These are N-Channel power MOSFET’S manufactured
using the MegaFET process. This process, which uses
feature sizes approaching those of LSI integrated circuits,
gives optimum utilization of silicon, resulting in outstanding
performance. They were designed for use in applications
such as switching regulators, switching converters, motor
drivers, relay drivers and emitter switches for bipolar
transistors.
Formerly developmental type TA09772.
Ordering Information
PART NUMBERPACKAGEBRAND
RFG50N05TO-247RFG50N05
RFP50N05TO-220ABRFP50N05
NOTE: When ordering, include the entire part number.
Features
• 50A, 50V
DS(ON)
= 0.022Ω
•r
• UIS Rating Curve (Single Pulse)
o
C Operating Temperature
• 175
Symbol
D
G
S
2873.3
Packaging
DRAIN
(BOTTOM
SIDE METAL)
JEDEC STYLE TO-247JEDEC TO-220AB
SOURCE
DRAIN
GATE
DRAIN
(FLANGE)
SOURCE
DRAIN
GATE
4-462
CAUTION: These devices are sensitive to electrostatic discharge; follow proper ESD Handling Procedures.
CAUTION: Stresses above those listed in “Absolute Maximum Ratings” may cause permanent damage to the device. This is a stress only rating and operationofthe
device at these or any other conditions above those indicated in the operational sections of this specification is not implied.
L
pkg
Refer to UIS SOA Curve
-55 to 175
300
260
o
C
o
C
o
C
NOTE:
1. TJ= 25oC to 150oC.
Electrical SpecificationsT
= 25oC, Unless Otherwise Specified
C
PARAMETERSYMBOLTEST CONDITIONSMINTYPMAXUNITS
Drain to Source Breakdown VoltageBV
Gate Threshold VoltageV
Zero Gate Voltage Drain CurrentI
DSSID
GS(TH)VDS
DSS
Zero Gate Voltage Drain Current,VDS = 0.8 x Rated BV
Gate to Source Leakage CurrentI
Drain to Source On Resistance (Note 2)r
Turn-On Timet
Turn-On Delay Timet
Rise Timet
Turn-Off Delay Timet
Fall Timet
Turn-Off Timet
Total Gate ChargeQ
Gate Charge at 10VQ
Threshold Gate ChargeQ
Thermal Resistance Junction to CaseR
Thermal Resistance Junction to AmbientR
GSS
DS(ON)ID
(ON)
d(ON)
r
d(OFF)
f
(OFF)
g(tot)VGS
g(10)VGS
g(th)
θJC
θJA
= 0.250µA, VGS = 0V (Figure 9)50--V
= VGS, ID = 0.250µA (Figure 8)2.0-4.0V
VDS = Rated BV
, VGS = 0V--1A
DSS
, VGS = 0V, TJ = 150oC- -25µA
DSS
VGS = ±20V--±100nA
= 50A, VGS = 10V (Figure 7)--0.022Ω
VDD = 25V, I
RGS = 6.67Ω, VGS = 10V
(Figure 11)
≈ 25A, R
D
= 1.0Ω,
L
--100ns
-15- ns
-55- ns
-60- ns
-15- ns
--100ns
= 0-20VVDD - 40V, ID = 50A
= 0-10V--80nC
RL = 0.8Ω, I
(Figure 11)
G(REF)
= 1.5mA
--160nC
VGS = 0-2V--6nC
--1.14oC/W
TO-220--62
TO-24730
o
o
C/W
C/W
Source to Drain Diode Specifications
PARAMETERSYMBOLTEST CONDITIONSMINTYPMAXUNITS
Source to Drain Diode Voltage (Note 2)V
Diode Reverse Recovery Timet
FIGURE 5. SATURATION CHARACTERISTICSFIGURE 6. TRANSFER CHARACTERISTICS
4-464
Page 4
RFG50N05, RFP50N05
Typical Performance Curves
3
PULSE DURATION = 80µs
DUTY CYCLE = 0.5% MAX
VGS = 10V, ID = 50A
2.5
2
1.5
1
ON RESISTANCE
0.5
NORMALIZED DRAIN TO SOURCE
0
-5050150
FIGURE 7. NORMALIZED DRAIN TOSOURCE ON
2.0
I
1.6
0100
TJ,JUNCTION TEMPERATURE (Co)
RESISTANCE vs JUNCTION TEMPERATURE
= 250µA
D
Unless Otherwise Specified (Continued)
2.0
1.8
1.2
0.8
THRESHOLD VOLTAGE
0.4
