Datasheet N74F219AN, N74F219AD Datasheet (Philips)

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INTEGRATED CIRCUITS
74F219A
64-bit TTL bipolar RAM, non-inverting (3-State)
Product specification 1996 Jan 05 IC15 Data Handbook
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74F219A64-bit TTL bipolar RAM, non-inverting (3-State)
FEA TURES
•High speed performance
•Replaces 74F219
•Address access time: 8ns max vs 28ns for 74F219
•Power dissipation: 4.3mW/bit typ
•Schottky clamp TTL
•One chip enable
•Non–Inverting outputs (for inverting outputs see 74F189A)
•3–state outputs
•74F219A in 150 mil wide SO is preferred options for new designs
•C3F219A in 300 mil wide SOL replaces 74F219 in existing
designs
DESCRIPTION
The 74F219A is a high speed, 64–bit RAM organized as a 16–word by 4–bit array. Address inputs are buf fered to minimize loading and are fully decoded on chip. The outputs are in high impedance state whenever the chip enable (CE) is high. The outputs are active only in the READ mode (WE complement of the stored data.
TYPE TYPICAL ACCESS TIME TYPICAL SUPPL Y CURRENT(TOTAL)
74F219A 5.0ns 55mA
= high) and the output data is the
APPLICATIONS
•Scratch pad memory
•Buffer memory
•Push down stacks
•Control store
PIN CONFIGURATION
1
A0
2
CE
WE
3 4
D0
Q0
5
D1
6
Q1
GND
16
V A1
15
A2
14 13
A3 D3
12 11
Q3
D2
107
Q2
98
SF00307
CC
ORDERING INFORMATION
ORDER CODE
DESCRIPTION COMMERCIAL RANGE
= 5V ±10%, T
V
CC
16-pin plastic Dual In-line Package N74F219AN SOT38-4 16-pin plastic Small Outline (150mil) N74F219AD SOT109-1 16-pin plastic Small Outline Large (300mil) C3F219AD SOT162–1
= 0°C to +70°C
amb
DRAWING NUMBER
INPUT AND OUTPUT LOADING AND FAN OUT TABLE
PINS DESCRIPTION 74F (U.L.)
HIGH/LOW
D0 – D3 Data inputs 1.0/1.0 20µA/0.6mA A0 – A3 Address inputs 1.0/1.0 20µA/0.6mA
CE Chip enable input (active low) 1.0/2.0 20µA/1.2mA
WE Write enable input (active low) 1.0/2.0 20µA/1.2mA
Q0 – Q3 Data outputs 150/40 3mA/24mA
NOTE: One (1.0) FAST unit load is defined as: 20µA in the high state and 0.6mA in the low state.
LOAD VALUE
HIGH/LOW
1996 Jan 05 853-1308 16196
2
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Philips Semiconductors Product specification
74F219A64-bit TTL bipolar RAM, non-inverting (3-State)
LOGIC SYMBOL
1 15 14 13
2
3
VCC = pin 16 GND = pin 8
LOGIC DIAGRAM
4
D0 D2 D3D1
A0 A1 A2 A3 CE
WE
Q0 Q1 Q2 Q3
57911
1
A0
15
A1
14
A2
13
A3
61012
SF00308
Decoder
Drivers
Address Decoder
D0 D1 D2 D3
4 6 10 12
Data buffers
16–word x 4–bit
memory cell
array
IEC/IEEE SYMBOL
1
15 14
13
2 3
4
6 10 12
RAM 16X4
0
1 G1
1 EN [READ] 1 C2 [WRITE]
A,2D A
3
WE
2
CE
0
A
15
5 7 9
11
SF00301
VCC = Pin 16 GND = Pin 8
FUNCTION TABLE
INPUTS OUTPUT OPERATING
CE WE Dn Q
n
L H X Stored data Read L L L High impedance Write “0” L L H High impedance Write “1”
H X X High impedance Disable input
NOTES:
H = High voltage level L = Low voltage level X = Don’t care
MODE
Output buffers
57911
Q0 Q1 Q2 Q3
SF00309
1996 Jan 05
3
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Philips Semiconductors Product specification
SYMBOL
PARAMETER
UNIT
74F219A64-bit TTL bipolar RAM, non-inverting (3-State)
ABSOLUTE MAXIMUM RATINGS
(Operation beyond the limit set forth in this table may impair the useful life of the device. Unless otherwise noted these limits are over the operating free-air temperature range.)
