Datasheet PLUS173BA, PLUS173BN, PLUS173DA, PLUS173DN Datasheet (Philips)

Page 1
Philips Semiconductors Programmable Logic Devices Product specification
PLUS173B/D
Programmable logic arrays (22 × 42 × 10)
33
October 22, 1993 853–1298 11164

DESCRIPTION

The 24-pin PLUS173 devices have a programmable AND array and a programmable OR array. Unlike PAL devices, 100% product term sharing is supported. Any of the 32 logic product terms can be connected to any or all of the 10 output OR gates. Most PAL ICs are limited to 7 AND terms per OR function; the PLUS173 devices can support up to 32 input wide OR functions.
The polarity of each output is user­programmable as either Active-High or Active-Low, thus allowing AND-OR or AND-NOR logic implementation. This feature adds an element of design flexibility, particularly when implementing complex decoding functions.
The PLUS173 devices are user­programmable using one of several commercially available, industry standard PLD programmers.

FEATURES

I/O propagation delays (worst case)
PLUS173B – 15ns max.PLUS173D – 12ns max.
Functional superset of 20L10 and most
other 24-pin combinatorial PAL devices
Two programmable arrays
Supports 32 input wide OR functions
12 inputs
10 bi-directional I/O
42 AND gates
32 logic product terms10 direction control terms
Programmable output polarity
Active-High or Active-Low
Security fuse
3-State outputs
Power dissipation: 750mW (typ.)
TTL Compatible

APPLICATIONS

Random logic
Code converters
Fault detectors
Function generators
Address mapping
Multiplexing

PIN CONFIGURATIONS

1234 5 6 7 8 9
10 11
12 13 14 15 16 17 18
19
20
21
22
23
24
25
262728
1 2 3 4 5 6 7 8
9 10 11 12 13
14
15
16
17
18
19
20
21
22
23
24
N Package
I0 I1 I2 I3 I4 I5 I6
I7 I8 I9
I10
V
CC
B9 B8 B7 B6 B5 B4 B3 B2 B1 B0 I11
GND
A Package
N = Plastic Dual In-Line (300mil-wide)
I0I1I2I3
V
CC
B9 B8
NC
I4 I5 I6 I7 I8
NC
I9 I10 GND I11 B0 B1 B2
NC
B3
B7 B6 B5 B4
NC
A = Plastic Leaded Chip Carrier

ORDERING INFORMATION

DESCRIPTION tPD (MAX) ORDER CODE DRAWING NUMBER
24-Pin Plastic Dual In-Line 300mil-wide 15ns PLUS173BN 0410D 24-Pin Plastic Dual In-Line 300mil-wide 12ns PLUS173DN 0410D 28-Pin Plastic Leaded Chip Carrier 15ns PLUS173BA 0401F 28-Pin Plastic Leaded Chip Carrier 12ns PLUS173DA 0401F
PAL is a registered trademark of Advanced Micro Devices Corporation.
Page 2
Philips Semiconductors Programmable Logic Devices Product specification
PLUS173B/D
Programmable logic arrays (22 × 42 × 10)
October 22, 1993
34

LOGIC DIAGRAM

NOTES:
1. All programmed ‘AND’ gate locations are pulled to logic “1”.
2. All programmed ‘OR’ gate locations are pulled to logic “0”.
3. Programmable connection.
(LOGIC TERMS–P) (CONTROL TERMS)
1
2
3
4
5
6
7
8
9
10
11
13
14
15
16
17
18
19
20
21
22
23
I0
I1
I2
I3
I4
I5
I6
I7
I8
I9
I10
I11
B9
B8
B7
B6
B5
B4
B3
B2
B1
B0
31 24 23 16 15 8 7 0
D9 D8 D7 D6 D5 D4 D3 D2 D1 D0
S9
S8
S7
S6
S5
S4
S3
S2
S1
S0
X9
X8
X7
X6
X5
X4
X3
X2
X1
X0
B9
B8
B7
B6
B5
B4
B3
B2
B1
B0
Page 3
Philips Semiconductors Programmable Logic Devices Product specification
PLUS173B/D
Programmable logic arrays (22 × 42 × 10)
October 22, 1993
35

