• Optimized Gate Charge to Minimize Switching Losses
• Dual SOIC−8 Surface Mount Package Saves Board Space
• This is a Pb−Free Device
Applications
• Disk Drives
• DC−DC Converters
• Printers
MAXIMUM RATINGS (T
Drain−to−Source VoltageV
Gate−to−Source VoltageV
Continuous Drain
Current R
Power Dissipation
(Note 1)
R
q
JA
Continuous Drain
Current R
Power Dissipation
(Note 2)
R
q
JA
Continuous Drain
Current R
(Note 1)
Power Dissipation
t < 10 s (Note 1)
R
q
JA
Pulsed Drain CurrentT
Operating Junction and Storage TemperatureTJ, T
Source Current (Body Diode)I
Single Pulse Drain−to−Source Avalanche
Energy T
= 7.5 Apk, L = 1.0 mH, RG = 25 W
I
L
Lead Temperature for Soldering Purposes
(1/8″ from case for 10 s)
THERMAL RESISTANCE RATINGS
Junction−to−Ambient – Steady State (Note 1)
Junction−to−Ambient – t≤10 s (Note 1)
Junction−to−FOOT (Drain)
Junction−to−Ambient – Steady State (Note 2)
Stresses exceeding Maximum Ratings may damage the device. Maximum
Ratings are stress ratings only. Functional operation above the Recommended
Operating Conditions is not implied. Extended exposure to stresses above the
Recommended Operating Conditions may affect device reliability.
1. Surface−mounted on FR4 board using 1 inch sq pad size, 1 oz Cu.
2. Surface−mounted on FR4 board using the minimum recommended pad size.
to Minimize Conduction Losses
DS(on)
= 25°C unless otherwise stated)
J
Rating
T
= 25°C
(Note 1)
q
JA
(Note 2)
q
JA
Steady
State
t < 10 s
q
JA
= 25°C, VDD = 30 V, VGS = 10 V,
J
A
T
= 70°C4.4
A
T
= 25°CP
A
T
= 25°C
A
T
= 70°C3.5
A
T
= 25°CP
A
T
= 25°C
A
T
= 70°C6.0
A
T
= 25°CP
A
= 25°C,
A
t
= 10 ms
p
RatingSymbolMaxUnit
SymbolValueUnit
DSS
I
I
I
I
DM
GS
D
D
D
D
D
D
STG
S
30V
±20V
5.5
1.14W
4.5
0.68W
7.5
1.95W
30A
−55 to
+150
2.0A
A
A
A
°C
EAS28mJ
T
L
R
q
JA
R
q
JA
R
q
JF
R
q
JA
260°C
110
64
40
183.5
°C/W
http://onsemi.com
R
V
(BR)DSS
30 V
24 mW @ 10 V
DS(on)
Max
I
D
7.5 A
Max
36 mW @ 4.5 V
N−Channel
D
G
S
MARKING DIAGRAM
& PIN ASSIGNMENT
D1 D1 D2 D2
8
8
1
SOIC−8
CASE 751
STYLE 11
4840N
AYWW
G
1
S1 G1 S2 G2
4840N = Device Code
A= Assembly Location
Y= Year
WW= Work Week
G= Pb−Free Package
ORDERING INFORMATION
DevicePackageShipping
NTMD4840NR2GSOIC−8
2500/Tape & Reel
(Pb−Free)
†For information on tape and reel specifications,
including part orientation and tape sizes, please
refer to our Tape and Reel Packaging Specification
Brochure, BRD8011/D.
Drain−to−Source Breakdown Voltage Temperature Coefficient
Zero Gate Voltage Drain CurrentI
Gate−to−Source Leakage CurrentI
V
(BR)DSS
V
(BR)DSS/TJ
DSS
GSS
V
= 0 V, I
GS
V
= 0 V,
GS
V
= 24 V
DS
V
= 0 V, V
DS
ON CHARACTERISTICS (Note 3)
Gate Threshold Voltage
Negative Threshold Temperature Coefficient
Drain−to−Source On ResistanceR
Forward Transconductanceg
V
GS(TH)
V
GS(TH)/TJ
DS(on)
FS
V
= VDS, I
GS
V
= 10 VI
GS
V
= 4.5 VI
GS
V
= 1.5 V, I
DS
CHARGES, CAPACITANCES AND GATE RESISTANCE
Input Capacitance
Output CapacitanceC
Reverse Transfer CapacitanceC
Total Gate ChargeQ
Threshold Gate ChargeQ
Gate−to−Source ChargeQ
Gate−to−Drain ChargeQ
Total Gate ChargeQ
C
ISS
OSS
RSS
G(TOT)
G(TH)
GS
GD
G(TOT)
V
= 0 V, f = 1.0 MHz, V
GS
V
= 4.5 V, V
GS
V
= 10 V, V
GS
DS
DS
SWITCHING CHARACTERISTICS (Note 4)
Turn−On Delay Time
Rise Timet
Turn−Off Delay Timet
Fall Timet
t
d(ON)
r
d(OFF)
