Datasheet Si8250, Si8251, Si8252 Datasheet (Silicon Laboratories)

Page 1
Preliminary Rev. 0.8 3/06 Copyright © 2006 by Silicon Laboratories Si8250/1/2
This information applies to a product under development. Its characteristics and specifications are subject to change without notice.
Si8250/1/2
DIGITAL POWER CONTROLLER
Features
Description
Si8250/1/2 provides all control and protection functions necessary to implement highly intelligent, fast response power delivery and management control systems for isolated and non-isolated power supplies. On-board processing capability enables intelligent control optimization for improved system performance and new capabilities such as serial connectivity via the PMBus or on-board UART. The Si8250/1/2 family is in-system Flash programmable enabling control and protection parameters such as system regulation and protection settings, start-up and shutdown modes, loop response, and modulation timing to be readily modified. The built-in high-speed control path provides loop updates every 100nS and provides pulse-by-pulse current limiting and over-current protection even while the internal CPU is disabled.
The Si825x family is supported by the Si8250DK development kit, which contains everything required to develop and program power supply applications with the Si825x family of digital controllers.
Single-Chip, Flash-based digital
power controller
Supports isolated and non-isolated
applications
Enables new system capabilities
such as:
- Adaptive dead-time control for higher efficiency
- Nonlinear control for faster transient response
- Self diagnostics for higher reliability
- Full PMBus command set implementation for system connectivity
Highly integrated control solution:
High-speed digital hardware
control loop
In-system programmable
supervisory processor
Programmable system protection
functions
Hardware cycle-by-cycle current
limiting and OCP
External clock and frame
synchronization inputs
Performs system management
functions such as external power supply sequencing and fan control/monitoring
In-system Flash programmable
Flash can also be used as NV
memory for data storage
Low cost, comprehensive
development tool kit includes:
Graphical, easy-to-use system
design tools
Integrated development
environment
In-system, on-line debuggerTurnkey isolated 35 W digital
half-bridge target board
Typical Applications
Isolated and non-isolated DC/DC
converters
AC/DC converters
Fully Pb-free and ROHS compliant
packages
32-pin LQFP28-pin 5 x 5 mm QFN
Temp Range: –40 to +125 ºC
Patents pending
Pin Assignments:
See page 23
4
5
6
7
2
1
3
111213
14
9
8
10
18
17
16
15
20
21
19
25
26
27
28
232224
Si8250/1/2
Top View
RST / C2CK
IPK
VSENSE
GND
VDD
VREF
P1.0/VIN/AIN0
P1.1/AIN1
P1.2/AIN2
P1.3/AIN3
P1.4/AIN4
P1.5/AIN5
P1.6/AIN6
P1.7/AIN7/C2D
P0.7
P0.6
P0.5
P0.4
P0.3/XCLK
P0.2
P0.1
P0.0
PH6
PH5
PH4
PH3
PH2
PH1
GND
GND
1
VSENSE
P0.0
P0.5
P0.2
P0.1
P0.3 / XCLK
P1.0/VIN/AIN 0
IPK
P0.6
P0.7
2
3
4
5
6
7
8
24
23
22
21
20
19
18
17
9
10111213141516
32313029282726
25
P0.4
Si8250/1/2
Top View
P1.1/AIN1
GNDA
VDDA
RST/C2CK
GND
VDD
P1.5/AIN5
P1.6/AIN6
P1.7/AIN7/C2D
PH6
PH5
P1.4/AIN4
VDD
GND
PH3
P1.3/AIN3
P1.2/AIN2
VREF
PH4
PH2
PH1
28-pin QFN
32-pin LQFP
查询SI8250-IQ供应商
Page 2
Si8250/1/2
2 Preliminary Rev. 0.8
Page 3
Si8250/1/2
Preliminary Rev. 0.8 3
TABLE OF CONTENTS
Section Page
1. Electrical Specifications . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .4
2. Benefits of Digital Power Control . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 14
3. Product Description . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .15
3.1. System Operation . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .16
3.2. Control Processor Functional Block Descriptions (Figure 1) . . . . . . . . . . . . . . . . . . . 16
3.3. System Management Processor Functional Block Descriptions . . . . . . . . . . . . . . . . 17
4. Design Tools . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .18
5. Example Applications . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .19
6. Layout Considerations . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .21
7. Pin Descriptions—Si8250/1/2 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .23
8. Ordering Guide . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 25
9. Package Outline—32LQFP . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .26
10. Package Outline—28QFN . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 27
Document Change List . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .28
Contact Information . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .30
Page 4
Si8250/1/2
4 Preliminary Rev. 0.8
1. Electrical Specifications
Table 1. Absolute Maximum Ratings*
Parameter Conditions Min. Typ. Max. Units
Ambient Temperature under Bias –55 +135 °C
Storage Temperature –65 +150 °C
Voltage on any Port0 Pin with respect to GND –0.3 5.5 V
Voltage on all other pins with respect to GND –0.3 4.0 V
Voltage on VDD with respect to GND –0.3 4.0 V
Maximum total current through VDD or GND 400 mA
Maximum output current sunk by RST
or any
Port pin
——80mA
*Note: Stresses above those listed under "2.1 Absolute Maximum Ratings" may cause permanent damage to the device. This
is a stress rating only, and functional operation of the devices at those or any other conditions above those indicated in the operation listings of this specification is not implied. Exposure to maximum rating conditions for extended periods may affect device reliability.
Table 2. DC Electrical Specifications
TA = –40 to +125 °C, VDD = 2.5 V, SYSCLK = 25 MHz, PLLCLK = 200 MHz unless otherwise specified.
Parameter Conditions Min Typ Max Units
Supply Voltage 2.25 2.75 V
Supply Current, all Peripherals Enabled
Analog + digital supply current. 26 mA
Lockout mode supply current Analog + digital supply current.
(See Table 1 on page 4)
—300— µA
Digital Supply Current (shutdown) Oscillator not running, VDD mon-
itor disabled
——TBA
Digital Supply RAM Data Retention Voltage
—1.5— V
Page 5
Si8250/1/2
Preliminary Rev. 0.8 5
Table 3. Reference DAC Electrical Specifications
TA = –40 to +125 °C, VDD = 2.5 V, SYSCLK = 25 MHz, PLLCLK = 200 MHz unless otherwise specified.
