Datasheet ntd24n06 Datasheet

Page 1
NTD24N06
Power MOSFET 60 Volt, 24 Amp
N−Channel DPAK
Features
• Pb−Free Packages are Available
Typical Applications
• Power Supplies
• Converters
• Power Motor Controls
• Bridge Circuits
MAXIMUM RATINGS (T
Drain−to−Source Voltage V Drain−to−Gate Voltage (RGS = 10 MW) Gate−to−Source Voltage
− Continuous
− Non−repetitive (tpv10 ms)
Drain Current
− Continuous @ TA = 25°C, TJ = 150°C
− Continuous @ TA = 25°C, TJ = 175°C
− Continuous @ TA = 100°C, TJ = 175°C
− Single Pulse (tpv10 ms), TJ = 175°C
Total Power Dissipation @ T
Derate above 25°C Total Power Dissipation @ TA = 25°C (Note 1) Total Power Dissipation @ TA = 25°C (Note 2)
Operating and Storage Temperature Range TJ, T
Single Pulse Drain−to−Source Avalanche Energy − Starting TJ = 25°C (VDD = 50 Vdc, VGS = 10 Vdc, L = 1.0 mH, IL(pk) = 18 A, VDS = 60 Vdc)
Thermal Resistance
− Junction−to−Case
− Junction−to−Ambient (Note 1)
− Junction−to−Ambient (Note 2)
Maximum Lead Temperature for Soldering Purposes, 1/8 in from case for 10 seconds
Maximum ratings are those values beyond which device damage can occur. Maximum ratings applied to the device are individual stress limit values (not normal operating conditions) and are not valid simultaneously. If these limits are exceeded, device functional operation is not implied, damage may occur and reliability may be affected.
1. When surface mounted to an FR−4 board using the 0.5 sq in drain pad size.
2. When surface mounted to an FR−4 board using the minimum recommended pad size.
= 25°C unless otherwise noted)
J
Rating Symbol Value Unit
stg
60 Vdc 60 Vdc
"20 "30
24 27 19 80
62.5
0.42
1.88
1.36
− 55 to +175
162 mJ
2.4 80
110 260 °C
Vdc
Adc Adc Adc Apk
W
W/°C
W W
°C
°C/W
= 25°C
A
V
V V
E
R R R
DSS DGR
GS GS
I I I
I
DM
P
AS
q q q
T
D D D
D
JC JA JA
L
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(BR)DSS
60 V
G
TYP
DS(on)
32 mW
N−Channel
D
S
ID MAXV
24 A
R
MARKING DIAGRAMS
& PIN ASSIGNMENTS
4
Gate
Gate
1
1
Drain
24
YWW
2
Drain
4
Drain
24
YWW
2
Drain
N06G
3 Source
N06G
3 Source
4
2
1
3
DPAK
CASE 369C
(Surface Mount)
STYLE 2
4
1
2
3
DPAK
CASE 369D
(Straight Lead)
STYLE 2
Y = Year WW = Work Week 24N06 = Device Code G = Pb−Free Package
ORDERING INFORMATION
See detailed ordering and shipping information in the package dimensions section on page 2 of this data sheet.
