This advanced Power MOSFET is designed to withstand high
energy in the avalanche and commutation modes. The new energy
efficient design also offers a drain−to−source diode with a fast
recovery time. Designed for low voltage, high speed switching
applications in power supplies, converters and PWM motor controls,
these devices are particularly well suited for bridge circuits where
diode speed and commutating safe operating areas are critical and
offer additional safety margin against unexpected voltage transients.
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6 AMPERES, 200 VOLTS
R
DS(on)
= 460 mW
Features
• Avalanche Energy Specified
N−Channel
D
• Source−to−Drain Diode Recovery Time Comparable to a
Discrete Fast Recovery Diode
• Diode is Characterized for Use in Bridge Circuits
• I
DSS
and V
Specified at Elevated Temperature
DS(on)
G
• These Devices are Pb−Free and are RoHS Compliant
DPAK
DPAK
S
DIAGRAMS
1
Gate
Gate
MARKING
4 Drain
6
YWW
N20EG
2
Drain
4 Drain
6
YWW
N20EG
1
3
2
Source
Drain
3
Source
MAXIMUM RATINGS (T
RatingSymbolValueUnit
Drain−to−Source VoltageV
Drain−to−Gate Voltage (RGS = 1.0 MW)
Gate−to−Source Voltage
− Continuous
− Non−repetitive (tp ≤ 10 ms)
Drain Current
− Continuous
− Continuous @ 100°C
− Single Pulse (tp ≤ 10 ms)
Total Power Dissipation
Derate above 25°C
Total Power Dissipation @ TA = 25°C (Note 2)
Operating and Storage Temperature RangeTJ, T
Single Pulse Drain−to−Source Avalanche
Energy − Starting TJ = 25°C
(VDD = 80 Vdc, VGS = 10 Vdc,
IL = 6.0 Apk, L = 3.0 mH, RG = 25 W)
Thermal Resistance − Junction−to−Case
− Junction−to−Ambient (Note 1)
− Junction−to−Ambient (Note 2)
Maximum Temperature for Soldering
Purposes, 1/8″ from case for 10 secs
Stresses exceeding Maximum Ratings may damage the device. Maximum
Ratings are stress ratings only. Functional operation above the Recommended
Operating Conditions is not implied. Extended exposure to stresses above the
Recommended Operating Conditions may affect device reliability.
1. When surface mounted to an FR4 board using the minimum recommended
pad size.
2. When surface mounted to an FR4 board using the 0.5 sq. in. drain pad size.
*For additional information on our Pb−Free strategy and soldering details, please download the ON Semiconductor Soldering and Mounting
Techniques Reference Manual, SOLDERRM/D.
= 25°C unless otherwise noted)
C
DSS
V
DGR
V
GS
V
GSM
I
D
I
D
I
DM
P
D
stg
E
AS
R
q
JC
R
q
JA
R
q
JA
T
L
200Vdc
200Vdc
± 20
± 40
6.0
3.8
18
50
0.4
1.75
−55 to
150
54mJ
2.50
100
71.4
260°C
Vdc
Vpk
Adc
Apk
W
W/°C
W
°C
°C/W
4
2
1
3
1
2
3
CASE 369C
STYLE 2
4
CASE 369D
STYLE 2
6N20E Device Code
Y= Year
WW= Work Week
G= Pb−Free Package
ORDERING INFORMATION
See detailed ordering and shipping information in the package
dimensions section on page 7 of this data sheet.
