Datasheet ntd20n06 Datasheet

Page 1
NTD20N06
Power MOSFET
20 Amps, 60 Volts, N−Channel DPAK
Designed for low voltage, high speed switching applications in power
Features
• Lower R
• Lower V
DS(on)
DS(on)
• Lower Capacitances
• Lower Total Gate Charge
• Lower and Tighter V
SD
• Lower Diode Reverse Recovery Time
• Lower Reverse Recovery Stored Charge
• These Devices are Pb−Free and are RoHS Compliant
Typical Applications
• Power Supplies
• Converters
• Power Motor Controls
• Bridge Circuits
MAXIMUM RATINGS (T
Drain−to−Source Voltage V
Drain−to−Gate Voltage (RGS = 10 MW)
Gate−to−Source Voltage
− Continuous
− Non−repetitive (tpv10 ms)
Drain Current
− Continuous @ TA = 25°C
− Continuous @ TA = 100°C
− Single Pulse (tpv10 ms)
Total Power Dissipation @ T
Derate above 25°C Total Power Dissipation @ TA = 25°C (Note 1) Total Power Dissipation @ TA = 25°C (Note 2)
Operating and Storage Temperature Range TJ, T
Single Pulse Drain−to−Source Avalanche
Energy − Starting TJ = 25°C
(VDD = 25 Vdc, VGS = 10 Vdc,
L = 1.0 mH, IL(pk) = 18.4 A, VDS = 60 Vdc)
Thermal Resistance
− Junction−to−Case
− Junction−to−Ambient (Note 1)
− Junction−to−Ambient (Note 2)
Maximum Lead Temperature for Soldering
Purposes, 1/8″ from case for 10 seconds
Stresses exceeding Maximum Ratings may damage the device. Maximum Ratings are stress ratings only. Functional operation above the Recommended Operating Conditions is not implied. Extended exposure to stresses above the Recommended Operating Conditions may affect device reliability.
1. When surface mounted to an FR4 board using the minimum recommended pad size.
2. When surface mounted to an FR4 board using the 0.5 sq in drain pad size.
= 25°C unless otherwise noted)
J
Rating Symbol Value Unit
stg
60 Vdc
60 Vdc
"20 "30
20 10 60
60
0.40
1.88
1.36
−55 to 175
170 mJ
2.5 80
110
260 °C
Vdc
Adc
Apk
W
W/°C
W W
°C
°C/W
= 25°C
A
V
V V
E
R R R
DSS
DGR
GS
GS
I I
I
DM
P
AS
q
q
q
T
D
D
D
JC
JA
JA
L
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(BR)DSS
60 V
G
TYP
DS(on)
37.5 mW
N−Channel
D
S
ID MAXV
20 A
R
MARKING DIAGRAM
4
Drain
4
2
1
3
20N06 = Device Code Y = Year WW = Work Week G = Pb−Free Package
DPAK
CASE 369C
STYLE 2
Gate
1
YWW
2
Drain
20N06G
3 Source
ORDERING INFORMATION
See detailed ordering and shipping information in the package dimensions section on page 2 of this data sheet.
© Semiconductor Components Industries, LLC, 2010
October, 2010 − Rev. 7
1 Publication Order Number:
NTD20N06/D
Page 2
NTD20N06
ELECTRICAL CHARACTERISTICS (T
= 25°C unless otherwise noted)
J
Characteristic Symbol Min Typ Max Unit
OFF CHARACTERISTICS
Drain−to−Source Breakdown Voltage (Note 3)
(VGS = 0 Vdc, ID = 250 mAdc)
Temperature Coefficient (Positive)
Zero Gate Voltage Drain Current
(VDS = 60 Vdc, VGS = 0 Vdc) (VDS = 60 Vdc, VGS = 0 Vdc, TJ = 150°C)
Gate−Body Leakage Current (VGS = ± 20 Vdc, VDS = 0 Vdc) I
ON CHARACTERISTICS (Note 3)
Gate Threshold Voltage (Note 3)
(VDS = VGS, ID = 250 mAdc)
Threshold Temperature Coefficient (Negative)
Static Drain−to−Source On−Resistance (Note 3)
(VGS = 10 Vdc, ID = 10 Adc)
Static Drain−to−Source On−Voltage (Note 3)
(VGS = 10 Vdc, ID = 20 Adc) (VGS = 10 Vdc, ID = 10 Adc, TJ = 150°C)
Forward Transconductance (Note 3) (VDS = 7.0 Vdc, ID = 6.0 Adc) g
DYNAMIC CHARACTERISTICS
Input Capacitance
Output Capacitance C
(VDS = 25 Vdc, VGS = 0 Vdc,
f = 1.0 MHz)
Transfer Capacitance C
SWITCHING CHARACTERISTICS (Note 4)
Turn−On Delay Time
(V
= 30 Vdc, ID = 20 Adc,
Rise Time t
Turn−Off Delay Time t
DD
VGS = 10 Vdc,
RG = 9.1 W) (Note 3)
Fall Time t
Gate Charge
(VDS = 48 Vdc, ID = 20 Adc,
VGS = 10 Vdc) (Note 3)
SOURCE−DRAIN DIODE CHARACTERISTICS
Forward On−Voltage (IS = 20 Adc, VGS = 0 Vdc) (Note 3)
(IS = 20 Adc, VGS = 0 Vdc, TJ = 150°C)
Reverse Recovery Time
(IS = 20 Adc, VGS = 0 Vdc, dIS/dt = 100 A/ms) (Note 3)