f
V
GS
I
D
= 10 V, V
= 1.0 A, R
DRAIN−TO−SOURCE CHARACTERISTICS
Forward Diode Voltage
Reverse Recovery Timet
Charge TimeT
Discharge TimeT
Reverse Recovery TimeQ
V
SD
RR
a
b
RR
VGS = 0 V
I
= 2.0 A
D
VGS = 0 V, dIS/dt = 100 A/ms,
IS = 2.0 A
PACKAGE PARASITIC VALUES
Source Inductance
Drain InductanceL
Gate InductanceL
Gate ResistanceR
L
S
D
G
G
TA = 25°C
3. Pulse Test: pulse width v 300 ms, duty cycle v 2%.
4. Switching characteristics are independent of operating junction temperatures.
= 250 mA
D
30V
18
TJ = 25°C
TJ = 100°C
= ±20 V±100nA
GS
= 250 mA
D
1.53.0V
1.0
10
6.0
= 6.9 A
D
= 5.0 A
D
= 6.9 A15S
D
1624
2636
520
DS
= 15 V
140
70
4.8
= 15 V, I
= 6.9 A
D
1.1
2.1
1.9
= 15 V, I
= 6.9 A9.5nC
D
7.6
= 15 V,
DD
= 3.0 W
G
5.0
17
3.0
TJ = 25°C
TJ = 125°C
0.761.0
0.58
12.5
7.3
5.2
6.0
0.66nH
0.20nH
1.50nH
2.03.0
mV/°C
mA
mV/°C
mW
pF
nC
ns
V
ns
nC
W
http://onsemi.com
2
Page 3
NTMD4840N
TYPICAL PERFORMANCE CURVES
12
10
10V
4.5 V
4.2 V
8
4 V
3.8 V
TJ = 25°C
3.4 V
6
3.2 V
4
DRAIN CURRENT (AMPS)
2
D,
I
0
01.02.03.0
, DRAIN−TO−SOURCE VOLTAGE (VOLTS)
V
DS
3.0 V
2.8 V
2.6 V
Figure 1. On−Region CharacteristicsFigure 2. Transfer Characteristics
0.060
0.055
0.050
0.045
0.040
0.035
0.030
0.025
0.020
DRAIN−TO−SOURCE RESISTANCE (W)
0.015
357 9
DS(on),
R
46 810
VGS, GATE−TO−SOURCE VOLTAGE (VOLTS)
TJ = 25°C
I
= 6.9 A
D
32
VDS ≥ 10 V
28
24
20
16
12
8
DRAIN CURRENT (AMPS)
D,
I
4
TJ = 125°C
TJ = 25°C
TJ = −55°C
5.04.0
0
1.52.53.54.5
234
VGS, GATE−TO−SOURCE VOLTAGE (VOLTS)
0.030
0.028
TJ = 25°C
0.026
VGS = 4.5 V
0.024
0.022
0.020
0.018
0.016
DRAIN−TO−SOURCE RESISTANCE (W)
0.014
DS(on),
R
3.5814
25 11
I
D,
VGS = 10 V
6.59.512.5
DRAIN CURRENT (AMPS)
Figure 3. On−Resistance vs. Gate−to−Source
Voltage
1.65
ID = 7.5 A
1.55
V
= 10 V
GS
1.45
1.35
1.25
1.15
1.05
DRAIN−TO−SOURCE
0.95
0.85
DS(on),
R
RESISTANCE (NORMALIZED)
0.75
0.65
−50−250255075100125150
TJ, JUNCTION TEMPERATURE (°C)
Figure 5. On−Resistance Variation with
Temperature
100000
10000
, LEAKAGE (nA)
1000
DSS
I
100
http://onsemi.com
3
Figure 4. On−Resistance vs. Drain Current and
Gate Voltage
VGS = 0 V
TJ = 150°C
TJ = 125°C
51015202530
VDS, DRAIN−TO−SOURCE VOLTAGE (VOLTS)
Figure 6. Drain−to−Source Leakage Current
vs. Voltage
Page 4
NTMD4840N
TYPICAL PERFORMANCE CURVES
700
600
500
400
300
200
C, CAPACITANCE (pF)
100
C
rss
0
0510
DRAIN−TO−SOURCE VOLTAGE (VOLTS)
Figure 7. Capacitance VariationFigure 8. Gate−To−Source and
100
VDD = 15 V
I
= 1 A
D
= 10 V
V
GS
10
t, TIME (ns)
t
d(on)
t
r
TJ = 25°C
C
iss
C
oss
1525
VGS = 0 V
20
t
d(off)
t
f
30
10
9
V
8
DS
QT
7
6
5
Q
GS
4
Q
GD
3
2
, GATE-TO-SOURCE VOLTAGE (VOLTS)
1
GS
V
0
04
2610
15 937
QG, TOTAL GATE CHARGE (nC)
Drain−To −Source Voltage vs. Total Charge
2.5
VGS = 0 V
T
= 25°C
J
2
1.5
1
V
GS
VGS = 10 V
= 6.9 A
I
D
= 25°C
T
J
8
1
110100
RG, GATE RESISTANCE (OHMS)
Figure 9. Resistive Switching Time
Variation vs. Gate Resistance
100
10
1
VGS = 20 V
SINGLE PULSE
0.1
, DRAIN CURRENT (AMPS)
D
I
0.01
0.0110100
TC = 25°C
R
DS(on)
THERMAL LIMIT
PACKAGE LIMIT
0.1
LIMIT
1
VDS, DRAIN−TO−SOURCE VOLTAGE (VOLTS)
Figure 11. Maximum Rated Forward Biased
Safe Operating Area
10 ms
100 ms
1 ms
10 ms
dc
0.5
, SOURCE CURRENT (AMPS)
S
I
0
0.40.50.60.7
VSD, SOURCE−TO−DRAIN VOLTAGE (VOLTS)
Figure 10. Diode Forward Voltage vs. Current
30
25
20
15
10
5
AVALANCHE ENERGY (mJ)
0
255075100
EAS, SINGLE PULSE DRAIN−TO−SOURCE
TJ, STARTING JUNCTION TEMPERATURE (°C)
Figure 12. Maximum Avalanche Energy vs.