4. Switching characteristics are independent of operating junction temperature.
V
(BR)DSS
I
DSS
GSS
V
GS(th)
DS(on)
V
DS(on)
C
t
d(on)
d(off)
Q
Q
Q
Q
V
t
t
t
L
L
FS
iss
oss
rss
r
f
SD
rr
a
b
RR
D
S
200
−
−
689
−
−
Vdc
mV/°C
mAdc
−
−
−
−
10
100
−−100nAdc
2.0
−
3.0
7.1
4.0
−
Vdc
mV/°C
−0.460.700Ohm
Vdc
−
−
2.9
−
4.4
5.0
1.5−−mhos
−342480
pF
−92130
−2755
−8.817.6
ns
−2958
−2244
−2040.8
T
1
2
3
−13.721
−2.7−
−7.1−
−5.9−
nC
Vdc
−
−
−138−
0.99
0.9
1.2
−
ns
−93−
−45−
−0.74−
mC
−4.5−nH
−7.5−nH
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2
Page 3
MTD6N20E
TYPICAL ELECTRICAL CHARACTERISTICS
12
TJ = 25°CVDS ≥ 10 V
10
8
6
4
, DRAIN CURRENT (AMPS)
D
I
2
0
0123 4 5 67 8 92 3 4 5 6 7 8 9
VDS, DRAIN-TO-SOURCE VOLTAGE (VOLTS)
VGS = 10 V
9 V
8 V
7 V
6 V
5 V
Figure 1. On−Region Characteristics
1.2
VGS = 10 V
1.0
0.8
0.6
0.4
0.2
, DRAIN-TO-SOURCE RESISTANCE (OHMS)
TJ = 100°C
25°C
-55°C
12
10
8
6
4
, DRAIN CURRENT (AMPS)
D
I
2
0
0.70
0.65
0.60
0.55
0.50
0.45
, DRAIN-TO-SOURCE RESISTANCE (OHMS)
TJ = -55°C
25°C
100°C
VGS, GATE-TO-SOURCE VOLTAGE (VOLTS)
Figure 2. Transfer Characteristics
TJ = 25°C
VGS = 10 V
15 V
0
DS(on)
R
024681012024681012
ID, DRAIN CURRENT (AMPS)
Figure 3. On−Resistance versus Drain Current
and Temperature
2.5
VGS = 10 V
ID = 3 A
2.0
1.5
1.0
(NORMALIZED)
, DRAIN-TO-SOURCE RESISTANCE
0.5
DS(on)
R
0
- 50- 250255075100125150050100150200
TJ, JUNCTION TEMPERATURE (°C)
Figure 5. On−Resistance Variation with
Temperature
0.40
DS(on)
R
ID, DRAIN CURRENT (AMPS)
Figure 4. On−Resistance versus Drain Current
and Gate Voltage
100
VGS = 0 V
10
, LEAKAGE (nA)
DSS
I
1
VDS, DRAIN-TO-SOURCE VOLTAGE (VOLTS)
TJ = 125°C
100°C
25°C
Figure 6. Drain−To−Source Leakage
Current versus Voltage
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Page 4
MTD6N20E
POWER MOSFET SWITCHING
Switching behavior is most easily modeled and predicted
by recognizing that the power MOSFET is charge
controlled. The lengths of various switching intervals (Dt)
are determined by how fast the FET input capacitance can
be charged by current from the generator.
The published capacitance data is difficult to use for
calculating rise and fall because drain−gate capacitance
varies greatly with applied voltage. Accordingly, gate
charge data is used. In most cases, a satisfactory estimate of
average input current (I
) can be made from a
G(AV)
rudimentary analysis of the drive circuit so that
t = Q/I
G(AV)
During the rise and fall time interval when switching a
resistive load, VGS remains virtually constant at a level
known as the plateau voltage, V
. Therefore, rise and fall
SGP
times may be approximated by the following:
tr = Q2 x RG/(VGG − V
tf = Q2 x RG/V
GSP
GSP
)
where
VGG = the gate drive voltage, which varies from zero to V
GG
RG = the gate drive resistance
and Q2 and V
are read from the gate charge curve.