Parameter Conditions Min Typ Max Units
Resolution 9 Bits
LSB Size 2.44 mV
Integral Nonlinearity (INL) –2 +2 LSB
Differential Nonlinearity (DNL) –1.0 +1.0 LSB
Settling Time 1/2 LSB change from 0 to
full scale
—2—µs
Turn-on Time 20 µs
Noise 2 MHz BW 1 mV
PP
Power Supply Rejection 70 db
Supply Current 220 µA
Shutdown Supply Current 0.1 µA
Page 6
Si8250/1/2
6 Preliminary Rev. 0.8
Table 4. ADC0 (12-Bit ADC) Specifications
TA = –40 to +125 °C, VDD = 2.5 V, SYSCLK = 25 MHz, PLLCLK = 200 MHz unless otherwise specified.
Parameter Conditions Min Typ Max Units
DC Accuracy
Resolution 12 bits
Integral Nonlinearity ±2 LSB
Differential Nonlinearity Guaranteed Monotonic ±1 LSB
Offset Error ±3 LSB
Full Scale Error Differential mode 3 LSB
Offset Temperature Coefficient TBD ppm/°C
Dynamic Performance (10 kHz sine-wave Single-ended input, 0 to 1 dB below Full Scale, 200 ksps)
Signal-to-Noise Plus Distortion 64 dB
Total Harmonic Distortion Up to the 5
th
harmonic 83 dB
Spurious-Free Dynamic Range –73 dB
Conversion Rate
Conversion Time in SAR Clocks Note 1 13 clocks
Track/Hold Acquisition Time Note 2 1 µs
Throughput Rate 200 ksps
Analog Inputs
Input Voltage Range 0 V
REF
V
Input Capacitance 15 pF
Temperature Sensor
Linearity Notes 3, 4 ±TBD °C
Gain Notes 3, 4 1353 µV/°C
Offset Notes 3, 4 (Temp = 0 °C) 488 mV
Power Specifications
Power Supply Current (V
DD
sup-
plied to ADC0)
Operating Mode, 200 ksps 780 µA
Power-On Time After V
REF
settle, before tracking
begins
—5— µs
Power Supply Rejection TBD mV/V
Notes:
1. An additional 2
F
CLK
cycles are required to start and complete a conversion.
2. Additional tracking time may be required depending on the output impedance connected to the ADC input.
3. Represents one standard deviation from the mean.
4. Includes ADC offset, gain, and linearity variations.
Page 7
Si8250/1/2
Preliminary Rev. 0.8 7
Table 5. ADC1 Specifications
TA = –40 to +125 °C, VDD = 2.5 V, SYSCLK = 25 MHz, PLLCLK = 200 MHz unless otherwise specified.
Parameter Conditions Min Typ Max Units
Sampling Frequency ADCSP = 0 10 Msps
ADCSP = 1 5
Resolution 6 Bits
LSB Size 4 20 mV
Differential Input Voltage Range Note 1 –32 +31 LSB
Common-mode input voltage range 0.8 1.3 V
Integral Nonlinearity –2 +2 LSB
Differential Nonlinearity –1 +1 LSB
Gain Error 5 %
Offset Error 3 mV
Input Bias Current 5 µA
Standby Mode Supply Current disabled 0.1 µA
Operating Mode Supply Current 3 mA
Notes:
1. LSB size (mV) is programmable using the RES[3:0] bits in the ADC1CN register.
Table 6. DSP Filter Engine Electrical Specifications
TA = –40 to +125 °C, VDD = 2.5 V, SYSCLK = 25 MHz, PLLCLK = 200 MHz unless otherwise specified.
Parameter Conditions Min Typ Max Units
Resolution
1
——9Bits
Dithering
2
——6Bits
Standby Mode Supply Current disabled 0.1 µA
Notes:
1. Internal word length = 22 bits.
2. Up to a total 15 bits of resolution when dithering is enabled.
Page 8
Si8250/1/2
8 Preliminary Rev. 0.8
Table 7. Peak Current Limit Detector Electrical Specifications
TA = –40 to +125 °C, VDD = 2.5 V, SYSCLK = 25 MHz, PLLCLK = 200 MHz unless otherwise specified.
Parameter Conditions Min Typ Max Units
IPK Input to DPWM Output Latency 10 mV Overdrive 45 ns
Threshold Detector Voltage VT[3:0] = 0000 35 50 65 mV
VT[3:0] = 0001 85 100 115
VT[3:0] = 0010 135 150 165
VT[3:0] = 0011 185 200 215
VT[3:0] = 0100 235 250 265
VT[3:0] = 0101 285 300 315
VT[3:0] = 0110 335 350 365
VT[3:0] = 0111 485 400 415
VT[3:0] = 1000 435 450 465
VT[3:0] = 1001 485 500 515
VT[3:0] = 1010 535 550 565
VT[3:0] = 1011 585 600 615
VT[3:0] = 1100 635 650 665
VT[3:0] = 1101 685 700 715
VT[3:0] = 1110 735 750 765
VT[3:0] = 1111 785 8 00 815
Hysteresis HYST[1:0] = 00 0 mV
HYST[1:0] = 01 5
HYST[1:0] = 10 10
HYST[1:0] = 11 20
Blanking Time LEB[1:0] = 00, f
PLL
= 200 MHz 0 ns
LEB[1:0] = 01, f
PLL
=200MHz 20
LEB[1:0] = 10, f
PLL
=200MHz 40
LEB[1:0] = 11, f
PLL
= 200 MHz 80
Input Capacitance 4.5 pF
Input Bias Current 0.1 µA
Shutdown Supply Current Enable bit = 0 0.1 µA
Active Supply Current IIN = (Vt + 100 mVpp),
1.5 MHz sq. wave
—100—µA
Page 9
Si8250/1/2
Preliminary Rev. 0.8 9
Table 8. DPWM Specifications
TA = –40 to +125 °C, VDD = 2.5 V, SYSCLK = 25 MHz, PLLCLK = 200 MHz unless otherwise specified.
