Datasheet MX26L1620TI-12, MX26L1620XAC-12, MX26L1620TI-90, MX26L1620XAI-12, MX26L1620XBI-90 Datasheet (MXIC)

FEATURES

ADVANCED INFORMATION

MX26L1620

16M-BIT [1M x 16] CMOS

MULTIPLE-TIME-PROGRAMMABLE EPROM

• 1,048,576 x 16 byte structure

• Single Power Supply Operation

- 2.7 to 3.6 volt for read, erase, and program
operations

• Low Vcc write inhibit is equal to or less than 2.5V

• Compatible with JEDEC standard

• High Performance

- Fast access time: 90/120ns (typ.)

- Fast program time: 35s/chip (typ.)

- Fast erase time: 45s/chip (typ.)

• Low Power Consumption

- Low active read current: 10mA (typ.) at 5MHz

- Low standby current: 30uA (typ.)

• Minimum 100 erase/program cycle

GENERAL DESCRIPTION

The MX26L1620 is a 16M bit MTP EPROMTM organized
as 1M bytes of 16 bits. MXIC's MTP EPROM
most cost-effective and reliable read/write non-volatile
random access memory. The MX26L1620 is packaged in
44-pin SOP, 48-pin TSOP and 48-ball CSP. It is designed
to be reprogrammed and erased in system or in standard
EPROM programmers.

TM

offer the

• 10-year data retention

• Status Reply

- Data polling & Toggle bits provide detection of
program and erase operation completion

• 12V ACC input pin provides accelerated program

capability

• Output voltages and input voltages on the device is

determined by the voltage on the VI/O pin.

- VI/O voltage range:1.65V~3.6V

• Package

- 44-Pin SOP

- 48-Pin TSOP

- 48-Ball CSP

MXIC's MTP EPROM
memory contents even after 100 erase and program
cycles. The MXIC cell is designed to optimize the erase
and program mechanisms. In addition, the combination of
advanced tunnel oxide processing and low internal
electric fields for erase and programming operations
produces reliable cycling.

TM

technology reliably stores

The standard MX26L1620 offers access time as fast as
90ns, allowing operation of high-speed microprocessors
without wait states. To eliminate bus contention, the
MX26L1620 has separate chip enable (CE) and output
enable OE controls. MXIC's MTP EPROMTM augment
EPROM functionality with in-circuit electrical erasure and
programming. The MX26L1620 uses a command register
to manage this functionality.

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The MX26L1620 uses a 2.7V to 3.6V VCC supply to
perform the High Reliability Erase and auto Program/
Erase algorithms.

The highest degree of latch-up protection is achieved with
MXIC's proprietary non-epiprocess. Latch-up protection
is proved for stresses up to 100 milliamps on address and
data pin from -1V to VCC +1V.

1

PIN CONFIGURATION

48 CSP

1. Ball pitch=0.75mm for MX26L1620XA (TOP view, Ball down)

12345678

MX26L1620

A

B

C

D

E

F

A13

A14

A15

A16

V I/O

GND

A11

A10

A12

Q14

Q15

Q7

A8

WE

A9

Q5

Q6

Q13

ACC

RESET

NC

Q11

Q12

Q4

8.0 mm

NC

A18

NC

Q2

Q3

VCC

A19 A7

A17

A6

Q8

Q9

Q10

2. Ball pitch=0.8mm for MX26L1620XB(TOP view, Ball down)

ABCDEFGH

A5

A3

CE

Q0

Q1

A4

A2

A1

7.0 mm

A0

GND

OE

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6

5

4

A13

A9

WE

A12

A8

RESET

A14

A10

NC

A15

A11

A19

A16

Q7

Q5

V I/O

Q14

Q12

Q15

Q13

VCC

GND

Q6

Q4

7.0 mm

3

2

1

NC

A7

A3

ACC

A17

A4

A18

A6

A2

NC

A5

A1

Q2

Q0

A0

Q10

Q8

CE

Q11

Q9

OE

Q3

Q1

GND

8.0 mm

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2

MX26L1620

A15
A14
A13
A12
A11
A10

A9

A8
NC
NC

WE

RESET

ACC
VCC

A19
A18
A17

A7

A6

A5

A4

A3

A2

A1

1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
20
21
22
23
24

A16
V

I/O

GND
Q15
Q7
Q14
Q6
Q13
Q5
Q12
Q4
V

CC

Q11
Q3
Q10
Q2
Q9
Q1
Q8
Q0
OE
GND
CE
A0

48
47
46
45
44
43
42
41
40
39
38
37
36
35
34
33
32
31
30
29
28
27
26
25

MX26L1620

44 SOP

44

NC
A18
A17

CE

GND

OE

Q0

Q8

Q1

Q9

Q2
Q10

Q3
Q11

2
3
4

A7

5

A6

6

A5

7

A4

8

A3

9

A2

10

A1

11

A0

12
13
14

MX26L1620

15
16
17
18
19
20
21
22

NC

43

A19

42

A8

41

A9

40

A10

39

A11

38

A12

37

A13

36

A14

35

A15

34

A16

33

WE

32

GND

31

Q15

30

Q7

29

Q14

28

Q6

27

Q13

26

Q5

25

Q12

24

Q4

23

VCC

PIN DESCRIPTION

SYMBOL PIN NAME

A0~A19 Address Input
Q0~Q15 Data Inputs/Outputs
CE Chip Enable Input
WE Write Enable Input
OE Output Enable Input
RESET Hardware Reset Pin, Active Low
VC C +3.0V single power supply
ACC Hardware Acceleration Pin
V I/O I/O power supply (for 48 TSOP and

48 CSP package only)
GN D Device Ground
N C Pin Not Connected Internally

48 TSOP

LOGIC SYMBOL

20

A0-A19

CE
OE
WE
RESET

ACC

16

Q0-Q15

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BLOCK DIAGRAM

CE
OE
WE

CONTROL
INPUT

LOGIC

PROGRAM/ERASE

HIGH VOLTAGE

MX26L1620

WRITE

STATE

MACHINE

(WSM)

A0-A19

ADDRESS

LATCH

AND

BUFFER

X-DECODER

MX26L1620

FLASH
ARRA Y

Y-DECODER

Y-PASS GATE

SENSE

AMPLIFIER

DATA LATCH

STATE

REGISTER

ARRAY

SOURCE

HV

COMMAND

DATA
DECODER

PGM

DATA

HV

COMMAND

DATA LATCH

PROGRAM

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Q0-Q15

I/O BUFFER

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4

MX26L1620

AUTOMATIC PROGRAMMING

The MX26L1620 is word programmable using the Auto­matic Programming algorithm. The Automatic Progr am­ming algorithm makes the external system do not need
to have time out sequence nor to verify the data pro­grammed. The typical chip programming time at room
temperature of the MX26L1620 is less than 20 seconds.

