These are N-Channel enhancement mode silicon gate
power field effect transistors designed for applications such
as switching regulators, switching converters, motor drivers,
relay drivers, and drivers for high power bipolar switching
transistors requiring high speed and low gate drive power.
These types can be operated directly from integrated
circuits.
Operating and Storage Temperature . . . . . . . . . . . . TJ, T
STG
-55 to 150-55 to 150-55 to 150-55 to 150
Maximum Temperature for Soldering
Leads at 0.063in (1.6mm) from Case for 10s. . . . . . . . . .T
Package Body for 10s, See Techbrief 334 . . . . . . . . . .T
CAUTION: Stresses above those listed in “Absolute Maximum Ratings” may cause permanent damage to the device. This is a stress only rating and operationofthe
device at these or any other conditions above those indicated in the operational sections of this specification is not implied.
L
pkg
300
260
300
260
300
260
300
260
o
C
o
C
o
C
NOTE:
1. TJ= 25oC to 125oC.
Electrical SpecificationsT
= 25oC, Unless Otherwise Specified
C
PARAMETERSYMBOLTEST CONDITIONSMINTYPMAX UNITS
Drain to Source Breakdown VoltageBV
DSSID
= 250µA, VGS = 0V
RFM3N45, RFP3N45450--V
RFM3N50, RFP3N50500--V
Gate Threshold VoltageV
GS(TH)VGS
Zero Gate Voltage Drain CurrentI
Gate to Source Leakage CurrentI
Drain to Source On Resistance (Note 2)r
Drain to Source On Voltage (Note 2)V
Turn-On Delay Timet
DS(ON)ID
DS(ON)ID
d(ON)VDD
Rise Timet
Turn-Off Delay Timet
d(OFF)
Fall Timet
Input CapacitanceC
Output CapacitanceC
Reverse Transfer CapacitanceC
Thermal Resistance, Junction to CaseR
DSS
GSS
r
f
ISS
OSS
RSS
θJC
= VDS, ID = 250µA, (Figure 7)2.0-4.0V
VDS = Rated BV
VDS = 0.8 x Rated BV
FIGURE 5. TRANSFER CHARACTERISTICSFIGURE 6. DRAIN TO SOURCE ON RESISTANCE vs GATE
VOLTAGE AND DRAIN CURRENT
3
Page 4
RFM3N45, RFM3N50, RFP3N45, RFP3N50
Typical Performance Curves
2
ID = 3A, VGS =10V
PULSE DURATION = 80µs
1.5
1
ON RESISTANCE
0.5
NORMALIZED DRAIN TO SOURCE
0
-50050100150200
, JUNCTION TEMPERATURE (oC)
T
J
Unless Otherwise Specified (Continued)
FIGURE 7. NORMALIZED DRAIN TO SOURCEON
RESISTANCE vs JUNCTION TEMPERATURE
800
700
600
500
400
300
C, CAPACITANCE (pF)
200
100
0
0 10203040 5060708090100
VDS, DRAIN TO SOURCE VOLTAGE (V)
VGS = 0V, f = 1MHz
C
ISS
C
RSS
C
OSS
C
ISS
C
OSS
C
RSS
= CGS + C
= C
≈ CDS + C
GD
GD
GD
1.4
VDS = 10V
1.3
= 250µA
I
D
1.2
1.1
1.0
0.9
NORMALIZED GATE
0.8
THRESHOLD VOLTAGE
0.7
0.6
-50
050100150200
, JUNCTION TEMPERATURE(oC)
T
J
FIGURE 8. NORMALIZED GATETHRESHOLDVOLTAGE vs
JUNCTION TEMPERATURE
500
375
250
125
, DRAIN TO SOURCE VOLTAGE (V)
DS
V
VDD= BV
0
20
DSS
SOURCE
VOLTAGE
R
I
G(REF)
VGS = 10V
0.75BV
0.50BV
0.25BV
DRAIN SOURCE VOLTAGE
I
G(REF)
I
G(ACT)
t, TIME (µs)
GATE
= 167Ω
L
= 0.45mA
DSS
DSS
DSS
VDD= BV
I
80
I
DSS
G(REF)
G(ACT)
10
8
6
4
2
, GATE TO SOURCE VOLTAGE (V)
GS
V
0
FIGURE 9. CAPACITANCE vs DRAIN TO SOURCE VOLTAGE
4
NOTE: Refer to Harris Application Notes AN7254 and AN7260.
