Continuous Source Current (Body Diode)I
Operating Junction and Storage
Temperature
Lead Temperature for Soldering Purposes
(1/8″ from case for 10 s)
Steady
State
t v 5 sT
t
= 10 ms
p
Steady
State
t v 5 sT
SCHOTTKY DIODE MAXIMUM RATINGS
(TJ = 25°C unless otherwise noted)
ParameterSymbolValueUnits
Peak Repetitive Reverse VoltageV
DC Blocking VoltageV
Average Rectified
Forward Current
Maximum ratings are those values beyond which device damage can occur.
Maximum ratings applied to the device are individual stress limit values (not
normal operating conditions) and are not valid simultaneously. If these limits are
exceeded, device functional operation is not implied, damage may occur and
reliability may be affected.
Input CapacitanceC
Output CapacitanceC
Reverse Transfer CapacitanceC
Total Gate ChargeQ
Threshold Gate ChargeQ
Gate−to−Source ChargeQ
Gate−to−Drain ChargeQ
ISS
OSS
RSS
G(TOT)
G(TH)
GS
GD
V
= 0 V, f = 1.0 MHz,
GS
V
DS
V
= −4.5 V, V
GS
I
D
= −10 V
DS
= −2.2 A
= −10 V,
185300
95150
3050
3.06.0
0.2
0.5
0.9
SWITCHING CHARACTERISTICS (Note 3)
Turn−On Delay Timet
d(ON)
Rise Timet
Turn−Off Delay Timet
d(OFF)
Fall Timet
r
f
V
GS
I
D
= −4.5 V, V
= −2.2 A, R
= −16 V,
DD
= 2.5 W
G
7.012
1325
3350
2740
DRAIN−SOURCE DIODE CHARACTERISTICS (Note 2)
Forward Diode VoltageV
SD
Reverse Recovery TimetRR
Charge Timeta10
V
GS
Discharge Timetb22
V
= 0 V,
GS
I
= −2.1 A
S
dIS/dt = 100 A/ms
= 0 V, I
= −2.1 A ,
S
−0.85−1.15V
32
Reverse Recovery ChargeQRR15nC
mA
W
pF
nC
ns
ns
SCHOTTKY DIODE ELECTRICAL CHARACTERISTICS (T
= 25°C unless otherwise noted)
J
ParameterSymbolTest ConditionsMinTypMaxUnits
Maximum Instantaneous Forward VoltageV
Maximum Instantaneous Reverse CurrentI
F
R
I
= 0.1 A0.425
F
I
= 0.5 A0.480
F
I
= 1.0 A0.5100.575
F
V
= 10 V1.0
R
V
= 20 V5.0
R
Maximum Voltage Rate of Changedv/dtVR = 20 V10,000V/ns
Non−Repetitive Peak Surge CurrentI
FSM
Halfwave, Single Pulse, 60 Hz23A
2. Pulse Test: Pulse Width v 300 ms, Duty Cycle v 2%.
3. Switching characteristics are independent of operating junction temperatures.
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2
V
mA
Page 3
NTHD4P02F
4
3
R
DRAIN−TO−SOURCE RESISTANCE (
)
0
TYPICAL MOSFET PERFORMANCE CURVES (T
VGS = −6 V to −3 V
VGS = −2.4 V
TJ = 25°C
−2 V
= 25°C unless otherwise noted)
J
4
VDS ≥ −10 V
−2.2 V
3
3
−1.8 V
2
2
−1.6 V
1
DRAIN CURRENT (AMPS)
D,
−I
0
0
1
−VDS, DRAIN−TO−SOURCE VOLTAGE (VOLTS)
Figure 1. On−Region Characteristics
W
0.5
0.4
1
DRAIN CURRENT (AMPS)
−1.4 V
−1.2 V
D,
−I
0
5
4
632
78
0.5
−VGS, GATE−TO−SOURCE VOLTAGE (VOLTS)
0.25
ID = −2.1 A
TJ = 25°C
0.225
TJ = 25°C
TC = −55°C
25°C
1
100°C
21.52.5
Figure 2. Transfer Characteristics
VGS = −2.5 V
0.2
0.3
0.2
0.175
0.15
VGS = −4.5 V
0.1
0
16
DS(on),
24
−VGS, GATE−TO−SOURCE VOLTAGE (VOLTS)
35
0.125
DRAIN−TO−SOURCE RESISTANCE (W)
0.1
0.51.52.53.5
DS(on),
R
−ID, DRAIN CURRENT (AMPS)
Figure 3. On−Resistance vs. Gate−to−Source
Voltage
1.6
ID = −2.1 A
VGS = −4.5 V
