The Philips Semiconductors SCN2681 Dual Universal
Asynchronous Receiver/Transmitter (DUART) is a single-chip
MOS-LSI communications device that provides two independent
full-duplex asynchronous receiver/transmitter channels in a single
package. The SCN2681T features a faster bus cycle time than the
standard SCN2681. The quick bus cycle eliminates or reduces the
need for wait states with fast CPUs and permits high throughput in
I/O intensive systems. Higher external clock rates may be used with
the transmitter, receiver and counter timer which in turn provide
greater versatility in baud rate generation. The SCN2681T
interfaces directly with microprocessors and may be used in a polled
or interrupt driven system.
The operating mode and data format of each channel can be
programmed independently. Additionally, each receiver and
transmitter can select its operating speed as one of eighteen fixed
baud rates, a 16X clock derived from a programmable counter/timer,
or an external 1X or 16X clock. The baud rate generator and
counter/timer can operate directly from a crystal or from external
clock inputs. The ability to independently program the operating
speed of the receiver and transmitter make the DUART particularly
attractive for dual-speed channel applications such as clustered
terminal systems.
Each receiver is quadruple buffered to minimize the potential of
receiver over-run or to reduce interrupt overhead in interrupt driven
systems. In addition, a flow control capability is provided to disable
a remote DUART transmitter when the receiver buffer is full.
Also provided on the SCN2681T are a multipurpose 7-bit input port
and a multipurpose 8-bit output port. These can be used as general
purpose I/O ports or can be assigned specific functions (such as
clock inputs or status/interrupt outputs) under program control.
For a complete functional description and programming information
for the SCN2681T, refer to the SCN2681 product specification.
FEA TURES
•Fast bus cycle times reduce or eliminate CPU wait states
D0–D7I/OData Bus: Bidirectional three-state data bus used to transfer commands, data and status between the DUART and
CENIChip Enable: Active low input signal. When low, data transfers between the CPU and the DUART are enabled on
WRNIWrite Strobe: When low and CEN is also low, the contents of the data bus is loaded into the addressed register. The
RDNIRead Strobe: When low and CEN is also low , causes the contents of the addressed register to be presented on the
A0–A3IAddress Inputs: Select the DUART internal registers and ports for read/write operations.
RESETIReset: A high level clears internal registers (SRA, SRB, IMR, ISR, OPR, OPCR), puts OP0–OP7 in the high state,
INTRNOInterrupt Request: Active-low, open-drain output which signals the CPU that one or more of the eight maskable
X1/CLKICrystal 1: Crystal connection or an external clock input. A crystal of a clock the appropriate frequency (nominally
X2ICrystal 2: Crystal connection. See Figure 7. If a crystal is not used it is best to keep this pin not connected although it
RxDAIChannel A Receiver Serial Data Input: The least significant bit is received first. ‘Mark’ is high, ‘space’ is low.
RxDBIChannel B Receiver Serial Data Input: The least significant bit is received first. ‘Mark’ is high, ‘space’ is low.
TxDAOChannel A Transmitter Serial Data Output: The least significant bit is transmitted first. This output is held in the ‘mark’
TxDBOChannel B Transmitter Serial Data Output: The least significant bit is transmitted first. This output is held in the
OP0OOutput 0: General purpose output, or channel A request to send (RTSAN, active-low). Can be deactivated
OP1OOutput 1: General purpose output, or channel B request to send (RTSBN, active-low). Can be deactivated
OP2OOutput 2: General purpose output, or channel A transmitter 1X or 16X clock output, or channel A receiver 1X clock output.
OP3OOutput 3: General purpose output, or open-drain, active-low counter/timer output, or channel B transmitter 1X clock
OP4OOutput 4: General purpose output, or channel A open-drain, active-low, RxRDYA/FFULLA output.
OP5OOutput 5: General purpose output, or channel B open-drain, active-low, RxRDYB/FFULLB output.
OP6OOutput 6: General purpose output, or channel A open-drain, active-low, TxRDYA output.
OP7OOutput 7: General purpose output, or channel B open-drain, active-low TxRDYB output.
IP0IInput 0: General purpose input, or channel A clear to send active-low input (CTSAN). Pin has an internal VCC pull-up
IP1IInput 1: General purpose input, or channel B clear to send active-low input (CTSBN). Pin has an internal VCC pull-up
IP2IInput 2: General purpose input, or counter/timer external clock input. Pin has an internal VCC pull-up device supplying
IP3IInput 3: General purpose input, or channel A transmitter external clock input (TxCA). When the external clock is used
IP4IInput 4: General purpose input, or channel A receiver external clock input (RxCA). When the external clock is used by
IP5IInput 5: General purpose input, or channel B transmitter external clock input (TxCB). When the external clock is used
IP6IInput 6: General purpose input, or channel B receiver external clock input (RxCB). When the external clock is used by
V
CC
GNDIGround
the CPU. D0 is the least significant bit.