Parameter Conditions Min Typ Max Units
Clock Frequency DPWMSP[4:3] = 00 200 MHz
DPWMSP[4:3] = 01 50
DPWMSP[4:3] = 1x 25
Resolution No dithering 9 Bits
Dithering enabled 15
Time Resolution DPWMSP[4:3] = 00 5 ns
DPWMSP[4:3] = 01 20
DPWMSP[4:3] = 1x 40
SYNC Pulse set-up time SYNC signal minimum LOW time
before positive transition
3——DPWM
clock cycles
PH Rise, Fall Time 50pF on pin 5 ns
Output Resistance High I
OUT
=–5mA 75
Output Resistance Low I
OUT
=8mA 40
Shutdown Supply Current 0.1 µA
Table 9. Bandgap Voltage Reference Specs
TA = –40 to +125 °C, VDD = 2.5 V, SYSCLK = 25 MHz, PLLCLK = 200 MHz unless otherwise specified.
Parameter Conditions Min Typ Max Units
Output Voltage 1.20 V
Temperature Stability –1 +1 %
Turn-on Response (0.01%, 4.7 µF) 6.5 ms
no load 2 µs
Noise 4.7 µF — 2 µV (RMS)
Bandgap Current 60 µA
Reference Buffer Current 30 µA
Power supply rejection 50 dB
Page 10
Si8250/1/2
10 Preliminary Rev. 0.8
Table 10. Comparator0 Specifications
TA = –40 to +125 °C, VDD = 2.5 V, SYSCLK = 25 MHz, PLLCLK = 200 MHz unless otherwise specified.
Parameter Conditions Min Typ Max Units
Vin 0 V
DD
V
Low-Speed Supply Current 8 µA
Full-speed Supply Current 225 µA
Hysteresis CP0HYP[1:0] = 00 0 mV
CP0HYP[1:0] = 01 7
CP0HYP[1:0] = 10 14
CP0HYP[1:0] = 11 28
CP0HYN[1:0] = 00 0
CP0HYN[1:0] = 01 –7
CP0HYN[1:0] = 10 –14
CP0HYN[1:0] = 11 –28
Response Time Low Power Mode, 25 mV Overdrive 180 ns
High-Speed Mode, 25 mV Overdrive 25
Input Capacitance 5 pF
CMRR 50 db
Input offset 5 mV
Page 11
Si8250/1/2
Preliminary Rev. 0.8 11
Table 11. Reset Electrical Characteristics
TA = –40 to +125 °C, VDD = 2.5 V, SYSCLK = 25 MHz, PLLCLK = 200 MHz unless otherwise specified.
Parameter Conditions Min Typ Max Units
RST
Output Low Voltage IOL= 8.5mA, VDD = 2.5V 0.7 V
RST
Input High Voltage 0.7 x V
DD
—— V
RST
Input Low Voltage 0.3 x V
DD
V
RST
Input Pull-up Current RST =0.0 25 TBD µA
VDD POR Threshold 2.0 2.1 2.2 V
Missing clock detector timeout Time from last system clock ris-
ing edge to start of reset
250 650 µs
Reset time delay Delay between release of any
reset source and code execu-
tion at location 0x0000
5.0 µs
Minimum RST
Low time to gen-
erate a System Reset
6.5 µs
VDD monitor turn-on time 100 µs
VDD monitor supply current 40 µA
Table 12. Flash Electrical Characteristics
TA = –40 to +125 °C, VDD = 2.25 V – 2.75 V, SYSCLK = 25 MHz, PLLCLK = 200 MHz unless otherwise specified.
Parameter Conditions Min Typ Max Units
Flash Size Si8250 32768
(1)
—— bytes
Si8251, Si8252 16383
(1)
——
Endurance 10 K 100 K Erase/Write
Read Cycle Time TBD ns
Erase Cycle Time 50 MHz System Clock 32 48 ms
Write Cycle Time 50 MHz System Clock 76 114 µs
Notes:
1. The last 512 bytes of memory are reserved.
Page 12
Si8250/1/2
12 Preliminary Rev. 0.8
Table 13. Port I/O DC Electrical Characteristics
TA = –40 to +125 °C, SYSCLK = 25 MHz, PLLCLK = 200 MHz unless otherwise specified.
Parameters Conditions Min Typ Max Units
Port0 Input Voltage Tolerance push-pull V
DD
+ 0.7 V
open-drain 5.5
Port1 Input Voltage Tolerance V
DD
+ 0.7
Output High Voltage I
OH
=–3mA,
Port I/O push-pull
VDD – 0.4 V
I
OH
=–10µA,
Port I/O push-pull
VDD – 0.1
I
OH
= –10 mA,
Port I/O push-pull
—VDD – 0.8
Output Low Voltage I
OL
=8.5mA 0.6 V
I
OL
=10µA 0.1
I
OL
= 25 mA 1.25
Input High Voltage (0.7) V
DD
——V
Input Low Voltage (0.3) V
DD
V
Input Leakage Current Weak Pullup Off ±10 µA
Weak Pullup On, V
IN
=0V 20 50
Table 14. PLL Specifications
TA = –40 to +125 °C, VDD = 2.5 V, SYSCLK = 25 MHz, PLLCLK = 200 MHz unless otherwise specified.
Parameter Conditions Min Typ Max Units
Stabilization Time 30 µs
Input Frequency Range 15 25 MHz
PLL Frequency 200 MHz
Cycle-to-cycle jitter 250 ps
Supply current 15 mA
Shutdown current 0.1 µA
Page 13
Si8250/1/2
Preliminary Rev. 0.8 13
Table 15. 25MHz Oscillator Specifications
TA = –40 to +125 °C, VDD = 2.5 V, SYSCLK = 25 MHz, PLLCLK = 200 MHz unless otherwise specified.
Parameter Conditions Min Typ Max Units
Frequency 24.5 MHz
Start-up time 100 µs
Power supply sensitivity 0.3 %/V
Temperature coefficient 50 PPM/°C
Supply current 450 µA
Shutdown current 0.1 µA
Table 16. Low Frequency Oscillator (LFO) Specifications
TA = –40 to +125 °C, VDD = 2.5 V, SYSCLK = 25 MHz, PLLCLK = 200 MHz unless otherwise specified.
