Datasheet si8413db Datasheet

Page 1
P-Channel 20-V (D-S) MOSFET
Si8413DB
Vishay Siliconix
PRODUCT SUMMARY
VDS (V) R
- 20
0.048 at V
0.063 at V
Bump Side View Backside View
32
DD
(Ω)I
DS(on)
= - 4.5 V
GS
= - 2.5 V
GS
MICRO FOOT
8413
D
- 6.5
- 5.7
xxx
S
41
Device Marking: 8413
Ordering Information: Si8413DB-T1-E1 (Lead (Pb)-free)
G
xxx = Date/Lot Traceability Code
(A) Qg (Typ.)
14
FEATURES
• TrenchFET® Power MOSFET
• MICRO FOOT Reduces Footprint Area Profile (0.62 mm) and On-Resistance Per Footprint Area
®
Chipscale Packaging
APPLICATIONS
• Load Switch
• Battery Switch
• Charger Switch
• PA Switch
S
G
D
P-Channel MOSFET
RoHS
COMPLIANT
ABSOLUTE MAXIMUM RATINGS TA = 25 °C, unless otherwise noted
Parameter Symbol 5 s Steady State Unit
Drain-Source Voltage
Gate-Source Voltage
Continuous Drain Current (T
= 150 °C)
J
a
Pulsed Drain Current
Continuous Source Current (Diode Conduction)
Maximum Power Dissipation
a
a
Operating Junction and Storage Temperature Range
Package Reflow Conditions
b
V
DS
V
GS
TA = 25 °C
= 70 °C
T
A
TA = 25 °C
= 70 °C
T
A
I
D
I
DM
I
S
P
D
T
, T
J
stg
- 6.5 - 4.8
- 5.2 - 3.8
- 2.5 - 1.3
2.77 1.47
1.77 0.94
IR/Convection 260
- 20
± 12
- 25
- 55 to 150
V
A
W
°C
THERMAL RESISTANCE RATINGS
Parameter Symbol Typical Maximum Unit
Maximum Junction-to-Ambient
a
t ≤ 5 s
Steady State 72 85
Maximum Junction-to-Foot (Drain) Steady State
Notes: a. Surface Mounted on 1" x 1" FR4 board. b. Refer to IPC/JEDEC (J-STD-020C), no manual or hand soldering.
R
thJA
R
thJF
35 45
°C/W
16 20
Document Number: 72947 S-82118-Rev. D, 08-Sep-08
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Page 2
Si8413DB
Vishay Siliconix
SPECIFICATIONS TJ = 25 °C, unless otherwise noted
Parameter Symbol Test Conditions Min. Typ. Max. Unit
Static
V
Gate Threshold Voltage
Gate-Body Leakage
Zero Gate Voltage Drain Current
On-State Drain Current
a
Drain-Source On-State Resistance
Forward Transconductance
Diode Forward Voltage
Dynamic
b
a
a
Total Gate Charge
Gate-Drain Charge
Gate Resistance
Tur n -O n De l ay Ti m e
Rise Time
Turn-Off Delay Time
Fall Time
Source-Drain Reverse Recovery Time
V
GS(th)
I
GSS
I
DSS
I
D(on)
a
R
DS(on)
g
fs
V
SD
Q
g
Q
gs
Q
gd
R
g
t
d(on)
t
r
t
d(off)
t
f
t
rr
V
V
V
DS
I
D
Notes: a. Pulse test; pulse width ≤ 300 µs, duty cycle ≤ 2 %. b. Guaranteed by design, not subject to production testing.
Stresses beyond those listed under “Absolute Maximum Ratings” may cause permanent damage to the device. These are stress ratings only, and functional operation of the device at these or any other conditions beyond those indicated in the operational sections of the specifications is not implied. Exposure to absolute maximum rating conditions for extended periods may affect device reliability.
