Datasheet SGW10N60RUF Datasheet (Fairchild Semiconductor)

Page 1
©2002 Fairchild Semiconductor Corporation SGW10N60RUF Rev. A1
IGBT
SGW10N60RUF
G
E
C
D2-PAK
Short Circuit Rated IGBT
General Description
Fairchild's RUF series of Insulated Gate Bipolar Transistors (IGBTs) provide low conduction and switching losses as well as short circuit ruggedness. The RUF series is designed for applications such as motor control, uninterrupted power supplies (UPS) and general inv erters where short circuit ruggedness is a required feature.
Features
• Short circuit rated 10us @ TC = 100°C, VGE = 15V
• High speed switching
• Low saturation voltage : V
CE(sat)
= 2.2 V @ IC = 10A
• High input impedance
Absolute Maximum Ratings T
C
= 25°C unless otherwise noted
Notes :
(1) Repetitive rating : Pulse width limited by max. junction temperature
Thermal Characteristics
Notes :
(2) Mounted on 1” squre PCB (FR4 or G-10 Material)
Symbol Description SGW10N60RUF Units
V
CES
Collector-Emitter Voltage 600 V
V
GES
Gate-Emitter Voltage ± 20 V
I
C
Collector Current @ TC = 25°C16 A Collector Current @ T
C
= 100°C10 A
I
CM (1)
Pulsed Collector Current 30 A
T
SC
Short Circuit Withstand Time @ TC = 100°C10 us
P
D
Maximum Power Dissipation @ TC = 25°C75 W Maximum Power Dissipation @ T
C
= 100°C30 W
T
J
Operating Junction Temperature -55 to +150 °C
T
stg
Storage Temperature Range -55 to +150 °C
T
L
Maximum Lead Tem p. for Soldering Purposes, 1/8” from Case for 5 Seconds
300 °C
Symbol Parameter Typ. Max. Units
R
θJC
Thermal Resistance, Junction-to-Case -- 1.6 °C/W
R
θJA
Thermal Resistance, Junction-to-Ambient (PCB Mount)
(2)
-- 40 °C/W
Applications
AC & DC motor controls, general purpose inverters, robotics, and servo controls.
G
C
E
G
C
E
Page 2
SGW10N60RUF Rev. A1
SGW10N60RUF
©2002 Fairchild Semiconductor Corporation
Electrical Characteristics of the IGBT T
C
= 25°C unless otherwise noted
Symbol Parameter Test Conditions Min. Typ. Max. Units
Off Characteristics
BV
CES
Collector-Emitter Breakdown Voltage VGE = 0V, IC = 250uA 600 -- -- V
B
VCES
/
T
J
T emperature Coefficient of Breakdown Voltage
V
GE
= 0V, IC = 1mA -- 0.6 -- V/°C
I
CES
Collector Cut-Off Current VCE = V
CES
, VGE = 0V -- -- 250 uA
I
GES
G-E Leakage Current VGE = V
GES
, VCE = 0V -- -- ± 100 nA
On Characteristics
V
GE(th)
G-E Threshold Voltage IC = 10mA, VCE = V
GE
5.0 6.0 8.5 V
V
CE(sat)
Collector to Emitter Saturation Voltage
I
C
= 10A
,
VGE = 15V
-- 2.2 2.8 V
I
C
= 16A
,
VGE = 15V
-- 2.5 -- V
Dynamic Characteristics
C
ies
Input Capacitance
V
CE
= 30V, VGE = 0V,
f = 1MHz
-- 660 -- pF
C
oes
Output Capacitance -- 115 -- pF
C
res
Reverse Transfer Capacitance -- 25 -- pF
Switching Characteristics
t
d(on)
Turn-On Delay Time
V
CC
= 300 V, IC = 10A,
R
G
= 20, V
GE
= 15V,
Inductive Load, T
C
= 25°C
-- 15 -- ns
t
r
Rise Time -- 30 -- ns
t
d(off)
Turn-Off Delay Time -- 36 50 ns
t
f
Fall Time -- 158 200 ns
E
on
Turn-On Switching Loss -- 141 -- uJ
E
off
Turn-Off Switching Loss -- 215 -- uJ
E
ts
Total Switching Loss -- 356 500 uJ
t
d(on)
Turn-On Delay Time
V
CC
= 300 V, IC = 10A,
R
G
= 20, V
GE
= 15V,
Inductive Load, T
C
= 125°C
-- 16 -- ns
t
r
Rise Time -- 33 -- ns
t
d(off)
Turn-Off Delay Time -- 42 60 ns
t
f
