Datasheet PLUS153BN, PLUS153DA Datasheet (Philips)

Page 1
Philips Semiconductors Programmable Logic Devices Product specification
PLUS153B/D
Programmable logic arrays (18 × 42 × 10)
9
October 22, 1993 853–1285 11164

DESCRIPTION

The 20-pin PLUS153 devices have a programmable AND array and a
programmable OR array. Unlike PAL
devices, 100% product term sharing is supported. Any of the 32 logic product terms can be connected to any or all of the 10 output OR gates. Most PAL ICs are limited to 7 AND terms per OR function; the PLUS153 devices can support up to 32 input wide OR functions.
The polarity of each output is user-programmable as either active-High or active-Low, thus allowing AND-OR or AND-NOR logic implementation. This feature adds an element of design flexibility, particularly when implementing complex decoding functions.
The PLUS153 devices are user-programmable using one of several commercially available, industry standard PLD programmers.

FEATURES

I/O propagation delays (worst case)
PLUS153B – 15ns max.PLUS153D – 12ns max.
Functional superset of 16L8 and most
other 20-pin combinatorial PAL devices
Two programmable arrays
Supports 32 input wide OR functions
8 inputs
10 bi-directional I/O
42 AND gates
32 logic product terms10 direction control terms
Programmable output polarity
Active-High or Active-Low
Security fuse
3-State outputs
Power dissipation: 750mW (typ.)
TTL Compatible

APPLICATIONS

Random logic
Code converters
Fault detectors
Function generators
Address mapping
Multiplexing

PIN CONFIGURATIONS

1 2 3 4 5 6 7 8 9
10 11
12
13
14
15
16
17
18
19
20
N Package
I0 I1 I2 I3 I4 I5 I6 I7
B0 B2
GND
B3
B4
B5
B6
B7
B8
B9
V
CC
B1
123 4 5 6 7 8
9 10 11 12 13
14
15
16
17
18
1920
A Package
N = Plastic Dual In-Line Package (300mil-wide)
A = Plastic Leaded Chip Carrier
B4
B5
B6
B7
B8
B2 B3B1B0
GND
I3 I4 I5 I6 I7
I1I2 B9V
CC
I0

ORDERING INFORMATION

DESCRIPTION tPD (MAX) ORDER CODE DRAWING NUMBER
20-Pin Plastic Dual-In-Line 300mil-wide 15ns PLUS153BN 0408D 20-Pin Plastic Dual-In-Line 300mil-wide 12ns PLUS153DN 0408D 20-Pin Plastic Leaded Chip Carrier 15ns PLUS153BA 0400E 20-Pin Plastic Leaded Chip Carrier 12ns PLUS153DA 0400E
PAL is a registered trademark of Monolithic Memories, Inc., a wholly owned subsidiary of Advanced Micro Devices Corporation.
Page 2
Philips Semiconductors Programmable Logic Devices Product specification
PLUS153B/D
Programmable logic arrays (18 × 42 × 10)
October 22, 1993
10

LOGIC DIAGRAM

NOTES:
1. All programmed ‘AND’ gate locations are pulled to logic “1”.
2. All programmed ‘OR’ gate locations are pulled to logic “0”.
3. Programmable connection.
(LOGIC TERMS–P) (CONTROL TERMS)
1
2
3
4
5
6
7
8
9
11
12
13
14
15
16
17
18
19
I0
I1
I2
I3
I4
I5
I6
I7
B9
B8
B7
B6
B5
B4
B3
B2
B1
B0
31 24 23 16 15 8 7 0
D9D8D7D6D5D4D3D2D1D
0
S
9
S
8
S
7
S
6
S
5
S
4
S
3
S
2
S
1
S
0
X
9
X
8
X
7
X
6
X
5
X
4
X
3
X
2
X
1
X
0
B9
B8
B7
B6
B5
B4
B3
B2
B1
B0
Page 3
Philips Semiconductors Programmable Logic Devices Product specification
PLUS153B/D
Programmable logic arrays (18 × 42 × 10)
October 22, 1993
11

