Datasheet NDL5551P2, NDL5551P2C, NDL5551PC, NDL5551P1C, NDL5551P Datasheet (NEC)

Page 1
DATA SHEET
PHOTO DIODE
NDL5551P Series
1 000 to 1 600 nm OPTICAL FIBER COMMUNICATIONS
φφφφ
µµµµ
50
m InGaAs AVALANCHE PHOTO DIODE MODULE
DESCRIPTION
NDL5551P Series is InGaAs avalanche photo diode modules with multimode fiber. They are designed for
detectors of long wavelength transmission systems and cover the wavelength range between 1 000 and 1 600 nm.
FEATURES
Smaller dark current ID = 5 nA
High quantum efficiency
High Speed response fC = 1.2 GHz @M = 20
Detecting area size
Coaxial module with multimode fiber (GI-50/125)
NDL5551P1 and NDL5551P2 have a flange.
η
= 90 % @ λ = 1 300 nm, M = 1
η
= 77 % @ λ = 1 550 nm, M = 1
φ
50 µm
NDL5551P
Optical Fiber: GI-50/125 Length: 1 m MIN.
+0.0
φ
6.0
–0.1
6.9±0.3
–0.1
+0.0
6.0
231
Shrunk tube
φ
2.5
φ
0.45
φ
2.0
30.0 MAX.
12.5 MIN.
3.0±0.3
PACKAGE DIMENSIONS
in millimeters
NDL5551P1
Optical Fiber: GI-50/125 Length: 1 m MIN.
φ
14.0±0.1
φ
3.9±0.5
6.9±0.3
φ
2– 2.2
1.5
7.0±0.3
231
18.0±0.1
LEAD CONNECTION
1 Anode (Negative) 2 Cathode (Positive) 3 Case
Optical Fiber:
NDL5551P2
GI-50/125 Length: 1 m MIN.
Shrunk tube Shrunk tube
2.5
6.0
+0.0 –0.1
φ
2.0
30.0 MAX.
4.0±0.1
12.5 MIN.
4.0±0.3
3
12
φ
6.0
0.5±0.1
2.5±0.1
+0.0 –0.1
φ
231
12.0±0.1
16.0±0.2
φ
2.5
2– 2.5
2.0
30.0 MAX.
12.5 MIN.
φ
7.0±0.15
The information in this document is subject to change without notice.
Document No. P11103EJ2V0DS00 (2nd edition) (Previous No. LD-2371) Date Published March 1996 P Printed in Japan
The mark
••••
shows major revised points.
1994©
Page 2
ORDERING INFORMATION
NDL5551P Series
Part Number NDL5551P Without Connector no flange NDL5551PC With FC-PC Connector NDL5551PD With SC-P C Connector NDL5551P1 Without Connector flat mount flange NDL5551P1C With FC-PC Connector NDL5551P1D With SC-P C Connector NDL5551P2 Without Connector vertical flange NDL5551P2C With FC-PC Connector NDL5551P2D With SC-P C Connector
ABSOLUTE MAXIMUM RATINGS (TC = 25
Parameter Symbol Ratings Unit Forward Current I Reverse Current I Operating Case Temperature T Storage Temperature T
Available Connector
F
R
C
stg
C)
°°°°
10 mA
0.5 mA
40 to +85
40 to +85
°
C
°
C
ELECTRO-OPTICAL CHARACTERISTICS (TC = 25
Parameter Symbol Conditions MIN. TYP. MAX. Unit Reverse Breakdown Voltage V Temperature Coefficient of
Reverse Breakdown Voltage Dark Current I Multiplied Dark Current I Terminal Capacitance C Cut-off Frequency f
Quantum Effici ency
Responsivity S
Multiplication Factor M
Excess Noise Exponent x Excess Noise Factor F M = 10, f = 35 MHz, B = 1 MHz 5
(BR)R
*1