Fall Time -- 242 350 ns
E
on
Turn-On Switching Loss -- 161 -- uJ
E
off
Turn-Off Switching Loss -- 452 -- uJ
E
ts
Total Switching Loss -- 613 860 uJ
T
sc
Short Circuit Withstand Time
VCC = 300 V, V
GE
= 15V
@
TC = 100°C
10 -- -- us
Q
g
Total Gate Charge
V
CE
= 300 V, IC = 10A,
V
GE
= 15V
-- 30 45 nC
Q
ge
Gate-Emitter Charge -- 5 10 nC
Q
gc
Gate-Collector Charge -- 8 16 nC
L
e
Internal Emitter Inductance Measured 5mm from PKG -- 7.5 -- nH
Page 3
SGW10N60RUF Rev. A1
SGW10N60RUF
©2002 Fairchild Semiconductor Corporation
Fig 1. Typical Output Characteristics Fig 2. Typical Saturation Voltage Characteristics
Fig 3. Saturation Voltage vs. Case Temp erature at Variant Current Level
Fig 4. Load Current vs. Frequ enc y
Fig 5. Satur ation Voltage vs. V
GE
Fig 6. Saturation Voltage vs. VGE
110
0
5
10
15
20
25
30
Common Emitter V
GE
= 15V
T
C
= 25℃
━━
T
C
= 125℃ ------
Collector Current, I
C
[A]
Collector - Emitter Voltage, VCE [V]
048121620
0
4
8
12
16
20
Common Emitter T
C
= 125
20A
10A
IC = 5A
Collector - Emitter Voltage, V
CE
[V]
Gate - Emitter Voltage, VGE [V]
0
2
4
6
8
10
12
14
16
0.1 1 10 100 1000
Duty cycle : 50% T
C
= 100
Power Dissipation = 18 W
VCC = 300V Load Current : peak of s qu a re w ave
Frequency [KHz]
Load Current [A]
02468
0
5
10
15
20
25
30
35
40
20V
12V
15V
VGE = 10V
Common Emitter TC = 25
Collector Cu rrent, I
C
[A]
Collector - Emitter Voltage, VCE [V]
-50 0 50 100 150
1.0
1.5
2.0
2.5
3.0
3.5
4.0
20A
10A
IC = 5A
Common Emitter V
GE
= 15V
Collector - Emitter Voltage, V
CE
[V]
Case Temperature, TC [℃]
048121620
0
4
8
12
16
20
Common Emitter T
C
= 25
20A
10A
IC = 5A
Collector - Emitter Voltage, V
CE
[V]
Gate - Emitter Voltage, VGE [V]
Page 4
SGW10N60RUF Rev. A1
SGW10N60RUF
©2002 Fairchild Semiconductor Corporation
Fig 7. Capaci tance Characterist i cs
Fig 8. Turn-On Characteristics vs. Gate Resistance
Fig 9. Turn-Off Characteristics vs. Gate Resistance
Fig 10. Switching Loss vs. Gate Resistance
Fig 11. Turn-O n Ch ar acteristics vs. Collector Current
Fig 12. Turn-Off Characteristics vs. Collector Current
110
0
200
400
600
800
1000
1200
1400
Cres
Coes
Cies
Common Emitter V
GE
= 0V, f = 1MHz
T
C
= 25
Capacitance [pF]
Collector - Emitter Voltage, VCE [V]
10 100
10
100
Common E mitter VCC = 300V, VGE = ±15V IC = 10A TC = 25℃
━━
TC = 125℃ ------
Ton
Tr
Switching Time [ns]
Gate Resistance, RG []
10 100
100
1000
Eoff
Eon
Eoff
Common Emitter V
CC
= 300V, VGE = ±15V
I
C
= 10A
T
C
= 25℃
━━
T
C
= 125℃ ------
Switching Loss [uJ]
Gate Resistance, RG []
10 100
100
1000
Toff
Tf
Toff
Tf
Common Emitter V
CC
= 300V, VGE = ±15V
I
C
= 10A
T
C
= 25℃
━━
T
C
= 125℃ ------
Switching Time [ns]
Gate Resistance, RG []
6 8 10 12 14 16 18 20
10
100
Ton
Tr
Common Emitter V
GE
= ±15V, RG = 20
TC = 25℃
━━
T
C
= 125℃ ------
Switching Time [ns]
Collector Current, IC [A]
6 8 10 12 14 16 18 20
100
1000
Tf
Toff
Toff
Tf
Common Emitter V
GE
= ±15V, RG = 20
TC = 25℃
━━
T
C
= 125℃ ------
Switching Time [ns]
Collector Current, IC [A]
Page 5
SGW10N60RUF Rev. A1
SGW10N60RUF
©2002 Fairchild Semiconductor Corporation
Fig 14. Gate Charge Characteristics
Fig 15. SOA Characteristics
Fig 16. Turn-Off SOA Characteristics
Fig 17. Transient Thermal Impedance of IGBT
Fig 13. Switching Loss vs. Collector Current
