Datasheet MT48LC64M8A2TG-75, MT48LC128M4A2TG-75, MT48LC128M4A2TG-7E, MT48LC64M8A2TG-7E, MT48LC32M16A2TG-7E Datasheet (MICRON)

...
Page 1
ADVANCE
‡ PRODUCTS AND SPECIFICATIONS DISCUSSED HEREIN ARE FOR EVALUATION AND REFERENCE PURPOSES ONLY AND ARE SUBJECT TO CHANGE
BY MICRON WITHOUT NOTICE. PRODUCTS ARE ONLY WARRANTED BY MICRON TO MEET MICRON’S PRODUCTION DATA SHEET SPECIFICATIONS.
1
512Mb: x4, x8, x16
SDRAM
512Mb: x4, x8, x16 SDRAM Micron Technology, Inc., reserves the right to change products or specifications without notice. 512MSDRAM_D.p65 – Rev. D; Pub 1/02 ©2000, Micron Technology, Inc.
KEY TIMING PARAMETERS
SPEED CLOCK ACCESS TIME SETUP HOLD
GRADE FREQUENCY CL = 2* CL = 3* TIME TIME
-7E 143 MHz 5.4ns 1.5ns 0.8ns
-75 133 MHz 5.4ns 1.5ns 0.8ns
-7E 133 MHz 5.4ns 1.5ns 0.8ns
-75 100 MHz 6ns 1.5ns 0.8ns
128 Meg x 4 64 Meg x 8 32 Meg x 16
Configuration 32 Meg x 4 x 4 banks 16 Meg x 8 x 4 banks 8 Meg x 16 x 4 banks Refresh Count 8K 8K 8K Row Addressing 8K (A0–A12) 8K (A0–A12) 8K (A0–A12) Bank Addressing 4 (BA0, BA1) 4 (BA0, BA1) 4 (BA0, BA1) Column Addressing 4K (A0–A9, A11, A12) 2K (A0–A9, A11) 1K (A0–A9)
SYNCHRONOUS DRAM
MT48LC128M4A2 – 32 Meg x 4 x 4 banks MT48LC64M8A2 – 16 Meg x 8 x 4 banks MT48LC32M16A2 – 8 Meg x 16 x 4 banks
For the latest data sheet, please refer to the Micron Web site:
www.micron.com/dramds
Pin Assignment (Top View)
54-Pin TSOP
FEATURES
• PC100- and PC133-compliant
• Fully synchronous; all signals registered on positive edge of system clock
• Internal pipelined operation; column address can be changed every clock cycle
• Internal banks for hiding row access/precharge
• Programmable burst lengths: 1, 2, 4, 8, or full page
• Auto Precharge, includes CONCURRENT AUTO PRECHARGE, and Auto Refresh Modes
• Self Refresh Mode
• 64ms, 8,192-cycle refresh
• LVTTL-compatible inputs and outputs
• Single +3.3V ±0.3V power supply
OPTIONS MARKING
• Configurations 128 Meg x 4 (32 Meg x 4 x 4 banks) 128M4
64 Meg x 8 (16 Meg x 8 x 4 banks) 64M8 32 Meg x 16 (8 Meg x 16 x 4 banks) 32M16
• WRITE Recovery (tWR)
t
WR = “2 CLK”
1
A2
• Plastic Package – OCPL
2
54-pin TSOP II (400 mil) TG
• Timing (Cycle Time)
7.5ns @ CL = 2 (PC133) -7E
7.5ns @ CL = 3 (PC133) -75
• Self Refresh Standard None Low power L
• Operating Temperature Commercial (0oC to +70oC) None
NOTE: 1. Refer to Micron Technical Note TN-48-05.
2. Off-center parting line.
Part Number Example:
MT48LC32M16A2TG-75
NOTE: The # symbol indicates signal is active LOW. A dash
(–) indicates x8 and x4 pin function is same as x16 pin function.
