Designed for low voltage, high speed switching applications in
power supplies, converters and power motor controls and bridge
circuits.
Features
• Pb−Free Packages are Available
Typical Applications
• Power Supplies
• Converters
• Power Motor Controls
• Bridge Circuits
MAXIMUM RATINGS (T
Drain−to−Source VoltageV
Drain−to−Gate Voltage (RGS = 10 MW)
Gate−to−Source Voltage
− Continuous
− Non−repetitive (t
Drain Current
− Continuous @ T
− Continuous @ T
− Single Pulse (t
Total Power Dissipation @ T
Derate above 25°C
Total Power Dissipation @ TA = 25°C (Note 2)
Operating and Storage Temperature RangeTJ, T
Single Pulse Drain−to−Source Avalanche
Energy − Starting T
= 50 Vdc, VGS = 5.0 Vdc,
(V
DD
L = 1.0 mH, I
Thermal Resistance
− Junction−to−Case
− Junction−to−Ambient (Note 1)
− Junction−to−Ambient (Note 2)
Maximum Lead Temperature for Soldering
Purposes, 1/8″ from case for 10 seconds
Stresses exceeding Maximum Ratings may damage the device. Maximum
Ratings are stress ratings only. Functional operation above the Recommended Operating Conditions is not implied. Extended exposure to stresses
above the Recommended Operating Conditions may affect device reliability.
1. When surface mounted to an FR−4 board using the minimum recommended
pad size.
2. When surface mounted to an FR−4 board using the 0.5 sq in drain pad size.
(pk) = 12 A, VDS = 60 Vdc)
L
= 25°C unless otherwise noted)
J
Rating
v10 ms)
p
= 25°C
A
= 100°C
A
v10 ms)
p
= 25°C
A
= 25°C
J
SymbolValueUnit
stg
60Vdc
60Vdc
"20
"30
18
10
54
55
0.36
2.1
−55 to
+175
72mJ
2.73
100
71.4
260°C
Vdc
Adc
Apk
W
W/°C
W
°C
°C/W
V
V
V
E
R
R
R
DSS
DGR
GS
GS
I
I
I
DM
P
AS
q
q
q
T
D
D
D
JC
JA
JA
L
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V
(BR)DSS
60 V
G
R
TYP
DS(on)
51 mW
N−Channel
D
ID MAX
18 A
S
MARKING
DIAGRAMS
4
Drain
4
DPAK
2
1
3
1
2
3
CASE 369C
STYLE 2
1
Gate
4
DPAK−3
CASE 369D
STYLE 2
1
Gate
18N06 = Device Code
Y= Year
WW= Work Week
G= Pb−Free Device
YWW18N06G
2
3
Drain
Source
4
Drain
YWW18N06G
3
2
Source
Drain
ORDERING INFORMATION
See detailed ordering and shipping information in the package
dimensions section on page 7 of this data sheet.
4. Switching characteristics are independent of operating junction temperatures.
SymbolMinTypMaxUnit
V
(BR)DSS
I
DSS
GSS
V
GS(th)
R
DS(on)
V
DS(on)
FS
C
iss
C
oss
rss
t
d(on)
r
d(off)
f
Q
T
Q
1
Q
2
V
SD
t
rr
t
a
t
b
RR
60
−
70.8
68.8
−
−
Vdc
mV/°C
mAdc
−
−
−
−
1.0
10
−−±100nAdc
2.0
−
3.1
7.0
4.0
−
Vdc
mV/°C
mW
−5160
Vdc
−
−
0.91
0.85
1.3
−
−10.1−mhos
−509710pF
−162230
−47100
−1225ns
−2350
−1940
−2040
−15.330nC
−3.2−
−7.3−
−
−
0.98
0.87
1.15
−
Vdc
−42−
−31−
−11−
−0.066−
ns
mC
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2
Page 3
NTD18N06
40
30
20
VGS = 10 V
9 V
8 V
7 V
6.5 V
6 V
40
VDS ≥ 10 V
30
20
5.5 V
10
, DRAIN CURRENT (AMPS)
D
I
5 V
10
, DRAIN CURRENT (AMPS)
D
I
TJ = 25°C
TJ = 100°C
TJ = −55°C
0
04
, DRAIN−TO−SOURCE VOLTAGE (VOLTS)
V
DS
21
3
0
33.87
V
GS
4.65.4
, GATE−TO−SOURCE VOLTAGE (VOLTS)
Figure 1. On−Region CharacteristicsFigure 2. Transfer Characteristics
0.12
0.1
0.08
0.06
VGS = 10 V
TJ = 100°C
TJ = 25°C
0.12
0.1
0.08
0.06
VGS = 15 V
TJ = 100°C
TJ = 25°C
6.2
7.8
0.04
0.02
, DRAIN−TO−SOURCE RESISTANCE (W)
DS(on)
R
0
0
TJ = −55°C
ID, DRAIN CURRENT (AMPS)
Figure 3. On−Resistance versus
Gate−to−Source Voltage
2
ID = 9 A
V
= 10 V
1.8
GS
1.6
1.4
1.2
(NORMALIZED)
1
0.8
, DRAIN−TO−SOURCE RESISTANCE
0.6
DS(on)
−5050250−2575125100
R
TJ, JUNCTION TEMPERATURE (°C)
Figure 5. On−Resistance Variation with