AUTOMATIC PROGRAMMING ALGORITHM

MXIC's Automatic Programming algorithm require the user
to only write program set-up commands (including 2 un­lock write cycle and A0H) and a program command (pro­gram data and address). The de vice automatically times
the programming pulse width, provides the program veri­fication, and counts the number of sequences. A status
bit similar to DATA polling and a status bit toggling be­tween consecutive read cycles, provide feedback to the
user as to the status of the programming operation.

AUTOMATIC CHIP ERASE

All data are latched on the rising edge of WE or CE,
whichever happens later .

MXIC's Flash technology combines years of EPROM
experience to produce the highest levels of quality, relia­bility, and cost effectiveness. The MX26L1620 electri­cally erases all bits simultaneously using Fowler-Nord­heim tunneling. The bytes are programmed b y using the
EPROM programming mechanism of hot electron injec­tion.

During a program cycle, the state-machine will control
the program sequences and command register will not
respond to any command set. After the state machine
has completed its task, it will allow the command regis­ter to respond to its full command set.

The entire chip is bulk erased using 50 ms erase pulses
according to MXIC's Automatic Chip Erase algorithm.
T ypical erasure at room temper ature is accomplished in
less than 45 seconds. The Automatic Erase algorithm
automatically programs the entire array prior to electrical
erase. The timing and verification of electrical erase are
controlled internally within the device.

AUTOMATIC ERASE ALGORITHM

MXIC's Automatic Erase algorithm requires the user to
write commands to the command register using stand­ard microprocessor write timings. The device will auto­matically pre-program and verify the entire arra y. Then
the device automatically times the erase pulse width,
provides the erase verification, and counts the number
of sequences. A status bit toggling between consecu­tive read cycles provides feedback to the user as to the
status of the programming operation.

Register contents serve as inputs to an internal state­machine which controls the erase and programming cir­cuitry . During write cycles, the command register inter­nally latches address and data needed for the program­ming and erase operations. All address are latched on
the falling edge of WE or CE, whiche ver happens later.

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MX26L1620

Table 1. BUS OPERATION(1)

Operation CE OE WE RESET Address Q15~Q0

Read L L H H A
Write(Note 1) L H L H A

IN

IN

Standby VCC±0.3V X X VCC±0.3V X High-Z
Output Disable L H H H X High-Z
Reset X X X L X High-Z

Legend:
L=Logic LOW=VIL,H=Logic High=VIH,VID=12.0±0.5V,X=Don't Care, AIN=Address IN, DIN=Data IN, D

Notes:

1. When the ACC pin is at VHH, the device enters the accelerated program mode . See "Accelerated Prog ram Operations"
for more information.

D

OUT

D

IN

=Data OUT

OUT

Table 2. AUTOSELECT CODES (High Voltage Method)

A5 A8 A14

Operation CE OE WE A0 A1 to A6 to A9 to A15~A21 Q15~Q0

A2 A7 A10

Read Silicon ID L L H L L X L X V
Manufactures Code
Read Silicon ID L L H H L X L X V
Device Code
Secured Silscon xx88h
Sector Indicator L L H H H X L X V
Bit(Q7) xx08h

X X00 C2 H

ID

X X 22FEH

ID

X X (factory locked)

ID

(non-factory locked)

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MX26L1620

REQUIREMENTS FOR READING ARRAY
DATA

To read array data from the outputs, the system must
drive the CE and OE pins to VIL. CE is the po wer control
and selects the device. OE is the output control and gates
array data to the output pins. WE should remain at VIH.

The internal state machine is set for reading array data
upon device power-up, or after a hardware reset. This
ensures that no spurious alteration of the memory contect
occurs during the power transition. No command is
necessary in this mode to obtain array data. Standard
microprocessor read cycles that assert valid address on
the device address inputs produce valid data on the device
data outputs. The de vice remains enabled for read access
until the command register contents are altered.

WRITE COMMANDS/COMMAND
SEQUENCES

To program data to the device, the system must drive
WE and CE to VIL, and OE to VIH.

An erase operation can erase the entire device. The
"Writing specific address and data commands or
sequences into the command register initiates device
operations. Table 1 defines the valid register command
sequences. Writing incorrect address and data values or
writing them in the improper sequence resets the device
to reading array data."section has details on erasing the
entire chip.

After the system writes the autoselect command
sequence, the device enters the autoselect mode. The
system can then read autoselect codes from the internal
reqister (which is separate from the memory array) on
Q15-Q0. Standard read cycle timings apply in this mode.
Refer to the Autoselect Mode and Autoselect Command
Sequence section for more information.

ICC2 in the DC Characteristics table represents the active
current specification for the write mode. The "AC
Characteristics" section contains timing specification
table and timing diagrams for write operations.

STANDBY MODE

MX26L1620 can be set into Standby mode with two dif­ferent approaches. One is using both CE and RESET

pins and the other one is using RESET pin only .
When using both pins of CE and RESET, a CMOS

Standby mode is achieved with both pins held at Vcc ±

0.3V . Under this condition, the current consumed is less
than 50uA (typ.). If both of the CE and RESET are held
at VIH, b ut not within the range of VCC ± 0.3V , the de vice
will still be in the standby mode, but the standby currect
will be larger. During Auto Algorithm operation, Vcc ac­tive current (Icc2) is required even CE = "H" until the
operation is complated. The de vice can be read with stan­dard access time (tCE) from either of these standby
modes.

When using only RESET, a CMOS standby mode is
achieved with RESET input held at Vss ± 0.3V, Under
this condition the current is consumed less than 50uA
(typ.). Once the RESET pin is taken high,the device is
back to active without recovery delay.

In the standby mode the outputs are in the high imped­ance state, independent of the OE input.

MX26L1620 is capable to provide the Automatic Standby
Mode to restrain power consumption during read-out of
data. This mode can be used eff ectively with an applica­tion requested low power consumption such as handy
terminals.

To active this mode, MX26L1620 automatically switch
themselves to low power mode when MX26L1620 ad­dresses remain stable during access time of tACC+30ns.
It is not necessary to control CE, WE, and OE on the
mode. Under the mode, the current consumed is typi­cally 50uA (CMOS level).