Starting Junction Temperature
0.8
ID = 7.5 A
150125
http://onsemi.com
4
Page 5
−Y−
−Z−
NTMD4840N
PACKAGE DIMENSIONS
SOIC−8 NB
CASE 751−07
M
Y
N
ISSUE AJ
X 45
_
M
K
J
−X−
A
58
B
1
S
0.25 (0.010)
4
M
G
C
SEATING
PLANE
0.10 (0.004)
H
D
0.25 (0.010)Z
M
Y
SXS
SOLDERING FOOTPRINT*
1.52
0.060
NOTES:
1. DIMENSIONING AND TOLERANCING PER
ANSI Y14.5M, 1982.
2. CONTROLLING DIMENSION: MILLIMETER.
3. DIMENSION A AND B DO NOT INCLUDE
MOLD PROTRUSION.
4. MAXIMUM MOLD PROTRUSION 0.15 (0.006)
PER SIDE.
5. DIMENSION D DOES NOT INCLUDE DAMBAR
PROTRUSION. ALLOWABLE DAMBAR
PROTRUSION SHALL BE 0.127 (0.005) TOTAL
IN EXCESS OF THE D DIMENSION AT
MAXIMUM MATERIAL CONDITION.
6. 751−01 THRU 751−06 ARE OBSOLETE. NEW
STANDARD IS 751−07.
*For additional information on our Pb−Free strategy and soldering
details, please download the ON Semiconductor Soldering and
Mounting Techniques Reference Manual, SOLDERRM/D.
ON Semiconductor and are registered trademarks of Semiconductor Components Industries, LLC (SCILLC). SCILLC reserves the right to make changes without further notice
to any products herein. SCILLC makes no warranty, representation or guarantee regarding the suitability of its products for any particular purpose, nor does SCILLC assume any liability
arising out of the application or use of any product or circuit, and specifically disclaims any and all liability, including without limitation special, consequential or incidental damages.
“Typical” parameters which may be provided in SCILLC data sheets and/or specifications can and do vary in different applications and actual performance may vary over time. All
operating parameters, including “Typicals” must be validated for each customer application by customer’s technical experts. SCILLC does not convey any license under its patent rights
nor the rights of others. SCILLC products are not designed, intended, or authorized for use as components in systems intended for surgical implant into the body, or other applications
intended to support or sustain life, or for any other application in which the failure of the SCILLC product could create a situation where personal injury or death may occur. Should
Buyer purchase or use SCILLC products for any such unintended or unauthorized application, Buyer shall indemnify and hold SCILLC and its officers, employees, subsidiaries, affiliates,
and distributors harmless against all claims, costs, damages, and expenses, and reasonable attorney fees arising out of, directly or indirectly, any claim of personal injury or death
associated with such unintended or unauthorized use, even if such claim alleges that SCILLC was negligent regarding the design or manufacture of the part. SCILLC is an Equal
Opportunity/Affirmative Action Employer. This literature is subject to all applicable copyright laws and is not for resale in any manner.
PUBLICATION ORDERING INFORMATION
LITERATURE FULFILLMENT:
Literature Distribution Center for ON Semiconductor
P.O. Box 5163, Denver, Colorado 80217 USA
Phone: 303−675−2175 or 800−344−3860 Toll Free USA/Canada
Fax: 303−675−2176 or 800−344−3867Toll Free USA/Canada
Email: [email protected]
N. American Technical Support: 800−282−9855 Toll Free
USA/Canada
Japan: ON Semiconductor, Japan Customer Focus Center
2−9−1 Kamimeguro, Meguro−ku, Tokyo, Japan 153−0051
Phone: 81−3−5773−3850
http://onsemi.com
ON Semiconductor Website: http://onsemi.com
Order Literature: http://www.onsemi.com/litorder
For additional information, please contact your
local Sales Representative.
NTMD4840N/D
5
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