Parameter Conditions Min Typ Max Units
Frequency 80 kHz
Start-up time 100 µs
Power supply sensitivity 1.7 %/V
Temperature coefficient 1000 PPM/°C
Supply current 4 µA
Shutdown current 0.1 µA
Page 14
Si8250/1/2
14 Preliminary Rev. 0.8
2. Benefits of Digital Power Control
Digitally controlled power systems have the following key advantages over analog implementations:
In-system programmability: Virtually all aspects of
digital controller behavior can be changed in software locally or remotely, and without hardware modification. This benefits the system in several ways:
Hardware designs can be segregated into base
platforms (for example, by form factor or output power), and optimized to the end application in software. This lowers development costs by reducing the total number of hardware designs required to address a given application segment.
The controller's ability to readily accept change makes
possible low-cost, custom power supply versions with relatively short lead-time.
The cost and risk of field configuration and/or updating
is greatly reduced, lowering the overhead associated with customer support.
More advanced control algorithms: Power supply
design with fixed-function analog components leads to many performance trade-offs. For example, analog compensator design routinely trades stability for higher loop bandwidth, and places the required poles and zeros using passive components. The "if­then-else" decision-making capability of digital control can change loop bandwidth as needed for optimum control response. For example the controller can operate the compensator at a relatively low bandwidth during steady-state operation, but significantly extend bandwidth during a transient. This adaptive response concept can be applied to improve other operating parameters such as efficiency.
Power Efficiency Optimization: In a switched mode
power supply, it is desirable to maintain high power efficiency over a wide range of loads. Software algorithms can optimize efficiency at every point of line and load. For example, the software can adjust dead time with changes load, disable synchronous rectification at low loads, or take other measures to maximize efficiency.
Higher operating precision: Switch timing, control
response and protection setting thresholds in analog systems are typically determined by the values of external passive components. These components typically have a wide tolerance and vary with temperature and time. Designers must allow for these tolerances when considering worst case operating conditions. Digital control offers tighter parameter tolerances with greatly reduced temperature/time variations resulting in improved worst-case operating specifications.
Power management and power delivery functions in
a single package: Power management functions, such as external supply sequencing, PMBus communication support and fan control can be performed by the digital controller, eliminating dedicated external components.
System connectivity: PMBus and other emerging
communication protocols enable system processors to communicate with the power supply to obtain data and command action. For example, the system processor may request the power supply operating history, perform self-diagnostics or change system settings without taking the supply off-line. Communications with the system controller enables notification of a pending power supply failure, enhancing system reliability. This attribute also reduces the cost and complexity of field configurations and upgrades.
Higher integration/smaller size/lower cost: Many
discrete circuits can be transformed to lines of software code, eliminating components and saving cost. The digital controller can be used to execute self-diagnostic routines during production test thereby reducing test time and saving cost. The small physical size of the Si8250 in particular (5 x 5 mm) saves board space.
Page 15
Si8250/1/2
Preliminary Rev. 0.8 15
3. Product Description
Figure 1. Functional Block Diagram
Figure 2. Si8250 Top-Level Block Diagram
Si8250/1/2
System Management Processor
I/O (8)
I/O (8)
50MIPS 8051 CPU
1280 Byte
RAM
16/32 kB
Flash
PORT 0
8
MUX
TEMP
SENSOR
PORT 1
HARDWARE
DEBUG
RESET
CONTROL
2% 25 Mhz OSC,
and LFO
INTERRUPT
CONTROL
4x 16-BIT
TIMERS
SMBus
3 CH PCA
I/O PORT LATCHES
ADC
REGISTERS
& LIMIT
DETECTORS
12-BIT
200 Ksps
ADC
UART
AUTO SCAN LOGIC
VSENSE
DEBUG
PORT
VDD
SYSCLKIN
Control Processor
IPK
VSENSE
VREF
GATE CONTROL
(6)
MULTIPHASE
DPWM
Pulse-by-Pulse
Current Limiter
and OCP
ICYC
u(n)
10 MHz
ADC
REFDAC
VREF
DSP
FILTER ENGINE
VSENSE
OCP
POWER STAGES
Si8250
System Management Processor
PORT 0
I/O CROSSBAR
TEMP
SENSOR
PORT 1
50MIPS 8051 CPU
and Memory
Digital Peripherals:
- UART
- SMBus Port
- 4 x 16-Bit Timers
- 3 Ch PCA (PWM)
- I/O Port La tches
VSENSE
DEBUG
PORT
VDD
SYSCLKIN
Control Processor
IPK
VSENSE
VREF
MULTIPHASE
DPWM
Pulse-by-Pulse Current Limiter
and OCP
ICYC
u(n)
ADC1
10Msps
REFDAC
VREF
DSP
FILTER ENGINE
VSENSE
OCP
ADC 0
12-Bit, 200Ksps
10-Channel
Up to 6 Gate
Control Outputs
GATE
DRIVERS
16 General-Purpose
Analog/Digital I/O Lines
SUPPLY INPUT
VOLTAGE
OUTPUT
FILTER
SWITCHES
AND
MAGNETICS
Analog Input (e.g. average current)
Digital Ouput (e.g. fan speed control)
VOUT
Peak Current Signal (e.g. CT)
Page 16
Si8250/1/2
16 Preliminary Rev. 0.8
3.1. System Operation
Figure 2 shows the Si8250/1/2 controlling a non­isolated DC/DC converter operating in digital voltage mode control. The output voltage signal connects to the VSENSE input through a resistive divider, limiting the common mode voltage range applied to ADC1 to a maximum of VREF. The equivalent resistance of the divider and the capacitor form an anti-aliasing filter with a cutoff frequency equal to ADC1 sampling frequency of divided by 2 (the amplitudes of frequencies above fS/2 must be minimized to prevent aliasing).
Differential ADC1 and the DSP Filter Engine together perform the same function as an analog error amplifier and associated RC compensation network. ADC1 digitizes the difference between the scaled output voltage and a programmable reference voltage provided by the REFDAC. The ADC1 output signal is frequency compensated (in digital domain) by the DSP Filter Engine. The resulting output from the DSP Filter Engine is a digital code that represents the compensated duty cycle ratio, u(n). The digital PWM generator (DPWM) directly varies output timing to the external gate drivers based on the value of u(n) until the difference between VSENSE and ADC1 reference level is driven to zero.