Reverse Recovery Stored Charge Q
3. Pulse Test: Pulse Width ≤ 300 ms, Duty Cycle ≤ 2%.
4. Switching characteristics are independent of operating junction temperatures.
V
(BR)DSS
I
DSS
GSS
V
GS(th)
R
DS(on)
V
DS(on)
C
t
d(on)
d(off)
Q
Q
Q
V
t
t
t
FS
iss
oss
rss
r
f
SD
rr
a
b
RR
60
−
71.7
79.4
−
−
mV/°C
mAdc
Vdc
−
−
−
−
1.0 10
− − ±100 nAdc
Vdc
2.0
−
2.91
6.9
4.0
−
mV/°C
mW
− 37.5 46
Vdc
−
−
0.78
1.57
1.10
−
− 13.2 − mhos
− 725 1015 pF
− 213 300
− 58 120
− 9.5 20 ns
− 60.5 120
− 27.1 60
− 37.1 80
T
1
2
− 21.2 30 nC
− 5.6 −
− 7.3 −
−
−
− 42.9 −
1.0
0.87
1.2
−
Vdc
ns
− 33 −
− 9.9 −
− 0.084 −
mC
ORDERING INFORMATION
Device Package Shipping
NTD20N06G DPAK
75 Units/Rail
(Pb−Free)
NTD20N06T4G DPAK
2500 Tape & Reel
(Pb−Free)
†For information on tape and reel specifications, including part orientation and tape sizes, please refer to our Tape and Reel Packaging
Specifications Brochure, BRD8011/D.
†
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2
Page 3
NTD20N06
40
VGS = 10 V
9 V
32
8 V
24
16
8
, DRAIN CURRENT (AMPS)
D
I
0
05
VDS, DRAIN−TO−SOURCE VOLTAGE (VOLTS)
7 V
21
3
6.5 V
6 V
5.5 V
5 V
4.5 V
4
40
VDS ≥ 10 V
32
24
16
8
, DRAIN CURRENT (AMPS)
D
I
0
2.6 4.23.4 7.4
TJ = 25°C
TJ = 100°C
VGS, GATE−TO−SOURCE VOLTAGE (VOLTS)
TJ = −55°C
5 5.8
Figure 1. On−Region Characteristics Figure 2. Transfer Characteristics
0.065
0.055
0.045
VGS = 10 V
TJ = 100°C
0.065
VGS = 15 V
0.055 TJ = 100°C
0.045
6.6
0.035
0.025
, DRAIN−TO−SOURCE RESISTANCE (W)
0.015
DS(on)
R
0
ID, DRAIN CURRENT (AMPS)
TJ = 25°C
TJ = −55°C
168
Figure 3. On−Resistance versus
Gate−to−Source Voltage
2
ID = 10 A V
= 10 V
1.8
1.6
1.4
1.2
(NORMALIZED)
1
0.8
, DRAIN−TO−SOURCE RESISTANCE
0.6
DS(on)
R
GS
−50 50250−25 75 125100
TJ, JUNCTION TEMPERATURE (°C)
Figure 5. On−Resistance Variation with
Temperature
24
32
40
150 175
0.035
0.025
, DRAIN−TO−SOURCE RESISTANCE (W)
0.015
0168244032
DS(on)
R
ID, DRAIN CURRENT (AMPS)
TJ = 25°C
TJ = −55°C
Figure 4. On−Resistance versus Drain Current
and Gate Voltage
10000
1000
100
, LEAKAGE (nA)
DSS
I
VGS = 0 V
TJ = 150°C
TJ = 125°C
TJ = 100°C
10
1
0403020 6010
VDS, DRAIN−TO−SOURCE VOLTAGE (VOLTS)
Figure 6. Drain−to−Source Leakage Current
versus Voltage
50
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Page 4
NTD20N06
POWER MOSFET SWITCHING
Switching behavior is most easily modeled and predicted
by recognizing that the power MOSFET is charge controlled. The lengths of various switching intervals (Dt) are determined by how fast the FET input capacitance can be charged by current from the generator.
