowerPAK SO-8
DS(on)
(Ω)
GS
GS
= 10 V
= 4.5 V
a
I
(A)
D
35
35
Qg (Typ.)
12 nC
FEATURES
• TrenchFET
• 100 % R
®
Power MOSFET
Tested
g
• 100 % UIS Tested
• Compliant to RoHS Directive 2002/95/EC
APPLICATIONS
6.15 mm
D
8
D
7
6
Ordering Information:
S
1
D
D
5
Bottom View
SiR402DP-T1-GE3 (Lead (Pb)-free and Halogen-free)
5.15 mm
S
2
S
3
G
4
• Synchronous Rectification
• DC/DC Point-of-Load
• Server
D
G
S
N-Channel MOSFET
ABSOLUTE MAXIMUM RATINGS TA = 25 °C, unless otherwise noted
Parameter Symbol Limit Unit
Drain-Source Voltage V Gate-Source Voltage V
= 25 °C
T
C
= 70 °C
T
Continuous Drain Current (T
= 150 °C)
J
C
TA = 25 °C
TA = 70 °C Pulsed Drain Current I Avalanche Current Avalanche Energy E
Continuous Source-Drain Diode Current
Maximum Power Dissipation
L = 0.1 mH
T
= 25 °C
C
= 25 °C
T
A
= 25 °C
T
C
T
= 70 °C
C
= 25 °C
T
A
TA = 70 °C Operating Junction and Storage Temperature Range Soldering Recommendations (Peak Temperature)
d, e
260
T
DS
GS
I
D
DM
I
AS
AS
I
S
P
D
, T
J
stg
30
± 20
a
35
a
35
b, c
20.7
b, c
16.6 70 35 61 30
b, c
3.5 36 23
b, c
4.2
b, c
2.7
- 55 to 150
V
A
mJ
A
W
°C
THERMAL RESISTANCE RATINGS
Parameter Symbol Typical Maximum Unit
Maximum Junction-to-Ambient Maximum Junction-to-Case (Drain)
Notes: a. Based on T b. Surface Mounted on 1" x 1" FR4 board.
= 25 °C. Package limited.
C
c. t = 10 s. d. See Solder Profile (www.vishay.com/ppg?73257
copper (not plated) as a result of the singulation process in manufacturing. A solder fillet at the exposed copper tip cannot be guaranteed
and is not required to ensure adequate bottom side solder interconnection. e. Rework Conditions: manual soldering with a soldering iron is not recommended for leadless components. f. Maximum under Steady State conditions is 70 °C/W.
Document Number: 68683 S09-1087-Rev. C, 15-Jun-09
b, f
t ≤ 10 s
Steady State
R
thJA
R
thJC
25 30
2.9 3.5
). The PowerPAK SO-8 is a leadless package. The end of the lead terminal is exposed
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°C/W
1
Page 2
SiR402DP
Vishay Siliconix
SPECIFICATIONS TJ = 25 °C, unless otherwise noted
Parameter Symbol Test Conditions Min. Typ. Max. Unit
Static
V
Drain-Source Breakdown Voltage
V
Temperature Coefficient
DS
V
Temperature Coefficient
GS(th)
Gate-Source Threshold Voltage
Gate-Source Leakage
Zero Gate Voltage Drain Current
On-State Drain Current
a
Drain-Source On-State Resistance
Forward Transconductance
Dynamic
b
a
Input Capacitance
Reverse Transfer Capacitance
Total Gate Charge
Gate-Source Charge
Gate-Drain Charge
Gate Resistance
Tur n -O n De l ay T i m e
Rise Time
Turn-Off Delay Time
Fall Time
Tur n -O n De l ay T i m e
Rise Time
Turn-Off Delay Time
Fall Time
a
V
DS
ΔV
DS/TJ
ΔV
GS(th)/TJ
V
GS(th)
I
GSS
I
DSS
I
V
D(on)
R
DS(on)
g
fs
C
iss
C
oss
C
rss
Q
g
Q
gs
Q
gd
R
g
t
d(on)
t
r
t
d(off)
t
f
t
d(on)
t
r
t
d(off)
t
f
Drain-Source Body Diode Characteristics
Continuous Source-Drain Diode Current
Pulse Diode Forward Current
Body Diode Voltage
Body Diode Reverse Recovery Time
Body Diode Reverse Recovery Charge
Reverse Recovery Fall Time
Reverse Recovery Rise Time
I
S
I
SM
V
SD
t
rr
Q
rr
t
a
t
b
Notes: a. Pulse test; pulse width ≤ 300 µs, duty cycle ≤ 2 %. b. Guaranteed by design, not subject to production testing.