© Semiconductor Components Industries, LLC, 2005
August, 2005 − Rev. 4
1 Publication Order Number:
NTD24N06/D
Page 2
NTD24N06
ELECTRICAL CHARACTERISTICS (T
= 25°C unless otherwise noted)
J
Characteristic Symbol Min Typ Max Unit
OFF CHARACTERISTICS
Drain−to−Source Breakdown Voltage (Note 3)
(VGS = 0 Vdc, ID = 250 mAdc)
Temperature Coefficient (Positive) Zero Gate Voltage Drain Current
(VDS = 60 Vdc, VGS = 0 Vdc) (VDS = 60 Vdc, VGS = 0 Vdc, TJ = 150°C)
Gate−Body Leakage Current (VGS = ± 20 Vdc, VDS = 0 Vdc) I
V
(BR)DSS
I
DSS
GSS
60
−
71.1
70.4
−
−
mV/°C
mAdc
Vdc
−
−
−
−
1.0 10
− − ±100 nAdc
ON CHARACTERISTICS (Note 3)
Gate Threshold Voltage (Note 3)
(VDS = VGS, ID = 250 mAdc)
Threshold Temperature Coefficient (Negative) Static Drain−to−Source On−Resistance (Note 3)
(VGS = 10 Vdc, ID = 10 Adc) (VGS = 10 Vdc, ID = 12 Adc)
Static Drain−to−Source On−Resistance (Note 3)
(VGS = 10 Vdc, ID = 20 Adc) (VGS = 10 Vdc, ID = 24 Adc) (VGS = 10 Vdc, ID = 12 Adc, TJ = 150°C)
Forward Transconductance (Note 3) (VDS = 7.0 Vdc, ID = 12 Adc) g
V
GS(th)
R
DS(on)
V
DS(on)
FS
2.0
−
3.03
7.0
4.0
−
mV/°C
mW
Vdc
−
−
32 32
42
− Vdc
−
−
−
0.8
0.8
0.7
1.15
−
−
− 15 − mhos
DYNAMIC CHARACTERISTICS
Input Capacitance Output Capacitance C
(VDS = 25 Vdc, VGS = 0 Vdc,
f = 1.0 MHz)
Transfer Capacitance C
C
iss oss rss
− 846 1200 pF
− 252 350
− 68 95
SWITCHING CHARACTERISTICS (Note 4)
Turn−On Delay Time
(V
= 30 Vdc, ID = 24 Adc,
Rise Time t Turn−Off Delay Time t
DD
VGS = 10 Vdc,
RG = 9.1 W) (Note 3)
Fall Time t Gate Charge
(VDS = 48 Vdc, ID = 24 Adc,
VGS = 10 Vdc) (Note 3)
t
d(on)
d(off)
Q Q Q
− 10 20 ns
r
− 24 50
− 25 50
f
T 1 2
− 27 60
− 24 48 nC
− 5.0 −
− 11.5 −
SOURCE−DRAIN DIODE CHARACTERISTICS
Forward On−Voltage (IS = 20 Adc, VGS = 0 Vdc) (Note 3)
(IS = 24 Adc, VGS = 0 Vdc)
(IS = 24 Adc, VGS = 0 Vdc, TJ = 150°C)
Reverse Recovery Time
(IS = 24 Adc, VGS = 0 Vdc, dIS/dt = 100 A/ms) (Note 3)
Reverse Recovery Stored Charge Q
V
SD
t
rr
t
a
t
b RR
−
−
−
0.95
1.0
0.89
1.15
− 49 −
− 35 −
− 13 −
− 0.096 −
−
Vdc
− ns
mC
3. Pulse Test: Pulse Width ≤ 300 ms, Duty Cycle ≤ 2%.
4. Switching characteristics are independent of operating junction temperatures.
ORDERING INFORMATION
Device Package Shipping
NTD24N06 DPAK 75 Units / Rail NTD24N06G DPAK
75 Units / Rail
(Pb−Free) NTD2406−1 DPAK (Straight Lead) 75 Units / Rail NTD2406−1G DPAK (Straight Lead)
75 Units / Rail
(Pb−Free) NTD24N06T4 DPAK 2500 Tape & Reel NTD24N06T4G DPAK
2500 Tape & Reel
(Pb−Free)
†For information on tape and reel specifications, including part orientation and tape sizes, please refer to our Tape and Reel Packaging
Specifications Brochure, BRD8011/D.