GSP
During the turn−on and turn−off delay times, gate current is
not constant. The simplest calculation uses appropriate
values from the capacitance curves in a standard equation for
voltage change in an RC network. The equations are:
t
d(on)
t
d(off)
= RG C
= RG C
In [VGG/(V
iss
In (VGG/V
iss
GG
GSP
− V
)
GSP
)]
The capacitance (C
) is read from the capacitance curve at
iss
a voltage corresponding to the off−state condition when
calculating t
on−state when calculating t
and is read at a voltage corresponding to the
d(on)
.
d(off)
At high switching speeds, parasitic circuit elements
complicate the analysis. The inductance of the MOSFET
source lead, inside the package and in the circuit wiring
which is common to both the drain and gate current paths,
produces a voltage at the source which reduces the gate drive
current. The voltage is determined by Ldi/dt, but since di/dt
is a function of drain current, the mathematical solution is
complex. The MOSFET output capacitance also
complicates the mathematics. And finally, MOSFETs have
finite internal gate resistance which effectively adds to the
resistance of the driving source, but the internal resistance
is difficult to measure and, consequently, is not specified.
The resistive switching time variation versus gate
resistance (Figure 9) shows how typical switching
performance is affected by the parasitic circuit elements. If
the parasitics were not present, the slope of the curves would
maintain a value of unity regardless of the switching speed.
The circuit used to obtain the data is constructed to minimize
common inductance in the drain and gate circuit loops and
is believed readily achievable with board mounted
components. Most power electronic loads are inductive; the
data in the figure is taken with a resistive load, which
approximates an optimally snubbed inductive load. Power
MOSFETs may be safely operated into an inductive load;
however, snubbing reduces switching losses.
900
750
600
450
300
C, CAPACITANCE (pF)
150
0
VDS = 0 V
C
iss
C
rss
GATE-TO-SOURCE OR DRAIN-TO-SOURCE VOLTAGE (VOLTS)
VGS = 0 V
C
iss
C
oss
C
rss
V
Figure 7. Capacitance Variation
V
GS
DS
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4
TJ = 25°C
25105 0 5101520
Page 5
MTD6N20E
12
Q
T
V
Q
2
GS
V
DS
, GATE-TO-SOURCE VOLTAGE (VOLTS)
GS
V
10
Q
8
6
4
2
0
1
Q
3
QT, TOTAL CHARGE (nC)
Figure 8. Gate−To−Source and Drain−To−Source
Voltage versus Total Charge
DRAIN−TO−SOURCE DIODE CHARACTERISTICS
6
VGS = 0 V
TJ = 25°C
5
4
ID = 6 A
TJ = 25°C
1000
90
75
60
45
30
15
, DRAIN-TO-SOURCE VOLTAGE (VOLTS)
DS
V
0
14121086420
t, TIME (ns)
100
10
1
VDD = 100 V
ID = 6 A
VGS = 10 V
TJ = 25°C
t
r
t
d(off)
t
d(on)
RG, GATE RESISTANCE (OHMS)
t
f
100101
Figure 9. Resistive Switching Time
Variation versus Gate Resistance
3
2
, SOURCE CURRENT (AMPS)
S
I
1
0
0.50.60.70.80.91.0
VSD, SOURCE-TO-DRAIN VOLTAGE (VOLTS)
Figure 10. Diode Forward Voltage versus Current
SAFE OPERATING AREA
The Forward Biased Safe Operating Area curves define the
maximum simultaneous drain−to−source voltage and drain
current that a transistor can handle safely when it is forward
biased. Curves are based upon maximum peak junction
temperature and a case temperature (TC) of 25°C. Peak
repetitive pulsed power limits are determined by using the
thermal response data in conjunction with the procedures
discussed in AN569, “Transient Thermal Resistance−General
Data and Its Use.”
Switching between the off−state and the on−state may
traverse any load line provided neither rated peak current
(IDM) nor rated voltage (V
) is exceeded and the
DSS
transition time (tr,tf) do not exceed 10 ms. In addition the total
power averaged over a complete switching cycle must not
exceed (T
J(MAX)
− TC)/(R
qJC
).
