0.3A, 60V, 6 Ohm, ESD Rated, Current
Limited, Voltage Clamped, Logic Level
N-Channel Power MOSFETs
These are intelligent monolithic power circuits which
incorporate a lateral bipolar transistor, resistors, zener
diodes and a power MOS transistor. The current limiting of
these devices allow it to be used safely in circuits where a
shorted load condition may be encountered. The drain to
source voltage clamping offersprecisioncontrolofthecircuit
voltage when switching inductive loads. The “Logic Level”
gate allows this device to be fully biased on with only 5V
from gate to source, thereby facilitating true on-off power
control directly from logic level (5V) integrated circuits.
These devicesincorporate ESD protection andaredesigned
to withstand 2kV (Human Body Model) of ESD.
CAUTION: Stresses above those listed in “Absolute Maximum Ratings” may cause permanent damage to the device. This is a stress only rating and operationofthe
device at these or any other conditions above those indicated in the operational sections of this specification is not implied.
L
pkg
60V
60V
+5.5V
Self Limited
30
0.2
-55 to 175
300
260
W
W/oC
o
C
o
C
o
C
NOTE:
1. TJ= 25oC to 150oC.
Electrical SpecificationsT
= 25oC, Unless Otherwise Specified
C
PARAMETERSYMBOLTEST CONDITIONSMINTYPMAXUNITS
Drain to Source Breakdown VoltageBV
Gate Threshold VoltageV
Zero Gate Voltage Drain CurrentI
Gate to Source Leakage CurrentI
DSSID
GS(TH)VGS
DSS
GSS
= 250µA, VGS = 0V60-85V
= VDS, ID = 250µA1-2.5V
VDS = 45V,
VGS = 0V
TJ = 25oC--25µA
TJ = 150oC--250µA
VGS = 5VTJ = 25oC--5µA
TJ = 150oC--20µA
Drain to Source On Resistance (Note 2)r
Limiting CurrentI
DS(ON)ID
DS(LIMIT)VDS
Turn-On Timet
Turn-On Delay Timet
d(ON)
Rise Timet
Turn-Off Delay Timet
d(OFF)
Fall Timet
Turn-Off Timet
Input CapacitanceC
Output CapacitanceC
Reverse Transfer CapacitanceC
Thermal Resistance Junction to CaseR
Thermal Resistance Junction to AmbientR
PULSE TEST
PULSE DURATION = 80µs
DUTY CYCLE = 0.5% MAX
0
023451
, GATE TO SOURCE VOLTAGE (V)
V
GS
FIGURE 6. TRANSFER CHARACTERISTICSFIGURE 7. NORMALIZEDDRAIN TOSOURCE ON
2.0
1.5
VGS= VDS,
I
= 250µA
D
Unless Otherwise Specified (Continued)
-55oC
25oC
175
o
C
2.5
2.0
1.5
1.0
ON RESISTANCE
0.5
NORMALIZED DRAIN TO SOURCE
0
-80-4004080120160200
2.0
1.5
PULSE DURATION = 80µs
DUTY CYCLE = 0.5% MAX
V
ID = 0.10A
= 5V,
GS
TJ, JUNCTION TEMPERATURE (oC)
RESISTANCE vs JUNCTION TEMPERATURE
ID = 10mA
1.0
NORMALIZED GATE
0.5
THRESHOLD VOLTAGE
0
-80-4004080120200160
TJ, JUNCTION TEMPERATURE (oC)
FIGURE 8. NORMALIZEDGATETHRESHOLD VOLTAGE vs
JUNCTION TEMPERATURE
300
200
100
C, CAPACITANCE (pF)
0
0510152025
VDS, DRAIN TO SOURCE VOLTAGE (V)
VGS = 0V, f = 1MHz
= CGS + C
C
C
C
ISS
RSS
OSS
C
C
C
OSS
RSS
= C
≈ CDS + C
ISS
GD
GD
GD
1.0
0.5
NORMALIZED DRAIN TO
SOURCE BREAKDOWN VOLTAGE
0
-80-4004080120160200
TJ, JUNCTION TEMPERATURE (oC)
FIGURE 9. NORMALIZEDDRAIN TOSOURCE BREAKDOWN
VOLTAGE vs TEMPERATURE
2.0
1.5
1.0
0.5
0
NORMALIZED DRAIN LIMITING CURRENT
-80-4004080120160200
TJ, JUNCTION TEMPERATURE (oC)
VGS = 5V
PULSE DURATION = 80µs
DUTY CYCLE = 0.5% MAX.