= VGS, ID = - 250 µA
DS
VDS = 0 V, VGS = ± 12 V
V
= - 20 V, V
= - 20 V, V
DS
DS
V
V
DS
≤ - 5 V, V
= - 4.5 V, ID = - 1 A
GS
= - 2.5 V, ID = - 1 A
GS
GS
= 0 V, TJ = 70 °C
GS
= - 4.5 V
GS
VDS = - 10 V, ID = - 1 A
IS = - 1 A, V
= - 10 V, V
V
= - 10 V, RL = 10 Ω
DD
≅ - 1 A, V
GEN
= 0 V
GS
= - 4.5 V, ID = - 1 A
GS
= - 4.5 V, Rg = 6 Ω
IF = - 1 A, dI/dt = 100 A/µs
= 0 V
- 0.6 - 1.4 V
± 100 nA
- 1
- 5
µA
- 5 A
0.0393 0.048
0.052 0.063
7.4 S
- 0.8 - 1.1 V
14 21
1.7
nCGate-Source Charge
5.1
18 Ω
31 50
50 75
105 160
90 135
85 130
Ω
ns
TYPICAL CHARACTERISTICS 25 °C, unless otherwise noted
25
20
15
10
- Drain Current (A)
D
I
5
0
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012345
VGS = 5 thru 3 V
V
- Drain-to-Source Voltage (V)
DS
Output Characteristics
2.5 V
2 V
1.5 V
- Drain Current (A)
D
I
25
20
15
10
5
0
0.0 0.5 1.0 1.5 2.0 2.5 3.0
TC = 125 °C
25 °C
- Gate-to-Source Voltage (V)
V
GS
- 55 °C
Transfer Characteristics
Document Number: 72947
S-82118-Rev. D, 08-Sep-08
Page 3
TYPICAL CHARACTERISTICS 25 °C, unless otherwise noted
Si8413DB
Vishay Siliconix
- On-Resistance (Ω)R
DS(on)
- Gate-to-Source Voltage (V)
GS
V
0.20
0.16
0.12
0.08
0.04
0.00 0 5 10 15 20 25
VGS = 2.5 V
VGS = 4.5 V
ID- Drain Current (A)
On-Resistance vs. Drain Current
5
VDS = 10 V
I
= 1 A
D
4
3
2
1
2000
1600
1200
800
C - Capacitance (pF)
400
0
048 12 16 20
1.4
1.3
1.2
1.1
On-Resistance
­(Normalized)
1.0
DS(on)
R
0.9
C
iss
C
oss
C
rss
VDS- Drain-to-Source Voltage (V)
Capacitance
VGS = 4.5 V
I
= 1 A
D
0
03691215
30
10
Source Current (A)I
-
S
1
0.0 0.2 0.4 0.6 0.8 1.0 1.2 1.4 1.6
VSD- S o urce-to-Drain Voltage (V)
Source-Drain Diode Forward Voltage
Document Number: 72947 S-82118-Rev. D, 08-Sep-08
Qg- Total Gate Charge (nC)
Gate Charge
TJ = 150 °C
TJ = 25 °C
0.8
- 50 - 25 0 25 50 75 100 125 150
- Junction Temperature (°C)
T
J
On-Resistance vs. Junction Temperature
0.20
0.16
0.12
ID = 1 A
0.08
- On-Resistance (Ω)R
DS(on)
0.04
0.00 012345
VGS- Gate-to-Source Voltage (V)
On-Resistance vs. Gate-to-Source Voltage
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Page 4
Si8413DB
Vishay Siliconix
TYPICAL CHARACTERISTICS 25 °C, unless otherwise noted
0.4
0.3
ID = 250 µA
0.2
0.1
Variance (V)V
GS(th)
0.0
- 0.1
- 0.2
- 50 - 25 0 25 50 75 100 125 150
TJ- Temperature (°C)
Threshold Voltage
100
- Drain Current (A)I
D
0.01
80
60
40
Power (W)
20
0
0.001
0.01 0.1 1 100 600
Single Pulse Power, Junction-to-Ambient
Limited by R
DS(on)*
10
1
I
D(on)
Limited
0.1
TA = 25 °C
Single Pulse
BVDSS Limited
0.1 1 10 100
- Drain-to-Source Voltage (V)
V
DS
minimum VGS at which R
* V
GS
IDMLimited
is specified
DS(on)
P(t) = 0.001
P(t) = 0.01
P(t) = 0.1 P(t) = 1 P(t) = 10 DC
