Notes
a. Pulse test; pulse width v
b. Guaranteed by design, not subject to production testing.
300 ms, duty cycle v2 %.
Stresses beyond those listed under “Absolute Maximum Ratings” may cause permanent damage to the device. These are stress ratings only, and functional operation
of the device at these or any other conditions beyond those indicated in the operational sections of the specifications is not implied. Exposure to absolute maximum
rating conditions for extended periods may affect device reliability.
TC = 25 C
I
= 0.05 A
S
20V
20
–2.8
mV/C
0.41.0V
5
0.4
0.12
0.650.85
35
4
335503
85
712
1015
813
712
0.18
0.4
0.71.2V
nA
mA
A
pF
pC
W
ns
A
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Document Number: 73557
S–52388—Rev. A, 21–Nov–05
Page 3
Si1300BDL
New Product
TYPICAL CHARACTERISTICS (25 C UNLESS NOTED)
1.25
1.00
0.75
0.50
– Drain Current (A)I
D
0.25
0.00
0.00.51.01.52.02.53.0
2.0
Output CharacteristicsTransfer Characteristics curves vs. Temp
VGS = 10 V thru 2.5 V
VGS = 2.0 V
VGS = 1.5 V
VGS = 1.0 V
VDS – Drain-to-Source Voltage (V)
On-Resistance vs. Drain Current
Vishay Siliconix
0.8
0.6
0.4
– Drain Current (A)I
D
0.2
0.0
0.00.51.01.52.02.5
50
TA = 25 C
TA = 125 C
TA = –55 C
VGS – Gate-to-Source Voltage (V)
Capacitance
W )
1.5
1.0
– On-Resistance (r
0.5
DS(on)
0.0
0.000.250.500.751.001.25
5
ID = 0.4 A
4
3
2
– Gate-to-Source Voltage (V)
GS
1
V
VGS = 2.5 V
VGS = 4.5 V
ID – Drain Current (A)
Qg–Gate Charge
VDS = 10 V
VDS = 16 V
40
30
20
C – Capacitance (pF)
10
0
048121620
On-Resistance vs. Junction Temperature
1.6
ID = 0.25 A
1.4
1.2
1.0
– On-Resistance
(Normalized)
DS(on)
r
0.8
C
iss
C
oss
C
rss
– Drain-Source Voltage (V)
V
DS
0
0150300450600
Qg – Total Gate Charge (nC)
Document Number: 73557
S–52388—Rev. A, 21–Nov–05
0.6
–50–250255075100125 150
T
– Junction Temperature (C)
J
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3
Page 4
Si1300BDL
Vishay Siliconix
New Product
TYPICAL CHARACTERISTICS (25 C UNLESS NOTED)
10.0
1.0
0.1
– Source Current (A)I
S
0.01
0.001
0.00.30.60.91.21.5
1.0
Forward Diode Voltage vs. Tempr
TJ = 150 C
TJ = 25 C
VSD – Source-to-Drain Voltage (V)VGS – Gate-to-Source Voltage (V)
*The power dissipation PD is based on T
cases where additional heatsinking is used. It is used to determine the current rating, when this rating falls below the package limit.
= 150 C, using junction-to-case thermal resistance, and is more useful in settling the upper dissipation limit for
J(max)
Vishay Siliconix maintains worldwide manufacturing capability. Products may be manufactured at one of several qualified locations. Reliability data for Silicon Technology and
Package Reliability represent a composite of all qualified locations. For related documents such as package/tape drawings, part marking, and reliability data, see
http://www.vishay.com/ppg?73557.
Document Number: 73557
S–52388—Rev. A, 21–Nov–05
www.vishay.com
5
Page 6
Legal Disclaimer Notice
Vishay
Notice
Specifications of the products displayed herein are subject to change without notice. Vishay Intertechnology, Inc.,
or anyone on its behalf, assumes no responsibility or liability for any errors or inaccuracies.
Information contained herein is intended to provide a product description only. No license, express or implied, by
estoppel or otherwise, to any intellectual property rights is granted by this document. Except as provided in Vishay's
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for a particular purpose, merchantability, or infringement of any patent, copyright, or other intellectual property right.
The products shown herein are not designed for use in medical, life-saving, or life-sustaining applications.
Customers using or selling these products for use in such applications do so at their own risk and agree to fully
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