Temperature
0.04
TJ = −55°C
0.02
, DRAIN−TO−SOURCE RESISTANCE (W)
2010
30
40
020103040
R
0
DS(on)
ID, DRAIN CURRENT (AMPS)
Figure 4. On−Resistance versus Drain Current
and Gate Voltage
1000
VGS = 0 V
TJ = 150°C
100
, LEAKAGE (nA)
10
DSS
I
TJ = 100°C
1
150 175
0405030206010
VDS, DRAIN−TO−SOURCE VOLTAGE (VOLTS)
Figure 6. Drain−to−Source Leakage Current
versus Voltage
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NTD18N06
POWER MOSFET SWITCHING
Switching behavior is most easily modeled and predicted
by recognizing that the power MOSFET is charge
controlled. The lengths of various switching intervals (Dt)
are determined by how fast the FET input capacitance can
be charged by current from the generator.
The published capacitance data is difficult to use for
calculating rise and fall because drain−gate capacitance
varies greatly with applied voltage. Accordingly, gate
charge data is used. In most cases, a satisfactory estimate of
average input current (I
) can be made from a
G(AV)
rudimentary analysis of the drive circuit so that
t = Q/I
G(AV)
During the rise and fall time interval when switching a
resistive load, V
known as the plateau voltage, V
remains virtually constant at a level
GS
. Therefore, rise and fall
SGP
times may be approximated by the following:
t
= Q2 x RG/(VGG − V
r
tf = Q2 x RG/V
GSP
GSP
)
where
= the gate drive voltage, which varies from zero to V
V
GG
GG
RG = the gate drive resistance
and Q
and V
2
are read from the gate charge curve.
GSP
During the turn−on and turn−off delay times, gate current is
not constant. The simplest calculation uses appropriate
values from the capacitance curves in a standard equation for
voltage change in an RC network. The equations are:
t
d(on)
t
d(off)
= RG C
= RG C
In [VGG/(V
iss
In (VGG/V
iss
GG
GSP
− V
)
GSP
)]
The capacitance (C
) is read from the capacitance curve at
iss
a voltage corresponding to the off−state condition when
calculating t
on−state when calculating t
and is read at a voltage corresponding to the
d(on)
.
d(off)
At high switching speeds, parasitic circuit elements
complicate the analysis. The inductance of the MOSFET
source lead, inside the package and in the circuit wiring
which is common to both the drain and gate current paths,
produces a voltage at the source which reduces the gate drive
current. The voltage is determined by Ldi/dt, but since di/dt
is a function of drain current, the mathematical solution is
complex. The MOSFET output capacitance also
complicates the mathematics. And finally, MOSFETs have
finite internal gate resistance which effectively adds to the
resistance of the driving source, but the internal resistance
is difficult to measure and, consequently, is not specified.
The resistive switching time variation versus gate
resistance (Figure 9) shows how typical switching
performance is affected by the parasitic circuit elements. If
the parasitics were not present, the slope of the curves would
maintain a value of unity regardless of the switching speed.
The circuit used to obtain the data is constructed to minimize
common inductance in the drain and gate circuit loops and
is believed readily achievable with board mounted
components. Most power electronic loads are inductive; the
data in the figure is taken with a resistive load, which
approximates an optimally snubbed inductive load. Power
MOSFETs may be safely operated into an inductive load;
however, snubbing reduces switching losses.
