Datasheet MX27C4100MC-15, MX27C4100MI-10, MX27C4100MI-12, MX27C4100MI-15, MX27C4100PC-10 Datasheet (MXIC)

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FEATURES
256K x 16 organization(MX27C4096, JEDEC pin
out)
512K x 8 or 256K x 16 organization(MX27C4100,
ROM pin out compatible)
+12.5V programming voltage
Fast access time: 100/120/150 ns
Totally static operation
Operating current: 60mA
Standby current: 100uA
Package type:
- 40 pin plastic DIP
- 44 pin PLCC
- 40 pin SOP
REV. 3.4, AUG. 22, 2001
P/N: PM0197
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GENERAL DESCRIPTION
The MX27C4100/4096 is a 5V only, 4M-bit, One Time Programmable Read Only Memory. It is organized as 256K words by 16 bits per word(MX27C4096), 512K x 8 or 256K x 16(MX27C4100), operates from a single + 5 volt supply, has a static standby mode, and features fast single address location programming. All programming signals are TTL levels, requiring a single pulse. For programming outside from the system, existing EPROM
programmers may be used. The MX27C4100/4096 supports a intelligent fast programming algorithm which can result in programming time of less than two minutes.
This EPROM is packaged in industry standard 40 pin dual-in-line packages, 40 lead SOP, and 44 lead PLCC packages.
PIN CONFIGURATIONS
SOP/PDIP(MX27C4100)
BLOCK DIAGRAM (MX27C4100)
MX27C4100/27C4096
4M-BIT [512K x 8/256K x 16] CMOS EPROM
MX27C4100
1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20
40 39 38 37 36 35 34 33 32 31 30 29 28 27 26 25 24 23 22 21
A8 A9 A10 A11 A12 A13 A14 A15 A16 BYTE/VPP GND Q15/A-1 Q7 Q14 Q6 Q13 Q5 Q12 Q4 VCC
A17
A7 A6 A5 A4 A3 A2 A1 A0
CE
GND
OE Q0 Q8 Q1 Q9 Q2
Q10
Q3
Q11
CONTROL
LOGIC
OUTPUT
BUFFERS
Q0~Q14 Q15/A-1
CE OE
BYTE/VPP
A0~A17
ADDRESS
INPUTS
Y-DECODER
X-DECODER
Y-SELECT
4M BIT
CELL
MAXTRIX
VCC GND
. . . . . . . .
. . . . . . . .
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PIN CONFIGURATIONS
PLCC(MX27C4096)
PIN CONFIGURATIONS
PDIP(MX27C4096)
BLOCK DIAGRAM (MX27C4096)
MX27C4096
1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20
40 39 38 37 36 35 34 33 32 31 30 29 28 27 26 25 24 23 22 21
VCC A17 A16 A15 A14 A13 A12 A11 A10 A9 GND A8 A7 A6 A5 A4 A3 A2 A1 A0
VPP
CE Q15 Q14 Q13 Q12 Q11 Q10
Q9
Q8
GND
Q7
Q6
Q5
Q4
Q3
Q2
Q1
Q0
OE
MX27C4096
Q12 Q11 Q10
Q9 Q8
GND
NC Q7 Q6 Q5 Q4
A13 A12 A11 A10 A9 GND NC A8 A7 A6 A5
Q13
Q14
Q15CEVPPNCVCC
A17
A16
A15
A14
Q3Q2Q1
Q0
OE
NC
A0A1A2A3A4
64440
39
34
29
7
12
17
18 23 28
1
CONTROL
LOGIC
OUTPUT
BUFFERS
Q0~Q15
CE
OE
A0~A17
ADDRESS
INPUTS
Y-DECODER
X-DECODER
Y-SELECT
4M BIT
CELL
MAXTRIX
VCC GND
VPP
. . . . . . . .
. . . . . . . .