FIGURE 10. NORMALIZED SWITCHING WAVEFORMS FOR
CONSTANT GATE CURRENT
Page 5
RFM3N45, RFM3N50, RFP3N45, RFP3N50
Test Circuits and Waveforms
R
G
V
GS
FIGURE 11. SWITCHING TIME TEST CIRCUIT
CURRENT
REGULATOR
12V
BATTERY
0.2µF
50kΩ
0.3µF
G
t
ON
t
d(ON)
t
R
L
+
V
DD
-
DUT
V
DS
0
V
GS
0
90%
10%
r
10%
50%
PULSE WIDTH
t
d(OFF)
90%
t
OFF
50%
t
f
90%
10%
FIGURE 12. RESISTIVE SWITCHING WAVEFORMS
V
DS
(ISOLATED
SUPPLY)
SAME TYPE
AS DUT
D
DUT
V
DD
Q
g(TOT)
Q
gd
Q
gs
V
DS
0
V
GS
I
0
G(REF)
IG CURRENT
SAMPLING
RESISTORRESISTOR
FIGURE 13. GATE CHARGE TEST CIRCUIT
S
CURRENT
I
D
SAMPLING
V
DS
0
I
G(REF)
FIGURE 14. GATE CHARGE WAVEFORMS
5
Page 6
Semiconductor
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RFM3N45, RFM3N50, RFP3N45, RFP3N50
Data SheetOctober 1998File Number1384.2
[ /Title
()
Subect ()
Autho
r ()
Keywords
()
Creator ()
DOCI
NFO
pdfmark
[
PageMode
UseOutlines
DOCVIEW
pdfmark
3A, 450V and 500V, 3 Ohm, N-Channel
Power MOSFETs
These are N-Channel enhancement mode silicon gate
power field effect transistors designed for applications such
as switching regulators, switching converters, motor drivers,
relay drivers, and drivers for high power bipolar switching
transistors requiring high speed and low gate drive power.
These types can be operated directly from integrated
circuits.
Operating and Storage Temperature . . . . . . . . . . . . TJ, T
STG
-55 to 150-55 to 150-55 to 150-55 to 150
Maximum Temperature for Soldering
Leads at 0.063in (1.6mm) from Case for 10s. . . . . . . . . .T
Package Body for 10s, See Techbrief 334 . . . . . . . . . .T
CAUTION: Stresses above those listed in “Absolute Maximum Ratings” may cause permanent damage to the device. This is a stress only rating and operationofthe
device at these or any other conditions above those indicated in the operational sections of this specification is not implied.
L
pkg
300
260
300
260
300
260
300
260
o
C
o
C
o
C
NOTE:
1. TJ= 25oC to 125oC.
Electrical SpecificationsT
= 25oC, Unless Otherwise Specified
C
PARAMETERSYMBOLTEST CONDITIONSMINTYPMAX UNITS
Drain to Source Breakdown VoltageBV
DSSID
= 250µA, VGS = 0V
RFM3N45, RFP3N45450--V
RFM3N50, RFP3N50500--V
Gate Threshold VoltageV
GS(TH)VGS
Zero Gate Voltage Drain CurrentI
Gate to Source Leakage CurrentI
Drain to Source On Resistance (Note 2)r
Drain to Source On Voltage (Note 2)V
Turn-On Delay Timet
DS(ON)ID
DS(ON)ID
d(ON)VDD
Rise Timet
Turn-Off Delay Timet
d(OFF)
Fall Timet
Input CapacitanceC
Output CapacitanceC
Reverse Transfer CapacitanceC
Thermal Resistance, Junction to CaseR
DSS
GSS
r
f
ISS
OSS
RSS
θJC
= VDS, ID = 250µA, (Figure 7)2.0-4.0V
VDS = Rated BV
VDS = 0.8 x Rated BV