δ
D
DM
C
η
ID = 100 µA 50 70 100 V
(BR)R
VR = V M = 2 to 10 1 5 nA
t
(BR)R
VR = V M = 10 1 1. 5 GHz M = 20 1.2
λ
= 1 300 nm, M = 1 76 90 %
λ
= 1 550 nm, M = 1 65 77
λ
= 1 300 nm, M = 1 0.8 0.94 A/W
λ
= 1 550 nm, M = 1 0.81 0.96
λ
= 1 300 nm, IP0 = 1.0 µA3040
R
V
= V (@ ID = 1 µA)
λ
= 1 300 nm, 1550 nm, IP0 = 1.0 µA0.7
C)
°°°°
× 0.9 5 30 nA
× 0.9, f = 1 MHz 0.4 0.75 pF
0.2 %/°C
*1:
(BR)R
V
δ
=
< 25 °C + ∆T °C > −V
T °C ⋅ V
(BR)R
< 25 °C
(BR)R
>
< 25 °C
>
2
Page 3
NDL5551P Series
TYPICAL CHARACTERISTICS
WAVELENGTH DEPENDENCE OF QUANTUM EFFICIENCY
100
80
η
60
40
20
Quantum Efficiency (%)
0
0.9 1.0 1.1 1.31.2 1.4 1.5 1.6 1.7 Wavelength λ ( m)
µ
TC = 25 ˚C
DARK CURRENT and PHOTO CURRENT vs. REVERSE VOLTAGE
–3
10
10
10
10
–4
–5
–6
λ = 1 300 nm
P0 = 1.0 A
I
C = 25 ˚C
T
Iph
µ
TEMPERATURE DEPENDENCE OF RESPONSIVITY
10
0
–10
–60 –40 0 40 10080
Responsivity (Relative Value) S/S (%)
–20 20 60
Operating Case Temperature T
DARK CURRENT vs. REVERSE VOLTAGE
–6
10
–7
10
(A)
D
–8
10
–9
10
Dark Current I
–10
10
0 40 10080
TC = 85 ˚C
C
= 65 ˚C
T
T
C
= 25 ˚C
20 60
Reverse Voltage VR (V)
λ = 1 300 nm
C
(˚C)
T
C
= –20 ˚C
••••
–7
10
–8
10
Dark Current, Photo Current ID, lph (A)
–9
10
–10
10
0 20 40 60 10080
Reverse Voltage VR (V)
MULTIPLICATION FACTOR vs. REVERSE VOLTAGE
3
10
2
10
TC = –20 ˚C
ID
1
10
TC = 25 ˚C
Multiplication Factor M
0
10
0 40 10080
20 60
TC = 65 ˚C
TC = 85 ˚C
Reverse Voltage VR (V)
3
Page 4
NDL5551P Series
TEMPERATURE DEPENDENCE OF DARK CURRENT and MULTIPLIED DARK CURRENT
–6
(A)
10
DM
, I
D
–7
10
–8
10
–9
10
–10
10
–11
10
Dark Current, Multiplied Dark Current I
ID @ VR = 0.9 V
0–60 –40 40 80 100
20
Operating Case Temperature T
λ = 1 300 nm
(BR)R
60–20
C
(˚C)
I
CUT-OFF FREQUENCY vs. MULTIPLICATION FACTOR
10
1
TC = 25 ˚C
FREQUENCY RESPONSE
λ = 1 300 nm
L
= 50
R M = 8 T
C
= 25 ˚C
DM
Response (3 dB/div.)
0
1.0 2.0 3.0 4.0 5.0 Frequency f (GHz)
TERMINAL CAPACITANCE vs. REVERSE VOLTAGE
2
(pF)
t
1
0.5
Cut-off Frequency fC (GHz)
0.1 1 100
10
Multiplication Factor M
EXCESS NOISE FACTOR vs. MULTIPLICATION FACTOR
100
1 300 nm ( ), 1 550 nm ( ) f = 35 MHz, B = 1 MHz
50
20 10
5
Excess Noise Factor F
2 1
51 2 20 50 100
10
Multiplication Factor M
0.5
0.4
0.2
Terminal Capacitance C
0.1 Reverse Voltage V
51 2 20 50 100
10
R
(V)
4
Page 5
NDL5551P Series
HANDLING PRECAUTION for PD/APD MODULE
The NEC PD/APD module has heat shrink tubing to protect the ferrule edge (*1) and the junction between the ferrule and the module body (*2). In order to avoid breaking the fiber and/or optical coupling degradation, NEC recommends the following handling precautions.