SYMBOL
V V I
IN
V I
OUT
T
amb
T
stg
CC IN
OUT
Supply voltage –0.5 to +7.0 V Input voltage –0.5 to +7.0 V Input current –30 to +5 mA Voltage applied to output in high output state –0.5 to V Current applied to output in low output state 48 mA Operating free-air temperature range 0 to +70 °C Storage temperature range –65 to +150 °C
RECOMMENDED OPERATING CONDITIONS
V V V I I I T
CC IH
IL Ik OH OL
amb
Supply voltage 4.5 5.0 5.5 V High–level input voltage 2.0 V Low–level input voltage 0.8 V Input clamp current –18 mA High–level output current –3 mA Low–level output current 24 mA Operating free-air temperature range 0 +70 °C
PARAMETER RATING UNIT
CC
V
LIMITS
MIN NOM MAX
DC ELECTRICAL CHARACTERISTICS
(Over recommended operating free-air temperature range unless otherwise noted.)
SYMBOL
V
OH
High-level output voltage VCC = MIN, VIL = MAX
PARAMETER TEST CONDITIONS
VIH = MIN, IOH = MAX
V
OL
V
IK
I
I
I
IH
I
IL
Low-level output voltage VCC = MIN, VIL = MAX
VIH = MIN, I
Input clamp voltage VCC = MIN, II = I
OL
= MAX
IK
Input current at maximum input voltage VCC = MAX, VI = 7.0V 100 µA High–level input current VCC = MAX, VI = 2.7V 20 µA Low–level input current others VCC = MAX, VI = 0.5V -0.6 mA
CE, WE -1.2 mA
I
OZH
I
OZL
I
OS
I
CC
C C
IN OUT
Offset output current, high–level voltage applied
Offset output current, low–level voltage applied
Short-circuit output current
3
VCC = MAX, VI = 2.7V 50
VCC = MAX, VI = 0.5V –50
VCC = MAX -60 -150 mA Supply current (total) VCC = MAX, CE = WE = GND 55 80 mA Input capacitance VCC = 5V, VIN = 2.0V 4 pF Output capacitance VCC = 5V, V
= 2.0V 7 pF
OUT
NOTES:
1. For conditions shown as MIN or MAX, use the appropriate value specified under recommended operating conditions for the applicable type.
2. All typical values are at V
3. Not more than one output should be shorted at a time. For testing I techniques are preferable in order to minimize internal heating and more accurately reflect operational values. Otherwise, prolonged shorting
CC
= 5V, T
amb
= 25°C.
, the use of high-speed test apparatus and/or sample-and-hold
OS
of a high output may raise the chip temperature well above normal and thereby cause invalid readings in other parameter tests. In any sequence of parameter tests, I
tests should be performed last.