1.4
Figure 4. On−Resistance vs. Drain Current and
Gate Voltage
10000
VGS = 0 V
TJ = 150°C
1000
1.2
1
DRAIN−TO−SOURCE
0.8
DS(on),
R
RESISTANCE (NORMALIZED)
0.6
−500−2525
Figure 5. On−Resistance Variation with
50125100
75150
−TJ, JUNCTION TEMPERATURE (°C)
Temperature
, LEAKAGE (A)
100
DSS
−I
10
248
−VDS, DRAIN−TO−SOURCE VOLTAGE (VOLTS)
Figure 6. Drain−to−Source Leakage Current
TJ = 100°C
6101814
12
vs. Voltage
16
2
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NTHD4P02F
TYPICAL MOSFET PERFORMANCE CURVES (T
600
500
VDS = 0 VVGS = 0 V
C
ISS
TJ = 25°C
400
C
RSS
300
200
C, CAPACITANCE (pF)
100
C
OSS
0
50
−VGS−V
51010
DS
15
GATE−TO−SOURCE OR DRAIN−TO−SOURCE VOLTAGE (V)
Figure 7. Capacitance Variation
1000
VDD = −16 V
ID = −2.1 A
VGS = −4.5 V
100
t
d(OFF)
t, TIME (ns)
10
t
d(ON)
1
110100
t
f
t
r
RG, GATE RESISTANCE (W)
Figure 9. Resistive Switching Time Variation
vs. Gate Resistance
= 25°C unless otherwise noted)
J
5
5
−V
DS
4
4
3
3
Q
GS
2
2
1
1
GATE−TO−SOURCE VOLTAGE (V)
GS,
−V
0
0
20
01234
Figure 8. Gate−to−Source and
Drain−to−Source Voltage vs. Total Charge
2.5
VGS = 0 V
TJ = 25°C
2
1.5
1
0.5
, SOURCE CURRENT (AMPS)
S
−I
0
−VSD, SOURCE−TO−DRAIN VOLTAGE (V)
Figure 10. Diode Forward Voltage vs. Current
Q
T
Q
GD
QG, TOTAL GATE CHARGE (nC)
0.70.50.3
−V
GS
ID = −2.1 A
TJ = 25°C
0.9
15
12
9
6
3
0
DRAIN−TO−SOURCE VOLTAGE (V)
DS,
−V
1.0
D = 0.5
0.2
0.1
0.1
0.05
0.02
0.0175 W0.0710 W0.2706 W0.5776 W0.7086 W
Chip
Normalized to qja at 10s.
0.01
r(t), NORMALIZED EFFECTIVE
SINGLE PULSE
TRANSIENT THERMAL RESISTANCE
107.55 F1.7891 F0.3074 F0.0854 F0.0154 F
Ambient
0.01
1.0E−031.0E−021.0E−011.0E+001.0E+011.0E+021.0E+03
t, TIME (s)
Figure 11. Thermal Response
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NTHD4P02F
10
I
, INSTANTANEOUS FORWARD
I
REVERSE CURRENT (AMPS)
5
10
0
TYPICAL SCHOTTKY PERFORMANCE CURVES (T
TJ = 150°C
1
CURRENT (AMPS)
F
0.1
0.20
0.40
VF, INSTANTANEOUS FORWARD VOLTAGE (VOLTS)
Figure 12. Typical Forward VoltageFigure 13. Maximum Forward Voltage
1E−3
100E−6
10E−6
1E−6
TJ = 150°C
TJ = 100°C
TJ = 25°C
TJ = −55°C
0.600.80
TJ = 150°C
1
CURRENT (AMPS)
, INSTANTANEOUS FORWARD
F
I
0.1
0.20
VF, MAXIMUM INSTANTANEOUS FORWARD
1.0E+1
1.0E+0
1.0E−1
1.0E−2
1.0E−3
1.0E−4
= 25°C unless otherwise noted)
J
TJ = 25°C
0.400.600.80
VOLTAGE (VOLTS)
TJ = 150°C
TJ = 100°C
100E−9
R,
10E−9
AVERAGE FORWARD CURRENT (AMPS)
O,
I
3.5
2.5
1.5
0.5
TJ = 25°C
0
10
VR, REVERSE VOLTAGE (VOLTS)
Figure 14. Typical Reverse Current
3
2
1
0
25
45145
dc
square wave
Ipk/Io = p
Ipk/Io = 5
Ipk/Io = 10
Ipk/Io = 20
65125105
85165
TL, LEAD TEMPERATURE (°C)
freq = 20 kHz
1.0E−5
1.0E−6
MAXIMUM REVERSE CURRENT (AMPS)
1.0E−7
R,
I
20
0
VR, REVERSE VOLTAGE (VOLTS)
Figure 15. Maximum Reverse Current
1.8
1.6
1.4
1.2
1
0.8
0.6
Ipk/Io = 20
0.4
0.2
0
, AVERAGE POWER DISSIPATION (WATTS)
01
FO
P
Ipk/Io = 5
Ipk/Io = 10
0.51.52.5
IO, AVERAGE FORWARD CURRENT (AMPS)
TJ = 25°C
10
Ipk/Io = p
square wavedc
2
2
3.