1. Do not make the fiber bend radius less than 30 mm (*3).
2. Do not bend the fiber within the 18 mm section from the module body (*4).
3. Do not stress the ferrule with a lateral force exceeding 500 g (*5).
30 mm min (*3)
fiber
(*1)
ferrule (*5)
(*2)
module body
18 mm min. (*4)
5
Page 6
InGaAs APD/PD FAMILY
••••
Features APD PIN-PD
30 µm
φ
Packages
TO-18 type Can NDL5530 NDL5500 NDL5510 3 pins TO-18 type Can
with Micro Lens Small Can
5.6 µm
φ
Chip on Carrier NDL5530C NDL5520C NDL5500C NDL5510C Receptacle Module NDL5471RC
Coaxial Module with MMF
Coaxial Module with SMF
14-pin DIP Module with TEC
6-pin BFY Module with MMF
(for 2.5 Gb/s)
NDL5531
50 µm
φ
(for 2.5 Gb/s)
NDL5521P NDL5521P1 NDL5521P2
NDL5522P NDL5422P With Pre-AMP
50 µm
φ
NDL5551P NDL5551P1 NDL5551P2 NDL5553P NDL5553P1 NDL5553P2
NDL5553PS NDL5553P1S NDL5553P2S
NDL5506P NDL5506PS
*1
*1
*1
*1
*1
*1
80 µm
φ
NDL5561P NDL5561P1 NDL5561P2
*2
*2
*2
50 µm
φ
(for 2.5 Gb/s)
NDL5490L
*3,4
NDL5490
*3,4
NDL5405L
NDL5471RD
NDL5461P NDL5461P1 NDL5461P2
NDL5481P NDL5481P1 NDL5481P2
NDL5551P Series
80 µm Remarks
φ
3 pins
3 pins RC: FC receptacle RD: SC receptacle
P1, P2: With flange
*5
*5
*5
T = 45 K (@ Ic = 1.1 A)
PS: With SMF
*1
For OTDR
*2
With GI-62.5/125
*3
Under development
*4
Internal pre-amplifier for 1Gb/s
*5
For analog application (optical CATV)
Remark
Modules are available with FC-PC connector or optional SC-PC connector.
6
Page 7
NDL5551P Series
REFERENCE
Document Name Document No. NEC semiconductor device reliabilit y/ qualit y c ontrol system IEI-1205 Quality grade on NEC semiconductor devices IEI-1209 Semiconductor devic e mounting technology manual C10535E Semiconductor devic e package manual IEI-1213 Guide to quality assurance for semiconductor devices MEI-1202 Semiconductor sel ection guide X10679E
7
Page 8
NDL5551P Series
CAUTION
Within this device there exists GaAs (Gallium Arsenide) material which is a harmful substance if ingested. Please do not under any circumstance break the hermetic seal.
The export of this product from Japan is prohibited without governmental license. To export or re-export this product from a country other than Japan may also be prohibited without a license from that country. Please call an NEC sales representative.
No part of this document may be copied or reproduced in any form or by any means without the prior written consent of NEC Corporation. NEC Corporation assumes no responsibility for any errors which may appear in this document. NEC Corporation does not assume any liability for infringement of patents, copyrights or other intellectual property rights of third parties by or arising from use of a device described herein or any other liability arising from use of such device. No license, either express, implied or otherwise, is granted under any patents, copyrights or other intellectual property rights of NEC Corporation or others. While NEC Corporation has been making continuous effort to enhance the reliability of its semiconductor devices, the possibility of defects cannot be eliminated entirely. To minimize risks of damage or injury to persons or property arising from a defect in an NEC semiconductor device, customer must incorporate sufficient safety measures in its design, such as redundancy, fire-containment, and anti-failure features. NEC devices are classified into the following three quality grades: "Standard", "Special", and "Specific". The Specific quality grade applies only to devices developed based on a customer designated "quality assurance program" for a specific application. The recommended applications of a device depend on its quality grade, as indicated below. Customers must check the quality grade of each device before using it in a particular application.
Standard: Computers, office equipment, communications equipment, test and measurement equipment, audio and visual equipment, home electronic appliances, machine tools, personal electronic equipment and industrial robots Special: Transportation equipment (automobiles, trains, ships, etc.), traffic control systems, anti-disaster systems, anti-crime systems, safety equipment and medical equipment (not specifically designed for life support) Specific: Aircrafts, aerospace equipment, submersible repeaters, nuclear reactor control systems, life support systems or medical equipment for life support, etc. The quality grade of NEC devices in "Standard" unless otherwise specified in NEC's Data Sheets or Data Books. If customers intend to use NEC devices for applications other than those specified for Standard quality grade, they should contact NEC Sales Representative in advance. Anti-radioactive design is not implemented in this product.
M4 94. 11
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