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WORD MODE(BYTE = VCC)
CE OE Q15/A-1 MODE Q0-Q14 SUPPLY CURRENT
H X High Z Non selected High Z Standby(ICC2) L H High Z Non selected High Z Operating(ICC1) L L DOUT Selected DOUT Operating(ICC1)
NOTE : X = H or L
TRUTH TABLE OF BYTE FUNCTION(MX27C4100)
BYTE MODE(BYTE = GND)
CE OE Q15/A-1 MODE Q0-Q7 SUPPLY CURRENT
H X X Non selected High Z Standby(ICC2) L H X Non selected High Z Operating(ICC1) L L A-1 input Selected DOUT Operating(ICC1)
SYMBOL PIN NAME
A0~A17 Address Input Q0~Q14 Data Input/Output CE Chip Enable Input OE Output Enable Input BYTE/VPP Word/Byte Selection/Program Supply Voltage Q15/A-1 Q15(Word mode)/LSB addr. (Byte mode) VCC Power Supply Pin (+5V) GND Ground Pin
PIN DESCRIPTION(MX27C4100)
PIN DESCRIPTION(MX27C4096)
SYMBOL PIN NAME
A0~A17 Address Input Q0~Q15 Data Input/Output CE Chip Enable Input OE Output Enable Input VPP Program Supply Voltage VCC Power Supply Pin (+5V) GND Ground Pin
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The verification should be performed with OE and CE at VIL(for MX27C4096), OE at VIL and CE at VIH(for MX27C4100) and VPP at its programming voltage.
AUTO IDENTIFY MODE
The auto identify mode allows the reading out of a binary code from an EPROM that will identify its manufacturer and device type. This mode is intended for use by programming equipment for the purpose of automatically matching the device to be programmed with its corresponding programming algorithm. This mode is functional in the 25°C± 5°C ambient temperature range that is required when programming the MX27C4100/4096.
To activate this mode, the programming equipment must force 12.0 ± 0.5 V on address line A9 of the device. Two identifier bytes may then be sequenced from the device outputs by toggling address line A0 from VIL to VIH. All other address lines must be held at VIL during auto identify mode.
Byte 0 ( A0 = VIL) represents the manufacturer code, and byte 1 (A0 = VIH), the device identifier code. For the MX27C4100/4096, these two identifier bytes are given in the Mode Select Table. All identifiers for manufacturer and device codes will possess odd parity, with the MSB (Q15) defined as the parity bit.
READ MODE
The MX27C4100/4096 has two control functions, both of which must be logically satisfied in order to obtain data at the outputs. Chip Enable (CE) is the power control and should be used for device selection. Output Enable (OE) is the output control and should be used to gate data to the output pins, independent of device selection. Assuming that addresses are stable, address access time (tACC) is equal to the delay from CE to output (tCE). Data is available at the outputs tOE after the falling edge of OE's, assuming that CE has been LOW and addresses have been stable for at least tACC - t OE.
WORD-WIDE MODE
With BYTE/VPP at VCC ± 0.2V outputs Q0-7 present data Q0-7 and outputs Q8-15 present data Q8-15, after CE and OE are appropriately enabled.
FUNCTIONAL DESCRIPTION
THE PROGRAMMING OF THE MX27C4100/4096
When the MX27C4100/4096 is delivered, or it is erased, the chip has all 4M bits in the "ONE" or HIGH state. "ZEROs" are loaded into the MX27C4100/4096 through the procedure of programming.
For programming, the data to be programmed is applied with 16 bits in parallel to the data pins.
VCC must be applied simultaneously or before VPP, and removed simultaneously or after VPP. When programming an MXIC EPROM, a 0.1uF capacitor is required across VPP and ground to suppress spurious voltage transients which may damage the device.
FAST PROGRAMMING
The device is set up in the fast programming mode when the programming voltage VPP = 12.75V is applied, with VCC = 6.25 V and OE = VIH (Algorithm is shown in Figure 1). The programming is achieved by applying a single TTL low level 100us pulse to the CE input after addresses and data line are stable. If the data is not verified, an additional pulse is applied for a maximum of 25 pulses. This process is repeated while sequencing through each address of the device. When the programming mode is completed, the data in all address is verified at VCC = VPP = 5V ± 10%.