A Power MOSFET designated E−FET can be safely used
in switching circuits with unclamped inductive loads. For
reliable operation, the stored energy from circuit inductance
dissipated in the transistor while in avalanche must be less
than the rated limit and adjusted for operating conditions
differing from those specified. Although industry practice is
to rate in terms of energy, avalanche energy capability is not
a constant. The energy rating decreases non−linearly with an
increase of peak current in avalanche and peak junction
temperature.
Although many E−FETs can withstand the stress of
drain−to−source avalanche at currents up to rated pulsed
current (IDM), the energy rating is specified at rated
continuous current (ID), in accordance with industry
custom. The energy rating must be derated for temperature
as shown in the accompanying graph (Figure 12). Maximum
energy at currents below rated continuous I
can safely be
D
assumed to equal the values indicated.
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5
Page 6
MTD6N20E
SAFE OPERATING AREA
100
VGS = 20 V
SINGLE PULSE
TC = 25°C
10
1.0
, DRAIN CURRENT (AMPS)
D
I
R
DS(on)
LIMIT
THERMAL LIMIT
0.1
PACKAGE LIMIT
VDS, DRAIN-TO-SOURCE VOLTAGE (VOLTS)
Figure 11. Maximum Rated Forward Biased
Safe Operating Area
100
10 ms
100 ms
1 ms
10 ms
dc
1000101.00.1
60
50
40
30
20
AVALANCHE ENERGY (mJ)
10
, SINGLE PULSE DRAIN-TO-SOURCE
AS
E
0
255075100125150
TJ, STARTING JUNCTION TEMPERATURE (°C)
Figure 12. Maximum Avalanche Energy versus
Starting Junction Temperature
1
D = 0.5
0.2
0.1
0.05
0.1
0.02
0.01
r(t), NORMALIZED EFFECTIVE
SINGLE PULSE
TRANSIENT THERMAL RESISTANCE
P
(pk)
t
1
t
2
DUTY CYCLE, D = t1/t
R
(t) = r(t) R
q
JC
q
JC
D CURVES APPLY FOR POWER
PULSE TRAIN SHOWN
READ TIME AT t
T
- TC = P
J(pk)
2
(pk)
1
R
q
JC
0.01
1.0E-051.0E-041.0E-031.0E-021.0E-011.0E+001.0E+01
t, TIME (s)
ID = 6 A
(t)
Figure 13. Thermal Response
di/dt
I
S
t
rr
t
t
a
b
TIME
t
p
0.25 I
S
I
S
Figure 14. Diode Reverse Recovery Waveform
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6
Page 7
ORDERING INFORMATION
MTD6N20E
DevicePackageShipping
MTD6N20ET4GDPAK
(Pb−Free)
MTD6N20ET5GDPAK
(Pb−Free)
†For information on tape and reel specifications, including part orientation and tape sizes, please refer to our Tape and Reel Packaging
Specifications Brochure, BRD8011/D.
2500 Tape & Reel
2500 Tape & Reel
†
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7
Page 8
L3
L4
b2
e
E
b3
4
12 3
A
B
D
b
0.005 (0.13)C
DETAIL A
M
MTD6N20E
PACKAGE DIMENSIONS
DPAK (SINGLE GAUGE)
CASE 369C−01
ISSUE D
C
A
c2
H
c
H
GAUGE
L2
PLANE
L
L1
DETAIL A
ROTATED 90 CW5
RECOMMENDED FOOTPRINT*
6.20
0.244
2.58
0.101
A1
3.0
0.118
Z
C
SEATING
PLANE
NOTES:
1. DIMENSIONING AND TOLERANCING PER ASME
Y14.5M, 1994.
2. CONTROLLING DIMENSION: INCHES.
3. THERMAL PAD CONTOUR OPTIONAL WITHIN DIMENSIONS b3, L3 and Z.
4. DIMENSIONS D AND E DO NOT INCLUDE MOLD
FLASH, PROTRUSIONS, OR BURRS. MOLD
FLASH, PROTRUSIONS, OR GATE BURRS SHALL
NOT EXCEED 0.006 INCHES PER SIDE.