Safe Operating Area
10
Time (s)
Transient
Thermal Impedance
Normalized Effective
0.01
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0.1
2
1
-4
10
Duty Cycle = 0.5
0.2
0.1
0.05
0.02
-3
10
Single Pulse
-2
10
-1
Square Wave Pulse Duration (s)
Normalized Thermal Transient Impedance, Junction-to-Ambient
Notes:
P
DM
t
1
t
- TA = PDMZ
JM
2
1. Duty Cycle, D =
2. Per Unit Base = R
3. T
4. Surface Mounted
Document Number: 72947
S-82118-Rev. D, 08-Sep-08
thJA
t t
thJA
100
1
2
= 72 °C/W
(t)
00601110
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TYPICAL CHARACTERISTICS 25 °C, unless otherwise noted
2
1
Duty Cycle = 0.5
0.2
0.1
0.1
0.01
0.05
0.02
Single Pulse
-4
10
-3
10
-2
10
Square Wave Pulse Duration (s)
Normalized Thermal Transient Impedance, Junction-to-Foot
Thermal Impedance
Normalized Effective Transient
Si8413DB
Vishay Siliconix
-1
1
1010
Document Number: 72947 S-82118-Rev. D, 08-Sep-08
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Page 6
Si8413DB
Vishay Siliconix
PACKAGE OUTLINE
MICRO FOOT: 4-BUMP (2 x 2, 0.8 mm PITCH)
e
Recommended Land
8413
XXX
Mark on Backside of Die
4 x φ 0.30 0.31 Note 3 Solder Mask φ 0.40
e
∼
∼
A
2
A
A
1
b Diamerter
Silicon
Bump Note 2
S
E
e S
D
e
Notes (Unless Otherwise Specified):
1. Laser mark on the silicon die back, coated with a thin metal.
2. Bumps are 95.5/3.8/0.7 Sn/Ag/Cu.
3. Non-solder mask defined copper landing pad.
4. The flat side of wafers is oriented at the bottom.
DIMENSIONS
Millimeters
MIN. MAX. MIN. MAX.
a
Inches
A 0.600 0.650 0.0236 0.0256
A
1
A
2
0.260 0.290 0.0102 0.0114
0.340 0.360 0.0134 0.0142
b 0.370 0.410 0.0146 0.0161
D 1.520 1.600 0.0598 0.0630
E 1.520 1.600 0.0598 0.0630
e 0.750 0.850 0.0295 0.0335
S 0.370 0.380 0.0146 0.0150
Notes: a. Use millimeters as the primary measurement.
Vishay Siliconix maintains worldwide manufacturing capability. Products may be manufactured at one of several qualified locations. Reliability data for Silicon Technology and Package Reliability represent a composite of all qualified locations. For related documents such as package/tape drawings, part marking, and reliability data, see http://www.vishay.com/ppg?72947.
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Document Number: 72947
S-82118-Rev. D, 08-Sep-08
Page 7
PCB Design and Assembly Guidelines
For MICRO FOOTr Products
Johnson Zhao
INTRODUCTION
Vishay Siliconix’s MICRO FOOT product family is based on a wafer-level chip-scale packaging (WL-CSP) technology that implements a solder bump process to eliminate the need for an outer package to encase the silicon die. MICRO FOOT products include power MOSFETs, analog switches, and power ICs.
