Pulsed Drain Current
Operating Junction and Storage Temperature TJ, T
Source Current (Body Diode) (Note 2)I
Lead Temperature for Soldering Purposes
(1/8” from case for 10 seconds)
Stresses exceeding Maximum Ratings may damage the device. Maximum
Ratings are stress ratings only. Functional operation above the Recommended
Operating Conditions is not implied. Extended exposure to stresses above the
Recommended Operating Conditions may affect device reliability.
1. Surface−mounted on FR4 board using 1 in sq pad size
(Cu area = 1.127 in sq [1 oz] including traces)
2. Surface−mounted on FR4 board using the minimum recommended pad size.
= 25°C unless otherwise stated)
J
DSS
GS
Steady
State
t v 5 s TA = 25°C285
Steady
State
t v 5 s545
Steady
State
TA = 25°C
TA = 85°C185
TA = 25°CP
TA = 25°C
TA = 85°C155
TA = 25°CP
tp = 10 ms
I
D
D
I
D
D
I
DM
STG
S
T
L
20V
±10V
255
440
210
310
400mA
−55 to
150
286mA
260°C
mA
mW
mA
mW
°C
3
12
1 − Gate
2 − Source
3 − Drain
MARKING
DIAGRAM
KA
M
SOT−723
CASE 631AA
KA = Device Code
M= Date Code
1
ORDERING INFORMATION
DevicePackageShipping
NTK3043NT1GSOT−723* 4000 / Tape & Ree
NTK3043NT5GSOT−723* 8000 / Tape & Ree
†For information on tape and reel specifications,
including part orientation and tape sizes, please
refer to our Tape and Reel Packaging Specification
Brochure, BRD8011/D.
Junction−to−Ambient – Steady State (Note 3)
Junction−to−Ambient – t = 5 s (Note 3)
Junction−to−Ambient – Steady State Minimum Pad (Note 4)
3. Surface−mounted on FR4 board using 1 in sq pad size (Cu area = 1.127 in sq [1 oz] including traces)
4. Surface−mounted on FR4 board using the minimum recommended pad size.
R
q
JA
R
q
JA
R
q
JA
280
228
400
°C/W
ELECTRICAL CHARACTERISTICS (T
= 25°C unless otherwise specified)
J
ParameterTest ConditionSymbolMinTypMaxUnit
OFF CHARACTERISTICS
Drain−to−Source Breakdown Voltage
Drain−to−Source Breakdown Voltage
VGS = 0 V, ID = 100 mA
ID = 100 mA, Reference to 25°C
V
Temperature Coefficient
Zero Gate Voltage Drain CurrentVGS = 0 V,
VDS = 16 V
TJ = 25°C
TJ = 125°C10
Gate−to−Source Leakage CurrentVDS = 0 V, VGS = ±5 VI
ON CHARACTERISTICS (Note 3)
Gate Threshold Voltage
Gate Threshold Temperature CoefficientV
Drain−to−Source On Resistance
VGS = VDS, ID = 250 mA
VGS = 4.5V, ID = 10 mA
VGS = 4.5V, ID = 255 mA1.63.8
VGS = 2.5 V, ID = 1 mA2.44.5
VGS = 1.8 V, ID = 1 mA5.110
VGS = 1.65 V, ID = 1 mA6.815
Forward TransconductanceVDS = 5 V, ID = 100 mAg
CHARGES, CAPACITANCES AND GATE RESISTANCE
Input Capacitance
Output CapacitanceC
VGS = 0 V, f = 1 MHz, VDS = 10 V
Reverse Transfer CapacitanceC
SWITCHING CHARACTERISTICS, VGS= 4.5 V (Note 4)
Turn−On Delay Time
Rise Timet
Turn−Off Delay Timet
VGS = 4.5 V, VDD = 5 V, ID = 10 mA,