OUTPUT DISABLE

With the OE input at a logic high level (VIH), output from
the devices are disabled. This will cause the output pins
to be in a high impedance state.

RESET OPERATION

The RESET pin provides a hardware method of resetting
the device to reading arra y data. When the RESET pin is
driven low for at least a period of tRP, the device
immediately terminates any operation in progress,
tristates all output pins, and ignores all read/write
commands for the duration of the RESET pluse. The

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7

MX26L1620

device also resets the internal state machine to reading
array data. The operation that was interrupted should be
reinitated once the device is ready to accept another
command sequence, to ensure data integrity

Current is reduced for the duration of the RESET pulse.
When RESET is held at VSS±0.3V, the device draws
CMOS standby current (ICC4). If RESET is held at VIL
but not within VSS±0.3V, the standby current will be
greater.

The RESET pin may be tied to system reset circuitry . A
system reset would that also reset the MTP EPROM.

Refer to the AC Characteristics tables for RESET
parameters and to Figure 14 for the timing diagram.

SILICON ID READ OPERATION

MTP EPROM are intended for use in applications where
the local CPU alters memory contents. As such, manu­facturer and device codes must be accessible while the
device resides in the target system. EPROM program­mers typically access signature codes by raising A9 to
a high voltage. How ever , multiple xing high voltage onto
address lines is not generally desired system design prac­tice.

Table 3

VCC / VI/O V oltage Range

Part No. VCC=2.7V to 3.6VVCC=2.7V to 3.6V

VI/O=2.7V to 3.6VVI/O=1.65V to 2.6V

MX26L1620-90 90ns 100ns
MX26L1620-12 120ns 130ns

Notes: T ypical v alues measured at VCC=2.7V to 3.6V,

VI/O=2.7V to 3.6V

DATA PROTECTION

The MX26L1620 is designed to offer protection against
accidental erasure or programming caused by spurious
system level signals that may exist during power transi­tion. During power up the device automatically resets
the state machine in the Read mode. In addition, with
its control register architecture, alteration of the memory
contents only occurs after successful completion of spe­cific command sequences. The device also incorporates
several features to prevent inadvertent write cycles re­sulting from VCC pow er-up and power-down transition or
system noise.

MX26L1620 provides hardware method to access the
silicon ID read operation. Which method requires VID on
A9 pin, VIL on CE, OE, A6, and A1 pins. Which apply
VIL on A0 pin, the device will output MXIC's manufac­ture code of C2H. Which apply VIH on A0 pin, the device
will output MX26L1620 device code of 22FEH.

VI/O PIN OPERATION

MX26L1620 is capable to provide the I/O prower supply
(VI/O) pin to control Input/Output voltage levels of the
device. The data outputs and voltage tolerated at its data
input is determined by the voltage on the VI/O pin. This
device is allows to operate in 1.8V or 3V system as re­quired.

SECURED SILICON SECTOR

The MX26L1620 features a Flash memory region where
the system may access through a command sequence
to create a permant part identification as so called Elec­tronic Serial Number (ESN) in the device. Once this re­gion is programmed, any further modification on the re­gion is impossible. The secured silicon sector is a 512
words in length, and uses a Secured Silicon Sector Indi­cator Bit (Q7) to indicate whether or not the Secured
Silicon Sector is locked when shipped from the f actory.
This bit is permanently set at the factory and cannot be
changed, which prevent duplication of a factory locked
part. This ensures the security of the ESN once the prod­uct is shipped to the field.

The MX26L1620 offers the device with Secured Silicon
Sector either factory locked or custor lockab le. The fac­tory-locked version is always protected when shipped
from the factory , and has the Secured Silicon Sector
Indicator Bit permanently set to a "1". The customer­lockable version is shipped with the Secured Silicon
Sector unprotected, allowing customer to utilize that sec­tor in any form they pref er . The customer-loc kable v er-

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8

MX26L1620

sion has the secured sector Indicator Bit permanently
set to a "0". Therefore, the Secured Silicon Sector Indi­cator Bit permanently set to a "0". Therefore, the Second
Silicon Sector Indicator Bit prevents customer, lockable
device from being used to replace devices that are fac­tory locked.

The system access the Secured Silicon Sector through
a command sequence (refer to "Enter Secured Silicon/
Exit Secured Silicon Sector command Sequence). After
the system has written the Enter Secured Silicon Sector
command sequence, it may read the Secured Silicon
Sector by using the address normally occupied by the
address 000000h-0001FFh. This mode of operation con­tinues until the system issues the Exit Secured Silicon
Sector command sequence, or until power is removed
from the device. On power-up, or following a hardware
reset, the device rever ts to sending command to ad­dress 000000h-0001FFFh.

LOW VCC WRITE INHIBIT

When VCC is less than VLKO the device does not ac­cept any write cycles. This protects dataduring VCC
power-up and power-do wn. The command register and
all internal program/erase circuits are disabled, and the
device resets. Subsequent writes are ignored until VCC
is greater thanVLK O. The system must provide the proper
signals to the control pins to prevent unintentional write
when VCC is greater than VLK O.

FACTORY LOCKED:Secured Silicon Sector
Programmed and Protected At the Factory

In device with an ESN, the Secured Silicon Sector is
protected when the device is shipped from the factory.
The Secured Silicon Sector cannot be modified in any
way . A f actory locked device has an 8-word random ESN
at address 000000h-000007h.

CUSTOMER LOCKABLE:Secured Silicon
Sector NOT Programmed or Protected At the
Factory

As an alternative to the factory-locked version, the device
may be ordered such that the customer may program
and protect the 512-word Secured Silicon Sector.
Programming and protecting the Secured Silicon Sector
must be used with caution since, once protected, there
is no procedure available for unprotecting the Secured
Silicon Sector area and none of the bits in the Secured
Silicon Sector memory space can be modified in any
way.

The Secured Silicon Sector area can be protected using
the following procedures:

Write the three-cycle Enter Secured Silicon Sector Region
command sequence. This allows in-system protection
of the Secured Silicon Sector without raising any device
pin to a high voltage. Note that method is only applicable
to the Secured Silicon Sector.

WRITE PULSE "GLITCH" PROTECTION

Noise pulses of less than 5ns(typical) on CE or WE will
not initiate a write cycle.

LOGICAL INHIBIT

Writing is inhibited by holding any one of OE = VIL, CE =
VIH or WE = VIH. To initiate a write cycle CE and WE
must be a logical zero while OE is a logical one.

POWER-UP SEQUENCE

The MX26L1620 powers up in the Read only mode. In
addition, the memory contents may only be altered after
successful completion of the predefined command se­quences.

