Page 1
Philips Semiconductors Products Product specification
FAST 74F13313–input NAND Gate
1
July 2, 1993 853-10219
FAST Products
PRODUCT SPECIFICATION
TYPE
TYPICAL PROPAGATION
DELAY
TYPICAL SUPPLY CURRENT
(TOTAL)
74F133 4.0ns 2.0 mA
ORDERING INFORMATION
ORDER CODE
COMMERCIAL RANGE INDUSTRIAL RANGE
DESCRIPTION
VCC = 5V ±10%, VCC = 5V ±10%,
T
amb
= 0°C to +70°C T
amb
= –40°C to +85°C
16–pin plastic DIP N74F133N I74F133N
16–pin plastic SO N74F133D I74F133D
INPUT AND OUTPUT LOADNG AND FAN OUT TABLE
PINS DESCRIPTION
74F (U.L.)
HIGH/LOW
LOAD VALUE
HIGH/LOW
D
O
- D
12
Data inputs 1.0/1.0 20µA/0.6mA
Q Data output 50/33 1.0mA/20mA
Note to input and output loading and fan out table
1. One (1.0) FAST unit load is defined as: 20µA in the high state and 0.6mA in the low state.
PIN CONFIGURATION LOGIC SYMBOL LOGIC SYMBOL (IEEE/IEC)
1
2
3
4
5
6
7
8
9
10
11
12
13
14
16
15
V
CC
= Pin 16
GND = Pin 8
1
2
3
4
5
6
7
10
11
12
13
14
15
1
2
3
4
5
6
7
10
11
12
13
14
15
9
&
V
CC
D
12
D
11
D
10
D
9
D
8
D
7
Q
D
0
D
1
D
2
D
3
D
4
D
5
D
6
GND
Page 2
Philips Semiconductors Products Product specification
FAST 74F13313–input NAND Gate
July 2, 1993
2
LOGIC DIAGRAM
VCC = Pin 16
GND = Pin 8
D0D1D2D3D4D
5
D
6
D7D8D9D10D11D
12
Q
9
1 2 3 4 5 6 7 10 11 12 13 14 15
FUNCTION TABLE
INPUTS OUTPUT
DO D1 D2 D3 D4 D5 D6 D7 D8 D9 D10 D11 D12 Q
H H H H H H H H H H H H H L
Any one input = L
H
Page 3
Philips Semiconductors Products Product specification
FAST 74F13313–input NAND Gate
July 2, 1993
3
ABSOLUTE MAXIMUM RATINGS
(Operation beyond the limit set forth in this table may impair the useful life of the device. Unless otherwise noted these limits are over the
operating free air temperature range.)
SYMBOL
PARAMETER RATING UNIT
V
CC
–0.5 to +7.0 V
V
IN
Input voltage –0.5 to +7.0 V
I
IN
–30 to +5 mA
V
OUT
–0.5 to V
CC
V
I
OUT
40 mA
T
amb
Operating free air temperature range Commercial range 0 to +70
°C
Industrial range –40 to +85
°C
T
stg
Storage temperature range –65 to +150
°C
RECOMMENDED OPERATING CONDITIONS
SYMBOL
PARAMETER
LIMITS UNIT
MIN NOM MAX
V
CC
4.5 5.0 5.5 V
V
IH
2.0 V
V
IL
0.8 V
I
Ik
–18 mA
I
OH
–1 mA
I
OL
20 mA
T
amb
Operating free air temperature range Commercial range 0 +70
°C
Industrial range –40 +85
°C
DC ELECTRICAL CHARACTERISTICS
(Over recommended operating free-air temperature range unless otherwise noted.)
SYMBOL PARAMETER TEST CONDITIONS
1
LIMITS UNIT
MIN TYP
2
MAX
V
OH
High-level output voltage VCC = MIN, VIL = MAX
±10%V
CC
2.5 V
VIH = MIN, IOH = MAX
±5%V
CC
2.7 3.4 V
V
OL
Low-level output voltage VCC = MIN, VIL = MAX
±10%V
CC
0.35 0.50 V
VIH = MIN, I
Ol
= MAX
±5%V
CC
0.35 0.50 V
V
IK
Input clamp voltage VCC = MIN, II = I
IK
-0.73 -1.2 V
I
I
Input current at maximum input voltage VCC = MAX, VI = 7.0V 100 µA
I
IH
High–level input current VCC = MAX, VI = 2.7V 20 µA
I
IL
Low–level input current VCC = MAX, VI = 0.5V -0.6 mA
I
OS
Short-circuit output current
3
VCC = MAX -60 -150 mA
I
CC
Supply current (total) I
CCHVCC
= MAX 1.0 2.0 mA
I
CCLVCC
= MAX 2.5 4.0 mA
NOTES:
1.. For conditions shown as MIN or MAX, use the appropriate value specified under recommended operating conditions for the applicable type.
2. All typical values are at V
CC
= 5V, T
amb
= 25°C.
3.. Not more than one output should be shorted at a time. For testing I
OS
, the use of high-speed test apparatus and/or sample-and-hold
techniques are preferable in order to minimize internal heating and more accurately reflect operational values. Otherwise, prolonged shorting
of a high output may raise the chip temperature well above normal and thereby cause invalid readings in other parameter tests. In any
sequence of parameter tests, I
OS
tests should be performed last.
Supply voltage
Input current
Voltage applied to output in high output state
Current applied to output in low output state
Supply voltage
High–level input voltage
Low–level input voltage
Input clamp current
High–level output current
Low–level output current
Page 4
Philips Semiconductors Products Product specification
FAST 74F13313–input NAND Gate
July 2, 1993
4
AC ELECTRICAL CHARACTERISTICS
LIMITS
T
amb
= +25°C T
amb
= 0°C to
+70
°C
T
amb
= –40°C to +85°C
SYMBOL PARAMETER TEST VCC = +5.0V
VCC = +5.0V ± 10% VCC = +5.0V ± 10%
UNIT
CONDITION CL = 50pF,
R
L
= 500Ω
CL = 50pF,
R
L
= 500Ω
CL = 50pF,
R
L
= 500Ω
MIN TYP MAX MIN MAX MIN MAX
t
PLH
t
PHL
Propagation delay
Dn to Q
n
Waveform 1
2.0
2.5
4.0
4.5
7.0
7.5
1.5
2.0
7.5
8.0
1.5
2.0
7.5
8.0
ns
AC WAVEFORMS
V
M
V
M
V
M
V
M
Waveform 1. Propagation delay for data to output
Q
Dn
t
PHL
t
PLH
Note to AC Waveforms
1. For all waveforms, V
M
= 1.5V.
TEST CIRCUIT AND WAVEFORMS
t
w
90%
V
M
10%
90%
V
M
10%
90%
V
M
10%
90%
V
M
10%
NEGATIVE
PULSE
POSITIVE
PULSE
t
w
AMP (V)
0V
0V
t
THL (tf
)
INPUT PULSE REQUIREMENTS
rep. rate
t
w
t
TLHtTHL
1MHz
500ns
2.5ns 2.5ns
Input pulse definition
V
CC
family
74F
D.U.T.
PULSE
GENERATOR
R
L
C
L
R
T
V
IN
V
OUT
Test circuit for totem-pole outputs
DEFINITIONS:
R
L
= Load resistor;
see AC electrical characteristics for value.
CL= Load capacitance includes jig and probe capacitance;
see AC electrical characteristics for value.
R
T
= Termination resistance should be equal to Z
OUT
of
pulse generators.
t
THL (tf
)
t
TLH (tr
)
t
TLH (tr
)
AMP (V)
amplitude
3.0V
1.5V
v
M
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