V
DS
V
V
DS
V
DS
I
D
I
D
IF = 10 A, dI/dt = 100 A/µs, TJ = 25 °C
= 0 V, ID = 250 µA
GS
VDS = V
V
= 0 V, V
DS
V
= 30 V, V
DS
= 30 V, V
≥ 5 V, V
DS
V
= 10 V, ID = 20 A
GS
V
= 4.5 V, ID = 17.5 A
GS
V
= 15 V, ID = 20 A
DS
= 15 V, V
DS
= 15 V, V
= 15 V, V
V
= 15 V, RL = 1.5 Ω
DD
≅ 10 A, V
V
= 15 V, RL = 1.5 Ω
DD
≅ 10 A, V
TC = 25 °C
IS = 10 A, V
30 V
ID = 250 µA
, ID = 250 µA
GS
= ± 20 V
GS
GS
= 0 V, TJ = 55 °C
GS
= 10 V
GS
1.15 2.2 V
= 0 V
50 A
- 6
24
mV/°C
± 100 nA
1
5
µA
0.0048 0.006
0.0064 0.008
82 S
1700
= 0 V, f = 1 MHz
GS
350
140
= 10 V, ID = 20 A
GS
= 4.5 V, ID = 20 A
GS
28 42
12 21
5.4
nC
4.6
f = 1 MHz 1.2 2.4 Ω
25 40
20 30
= 4.5 V, Rg = 1 Ω
GEN
25 40
15 25
12 20
10 15
= 10 V, Rg = 1 Ω
GEN
25 40
10 15
30
70
GS
= 0 V
0.8 1.2 V
25 50 ns
17 35 nC
13
12
Ω
pFOutput Capacitance
ns
A
ns
Stresses beyond those listed under “Absolute Maximum Ratings” may cause permanent damage to the device. These are stress ratings only, and functional operation of the device at these or any other conditions beyond those indicated in the operational sections of the specifications is not implied. Exposure to absolute maximum rating conditions for extended periods may affect device reliability.