Sensing circuitry within the power stages (current transformer, sense amp, etc.) provides a signal representative of inductor or transformer current. This signal connects to the pulse-by-pulse current limiting hardware in the Si8250/1/2 via the IPK input pin. This current limiting circuitry is similar to that found in a voltage mode analog PWM. It contains a fast analog comparator and a programmable leading-edge blanking circuit to prevent unwanted tripping of the current sensing circuitry on the leading edge of the current pulse. Current limiting occurs when the sensed current exceeds the programmed threshold. When this occurs, the on-going active portions of the PWM outputs are terminated. A programmable OCP counter keeps track of the number of consecutive current limit cycles, and automatically shuts the supply down when the accumulated number of limit cycles exceeds the programmed maximum.
The System Management Processor is based on a 50 million instruction per second (MIPS) 8051 CPU and dedicated A/D converter (ADC0). ADC0 digitizes key analog parameters that are used by the MCU to provide protection, as well as manage and control other aspects of the power system. On-board digital peripherals include: timers, an SMBus interface port (for PMBus or other protocols); and a universal asynchronous receiver/transmitter (UART) for serial communications, useful for communicating across an isolation boundary.
The System Management Processor serves several purposes, among these are:
1. Continuously optimizes Control Processor operation (e.g. efficiently optimization)
2. Executes user-specific algorithms (e.g. support for proprietary system interfaces)
3. Provides regulation for low-bandwidth system variables (e.g. VIN feed-forward)
4. Performs system fault detection and recovery
5. Provides system housekeeping functions such as PMBus communication support
6. Manages external device functions (e.g. external supply sequencing, fan control/monitoring)
The Si8250/1/2 system development requires using the Si8250DK, a comprehensive development kit providing all required hardware and software for control system design. It comes complete with pre-written and verified application software, and a set of tools that enable the user to adapt this software to the end application. It also includes a turnkey isolated half-bridge DC/DC converter based on the Si8250/1/2 for evaluation and experimentation.
3.2. Control Processor Functional Block
Descriptions (Figure 1)
ADC 1: Differential input, 10 Msps control loop analog­to-digital converter. ADC1 digitizes the difference between the Vsense input and the programmable voltage reference level from the REFDAC. ADC1 can be operated at either 5 Msps or 10 Msps and has a programmable LSB size to prevent limit cycle oscillation (Limit cycle oscillation can also be avoided using dithering to increase DPWM resolution). ADC1 has programmable conversion rates of 10 Msps and 5 Msps to accommodate a wide loop gain range. ADC1 also contains a hardware transient detector that interrupts the CPU at the onset of an output load or unload transient. The CPU responds by executing specific algorithms to accelerate output recovery. These algorithms may include increasing loop bandwidth or other measures.
REFDAC
: 9-bit digital-to-analog converter provides the output voltage reference setting. The REFDAC uses the on-board band gap as its voltage reference, or can be referenced to an external voltage reference source. REFDAC is used for output voltage calibration, margining and positioning. The CPU continuously manages the REFDAC during soft-start and soft-stop.
DSP Filter Engine
: This two-stage loop compensation filter is the functional equivalent of an active RC compensation in an analog control scheme. The first filter stage is a PID filter providing one pole and two
Page 17
Si8250/1/2
Preliminary Rev. 0.8 17
zeros. The second stage is selectable: a two-pole low­pass filter (LPF) for the fastest possible response, or SINC (multiple zero) decimation filter for relatively quieter operation. The PID plus the LPF result in a three pole, two zero composite filter, while the PID plus the SINC results in a single pole, multiple zero composite filter. The SINC filter provides zeros at intervals equal to f
S
/(2*DEC) where DEC is the decimation ratio (i.e. ratio of input to output sampling rate). DEC is a software­programmable parameter, and can be programmed such that zero placement occurs that the PWM frequency and its harmonics. This creates more than 100 db attenuation at these frequencies providing lower system noise levels.
The end-to-end response of the filter is defined using only six software parameters, and can be re­programmed during converter operation to implement nonlinear control response for improved transient resolution.
As described in the ADC1 section above, limit cycle oscillation can be avoided by increasing ADC1 LSB size to allow the DPWM LSB to fit within a single ADC1 output code (i.e. zero-error bin). However in some applications, it may not be desirable to lower ADC1 sensitivity. For such applications, limit cycle oscillation can be avoided by dithering the DPWM output. The DSP Filter Engine contains a pseudo-random, broadband noise generator - mixing this noise into the filter output randomly moves the gate control output(s) over a range of 1 LSB, such that the time-averaged resolution of the DPWM is increased.
The filter response is programmed using S-domain design tools included in the Si8250DK development kit, greatly minimizing software writing tasks.
Pulse-by-pulse Current Limiter/OCP
: High-speed comparator with 4-bit DAC threshold generator and 2-bit programmable leading-edge blanking delay generator. The comparator output causes the DPWM to terminate the on-going portions of the active outputs when the peak current signal applied to the IPK input exceeds the threshold setting. Hardware performs an OCP supply shutdown when the number of consecutive current limit events equals a programmed maximum.
DPWM
: Output generator may be programmed for pulse width (PWM) or phase-shift modulation using design tools contained in the Si8250DK design kit. The DPWM may be modulated by the front-end of the Control Processor (ADC1 and DSP Filter Engine); or by the CPU. The DPWM has individually programmable stop states for supply off (disable) and OCP. Software bypass mode allows the CPU to force selected outputs high or low while the remaining outputs continue normal
operation. The DPWM includes an external SYNC input and ENABLE input, both of which can be connected to the I/O pins. The Enable is a logic input used to turn the power supply on and off. It can be configured to be active high or active low. The SYNC input allows the start of each switching cycle to be synchronized to an external clock source, including another Si8250/1/2.
3.3. System Management Processor Func­tional Block Descriptions
ADC0: Self-sequencing, 10-input, 200 Ksps analog-to­digital converter. This general-purpose ADC acquires other analog system parameters for supplemental control by the CPU (e.g. dead time control using average input current as the control variable). ADC0 also converts the output of the on-board temperature sensor. Eight of the ten analog inputs may be connected to the I/O pins for external interface. The remaining two analog inputs (Vsense and Temp Sensor) are internally connected. When placed in Auto Sequencing mode, ADC0 automatically converts, stores and limit-checks each analog input, and interrupts the CPU when a converted result is outside of its programmed range. This feature greatly facilitates protection functions because all measurement and comparison operations are automated.