RG = 6 W
Fall Timet
DRAIN−SOURCE DIODE CHARACTERISTICS
Forward Diode Voltage
VGS = 0 V, IS= 286 mA
TJ = 25°C
TJ = 125°C0.69
Reverse Recovery Time
Charge Timet
Discharge Timet
VGS = 0 V, VDD = 20 V, dISD/dt = 100 A/ms,
IS = 286 mA
Reverse Recovery ChargeQ
5. Pulse Test: pulse width v 300 ms, duty cycle v 2%
6. Switching characteristics are independent of operating junction temperatures
V
(BR)DSS
(BR)DSS/TJ
I
DSS
GSS
V
GS(TH)
GS(TH)/TJ
R
DS(ON)
FS
C
ISS
OSS
RSS
t
d(ON)
r
d(OFF)
f
V
SD
t
RR
a
b
RR
20V
27
mV/°C
1
1
0.41.3V
−2.4mV/°C
1.53.4
0.275S
11
8.3
2.7
13
15
94
55
0.831.2
9.1
7.1
2.0
3.7nC
mA
mA
W
pF
ns
V
ns
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2
Page 3
NTK3043N
R
DRAIN−TO−SOURCE RESISTANCE (
)
0
0.3
.3
0.3
TYPICAL PERFORMANCE CURVES
2.5 V
2.2 V
2.0 V
1.8 V
1.6 V
1.4 V
4
0.2
0.1
DRAIN CURRENT (AMPS)
D,
I
0
0
1
VDS, DRAIN−TO−SOURCE VOLTAGE (VOLTS)
VGS = 3 V to 10 V
2
TJ = 25°C
35
Figure 1. On−Region Characteristics
W
5
4
3
2
ID = 0.255 A
TJ = 25°C
VDS ≥ 5 V
0.2
0.1
DRAIN CURRENT (AMPS)
D,
I
0
12
TJ = 25°C
VGS, GATE−TO−SOURCE VOLTAGE (VOLTS)
TJ = 125°C
1.5
TJ = −55°C
2.5
Figure 2. Transfer Characteristics
6
5
4
VGS = 2.5 V
3
TJ = 25°C
1
01
16
DS(on),
27593
VGS, GATE−TO−SOURCE VOLTAGE (VOLTS)
4
80.2
10
Figure 3. On−Resistance vs. Gate−to−Source
Voltage
9.0
8.0
7.0
6.0
5.0
4.0
DRAIN−TO−SOURCE
RESISTANCE
3.0
2.0
DS(on),
R
1.0
0
−500−2525
VGS = 1.65 V, ID = 1 mA
VGS = 1.8 V, ID = 10 mA
VGS = 2.5 V, ID = 10 mA
VGS = 4.5 V, ID = 10 mA
50150
75
TJ, JUNCTION TEMPERATURE (°C)
125100
Figure 5. On−Resistance Variation with
Temperature
2
DRAIN−TO−SOURCE RESISTANCE (W)
00
DS(on),
R
0.1
ID, DRAIN CURRENT (AMPS)
VGS = 4.5 V
Figure 4. On−Resistance vs. Drain Current and
Gate Voltage
1000
, LEAKAGE (nA)
DSS
I
100
10
VGS = 0 V
TJ = 150°C
TJ = 125°C
1
5
VDS, DRAIN−TO−SOURCE VOLTAGE (VOLTS)
10
15
2
Figure 6. Drain−to−Source Leakage Current
vs. Voltage
http://onsemi.com
3
Page 4
NTK3043N
TYPICAL PERFORMANCE CURVES
25
TJ = 25°C
20
C
iss
C
rss
15
10
C, CAPACITANCE (pF)
5
0
VGS = 0 VVDS = 0 V
10505101520
GS
V
DS
V
GATE−TO−SOURCE OR DRAIN−TO−SOURCE VOLTAGE (V)
Figure 7. Capacitance Variation
0.4
VGS = 0 V
0.3
1000
VDD = 5 V
= 10 mA
I
D
VGS = 4.5 V
100
C
iss
C
oss
C
rss
t, TIME (ns)
t
d(off)
t
f
t
r
t
d(on)
10
1
110100
RG, GATE RESISTANCE (OHMS)
Figure 8. Resistive Switching Time
Variation vs. Gate Resistance
TJ = 25°C
0.2
0.1
, SOURCE CURRENT (AMPS)
S
I
TJ = 150°C
TJ = 125°C
0
0.40.70.5
VSD, SOURCE−TO−DRAIN VOLTAGE (VOLTS)
Figure 9. Diode Forward Voltage vs. Current
TJ = −55°C
0.90.8
1.00.6
http://onsemi.com
4
Page 5
b1
NTK3043N
PACKAGE DIMENSIONS
SOT−723
CASE 631AA−01
ISSUE B
NOTES:
1. DIMENSIONING AND TOLERANCING PER ANSI
Y14.5M, 1982.