PROGRAM INHIBIT MODE
Programming of multiple MX27C4100/4096's in parallel with different data is also easily accomplished by using the Program Inhibit Mode. Except for CE and OE, all like inputs of the parallel MX27C4100/4096 may be common. A TTL low-level program pulse applied to an MX27C4100/4096 CE input with VPP = 12.5 ± 0.5 V will program the MX27C4100/4096. A high-level CE input inhibits the other MX27C4100/4096s from being programmed.
PROGRAM VERIFY MODE
Verification should be performed on the programmed bits to determine that they were correctly programmed.
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BYTE-WIDE MODE
With BYTE/VPP at GND ± 0.2V, outputs Q8-15 are tri­stated. If Q15/A-1 = VIH, outputs Q0-7 present data bits Q8-15. If Q15/A-1 = VIL, outputs Q0-7 present data bits Q0-7.
STANDBY MODE
The MX27C4100/4096 has a CMOS standby mode which reduces the maximum VCC current to 100 uA. It is placed in CMOS standby when CE is at VCC ± 0.3 V. The MX27C4100/4096 also has a TTL-standby mode which reduces the maximum VCC current to 1.5 mA. It is placed in TTL-standby when CE is at VIH. When in standby mode, the outputs are in a high-impedance state, independent of the OE input.
TWO-LINE OUTPUT CONTROL FUNCTION
To accommodate multiple memory connections, a two­line control function is provided to allow for:
1. Low memory power dissipation,
2. Assurance that output bus contention will not occur.
It is recommended that CE be decoded and used as the primary device-selecting function, while OE be made a common connection to all devices in the array and connected to the READ line from the system control bus. This assures that all deselected memory devices are in their low-power standby mode and that the output pins are only active when data is desired from a particular memory device.
SYSTEM CONSIDERATIONS
During the switch between active and standby conditions, transient current peaks are produced on the rising and falling edges of Chip Enable. The magnitude of these transient current peaks is dependent on the output capacitance loading of the device. At a minimum, a 0.1 uF ceramic capacitor (high frequency, low inherent inductance) should be used on each device between Vcc and GND to minimize transient effects. In addition, to overcome the voltage drop caused by the inductive effects of the printed circuit board traces on EPROM arrays, a 4.7 uF bulk electrolytic capacitor should be
used between VCC and GND for each eight devices. The location of the capacitor should be close to where the power supply is connected to the array.
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MODE SELECT TABLE (MX27C4100)
BYTE/
MODE CE OE A9 A0 Q15/A-1 VPP(5) Q8-14 Q0-7
Read (Word) VIL VIL X X Q15 Out VCC Q8-14 Out Q0-7 Out Read (Upper Byte) VIL VIL X X VIH GND High Z Q8-15 Out Read (Lower Byte) VIL VIL X X VIL GND High Z Q0-7 Out Output Disable VIL VIH X X High Z X High Z High Z Standby VIH X X X High Z X High Z High Z Program VIL VIH X X Q15 In VPP Q8-14 In Q0-7 In Program Verify VIH VIL X X Q15 Out VPP Q8-14 Out Q0-7 Out Program Inhibit VIH VIH X X High Z VPP High Z High Z Manufacturer Code(3) VIL VIL VH VIL 0B VCC 00H C2H Device Code(3) VIL VIL VH VIH 1B VCC 38H 00H