†
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2
Page 3
NTD24N06
0
0
50
VGS = 10 V
40
30
20
10
, DRAIN CURRENT (AMPS)
D
I
0
04
9 V
8 V
VDS, DRAIN−TO−SOURCE VOLTAGE (VOLTS)
7 V
6 V
5.5 V
5 V
4.5 V
21
3
50
VDS ≥ 10 V
40
30
20
TJ = 25°C
10
, DRAIN CURRENT (AMPS)
D
I
0
23 8
TJ = 100°C
45
VGS, GATE−TO−SOURCE VOLTAGE (VOLTS)
Figure 1. On−Region Characteristics Figure 2. Transfer Characteristics
0.08
0.06
0.04
0.02
VGS = 10 V
TJ = 100°C
TJ = 25°C
TJ = −55°C
0.08
0.06
0.04
0.02
VGS = 15 V
TJ = 100°C
TJ = 25°C
TJ = −55°C
TJ = −55°C
67
, DRAIN−TO−SOURCE RESISTANCE (W)
0
DS(on)
0
R
10 40
ID, DRAIN CURRENT (AMPS)
Figure 3. On−Resistance versus
Gate−to−Source Voltage
2
ID = 12 A V
= 10 V
1.8
1.6
1.4
1.2
(NORMALIZED)
0.8
, DRAIN−TO−SOURCE RESISTANCE
0.6
DS(on)
R
GS
1
−50 50250−25 75 125100 TJ, JUNCTION TEMPERATURE (°C)
Figure 5. On−Resistance Variation with
Temperature
, DRAIN−TO−SOURCE RESISTANCE (W)
0
3020
50
DS(on)
R
0
10 40
ID, DRAIN CURRENT (AMPS)
3020
5
Figure 4. On−Resistance versus Drain Current
and Gate Voltage
50
150 175
10000
1000
100
, LEAKAGE (nA)
DSS
I
VGS = 0 V
TJ = 150°C
TJ = 100°C
10
1
0403020 6
10
VDS, DRAIN−TO−SOURCE VOLTAGE (VOLTS)
Figure 6. Drain−to−Source Leakage Current
versus Voltage
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3
Page 4
NTD24N06
POWER MOSFET SWITCHING
Switching behavior is most easily modeled and predicted by recognizing that the power MOSFET is charge controlled. The lengths of various switching intervals (Dt) are determined by how fast the FET input capacitance can be charged by current from the generator.
The published capacitance data is difficult to use for calculating rise and fall because drain−gate capacitance varies greatly with applied voltage. Accordingly, gate charge data is used. In most cases, a satisfactory estimate of average input current (I
) can be made from a
G(AV)
rudimentary analysis of the drive circuit so that t = Q/I
G(AV)
During the rise and fall time interval when switching a resistive load, VGS remains virtually constant at a level known as the plateau voltage, V
. Therefore, rise and fall
SGP
times may be approximated by the following: tr = Q2 x RG/(VGG − V tf = Q2 x RG/V
GSP
GSP
)
where VGG = the gate drive voltage, which varies from zero to V
GG
RG = the gate drive resistance and Q2 and V
are read from the gate charge curve.
GSP
During the turn−on and turn−off delay times, gate current is not constant. The simplest calculation uses appropriate values from the capacitance curves in a standard equation for voltage change in an RC network. The equations are:
t
d(on)
t
d(off)
= RG C
= RG C
In [VGG/(V
iss
In (VGG/V
iss
GG
GSP
− V
)
GSP
)]
The capacitance (C
) is read from the capacitance curve at
iss
a voltage corresponding to the off−state condition when calculating t on−state when calculating t
and is read at a voltage corresponding to the
d(on)
.
d(off)
At high switching speeds, parasitic circuit elements complicate the analysis. The inductance of the MOSFET source lead, inside the package and in the circuit wiring which is common to both the drain and gate current paths, produces a voltage at the source which reduces the gate drive current. The voltage is determined by Ldi/dt, but since di/dt is a function of drain current, the mathematical solution is complex. The MOSFET output capacitance also complicates the mathematics. And finally, MOSFETs have finite internal gate resistance which effectively adds to the resistance of the driving source, but the internal resistance is difficult to measure and, consequently, is not specified.
The resistive switching time variation versus gate resistance (Figure 9) shows how typical switching performance is affected by the parasitic circuit elements. If the parasitics were not present, the slope of the curves would maintain a value of unity regardless of the switching speed. The circuit used to obtain the data is constructed to minimize common inductance in the drain and gate circuit loops and is believed readily achievable with board mounted components. Most power electronic loads are inductive; the data in the figure is taken with a resistive load, which approximates an optimally snubbed inductive load. Power MOSFETs may be safely operated into an inductive load; however, snubbing reduces switching losses.