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Document Number: 68683
S09-1087-Rev. C, 15-Jun-09
Page 3
TYPICAL CHARACTERISTICS 25 °C, unless otherwise noted
SiR402DP
Vishay Siliconix
70
60
50
40
30
- Drain Current (A)I
D
20
10
0
0.0 0.5 1.0 1.5 2.0 2.5 3.0
VGS=10V thru 4 V
- Drain-to-Source Voltage (V)
V
DS
Output Characteristics
0.010
0.008
VGS=4.5V
0.006
- On-Resistance (Ω)R
DS(on)
0.004
0.002 0 10203040506070
VGS=10V
VGS=3V
VGS=2V
10
TC= - 55 °C
8
6
4
- Drain Current (A)I
D
2
0
0.0 0.5 1.0 1.5 2.0 2.5 3.0
TC= 125 °C
- Gate-to-Source Voltage (V)
V
GS
TC= 25 °C
Transfer Characteristics
2100
1800
1500
1200
900
C - Capacitance (pF)
600
300
C
0
0 5 10 15 20 25 30
C
iss
C
oss
rss
On-Resistance vs. Drain Current and Gate Voltage
10
ID=20A
8
6
4
- Gate-to-Source Voltage (V)
GS
2
V
0
0 6 12 18 24 30
Document Number: 68683 S09-1087-Rev. C, 15-Jun-09
ID- Drain Current (A)
VDS=15V
VDS=24V
Qg- Total Gate Charge (nC)
Gate Charge
VDS- Drain-to-Source Voltage (V)
Capacitance
1.8
ID=20A
1.6
1.4
VGS=10V,4.5V
1.2
- On-Resistance (Normalized)
1.0
DS(on)
R
0.8
0.6
- 50 - 25 0 25 50 75 100 125 150
-Junction Temperature (°C)
T
J
On-Resistance vs. Junction Temperature
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Page 4
SiR402DP
Vishay Siliconix
TYPICAL CHARACTERISTICS 25 °C, unless otherwise noted
- On-Resistance (Ω)R
DS(on)
0.015
ID=20A
0.012
0.009
0.006
0.003
0.000
02468 10
VGS- Gate-to-Source Voltage (V)
TJ= 125 °C
TJ= 25 °C
On-Resistance vs. Gate-to-Source Voltage
50
40
30
100
10
- Source Current (A)I
S
1
0.0 0.2 0.4 0.6 0.8 1.0 1.2
TJ= 150 °C
V
-Source-to-Drain Voltage (V)
SD
TJ= 25 °C
Source-Drain Diode Forward Voltage
2.4
2.2
2.0
(V)V
1.8
ID= 250 µA
GS(th)
1.6
1.4
1.2
1.0
- 50 - 25 0 25 50 75 100 125 150
TJ- Temperature (°C)
Threshold Voltage
100
Limited byR
10
1
- Drain Current (A)I
D
0.1
0.01
0.1 1 10 100
Power (W)
20
10
0
0.001
Single Pulse Power (Junction-to-Ambient)
*
DS(on)
TA=25 °C
Single Pulse
VDS- Drain-to-Source Voltage (V)
* V
> minimum VGSat which R
GS
BVDSS Limited
DS(on)
is specified
Safe Operating Area, Junction-to-Ambient
100 µs
1ms
10 ms
100 ms
1s
10 s
DC
Time (s)
1
1000.01
10 6000.1
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Document Number: 68683
S09-1087-Rev. C, 15-Jun-09
Page 5
TYPICAL CHARACTERISTICS 25 °C, unless otherwise noted
SiR402DP
Vishay Siliconix
80
60
- Drain Current (A) I
40
D
20
0
Package Limited
0 255075100125150
TC- Case Temperature (°C)
Current Derating*
* The power dissipation PD is based on T dissipation limit for cases where additional heatsinking is used. It is used to determine the current rating, when this rating falls below the package
= 150 °C, using junction-to-case thermal resistance, and is more useful in settling the upper
J(max)
40
32
24
16
Power Dissipation (W)
8
0
25 50 75 100 125 150
TC - Case Temperature (°C)
Power Derating
limit.
Document Number: 68683 S09-1087-Rev. C, 15-Jun-09
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Page 6
SiR402DP
Vishay Siliconix
TYPICAL CHARACTERISTICS 25 °C, unless otherwise noted
2
1
Duty Cycle = 0.5
0.1
Thermal Impedance
Normalized Effective Transient
0.01
0.1
Thermal Impedance
Normalized Effective Transient
0.2
0.1
0.05
0.02
-4
10
2
1
Duty Cycle = 0.5
0.2
0.1
Single Pulse
0.02
Single Pulse
Notes:
P
DM
t
1
t
2
t
= P
DMZthJA
1
t
2
= 58 °C/W
thJA
(t)
100
Duty Cycle, D =
1.
