P-Channel Enhancement Mode Field Effect Transistor
General Description Features
Power SOT P-Channel enhancement mode power field
effect transistors are produced using Fairchild's
proprietary, high cell density, DMOS technology. This
very high density process is especially tailored to
minimize on-state resistance and provide superior
switching performance. These devices are particularly
suited for low voltage applications such as notebook
computer power management, battery powered circuits,
and DC motor control.
Forward TransconductanceVGS = -10 V, ID = -7.5 A13S
DYNAMIC CHARACTERISTICS
C
iss
C
oss
C
rss
Input CapacitanceVDS = -15 V, V
Output Capacitance905pF
f = 1.0 MHz
GS
= 0 V,
1440pF
Reverse Transfer Capacitance355pF
SWITCHING CHARACTERISTICS (Note 2)
t
t
t
t
Q
Q
Q
D(on)
r
D(off)
f
g
gs
gd
Turn - On Delay TimeVDD = -15 V, ID = -7 A,
V
= -10 V, R
Turn - On Rise Time65120ns
GEN
GEN
= 12 Ω
1020ns
Turn - Off Delay Time70130ns
Turn - Off Fall Time70130ns
Total Gate ChargeVDS = -10 V,
Gate-Source Charge5nC
ID = -7.5 A, VGS = -10 V
4767nC
Gate-Drain Charge12nC
NDT456P Rev. F
Page 3
Electrical Characteristics(T
(t)
T
−
T
θJA
T
−
T
θJC+RθCA
(t)
= 25°C unless otherwise noted)
A
SymbolParameterConditionsMinTypMaxUnits
DRAIN-SOURCE DIODE CHARACTERISTICS AND MAXIMUM RATINGS
I
S
V
SD
t
rr
Notes:
P
1. R
D
solder mounting surface of the drain pins. R
typical R
Maximum Continuous Drain-Source Diode Forward Current-2.5A
Drain-Source Diode Forward VoltageVGS = 0 V, IS = - 2.5 A (Note 2)- 0.85-1.2V
Reverse Recovery TimeVGS = 0 V, IF = - 2.5 A dIF/dt = 100 A/µs140ns
J
A
=
R
is found to be:
JA
θ
a. 42oC when mounted on a 1 in2 pad of 2oz copper.
b. 95oC when mounted on a 0.066in2 pad of 2oz copper.
c. 110oC/W when mounted on a 0.00123in2 pad of 2oz copper.
J
=
(t)
R
2
A
= I
(t)
is guaranteed by design while R
JC
θ
×R
DS(ON)@T
D
is the sum of the junction-to-case and case-to-ambient thermal resistance where the case thermal reference is defined as the
JA
θ
J
is defined by users. For general reference: Applications on 4.5"x5" FR-4 PCB under still air environment,
Figure 16. Maximum Safe Operating Area.
Current versus Copper Mounting Pad
Area.
1
0.5
D = 0.5
0.2
0.2
0.1
0.1
0.05
0.02
0.01
0.005
r(t), NORMALIZED EFFECTIVE
0.002
TRANSIENT THERMAL RESISTANCE
0.001
0.05
0.02
0.01
Single Pulse
0.00010.0010.010.1110100300
Figure 17. Transient Thermal Response Curve.
Note: Thermal characterization performed using the conditions described in note 1c. Transient thermal
response will change depending on the circuit board design.
t , TIME (sec)
1
R (t) = r(t) * R
JA
θ
R = See Note 1 c
JA
θ
P(pk)
t
1
t
2
T - T = P * R (t)
J
Duty Cycle, D = t / t
θ
JA
θ
JAA
2
1
NDT456P Rev. F
Page 7
TRADEMARKS
The following are registered and unregistered trademarks Fairchild Semiconductor owns or is authorized to use and is
not intended to be an exhaustive list of all such trademarks.
ACEx™
CoolFET™
CROSSVOLT™
2
E
CMOS
TM
FACT™
FACT Quiet Series™
®
FAST
FASTr™
GTO™
HiSeC™
ISOPLANAR™
MICROWIRE™
POP™
PowerTrench™
QFET™
QS™
Quiet Series™
SuperSOT™-3
SuperSOT™-6
SuperSOT™-8
TinyLogic™
UHC™
VCX™
DISCLAIMER
FAIRCHILD SEMICONDUCTOR RESERVES THE RIGHT TO MAKE CHANGES WITHOUT FURTHER
NOTICE TO ANY PRODUCTS HEREIN TO IMPROVE RELIABILITY, FUNCTION OR DESIGN. FAIRCHILD
DOES NOT ASSUME ANY LIABILITY ARISING OUT OF THE APPLICA TION OR USE OF ANY PRODUCT
OR CIRCUIT DESCRIBED HEREIN; NEITHER DOES IT CONVEY ANY LICENSE UNDER ITS PATENT
RIGHTS, NOR THE RIGHTS OF OTHERS.
LIFE SUPPORT POLICY
FAIRCHILD’S PRODUCTS ARE NOT AUTHORIZED FOR USE AS CRITICAL COMPONENTS IN LIFE SUPPORT
DEVICES OR SYSTEMS WITHOUT THE EXPRESS WRITTEN APPROV AL OF FAIRCHILD SEMICONDUCTOR CORPORA TION.
As used herein:
1. Life support devices or systems are devices or
systems which, (a) are intended for surgical implant into
the body, or (b) support or sustain life, or (c) whose
failure to perform when properly used in accordance
with instructions for use provided in the labeling, can be
reasonably expected to result in significant injury to the
user.
2. A critical component is any component of a life
support device or system whose failure to perform can
be reasonably expected to cause the failure of the life
support device or system, or to affect its safety or
effectiveness.
PRODUCT STA TUS DEFINITIONS
Definition of Terms
Datasheet IdentificationProduct StatusDefinition
Advance Information
Preliminary
No Identification Needed
Obsolete
Formative or
In Design
First Production
Full Production
Not In Production
This datasheet contains the design specifications for
product development. Specifications may change in
any manner without notice.
This datasheet contains preliminary data, and
supplementary data will be published at a later date.
Fairchild Semiconductor reserves the right to make
changes at any time without notice in order to improve
design.
This datasheet contains final specifications. Fairchild
Semiconductor reserves the right to make changes at
any time without notice in order to improve design.
This datasheet contains specifications on a product
that has been discontinued by Fairchild semiconductor.
The datasheet is printed for reference information only.
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