P/N:PM0827

Once the Secured Silicon Sector is programmed, locked
and verified, the system must write the Exit Secured
Silicon Sector Region command sequence to return to
reading and writing the remainder of the array .

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9

SOFTWARE COMMAND DEFINTIONS

MX26L1620

Device operations are selected by writing specific ad­dress and data sequences into the command register.
Writing incorrect address and data values or writing them

All addresses are latched on the falling edge of WE or
CE, whichever happens later . All data are latched on ris-

ing edge of WE or CE, whiche ver happens first.
in the improper sequence will reset the device to the
read mode. Table 4 defines the valid register command
sequences. Either of the two reset command sequences
will reset the device(when applicable).

TABLE4. MX26L1620 COMMAND DEFINITIONS

First Bus Second Bus Third Bus Fourth Bus Fifth Bus Sixth Bus

Command Bus Cycle Cycle Cycle Cycle Cycle Cycle

Cycle Addr Data Addr Data Addr Data Addr Data Addr Data Addr Data
Read(Note 5) 1 RA RD
Reset(Note 6) 1 XXX F0
Autoselect(Note 7)
Manufacturer ID 4 555 AA 2AA 55 555 90 X00 C2
Device ID 4 555 AA 2AA 55 555 90 X01 22FE
Secured Sector 4 55 5 AA 2AA 55 5 55 90 x03 see
Factory Protect Note9
Enter Secured Silicon 3 555 AA 2AA 5 5 5 55 88
Sector
Exit Secured Silicon 4 555 AA 2AA 5 5 5 55 9 0 xxx 00
Sector
Porgram 4 555 AA 2AA 55 5 55 A0 PA PD
Chip Erase 6 55 5 AA 2 AA 5 5 55 5 8 0 55 5 AA 2AA 55 5 55 10
Deep power down 3 55 5 AA 2 AA 55 5 55 C 0

Legend:
X=Don't care
RA=Address of the memory location to be read.
RD=Data read from location RA during read operation.
P A=Address of the memory location to be programmed.

Addresses are latched on the falling edge of the WE or
CE pulse.
PD=Data to be programmed at location PA. Data is
latched on the rising edge of WE or CE pulse.

Notes:

1.See Table 1 for descriptions of bus operations.

2.All values are in hexadecimal.

3.Except when reading array or autoselect data, all bus cycles are write operation.

4.Address bits are don't care for unlock and command cycles , except when PA is required.

5.No unlock or command cycles required when device is in read mode.

6.The Reset command is required to return to the read mode when the device is in the autoselect mode or if Q5 goes
high.

7.The fourth cycle of the autoselect command sequence is a read cycle.

8.Command is valid when device is ready to read array data or when device is in autoselect mode.

9.The data is 88h for factory locked and 08h for non-factory locked.

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MX26L1620

READING ARRAY DATA

The device is automatically set to reading array data
after device power-up. No commands are required to
retrieve data. The device is also ready to read arra y data
after completing an Automatic Program or Automatic
Erase algorithm.

The system must issue the reset command to re-en­able the device for reading array data if Q5 goes high, or
while in the autoselect mode. See the "Reset Command"
section, next.

RESET COMMAND

Writing the reset command to the device resets the
device to reading array data. Address bits are don't care
for this command.

The reset command may be written between the se­quence cycles in an erase command sequence before
erasing begins. This resets the device to reading array
data. Once erasure begins, however, the device ignores
reset commands until the operation is complete.

The reset command may be written between the se­quence cycles in a program command sequence before
programming begins. This resets the device to reading
array data. Once programming begins ,howe ver , the device
ignores reset commands until the operation is complete.

The reset command may be written between the se­quence cycles in an SILICON ID READ command
sequence. Once in the SILICON ID READ mode, the
reset command
data.

must be written to return to reading array

ID READ command. The device then enters the SILICON
ID READ mode, and the system may read at any address
any number of times, without init iating another command
sequence. A read cycle at address XX00h retrieves the
manufacturer code. A read cycle at address XX01h re­turns the device code.

The system must write the reset command to exit the
autoselect mode and return to reading array data.

WORD PROGRAM COMMAND SEQUENCE

The command sequence requires four bus cycles, and
is initiated by writing two unlock write cycles, followed
by the program set-up command. The program address
and data are written next, which in turn initiate the
Embedded Program algorithm. The system is
to provide further controls or timings. The device
automatically generates the program pulses and verifies
the programmed cell margin. Table 4 shows the address
and data requirements for the byte program command
sequence.

When the Embedded Program algorithm is complete, the
device then returns to reading array data and addresses
are no longer latched. The system can determine the
status of the program operation by using Q7, Q6. See
"Write Operation Status" for information on these status
bits.

Any commands written to the device during the Em­bedded Program Algorithm are ignored. Note that a
hardware reset immediately terminates the programming
operation. The Word Program command sequence should
be reinitiated once the device has reset to reading array
data, to ensure data integrity.

not required

If Q5 goes high during a program or erase operation,
writing the reset command returns the device to reading
array data.

SILICON ID READ COMMAND SEQUENCE

The SILICON ID READ command sequence allows the
host system to access the manufacturer and devices
codes, and determine whether or not. Table 4 shows the
address and data requirements. This method is an
alternative to that shown in Table 1, which is intended for
EPROM programmers and requires VID on address bit
A9.

The SILICON ID READ command sequence is initiated
by writing two unlock cycles, followed by the SILICON

P/N:PM0827

Programming is allowed in any sequence. A bit cannot
be programmed from a "0" back to a "1". Cause the Data
Polling algorithm to indicate the operation was successful.
However, a succeeding read will show that the data is
still "0". Only erase operations can conver t a "0" to a
"1".

ACCELERATED PROGRAM OPERATIONS

The device offers accelerated program operations through
the ACC pin. When the system asserts VHH on the ACC
pin, the device automatically bypass the two "Unlock"
write cycle. The device uses the higher voltage on the
ACC pin to accelerate the operation. Note that the ACC
pin must not be at VHH any oper ation other than accelerated
programming, or device damage may result.

REV. 0.4, JAN. 31, 2002

11

MX26L1620

SETUP AUTOMATIC CHIP ERASE

Chip erase is a six-bus cycle operation. There are two
"unlock" write cycles. These are f ollow ed by writing the
"set-up" command 80H. Two more "unlock" write cycles
are then followed by the chip erase command 10H.