0102030
0
3
6
9
12
15
VCC = 100 V
200 V
300 V
Common Emitter RL = 30
TC = 25
Gate - Emitter Voltage, V
GE
[ V ]
Gate Charge, Qg [ nC ]
1 10 100 1000
1
10
Safe Operating Area VGE = 20V, TC = 100
50
Collector Current, I
C
[A]
Collector-Emitter Voltage, VCE [V]
5101520
100
1000
Eon
Eoff
Common Emitter V
GE
= ±15V, RG = 20
TC = 25℃
━━
T
C
= 125℃ ------
Switchi n g Lo ss [uJ]
Collector Current, IC [A]
0.1 1 10 100 1000
0.1
1
10
100
Single Nonrepetitive Pulse T
C
= 25
Curves must be derated linearly with increase in temperat ur e
IC MAX. (Continuous)
IC MAX. (Pulsed)
DC Operation
1
100us
50us
Collector Cur r ent, I
C
[A]
Collector-Emitter Voltage, VCE [V]
10
-5
10
-4
10
-3
10
-2
10
-1
10
0
10
1
0.01
0.1
1
10
0.5
0.2
0.1
0.05
0.02
0.01
single pulse
Thermal Response, Zthjc [
/W]
Rectangular Pulse Duration [sec]
Pdm
t1
t2
Duty fac to r D = t1 / t2 Peak Tj = Pdm
×
Zthjc + T
C
Page 6
©2002 Fairchild Semiconductor Corporation SGW10N60RUF Rev. A1
SGW10N60RUF
Package Dimension
10.00 ±0.20
10.00 ±0.20 (8.00) (4.40)
1.27
±0.10
0.80 ±0.10
0.80 ±0.10
(2XR0.45)
9.90
±0.20
4.50 ±0.20
0.10 ±0.15
2.40 ±0.20
2.54 ±0.30
15.30 ±0.30
9.20 ±0.20
4.90 ±0.20
1.40 ±0.20
2.00 ±0.10
(0.75)
(1.75)
(7.20)
0°~3°
1.20 ±0.20
9.20 ±0.20
15.30 ±0.30
4.90 ±0.20
(0.40)
2.54 TYP 2.54 TYP
1.30
+0.10 –0.05
0.50
+0.10 –0.05
D2-PAK
Dimensions in Millimeters
Page 7
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FAIRCHILD’S PRODUCTS ARE NOT AUTHORIZED FOR USE AS CRITICAL COMPONENTS IN LIFE SUPPORT DEVICES OR SYSTEMS WITHOUT THE EXPRESS WRITTEN APPROVAL OF FAIRCHILD SEMICONDUCTOR CORPORATION. As used herein:
1. Life support devices or systems are devices or systems which, (a) are intended for surgical implant into the body, or (b) support or sustain life, or (c) whose failure to perform when properly used in accordance with instructions for use provided in the labeling, can be reasonably expected to result in significant injury to the user.
2. A critical component is any component of a life support device or system whose failure to perform can be reasonably expected to cause the failure of the life support device or system, or to affect its safety or effectiveness.
PRODUCT STATUS DEFINITIONS Definition of Terms
Datasheet Identification Product Status Definition
Advance Information Formative or In
Design
This datasheet contains the design specifications for product development. Specifications may change in any manner without notice.
Preliminary First Production This datasheet contains preliminary data, and
supplementary data will be published at a later date. Fairchild Semiconductor reserves the right to make changes at any time without notice in order to improve design.
No Identification Needed Full Production This datasheet contains final specifications. Fairchild
Semiconductor reserves the right to make changes at any time without notice in order to improve design.
Obsolete Not In Production This datasheet contains specifications on a product
that has been discontinued by Fairchild semiconductor. The datasheet is printed for reference information only.
Rev. H5©2002 Fairchild Semiconductor Corporation
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