D0–D7 as controlled by the WRN, RDN, and A0–A3 inputs. When CEN is high, the DUART places the D0–D7 lines in
the three-state condition.
transfer occurs on the rising edge of the signal.
data bus. The read cycle begins on the falling edge of RDN.
stops the counter/timer, and puts channels A and B in the inactive state, with the TxDA and TxDB outputs in the mark
(high) state. Clears Test modes, sets MR pointer to MR1.
interrupting conditions are true.
3.6864 MHz) must be supplied at all times. For crystal connections see Figure 7, Clock Timing.
is permissible to ground it.
condition when the transmitter is disabled, idle, or when operating in local loopback mode. ‘Mark’ is high, ‘space’ is low.
‘mark’ condition when the transmitter is disabled, idle, or when operating in local loopback mode. ‘Mark’ is high,
‘space’ is low.
automatically on receive or transmit.
automatically on receive or transmit.
output, or channel B receiver 1X clock output.
device supplying 1 to 4 A of current.
device supplying 1 to 4 A of current.
1 to 4 A of current.
by the transmitter, the transmitted data is clocked on the falling edge of the clock. Pin has an internal VCC pull-up
device supplying 1 to 4 A of current.
the receiver, the received data is sampled on the rising edge of the clock. Pin has an internal VCC pull-up device
supplying 1 to 4 A of current.
by the transmitter, the transmitted data is clocked on the falling edge of the clock. Pin has an internal VCC pull-up
device supplying 1 to 4 A of current.
the receiver, the received data is sampled on the rising edge of the clock. Pin has an internal VCC pull-up device
supplying 1 to 4 A of current.
Operating ambient temperature range
Storage temperature range-65 to +150°C
All voltages with respect to GND
1
PARAMETERRATINGUNIT
2
3
0 to +70°C
-0.5 to +6.0V
NOTES:
1. Stresses above those listed under Absolute Maximum Ratings may cause permanent damage to the device. This is a stress rating only and
functional operation of the device at these or any other conditions above those indicated in the operation section of this specification is not
implied.
2. For operating at elevated temperatures, the device must be derated based on +150°C maximum junction temperature.
3. This product includes circuitry specifically designed for the protection of its internal devices from damaging effects of excessive static
charge. Nonetheless, it is suggested that conventional precautions be taken to avoid applying any voltages larger than the rated maxima.
DC ELECTRICAL CHARACTERISTICS
1, 2, 3
LIMITS
MinTypMax
V
V
V
V
V
I
IL
I
LL
I
X1L
I
X1H
I
X2L
I
X2H
I
OC
I
CC
IL
IH
IH
OL
OH
Input low voltage0.8
Input high voltage (except X1/CLK)2.0V
Input high voltage (X1/CLK)3.5
Output low voltageIOL = 2.4mA0.4
Output high voltage (except o.c. outputs)
Input leakage currentVIN = 0 to V
Data bus 3-state leakage currentVO = 0.4 to V
mA
X2 low input currentVIN = 0, X1/CLK floated-100-300µA
X2 high input currentVIN = VCC, X1/CLK floated0+30100µA
Open-collector output leakage currentVO = 0.4 to V
Power supply current
5
CC
-1010µA
150 mA
NOTES:
1. Parameters are valid over specified temperature range. See Ordering information table for applicable operating temperature range and V
supply range.
CC
2. All voltage measurements are referenced to ground (GND). For testing, all inputs except X1/CLK swing between 0.4V and 2.4V with a
transition time of 20ns maximum. For X1/CLK this swing is between 0.4V and 4.0V . All time measurements are referenced at inpu t voltages
of 0.8V and 2.0V and output voltages of 0.8V and 2.0V as appropriate.
3. Typical values are at +25°C, typical supply voltages, and typical processing parameters.
4. Test conditions for outputs: C
5. For bus operations, CEN and RDN (also CEN and WRN) are ANDed internally. As a consequence, the signal asserted last initiates the cycle
= 150pF, except interrupt outputs. T est conditions for interrupt outputs: CL = 50pF, RL = 2.7kΩ to VCC.
L
and the signal negated first terminates the cycle.
AC ELECTRICAL CHARACTERISTICS
RESET
1, 2, 3, 4
t
RES
SD00028
Figure 3. Reset Timing
NOTES:
1. Parameters are valid over specified temperature range. See Ordering information table for applicable operating temperature range and V
supply range.
2. All voltage measurements are referenced to ground (GND). For testing, all inputs except X1/CLK swing between 0.4V and 2.4V with a
transition time of 20ns maximum. For X1/CLK this swing is between 0.4V and 4.0V . All time measurements are referenced at inpu t voltages
of 0.8V and 2.0V and output voltages of 0.8V and 2.0V as appropriate.
3. Typical values are at +25°C, typical supply voltages, and typical processing parameters.
4. Test conditions for outputs: C
1998 Sep 04
= 150pF, except interrupt outputs. T est conditions for interrupt outputs: CL = 50pF, RL = 2.7kΩ to VCC.
