Philips Semiconductors Product specification
OM5202ROMless 8-bit microcontroller
December 1994
7
DC ELECTRICAL CHARACTERISTICS
VSS = 0V, VDD = 5.0V ±10%. Operating temperature range 0 to 70°C.
TEST LIMITS
SYMBOL PARAMETER CONDITIONS MIN. MAX. UNIT
V
IL
Input low voltage, except EA, P1.6, P1.7 –0.5 0.2VDD–0.1 V
V
IL1
Input low voltage to EA –0.5 0.2VDD–0.3 V
V
IL2
Input low voltage to P1.6, P1.7 –0.5 0.3V
DD
V
V
IH
Input high voltage, except XTAL1, RST, P1.6, P1.7 0.2VDD+0.9 VDD+0.5 V
V
IH1
Input high voltage, XTAL1, RST 0.7V
DD
VDD+0.5 V
V
IH2
Input high voltage, P1.6, P1.7 0.7V
DD
6.0 V
V
OL
Output low voltage, ports 1, 2, 3, except P1.6, P1.7 IOL = 1.6mA
7), 8)
0.45 V
V
OL1
Output low voltage, port 0, ALE, PSEN IOL = 3.2mA
7), 8)
0.45 V
V
OL2
Output low voltage, P1.6, P1.7 IOL = 3.0mA 0.4 V
V
OH
Output high voltage, ports 1, 2, 3, ALE, PSEN
9)
IOH = –60µA 2.4 V
IOH = –25µA 0.75V
DD
V
IOH = –10µA 0.9V
DD
V
V
OH1
Output high voltage; port 0 in external bus mode IOH = –800µA 2.4 V
IOH = –300µA 0.75V
DD
V
IOH = –80µA 0.9V
DD
V
I
IL
Logical 0 input current, ports 1, 2, 3, except P1.6, P1.7 VIN = 0.45V –50 µA
I
TL
Logical 1-to-0 transition current, ports 1, 2, 3,
except P1.6, P1.7
See note 6) –650 µA
I
L1
Input leakage current, port 0, EA 0.45V < V
I
< V
DD
±10
µA
I
L2
Input leakage current, P1.6, P1.7 0V < V
I
< 6.0V
0V < V
DD
< 6.0V
±10
µA
I
DD
Power supply current: See note 1)
Active mode @ 16MHz
2), 10)
VDD=6.0V 26.5 mA
Idle mode @ 16MHz
3), 10)
6 mA
Power down mode
4), 5)
50 µA
R
RST
Internal reset pull-down resistor 50 150 kΩ
C
IO
Pin capacitance Freq.=1MHz 10 pF
NOTES FOR DC ELECTRICAL CHARACTERISTICS:
1. See Figures 9 through 11 for I
DD
test conditions.
2. The operating supply current is measured with all output pins disconnected; XTAL1 driven with t
r
= tf = 5ns;
VIL = VSS + 0.5V; VIH = V
DD
–0.5V; XTAL2 not connected; EA = RST = Port 0 = P1.6 = P1.7 = VDD. See Figure 9.
3. The idle mode supply current is measured with all output pins disconnected; XTAL1 driven with t
r
= tf = 5ns; VIL = VSS + 0.5V;
V
IH
= V
DD
–0.5V; XTAL2 not connected; Port 0 = P1.6 = P1.7 = VDD; EA = RST = VSS. See Figure 10.
4. The power-down current is measured with all output pins disconnected; XTAL2 not connected; Port 0 = P1.6 = P1.7 = VDD;
EA
= RST = VSS. See Figure 11.
5. 2V
≤ V
PD
≤ VDDmax.
6. Pins of ports 1 , 2, and 3 source a transition current when they are being externally driven from 1 to 0. The transition current reaches its
maximum value when V
IN
is approximately 2V .
7. Capacitive loading on ports 0 and 2 may cause spurious noise to be superimposed on the V
OL
s of ALE and ports 1 and 3. The noise is due
to external bus capacitance discharging into the port 0 and port 2 pins when these pins make 1-to-0 transitions during bus operations. In the
worst cases (capacitive loading > 100pF), the noise pulse on the ALE pin may exceed 0.8V . In such cases, it may be desirable to qualify
ALE with a Schmitt Trigger, or use an address latch with a Schmitt Trigger STROBE input.
8. Under steady state (non-transient) conditions, I
OL
must be externally limited as follows: Maximum IOL = 10mA per port pin; Maximum
I
OL
= 26mA total for Port 0; Maximum IOL = 15mA total for Ports 1, 2, and 3; Maximum IOL = 71mA total for all output pins. If IOL exceeds the
test conditions, VOL may exceed the related specification. Pins are not guaranteed to sink current greater than the listed test conditions.
9. Capacitive loading on ports 0 and 2 may cause the V
OH
on ALE and PSEN to momentarily fall below the 0.9VDD specification when the
address bits are stabilizing.
10.I
DDMAX
for other frequencies can be derived from Figure 1, where FREQ is the external oscillator frequency in MHz. I
DDMAX
is given in mA.