FUNCTIONAL DIAGRAM

P31 P0 D0 D9
I0
I11
B0
B9
B9
B0
S0
S9
X9
X0

ABSOLUTE MAXIMUM RATINGS

1

THERMAL RATINGS

RATING
SYMBOL PARAMETER MIN MAX UNIT
V
CC
Supply voltage +7 V
DC
V
IN
Input voltage +5.5 V
DC
V
OUT
Output voltage +5.5 V
DC
I
IN
Input currents –30 +30 mA
I
OUT
Output currents +100 mA
T
amb
Operating free-air temperature range 0 +75 °C
T
stg
Storage temperature range –65 +150 °C
NOTES:
1. Stresses above those listed may cause malfunction or permanent damage to the device. This is a stress rating only. Functional operation at these or any other condition above those indicated in the operational and programming specification of the device is not implied.
TEMPERATURE
Maximum junction 150°C Maximum ambient 75
°C
Allowable thermal rise 75
°C
ambient to junction
Page 4
Philips Semiconductors Programmable Logic Devices Product specification
PLUS173B/D
Programmable logic arrays (22 × 42 × 10)
October 22, 1993
36

DC ELECTRICAL CHARACTERISTICS

0°C T
amb
+75°C, 4.75 VCC 5.25V
LIMITS
SYMBOL PARAMETER TEST CONDITIONS MIN TYP
1
MAX UNIT
Input voltage
2
V
IL
Low VCC = MIN 0.8 V
V
IH
High VCC = MAX 2.0 V
V
IC
Clamp VCC = MIN, IIN = –12mA –0.8 –1.2 V
Output voltage
2
VCC = MIN
V
OL
Low
4
IOL = 15mA 0.5 V
V
OH
High
5
IOH = –2mA 2.4 V
Input current
9
VCC = MAX
I
IL
Low VIN = 0.45V –100 µA
I
IH
High VIN = V
CC
40 µA
Output current
VCC = MAX
I
O(OFF)
Hi-Z state
8
V
OUT
= 2.7V 80 µA
V
OUT
= 0.45V –140
I
OS
Short circuit
3, 5, 6
V
OUT
= 0V –15 –70 mA
I
CC
VCC supply current
7
VCC = MAX 150 200 mA
Capacitance
VCC = 5V
I
IN
Input VIN = 2.0V 8 pF
C
B
I/O VB = 2.0V 15 pF
NOTES:
1. All typical values are at VCC = 5V, T
amb
= +25°C.
2. All voltage values are with respect to network ground terminal.
3. Test one at a time.
4. Measured with inputs I0 – I4 = 0V, inputs I5 – I9 = 4.5V, I11 = 4.5V and I19 = 10V. For outputs B0 – B4 and for outputs B5 – B9 apply the same conditions except I11 = 0V.
5. Same conditions as Note 4 except input I11 = +10V.
6. Duration of short circuit should not exceed 1 second.
7. I
CC
is measured with inputs I0 – I11 and B0 – B9 = 0V. Part in Virgin State.
8. Leakage values are a combination of input and output leakage.
9. I
IL
and IIH limits are for dedicated inputs only (I0 – I11).
Page 5
Philips Semiconductors Programmable Logic Devices Product specification
PLUS173B/D
Programmable logic arrays (22 × 42 × 10)
October 22, 1993
37

AC ELECTRICAL CHARACTERISTICS

0°C T
amb
+75°C, 4.75 VCC 5.25V, R1 = 300, R2 = 390
LIMITS
SYMBOL PARAMETER FROM TO TEST PLUS173B PLUS173D UNIT
CONDITION MIN TYP MAX MIN TYP MAX
t
PD
Propagation Delay
2
Input +/– Output +/– CL = 30pF 11 15 10 12 ns
t
OE
Output Enable
1
Input +/– Output – CL = 30pF 11 15 10 12 ns
t
OD
Output Disable
1
Input +/– Output + CL = 5pF 11 15 10 12 ns
NOTES:
1. For 3-State outputs; output enable times are tested with C
L
= 30pF to the 1.5V level, and S1 is open for high-impedance to High tests and closed for high-impedance to Low tests. Output disable times are tested with CL = 5pF. High-to-High impedance tests are made to an output voltage of V
T
= (VOH – 0.5V) with S1 open, and Low-to-High impedance tests are made to the VT = (VOL + 0.5V) level with S1 closed.
2. All propagation delays are measured and specified under worst case conditions.

VOLTAGE WAVEFORM

MEASUREMENTS:
All circuit delays are measured at the +1.5V level of inputs and outputs, unless otherwise specified.
90%
10%
5ns5ns
5ns 5ns
90%
10%
+3.0V
+3.0V
0V
0V
t
RtF
Input Pulses

TIMING DEFINITIONS

SYMBOL PARAMETER
t
PD
Propagation delay between input and output.
t
OD
Delay between input change and when output is off (Hi-Z or High).
t
OE
Delay between input change and when output reflects specified output level.

