Philips Semiconductors Product specification
74F776Pi–bus transceiver
December 19, 1990
7
DC ELECTRICAL CHARACTERISTICS
(Over recommended operating free-air temperature range unless otherwise noted.)
SYMBOL
PARAMETER TEST LIMITS UNIT
CONDITIONS
1
MIN TYP2MAX
I
OH
High–level output current B0 – B7 VCC = MAX, VIL = MAX, VIH = MIN, VOH = 2.1V 100 µA
I
OFF
Power–off output current B0 – B7 VCC = 0.0V, VIL = MAX, VIH = MIN, VOH = 2.1V 100 µA
VCC = MIN, I
OH
= –3mA, VX =V
CC
2.5 V
CC
V
V
OH
High-level output voltage A0 – A7
4
VIL = MAX, VIH = MIN
I
OH
= –4mA,
VX =3.13V and 3.47V
2.5 V
A0 – A7
4
VCC = MIN, I
OL
= 20mA, VX = V
CC
0.50 V
V
OL
Low-level output voltage B0 – B7 VIL = MAX I
OL
= 100mA 1.15 V
VIH = MIN I
OL
= 4mA 0.40 V
V
IK
Input clamp voltage A0 – A7 VCC = MIN, II = I
IK
-0.5 V
Except A0 – A7 VCC = MIN, II = I
IK
-1.2 V
I
I
Input current at OEBn, OEA, LE VCC = 0.0V, VI = 7.0V 100 µA
maximum input voltage A0 – A7, B0 – B7 VCC = MAX, VI = 5.5V 1 mA
I
IH
High–level input current OEBn, OEA, LE VCC = MAX, VI = 2.7V , Bn –An =0V 20 µA
B0 – B7 VCC = MAX, VI = 2.1V 100 µA
I
IL
Low–level input current OEBn, OEA, LE VCC = MAX, VI = 0.5V –20 µA
B0 – B7 VCC = MAX, VI = 0.3V –100 µA
I
OZH
+ I
IH
Off state output current,
high level voltage applied
A0 – A7 VCC = MAX, V
O
= 2.7V 70
µA
I
OZL
+ I
IL
Off state output current,
low level voltage applied
A0 – A7 VCC = MAX, VO = 0.5V –70
µA
I
X
High–level control current
VCC = MAX, V
X
= VCC, LE = OEA = OEBn =
2.7V, A0 – A7 = 2.7V, B0 – B7 = 2.0V,
–100 100 µA
VCC = MAX, V
X
= 3.13 & 3.47V , LE = OEA =
2.7V, OEBn = A0 – A7 = 2.7V, B0 – B7 = 2.0V,
–10 10 µA
I
OS
Short circuit output
current
3
A0 – A7 only
VCC = MAX, Bn = 1.8V, OEA = 2.0V,
OEBn = 2.7V
-60 -150 mA
I
CCH
VCC = MAX 65 100 mA
I
CC
Supply current (total) I
CCL
VCC = MAX, VIL = 0.5V 100 145 mA
I
CCZ
75 100 mA
Notes to DC electrical characteristics
1. For conditions shown as MIN or MAX, use the appropriate value specified under recommended operating conditions for the applicable type.
Unless otherwise specified, V
X
= VCC for all test conditions.
2. All typical values are at VCC = 5V, T
amb
= 25°C.
3. Not more than one output should be shorted at a time. For testing I
OS
, the use of high-speed test apparatus and/or sample-and-hold
techniques are preferable in order to minimize internal heating and more accurately reflect operational values. Otherwise, prolonged shorting
of a high output may raise the chip temperature well above normal and thereby cause invalid readings in other parameter tests. In any
sequence of parameter tests, I
OS
tests should be performed last.
4. Due to test equipment limitations, actual test conditions are for V
IH
=1.8v and VIL = 1.3V .