NOTES: 1. VH = 12.0 V ± 0.5 V
2. X = Either VIH or VIL
3. A1 - A8 = A10 - A17 = VIL(For auto select)
4. See DC Programming Characteristics for VPP voltage during programming.
NOTES: 1. VH = 12.0V ± 0.5V
2. X = Either VIH or VIL
3. A1 - A8, A10 - A17 = VIL(for auto select)
4. See DC Programming Characteristics for VPP voltages.
5. BYTE/VPP is intended for operation under DC Voltage conditions only.
6. Manufacture code = 00C2H Device code = B800H
MODE SELECT TABLE (MX27C4096)
PINS
MODE CE OE A0 A9 VPP OUTPUTS
Read VIL VIL X X VCC DOUT Output Disable VIL VIH X X VCC High Z Standby (TTL) VIH X X X VCC High Z Standby (CMOS) VCC±0.3V X X X VCC High Z Program VIL VIH X X VPP DIN Program Verify VIH VIL X X VPP DOUT Program Inhibit VIH VIH X X VPP High Z Manufacturer Code(3) VIL VIL VIL VH VCC 00C2H Device Code(3) VIL VIL VIH VH VCC 0151H
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START
ADDRESS = FIRST LOCATION
VCC = 6.25V VPP = 12.75V
X = 0
PROGRAM ONE 100us PULSE
INCREMENT X
X = 25?
VERIFY BYTE
LAST ADDRESS
VCC = VPP = 5.25V
DEVICE PASSED
VERIFY ALL BYTES
?
DEVICE FAILED
INCREMENT ADDRESS
INTERACTIVE SECTION
VERIFY SECTION
FAIL
PASS
YES
PASS
NO
YES
NO
FAIL
FIGURE 1. FAST PROGRAMMING FLOW CHART
FAIL
?
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SWITCHING TEST CIRCUITS
SWITCHING TEST WAVEFORMS
DEVICE UNDER TEST
DIODES = IN3064 OR EQUIVALENT
CL = 100 pF including jig capacitance(30pF for 100 ns parts)
6.2K ohm
1.8K ohm +5V
CL
2.0V
0.8V
TEST POINTS
INPUT
2.0V
0.8V OUTPUT
AC TESTING:
AC driving levels
AC driving levels are 2.4V/0.4V for commercial grade , 3.0V/0V for industrial grade. Input pulse rise and fall times are <10ns.
1.5V
TEST POINTS
INPUT
OUTPUT
AC TESTING: (1)AC driving levels are 3.0V/0V for both commercial grade and industrial grade.
Input pulse rise and fall times are < 10ns.
AC driving levels
1.5V
(2)For MX27C4100/4096-10
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NOTICE:
Stresses greater than those listed under ABSOLUTE MAXIMUM RATINGS may cause permanent damage to the device. This is a stress rating only and functional operation of the device at these or any other conditions above those indicated in the operational sections of this specification is not implied. Exposure to absolute maximum rating conditions for extended period may affect reliability.
NOTICE:
Specifications contained within the following tables are subject to change.
DC/AC Operating Conditions for Read Operation
ABSOLUTE MAXIMUM RATINGS
RATING VALUE
Ambient Operating Temperature -40oC to 85oC Storage Temperature -65oC to 125oC Applied Input Voltage -0.5V to 7.0V Applied Output Voltage -0.5V to VCC + 0.5V VCC to Ground Potential -0.5V to 7.0V A9 & VPP -0.5V to 13.5V
MX27C4100/4096
-10 -12 -15
Operating Temperature Commercial 0°C to 70°C0°C to 70°C0°C to 70°C
Industrial -40°C to 85°C -40°C to 85°C -40°C to 85°C
Vcc Power Supply 5V ± 5% 5V ± 10% 5V ± 10%
DC CHARACTERISTICS
SYMBOL PARAMETER MIN. MAX. UNIT CONDITIONS