For battery powered compact devices, this new packaging technology reduces board space requirements, improves thermal performance, and mitigates the parasitic effect typical of leaded packaged products. For example, the 6−bump MICRO FOOT Si8902EDB common drain power MOSFET, which measures just 1.6 mm x 2.4 mm, achieves the same performance as TSSOP−8 devices in a footprint that is 80% smaller and with a 50% lower height profile (Figure 1). A MICRO FOOT analog switch, the 6−bump DG3000DB, offers low charge injection and 1.4 W on−resistance in a footprint measuring just 1.08 mm x 1.58 mm (Figure 2).
AN824
Vishay Siliconix
Vishay Siliconix MICRO FOOT products can be handled with the same process techniques used for high-volume assembly of packaged surface-mount devices. With proper attention to PCB and stencil design, the device will achieve reliable performance without underfill. The advantage of the device’s small footprint and short thermal path make it an ideal option for space-constrained applications in portable devices such as battery packs, PDAs, cellular phones, and notebook computers.
This application note discusses the mechanical design and reliability of MICRO FOOT, and then provides guidelines for board layout, the assembly process, and the PCB rework process.
FIGURE 1. 3D View of MICRO FOOT Products Si8902DB and
0.18 ~ 0.25
Si8900EDB
321
0.5
0.285
0.285
FIGURE 2. Outline of MICRO FOOT CSP & Analog
Switch DG3000DB
0.5
1.58
A
1.08
B
Document Number: 71990 06-Jan-03
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Page 8
AN824
/
63Sm/37Pb
Vishay Siliconix
MICRO FOOT CSP
MICRO FOOT CSP MOSFET
MICRO FOOT CSP Analog Switch
MICRO FOOT UCSP Analog Switch
* All measurements in millimeters
TABLE 1
Main Parameters of Solder Bumps in MICRO FOOT Designs
Bump Material
Eutectic Solder:
63Sm
37Pb
Bump Pitch*
0.8
0.5
0.5
Bump Diameter*
0.37-0.41
0.18-0.25
0.32-0.34
Bump Height*
0.26-0.29
0.14-0.19
0.21-0.24
MICRO FOOT’S DESIGN AND RELIABILITY
As a mechanical, electrical, and thermal connection between the device and PCB, the solder bumps of MICRO FOOT products are mounted on the top active surface of the die. Table 1 shows the main parameters for solder bumps used in MICRO FOOT products. A silicon nitride passivation layer is applied to the active area as the last masking process in fabrication,ensuring that the device passes the pressure pot test. A green laser is used to mark the backside of the die without damaging it. Reliability results for MICRO FOOT products mounted on a FR-4 board without underfill are shown in Table 2.
TABLE 2
MICRO FOOT Reliability Results
Test Condition C: −65_ to 150_C
Test condition B: −40_ to 125_C
121_C @ 15PSI 100% Humidity Test
The main failure mechanism associated with wafer-level chip-scale packaging is fatigue of the solder joint. The results shown in Table 2 demonstrate that a high level of reliability can be achieved with proper board design and assembly techniques.
>500 Cycles
>1000 Cycles
96 Hours
BOARD LAYOUT GUIDELINES
Board materials. Vishay Siliconix MICRO FOOT products are designed to be reliable on most board types, including organic boards such as FR-4 or polyamide boards. The package qualification information is based on the test on 0.5-oz. FR-4 and polyamide boards with NSMD pad design.
Land patterns. Two types of land patterns are used for surface-mount packages. Solder mask defined (SMD) pads have a solder mask opening smaller than the metal pad (Figure 3), whereas on-solder mask defined (NSMD) pads have a metal pad smaller than the solder-mask opening (Figure 4).
NSMD is recommended for copper etch processes, since it provides a higher level of control compared to SMD etch processes. A small-size NSMD pad definition provides more area (both lateral and vertical) for soldering and more room for escape routing on the PCB. By contrast, SMD pad definition introduces a stress on the PCB side that may result in solder joint cracking under extreme fatigue conditions.