OS
1
±10%V
±10%V
±5%V
±5%V
CC
CC
CC
CC
LIMITS UNIT
MIN TYP
2
MAX
2.4 V
2.7 3.4 V
0.35 0.50 V
0.35 0.50 V
-0.73 -1.2 V
µA
µA
1996 Jan 05
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Philips Semiconductors Product specification
74F219A64-bit TTL bipolar RAM, non-inverting (3-State)
AC ELECTRICAL CHARACTERISTICS
LIMITS
T
SYMBOL PARAMETER
t
PLH
t
PHL
t
PZH
t
PZL
t
PHZ
t
PLZ
t
PZH
t
PZL
t
PHZ
t
PLZ
Access time
Disable time CE to Qn
Write recovery time Disable time
WE to Qn
Propagation delay An to Qn
Enable time CE to Qn
Enable time WE to Qn
TEST
CONDITION
Waveform 1
Waveform 2
Waveform 3
Waveform 4
Waveform 4
= +25°C
amb
VCC = +5.0V
CL = 50pF, RL = 500Ω MIN TYP MAX MIN MAX
2.5
2.0
1.5
2.5
2.5
1.5
2.0
3.0
3.0
1.5
5.0
4.5
3.0
4.0
4.5
3.0
3.5
4.5
5.0
3.5
8.0
8.0
6.0
7.0
7.0
5.5
6.5
7.5
8.0
6.0
T
= 0°C to +70°C
amb
VCC = +5.0V ± 10%
CL = 50pF, RL = 500Ω
2.5
2.0
1.5
2.0
2.0
1.0
1.5
2.5
2.5
1.5
8.0
8.0
7.0
7.5
8.0
6.0
7.0
8.0
9.0
7.0
UNIT
ns
ns
ns
ns
ns
AC SETUP REQUIREMENT
SYMBOL PARAMETER
tsu(H) tsu(L)
th(H) th(L)
tsu(H) tsu(L)
th(H) th(L)
tsu(L)
th(L)
tw(L)
Setup time, high or low An to WE
Hold time, high or low An to WE
Setup time, high or low Dn to WE
Hold time, high or low Dn to WE
Setup time, low CE (falling edge) to WE (falling edge)
Hold time, low WE (falling edge) to WE (rising edge)
Pulse width, low WE
LIMITS
TEST
CONDITION
= +25°C
amb
VCC = +5.0V
C
= 50pF, RL = 500Ω
L
T
= 0°C to +70°C
amb
VCC = +5.0V ± 10%
C
= 50pF, RL = 500Ω
L
UNIT
T
MIN TYP MAX MIN MAX
Waveform 4
Waveform 4
Waveform 4
Waveform 4
4.5
4.5 0
0
8.0
7.5 0
0
5.0
5.0 0
0
9.0
8.5 0
0
Waveform 4 0 0 ns
Waveform 4 6.5 7.5 ns
Waveform 4 7.0 8.0 ns
ns
ns
ns
ns
1996 Jan 05
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Philips Semiconductors Product specification
74F219A64-bit TTL bipolar RAM, non-inverting (3-State)
AC WAVEFORMS FOR READ CYCLES
For all waveforms, VM = 1.5V.
An
Qn
CE
Qn
CE
V
M
t
PHL
V
M
t
PLH
SP000310
Waveform 1. Read cycle, address access time
V
M
t
PZH
V
M
t
PZL
SP000311
Waveform 2. Read cycle, chip enable access time
V
M
t
PHZ
Qn
Waveform 3. Read cycle, chip disable time
V
M
t
PLZ
SP000312
1996 Jan 05
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Philips Semiconductors Product specification
74F219A64-bit TTL bipolar RAM, non-inverting (3-State)
AC WAVEFORMS FOR WRITE CYCLE
An
Dn
CE
WE
Qn
V
M
V
M
tsu (H or L) th ( L)
NOTE: For all waveforms, VM = 1.5V.
V
M
tsu (H or L)
V
M
tw ( L)
V
t
PHZ
Hi–Z
M
t
PLZ
V
Waveform 4. Write cycle
th (H or L)
M
V
M
V
V
M
M
th (H or L)tsu ( L)
V
M
t
PZH
V
M
t
PZL
SP000313
TEST CIRCUIT AND WAVEFORM
V
CC
V
PULSE
GENERATOR
IN
R
T
Test Circuit for Totem-Pole Outputs
DEFINITIONS:
R
= Load resistor;
L
see AC ELECTRICAL CHARACTERISTICS for value.
C
= Load capacitance includes jig and probe capacitance;
L
see AC ELECTRICAL CHARACTERISTICS for value.