VOH Output High Voltage 2.4 V IOH = -0.4mA VOL Output Low Voltage 0.4 V IOL = 2.1mA VIH Input High Voltage 2.0 VCC + 0.5 V VIL Input Low Voltage -0.3 0.8 V ILI Input Leakage Current -10 10 uA VIN = 0 to 5.5V ILO Output Leakage Current -10 10 uA VOUT = 0 to 5.5V ICC3 VCC Power-Down Current 100 uA CE = VCC ± 0.3V ICC2 VCC Standby Current 1.5 mA CE = VIH ICC1 VCC Active Current 60 mA CE = VIL, f=5MHz, Iout = 0mA IPP VPP Supply Current Read 10 uA CE = OE = VIL, VPP = 5.5V
CAPACITANCE TA = 25
o
C, f = 1.0 MHz (Sampled only)
SYMBOL PARAMETER TYP. MAX. UNIT CONDITIONS
CIN Input Capacitance 8 12 pF VIN = 0V COUT Output Capacitance 8 12 pF VOUT = 0V CVPP VPP Capacitance 18 25 pF VPP = 0V
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AC PROGRAMMING CHARACTERISTICS TA = 25
o
C ± 5°C
SYMBOL PARAMETER MIN. MAX. UNIT CONDITIONS
tAS Address Setup Time 2.0 us tOES OE Setup Time 2.0 us tDS Data Setup Time 2.0 us tAH Address Hold Time 0 us tDH Data Hold Time 2.0 us tDFP Output Enable to Output Float Delay 0 130 ns tVPS VPP Setup Time 2.0 us tPW PGM Program Pulse Width 95 105 us tVCS VCC Setup Time 2.0 us tOE Data valid from OE 150 ns
AC CHARACTERISTICS
27C4100/4096-10 27C4100/4096-12 27C4100/4096-15
SYMBOL PARAMETER MIN. MAX. MIN. MAX. MIN. MAX. UNIT CONDITIONS
tACC Address to Output Delay 100 120 150 ns CE = OE = VIL tCE Chip Enable to Output Delay 100 120 150 n s OE = VIL tOE Output Enable to Output Delay 45 50 65 ns CE = VIL tDF OE High to Output Float, 0 30 0 35 0 50 n s
or CE High to Output Float
tOH Output Hold from Address, 0 0 0 ns
CE or OE which ever occurred first
AC CHARACTERISTICS(Continued)
27C4100-10 27C4100-12 27C4100-15 SYMBOL PARAMETER MIN. MAX. MIN. MAX. MIN. MAX. UNIT CONDITIONS
tBHA BYTE Access Time 100 120 150 ns tOHB BYTE Output Hold Time 0 0 0 ns tBHZ BYTE Output Delay Time 70 70 70 ns tBLZ BYTE Output Set Time 10 10 10 ns
DC PROGRAMMING CHARACTERISTICS TA = 25
o
C ± 5°C
SYMBOL PARAMETER MIN. MAX. UNIT CONDITIONS
VOH Output High Voltage 2.4 V IOH = -0.40mA VOL Output Low Voltage 0.4 V IOL = 2.1mA VIH Input High Voltage 2.0 VCC + 0.5 V VIL Input Low Voltage -0.3 0.8 V ILI Input Leakage Current -10 10 uA VIN = 0 to 5.5V VH A9 Auto Select Voltage 11.5 12.5 V ICC3 VCC Supply Current (Program & Verify) 50 mA IPP2 VPP Supply Current(Program) 30 mA CE = VIL, OE = VIH VCC1 Fast Programming Supply Voltage 6.00 6.50 V
VPP1 Fast Programming Voltage 12.5 13.0 V
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FAST PROGRAMMING ALGORITHM WAVEFORMS
WEFORMS(MX27C4096)
READ CYCLE(WORD MODE)
ADDRESS
INPUTS
DATA
OUT
OE
CE
DATA ADDRESS
VALID DATA
tDF
tACC
tCE
tOE
tOH
Addresses
CE
OE
DATA
VPP
VCC
VIH
VIL
VPP1
VCC
VCC1
VCC
VIH
VIL
VIH
VIL
DATA OUT VALID
Hi-z
DATA IN STABLE
tAS
tVPS
tVCS
tOE Max
tPW
tDS
tDH
tOES
tDFP
tAH
PROGRAM VERIFY
PROGRAM
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WAVEFORMS(MX27C4100)
READ CYCLE (BYTE MODE)
FAST PROGRAMMING ALGORITHM WAVEFORMS
Addresses
CE
OE
DATA
BYTE/VPP
VCC
VIH
VIL