1400
1200
C
iss
1000
800
C
rss
600
400
C, CAPACITANCE (pF)
200
0
10010152025
55
GATE−TO−SOURCE OR DRAIN−TO−SOURCE VOLTAGE (VOLTS)
VGS = 0 VVDS = 0 V
C
rss
V
Figure 7. Capacitance Variation
V
GS
DS
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4
TJ = 25°C
C
C
iss
oss
Page 5
NTD18N06
12
Q
T
V
GS
Q
2
ID = 18 A
T
12
, GATE−TO−SOURCE VOLTAGE (VOLTS)
GS
V
10
8
Q
1
6
4
2
0
0
4816
, TOTAL GATE CHARGE (nC)
Q
G
Figure 8. Gate−To−Source and Drain−To−Source
Voltage versus Total Charge
DRAIN−TO−SOURCE DIODE CHARACTERISTICS
20
VGS = 0 V
T
= 25°C
16
12
J
= 25°C
J
1000
100
t
d(off)
t
t, TIME (ns)
10
1
110100
r
t
d(on)
RG, GATE RESISTANCE (W)
t
f
VDS = 30 V
I
= 18 A
D
V
GS
Figure 9. Resistive Switching Time
Variation versus Gate Resistance
= 10 V
8
4
, SOURCE CURRENT (AMPS)
S
I
0
0.6
0.680.761
VSD, SOURCE−TO−DRAIN VOLTAGE (VOLTS)
Figure 10. Diode Forward Voltage versus Current
SAFE OPERATING AREA
The Forward Biased Safe Operating Area curves define
the maximum simultaneous drain−to−source voltage and
drain current that a transistor can handle safely when it is
forward biased. Curves are based upon maximum peak
junction temperature and a case temperature (T
) of 25°C.
C
Peak repetitive pulsed power limits are determined by using
the thermal response data in conjunction with the procedures
discussed in AN569, “Transient Thermal Resistance −
General Data and Its Use.”
Switching between the off−state and the on−state may
traverse any load line provided neither rated peak current
(I
) nor rated voltage (V
DM
transition time (t
r,tf
) do not exceed 10 ms. In addition the total
) is exceeded and the
DSS
power averaged over a complete switching cycle must not
exceed (T
J(MAX)
− TC)/(R
).
JC
q
A Power MOSFET designated E−FET can be safely used
in switching circuits with unclamped inductive loads. For
0.840.92
reliable operation, the stored energy from circuit inductance
dissipated in the transistor while in avalanche must be less
than the rated limit and adjusted for operating conditions
differing from those specified. Although industry practice is
to rate in terms of energy, avalanche energy capability is not
a constant. The energy rating decreases non−linearly with an
increase of peak current in avalanche and peak junction
temperature.
Although many E−FETs can withstand the stress of
drain−to−source avalanche at currents up to rated pulsed
current (I
continuous current (I
), the energy rating is specified at rated
DM
), in accordance with industry custom.
D
The energy rating must be derated for temperature as shown
in the accompanying graph (Figure 12). Maximum energy at
currents below rated continuous I
can safely be assumed to
D
equal the values indicated.
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NTD18N06
SAFE OPERATING AREA
100
VGS = 20 V
SINGLE PULSE
TC = 25°C
10
100 ms
10 ms
1 ms
1
, DRAIN CURRENT (AMPS)
D
I
R
LIMIT
DS(on)
THERMAL LIMIT
10 ms
PACKAGE LIMIT
0.1
0.11100
V
, DRAIN−TO−SOURCE VOLTAGE (VOLTS)
DS
10175
Figure 11. Maximum Rated Forward Biased
Safe Operating Area
1.0
D = 0.5
0.2
0.1
0.1
0.05
0.02
(NORMALIZED)
0.01
SINGLE PULSE
0.01
r(t), EFFECTIVE TRANSIENT THERMAL RESISTANCE
Figure 13. Thermal Response
dc
80
60
40
20
AVALANCHE ENERGY (mJ)
, SINGLE PULSE DRAIN−TO−SOURCE
0
AS
E
P
(pk)
t
1
DUTY CYCLE, D = t1/t
t, TIME (ms)
ID = 12 A
255075100125
150
TJ, STARTING JUNCTION TEMPERATURE (°C)
Figure 12. Maximum Avalanche Energy versus
Starting Junction Temperature
R
(t) = r(t) R
q
JC
D CURVES APPLY FOR POWER
PULSE TRAIN SHOWN
READ TIME AT t
t
2
2
T
J(pk)
− TC = P
q
JC
(pk)
1.0E+001.0E+011.0E−011.0E−021.0E−031.0E−041.0E−05
1
R
(t)
q
JC
di/dt
I
S
t
rr
t
t
a
b
TIME
t
p
0.25 I
S
I
S
Figure 14. Diode Reverse Recovery Waveform
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NTD18N06
ORDERING INFORMATION
DevicePackageShipping
NTD18N06DPAK75 Units/Rail
NTD18N06GDPAK
(Pb−Free)
NTD18N06−1DPAK−375 Units/Rail
NTD18N06−1GDPAK−3
(Pb−Free)
NTD18N06T4DPAK2500 Tape & Reel
NTD18N06T4GDPAK
(Pb−Free)
†For information on tape and reel specifications, including part orientation and tape sizes, please refer to our Tape and Reel Packaging
Specifications Brochure, BRD8011/D.