The MX26L1620 contains a Silicon-ID-Read operation to
supplement traditional PROM programming methodology .
The operation is initiated by writing the read silicon ID
command sequence into the command register. F ollow­ing the command write, a read cycle with A6=VIL,
A1=VIL, A0=VIL retrieves the manufacturer code of C2H.
A read cycle with A6=VIL, A1=VIL, A0=VIH returns the
device code of 22FEH for MX26L1620.

AUTOMATIC CHIP ERASE COMMAND

The device does not require the system to preprogram
prior to erase. The A utomatic Erase algorithm automati­cally preprograms and verifies the entire memory for an

TABLE 5. SILICON ID CODE

all zero data pattern prior to electrical erase. The system
is not required to provide any controls or timings during
these operations. Table 4 shows the address and data
requirements for the chip erase command sequence.

Any commands written to the chip during the Automatic
Erase algorithm are ignored. Note that a hardware reset
during the chip erase operation immediately terminates
the operation. The Chip Erase command sequence should
be reinitiated once the device has returned to reading
array data, to ensure data integrity.

The system can determine the status of the erase op­eration by using Q7, Q6. See "Write Operation Status"
for inf ormation on these status bits. When the Automatic
Erase algorithm is complete, the device returns to read­ing array data and addresses are no longer latched.

Figure 5 illustrates the algorithm for the erase opera­tion.See the Erase/Program Operations tables in "AC
Characteristics" for parameters, and to Figure 4 for tim­ing diagrams.

Pins A0 A1 A6 Q15 Q7 Q6 Q5 Q4 Q3 Q2 Q1 Q0 Code(Hex)

|
Q8

Manufacture code VIL VIL VIL 00 H 1 1 0 0 001000C2H
Device code for MX26L1620 VIH VIL VIL 22 H 1 1 1 1 111022FEH

WRITE OPERSTION STATUS

The device provides several bits to determine the sta­tus of a write operation: Q5, Q6, Q7. The following sub­sections describe the functions of these bits. Q7, and

Q6 each offer a method for determining whether a pro­gram or erase operation is complete or in progress. These
three bits are discussed first.

Table 6. Write Operation Status

Status Q7 Q6 Q5

Note1

In Progress Word Program in Auto Program Algorithm Q7 Toggle 0

Auto Erase Algorithm 0 Toggle 0
Exceeded Word Program in Auto Program Algorithm Q7 Toggle 1
Time Limits Auto Erase Algorithm 0 Toggle 1

Notes: 1.P erf orming successive read operations from any address will cause Q6 to toggle.

P/N:PM0827

12

REV. 0.4, JAN. 31, 2002

MX26L1620

Q7: Data Polling

The Data Polling bit, Q7, indicates to the host sys-tem
whether an Automatic Algorithm is in progress or com­pleted. Data Polling is valid after the rising edge of the
final WE pulse in the program or erase command se­quence.

During the Automatic Program algorithm, the device out­puts on Q7 the complement of the datum programmed
to Q7. This Q7 status also applies to programming dur­ing Er ase Suspend. When the Automatic Program algo­rithm is complete, the device outputs the datum pro­grammed to Q7. The system must provide the program
address to read valid status information on Q7.

During the Automatic Erase algorithm, Data Polling pro­duces a "0" on Q7. When the Automatic Erase algorithm
is complete. Data Polling produces a "1" on Q7. This is
analogous to the complement/true datum out-put de­scribed for the Automatic Program algorithm: the erase
function changes all the bits to "1" prior to this, the de­vice outputs the "complement,” or "0".”

If this time-out condition occurs during sector erase op­eration, it specifies that a is bad and it may not be re­used. Write the Reset command sequence to the de­vice, and then execute program or erase command se­quence. This allows the system to continue to use the
other active sectors in the device.

If this time-out condition occurs during the chip erase
operation, it specifies that the entire chip is bad.

If this time-out condition occurs during the word program­ming operation, the word is bad and maynot be reused,
(other word are still functional and can be reused).

Q6:Toggle BIT I

Toggle Bit I on Q6 indicates whether an Automatic Pro­gram or Erase algorithm is in progress or complete. Toggle
Bit I may be read at any address, and is valid after the
rising edge of the final WE or CE, whichever happens
first pulse in the command sequence(prior to the pro­gram or erase operation).

During an Automatic Program or Erase algorithm opera­tion, successive read cycles to any address cause Q6
to toggle. The system may use either OE or CE to con­trol the read cycles. When the operation is complete, Q6
stops toggling.

Q5:Program/Erase Timing

Q5 will indicate if the program or erase time has exceeded
the specified limits(internal pulse count). Under these
conditions Q5 will produce a "1". This time-out condition
indicates that the program or erase cycle was not suc­cessfully completed. Data Polling and Toggle Bit are the
only operating functions of the device under this condi­tion.

P/N:PM0827

REV. 0.4, JAN. 31, 2002

13

MX26L1620

ABSOLUTE MAXIMUM RATINGS

Storage T emperature

Plastic Packages . . . . . . . . . . . . . ..... -65oC to +150oC

Ambient T emperature

with Power Applied. . . . . . . . . . . . . ....-65oC to +125oC

V oltage with Respect to Ground

VCC (Note 1) . . . . . . . . . . . . . . . . . -0.5 V to +4.0 V

A9, OE, and

RESET (Note 2) . . . . . . . . . . . ....-0.5 V to +12.5 V

All other pins (Note 1) . . . . . . . -0.5 V to VCC +0.5 V

Output Short Circuit Current (Note 3) . . . . . . 200 mA

Notes:

1. Minimum DC v oltage on input or I/O pins is -0.5 V.
During voltage transitions, input or I/O pins may over­shoot VSS to -2.0 V for periods of up to 20 ns. See
Figure 6. Maximum DC voltage on input or I/O pins is
VCC +0.5 V. During voltage transitions, input or I/O
pins may overshoot to VCC +2.0 V for periods up to
20 ns. See Figure 7.

2. Minimum DC input voltage on pins A9, OE, and
RESET is -0.5 V. During voltage transitions, A9, OE,
and RESET may ov ershoot VSS to -2.0 V for periods
of up to 20 ns. See Figure 6. Maximum DC input volt­age on pin A9 is +12.5 V which ma y overshoot to 14.0
V for periods up to 20 ns.

3. No more than one output ma y be shorted to ground at
a time. Duration of the shor t circuit should not be
greater than one second.