R
= Termination resistance should be equal to Z
T
pulse generators.
D.U.T.
V
OUT
C
t
NEGATIVE PULSE
R
L
L
POSITIVE PULSE
90%
10%
V
M
10%
t
THL (tf
t
TLH (tr
90%
V
M
w
V
M
10%
)
)
t
w
t
TLH (tr
t
THL (tf
)
)
90%
V
M
90%
10%
AMP (V)
0V
AMP (V)
0V
Input Pulse Definition
INPUT PULSE REQUIREMENTS
V
amplitude
3.0V 1.5V
rep. rate
M
1MHz 500ns
t
w
t
TLHtTHL
2.5ns 2.5ns
SF00006
OUT
of
family
74F
1996 Jan 05
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Philips Semiconductors Product specification
74F219A64-Bit TTL bipolar RAM, non-inverting (3-State)
DIP16: plastic dual in-line package; 16 leads (300 mil); long body SOT38-1
1996 Jan 05
8
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Philips Semiconductors Product specification
74F219A64-Bit TTL bipolar RAM, non-inverting (3-State)
SO16: plastic small outline package; 16 leads; body width 3.9 mm SOT109-1
1996 Jan 05
9
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Philips Semiconductors Product specification
74F219A64-Bit TTL bipolar RAM, non-inverting (3-State)
SO16: plastic small outline package; 16 leads; body width 7.5 mm SOT162-1
1996 Jan 05
10
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Philips Semiconductors Product specification
74F219A64-Bit TTL bipolar RAM, non-inverting (3-State)
NOTES
1996 Jan 05
11
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Philips Semiconductors Product specification
74F219A64-bit TTL bipolar RAM, non-inverting (3-State)
DEFINITIONS
Data Sheet Identification Product Status Definition
Objective Specification
Preliminary Specification
Product Specification
Formative or in Design
Preproduction Product
Full Production
Philips Semiconductors and Philips Electronics North America Corporation reserve the right to make changes, without notice, in the products, including circuits, standard cells, and/or software, described or contained herein in order to improve design and/or performance. Philips Semiconductors assumes no responsibility or liability for the use of any of these products, conveys no license or title under any patent, copyright, or mask work right to these products, and makes no representations or warranties that these products are free from patent, copyright, or mask work right infringement, unless otherwise specified. Applications that are described herein for any of these products are for illustrative purposes only. Philips Semiconductors makes no representation or warranty that such applications will be suitable for the specified use without further testing or modification.
LIFE SUPPORT APPLICA TIONS Philips Semiconductors and Philips Electronics North America Corporation Products are not designed for use in life support appliances, devices, or systems where malfunction of a Philips Semiconductors and Philips Electronics North America Corporation Product can reasonably be expected
to result in a personal injury. Philips Semiconductors and Philips Electronics North America Corporation customers using or selling Philips Semiconductors and Philips Electronics North America Corporation Products for use in such applications do so at their own risk and agree to fully indemnify Philips Semiconductors and Philips Electronics North America Corporation for any damages resulting from such improper use or sale.
Philips Semiconductors 811 East Arques Avenue P.O. Box 3409 Sunnyvale, California 94088–3409 Telephone 800-234-7381
This data sheet contains the design target or goal specifications for product development. Specifications may change in any manner without notice.
This data sheet contains preliminary data, and supplementary data will be published at a later date. Philips Semiconductors reserves the right to make changes at any time without notice in order to improve design and supply the best possible product.
This data sheet contains Final Specifications. Philips Semiconductors reserves the right to make changes at any time without notice, in order to improve design and supply the best possible product.
Philips Semiconductors and Philips Electronics North America Corporation
register eligible circuits under the Semiconductor Chip Protection Act.
Copyright Philips Electronics North America Corporation 1996
All rights reserved. Printed in U.S.A.
(print code) Date of release: July 1994 Document order number: 9397-750-05098
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