2. Per Unit Base = R
3. T
- T
JM
A
4. Surface Mounted
-3
10
-2
10
-1
1 10 60010
Square Wave Pulse Duration (s)
Normalized Thermal Transient Impedance, Junction-to-Ambient
0.05
0.01
-4
10
-3
10
-2
10
-1
110
Square Wave Pulse Duration (s)
Normalized Thermal Transient Impedance, Junction-to-Case
Vishay Siliconix maintains worldwide manufacturing capability. Products may be manufactured at one of several qualified locations. Reliability data for Silicon Technology and Package Reliability represent a composite of all qualified locations. For related documents such as package/tape drawings, part marking, and reliability data, see www.vishay.com/ppg?68683
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.
Document Number: 68683
S09-1087-Rev. C, 15-Jun-09
Page 7
Package Information
Vishay Siliconix
PowerPAK® SO-8, (SINGLE/DUAL)
L
K
E4
D5
L
K
E4
D5
K1
W
1
2
3
4
θ
c
Notes
1. 2
3.
2
E1
E
Inch will govern. Dimensions exclusive of mold gate burrs. Dimensions exclusive of mold flash and cutting burrs.
M
e
L1
θ
A
H
θ
Z
2
D
D1
θ
A1
Detail Z
D4
D2
0.150 ± 0.008
Backside View of Single Pad
H
D4
D3(2x)
D2
Backside View of Dual Pad
E2
D
E3
E2
D1
D2
E3
MILLIMETERS INCHES
DIM. MIN. NOM. MAX. MIN. NOM. MAX.
A 0.97 1.04 1.12 0.038 0.041 0.044
A1 0.00 - 0.05 0.000 - 0.002
b 0.33 0.41 0.51 0.013 0.016 0.020
c 0.23 0.28 0.33 0.009 0.011 0.013
D 5.05 5.15 5.26 0.199 0.203 0.207
D1 4.80 4.90 5.00 0.189 0.193 0.197
D2 3.56 3.76 3.91 0.140 0.148 0.154
D3 1.32 1.50 1.68 0.052 0.059 0.066
D4
D5
0.57 TYP. 0.0225 TYP.
3.98 TYP. 0.157 TYP.
E 6.05 6.15 6.25 0.238 0.242 0.246
E1 5.79 5.89 5.99 0.228 0.232 0.236
E2 3.48 3.66 3.84 0.137 0.144 0.151
E3 3.68 3.78 3.91 0.145 0.149 0.154
E4
0.75 TYP. 0.030 TYP.
e 1.27 BSC 0.050 BSC
K
1.27 TYP. 0.050 TYP.
K1 0.56 - - 0.022 - -
H 0.51 0.61 0.71 0.020 0.024 0.028
L 0.51 0.61 0.71 0.020 0.024 0.028
L1 0.06 0.13 0.20 0.002 0.005 0.008
θ 0° - 12° 0° - 12°
W 0.15 0.25 0.36 0.006 0.010 0.014
M
0.125 TYP. 0.005 TYP.
ECN: T10-0055-Rev. J, 15-Feb-10 DWG: 5881
1
2
3
b
4
1
2
3
b
4
Document Number: 71655 www.vishay.com Revison: 15-Feb-10 1
Page 8
PowerPAK® SO-8 Mounting and Thermal Considerations
Wharton McDaniel
AN821
Vishay Siliconix
MOSFETs for switching applications are now available with die on resistances around 1 mΩ and with the capability to handle 85 A. While these die capabilities represent a major advance over what was available just a few years ago, it is important for power MOSFET packaging technology to keep pace. It should be obvi­ous that degradation of a high performance die by the package is undesirable. PowerPAK is a new package technology that addresses these issues. In this appli­cation note, PowerPAK’s construction is described. Following this mounting information is presented including land patterns and soldering profiles for max­imum reliability. Finally, thermal and electrical perfor­mance is discussed.