OPERATING RATINGS

Commercial (C) Devices

Ambient Temperature (T

Industrial (I) Devices

Ambient Temperature (T

V

CC Supply Voltages

CC for full voltage range. . . . . . . . . . . +2.7 V to 3.6 V

V

Operating ranges define those limits between which the
functionality of the device is guaranteed.

A ) . . . . . . . . . . . . 0°C to +70°C

A ) . . . . . . . . . . -4 0 °C to +85°C

Stresses above those listed under "Absolute Maximum
Rat-ings" may cause permanent damage to the device.
This is a stress rating only; functional operation of the
device at these or any other conditions above those in­dicated in the operational sections of this data sheet is
not implied. Exposure of the device to absolute maxi­mum rating conditions for extended periods may affect
device reliability.

P/N:PM0827

REV. 0.4, JAN. 31, 2002

14

MX26L1620

DC CHARACTERISTICS TA=0

Para- VI/O=2.7V~3.6V VI/O=1.65V~2.6V
meter Description Test Conditions Min T yp Max Min Typ Max Unit

I LI Input Load Current (Note 1) VIN = VSS to VCC , ±1.0 ±1.0 uA

I LIT A9 Input Load Current VCC=VCC max; A9 = 12.5V 35 35 uA
I LO Output Leakage Current VOUT = VSS to VCC , ±1.0 ±1.0 uA

ICC1 VCC Active Read Current CE= VIL, OE = VIH 5 MHz 9 16 9 16 mA

(Notes1, 2) 1 MHz 2 4 2 4 mA

ICC2 VCC Active Write Current CE= V IL , OE = V IH 26 30 26 30 mA

(Notes 1, 3, 4)

ICC3 VCC Standby Current (CMOS) CE,RESET, 30 10 0 3 0 1 0 0 u A

(Note 1) ACC=VCC ± 0.3V

ICC4 VCC Standby Current (TTL) CE=VIH 0.5 1 0.5 1 mA

(Note 1)

ICC5 VCC Reset Current (Note 1) RESET = V SS ± 0.3 V, 0.2 5 0.2 5 uA

°°

°C to 70

°°

VCC = VCC max

VCC= VCC max

°°

°C, VCC=2.7V~3.6V

°°

ACC = VCC ± 0.3 V

IACC ACC Accelerated Program CE=VIL, OE=VIH Acc pin 5 10 5 10 mA

Current, Word Vcc pin 15 3 0 15 3 0 mA
VIL Input Low Voltage -0.5 0.8 0.4 V
VIH Input High Voltage 0.7xVcc Vcc+0.3 VI/O-0.4 V
VHH Voltage for ACC VCC = 3.0 V ± 10% 8.5 9.5 8.5 9.5 V

Program Acceleration
VID Voltage for Autoselect VCC = 3.0 V ± 10% 11.5 12.5 11.5 12.5 V
VOL Output Low Voltage IOL= 4.0mA,VCC=VCC min 0.45 0.45 V
VOH1 Output High Voltage IOH=-2.0mA,VCC=VCC min0.85VI/O 0.85VI/O V
VOH2 IOH=-100uA,VCC=VCC min VI/O-0.4 VI/O-0.4 V
VLKO Low V CC Lock-Out Voltage 2.3 2.5 2 .3 2.5 V

(Note 4)

Notes:

1. Maximum ICC specifications are tested with VCC = VCC max.

2. The ICC current listed is typically is less than 2 mA/MHz, with OE at V IH . Typical specifications are for VCC = 3.0 V.

3. ICC active while Embedded Erase or Embedded Program is in progress.

4. Not 100% tested.

P/N:PM0827

REV. 0.4, JAN. 31, 2002

15

MX26L1620

SWITCHING TEST CIRCUITS

TEST SPECIFICA TIONS

T est Condition 90 12 0 Unit
Output Load 1 TTL gate

DEVICE UNDER

TEST

2.7K ohm

3.3V

Output Load Capacitance, CL 3 0 100 pF
(including jig capacitance)
Input Rise and Fall Times 5 ns

CL

6.2K ohm

DIODES=IN3064

OR EQUIVALENT

Input Pulse Levels 0.0-3.0 V
Input timing measurement 1.5 V
reference levels
Output timing measurement 1.5 V
reference levels

KEY TO SWITCHING WA VEFORMS

WAVEFROM INPUTS OUTPUTS

Steady

Changing from H to L

Don't Care, Any Change P ermitted Changing, State Unknown
Does Not Apply Center Line is High Impedance State(High Z)

SWITCHING TEST WA VEFORMS

3.0V

0.0V

Changing from L to H

1.5V

INPUT

Measurement Level

VIO/2

OUTPUT

P/N:PM0827

REV. 0.4, JAN. 31, 2002

16

MX26L1620

AC CHARACTERISTICS TA=0

Symbol DESCRIPTION CONDITION 90 120 Unit

tACC Address to output delay CE=VIL MAX 90 12 0 ns

OE=VIL
tCE Chip enable to output delay OE=VIL MAX 90 12 0 ns
tOE Output enable to output delay MAX 34 44 ns
tDF OE High to output float(Note1) MAX 25 35 ns
tOH Output hold time of from the rising edge of M IN 0 0 ns

Address, CE, or OE, whichever happens first
tR C Read cycle time (Note 1) MIN 90 12 0 ns
tW C Write cycle time (Note 1) MIN 90 12 0 ns
tCWC Command write cycle time(Note 1) MIN 90 12 0 ns
tAS Address setup time MIN 0 0 ns
tAH Address hold time MIN 45 50 ns
tDS Data setup time MIN 45 5 0 ns
tD H Data hold time MIN 0 0 ns
tVCS Vcc setup time(Note 1) MIN 50 50 us
tCS Chip enable setup time MIN 0 0 ns
tC H Chip enable hold time MIN 0 0 ns
tOES Output enable setup time (Note 1) MIN 0 0 ns
tOEH Output enable hold time (Note 1) Read MIN 0 0 ns

tWES WE setup time MIN 0 0 ns
tWEH WE hold time MIN 0 0 ns
tCEP CE pulse width MIN 45 50 ns
tCEPH CE pulse width high MIN 3 0 30 ns
tWP WE pulse width MIN 35 50 ns
tWPH WE pulse width high MIN 30 30 ns
tOLZ Output enable to output low Z MAX 30 4 0 ns
tW HG L WE high to OE going low MIN 30 3 0 ns