75 Units/Rail
75 Units/Rail
2500 Tape & Reel
†
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NTD18N06
PACKAGE DIMENSIONS
DPAK
CASE 369C−01
ISSUE O
SEATING
−T−
PLANE
B
V
S
R
4
A
123
K
F
L
D
2 PL
G
0.13 (0.005)T
C
E
Z
U
J
H
M
DIM MINMAXMIN MAX
A 0.235 0.2455.976.22
B 0.250 0.2656.356.73
C 0.086 0.0942.192.38
D 0.027 0.0350.690.88
E 0.018 0.0230.460.58
F 0.037 0.0450.941.14
G0.180 BSC4.58 BSC
H 0.034 0.0400.871.01
J 0.018 0.0230.460.58
K 0.102 0.1142.602.89
L0.090 BSC2.29 BSC
R 0.180 0.2154.575.45
S 0.025 0.0400.631.01
U 0.020−−−0.51−−−
V 0.035 0.0500.891.27
Z 0.155−−−3.93−−−
STYLE 2:
PIN 1. GATE
2. DRAIN
3. SOURCE
4. DRAIN
MILLIMETERSINCHES
SOLDERING FOOTPRINT*
6.20
0.244
2.58
0.101
5.80
0.228
*For additional information on our Pb−Free strategy and soldering
details, please download the ON Semiconductor Soldering and
Mounting Techniques Reference Manual, SOLDERRM/D.
3.0
0.118
1.6
0.063
SCALE 3:1
6.172
0.243
ǒ
inches
mm
Ǔ
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NTD18N06
PACKAGE DIMENSIONS
DPAK−3
CASE 369D−01
ISSUE B
V
S
−T−
SEATING
PLANE
F
B
R
4
123
G
A
K
J
3 PL
D
0.13 (0.005)T
C
E
H
M
NOTES:
1. DIMENSIONING AND TOLERANCING PER
ANSI Y14.5M, 1982.
2. CONTROLLING DIMENSION: INCH.
DIM MINMAXMIN MAX
Z
A 0.235 0.2455.976.35
B 0.250 0.2656.356.73
C 0.086 0.0942.192.38
D 0.027 0.0350.690.88
E 0.018 0.0230.460.58
F 0.037 0.0450.941.14
0.090 BSC2.29 BSC
G
H 0.034 0.0400.871.01
J 0.018 0.0230.460.58
K 0.350 0.3808.899.65
R 0.180 0.2154.455.45
S 0.025 0.0400.631.01
V 0.035 0.0500.891.27
Z 0.155−−−3.93−−−
STYLE 2:
PIN 1. GATE
2. DRAIN
3. SOURCE
4. DRAIN
MILLIMETERSINCHES
ON Semiconductor and are registered trademarks of Semiconductor Components Industries, LLC (SCILLC). SCILLC reserves the right to make changes without further notice
to any products herein. SCILLC makes no warranty, representation or guarantee regarding the suitability of its products for any particular purpose, nor does SCILLC assume any liability
arising out of the application or use of any product or circuit, and specifically disclaims any and all liability, including without limitation special, consequential or incidental damages.
“Typical” parameters which may be provided in SCILLC data sheets and/or specifications can and do vary in different applications and actual performance may vary over time. All
operating parameters, including “Typicals” must be validated for each customer application by customer’s technical experts. SCILLC does not convey any license under its patent rights
nor the rights of others. SCILLC products are not designed, intended, or authorized for use as components in systems intended for surgical implant into the body, or other applications
intended to support or sustain life, or for any other application in which the failure of the SCILLC product could create a situation where personal injury or death may occur. Should
Buyer purchase or use SCILLC products for any such unintended or unauthorized application, Buyer shall indemnify and hold SCILLC and its officers, employees, subsidiaries, affiliates,
and distributors harmless against all claims, costs, damages, and expenses, and reasonable attorney fees arising out of, directly or indirectly, any claim of personal injury or death
associated with such unintended or unauthorized use, even if such claim alleges that SCILLC was negligent regarding the design or manufacture of the part. SCILLC is an Equal
Opportunity/Affirmative Action Employer. This literature is subject to all applicable copyright laws and is not for resale in any manner.
PUBLICATION ORDERING INFORMATION
LITERATURE FULFILLMENT:
Literature Distribution Center for ON Semiconductor
P.O. Box 61312, Phoenix, Arizona 85082−1312 USA
Phone: 480−829−7710 or 800−344−3860 Toll Free USA/Canada
Fax: 480−829−7709 or 800−344−3867Toll Free USA/Canada
Email: [email protected]
N. American Technical Support: 800−282−9855 Toll Free
USA/Canada
Japan: ON Semiconductor, Japan Customer Focus Center
2−9−1 Kamimeguro, Meguro−ku, Tokyo, Japan 153−0051
Phone: 81−3−5773−3850
http://onsemi.com
ON Semiconductor Website: http://onsemi.com
Order Literature: http://www.onsemi.com/litorder
For additional information, please contact your
local Sales Representative.
NTD18N06/D
9
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