Mean on-state current, T
Mean on-state current. T
Mean on-state current. T
Nominal RMS on-state current, 25°C, (note 2)2200A
D.C. on-state current, 25°C, (note 4)1180A
Peak non-repetitive surge tp=10ms, VRM=0.6V
Peak non-repetitive surge tp=10ms, V
2
t capacity for fusing tp=10ms, VRM=0.6V
I2t capacity for fusing tp=10ms, V
Maximum rate of rise of on-state current (repetitive), (Note 6)300A/µs
Maximum rate of rise of on-state current (non-repetitive), (Note 6)600A/µs
Peak reverse gate voltage5V
Mean forward gate power4W
Peak forward gate power30W
Non-trigger gate voltage, (Note 7)0.25V
Operating temperature range-40 to +125°C
Storage temperature range-40 to +150°C
MAXIMUM
LIMITS
MAXIMUM
LIMITS
=55°C, (note 2)1115A
sink
=85°C, (note 2)770A
sink
=85°C, (note 3)470A
sink
, (note 5)10.65kA
RRM
≤
RM
≤
10V, (note 5)
RM
10V, (note 5)
, (note 5)567×10
RRM
11.7kA
3
3
686×10
UNITS
UNITS
A2s
A2s
Notes:-
1)
De-rating factor of 0.13% per °C is applicable for Tj below 25°C.
2)
Double side cooled, single phase;50Hz, 180° half-sinewave.
3)
Single side cooled, single phase;50Hz, 180° half-sinewave.
4)
Double side cooled.
5)
Half-sinewave, 125°C Tj initial.
6)
VD=67% V
7)
Rated V
Types P480CH20 to P480CH32. Rating Report 99T16 Issue 1Page 1 of 13December, 1999
DRM
, IFG=2A, t
DRM
.
≤
0.5µs, T
r
case
=125°C.
Page 2
WESTCODE
Positive development in power electronics
Characteristics
P480CH20 to P480CH32
PARAMETERMIN.TYP.MAX. TEST CONDITIONS
V
Maximum peak on-state voltage--1.87ITM=1400AV
TM
V
Threshold voltage--1.144V
0
r
Slope resistance--0.53
S
Critical rate of rise of off-state
dv/dt
voltage
I
Peak off-state current--150Rated V
DRM
I
Peak reverse current--150Rated V
RRM
V
Gate trigger voltage--3.0Tj=25°CV
GT
I
Gate trigger current--300Tj=25°C.VD=10V, IT=3AmA
GT
I
Holding current--1000Tj=25°CmA
H
Q
Recovered charge, 50% Chord-800-
RA
t
Turn-off time
q
Thermal resistance, junction to
R
θ
heatsink
--200VD=80% V
DRM
DRM
RRM
ITM=1000A, tp=1000µs, di/dt=60A/µs,
V
=50V
R
I
=1000A, tp=1000µs, di/dt=60A/µs,
--300
--400
TM
V
=50V, VDR=80%V
R
=1000A, tp=1000µs, di/dt=60A/µs,
I
TM
V
=50V, VDR=80%V
R
dV
/dt=200V/µs
DR
--0.024 Double side cooled°C/W
--0.048 Single side cooled°C/W
(Note 1)
, dVDR/dt=20V/µs
DRM
,
DRM
UNITS
m
V/µs
mA
mA
µC
µs
µs
FMounting force19-26kN
WtWeight-510-g
Ω
Notes:-
Unless otherwise indicated Tj=125°C.
1)
Types P480CH20 to P480CH32. Rating Report 99T16 Issue 1Page 2 of 13December, 1999
This report is applicable to other and higher voltage grades when supply has been agreed by
Sales/Production.
3.0 Extension of Turn-off Time
This Report is applicable to other tq/re-applied dv/dt combinations when supply has been agreed by
Sales/Production.
4.0 Repetitive dv/dt
Higher dv/dt selections are available up to 1000V/µs on request.
5.0 De-rating Factor
DRM VDSM VRRM
V
V
RSM
V
V
V
D
DC V
R
A blocking voltage de-rating factor of 0.13%/°C is applicable to this device for Tj below 25oC.
6.0 Rate of rise of on-state current
The maximum un-primed rate of rise of on-state current must not exceed 600A/µs at any time during turnon on a non-repetitive basis. For repetitive performance the on-state rate of rise of current must not
exceed 300 A/µs at any time during turn-on. Note that these values of rate of rise of current apply to the
total device current including that from any local snubber network.
7.0 Square wave ratings
These ratings are given for load component rate of rise of forward current of 100 and 500 A/µs.
8.0 Duty cycle lines
The 100% duty cycle is represented on all the ratings by a straight line. Other duties can be included as
parallel to the first.
9.0 Maximum Operating Frequency
The maximum operating frequency is set by the on-state duty, the time required for the thyristor to turn off
) and for the off-state voltage to reach full value (tv), i.e.
(t
q
1
=
max
f
++
ttt
vqpulse
Types P480CH20 to P480CH32. Rating Report 99T16 Issue 1Page 3 of 13December, 1999
Page 4
WESTCODE
(
)
(
)
10.0 On-State Energy per Pulse Characteristics
These curves enable rapid estimation of device dissipation to be obtained for conditions not covered by
the frequency ratings.