Temperature Sensor
: This sensor measures the die temperature of the Si8250/1/2. It can achieve 3 C accuracy with a single-point calibration and 1 C with a two-point calibration. The temperature output signal is digitized by ADC0.
8051 CPU
: 50MIPS CPU core with 1K of SRAM and up to 32 kB of Flash memory. This processor has its own on-board oscillator and PLL, reset sources and real­time in-system hardware debug interface eliminating the need for external processor supervisors, timebases, and "emulators". The CPU has an external interrupt (INT0/) that can be connected to an external device via the I/O pins. When interrupted, the CPU suspends execution of the current task, and immediately vectors to an interrupt service routine specifically designed to handle the interrupting device.
Digital peripherals
: Peripherals include: four 16-bit timers, a three-channel programmable counter array (PCA), each channel useful as a PWM, an SMBus port useful as a PMBus interface, a UART (useful as a serial data port for isolated applications, and two 8-bit I/O port latches for logic control outputs.
Page 18
Si8250/1/2
18 Preliminary Rev. 0.8
4. Design Tools
The Si8250DK development kit (Figure 3) contains everything required to develop applications with the Si825x family of digital power controllers. This kit supports all phases of power supply development from controller design through real-time system debugging. It also includes a turnkey, 35 W isolated DC/DC target board for evaluation and experimentation.
Figure 3. Si8250DK Development Kit
Figure 4. Software Download to Si8250
Mounted in Power Supply
Figure 5. Timing Design Tool (Top) and Buck
Regulator Compensation Tool (Bottom)
The tool set enables the user to configure pre-written application software included in the kit to his application using a set of PC-based graphical user interface (GUIs). These GUIs (Figure 5) allow the user to quickly and easily specify and verify system timing, loop compensation and protection settings, and compile and download the resulting code into the Si8250/1/2 (Figure 4).
Page 19
Si8250/1/2
Preliminary Rev. 0.8 19
5. Example Applications
Isolated DC/DC Converter: A 35 W, 400 kHz Si8250-based half bridge converter is shown in Figure 6. This circuit is the same as that of the target (evaluation) board shipped in the Si8250DK development kit.
Figure 6. Isolated Half-Bridge DC/DC Converter
The Si8250/1/2 is located on the secondary-side of the power supply for optimum transient response. DPWM outputs PH3 and PH4 control gates of the synchronous rectifiers via a dual driver I.C. DPWM outputs PH1 and PH2 control the gates of the primary-side switching transistors with isolation provided by a Silicon Laboratories isolator. A current transformer circuit provides peak current sensing. Primary side analog parameters (input voltage and current and the filter node voltage) are digitized by a Silicon Laboratories C8051F300 microcontroller and passed to the Si8250/1/2 using the on-board UART through additional channels of the isolator I.C. to the Si8250/1/2. The Si8250/1/2 is uses the application software included with the Si8250DK development kit after being configured for the half-bridge application using the tools supplied in the kit.
When power is applied, the CPU executes an internal reset followed by initialization of all parameters. The Si8250/1/2 remains in a low-power state, monitoring digitized VIN data from the primary-side MCU until VIN is within specified limits. At this time, the controller is fully enabled and executes soft-start by monitoring Vout while sequentially incrementing the loop voltage reference (REFDAC) until the supply output voltage is within specified range, at which time steady-state operation begins.
During steady-state operation, the MCU operates in interrupt mode where hardware events divert program execution to specific routines in priority order.
2.2uF
180nH
6 x 100 uF
Cerami c
DRIVER
P2
IRLR8113
IRLR8113
180nH
.0.001
6:1
Si8250
Digi tal Contr oller
VOUT
P3
P4
PH4
PH3
P2
P1
10K
3.9K
0.01uF
IPK
Vsens eIOUT
C8051F300
Micr ocontrol ler
33K
1K
AIN
RX
Isol ator
PH2
PH1
0.010
AIN
1uH
33K
1K
VIN+
1.2nF
120uF
VI N-
GND
VDD
3V3P
IIN
DC BAL
AIN
VIN
2.2uF
TX
4.7
DRIVER
P1
4.7
0.01uF
4.7
4.7
7.5
~ +
~ -
FDS3572
FDS3 572
DRIVER
P3
DRIVER
P4
200
200
3V3P
VDDA
GNDA
3V3P
VDDB
GNDB
GND
VDD
Page 20
Si8250/1/2
20 Preliminary Rev. 0.8
Single Phase POL (point of load) converter: A 65 W, 400 KHz Si8252 based single phase POL converter block diagram is shown in Figure 7. DPWM outputs PH1 and PH2 control the gates of the buck and synchronous switching transistors. A lossless current sensing method that relies on the resistor and inductance of the inductor is used to measure the current for over current protection. The input voltage is measured using resistor divider network and analog input port AIN0 of 12bit, 200 kHz ADC0.
Figure 7. Single-phase POL Block Diagram
When power is applied, the CPU executes an internal reset followed by initialization of all parameters. The Si8252 remains in a low-power state, monitoring digitized VIN data until VIN is within specified limits. At this time, the controller is fully enabled and executes soft-start by monitoring output voltage while sequentially incrementing the loop voltage reference (REFDAC) until the supply output voltage is within specified range, at which time steady­state operation begins.
As in the previous half-bridge example, transient response is improved by adjusting loop gain at the onset of a transient (i.e. nonlinear control). The efficiency of the POL converter can be optimized over the complete load range by dynamically adjusting the dead-times. Typical efficiency simulation results for the POL are shown in Figure 8. In this case, the single-phase POL operates at a PWM frequency of 400 kHz with an output voltage of
3.3 V and an input voltage range of 10 to 15 V. The curve shows the efficiency with an input voltage of 12.0 V.
Figure 8. POL Efficiency
PH1
PH2
Vsense
Ipk
DRIVER
DRIVER
VIN
+2.5 V
CIN
GND
Si8252
AIN0
VIN
Vout
LOAD
Ipk
DIFFERENTIAL
AMPLIFIER
L
C
VDD
Ipk
0 5 10 15 20 25
80
85
90
95
Eff I o()
Io
Page 21
Si8250/1/2
Preliminary Rev. 0.8 21
6. Layout Considerations
The mixed-signal nature of the Si8250/1/2 mandates clean bias supplies and ground returns. It is best to provide separate ground planes for analog, digital and power switch returns. These planes should tie together at only one point to eliminate the possibility of circulating ground currents.