NORMALIZED GATE TO SOURCE
0
200
-5050150
FIGURE 8. NORMALIZED GATE THRESHOLD VOLTAGE vs
5000
4000
VGS = V
DS
I
= 250µA
D
0100
TJ,JUNCTION TEMPERATURE (Co)
JUNCTION TEMPERATURE
VGS = 0V, f = 1MHz
= CGS + C
C
C
C
ISS
RSS
OSS
= C
= CDS + C
GD
GD
GD
200
1.2
0.8
BREAKDOWN VOLTAGE
0.4
NORMALIZED DRAIN TO SOURCE
0
-5050150
0100200
TJ,JUNCTION TEMPERATURE (Co)
FIGURE 9. NORMALIZED DRAIN TOSOURCE BREAKDOWN
VOLTAGE vs. JUNCTION TEMPERATURE
50
37.5
12.5
, DRAIN TO SOURCE VOLTAGE (V)
DS
V
VDD= BV
25
0
DSS
0.75BV
0.50BV
0.25 BV
DRAIN SOURCE VOLTAGE
I
G(REF)
2080
I
G(ACT)
SOURCE
VOLTAGE
RL = 1Ω
I
G(REF)
V
GS
DSS
DSS
DSS
t, TIME (µs)
GATE
= 1.5mA
= 10V
0.75BV
0.50BV
0.25BV
3000
2000
C, CAPACITANCE (pF)
1000
0
125
C
ISS
C
OSS
C
RSS
5
V
DS
101520
, DRAIN TO SOURCE VOLTAGE (V)
FIGURE 10. CAPACITANCE vs DRAIN TO SOURCE VOLTAGE
10
8
VDD= BV
DSS
DSS
DSS
DSS
I
G(REF)
I
G(ACT)
6
4
2
0
, GATE TO SOURCE VOLTAGE (V)
GS
V
NOTE: Refer to Intersil Application Notes AN7254 and AN7260
FIGURE 11. NORMALIZED SWITCHING WAVEFORMS FOR CONSTANT GATE CURRENT
4-465
Page 5
RFG50N05, RFP50N05
Test Circuits and Waveforms
V
DS
BV
DSS
L
VARY t
TO OBTAIN
P
REQUIRED PEAK I
V
GS
AS
R
G
+
V
DD
-
DUT
0V
P
I
AS
0.01Ω
0
t
FIGURE 12. UNCLAMPED ENERGY TEST CIRCUITFIGURE 13. UNCLAMPED ENERGY WAVEFORMS
t
P
I
AS
t
AV
V
DS
V
DD
t
ON
t
10%
d(ON)
90%
50%
t
10%
r
PULSE WIDTH
V
DS
V
DS
R
DUT
L
+
V
DD
-
0
V
GS
0
V
GS
R
GS
V
GS
FIGURE 14. SWITCHING TIME TEST CIRCUITFIGURE 15. RESISTIVE SWITCHING WAVEFORMS
V
I
g(REF)
DS
R
L
V
GS
+
V
DD
-
DUT
V
DD
V
VGS= 2V
0
GS
Q
g(TH)
Q
V
DS
g(10)
Q
g(TOT)
VGS = 10V
t
d(OFF)
90%
t
OFF
50%
t
f
10%
VGS= 20V
90%
I
g(REF)
0
FIGURE 16. GATE CHARGE TEST CIRCUITFIGURE 17. GATE CHARGE WAVEFORMS
4-466
Page 6
RFG50N05, RFP50N05
All Intersil semiconductor products are manufactured, assembled and tested under ISO9000 quality systems certification.
Intersil semiconductor products are sold by description only. Intersil Corporation reserves the right to make changesin circuit design and/or specifications at any time without notice . Accordingly, the reader is cautioned to verify that data sheets are current before placing orders. Information furnished by Intersil is believed to be accurate and
reliable. However, no responsibility is assumed by Intersil or its subsidiaries for its use; nor for any infringements of patents or other rights of third parties which may result
from its use. No license is granted by implication or otherwise under any patent or patent rights of Intersil or its subsidiaries.
For information regarding Intersil Corporation and its products, see web site http://www.intersil.com
Sales Office Headquarters
NORTH AMERICA
Intersil Corporation
P. O. Box 883, Mail Stop 53-204
Melbourne, FL 32902
TEL: (407) 724-7000
FAX: (407) 724-7240
4-467
EUROPE
Intersil SA
Mercure Center
100, Rue de la Fusee
1130 Brussels, Belgium
TEL: (32) 2.724.2111
FAX: (32) 2.724.22.05
ASIA
Intersil (Taiwan) Ltd.
7F-6, No. 101 Fu Hsing North Road
Taipei, Taiwan
Republic of China
TEL: (886) 2 2716 9310
FAX: (886) 2 2715 3029
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