FUNCTIONAL DIAGRAM

P
31
P
0
D
0
D
9
I0
I7
B0
B9
B9
B0
S
0
S
9
X
9
X
0

ABSOLUTE MAXIMUM RATINGS

1

THERMAL RATINGS

RATING
SYMBOL PARAMETER MIN MAX UNIT
V
CC
Supply voltage +7 V
DC
V
IN
Input voltage +5.5 V
DC
V
OUT
Output voltage +5.5 V
DC
I
IN
Input currents –30 +30 mA
I
OUT
Output currents +100 mA
T
amb
Operating free-air temperature range 0 +75 °C
T
stg
Storage temperature range –65 +150 °C
NOTES:
1. Stresses above those listed may cause malfunction or permanent damage to the device. This is a stress rating only. Functional operation at these or any other condition above those indicated in the operational and programming specification of the device is not implied.
TEMPERATURE
Maximum junction 150°C Maximum ambient 75
°C
Allowable thermal rise 75
°C
ambient to junction
Page 4
Philips Semiconductors Programmable Logic Devices Product specification
PLUS153B/D
Programmable logic arrays (18 × 42 × 10)
October 22, 1993
12

DC ELECTRICAL CHARACTERISTICS

0°C T
amb
+75°C, 4.75 VCC 5.25V
LIMITS
SYMBOL PARAMETER TEST CONDITIONS MIN TYP
1
MAX UNIT
Input voltage
2
V
IL
Low VCC = MIN 0.8 V
V
IH
High VCC = MAX 2.0 V
V
IC
Clamp VCC = MIN, IIN = –12mA –0.8 –1.2 V
Output voltage
2
VCC = MIN
V
OL
Low
4
IOL = 15mA 0.5 V
V
OH
High
5
IOH = –2mA 2.4 V
Input current
9
VCC = MAX
I
IL
Low VIN = 0.45V –100 µA
I
IH
High VIN = V
CC
40 µA
Output current
VCC = MAX
I
O(OFF)
Hi-Z state
8
V
OUT
= 2.7V 80 µA
V
OUT
= 0.45V –140
I
OS
Short circuit
3, 5, 6
V
OUT
= 0V –15 –70 mA
I
CC
VCC supply current
7
VCC = MAX 150 200 mA
Capacitance
VCC = 5V
C
IN
Input VIN = 2.0V 8 pF
C
B
I/O VB = 2.0V 15 pF
NOTES:
1. All typical values are at VCC = 5V, T
amb
= +25°C.
2. All voltage values are with respect to network ground terminal.
3. Test one at a time.
4. Measured with inputs I0 – I2 = 0V, inputs I3 – I5 = 4.5V, inputs I7 = 4.5V and I6 = 10V. For outputs B0 – B4 and for outputs B5 – B9 apply the same conditions except I7 = 0V.
5. Same conditions as Note 4 except I7 = +10V.
6. Duration of short circuit should not exceed 1 second.
7. I
CC
is measured with inputs I0 – I7 and B0 – B9 = 0V.
8. Leakage values are a combination of input and output leakage.
9. I
IL
and IIH limits are for dedicated inputs only (I0 – I7).
Page 5
Philips Semiconductors Programmable Logic Devices Product specification
PLUS153B/D
Programmable logic arrays (18 × 42 × 10)
October 22, 1993
13

AC ELECTRICAL CHARACTERISTICS

0°C T
amb
+75°C, 4.75V VCC 5.25V, R1 = 300, R2 = 390
LIMITS
SYMBOL PARAMETER FROM TO TEST PLUS153B PLUS153D UNIT
CONDITION MIN TYP MAX MIN TYP MAX
t
PD
Propagation Delay
2
Input +/– Output +/– CL = 30pF 11 15 10 12 ns
t
OE
Output Enable
1
Input +/– Output – CL = 30pF 11 15 10 12 ns
t
OD
Output Disable
1
Input +/– Output + CL = 5pF 11 15 10 12 ns
NOTES:
1. For 3-State output; output enable times are tested with C
L
= 30pF to the 1.5V level, and S1 is open for high-impedance to High tests and closed for high-impedance to Low tests. Output disable times are tested with CL = 5pF. High-to-High impedance tests are made to an output voltage of V
T
= (VOH – 0.5V) with S1 open, and Low-to-High impedance tests are made to the VT = (VOL + 0.5V) level with S1 closed.
2. All propagation delays are measured and specified under worst case conditions.

VOLTAGE WAVEFORMS

MEASUREMENTS:
All circuit delays are measured at the +1.5V level of inputs and outputs, unless otherwise specified.
90%
10%
5ns5ns
5ns 5ns
90%
10%
+3.0V
+3.0V
0V
0V
t
RtF
Input Pulses

TIMING DEFINITIONS

SYMBOL PARAMETER
t
PD
Propagation delay between input and output.
t
OD
Delay between input change and when output is off (Hi-Z or High).
t
OE
Delay between input change and when output reflects specified output level.