VPP1
VCC
VCC1
VCC
VIH
VIL
VIH
VIL
DATA OUT VALID
DATA SET
VALID ADDRESS
tAS
tVPS
tVCS
tOE
tPW
tDS
tDH
tOES
tDFP
tAH
VERIFY
PROGRAM
tACC
tOH
tBHA
tBLZ
tOHB
tBHZ
HIGH-Z
VALID DATA
VALID DATA
HIGH-Z
A-1
BYTE/VPP
Q0-Q7
Q15-Q8
VALID DATA
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PLASTIC PACKAGE
PART NO. ACCESS TIME OPERATING STANDBY OPERATING PACKAGE
(ns) CURRENT MAX.(mA) CURRENT MAX.(uA) TEMPERATURE
MX27C4100PC-10 100 60 100 0°C to 70°C 40 Pin DIP(ROM pin out) MX27C4100PC-12 120 60 100 0°C to 70°C 40 Pin DIP(ROM pin out) MX27C4100PC-15 150 60 100 0°C to 70°C 40 Pin DIP(ROM pin out) MX27C4100MC-10 100 60 100 0°C to 70°C 40 Pin SOP(ROM pin out) MX27C4100MC-12 120 60 100 0°C to 70°C 40 Pin SOP(ROM pin out) MX27C4100MC-15 150 60 100 0°C to 70°C 40 Pin SOP(ROM pin out) MX27C4096PC-10 100 60 100 0°C to 70°C 40 Pin DIP(JEDEC pin out) MX27C4096PC-12 120 60 100 0°C to 70°C 40 Pin DIP(JEDEC pin out) MX27C4096PC-15 150 60 100 0°C to 70°C 40 Pin DIP(JEDEC pin out) MX27C4096QC-10 100 60 100 0°C to 70°C 44 Pin PLCC MX27C4096QC-12 120 60 100 0°C to 70°C 44 Pin PLCC MX27C4096QC-15 150 60 100 0°C to 70°C 44 Pin PLCC MX27C4100PI-10 100 60 100 -40°C to 85°C 40 Pin DIP(ROM pin out) MX27C4100PI-12 120 60 100 -40°C to 85°C 40 Pin DIP(ROM pin out) MX27C4100PI-15 150 60 100 -40°C to 85°C 40 Pin DIP(ROM pin out) MX27C4100MI-10 100 60 100 -40 °C to 85°C 40 Pin SOP(ROM pin out) MX27C4100MI-12 120 60 100 -40 °C to 85°C 40 Pin SOP(ROM pin out) MX27C4100MI-15 150 60 100 -40 °C to 85°C 40 Pin SOP(ROM pin out) MX27C4096PI-10 100 60 100 --40°C to 85°C 40 Pin DIP(JEDEC pin out) MX27C4096PI-12 120 60 100 -40°C to 85°C 40 Pin DIP(JEDEC pin out) MX27C4096PI-15 150 60 100 -40°C to 85°C 40 Pin DIP(JEDEC pin out) MX27C4096QI-10 100 60 100 -40°C to 85°C 44 Pin PLCC MX27C4096QI-12 120 60 100 -40°C to 85°C 44 Pin PLCC
MX27C4096QI-15 150 60 100 -40°C to 85°C 44 Pin PLCC
ORDERING INFORMATION
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PACKAGE INFORMATION
40-PIN PLASTIC DIP(600 mil)
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40-PIN PLASTIC SOP(450 mil)
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44-PIN PLASTIC LEADED CHIP CARRIER(PLCC)
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Revision History
Revision No. Description Pgae Date
3.0 1) Eliminate Interactive Programming Mode 6/13/1997
2) 40-CDIP package quartz lens, change to square shape.
3.1 IPP1 100uA to 10uA 7/17/1997
3.2 Cancel 32pin ceramic DIP Package P1,2,4,13,14 FEB/25/2000
3.3 Modify Commercial range 0~55°C-->0~70°C P9 MAY/03/2000
3.4 Cancel "Ultraviolet Erasable" wording in General Description P1 AUG/22/2001 To modify Package Information P14~16
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MX27C4100/27C4096
MACRONIX INTERNATIONAL CO., LTD.
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MACRONIX INTERNATIONAL CO., LTD. reserves the right to change product and specifications without notice.
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