3
Figure 16. Current Derating
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Figure 17. Forward Power Dissipation
Page 6
NTHD4P02F
SOLDERING FOOTPRINT*
0.457
0.018
2.032
0.08
0.711
0.028
0.66
0.026
Figure 18. Basic
2.032
0.08
0.711
0.028
SCALE 20:1
0.635
0.025
mm
ǒ
inches
0.457
0.018
Ǔ
0.66
0.026
Figure 19. Style 3
*For additional information on our Pb−Free strategy and soldering
details, please download the ON Semiconductor Soldering and
Mounting Techniques Reference Manual, SOLDERRM/D.
0.254
0.010
SCALE 20:1
1.092
0.043
mm
ǒ
inches
0.178
0.007
Ǔ
BASIC PAD PATTERNS
The basic pad layout with dimensions is shown in
Figure 18. This is sufficient for low power dissipation
MOSFET applications, but power semiconductor
performance requires a greater copper pad area,
particularly for the drain leads.
The minimum recommended pad pattern shown in
Figure 19 improves the thermal area of the drain
connections (pins 5, 6) while remaining within the confines
of the basic footprint. The drain copper area is 0.0019 sq.
in. (or 1.22 sq. mm). This will assist the power dissipation
path away from the device (through the copper lead−frame)
and into the board and exterior chassis (if applicable) for
the single device. The addition of a further copper area
and/or the addition of vias to other board layers will
enhance the performance still further.
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NTHD4P02F
PACKAGE DIMENSIONS
ChipFET]
CASE 1206A−03
ISSUE G
e1
D
8765
H
E
1234
b
e
q
L
E
c
A
0.05 (0.002)
NOTES:
1. DIMENSIONING AND TOLERANCING PER ANSI Y14.5M, 1982.
2. CONTROLLING DIMENSION: MILLIMETER.
3. MOLD GATE BURRS SHALL NOT EXCEED 0.13 MM PER SIDE.
4. LEADFRAME TO MOLDED BODY OFFSET IN HORIZONTAL
8765
1234
AND VERTICAL SHALL NOT EXCEED 0.08 MM.
5. DIMENSIONS A AND B EXCLUSIVE OF MOLD GATE BURRS.
6. NO MOLD FLASH ALLOWED ON THE TOP AND BOTTOM LEAD
SURFACE.
ON Semiconductor and are registered trademarks of Semiconductor Components Industries, LLC (SCILLC). SCILLC reserves the right to make changes without further notice
to any products herein. SCILLC makes no warranty, representation or guarantee regarding the suitability of its products for any particular purpose, nor does SCILLC assume any liability
arising out of the application or use of any product or circuit, and specifically disclaims any and all liability, including without limitation special, consequential or incidental damages.
“Typical” parameters which may be provided in SCILLC data sheets and/or specifications can and do vary in different applications and actual performance may vary over time. All
operating parameters, including “Typicals” must be validated for each customer application by customer’s technical experts. SCILLC does not convey any license under its patent rights
nor the rights of others. SCILLC products are not designed, intended, or authorized for use as components in systems intended for surgical implant into the body, or other applications
intended to support or sustain life, or for any other application in which the failure of the SCILLC product could create a situation where personal injury or death may occur. Should
Buyer purchase or use SCILLC products for any such unintended or unauthorized application, Buyer shall indemnify and hold SCILLC and its officers, employees, subsidiaries, affiliates,
and distributors harmless against all claims, costs, damages, and expenses, and reasonable attorney fees arising out of, directly or indirectly, any claim of personal injury or death
associated with such unintended or unauthorized use, even if such claim alleges that SCILLC was negligent regarding the design or manufacture of the part. SCILLC is an Equal
Opportunity/Affirmative Action Employer. This literature is subject to all applicable copyright laws and is not for resale in any manner.
PUBLICATION ORDERING INFORMATION
LITERATURE FULFILLMENT:
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For additional information, please contact your
local Sales Representative.
NTHD4P02F/D
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