The published capacitance data is difficult to use for calculating rise and fall because drain−gate capacitance varies greatly with applied voltage. Accordingly, gate charge data is used. In most cases, a satisfactory estimate of average input current (I
) can be made from a
G(AV)
rudimentary analysis of the drive circuit so that
t = Q/I
G(AV)
During the rise and fall time interval when switching a resistive load, VGS remains virtually constant at a level known as the plateau voltage, V
. Therefore, rise and fall
SGP
times may be approximated by the following:
tr = Q2 x RG/(VGG − V
tf = Q2 x RG/V
GSP
GSP
)
where
VGG = the gate drive voltage, which varies from zero to V
GG
RG = the gate drive resistance
and Q2 and V
are read from the gate charge curve.
GSP
During the turn−on and turn−off delay times, gate current is not constant. The simplest calculation uses appropriate values from the capacitance curves in a standard equation for voltage change in an RC network. The equations are:
t
d(on)
t
d(off)
= RG C
= RG C
In [VGG/(V
iss
In (VGG/V
iss
GG
GSP
− V
)
GSP
)]
The capacitance (C
) is read from the capacitance curve at
iss
a voltage corresponding to the off−state condition when calculating t on−state when calculating t
and is read at a voltage corresponding to the
d(on)
.
d(off)
At high switching speeds, parasitic circuit elements complicate the analysis. The inductance of the MOSFET source lead, inside the package and in the circuit wiring which is common to both the drain and gate current paths, produces a voltage at the source which reduces the gate drive current. The voltage is determined by Ldi/dt, but since di/dt is a function of drain current, the mathematical solution is complex. The MOSFET output capacitance also complicates the mathematics. And finally, MOSFETs have finite internal gate resistance which effectively adds to the resistance of the driving source, but the internal resistance is difficult to measure and, consequently, is not specified.
The resistive switching time variation versus gate resistance (Figure 9) shows how typical switching performance is affected by the parasitic circuit elements. If the parasitics were not present, the slope of the curves would maintain a value of unity regardless of the switching speed. The circuit used to obtain the data is constructed to minimize common inductance in the drain and gate circuit loops and is believed readily achievable with board mounted components. Most power electronic loads are inductive; the data in the figure is taken with a resistive load, which approximates an optimally snubbed inductive load. Power MOSFETs may be safely operated into an inductive load; however, snubbing reduces switching losses.
2000
1600
C
iss
1200
C
rss
800
C, CAPACITANCE (pF)
400
0
10 0 10 15 20 25
55
V
GATE−TO−SOURCE OR DRAIN−TO−SOURCE VOLTAGE (VOLTS)
VGS = 0 VVDS = 0 V
V
GS
Figure 7. Capacitance Variation
DS
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4
C
TJ = 25°C
rss
C
iss
C
oss
Page 5
NTD20N06
12
Q
T
Q
2
ID = 20 A TJ = 25°C
12
16
, GATE−TO−SOURCE VOLTAGE (VOLTS)
GS
V
10
8
Q
1
6
4
2
0
0
48 24
QG, TOTAL GATE CHARGE (nC)
Figure 8. Gate−To−Source and Drain−To−Source
Voltage versus Total Charge
DRAIN−TO−SOURCE DIODE CHARACTERISTICS
20
VGS = 0 V TJ = 25°C
16
12
1000
VDS = 30 V ID = 20 A VGS = 10 V
V
GS
20
100
t
t, TIME (ns)
10
1
1 10 100
d(off)
t
d(on)
t
f
t
r
RG, GATE RESISTANCE (OHMS)
Figure 9. Resistive Switching Time
Variation versus Gate Resistance
8
4
, SOURCE CURRENT (AMPS)
S
I
0
0.6
0.7 1
VSD, SOURCE−TO−DRAIN VOLTAGE (VOLTS)
Figure 10. Diode Forward Voltage versus Current
SAFE OPERATING AREA
The Forward Biased Safe Operating Area curves define the maximum simultaneous drain−to−source voltage and drain current that a transistor can handle safely when it is forward biased. Curves are based upon maximum peak junction temperature and a case temperature (TC) of 25°C. Peak repetitive pulsed power limits are determined by using the thermal response data in conjunction with the procedures discussed in AN569, “Transient Thermal Resistance − General Data and Its Use.”
Switching between the off−state and the on−state may traverse any load line provided neither rated peak current (IDM) nor rated voltage (V
) is exceeded and the
DSS
transition time (tr,tf) do not exceed 10 ms. In addition the total power averaged over a complete switching cycle must not exceed (T
J(MAX)
− TC)/(R
qJC
).
A Power MOSFET designated E−FET can be safely used in switching circuits with unclamped inductive loads. For
0.8 0.9
reliable operation, the stored energy from circuit inductance dissipated in the transistor while in avalanche must be less than the rated limit and adjusted for operating conditions differing from those specified. Although industry practice is to rate in terms of energy, avalanche energy capability is not a constant. The energy rating decreases non−linearly with an increase of peak current in avalanche and peak junction temperature.