2400
C
2000
1600
1200
C, CAPACITANCE (pF)
GATE−TO−SOURCE OR DRAIN−TO−SOURCE VOLTAGE (VOLTS)
iss
C
rss
800
400
0
10 0 10 15 20 25
55
V
VGS = 0 VVDS = 0 V
C
rss
GS
Figure 7. Capacitance Variation
V
DS
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4
TJ = 25°C
C
iss
C
oss
Page 5
NTD24N06
0
V
, GATE−TO−SOURCE VOLTAGE (VOLTS
12
Q
T
V
GS
Q
2
ID = 24 A TJ = 25°C
12
16
20 24
GS
10
8
Q
1
6
4
2
0
0
48 28
QG, TOTAL GATE CHARGE (nC)
Figure 8. Gate−To−Source and Drain−To−Source
Voltage versus Total Charge
DRAIN−TO−SOURCE DIODE CHARACTERISTICS
24
VGS = 0 V TJ = 25°C
20
16
1000
100
t
t
t, TIME (ns)
d(off)
10
1
11010
r
t
t
d(on)
f
RG, GATE RESISTANCE (OHMS)
VDS = 30 V ID = 24 A VGS = 10 V
Figure 9. Resistive Switching Time
Variation versus Gate Resistance
12
8
4
, SOURCE CURRENT (AMPS)
S
I
0
0.6
0.68 0.76 1
VSD, SOURCE−TO−DRAIN VOLTAGE (VOLTS)
Figure 10. Diode Forward Voltage versus Current
SAFE OPERATING AREA
The Forward Biased Safe Operating Area curves define the maximum simultaneous drain−to−source voltage and drain current that a transistor can handle safely when it is forward biased. Curves are based upon maximum peak junction temperature and a case temperature (TC) of 25°C. Peak repetitive pulsed power limits are determined by using the thermal response data in conjunction with the procedures discussed in AN569, “Transient Thermal Resistance − General Data and Its Use.”
Switching between the off−state and the on−state may traverse any load line provided neither rated peak current (IDM) nor rated voltage (V
) is exceeded and the
DSS
transition time (tr,tf) do not exceed 10 ms. In addition the total power averaged over a complete switching cycle must not exceed (T
J(MAX)
− TC)/(R
qJC
).
A Power MOSFET designated E−FET can be safely used in switching circuits with unclamped inductive loads. For
0.84 0.92
reliable operation, the stored energy from circuit inductance dissipated in the transistor while in avalanche must be less than the rated limit and adjusted for operating conditions differing from those specified. Although industry practice is to rate in terms of energy, avalanche energy capability is not a constant. The energy rating decreases non−linearly with an increase of peak current in avalanche and peak junction temperature.
Although many E−FETs can withstand the stress of drain−to−source avalanche at currents up to rated pulsed current (IDM), the energy rating is specified at rated continuous current (ID), in accordance w i th i ndust ry c us tom. The energy rating must b e derated for temperature as shown in the accompanying graph (Fi gure 12). Maxi mum energy a t currents below rated c onti nuous I
can safely be assumed to
D
equal the values indicated.
