Datasheet nthd4401p-d Datasheet

Page 1
NTHD4401P
l
T
l
s
Power MOSFET
−20 V, −3.0 A, Dual P−Channel, ChipFETt
Features
• Leadless ChipFET Package 40% Smaller Footprint than TSOP−6
• ChipFET Package with Excellent Thermal Capabilities where Heat
Transfer is Required
• Pb−Free Package is Available
Applications
• Charge Control in Battery Chargers
• Optimized for Battery and Load Management Applications in
Portable Equipment
• MP3 Players, Cell Phones, Digital Cameras, PDAs
• Buck and Boost DC−DC Converters
and Fast Switching Speed in a ChipFET Package
DS(on)
G
1
(BR)DSS
−20 V
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R
TYP
DS(on)
130 mW @ −4.5 V 200 mW @ −2.5 V
S
1
G
ID MAXV
−3.0 A
S
2
2
MAXIMUM RATINGS (T
Drain−to−Source Voltage V Gate−to−Source Voltage V Continuous Drain
Current (Note 1)
Power Dissipation (Note 1)
Pulsed Drain Current Operating Junction and Storage Temperature TJ, T
Source Current (Body Diode) I Lead Temperature for Soldering Purposes
(1/8″ from case for 10 s)
= 25°C unless otherwise noted)
J
Rating Symbol Value Unit
stg
−20 V
"12 V
−2.1
1.1
−9.0 A
−55 to 150
−2.5 A 260 °C
A
W
°C
DSS
GS
Steady
State t v 5 s TA = 25°C −3.0 Steady
State t v 5 s TA = 25°C 2.1
TA = 25°C TA = 85°C −1.5
TA = 25°C TA = 85°C 0.6
tp = 10 ms
I
D
P
D
I
DM
S
T
L
THERMAL RESISTANCE RATINGS
Rating Symbol Value Unit
Junction−to−Ambient − Steady State (Note 1) R Junction−to−Ambient − t v 5 s 60
Maximum ratings are those values beyond which device damage can occur. Maximum ratings applied to the device are individual stress limit values (not normal operating conditions) and are not valid simultaneously. If these limits are exceeded, device functional operation is not implied, damage may occur and reliability may be affected.
1. Surface Mounted on FR4 Board using 1 in sq pad size (Cu area = 1.27 in sq [1 oz] including traces).
© Semiconductor Components Industries, LLC, 2005
November, 2005 − Rev. 4
q
JA
°C/W
110
1 Publication Order Number:
D
1
P−Channel MOSFET
PIN
CONNECTIONS
81
D
1
7
D
1
6
D
2
5
D
2
2 3 4
C4 = Specific Device Code M = Month Code G = Pb−Free Package
P−Channel MOSFE
ChipFET
CASE 1206A
STYLE 2
MARKING DIAGRAM
S
1
1
2
G
1
S
2
G
2
G
3 4
C4 M
D
2
8 7 6 5
ORDERING INFORMATION
Device Package Shipping
NTHD4401PT1 ChipFET 3000/Tape & Ree NTHD4401PT1G ChipFET
(Pb−Free)
†For information on tape and reel specifications,
including part orientation and tape sizes, please refer to our Tape and Reel Packaging Specification Brochure, BRD8011/D.
3000/Tape & Ree
NTHD4401P/D
†
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NTHD4401P
ELECTRICAL CHARACTERISTICS (T
= 25°C unless otherwise noted)
J
Characteristic Symbol Test Condition Min Typ Max Unit
OFF CHARACTERISTICS
Drain−to−Source Breakdown Voltage V Drain−to−Source Breakdown Voltage Tem-
perature Coefficient
V
(Br)DSS/TJ
Zero Gate Voltage Drain Current I
(Br)DSS
DSS
VGS = 0 V, ID = −250 mA
VGS = 0 V TJ = 25°C −1.0 mA
VDS = −16 V TJ = 85°C −5.0
Gate−to−Source Leakage Current I
GSS
VDS = 0 V, VGS = "12 V "100 nA
ON CHARACTERISTICS (Note 2)
Gate Threshold Voltage V Gate Threshold Temperature Coefficient V Drain−to−Source On Resistance R
GS(th)
GS(th)/TJ
DS(on)
VGS = VDS, ID = −250 mA
VGS = −4.5 V, ID = −2.1 A VGS = −2.5 V, ID = −1.7 A VGS = −1.8 V, ID = −1.0 A
Forward Transconductance g
FS
VDS = −10 V, ID = −2.1 A 5.0 S
CHARGES, CAPACITANCES AND GATE RESISTANCE
Input Capacitance C Output Capacitance C Reverse Transfer Capacitance C Total Gate Charge Q Threshold Gate Charge Q Gate−to−Source Charge Q Gate−to−Drain Charge Q
iss
oss
rss
G(TOT)
G(TH)
GS GD
VGS = 0 V, f = 1.0 MHz,
VDS = −10 V
VGS = −4.5 V, VDS = −10 V,
ID = −2.1 A
SWITCHING CHARACTERISTICS (Note 3)
Turn−On Delay Time t Rise Time t Turn−Off Delay Time t Fall Time t
d(on)
r
d(off)
f
VGS = −4.5 V, VDD = −16 V,
ID = −2.1 A, RG = 2.5 W
DRAIN−SOURCE DIODE CHARACTERISTICS
Forward Diode Voltage V
SD
VGS = 0 V
IS = −2.5 A Reverse Recovery Time t Charge Time t Discharge Time t Reverse Recovery Charge Q