For best performance, the VDD supply should be decoupled from the main supply. The LQFP-32 package provides the best noise performance because it has separate analog and digital VDD and ground inputs (AVDD, AGND). As shown in Figure 9, the AVDD is decoupled by a filter consisting of a 1 resistor in series with a 500 mA, 40 ferrite bead and a parallel combination of a 10 uF with a 0.1 uF high-frequency bypass capacitor. All connections should be kept as short as possible. The VDDA and GNDA should be connected into their respective ground planes. The QFN-28 package shares analog and digital power with ground on the same pins. Power supply decoupling is shown in Figure 10. Again, all connections should be kept as short as possible.
Figure 9. Power Supply Connections for LQFP-32 Package
Figure 10. Power Supply Connections for QFN-28 Package
AVDD DVDD
Ferrite bead
500 mA, 40
0.1 uF10 uF
Si8250/1/2
AGND DGND
AGND
10 uF 0.1 uF
2.5 V
1
Keep trace
lengths as short
as possible
VDD
Ferrite bead
500 mA, 40
0.1 uF10 uF
Si8250/1/2
GND
2.5 V
1
Keep trace
lengths as short
as possible
Page 22
Si8250/1/2
22 Preliminary Rev. 0.8
In both cases, the bias supplies must be filtered using low ESR/ESL capacitors placed close to the IC pins.
Thick copper traces should be connected to the bias pins (VDD, VDDA) and the ground pins (GND, GNDA) to reduce resistance and inductance. The copper routings from the drivers to the FETs should be kept short and wide, especially in very high frequency applications, to reduce inductance of the traces so that the drive signals can be kept clean.
Connections between VSENSE and the output voltage must be kept absolutely as short as possible to minimize inductance and parasitic ringing effects. It is best to locate the Si8250/1/2 as close to the output voltage terminal as possible and use a Kelvin connection to ensure to difference in ground potential between the Si8250/1/2 and the output voltage ground return.
Most applications will require access to the debug pins. These pins are susceptible to damage from electrostatic discharge (ESD). It is therefore recommended the debug circuit interface use the input protection circuitry shown in Figure 11.
Figure 11. Debug Interface Pin Protection Circuit
DEBUG
CONNECTOR
10
10
Si8250/1/2
Debug Pins
(C2D, C2CK)
2.5 V
Page 23
Si8250/1/2
Preliminary Rev. 0.8 23
7. Pin Descriptions—Si8250/1/2
Figure 12. Example Pin Configurations
Table 17. Pin Descriptions
Name QFN-28
Pin #
LQFP-32
Pin#
Type D e s c r i p tion
RST
/C2CK
1 1 D I/O
Reset input or bidirect debug clock
IPK
22 AIN
Inductor current input
VSENSE
33 AIN
Output voltage feedback input
GND
4— AIN
Ground
GNDA
—4 AIN
Ground
VDD
5— AIN
Power supply input
VDDA
—5 AIN
Power supply input
VREF
66 AIN
External voltage reference input
P1.0/VIN or AIN0
7 7 D I/O or AIN
Port 1 I/O or scaled power supply input voltage or ADC input 0
P1.1/AIN1
8 8 D I/O or AIN
Port 1 I/O or ADC input 1
P1.2/AIN2
9 9 D I/O or AIN
Port 1 I/O or ADC input 2
P1.3/AIN3
10 10 D I/O or AIN
Port 1 I/O or ADC input 3
P1.4/AIN4
11 11 D I/O or AIN
Port 1 I/O or ADC input 4
GND
—12 AIN
Ground
VDD
—13 AIN
Power supply input
P1.5/AIN5
12 14 D I/O or AIN
Port 1 I/O or ADC input 5
P1.6/AIN6
13 15 D I/O or AIN
Port 1 I/O or ADC input 6
P1.7/ AIN7/C2D
14 16 D I/O, DIN or
AIN
Port 1 I/O or ADC input 7 or C2 Data
32-pin LQFP 28-pin QFN
1
VSENSE
P0.0
P0.5
P0.2
P0.1
P0.3 / XCLK
P1.0/VIN/AIN0
IPK
P0.6
P0.7
2
3
4
5
6
7
8
24
23
22
21
20
19
18
17
9
101112
13
14
15
16
32
313029
28
27
26
25
P0.4
Si8250/1/2
Top View
P1.1/AIN1
GNDA
VDDA
RST/C2CK
GND
VDD
P1.5/AIN5
P1.6/AIN6
P1.7/AIN7/C2D
PH6
PH5
P1.4/AIN4
VDD
GND
PH3
P1.3/AIN3
P1.2/AIN2
VREF
PH4
PH2
PH1
4
5
6
7
2
1
3
11
12
13
14
9
8
10
18
17
16
15
20
21
19
25
26
27
28
23
22
24
Si8250/1/2
Top View
RST / C2CK
IPK
VSENSE
GND
VDD
VREF
P1.0/VIN /AIN0
P1.1/AIN1
P1.2/AIN2
P1.3/AIN3
P1.4/AIN4
P1.5/AIN5
P1.6/AIN6
P1.7/AIN7/C2D
P0.7
P0.6
P0.5
P0.4
P0.3/XC LK
P0.2
P0.1
P0.0
PH6
PH5
PH4
PH3
PH2
PH1
GND
GND
Page 24
Si8250/1/2
24 Preliminary Rev. 0.8
Pin Functions:
RST/C2CK: CPU reset or debug tool clock. Driving this pin low resets the CPU. This pin is also clocked by the USB debug adaptor during debug.
IPK
: Input to the peak current detector for pulse-by-pulse current limiting and over-current protection shutdown
control.
VSENSE
: ADC1 inverting input. This is the voltage feedback input for the Si8250. The maximum allowable signal is
VREF.
GND
: Digital ground for the 32LQFP package, and the main ground for the 28MLP package.
GNDA
: Analog ground for 32LQFP only.
VDD
: Digital supply voltage for the 32LQFP package, and main supply voltage for the 28MLP package.
VDDA
: Analog supply for 32LQFP only.