THE PowerPAK PACKAGE
The PowerPAK package was developed around the SO-8 package (Figure 1). The PowerPAK SO-8 uti­lizes the same footprint and the same pin-outs as the standard SO-8. This allows PowerPAK to be substi­tuted directly for a standard SO-8 package. Being a leadless package, PowerPAK SO-8 utilizes the entire SO-8 footprint, freeing space normally occupied by the leads, and thus allowing it to hold a larger die than a standard SO-8. In fact, this larger die is slightly larger than a full sized DPAK die. The bottom of the die attach pad is exposed for the purpose of providing a direct, low resistance thermal path to the substrate the device is mounted on. Finally, the package height is lower than the standard SO-8, making it an excellent choice for applications with space constraints.
PowerPAK SO-8 SINGLE MOUNTING
The PowerPAK single is simple to use. The pin arrangement (drain, source, gate pins) and the pin dimensions are the same as standard SO-8 devices (see Figure 2). Therefore, the PowerPAK connection pads match directly to those of the SO-8. The only dif­ference is the extended drain connection area. To take immediate advantage of the PowerPAK SO-8 single devices, they can be mounted to existing SO-8 land patterns.
Standard SO-8 PowerPAK SO-8
Figure 2.
The minimum land pattern recommended to take full advantage of the PowerPAK thermal performance see Application Note 826, Recommended Minimum Pad
Patterns With Outline Drawing Access for Vishay Sili­conix MOSFETs. Click on the PowerPAK SO-8 single
in the index of this document. In this figure, the drain land pattern is given to make full
contact to the drain pad on the PowerPAK package. This land pattern can be extended to the left, right, and
top of the drawn pattern. This extension will serve to increase the heat dissipation by decreasing the ther­mal resistance from the foot of the PowerPAK to the PC board and therefore to the ambient. Note that increasing the drain land area beyond a certain point will yield little decrease in foot-to-board and foot-to­ambient thermal resistance. Under specific conditions of board configuration, copper weight and layer stack, experiments have found that more than about 0.25 to
2
0.5 in
of additional copper (in addition to the drain land) will yield little improvement in thermal perfor­mance.
Figure 1. PowerPAK 1212 Devices
Document Number 71622 28-Feb-06
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1
Page 9
AN821
Vishay Siliconix
PowerPAK SO-8 DUAL
The pin arrangement (drain, source, gate pins) and the pin dimensions of the PowerPAK SO-8 dual are the same as standard SO-8 dual devices. Therefore, the PowerPAK device connection pads match directly to those of the SO-8. As in the single-channel package, the only exception is the extended drain connection area. Manufacturers can likewise take immediate advantage of the PowerPAK SO-8 dual devices by mounting them to existing SO-8 dual land patterns.
To take the advantage of the dual PowerPAK SO-8’s thermal performance, the minimum recommended land pattern can be found in Application Note 826,
Recommended Minimum Pad Patterns With Outline Drawing Access for Vishay Siliconix MOSFETs. Click
on the PowerPAK 1212-8 dual in the index of this doc­ument.
The gap between the two drain pads is 24 mils. This matches the spacing of the two drain pads on the Pow­erPAK SO-8 dual package.
REFLOW SOLDERING
Vishay Siliconix surface-mount packages meet solder reflow reliability requirements. Devices are subjected to solder reflow as a test preconditioning and are then reliability-tested using temperature cycle, bias humid­ity, HAST, or pressure pot. The solder reflow tempera­ture profile used, and the temperatures and time duration, are shown in Figures 3 and 4.
For the lead (Pb)-free solder profile, see http:// www.vishay.com/doc?73257.
Ramp-Up Rate + 6 °C /Second Maximum
Temperature at 155 ± 15 °C
Temperature Above 180 °C
Maximum Temperature
Time at Maximum Temperature
Ramp-Down Rate
Figure 3. Solder Reflow Temperature Profile
120 Seconds Maximum
70 - 180 Seconds
240 + 5/- 0 °C
20 - 40 Seconds
+ 6 °C/Second Maximum
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140 - 170 °C
3 °C(max)
10 s (max)
210 - 220 °C
3 °C(max) 4 ° C/s (max)
183 °C
50 s (max)
60 s (min)
Pre-Heating Zone
Maximum peak temperature at 240 °C is allowed.