A0–A3 setup to RDN and CEN, or WRN and CEN low0ns
RDN and CEN, or WRN and CEN low to A0–A3 invalid100ns
RDN and CEN low to RDN or CEN high120ns
CEN high to CEN low
2, 3
110ns
CEN and RDN low to data outputs active15ns
CEN and RDN low to data valid100ns
CEN or RDN high to data invalid10ns
CEN or RDN high to data outputs floating65ns
WRN and CEN low to WRN or CEN high75ns
Data input valid to WRN or CEN high35ns
WRN or CEN high to data invalid15ns
NOTES:
1. For bus operations, CEN and RDN (also CEN and WRN) are ANDed internally. As a consequence, the signal asserted last initiates the cycle
and the signal negated first terminates the cycle.
2. If CEN is used as the ‘strobing’ input, the parameter defines the minimum high times between one CEN and the next. The RDN signal must
be negated for t
RDN input even if the CEN is used as the strobing signal for bus operations.
to guarantee that any status register changes are valid. As a consequence, this minimum time must be met for the
EHEL
3. Consecutive write operations to the same command register require at least three edges of the X1 clock between writes.
Port input setup time before RDN low0ns
Port input hold time after RDN high0ns
Port output valid after WRN high200ns
NOTE:
1. For bus operations, CEN and RDN (also CEN and WRN) are ANDed internally. As a consequence, the signal asserted last initiates the cycle
and the signal negated first terminates the cycle.
V
WRN
M
t
INTERRUPT
NOTES:
1. INTRN or OP3-OP7 when used as interrupt outputs.
2. The test for open drain outputs is intended to guarantee switching of the output transistor. Measurement of this response is referenced from the midpoint of the switching
, to a point 0.5V above VOL. This point represents noise margin that assures true switching has occurred. Beyond this level, the effects of external circuitry and
signal, V
M
test environment are pronounced and can greatly affect the resultant measurement.
1
OUTPUT
IR
V
+0.5V
OL
V
OL
SD00102
Figure 6. Interrupt Timing
LIMITS
MinMax
INTRN (or OP3–OP7 when used as interrupts) negated from:
When using an external clock it is preferred to drive X2 and leave X1 open.
X2 is the input to the internal driver, while X1 is the output.
R1 is only required if U1 will not drive to X2 high level.
Previous specifications indicated X2 should be grounded and X1
should be driven. This is still acceptable. It is electrically easier to drive
the amplifier input than to overdrive its output.
Tx
t
CLK
t
CTC
t
Rx
t
Tx
DRIVING FROM
EXTERNAL SOURCE
U1
Figure 7. Clock Timing
X1/CLK high or low time90ns
t
CLK
f
CLK
t
CTC
f
CTC
t
RX
f
RX
t
TX
f
TX
X1/CLK frequency24MHz
CTCLK (IP2) high or low time55ns
CTCLK (IP2) frequency
1
RxC high or low time55ns
RxC frequency (16X)
(1X)
1
1
TxC high or low time110ns
TxC frequency (16X)
(1X)
1
1
NOTE:
1. Minimum frequencies are not tested but are guaranteed by design.
This data sheet contains the design target or goal specifications for product development.
Specification may change in any manner without notice.
This data sheet contains preliminary data, and supplementary data will be published at a later date.
Philips Semiconductors reserves the right to make chages at any time without notice in order to
improve design and supply the best possible product.
This data sheet contains final specifications. Philips Semiconductors reserves the right to make
changes at any time without notice in order to improve design and supply the best possible product.
[1]
[1] Please consult the most recently issued datasheet before initiating or completing a design.
Definitions
Short-form specification — The data in a short-form specification is extracted from a full data sheet with the same type number and title. For
detailed information see the relevant data sheet or data handbook.
Limiting values definition — Limiting values given are in accordance with the Absolute Maximum Rating System (IEC 134). Stress above one
or more of the limiting values may cause permanent damage to the device. These are stress ratings only and operation of the device at these or
at any other conditions above those given in the Characteristics sections of the specification is not implied. Exposure to limiting values for extended
periods may affect device reliability.
Application information — Applications that are described herein for any of these products are for illustrative purposes only. Philips
Semiconductors make no representation or warranty that such applications will be suitable for the specified use without further testing or
modification.
Disclaimers
Life support — These products are not designed for use in life support appliances, devices or systems where malfunction of these products can
reasonably be expected to result in personal injury . Philips Semiconductors customers using or selling these products for use in such applications
do so at their own risk and agree to fully indemnify Philips Semiconductors for any damages resulting from such application.
Right to make changes — Philips Semiconductors reserves the right to make changes, without notice, in the products, including circuits, standard
cells, and/or software, described or contained herein in order to improve design and/or performance. Philips Semiconductors assumes no
responsibility or liability for the use of any of these products, conveys no license or title under any patent, copyright, or mask work right to these
products, and makes no representations or warranties that these products are free from patent, copyright, or mask work right infringement, unless
otherwise specified.
Philips Semiconductors
811 East Arques Avenue
P.O. Box 3409
Sunnyvale, California 94088–3409
Telephone 800-234-7381
Copyright Philips Electronics North America Corporation 1998
All rights reserved. Printed in U.S.A.
Date of release: 09-98
Document order number:9397 750 04363
1998 Sep 04
14
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