NE76118 is a n-channel GaAs MES FET housed in MOLD package.
FEATURES
• Low noise figure
NF = 0.8 dB TYP. at f = 2 GHz
• High associated gain
Ga = 13.5 dB TYP. at f = 2 GHz
• Gate width : Wg = 400 Pm
• 4 pins super mini mold
• Tape & reel packaging only available
ORDERING INFORMATION
PART
NUMBER
NE76118-T13 Kpcs/Reel.Embossed tape 8 mm wide. Pin 3 (Source),
NE76118-T23 Kpcs/Reel.Embossed tape 8 mm wide. Pin 1 (Source),
QUANTITYPACKING STYLE
Pin 4 (Drain) face to perforation side of the
tape.
Pin 2 (Gate) face to perforation side of the
tape.
PACKAGE DIMENSIONS
in millimeters
2.1±0.2
1.25±0.1
+0.1
–0.05
V52
12
0 to 0.1
PIN CONNECTIONS
1. Source
2. Gate
3. Source
4. Drain
(1.25)
2.0±0.2
0.9±0.1
0.650.60
+0.1
0.3
–0.05
0.4
0.3
+0.1
–0.05
0.3
(1.3)
+0.1
–0.05
43
0.3
+0.1
–0.05
0.15
* Please contact with responsible NEC person, if you require evaluation
sample. Unit sample quantity shall be 50 pcs. (Part No.: NE76118)
ABSOLUTE MAXIMUM RATINGS (TA = 25
Drain to Source VoltageV
Gate to Source VoltageV
Gate to Drain VoltageV
Drain CurrentI
Total Power DissipationP
Channel TemperatureT
Storage TemperatureT
Document No. P11129EJ2V0DS00 (2nd edition)
Date Published January 1997 N
Printed in Japan
Drain to Source VoltageV
Drain CurrentI
Input PowerP
DS
D
in
34V
1020mA
0dBm
ELECTRICAL CHARACTERISTICS (TA = 25 qqqqC)
CHARACTERISTICSYMBOLMIN.TYP.MAX.UNITTEST CONDITIONS
Gate to Source Leak CurrentI
Saturated Drain CurrentI
Gate to Source C u t off VoltageV
Transconductancegm2045ðmSVDS = 3 V, ID = 10 mA
Noise FigureNF0.8dBf = 2 GHz
Associated GainGa13.5dB
Noise FigureNF0.91.4dBf = 4 GHz
Associated GainGa9.510.5dB
DSS
I
rank is specified as follows.
K : 30 to 100 mA
M : 50 to 100 mA
VDS = 3 V, ID = 10 mA
START 100 MHz, STOP 3 GHz, STEP 100 MHz
NE76118
S11
1.0
0.5
0
–0.5
–1.0
S22
2.0
MARKERS
1: 1 GHz
2: 2 GHz
∞
2
1
–2.0
1.0
0.5
0
–0.5
–1.0
2.0
∞
2
1
–2.0
5
Page 6
NE76118
RECOMMENDED SOLDERING CONDITIONS
The following conditions (see table below) must be met when soldering this product.
Please consult with our sales offices in case other soldering process is used, or in case soldering is done under
different conditions.
<TYPES OF SURFACE MOUNT DEVICE>
For more details, refer to our document “SEMICONDUCTOR DEVICE MOUNTING TECHNOLOGY MANUAL”
(C10535E).
Soldering processSoldering conditionsSymbol
VPSPackage peak temperature : 215 °C, Time : 40 seconds MAX.
(200 °C MIN.), Number of times : 2, Number of days : not limited*
Wave solderingSoldering bath temperature : 260 °C MAX., Time : 10 seconds MAX.,
Number of times : 1, Number of days : not limited*
Infrared ray reflowPeak package’s surface temperature: 230 °C or below,
Reflow time: 30 seconds or below (210 °C or higher),
Number of reflow process: 2, Exposure limit*: None
Partial heating methodTerminal temperature: 230 °C or below,
Flow time: 10 seconds or below,
Exposure limit*: None
VP15-00-2
WS60-00-1
IR30-00-2
* Exposure limit before soldering after dry-pack package is opened.
Storage conditions: 25 °C and relative humidity at 65 % or less.
Do not apply more than a single process at once, except for “Partial heating method”.
Note
PRECAUTION Avoid high static voltage and electric fields, because this device is MES FET with GaAs
shottky barrier gate.
6
Page 7
[MEMO]
NE76118
7
Page 8
NE76118
Caution
The Great Care must be taken in dealing with the devices in this guide.
The reason is that the material of the devices is GaAs (Gallium Arsenide), which is
designated as harmful substance according to the law concerned.
Keep the law concerned and so on, especially in case of removal.
No part of this document may be copied or reproduced in any form or by any means without the prior written
consent of NEC Corporation. NEC Corporation assumes no responsibility for any errors which may appear in this
document.
NEC Corporation does not assume any liability for infringement of patents, copyrights or other intellectual
property rights of third parties by or arising from use of a device described herein or any other liability arising
from use of such device. No license, either express, implied or otherwise, is granted under any patents,
copyrights or other intellectual property rights of NEC Corporation or others.
While NEC Corporation has been making continuous effort to enhance the reliability of its semiconductor devices,
the possibility of defects cannot be eliminated entirely. To minimize risks of damage or injury to persons or
property arising from a defect in an NEC semiconductor device, customers must incorporate sufficient safety
measures in its design, such as redundancy, fire-containment, and anti-failure features.
NEC devices are classified into the following three quality grades:
"Standard", "Special", and "Specific". The Specific quality grade applies only to devices developed based on
a customer designated "quality assurance program" for a specific application. The recommended applications
of a device depend on its quality grade, as indicated below. Customers must check the quality grade of each
device before using it in a particular application.
Standard: Computers, office equipment, communications equipment, test and measurement equipment,
audio and visual equipment, home electronic appliances, machine tools, personal electronic
equipment and industrial robots
Special: Transportation equipment (automobiles, trains, ships, etc.), traffic control systems, anti-disaster
systems, anti-crime systems, safety equipment and medical equipment (not specifically designed
for life support)
Specific: Aircrafts, aerospace equipment, submersible repeaters, nuclear reactor control systems, life
support systems or medical equipment for life support, etc.
The quality grade of NEC devices is "Standard" unless otherwise specified in NEC's Data Sheets or Data Books.
If customers intend to use NEC devices for applications other than those specified for Standard quality grade,
they should contact an NEC sales representative in advance.
Anti-radioactive design is not implemented in this product.
M4 96. 5
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