Then the average dissipation will be:
Positive development in power electronics
be the Energy per pulse for a given current and pulse width, in joules
Let E
p
Let R
and T
be the steady-state d.c. thermal resistance (junction to sink)
th(J-Hs)
be the heat sink temperature.
SINK
P480CH20 to P480CH32
11.0 Reverse recovery ratings
(i) QRA is based on 50% IRM chord as shown in Fig. 1 below.
(ii) Q
i.e.
is based on a 150µs integration time.
RR
=
.)(max
150
µ
∫
0
125
Fig. 1
s
.
RRRR
⋅−=⋅=
RWT and fEW
()
−
HsJthAVSINKPAV
dtiQ
1
t
(iii)
12.0 Reverse Recovery Loss
12.1 Determination by Measurement
From waveforms of recovery current obtained from a high frequency shunt (see Note 1, Page 5) and
reverse voltage present during recovery, an instantaneous reverse recovery loss waveform must be
constructed. Let the area under this waveform be E joules per pulse. A new heat sink temperature can
then be evaluated from:
where k = 0.227 (°C/W)/s
E = Area under reverse loss waveform per pulse in joules (W.s.)
f = rated frequency Hz at the original heat sink temperature.
= d.c. thermal resistance (°C/W).
R
th(J-Hs)
Types P480CH20 to P480CH32. Rating Report 99T16 Issue 1Page 4 of 13December, 1999
FactorK
)()(
=
2
t
⋅+⋅−=
RfkETT
()
−
HsJthoriginalSINKnewSINK
Page 5
WESTCODE
The total dissipation is now given by:
12.2 Determination without Measurement
In circumstances where it is not possible to measure voltage and current conditions, or for design
purposes, the additional losses E in joules may be estimated as follows.
Let E be the value of energy per reverse cycle in joules (curves in Figure 9).
Let f be the operating frequency in Hz
Positive development in power electronics
(original)(TOT)
P480CH20 to P480CH32
⋅+=
fEWW
()()
where T
T
A suitable R-C snubber network is connected across the thyristor to restrict the transient reverse voltage
waveform to a peak value (V
other than 67% of Grade, the reverse loss may be approximated by a pro rata adjustment of the maximum
value obtained from the curves.
NOTE 1
This thyristor has a low reverse recovered charge and peak reverse recovery current. W hen measuring
the charge care must be taken to ensure that:
R
- Reverse Recovery Loss by Measurement
(a) a.c. coupled devices such as current transformers are not affected by prior passage of high
amplitude forward current.
(b) A suitable, polarised, clipping circuit must be connected to the input of the measuring oscilloscope
to avoid overloading the internal amplifiers by the relatively high amplitude forward current signal
(c) Measurement of reverse recovery waveform should be carried out with an appropriate critically
damped snubber, connected across diode anode to cathode. The formula used for the calculation
of this snubber is shown below:
2
4
SINK (new)
SINK (original)
V
⋅=
C
S
is the required maximum heat sink temperature and
is the heat sink temperature given with the frequency ratings.
) of 67% of the maximum grade. If a different grade is being used or VRM is
RM
R
di
⋅
dt
()
⋅⋅−=
fRETT
thoriginalSINKnewSINK
Where: VR= Commutating source voltage
C
= Snubber capacitance
S
R= Snubber resistance
13.0 Gate Drive
The recommended pulse gate drive is 20V, 10Ω with a short-circuit current rise time of not more than
0.5µs. This gate drive must be applied when using the full di/dt capability of the device.
The duration of pulse may need to be configured with respect to the application but should be no shorter
than 20µs, otherwise an increase in pulse current could be needed to supply the resulting increase in
charge to trigger.
Types P480CH20 to P480CH32. Rating Report 99T16 Issue 1Page 5 of 13December, 1999
Page 6
WESTCODE
p
p
14.0 Reverse recovery - snubber
The effect of a conventional snubber of 0.25µF and critical damping resistor has been included in the
reverse recovery loss rating. All frequency rating di/dt values apply to the load circuit.
15.0 Computer Modelling Parameters
15.1 Calculating VT using ABCD Coefficients
Positive development in power electronics
P480CH20 to P480CH32
The on-state characteristic I
tangent used for rating purposes and (ii) a set of constants A, B, C, D, forming the coefficients of the
r
s
representative equation for V
The constants, derived by curve fitting software, are given in this report for hot characteristics where
possible. The resulting values for V
limited to that plotted.
A3.495726A2.3555853
B-0.3948598B-0.3630092
C2.077861×10
D0.02528862D0.05230597
15.2 D.C. Thermal Impedance Calculation
vs VT, on page 11 is represented in two ways; (i) the well established Vo and
T
in terms of IT given below:
T
()()
agree with the true device characteristic over a current range which is
T
25°C Coefficients125°C Coefficients
++⋅+=
-4
∑
p
..ln
IDICIBAV
TTTT
C1.335898×10
−
=
np
1
pt
=
1
t
τ
p
−⋅=
err
-4
Where p = 1 to n, n is the number of terms in the series.
t = Duration of heating pulse in seconds.
r
= Thermal resistance at time t.
t
= Amplitude of pth term.
r
τ
= Time Constant of rth term.
D.C. Double Side Cooled
Term12345
r
p
τ
p
Term123456
r
p
τ
p
Types P480CH20 to P480CH32. Rating Report 99T16 Issue 1Page 6 of 13December, 1999