rr a b
RR
VGS = 0 V, dIS/dt = 90 A/ms,
IS = −2.1 A
2. Pulse Test: Pulse Width v 300 ms, Duty Cycle v 2%.
3. Switching characteristics are independent of operating junction temperatures.
−20 −23 V
−8.0 mV/°C
−0.6 −0.75 −1.2 V
2.65 mV/°C
0.130
0.200
0.155
0.240
0.34
185 300
95 150 30 50
3.0 6.0
0.2
0.5
0.9
7.0 12 13 25 33 50 27 40
−0.85 −1.15
32 10 22 15 nC
W
pF
nC
ns
V
ns
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2
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NTHD4401P
4
−2.2 V
3
2
1
DRAIN CURRENT (AMPS)
D,
−I 0
0
1
−VDS, DRAIN−TO−SOURCE VOLTAGE (VOLTS)
Figure 1. On−Region Characteristics
0.5
0.4
0.3
0.2
TYPICAL PERFORMANCE CURVES (T
VGS = −6 V to −3 V VGS = −2.4 V
4
−2 V
−1.8 V
−1.6 V
−1.4 V
−1.2 V
5
TJ = 25°C
632
78
ID = −2.1 A TJ = 25°C
= 25°C unless otherwise noted)
J
4
VDS ≥ −10 V
3
2
1
DRAIN CURRENT (AMPS)
D,
−I
TC = −55°C
25°C
0
0.5
1
−VGS, GATE−TO−SOURCE VOLTAGE (VOLTS)
Figure 2. Transfer Characteristics
0.25 TJ = 25°C
0.225
0.2
0.175
0.15
VGS = −2.5 V
100°C
21.5 2.5
3
0.1
DRAIN−TO−SOURCE RESISTANCE (W)
0
16
DS(on),
R
24
−VGS, GATE−TO−SOURCE VOLTAGE (VOLTS)
35
Figure 3. On−Resistance vs. Gate−to−Source
0.125
DRAIN−TO−SOURCE RESISTANCE (W)
0.1
0.5 4.5
DS(on),
R
1.5 2.5 3.5
−ID, DRAIN CURRENT (AMPS)
Figure 4. On−Resistance vs. Drain Current and
Voltage
VGS = −4.5 V
Gate Voltage
1.6 ID = −2.1 A VGS = −4.5 V
1.4
ID = −1.0 A VGS = −1.8 V
1.2
1.2
1
DRAIN−TO−SOURCE
0.8
DS(on),
R
RESISTANCE (NORMALIZED)
0.6
−50 0−25 25
Figure 5. On−Resistance Variation with
50 125100
75 150
TJ, JUNCTION TEMPERATURE (°C)
Temperature
1
DRAIN−TO−SOURCE
DS(on),
R
RESISTANCE (NORMALIZED)
0.8
−50 −25 0 25 50 75 100 125 150 TJ, JUNCTION TEMPERATURE (°C)
Figure 6. On−Resistance Variation with
Temperature
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3
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NTHD4401P
S)
−V
GATE−TO−SOURCE VOLTAGE (VOLTS)
0
−I
, LEAKAGE (A)
TYPICAL PERFORMANCE CURVES (T
10000
VGS = 0 V
TJ = 150°C
1000
DSS
100
TJ = 100°C
10
24 8
610 1814
12
−VDS, DRAIN−TO−SOURCE VOLTAGE (VOLTS)
Figure 7. Drain−to−Source Leakage Current
vs. Voltage
6
−V
DS
5
4
3
2
Q2Q1
1
0
GS,
02
1
Qg, TOTAL GATE CHARGE (nC)
QT
−V
GS
ID = −2.1 A TJ = 25°C
1.50.5 3.5
32.5
= 25°C unless otherwise noted)
J
600
500
VDS = 0 V VGS = 0 V
C
iss
TJ = 25°C
400
C
rss
300
200
C, CAPACITANCE (pF)
100
0
2016
50
−VGS−V
510 10
DS
GATE−TO−SOURCE OR DRAIN−TO−SOURCE VOLTAGE (VOLT
Figure 8. Capacitance Variation
12
10
8
6
4
2
0
t, TIME (ns)
DRAIN−TO−SOURCE VOLTAGE (VOLTS)
DS,
−V
100
10
t
d(off)
t
d(on)
t
f
t
r
VDD = −16 V ID = −2.1 A VGS = −4.5 V
1
101
RG, GATE RESISTANCE (OHMS)
C
oss
15
20
10
Figure 9. Gate−to−Source and
Drain−to−Source Voltage vs. Total Charge
2.5 VGS = 0 V TJ = 25°C
2
1.5
1
0.5
, SOURCE CURRENT (AMPS)
S
−I 0
−VSD, SOURCE−TO−DRAIN VOLTAGE (VOLTS)
Figure 11. Diode Forward Voltage vs. Current
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4