FIGURE 10. CAPACITANCE vs DRAIN TO SOURCE VOLTAGEFIGURE 11. NORMALIZEDDRAIN LIMITING CURRENTvs
JUNCTION TEMPERATURE
6-421
RLD03N06CLE, RLD03N06CLESM, RLP03N06CLE
Typical Performance Curves
60
45
30
15
, DRAIN SOURCE VOLTAGE (V)
DS
V
NOTE: Refer to Intersil Application Notes AN7254 and AN7260.
FIGURE 12. NORMALIZED SWITCHING WAVEFORMS FOR CONSTANT GATE CURRENT.
Test Circuits and Waveforms
V
Unless Otherwise Specified (Continued)
0
DD
R
L
I
G REF()
--------------------- -
10
I
G ACT()
VDD = BV
0.75 BV
0.50 BV
0.25 BV
t, TIME (µs)
V
DS
DSS
DSS
DSS
DSS
40
V
DS
RL = 600Ω
I
= 0.1mA
G(REF)
V
= 5V
GS
I
G REF()
--------------------- -
I
G ACT()
t
d(ON)
90%
5.00
3.75
2.50
1.25
, GATE SOURCE VOLTAGE (V)
GS
V
0.00
t
ON
t
r
t
d(OFF)
t
OFF
t
f
90%
V
0V
GS
DUT
V
R
GS
GS
10%
10%
PULSE WIDTH
FIGURE 13. RESISTIVE SWITCHING TEST CIRCUITFIGURE 14. RESISTIVE SWITCHING WAVEFORMS
Detailed Description
Temperature Dependence of Current Limiting and
Switching Speed Performance
The RLD03N06CLE, CLESM and RLP03N06CLE are
monolithic power deviceswhich incorporateaLogicLev elpower
MOSFET transistor with a current sensing scheme and control
circuitry to enable the device to self limit the drain source current
flow . The current sensing scheme supplies current to a resistor
thatisconnected across thebase to emitter ofa bipolar transistor
in the control section. The collector of this bipolar transistor is
connected to the gate of the power MOSFET transistor . When
the ratiometric current from the current sensing reaches the
value required to forward bias the base emitter junction of this
bipolar transistor ,the bipolar “turns on”. A resistor isincorporated
in series with the gate of the power MOSFET transistor allowing
the bipolar transistor to adjust the drive on the gate of the power
MOSFET transistortoa voltage which then maintains a constant
current in the power MOSFET transistor . Since both the
ratiometric current sensing schemeandthebase emitter unction
voltageof the bipolartransistorvary with temperature,the current
at which the device limits is a function of temperature. This
dependence is shown in Figure 3.
The resistor in series with the gate of the power MOSFET
transistor also results in much slower switching performance
than in standard power MOSFET transistors. This is an
advantage where fast switching can cause EMI or RFI. The
switching speed is very predictable.
DC Operation
The limit on the drain to source voltage for operation in
current limiting on a steady state (DC) basis is shown in the
equation below. The dissipation in the device is simply the
applied drain to source voltage multiplied by the limiting
current. This device, like most power MOSFET devices
today, is limited to 175
can, therefore, be expressed as shown in Equation 1:
The results of this equation are plotted in Figure 15 for various
heatsinks.
Duty Cycle Operation
In many applications either the drain to source voltage or the
gate drive isnotav ailab le100% of the time. The copper header
on which the RLD03N06CLE, CLESM and RLP03N06CLE is
mounted has a very large thermal storage capability , so f or
pulse widths of less then 1ms, the temperature of the header
can beconsidereda constant, thereby thejunctiontemperature
can be calculated simply as shown in Equation 2:
T
VDSID•D•R
C
•()T
θCA
+=
AMBIENT
(EQ.2)
Generally the heat storage capability of the silicon chip in a
power transistor is ignored for duty cycle calculations . Making
this assumption, limiting junction temperature to 175
using the T
ximum V
:
V
DS
calculated in Equation 2, the expression for ma-
C
under duty cycle operation is shown in Equation 3
DS
o
150 C TC–
----------------------------------------- -=
I
DR
••
LM
θJC
o
C and
(EQ.3)
Typical Performance Curves
90
75
HSTR = 5oC/W
60
HSTR = 10oC/W
45
HSTR = 0oC/W
HSTR = 1
HSTR = 2oC/W
TJ = 175oC
I
R
= 0.210A
LIM
JC
θ
o
C/W
= 5.0oC/W
These values are plotted as Figures 16 through 21 for various heatsink thermal resistances.