Although many E−FETs can withstand the stress of drain−to−source avalanche at currents up to rated pulsed current (IDM), the energy rating is specified at rated continuous current (ID), in accordance with industry custom. The energy rating must be derated for temperature as shown in the accompanying graph (Figure 12). Maximum energy at currents below rated continuous I
can safely be assumed to
D
equal the values indicated.
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NTD20N06
SAFE OPERATING AREA
100
VGS = 20 V SINGLE PULSE TC = 25°C
10
100 ms
10 ms
1 ms
1
, DRAIN CURRENT (AMPS)
D
I
R
LIMIT
DS(on)
THERMAL LIMIT
10 ms
PACKAGE LIMIT
0.1
0.1 1 100
10 175
VDS, DRAIN−TO−SOURCE VOLTAGE (VOLTS)
Figure 11. Maximum Rated Forward Biased
Safe Operating Area
1.0 D = 0.5
0.2
0.1
0.05
0.1
0.02
(NORMALIZED)
0.01
SINGLE PULSE
0.01
r(t), EFFECTIVE TRANSIENT THERMAL RESISTANCE
Figure 13. Thermal Response
dc
180
160
140
120
100
80
60
40
20
AVALANCHE ENERGY (mJ)
, SINGLE PULSE DRAIN−TO−SOURCE
0
AS
E
P
(pk)
t
1
DUTY CYCLE, D = t1/t
t, TIME (s)
ID = 18.4 A
25 50 75 100 125
150
TJ, STARTING JUNCTION TEMPERATURE (°C)
Figure 12. Maximum Avalanche Energy versus
Starting Junction Temperature
R
(t) = r(t) R
q
JC
D CURVES APPLY FOR POWER PULSE TRAIN SHOWN READ TIME AT t
t
2
T
− TC = P
J(pk)
2
q
(pk)
JC
1
R
(t)
q
JC
1100.10.010.0010.00010.00001
di/dt
I
S
t
rr
t
t
a
b
TIME
t
p
0.25 I
S
I
S
Figure 14. Diode Reverse Recovery Waveform
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Page 7
L3
l
L4
b2
e
E
b3
4
12 3
A
B
D
b
0.005 (0.13) C
DETAIL A
M
NTD20N06
PACKAGE DIMENSIONS
DPAK (SINGLE GAUGE)
CASE 369C−01
ISSUE D
C
A
c2
H
c
GAUGE
L2
PLANE
L
L1
DETAIL A
ROTATED 90 CW5
SOLDERING FOOTPRINT*
6.20
0.244
2.58
0.101
A1
H
3.0
0.118
Z
C
SEATING PLANE
NOTES:
1. DIMENSIONING AND TOLERANCING PER ASME Y14.5M, 1994.
2. CONTROLLING DIMENSION: INCHES.
3. THERMAL PAD CONTOUR OPTIONAL WITHIN DI­MENSIONS b3, L3 and Z.
4. DIMENSIONS D AND E DO NOT INCLUDE MOLD FLASH, PROTRUSIONS, OR BURRS. MOLD FLASH, PROTRUSIONS, OR GATE BURRS SHALL NOT EXCEED 0.006 INCHES PER SIDE.
5. DIMENSIONS D AND E ARE DETERMINED AT THE OUTERMOST EXTREMES OF THE PLASTIC BODY.
6. DATUMS A AND B ARE DETERMINED AT DATUM PLANE H.
DIM MIN MAX MIN MAX
A 0.086 0.094 2.18 2.38
A1 0.000 0.005 0.00 0.13
b 0.025 0.035 0.63 0.89 b2 0.030 0.045 0.76 1.14 b3 0.180 0.215 4.57 5.46
c 0.018 0.024 0.46 0.61 c2 0.018 0.024 0.46 0.61
D 0.235 0.245 5.97 6.22
E 0.250 0.265 6.35 6.73
e 0.090 BSC 2.29 BSC
H 0.370 0.410 9.40 10.41
L 0.055 0.070 1.40 1.78 L1 0.108 REF 2.74 REF L2 0.020 BSC 0.51 BSC L3 0.035 0.050 0.89 1.27 L4 −−− 0.040 −−− 1.01
Z 0.155 −−− 3.93 −−−
STYLE 2:
PIN 1. GATE
2. DRAIN
3. SOURCE
4. DRAIN
MILLIMETERSINCHES
5.80
0.228
1.6
0.063
SCALE 3:1
6.172
0.243
ǒ
inches
mm
Ǔ
*For additional information on our Pb−Free strategy and soldering
details, please download the ON Semiconductor Soldering and Mounting Techniques Reference Manual, SOLDERRM/D.
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7
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