Figure 10. Resistive Switching Time Variation
vs. Gate Resistance
0.70.50.3
0.9
Page 5
NTHD4401P
1.0
D = 0.5
0.2
0.1
0.1
0.05
0.0175 Ω 0.0710 Ω 0.2706 Ω 0.5776 Ω 0.7086 Ω
0.02
0.01
r(t), NORMALIZED EFFECTIVE
SINGLE PULSE
TRANSIENT THERMAL RESISTANCE
0.01
1.0E−03 1.0E−02 1.0E−01 1.0E+00 1.0E+01 1.0E+02 1.0E+03
Chip
t, TIME (s)
Figure 12. Thermal Response
SOLDERING FOOTPRINT*
Normalized to θJA at 10s.
107.55 F1.7891 F0.3074 F0.0854 F0.0154 F
Ambient
0.457
0.018
0.66
0.026
2.032
0.08
0.711
0.028
SCALE 20:1
0.635
0.025
mm
ǒ
inches
0.635
0.025
0.457
0.018
Ǔ
0.66
0.026
2.032
0.08
Figure 13. Basic Figure 14. Style 2
*For additional information on our Pb−Free strategy and soldering
details, please download the ON Semiconductor Soldering and Mounting Techniques Reference Manual, SOLDERRM/D.
0.254
0.010
SCALE 20:1
1.092
0.043
mm
ǒ
inches
0.178
0.007
Ǔ
BASIC PAD PATTERNS
The basic pad layout with dimensions is shown in Figure 13. This is sufficient for low power dissipation MOSFET applications, but power semiconductor performance requires a greater copper pad area, particularly for the drain leads.
The minimum recommended pad pattern shown in Figure 14 improves the thermal area of the drain connections (pins 5, 6, 7, 8) while remaining within the
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confines of the basic footprint. The drain copper area is
0.0019 sq. in. (or 1.22 sq. mm). This will assist the power dissipation path away from the device (through the copper leadframe) and into the board and exterior chassis (if applicable) for the single device. The addition of a further copper area and/or the addition of vias to other board layers will enhance the performance still further.
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NTHD4401P
PACKAGE DIMENSIONS
ChipFET]
CASE 1206A−03
ISSUE G
e1
D
8765
H
E
1234
b
e
q
L
E
c
A
0.05 (0.002)
NOTES:
1. DIMENSIONING AND TOLERANCING PER ANSI Y14.5M, 1982.
2. CONTROLLING DIMENSION: MILLIMETER.
3. MOLD GATE BURRS SHALL NOT EXCEED 0.13 MM PER SIDE.
4. LEADFRAME TO MOLDED BODY OFFSET IN HORIZONTAL
8765
1234
AND VERTICAL SHALL NOT EXCEED 0.08 MM.
5. DIMENSIONS A AND B EXCLUSIVE OF MOLD GATE BURRS.
6. NO MOLD FLASH ALLOWED ON THE TOP AND BOTTOM LEAD SURFACE.
DIMAMIN NOM MAX MIN
b 0.25 0.30 0.35 0.010 c 0.10 0.15 0.20 0.004
D 2.95 3.05 3.10 0.116
E 1.55 1.65 1.70 0.061 e 0.65 BSC
e1 0.55 BSC
L 0.28 0.35 0.42 0.011
H
E
q
STYLE 2:
PIN 1. SOURCE 1
MILLIMETERS
1.00 1.05 1.10 0.039
1.80 1.90 2.00 0.071 0.075 0.079
5° NOM
2. GATE 1
3. SOURCE 2
4. GATE 2
5. DRAIN 2
6. DRAIN 2
7. DRAIN 1
8. DRAIN 1
INCHES
NOM MAX
0.041 0.043
0.012 0.014
0.006 0.008
0.120 0.122
0.065 0.067
0.025 BSC
0.022 BSC
0.014 0.017
5° NOM
ChipFET is a trademark of Vishay Siliconix.
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NTHD4401P/D
6
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