This N-Channel 2.5V specified MOSFET is a rugged
gate version of Fairchild's Semiconductor’s advanced
PowerTrench process. It has been opt imized for power
management applications with a wide range of gate
drive voltage (2.5V – 12V).
Applications
• Load switch
• Motor drive
• DC/DC conversion
• Power management
G
2
S
2
S
2
D
2
G
S
S
1
D
1
TSSOP-8
Pin 1
Features
• 5.5 A, 20 V. R
R
• Extended V
• Low gate charge
• High performance trench te chnology for extremely
low R
• Low profile TSSOP-8 package
1
1
DS(ON)
GSS
= 0.021 Ω @ VGS = 4.5 V
DS(ON)
= 0.035 Ω @ VGS = 2.5 V
DS(ON)
range (±12V) for battery applications
1
2
3
4
8
7
6
5
Absolute Maximum RatingsT
o
=25
C unless otherwise noted
A
Symbol Parameter Ratings Units
V
Drain-Source Voltage 20 V
DSS
V
Gate-Source Voltage
GSS
ID Drain Current – Continuous (Note 1a) 5.5 A
– Pulsed 30
PD Power Dissipation (Note 1a) 1.0 W
TJ, T
STG
Operating and Storage Junction Temperature Range -55 to +150
Symbol Parameter Test Conditions MinTyp Max Units
Off Characteristics
BV
Drain–Source Breakdown Voltage
DSS
∆BVDSS
∆T
I
Zero Gate Voltage Drain Current VDS = 16 V, VGS = 0 V 1
DSS
I
GSSF
I
GSSR
Breakdown Voltage Temperature
Coefficient
J
Gate–Body Leakage, Forward VGS = 12 V, VDS = 0 V 100 nA
Gate–Body Leakage, Reverse VGS = –12 V VDS = 0 V –100 nA
V
= 0 V, ID = 250 µA
GS
= 250 µA,Referenced to 25°C
I
D
20 V
14
mV/°C
µA
On Characteristics (Note 2)
V
Gate Threshold Voltage
GS(th)
∆VGS(th)
∆TJ
R
DS(on)
Gate Threshold Voltage
Temperature Coefficient
Static Drain–Source
On–Resistance
I
On–State Drain Current VGS = 4.5 V, VDS = 5 V 30 A
D(on)
V
= VGS, ID = 250 µA
DS
I
= 250 µA,Referenced to 25°C
D
= 4.5 V, ID = 5.5 A
V
GS
= 2.5 V, ID = 4.2 A
V
GS
= 4.5 V, ID = 5.5A, TJ=125°C
V
GS
0.6 0.8 1.5 V
–3.2
17
24
23
21
35
34
mV/°C
mΩ
gFS Forward Transconductance VDS = 5 V, ID = 5.5 A 26 S
Dynamic Characteristics
C
Input Capacitance 1082 pF
iss
C
Output Capacitance 277 pF
oss
C
Reverse Transfer Capacitance
rss
= 10 V, V
V
DS
f = 1.0 MHz
= 0 V,
GS
130 pF
Switching Characteristics (Note 2)
t
Turn–On Delay Time 8 20 ns
d(on)
tr Turn–On Rise Time 8 27 ns
t
Turn–Off Delay Time 24 38 ns
d(off)
tf Turn–Off Fall Time
Qg Total Gate Charge 12 17 nC
Qgs Gate–Source Charge 2 nC
Qgd Gate–Drain Charge
= 10 V, ID = 1 A,
V
DD
= 4.5 V, R
V
GS
= 10 V, ID = 5.5 A,
V
DS
V
= 4.5 V
GS
GEN
= 6 Ω
8 16 ns
3 nC
SI6966DQ
Drain–Source Diode Characteristics and Maximum Ratings
IS Maximum Continuous Drain–Source Diode Forward Current 0.83 A
VSD Drain–Source Diode Forward
Voltage
Notes:
1. R
is the sum of the junction-to-case and case-to-ambient thermal resistance where the case thermal reference is defined as the solder mounting surface of
θJA
the drain pins. R
a) R
is 125°C/W (steady state) when mounted on a 1 inch² copper pad on FR-4.
θJA
b) R
is 208 °C/W (steady state) when mounted on a minimum copper pad on FR-4.
Figure 9. Maximum Safe Operating Area. Figure 10. Single Pulse Maximum
Power Dissipation.
1
D = 0.5
0.2
0.1
0.01
r(t), NORMALIZED EFFECTIVE
0.001
TRANSIENT THERMAL RESISTANCE
0.00010.0010.010.11101001000
0.1
0.05
0.02
0.01
SINGLE PULSE
t
, TIME (sec)
1
R
(t) = r(t) + R
θJA
R
= 208 °C/W
θJA
P(pk
t
1
t
2
- TA = P * R
T
J
Duty Cycle, D = t
θJA
(t)
θJA
/ t
1
2
Figure 11. Transient Thermal Response Curve.
Thermal characterization performed using the conditions described in Note 1b.
Transient thermal response will change depending on the circuit board design.
SI6966DQ Rev. A (W)
Page 5
TRADEMARKS
The following are registered and unregistered trademarks Fairchild Semiconductor owns or is authorized to use and is
not intended to be an exhaustive list of all such trademarks.
FAIRCHILD SEMICONDUCTOR RESERVES THE RIGHT TO MAKE CHANGES WITHOUT FURTHER
NOTICE TO ANY PRODUCTS HEREIN T O IMPROVE RELIABILITY , FUNCTION OR DESIGN. FAIRCHILD
DOES NOT ASSUME ANY LIABILITY ARISING OUT OF THE APPLICA TION OR USE OF ANY PRODUCT
OR CIRCUIT DESCRIBED HEREIN; NEITHER DOES IT CONVEY ANY LICENSE UNDER ITS PA TENT
RIGHTS, NOR THE RIGHTS OF OTHERS.
LIFE SUPPORT POLICY
FAIRCHILD’S PRODUCTS ARE NOT AUTHORIZED FOR USE AS CRITICAL COMPONENTS IN LIFE SUPPORT
DEVICES OR SYSTEMS WITHOUT THE EXPRESS WRITTEN APPROVAL OF FAIRCHILD SEMICONDUCTOR CORPORA TION.
As used herein:
1. Life support devices or systems are devices or
systems which, (a) are intended for surgical implant into
the body, or (b) support or sustain life, or (c) whose
failure to perform when properly used in accordance
with instructions for use provided in the labeling, can be
reasonably expected to result in significant injury to the
user.
2. A critical component is any component of a life
support device or system whose failure to perform can
be reasonably expected to cause the failure of the life
support device or system, or to affect its safety or
effectiveness.
PRODUCT STA TUS DEFINITIONS
Definition of Terms
Datasheet IdentificationProduct StatusDefinition
Advance Information
Preliminary
No Identification Needed
Obsolete
Formative or
In Design
First Production
Full Production
Not In Production
This datasheet contains the design specifications for
product development. Specifications may change in
any manner without notice.
This datasheet contains preliminary data, and
supplementary data will be published at a later date.
Fairchild Semiconductor reserves the right to make
changes at any time without notice in order to improve
design.
This datasheet contains final specifications. Fairchild
Semiconductor reserves the right to make changes at
any time without notice in order to improve design.
This datasheet contains specifications on a product
that has been discontinued by Fairchild semiconductor.
The datasheet is printed for reference information only.
Rev. H1
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