°°

°C to 70

°°

°°

°C, VCC=2.7V~3.6V

°°

Toggle & MIN 10 10 ns
Data Polling

Note: 1.Not 100% Tested

2.tr = tf = 5ns

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17

Fig 1. COMMAND WRITE OPERATION

MX26L1620

VCC

Addresses

WE

CE

OE

Data

VIH

VIL

VIH

VIL

VIH

VIL

VIH

VIL

VIH

VIL

5V

ADD Valid

tAS

tOES

tCS tCH

tWP

tDS

tAH

tWPH

tCWC

tDH

DIN

READ/RESET OPERATION
Fig 2. READ TIMING WAVEFORMS

VIH

Addresses

CE

WE

OE

Outputs

VIL

VIH

VIL

VIH

VIL

VIH

VIL

VOH

VOL

HIGH Z

tOEH

tOLZ

tACC

tRC

ADD Valid

tCE

tOE

DAT A V alid

tDF

tOH

HIGH Z

P/N:PM0827

REV. 0.4, JAN. 31, 2002

18

MX26L1620

AC CHARACTERISTICS

Parameter Description Test Setup All Speed OptionsUnit

tREAD Y RESET PIN Low (NOT During Automatic MAX 500 ns

Algorithms) to Read or Write (See Note)
tRP1 RESET Pulse Width (During Automatic Algorithms) MIN 1 0 us
tRP2 RESET Pulse Width (NOT During Automatic Algorithms) MIN 500 ns
tR H RESET High Time Bef ore Read(See Note) MIN 5 0 ns

Note:Not 100% tested

Fig 3. RESET TIMING WAVFORM

CE, OE

RESET

RESET

tRH

tRP2

tReady

Reset Timing NOT during Automatic Algorithms

tRP1

Reset Timing during Automatic Algorithms

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REV. 0.4, JAN. 31, 2002

19

ERASE/PROGRAM OPERATION

Fig 4. AUTOMATIC CHIP ERASE TIMING WAVEFORM

tWC

tAS

MX26L1620

Read Status Data Erase Command Sequence(last two cycle)

Address

CE

OE

WE

Data

VCC

tVCS

2AAh

tCH

tGHWL

tWP

tCS tWPH

tDS tDH

55h

555h

tAH

10h

tWHGL

VA VA

tWHWH2

In

Progress

Complete

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20

Fig 5. AUTOMATIC CHIP ERASE ALGORITHM FLOWCHART

START

Write Data AAH Address 555H

Write Data 55H Address 2AAH

Write Data 80H Address 555H

Write Data AAH Address 555H

Write Data 55H Address 2AAH

MX26L1620

Write Data 10H Address 555H

Data Poll
from system

No

DATA = FFh ?

Auto Erase Completed

YES

YES

P/N:PM0827

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21

Fig 6. AUTOMATIC PROGRAM TIMING WAVEFORMS

tWC

tAS

MX26L1620

Read Status Data (last two cycle)Program Command Sequence(last two cycle)

Address

CE

OE

WE

Data

VCC

tVCS

555h

tCH

tGHWL

tWP

tCS tWPH

tDS tDH

A0h

PA

tAH

PD

tWHGL

PA PA

tWHWH1

Status

DOUT

NOTES:

1.PA=Program Address, PD=Program Data, DOUT is the true data the program address

Fig 7. Accelerated Program Timing Diagram

(8.5V ~ 9.5V)

VHH

ACC

VIL or VIH

tVHH

P/N:PM0827

VIL or VIH

tVHH

REV. 0.4, JAN. 31, 2002

22

Fig 8. CE CONTROLLED PROGRAM TIMING WAVEFORM

MX26L1620

Address

WE

OE

CE

Data

555 for program
2AA for erase

tWC

tWH

tGHEL

tWS

tRH

tCP

tDS

tDH

PA for program
555 for chip erase

tAS

tAH

tCPH

A0 for program
55 for erase

Data Polling

tWHGL

tBUSY

PD for program
10 for chip erase

tWHWH1 or 2

PA

Q7

DOUT

RESET

NOTES:

1.PA=Program Address, PD=Program Data, DOUT=Data Out, Q7=complement of data written to device.

2.Figure indicates the last two bus cycles of the command sequence.

P/N:PM0827

REV. 0.4, JAN. 31, 2002

23

Fig 9. AUTOMATIC PROGRAMMING ALGORITHM FLOWCHART

START

Write Data AAH Address 555H

Write Data 55H Address 2AAH

Write Data A0H Address 555H

Write Program Data/Address

MX26L1620

Increment
Address

No

No

Verify Word Ok ?

Last Address ?

Auto Program Completed

Data Polling
from system

YES

YES

P/N:PM0827

REV. 0.4, JAN. 31, 2002

24

MX26L1620

Fig 10. SECURED SILICON SECTOR PROTECTED ALOGORITHMS FLOWCHART

START

Enter Secured Silicon Sector

Wait 1us

Frist Wait Cycle Data=60h

Second Wait Cycle Data=60h

A6=0, A1=1, A0=0

NO

Wait 300us

Data=01h?

YES

Write Reset CommandDevice Failed

Secured Sector Protect Complete

P/N:PM0827

REV. 0.4, JAN. 31, 2002

25

Fig 11. SILICON ID READ TIMING WAVEFORM

MX26L1620

VCC

ADD

A9

ADD

A0

A1

ADD

CE

WE

OE

DATA

Q0-Q15

VIH

VIL

VIH

VIH

VIH

VIH

VIL

VIL

VIL

VIL

VIH

VIL

VIH

VIL

3V

VID
VIH

VIL

tACC

tCE

tOE

DATA OUT

00C2H

tOH

tACC

tDF

tOH

DATA OUT

22FE

P/N:PM0827

REV. 0.4, JAN. 31, 2002

26

MX26L1620

WRITE OPERATION STATUS

Fig 12. DATA POLLING TIMING WAVEFORMS (DURING AUTOMATIC ALGORITHMS)

tRC

Address

tACC

tCE

VAVAVA

CE

tCH

tOE

OE

tOEH

tDF

WE

tOH

DQ7

Q0-Q6

Complement

Status Data

Complement

Status Data

Valid DataTrue

Valid DataTrue

NOTES:

VA=Valid address. Figure shows are first status cycle after command sequence, last status read cycle, and array data read cycle.

High Z

High Z

P/N:PM0827

REV. 0.4, JAN. 31, 2002

27

Fig 13. Data Polling Algorithm

MX26L1620

START

Read Q7~Q0
Add. = VA (1)

No

Q7 = Data ?

No

Q5 = 1 ?

Yes

Read Q7~Q0

Add. = VA

Q7 = Data ?

No

FAIL

Yes

Yes

(2)

PASS

Notes:

1.V A=valid address f or programming.