P1.0/VIN or AIN0
: Programmable multifunction I/O pin. This pin can be software configured to be either a Port 1 digital input or output, or an ADC0 input at AMUX address 0. If used in a non-isolated application, positive input supply voltage must be tied to this input through a resistor divider and anti-aliasing capacitor to minimize the frequencies above fS/2 (100Khz) to prevent aliasing. Isolated applications may use this input as general-purpose digital I/O or analog input.
P1.1 or AIN1–P1.7 or AIN7
: Programmable multifunction I/O pins. These pins can be software configured to be a Port 1 digital input or output, or an ADC0 input. P1.7 also serves as the debug data input (C2D) and is used during debug by the USB debug adaptor. P1.7 may be used as general-purpose digital I/O when not in debug mode. Any of the digital peripherals may be programmed to connect to these pins.
P0.0–P0.7
: Programmable multifunction I/O pins. These pins can be software configured to be either a Port 1 digital input or output, or an ADC0 input. Any of the digital peripherals (including the ENABLE input) may be programmed to connect to these pins. P0.3 may be programmed to serve as an external (25MHz nominal) clock input.
PH1–PH6
: DPWM gate control (complementary drive) outputs. These signals connect to the MOSFET gates
through an external gate driver. The output levels swing between ground and Vdd.
P0.7
15 17 D I/O
Port 0 I/O
P0.6
16 18 D I/O
Port 0 I/O
P0.5
17 19 D I/O
Port 0 I/O
P0.4
18 20 D I/O
Port 0 I/O
P0.3/XCLK
19 21 D I/O
Port 0 I/O
P0.2
20 22 D I/O
Port 0 I/O
P0.1
21 23 D I/O
Port 0 I/O
P0.0
22 24 D I/O
Port 0 I/O or bidirectional debug data
PH6
23 25 DOUT
Phase 6 switch control output
PH5
24 26 DOUT
Phase 5 switch control output
PH4
25 27 DOUT
Phase 4 switch control output
VDD
—28 AIN
Power supply input
GND
—29 AIN
Ground
PH3
26 30 DOUT
Phase 3 switch control output
PH2
27 31 DOUT
Phase 2 switch control output
PH1
28 32 DOUT
Phase 1 switch control output
Table 17. Pin Descriptions (Continued)
Name QFN-28
Pin #
LQFP-32
Pin#
Type D e s c r i p tion
Page 25
Si8250/1/2
Preliminary Rev. 0.8 25
8. Ordering Guide
Ordering Number Flash Memory Number of
PWM
Outputs
UART Package
Si8250-IQ 32 kB 6 Yes LQFP-32
Si8250-IM 32 kB 6 Yes QFN-28
Si8251-IQ 16 kB 6 Yes LQFP-32
Si8251-IM 16 kB 6 Yes QFN-28
Si8252-IQ 16 kB 3 No LQFP-32
Si8252-IM 16 kB 3 No QFN-28
Page 26
Si8250/1/2
26 Preliminary Rev. 0.8
9. Package Outline—32LQFP
Figure 13 illustrates the package details for the 32-pin LQFP version of the Si8250/1/2. Table 18 lists the values for the dimensions shown in the illustration.
Figure 13. 32-pin LQFP Package Diagram
Table 18. LQFP-32 Package Dimensions
MM
Min Typ Max
A——1.60
A1 0.05 0.15
A2 1.35 1.40 1.45
b 0.300.370.45
D 9.00
D1 7.00
e 0.80
E 9.00
E1 7.00
PIN 1
IDENTIFIER
A1
eb
1
32
E1
D1
D
E
A2
A
L
Page 27
Si8250/1/2
Preliminary Rev. 0.8 27
10. Package Outline—28QFN
Figure 14 illustrates the package details for the 28-lead QFN version of the Si8250/1/2. Table 19 lists the values for the dimensions shown in the illustration.
Figure 14. 28-lead Quad Flat No-lead (QFN) Package Diagram
Table 19. QFN-28 Package Dimensions
MM MM
Min Typ Max Min Typ Max
A 0.80 0.90 1.00 L 0.45 0.55 0.65
A1 0 0.02 0.05 N 28
A2 0 0.65 1.00 ND 7
A3 0.25 NE 7
b 0.180.230.30 R 0.09 — —
D 5.00 AA 0.435
D2 2.90 3.15 3.35 BB 0.435
E 5.00 CC 0.18
E2 2.90 3.15 3.35 DD 0.18
e—0.5—
1
E
D
A2
A
A1
e
A3
E2
R
e
L
Bottom View
Side View
2
3
4
5
6
7
8
9
10
12
13
14
21
20
19
17
16
15
28
27
26
24
23
22
E2
25
2
D2
11
18
D2
2
6 x e
6 x e
DETAIL 1
DETAIL 1
AA
BB
CC
DD
b
Page 28
Si8250/1/2
28 Preliminary Rev. 0.8
DOCUMENT CHANGE LIST
Revision 0.7 to Revision 0.8
Updated DPWM phase output drive-high and drive-
low resistance in Table 8, “DPWM Specifications,” on page 9.
Page 29
Si8250/1/2
Preliminary Rev. 0.8 29
NOTES:
Page 30
Si8250/1/2
30 Preliminary Rev. 0.8
CONTACT INFORMATION
Silicon Laboratories Inc.
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Email: productinfo@silabs.com Internet: www.silabs.com
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The information in this document is believed to be accurate in all respects at the time of publication but is subject to change without notice. Silicon Laboratories assumes no responsibility for errors and omissions, and disclaims responsibility for any consequences resulting from the use of information included herein. Additionally, Silicon Laboratories assumes no responsibility for the functioning of undescribed features or parameters. Silicon Laboratories reserves the right to make changes without further notice. Silicon Laboratories makes no warranty, rep­resentation or guarantee regarding the suitability of its products for any particular purpose, nor does Silicon Laboratories assume any liability arising out of the application or use of any product or circuit, and specifically disclaims any and all liability, including without limitation conse­quential or incidental damages. Silicon Laboratories products are not designed, intended, or authorized for use in applications intended to support or sustain life, or for any other application in which the failure of the Silicon Laboratories product could create a situation where per­sonal injury or death may occur. Should Buyer purchase or use Silicon Laboratories products for any such unintended or unauthorized ap­plication, Buyer shall indemnify and hold Silicon Laboratories harmless against all claims and damages.
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