smaller than standard S O-8); low profile (1mm thic k)
C unless otherwise noted
(Note 1c)
= 5 Ω @ VGS = –10 V
DS(ON)
= 7 Ω @ VGS = –4.5 V
DS(ON)
TM
-6 package: small f ootprint (72%
4
5
6
3
2
1
±20
0.9
0.7
DS(ON)
V
W
°C
Dual P-Channel PowerTrench
General Description
These dual P-Channel Enhancement Mode Power Field
Effect Transistors are produced using Fairchild’s
proprietary Trench Technology. This very high density
process has been designed to minimize on-state
resistance, provide rugged and reliable performance
and fast switching. This product is particularly suited to
low voltage applications requiring a low current high
side switch.
D2
S1
D1
SuperSOT -6
TM
G1
Absolute Maximum RatingsT
Symbol Parameter Ratings Units
V
Drain-Source Voltage –60 V
DSS
V
Gate-Source Voltage
GSS
ID Drain Current – Continuous (Note 1a) –0.34 A
– Pulsed –1
PD
TJ, T
STG
Power Dissipation for Single Operation (Note 1a) 0.96
(Note 1b)
Operating and Storage Junction Temperature Range –55 to +150
Symbol Parameter Test Conditions Min Typ Max Units
Off Characteristics
BV
Drain–Source Breakdown Voltage
DSS
∆BVDSS
∆T
I
Zero Gate Voltage Drain Current VDS = –48 V, VGS = 0 V –1
DSS
I
Gate–Body Leakage,
GSS
Breakdown Voltage Temperature
Coefficient
J
= 0 V, ID = –250 µA
V
GS
I
= –250 µA, Referenced to 25°C
D
= ±20 V, VDS = 0 V
V
GS
–60 V
–57
mV/°C
µA
±100
nA
On Characteristics (Note 2)
V
Gate Threshold Voltage
GS(th)
∆VGS(th)
∆TJ
R
DS(on)
Gate Threshold Voltage
Temperature Coefficient
Static Drain–Source
On–Resistance
I
On-State Drain Current
D(on)
= VGS, ID = –250 µA
V
DS
I
= –250 µA, Referenced to 25°C
D
= –10 V, ID = –0.34 A
V
GS
= –4.5 V, ID = –0.25 A
V
GS
= –10 V,ID = –0.34 A, TJ=125°C
V
GS
= –10 V VDS = –10 V
V
GS
gFS Forward Transconductance VDS = –10 V, ID = –0.34 A 700 mS
–1 –1.9 –3.5 V
3.2
1.2
1.5
1.9
–1
5
7.5
10
mV/°C
Ω
A
Dynamic Characteristics
C
Input Capacitance 66 pF
iss
C
Output Capacitance 13 pF
oss
C
Reverse Transfer Capacitance
rss
RG Gate Resistance
= –25 V, V
V
DS
f = 1.0 MHz
V
15mV, f = 1.0 MHz
GS =
= 0 V,
GS
6 pF
11.2
Ω
Switching Characteristics (Note 2)
t
Turn–On Delay Time 3.2 6.4 ns
d(on)
tr Turn–On Rise Time 10 20 ns
t
Turn–Off Delay Time 8 16 ns
d(off)
tf Turn–Off Fall Time
Qg Total Gate Charge 1.6 2.2 nC
Qgs Gate–Source Charge 0.3 nC
Qgd Gate–Drain Charge
= –25 V, ID = –1 A,
V
DD
= –10 V, R
V
GS
V
= –25 V, ID = –0.34 A,
DS
V
= –10 V
GS
GEN
= 6 Ω
1 2 ns
0.3 nC
Drain–Source Diode Characteristics and Maximum Ratings
IS Maximum Continuous Drai n–Source Diode Forward Current –0.34 A
VSD Drain–Source Diode Forward
Voltage
Notes:
1. R
is the sum of the junction-to-case and case-to-ambient thermal resistance where the case thermal reference is defined as the solder mounting surface of
Figure 9. Maximum Safe Operating Area. Figure 10. Single Pulse Maximum
Power Dissipation.
1
r(t), NORMALIZED EFF EC T I VE T R A N SIENT
0.01
THERMAL RESISTANC E
0.001
0.1
D = 0.5
0.2
0.1
0.05
0.02
0.01
SINGLE PULSE
R
(t) = r(t) * R
θ
JA
R
= 180oC/W
θ
JA
P(pk
t
1
t
2
T
- TA = P * R
J
Duty Cycle, D = t
0.000010.00010.0010.010.11101001000
t1, TIME (sec)
Figure 11. Transient Thermal Response Curve.
Thermal characterization performed using the conditions described in Note 1c.
Transient themal response will change depending on the circuit board design.
θ
JA
(t)
θ
JA
/ t
1
2
NDC7003P Rev B(W)
Page 5
TRADEMARKS
The following are registered and unregistered trademarks Fairchild Semiconductor owns or is authorized to use and is
not intended to be an exhaustive list of all such trademarks.
FAIRCHILD SEMICONDUCTOR RESERVES THE RIGHT TO MAKE CHANGES WITHOUT FURTHER
NOTICE TO ANY PRODUCTS HEREIN TO IMPROVE RELIABILITY, FUNCTION OR DESIGN. FAIRCHILD
DOES NOT ASSUME ANY LIABILITY ARISING OUT OF THE APPLICATION OR USE OF ANY PRODUCT
OR CIRCUIT DESCRIBED HEREIN; NEITHER DOES IT CONVEY ANY LICENSE UNDER ITS PATENT
RIGHTS, NOR THE RIGHTS OF OTHERS.
LIFE SUPPORT POLICY
â
FAIRCHILDS PRODUCTS ARE NOT AUTHORIZED FOR USE AS CRITICAL COMPONENTS IN LIFE SUPPORT
DEVICES OR SYSTEMS WITHOUT THE EXPRESS WRITTEN APPROVAL OF FAIRCHILD SEMICONDUCTOR CORPORATION.
As used herein:
1. Life support devices or systems are devices or
systems which, (a) are intended for surgical implant into
the body, or (b) support or sustain life, or (c) whose
failure to perform when properly used in accordance
with instructions for use provided in the labeling, can be
reasonably expected to result in significant injury to the
user.
PRODUCT STATUS DEFINITIONS
Definition of Terms
Datasheet IdentificationProduct StatusDefinition
Advance Information
Preliminary
No Identification Needed
Formative or
In Design
First Production
Full Production
2. A critical component is any component of a life
support device or system whose failure to perform can
be reasonably expected to cause the failure of the life
support device or system, or to affect its safety or
effectiveness.
This datasheet contains the design specifications for
product development. Specifications may change in
any manner without notice.
This datasheet contains preliminary data, and
supplementary data will be published at a later date.
Fairchild Semiconductor reserves the right to make
changes at any time without notice in order to improve
design.
This datasheet contains final specifications. Fairchild
Semiconductor reserves the right to make changes at
any time without notice in order to improve design.
Obsolete
Not In Production
This datasheet contains specifications on a product
that has been discontinued by Fairchild semiconductor.
The datasheet is printed for reference information only.
Rev. H5
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