Figure 3. Solder Reflow Temperatures and Time Durations
Reflow Zone
Document Number 71622
28-Feb-06
Page 10
THERMAL PERFORMANCE
AN821
Vishay Siliconix
Introduction
A basic measure of a device’s thermal performance is the junction-to-case thermal resistance, Rθ junction-to-foot thermal resistance, Rθ
. This parameter
jf
, or the
jc
is measured for the device mounted to an infinite heat sink and is therefore a characterization of the device only, in other words, independent of the properties of the object to which the device is mounted. Table 1 shows a comparison of the DPAK, PowerPAK SO-8, and stan­dard SO-8. The PowerPAK has thermal performance equivalent to the DPAK, while having an order of magni­tude better thermal performance over the SO-8.
TABLE 1.
DPAK and PowerPAK SO-8
Equivalent Steady State Performance
Thermal
Resistance Rθ
DPAK PowerPAK
SO-8
1.2 °C/W 1.0 °C/W 16 °C/W
jc
Standard
SO-8
Thermal Performance on Standard SO-8 Pad Pattern
Because of the common footprint, a PowerPAK SO-8 can be mounted on an existing standard SO-8 pad pat­tern. The question then arises as to the thermal perfor­mance of the PowerPAK device under these conditions. A characterization was made comparing a standard SO-8 and a PowerPAK device on a board with a trough cut out underneath the PowerPAK drain pad. This configuration restricted the heat flow to the SO-8 land pads. The results are shown in Figure 5.
Because of the presence of the trough, this result sug­gests a minimum performance improvement of 10 °C/W by using a PowerPAK SO-8 in a standard SO-8 PC board mount.
The only concern when mounting a PowerPAK on a standard SO-8 pad pattern is that there should be no traces running between the body of the MOSFET. Where the standard SO-8 body is spaced away from the pc board, allowing traces to run underneath, the Power­PAK sits directly on the pc board.
Thermal Performance - Spreading Copper
Designers may add additional copper, spreading cop­per, to the drain pad to aid in conducting heat from a device. It is helpful to have some information about the thermal performance for a given area of spreading cop­per.
Figure 6 shows the thermal resistance of a PowerPAK SO-8 device mounted on a 2-in. 2-in., four-layer FR-4 PC board. The two internal layers and the backside layer are solid copper. The internal layers were chosen as solid copper to model the large power and ground planes common in many applications. The top layer was cut back to a smaller area and at each step junction-to­ambient thermal resistance measurements were taken. The results indicate that an area above 0.3 to 0.4 square inches of spreading copper gives no additional thermal performance improvement. A subsequent experiment was run where the copper on the back-side was reduced, first to 50 % in stripes to mimic circuit traces, and then totally removed. No significant effect was observed.
Si4874DY vs. Si7446DP PPAK on a 4-Layer Board
SO-8 Pattern, Trough Under Drain
60
50
) s
ttaw/
40
C ( e
cn
30
adep
m
I
20
10
0
0.0001
Figure 5.
Document Number 71622 28-Feb-06
PowerPAK SO-8 and Standard SO-0 Land Pad Thermal Path
Si4874DY
1
Pulse Duration (sec)
Si7446DP
100
vs. Spreading Copper
R
th
(0 %, 50 %, 100 % Back Copper)
56
)sttaw/C(
51
ecn
46
adep
m
I
41
100000.01
36
0.25 0.50 0.75 1.00 1.25 1.50 1.75 2.00
0.00
Figure 6. Spreading Copper Junction-to-Ambient Performance
100 %
0 %
50 %
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Page 11
AN821
Vishay Siliconix
SYSTEM AND ELECTRICAL IMPACT OF PowerPAK SO-8
In any design, one must take into account the change in MOSFET r
1.8
1.6
) ( ecnatsiseR-nO -r
1.4
)dezilamroN(
1.2
)no(SD
1.0
0.8
0.6
with temperature (Figure 7).