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Page 6
NTD24N06
E
100
I
, DRAIN CURRENT (AMPS)
5
200
SAFE OPERATING AREA
VGS = 20 V SINGLE PULSE TC = 25°C
10
100 ms
10 ms
1 ms
1
R
LIMIT
D
DS(on)
THERMAL LIMIT PACKAGE LIMIT
10 ms
0.1
0.1 1 100
10 17
VDS, DRAIN−TO−SOURCE VOLTAGE (VOLTS)
Figure 11. Maximum Rated Forward Biased
Safe Operating Area
1.0
D = 0.5
0.2
0.1
0.05
0.1
0.02
(NORMALIZED)
0.01
SINGLE PULSE
0.01
r(t), EFFECTIVE TRANSIENT THERMAL RESISTANCE
Figure 13. Thermal Response
dc
160
120
80
40
AVALANCHE ENERGY (mJ)
, SINGLE PULSE DRAIN−TO−SOURC
0
AS
E
P
(pk)
t
1
DUTY CYCLE, D = t1/t
t, TIME (ms)
ID = 18 A
25 50 75 100 125
150
TJ, STARTING JUNCTION TEMPERATURE (°C)
Figure 12. Maximum Avalanche Energy versus
Starting Junction Temperature
R
(t) = r(t) R
q
JC
D CURVES APPLY FOR POWER PULSE TRAIN SHOWN READ TIME AT t
t
2
2
T
J(pk)
− TC = P
q
(pk)
1.0E+00 1.0E+011.0E−011.0E−021.0E−031.0E−041.0E−05
JC
1
R
(t)
q
JC
di/dt
I
S
t
rr
t
t
a
b
TIME
t
p
0.25 I
S
I
S
Figure 14. Diode Reverse Recovery Waveform
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NTD24N06
PACKAGE DIMENSIONS
DPAK
CASE 369C−01
ISSUE O
SEATING
−T−
PLANE
B
V
S
R
4
A
123
K
F
L
D
2 PL
G
0.13 (0.005) T
C
E
Z
U
J
H
M
NOTES:
1. DIMENSIONING AND TOLERANCING PER ANSI Y14.5M, 1982.
2. CONTROLLING DIMENSION: INCH.
DIM MIN MAX MIN MAX
A 0.235 0.245 5.97 6.22 B 0.250 0.265 6.35 6.73 C 0.086 0.094 2.19 2.38 D 0.027 0.035 0.69 0.88 E 0.018 0.023 0.46 0.58 F 0.037 0.045 0.94 1.14 G 0.180 BSC 4.58 BSC H 0.034 0.040 0.87 1.01 J 0.018 0.023 0.46 0.58 K 0.102 0.114 2.60 2.89 L 0.090 BSC 2.29 BSC R 0.180 0.215 4.57 5.45 S 0.025 0.040 0.63 1.01 U 0.020 −−− 0.51 −−− V 0.035 0.050 0.89 1.27 Z 0.155 −−− 3.93 −−−
STYLE 2:
PIN 1. GATE
2. DRAIN
3. SOURCE
4. DRAIN
MILLIMETERSINCHES
SOLDERING FOOTPRINT*
6.20
0.244
2.58
0.101
3.0
0.118
5.80
0.228
1.6
0.063
SCALE 3:1
6.172
0.243
ǒ
inches
mm
Ǔ
*For additional information on our Pb−Free strategy and soldering
details, please download the ON Semiconductor Soldering and Mounting Techniques Reference Manual, SOLDERRM/D.
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7
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NTD24N06
PACKAGE DIMENSIONS
DPAK
CASE 369D−01
ISSUE B
V
S
−T−
SEATING PLANE
F
B R
4
123
G
A
K
D 3 PL
0.13 (0.005) T
C
E
J
H
M
NOTES:
1. DIMENSIONING AND TOLERANCING PER ANSI Y14.5M, 1982.
2. CONTROLLING DIMENSION: INCH.
DIM MIN MAX MIN MAX
Z
A 0.235 0.245 5.97 6.35 B 0.250 0.265 6.35 6.73 C 0.086 0.094 2.19 2.38 D 0.027 0.035 0.69 0.88
E 0.018 0.023 0.46 0.58 F 0.037 0.045 0.94 1.14
0.090 BSC 2.29 BSC
G H 0.034 0.040 0.87 1.01
J 0.018 0.023 0.46 0.58 K 0.350 0.380 8.89 9.65 R 0.180 0.215 4.45 5.45
S 0.025 0.040 0.63 1.01
V 0.035 0.050 0.89 1.27
Z 0.155 −−− 3.93 −−−
STYLE 2:
PIN 1. GATE
2. DRAIN
3. SOURCE
4. DRAIN
MILLIMETERSINCHES
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NTD24N06/D
8
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