Copper pads should be finished with an organic solderability preservative (OSP) coating. For electroplated nickel-immersion gold finish pads, the gold thickness must be less than 0.5 mm to avoid solder joint embrittlement.
concentration point near the solder mask
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2
Solder Mask
Copper
FIGURE 3. SMD FIGURE 4. NSMD
Copper
Solder Mask
Document Number: 71990
06-Jan-03
Page 9
AN824
Á
Á
Á
Á
Vishay Siliconix
Board pad design. The landing-pad size for MICRO FOOT products is determined by the bump pitch as shown in Table 3. The pad pattern is circular to ensure a symmetric, barrel-shaped solder bump.
TABLE 3
Dimensions of Copper Pad and Solder Mask
Opening in PCB and Stencil Aperture
Pitch
Á
0.80 mm
0.50 mm
Copper Pad
ÁÁÁ
0.30 " 0.01 mm
0.17 " 0.01 mm
Solder Mask
Opening
ÁÁÁ
0.41 " 0.01 mm
0.27 " 0.01 mm
Stencil
Aperture
ÁÁÁ
0.33 " 0.01 mm
in ciircle aperture
0.30 " 0.01 mm
in square aperture
ASSEMBLY PROCESS
MICRO FOOT products’ surface-mount-assembly operations include solder paste printing, component placement, and solder reflow as shown in the process flow chart (Figure 5).
Stencil Design
Chip pick-and-placement. MICRO FOOT products can be picked and placed with standard pick-and-place equipment. The recommended pick-and-place force is 150 g. Though the part will self-center during solder reflow, the maximum placement offset is 0.02 mm.
Reflow Process. MICRO FOOT products can be assembled using standard SMT reflow processes. Similar to any other package, the thermal profile at specific board locations must be determined. Nitrogen purge is recommended during reflow operation. Figure 6 shows a typical reflow profile.
Thermal Profile
250
200
150
100
Temperature (_C)
50
IIncoming Tape and Reel Inspection
Solder Paste Printing
Chip Placement
Reflow
Solder Joint Inspection
Pack and Ship
FIGURE 5. SMT Assembly Process Flow
Stencil design. Stencil design is the key to ensuring maximum solder paste deposition without compromising the assembly yield from solder joint defects (such as bridging and extraneous solder spheres). The stencil aperture is dependent on the copper pad size, the solder mask opening, and the quantity of solder paste.
In MICRO FOOT products, the stencil is 0.125-
mm (5-mils) thick. The recommended apertures are shown in Table 3 and are fabricated by laser cut.
Solder-paste printing. The solder-paste printing process involves transferring solder paste through pre-defined apertures via application of pressure.
In MICRO FOOT products, the solder paste used is UP78 No-clean eutectic 63 Sn/37Pb type3 or finer solder paste.
0
0 100 200 300 400
Time (Seconds
FIGURE 6. Reflow Profile
PCB REWORK
To replace MICRO FOOT products on PCB, the rework procedure is much like the rework process for a standard BGA or CSP, as long as the rework process duplicates the original reflow profile. The key steps are as follows:
1. Remove the MICRO FOOT device using a convection nozzle to create localized heating similar to the original reflow profile. Preheat from the bottom.
2. Once the nozzle temperature is +190_C, use tweezers to remove the part to be replaced.
3. Resurface the pads using a temperature-controlled soldering iron.
4. Apply gel flux to the pad.
5. Use a vacuum needle pick-up tip to pick up the replacement part, and use a placement jig to placed it accurately.
6. Reflow the part using the same convection nozzle, and preheat from the bottom, matching the original reflow profile.
Document Number: 71990 06-Jan-03
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Page 10
Legal Disclaimer Notice
Vishay

Disclaimer

ALL PRODUCT, PRODUCT SPECIFICATIONS AND DATA ARE SUBJECT TO CHANGE WITHOUT NOTICE TO IMPROVE RELIABILITY, FUNCTION OR DESIGN OR OTHERWISE.
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