DS(on)
On-Resistance vs. Junction Temperature
VGS = 10 V
= 23 A
I
D
-50 - 25 0 25 50 75 100 125 150
- Junction Temperature (°C)
T
J
Figure 7.
MOSFET
r
vs. Temperature
DS(on)
A MOSFET generates internal heat due to the current passing through the channel. This self-heating raises the junction temperature of the device above that of the PC board to which it is mounted, causing increased power dissipation in the device. A major source of this problem lies in the large values of the junction-to-foot thermal resistance of the SO-8 package.
PowerPAK SO-8 minimizes the junction-to-board ther­mal resistance to where the MOSFET die temperature is very close to the temperature of the PC board. Consider two devices mounted on a PC board heated to 105 °C by other components on the board (Figure 8).
Suppose each device is dissipating 2.7 W. Using the junction-to-foot thermal resistance characteristics of the PowerPAK SO-8 and the standard SO-8, the die tem­perature is determined to be 107 °C for the PowerPAK (and for DPAK) and 148 °C for the standard SO-8. This is a 2 °C rise above the board temperature for the Pow­erPAK and a 43 °C rise for the standard SO-8. Referring to Figure 7, a 2 °C difference has minimal effect on r
whereas a 43C difference has a significant effect
DS(on)
on r
DS(on)
.
Minimizing the thermal rise above the board tempera­ture by using PowerPAK has not only eased the thermal design but it has allowed the device to run cooler, keep r
low, and permits the device to handle more cur-
DS(on)
rent than the same MOSFET die in the standard SO-8 package.
CONCLUSIONS
PowerPAK SO-8 has been shown to have the same thermal performance as the DPAK package while hav­ing the same footprint as the standard SO-8 package. The PowerPAK SO-8 can hold larger die approximately equal in size to the maximum that the DPAK can accom­modate implying no sacrifice in performance because of package limitations.
Recommended PowerPAK SO-8 land patterns are pro­vided to aid in PC board layout for designs using this new package.
Thermal considerations have indicated that significant advantages can be gained by using PowerPAK SO-8 devices in designs where the PC board was laid out for the standard SO-8. Applications experimental data gave thermal performance data showing minimum and typical thermal performance in a SO-8 environment, plus infor­mation on the optimum thermal performance obtainable including spreading copper. This further emphasized the DPAK equivalency.
PowerPAK SO-8
Figure 8.
www.vishay.com 4
Standard SO-8
107 °C
0.8 °C/W
PC Board at 105 °C
Temperature of Devices on a PC Board
16 C/W
148 °C
PowerPAK SO-8 therefore has the desired small size characteristics of the SO-8 combined with the attractive thermal characteristics of the DPAK package.
Document Number 71622
28-Feb-06
Page 12
RECOMMENDED MINIMUM PADS FOR PowerPAK® SO-8 Single
0.260
(6.61)
0.150
(3.81)
0.024
(0.61)
Application Note 826
Vishay Siliconix
Return to Index
Return to Index
0.026 (0.66)
0.050
(1.27)
0.050
(1.27)
0.032
(0.82)
Recommended Minimum Pads
Dimensions in Inches/(mm)
0.154
(3.91)
0.040
(1.02)
0.174
(4.42)
APPLICATION NOTE
Document Number: 72599 www.vishay.com Revision: 21-Jan-08 15
Page 13
Legal Disclaimer Notice
Vishay

Disclaimer

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Document Number: 91000 www.vishay.com Revision: 11-Mar-11 1
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