TEST LOAD CIRCUIT

TIMING DIAGRAM

+5V
C
L
R
1
R
2
S
1
GND
B
Z
B
Y
INPUTS
I0
I7
B
W
B
X
OUTPUTS
C
2
C
1
DUT
NOTE:
C
1
and C2 are to bypass VCC to GND.
V
CC
+3V
0V
V
OH
V
OL
I, B
B
t
PD
1.5V 1.5V 1.5V
1.5V 1.5V
t
OD
t
OE
V
T
Page 6

Philips Semiconductors Programmable Logic Devices Product specification
PLUS153B/D
Programmable logic arrays (18 × 42 × 10)
October 22, 1993
14

LOGIC PROGRAMMING

The PLUS153B/D is fully supported by industry standard (JEDEC compatible) PLD CAD tools, including Philips Semiconductors SNAP design software package. ABEL and CUPL design software packages also support the PLUS153B/D architecture.
All packages allow Boolean and state equation entry formats. SNAP, ABEL and CUPL also accept, as input, schematic capture format.
PLUS153B/D logic designs can also be generated using the program table entry format, which is detailed on the following page. This program table entry format is supported by SNAP only.
To implement the desired logic functions, the state of each logic variable from logic equations (I, B, O, P, etc.) is assigned a symbol. The symbols for TRUE, COMPLEMENT, INACTIVE, PRESET, etc., are defined below.

PROGRAMMING AND SOFTWARE SUPPORT

Refer to Section 9
(Development Software)
and Section 10
(Third-Party
Programmer/Software Support)
of this data
handbook for additional information.

AND ARRAY – (I, B)

CODE
O
STATE
INACTIVE
1, 2
CODESTATE CODESTATE CODESTATE
I, B
H
L
P, D
I, B
I
, B
I, B
I, B
P, D
I, B
I
, B
I, B
P, D
I, B
I
, B
I, B
P, D
I, B
I
, B
I, B
DON’T CARE

OR ARRAY – (B) VIRGIN STATE

A factory shipped virgin device contains all fusible links intact, such that:
1. All outputs are at “H” polarity.
2. All P
n
terms are disabled.
3. All P
n
terms are active on all outputs.
NOTES:
1. This is the initial unprogrammed state of all links.
2. Any gate P
n
will be unconditionally inhibited if both the true and complement of an input (either
I or B) are left intact.
ABEL is a trademark of Data I/O Corp. CUPL is a trademark of Logical Devices, Inc.
CODEACTIVE LEVEL
LOW
(INVERTING)
L
CODEACTIVE LEVEL
HIGH
1
(NON–INVERTING)
H
S
X
B
S
X
B

OUTPUT POLARITY – (B)

CODE
INACTIVE
A
CODE
P
n
STATUS
ACTIVE
1
P
S
P
n
STATUS
P
S
Page 7
Philips Semiconductors Programmable Logic Devices Product specification
PLUS153B/D
Programmable logic arrays (18 × 42 × 10)
October 22, 1993
15

PROGRAM TABLE

8
POLARITY
1 2 3 4 5 6 7 8
9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 25 26 27 28 29 30 31
D9 D8 D7 D6 D5 D4 D3 D2 D1 D0
PIN
T E R M
AND OR
ACTIVE
INACTIVE
CONTROL
HIGH
LOW
A
INACTIVE
H
L
B(0)
(POL)
DON’T CARE
I, B
I, B
I, B(I)
CUSTOMER NAME
PHILIPS DEVICE #
PROGRAM TABLE # REV DATE
0HL
VARIABLE
NAME
AND OR
B(0)
7 6 5 4 3 2 1 0 9 8 7 6 5 4 3 2 1 0 9 8 7 6 5 4 3 2 1 0
B(I)
7 6 5 4 3 2 1 19 18 17 16 15 14 13 12 11 9 19 18 17 16 15 14 13 12 11 9
PURCHASE ORDER #
CF(XXXX)
CUSTOMER SYMBOLIZED PART #
TOTAL NUMBER OF PARTS
I
0
NOTES
In the unprogrammed state:
Output polarity is non–inverting.
Unused I and B bits in the AND array should be programmed
Unused product terms in the OR array should be
as Don’t Care (–).
All AND gates are pulled to a logic “0” (Low).
programmed as INACTIVE (o).
Page 8
Philips Semiconductors Programmable Logic Devices Product specification
PLUS153B/D
Programmable logic arrays (18 × 42 × 10)
October 22, 1993
16

SNAP RESOURCE SUMMARY DESIGNATIONS

CAND
P
31
P
0
D
0
D
9
I0
I7
B0
B9
B9
B0
S
0
S
9
X
9
X
0
DIN153 NIN153
OR
TOUT153
AND
EXOR153
DIN153 NIN153
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