TEST LOAD CIRCUIT

TIMING DIAGRAM

Test Load Circuit
+5V
C
L
R
1
R
2
S
1
GND
B
Z
B
Z
INPUTS
I
n
I
n
B
M
B
M
OUTPUTS
C
2
C
1
DUT
NOTE:
C
1
and C2 are to bypass VCC to GND.
V
CC
+3V
0V
V
OH
V
OL
I, B
B
t
PD
1.5V 1.5V 1.5V
1.5V 1.5V
t
OD
t
OE
V
T
Page 6

Philips Semiconductors Programmable Logic Devices Product specification
PLUS173B/D
Programmable logic arrays (22 × 42 × 10)
October 22, 1993
38

LOGIC PROGRAMMING

The PLUS173 series is fully supported by industry standard (JEDEC compatible) PLD CAD tools, including Philips Semiconductors SNAP design software package. ABEL and CUPL design software packages also support the PLUS173 architecture.
All packages allow Boolean and state equation entry formats. SNAP, ABEL and CUPL also accept, as input, schematic capture format.
PLUS173 logic designs can also be generated using the program table entry format, which is detailed on the following page. This program table entry format is supported by SNAP only.
To implement the desired logic functions, the state of each logic variable from logic equations (I, B, O, P, etc.) is assigned a symbol. The symbols for TRUE, COMPLEMENT, INACTIVE, PRESET, etc., are defined below.

PROGRAMMING AND SOFTWARE SUPPORT

Refer to Section 9
(Development Software)
and Section 10
(Third-Party Programmer/
Software Support)
of this data handbook for
additional information.

AND ARRAY – (I, B)

CODE
O
STATE
INACTIVE
1, 2
CODESTATE CODESTATE CODESTATE
I, B
H
L
P, D
I, B
I
, B
I, B
I, B
P, D
I, B
I
, B
I, B
P, D
I, B
I
, B
I, B
P, D
I, B
I
, B
I, B
DON’T CARE

OR ARRAY – (B) VIRGIN STATE

A factory shipped virgin device contains all fusible links intact, such that:
1. All outputs are at “H” polarity.
2. All P
n
terms are disabled.
3. All P
n
terms are active on all outputs.
NOTES:
1. This is the initial unprogrammed state of all link pairs. It is normally associated with all unused (inactive) AND gates P
n
, Dn.
2. Any gate Pn, Dn will be unconditionally inhibited if both the true and complement of any input (I, B) are left intact.
ABEL is a trademark of Data I/O Corp. CUPL is a trademark of Logical Devices, Inc.
CODEACTIVE LEVEL
LOW
(INVERTING)
L
CODEACTIVE LEVEL
HIGH
1
(NON-INVERTING)
H
S
X
B
S
X
B

OUTPUT POLARITY – (B)

CODE
INACTIVE
A
CODE
P
n
STATUS
ACTIVE
1
P
S
P
n
STATUS
P
S
Page 7
Philips Semiconductors Programmable Logic Devices Product specification
PLUS173B/D
Programmable logic arrays (22 × 42 × 10)
October 22, 1993
39

PROGRAM TABLE

POLARITY
1 2 3 4 5 6 7 8
9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 25 26 27 28 29 30 31 D9 D8 D7 D6 D5 D4 D3 D2 D1 D0
PIN
T
E
R M
AND OR
ACTIVE
INACTIVE
CONTROL
HIGH
LOW
A
INACTIVE
H
L
B(0)
(POL)
DON’T CARE
I, B
I, B
I, B(I)
CUSTOMER NAME
PHILIPS DEVICE #
PROGRAM TABLE # REV DATE
0HL
VARIABLE
NAME
AND OR
B(0)
11 10 9 8 7 6 5 4 3 2 1 0 9 8 7 6 5 4 3 2 1 0 9 8 7 6 5 4 3 2 1 0
B(I)
13 11 10 9 8 7 6 5 4 3 2 1 23 22 21 20 19 18 17 16 15 14 23 22 21 20 19 18 17 16 15 14
NOTES
1.
2.
3.
The PLA is shipped with all links intact. Thus a background
(Shown BLANK for clarity.)
Unused I and B bits in the AND array must be programmed
Unused product terms can be left blank.
Don’t Care (—).
of entries corresponding to states of virgin links exists in the
table.
0
I
Page 8
Philips Semiconductors Programmable Logic Devices Product specification
PLUS173B/D
Programmable logic arrays (22 × 42 × 10)
October 22, 1993
40

SNAP RESOURCE SUMMARY DESIGNATIONS

CANDAND
P
31
P
0
D
0
D
9
I
0
I
11
B
0
B
9
B
9
B
0
S
0
S
9
X
9
X
0
OR
DIN173 NIN173
EXOR173
TOUT173
DIN173 NIN173
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