Limited Time Operations
Protection for a limited period of time is sufficient for many
applications. As stated above the heat storage in the silicon
chip can usually be ignored for computations of over 10 ms ,
thereby the thermal equivalent circuit reduces to a simple
enough circuit to allow easy computation on the limiting
conditions. The variation in limiting current with temperature
complicates the calculation of junction temperature, but a
simple straight line approximation of the variation is accurate
enough to allow meaningful computations. The curves shown
as Figures 22 through 25 (RLP03N06CLE) and Figure 26
through 29 (RLD03N06CLE and RLD03N06CLESM) give an
accurate indication of how long the specified voltage can be
applied to the device in the current limiting mode without
exceedingthe maximum specified 175
In practice this tells you how long you ha v e to alleviate the
condition causing the current limiting to occur.
90
DC = 50%
75
60
45
o
C junctiontemperature.
DC = 20%
DC = 2%
DC = 5%
DC = 10%
30
, APPLIED VOLTAGE (V)
HSTR = 25oC/W
DS
V
15
HSTR = 80oC/W
0
255075100125150175
, AMBIENT TEMPERATURE (oC)
T
A
NOTE: Heat Sink Thermal Resistance = HSTR.
FIGURE 15. DC OPERATION IN CURRENT LIMITING
90
75
DC = 50%
60
45
30
TJ = 175oC
= 0.210A
I
, DRAIN TO SOURCE VOLTAGE (V)
DS
V
LIM
15
R
= 5.0oC/W
JC
θ
DUTY CYCLE = DC MAX PULSE WIDTH = 100ms
0
100125150175
T
, AMBIENT TEMPERATURE (oC)
A
DC = 20%
DC = 2%
DC = 5%
DC = 10%
FIGURE 17. MAXIMUMVDSvs AMBIENT TEMPERATURE IN
CURRENT LIMITING. (HSTR = 2oC/W)
30
TJ = 175oC
I
= 0.210A
, DRAIN TO SOURCE VOLTAGE (V)
15
DS
V
0
100125150175
LIM
= 5.0oC/W
R
JC
θ
DUTY CYCLE = DC MAX PULSE WIDTH = 100ms
T
, AMBIENT TEMPERATURE (oC)
A
FIGURE 16. MAXIMUM VDS vs AMBIENT TEMPERATURE IN
CURRENT LIMITING. (HEATSINK THERMAL
RESISTANCE = 1oC/W)
.ENDS
NOTE: For further discussion of the PSPICE model consult A New PSPICE Sub-Circuit for the Power MOSFET Featuring Global
Temperature Options; IEEE Power Electronics Specialist Conference Records 1991.
+
6
C
16
IN
8
+
5
RDRAIN
21
MOS1
RSOURCE1
14
5
8
MOS2
RSOURCE2
70
LDRAIN
DBODY
LSOURCE
7
RBREAK
17
IT
DRAIN
2
3
SOURCE
18
RVTO
19
VBAT
+
All Intersil semiconductor products are manufactured, assembled and tested under ISO9000 quality systems certification.
Intersil semiconductor products are sold by description only .Intersil Corporation reserves the right to makechanges in circuit design and/or specifications at any time without notice. Accordingly, the reader is cautioned to verify that data sheets are current before placing orders. Information furnished by Intersil is believed to be accurate and
reliable. Howe ver, no responsibility is assumed by Intersil or its subsidiaries for its use; nor for any infringements of patents or other rights of third parties which may result
from its use. No license is granted by implication or otherwise under any patent or patent rights of Intersil or its subsidiaries.
For information regarding Intersil Corporation and its products, see web site http://www.intersil.com
6-426
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