2.Q7 should be rechecked even Q5="1"because Q7 may change simultaneously with Q5.

P/N:PM0827

28

REV. 0.4, JAN. 31, 2002

MX26L1620

Fig 14. TOGGLE BIT TIMING WAVEFORMS (DURING AUTOMATIC ALOGRITHMS)

tRC

Address

tACC

VA

tCE

VA

VA

VA

CE

tCH

tOE

OE

tOEH

tDF

WE

tOH

Q6/Q2

High Z

Valid Status

(first raed)

Valid Status

(second read) (stops toggling)

Valid Data

Valid Data

NOTES:

VA=Valid address; not required for Q6. Figure shows first two status cycle after command sequence, last status read cycle, and
array data read cycle.

P/N:PM0827

REV. 0.4, JAN. 31, 2002

29

Fig 15. Toggle Bit Algorithm

MX26L1620

START

Read Q7~Q0

Read Q7~Q0

Toggle Bit Q6

=Toggle?

NO

Program/Erase Operation Not

Complete, Write Reset Command

Q5=1?

Read Q7~Q0 Twice

Toggle Bit Q6=

Toggle?

(Note 1)

NO

YES

YES

(Note 1,2)

YES

Program/Erase Operation Complete

Note:

1.Read toggle bit twice to determine whether or not it is toggling.

2.Recheck toggle bit because it may stop toggling as Q5 changes to "1".

P/N:PM0827

30

REV. 0.4, JAN. 31, 2002

MX26L1620

ERASE AND PROGRAMMING PERFORMANCE(1)

LIMITS

PARAMETER MIN. TYP.(2) MAX. UNITS

Chip Erase Time 45 4 5 0 sec
Word Programming Time 30 3 50 us
Chip Programming Time 35 75 sec
Accelerated Word Program Time 7 21 0 us
Erase/Program Cycles 10 0 Cycles

Note: 1.Not 100% Tested, Excludes external system level o v er head.

2.T ypical v alues measured at 25°C,3.3V . Additionally programming typicals assume chec kerboard pattern.

LATCHUP CHARACTERISTICS

MIN. MAX.

Input Voltage with respect to GND on all pins except I/O pins -1.0V 13.5V
Input Voltage with respect to GND on all I/O pins -1.0V Vcc + 1.0V
Current -100mA +100mA
Includes all pins except Vcc. Test conditions: Vcc = 5.0V, one pin at a time.

CAPACITANCE TA=0

Parameter Symbol Parameter Description Test Set TYP MAX UNIT

CIN Input Capacitance VIN=0 6 7.5 pF
COUT Output Capacitance VOUT=0 8.5 12 pF
CIN2 Control Pin Capacitance VIN=0 7.5 9 pF

Notes:

1. Sampled, not 100% tested.

2. T est conditions T A=25°C, f=1.0MHz

°°

°C to 70

°°

°°

°C, VCC=2.7V~3.6V

°°

DATA RETENTION

Parameter Test Conditions Min Unit

Minimum Pattern Data Retention Time 15 0 10 Years

125 20 Years

P/N:PM0827

31

REV. 0.4, JAN. 31, 2002

MX26L1620

ORDERING INFORMATION

PLASTIC P ACKA GE

PART NO. ACCESS TIME Temperature Package type Ball Pitch

(ns) Range

MX26L1620MC-90 90 Commerical 44 pin SOP ­MX26L1620MC-12 120 Commerical 44 pin SOP ­MX26L1620TC-90 90 Commerical 48 pin TSOP -

(Normal Type)

MX26L1620TC-12 120 Commerical 48 pin TSOP -

(Normal Type)
MX26L1620XAC-90 9 0 Commerical 48 ball CSP 0.75 mm
MX26L1620XAC-12 120 Commerical 48 ball CSP 0.75 mm
MX26L1620XBC-90 9 0 Commerical 48 ball CSP 0.8 mm
MX26L1620XBC-12 120 Commerical 48 ball CSP 0.8 mm
MX26L1620MI-90 9 0 Industrial 44 pin SOP ­MX26L1620MI-12 120 Industrial 44 pin SOP ­MX26L1620TI-90 90 Industrial 48 pin TSOP -

(Normal Type)
MX26L1620TI-12 120 Industrial 48 pin TSOP -

(Normal Type)
MX26L1620XAI-90 90 Industrial 48 ball CSP 0.75 mm
MX26L1620XAI-12 120 Industrial 48 ball CSP 0.75 mm
MX26L1620XBI-90 90 Industrial 48 ball CSP 0.8 mm
MX26L1620XBI-12 120 Industrial 48 ball CSP 0.8 mm

P/N:PM0827

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32

PACKAGE INFORMATION

48-PIN PLASTIC TSOP

MX26L1620

P/N:PM0827

REV. 0.4, JAN. 31, 2002

33

44-Pin SOP

MX26L1620

P/N:PM0827

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34

MX26L1620

REVISION HISTORY

Revision No. Description Page Date

0.1 1.To added the VI/O voltage range and performance P1,7 JUL/23/2001

2.To modify Autoselect code table P 5

3.To added Deep power-down mode P9,10

4.To added chip erase algorithm flowchart P23

5.To added secured silicon sector protect Algorithm flowchart P24

6.To modify the 14-pin of 48 TSOP package from NC to VCC P2

0.2 1.To added 44 SOP package P1,2, 34 JUL/31/2001

2.To modify the VI/O range from 1.8V~5V to 1.8V~3.6V P1

3.Cancel th regulated voltage range 14

4.Modify DC Characteristics table for VIL/VIH voltage when VI/O range P15
is 1.8V~2.6V

0.3 1.To modify VI/O voltage range from 1.8V to 1.65V P1,8,1 5 SEP/26/2001

2.To modify ICC4/tCS/tCH/tOLZ/tWHGL spec P14,17

3.To modify VCC standby current from 50uA to 30uA P1,15

4.Cancel the deep power down mode P11,15

5.To modify programming time P31

0.4 1.To modify the content error P1,7 ,11 JAN/31/2002

2.To modify Fast erase time:23s/chip (typ.)-->45s/chip(typ.) P1,5,31

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35

MX26L1620

MACRONIX INTERNA TIONAL CO., LTD.

HEADQUARTERS:

TEL:[phone]
FAX:[phone]

EUROPE OFFICE:

TEL:[phone]
FAX:[phone]

JAPAN OFFICE:

TEL:[phone]
FAX:[phone]

SINGAPORE OFFICE:

TEL:[phone]
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