5. DIMENSIONS D AND E ARE DETERMINED AT THE
OUTERMOST EXTREMES OF THE PLASTIC BODY.
6. DATUMS A AND B ARE DETERMINED AT DATUM
PLANE H.
DIM MINMAXMIN MAX
A 0.086 0.0942.182.38
A1 0.000 0.0050.000.13
b 0.025 0.0350.630.89
b2 0.030 0.0450.761.14
b3 0.180 0.2154.575.46
*For additional information on our Pb−Free strategy and soldering
details, please download the ON Semiconductor Soldering and
Mounting Techniques Reference Manual, SOLDERRM/D.
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8
Page 9
MTD6N20E
PACKAGE DIMENSIONS
DPAK−3 (SINGLE GAUGE)
CASE 369D−01
ISSUE B
V
S
−T−
SEATING
PLANE
F
B
R
4
123
G
A
K
D 3 PL
0.13 (0.005)T
C
E
J
H
M
NOTES:
1. DIMENSIONING AND TOLERANCING PER
ANSI Y14.5M, 1982.
2. CONTROLLING DIMENSION: INCH.
DIM MINMAXMIN MAX
Z
A 0.235 0.2455.976.35
B 0.250 0.2656.356.73
C 0.086 0.0942.192.38
D 0.027 0.0350.690.88
E 0.018 0.0230.460.58
F 0.037 0.0450.941.14
0.090 BSC2.29 BSC
G
H 0.034 0.0400.871.01
J 0.018 0.0230.460.58
K 0.350 0.3808.899.65
R 0.180 0.2154.455.45
S 0.025 0.0400.631.01
V 0.035 0.0500.891.27
Z 0.155−−−3.93−−−
STYLE 2:
PIN 1. GATE
2. DRAIN
3. SOURCE
4. DRAIN
MILLIMETERSINCHES
ON Semiconductor and are registered trademarks of Semiconductor Components Industries, LLC (SCILLC). SCILLC reserves the right to make changes without further notice
to any products herein. SCILLC makes no warranty, representation or guarantee regarding the suitability of its products for any particular purpose, nor does SCILLC assume any liability
arising out of the application or use of any product or circuit, and specifically disclaims any and all liability, including without limitation special, consequential or incidental damages.
“Typical” parameters which may be provided in SCILLC data sheets and/or specifications can and do vary in different applications and actual performance may vary over time. All
operating parameters, including “Typicals” must be validated for each customer application by customer’s technical experts. SCILLC does not convey any license under its patent rights
nor the rights of others. SCILLC products are not designed, intended, or authorized for use as components in systems intended for surgical implant into the body, or other applications
intended to support or sustain life, or for any other application in which the failure of the SCILLC product could create a situation where personal injury or death may occur. Should
Buyer purchase or use SCILLC products for any such unintended or unauthorized application, Buyer shall indemnify and hold SCILLC and its officers, employees, subsidiaries, affiliates,
and distributors harmless against all claims, costs, damages, and expenses, and reasonable attorney fees arising out of, directly or indirectly, any claim of personal injury or death
associated with such unintended or unauthorized use, even if such claim alleges that SCILLC was negligent regarding the design or manufacture of the part. SCILLC is an Equal
Opportunity/Affirmative Action Employer. This literature is subject to all applicable copyright laws and is not for resale in any manner.
PUBLICATION ORDERING INFORMATION
LITERATURE FULFILLMENT:
Literature Distribution Center for ON Semiconductor
P.O. Box 5163, Denver, Colorado 80217 USA
Phone: 303−675−2175 or 800−344−3860 Toll Free USA/Canada
Fax: 303−675−2176 or 800−344−3867Toll Free USA/Canada
Email: [email protected]
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Europe, Middle East and Africa Technical Support:
Phone: 421 33 790 2910
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ON Semiconductor Website: www.onsemi.com
Order Literature: http://www.onsemi.com/orderlit
For additional information, please contact your local
Sales Representative
MTD6N20E/D
9
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