−X−
D
3
1
2
e
−Y−
E
b
2X
X0.08 (0.0032)Y
A
H
L
E
C
2. CONTROLLING DIMENSION: MILLIMETERS.
3. MAXIMUM LEAD THICKNESS INCLUDES LEAD
FINISH. MINIMUM LEAD THICKNESS IS THE MINIMUM
THICKNESS OF BASE MATERIAL.
4. DIMENSIONS D AND E DO NOT INCLUDE MOLD
FLASH, PROTRUSIONS OR GATE BURRS.
MILLIMETERS
DIM MINNOM MAX
A0.450.500.55
b0.150.210.27
b10.250.310.37
C0.070.120.17
D1.151.201.25
E0.750.800.85
e0.40 BSC
H1.151.201.25
E
L0.150.200.25
INCHES
MINNOM MAX
0.018 0.020 0.022
0.0059 0.0083 0.0106
0.010 0.012 0.015
0.0028 0.0047 0.0067
0.045 0.047 0.049
0.03 0.032 0.034
0.016 BSC
0.045 0.047 0.049
0.0059 0.0079 0.0098
SOLDERING FOOTPRINT*
0.40
0.0157
0.40
0.0157
1.0
0.039
0.40
0.0157
0.40
0.0157
*For additional information on our Pb−Free strategy and soldering
details, please download the ON Semiconductor Soldering and
Mounting Techniques Reference Manual, SOLDERRM/D.
ON Semiconductor and are registered trademarks of Semiconductor Components Industries, LLC (SCILLC). SCILLC reserves the right to make changes without further notice
to any products herein. SCILLC makes no warranty, representation or guarantee regarding the suitability of its products for any particular purpose, nor does SCILLC assume any liability
arising out of the application or use of any product or circuit, and specifically disclaims any and all liability, including without limitation special, consequential or incidental damages.
“Typical” parameters which may be provided in SCILLC data sheets and/or specifications can and do vary in different applications and actual performance may vary over time. All
operating parameters, including “Typicals” must be validated for each customer application by customer’s technical experts. SCILLC does not convey any license under its patent rights
nor the rights of others. SCILLC products are not designed, intended, or authorized for use as components in systems intended for surgical implant into the body, or other applications
intended to support or sustain life, or for any other application in which the failure of the SCILLC product could create a situation where personal injury or death may occur. Should
Buyer purchase or use SCILLC products for any such unintended or unauthorized application, Buyer shall indemnify and hold SCILLC and its officers, employees, subsidiaries, affiliates,
and distributors harmless against all claims, costs, damages, and expenses, and reasonable attorney fees arising out of, directly or indirectly, any claim of personal injury or death
associated with such unintended or unauthorized use, even if such claim alleges that SCILLC was negligent regarding the design or manufacture of the part. SCILLC is an Equal
Opportunity/Affirmative Action Employer. This literature is subject to all applicable copyright laws and is not for resale in any manner.
0.40
0.0157
SCALE 20:1
mm
ǒ
inches
Ǔ
PUBLICATION ORDERING INFORMATION
LITERATURE FULFILLMENT:
Literature Distribution Center for ON Semiconductor
P.O. Box 61312, Phoenix, Arizona 85082−1312 USA
Phone: 480−829−7710 or 800−344−3860 Toll Free USA/Canada
Fax: 480−829−7709 or 800−344−3867Toll Free USA/Canada
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Japan: ON Semiconductor, Japan Customer Focus Center
2−9−1 Kamimeguro, Meguro−ku, Tokyo, Japan 153−0051
Phone: 81−3−5773−3850
http://onsemi.com
5
ON Semiconductor Website: http://onsemi.com
Order Literature: http://www.onsemi.com/litorder
For additional information, please contact your
local Sales Representative.
NTK3043N/D
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