V
DD
DQ0
V
DD
Q
DQ1 DQ2
VssQ
DQ3 DQ4
V
DD
Q
DQ5 DQ6
VssQ
DQ7
V
DD
DQML
WE#
CAS# RAS#
CS#
BA0 BA1 A10
A0 A1 A2 A3
V
DD
1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 25 26 27
54 53 52 51 50 49 48 47 46 45 44 43 42 41 40 39 38 37 36 35 34 33 32 31 30 29 28
Vss
DQ15
VssQ
DQ14 DQ13
V
DD
Q
DQ12 DQ11
VssQ
DQ10 DQ9
V
DD
Q
DQ8
Vss NC DQMH CLK CKE
A12 A11 A9 A8 A7 A6 A5 A4
Vss
x8x16 x16x8 x4x4
-
DQ0
-
NC
DQ1
-
NC
DQ2
-
NC
DQ3
-
NC
-
NC
-
-
-
-
-
-
-
-
-
-
-
-
-
NC
-
NC
DQ0
-
NC NC
-
NC
DQ1
-
NC
-
NC
-
-
-
-
-
-
-
-
-
-
-
-
-
DQ7
-
NC
DQ6
-
NC
DQ5
-
NC
DQ4
-
NC
-
-
DQM
-
-
-
-
-
-
-
-
-
-
-
-
NC
-
NC
DQ3
-
NC NC
-
NC
DQ2
-
NC
-
-
DQM
-
-
-
-
-
-
-
-
-
-
-
*CL = CAS (READ) latency
512Mb SDRAM PART NUMBERS
PART NUMBER ARCHITECTURE
MT48LC128M4A2TG 128 Meg x 4 MT48LC64M8A2TG 64 Meg x 8 MT48LC32M16A2TG 32 Meg x 16
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512Mb: x4, x8, x16 SDRAM Micron Technology, Inc., reserves the right to change products or specifications without notice. 512MSDRAM_D.p65 – Rev. D; Pub 1/02 ©2000, Micron Technology, Inc.
512Mb: x4, x8, x16
SDRAM
ADVANCE
page, with a burst terminate option. An auto precharge function may be enabled to provide a self-timed row precharge that is initiated at the end of the burst se­quence.
The 512Mb SDRAM uses an internal pipelined archi­tecture to achieve high-speed operation. This architec­ture is compatible with the 2n rule of prefetch architec­tures, but it also allows the column address to be changed on every clock cycle to achieve a high-speed, fully ran­dom access. Precharging one bank while accessing one of the other three banks will hide the precharge cycles and provide seamless, high-speed, random-access operation.
The 512Mb SDRAM is designed to operate at 3.3V. An auto refresh mode is provided, along with a power-sav­ing, power-down mode. All inputs and outputs are LVTTL­compatible.
SDRAMs offer substantial advances in DRAM operat­ing performance, including the ability to synchronously burst data at a high data rate with automatic column­address generation, the ability to interleave between in­ternal banks to hide precharge time and the capability to randomly change column addresses on each clock cycle during a burst access.
GENERAL DESCRIPTION
The 512Mb SDRAM is a high-speed CMOS, dynamic random-access memory containing 536,870,912 bits. It is internally configured as a quad-bank DRAM with a syn­chronous interface (all signals are registered on the posi­tive edge of the clock signal, CLK). Each of the x4’s 134,217,728-bit banks is organized as 8,192 rows by 4,096 columns by 4 bits. Each of the x8’s 134,217,728-bit banks is organized as 8,192 rows by 2,048 columns by 8 bits. Each of the x16’s 134,217,728-bit banks is organized as 8,192 rows by 1,024 columns by 16 bits.
Read and write accesses to the SDRAM are burst ori­ented; accesses start at a selected location and continue for a programmed number of locations in a programmed sequence. Accesses begin with the registration of an AC­TIVE command, which is then followed by a READ or WRITE command. The address bits registered coincident with the ACTIVE command are used to select the bank and row to be accessed (BA0, BA1 select the bank; A0-A12 select the row). The address bits registered coincident with the READ or WRITE command are used to select the starting column location for the burst access.
The SDRAM provides for programmable READ or WRITE burst lengths of 1, 2, 4, or 8 locations, or the full
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512Mb: x4, x8, x16 SDRAM Micron Technology, Inc., reserves the right to change products or specifications without notice. 512MSDRAM_D.p65 – Rev. D; Pub 1/02 ©2000, Micron Technology, Inc.
512Mb: x4, x8, x16
SDRAM
ADVANCE
TABLE OF CONTENTS
Functional Block Diagram – 128 Meg x 4 .................... 4
Functional Block Diagram – 64 Meg x 8 ................... 5
Functional Block Diagram – 32 Meg x 16 ................. 6
Pin Descriptions ........................................................... 7
Functional Description ............................................... 8
Initialization ............................................................ 8
Register Definition .................................................. 8
Mode Register .................................................... 8
Burst Length ................................................. 8
Burst Type .................................................... 9
CAS Latency ................................................. 10
Operating Mode ........................................... 10
Write Burst Mode ......................................... 10
Commands.................................................................... 11
Truth Table 1 (Commands and DQM Operation) ............ 11
Command Inhibit ................................................... 12
No Operation (NOP) ............................................... 12
Load Mode Register ................................................ 12
Active ....................................................................... 12
Read ....................................................................... 12
Write ....................................................................... 12
Precharge ................................................................. 12
Auto Precharge ........................................................ 12
Burst Terminate ...................................................... 13
Auto Refresh ............................................................ 13
Self Refresh .............................................................. 13
Operation ...................................................................... 14
Bank/Row Activation .............................................. 14
Reads ....................................................................... 16
Writes ....................................................................... 21
Precharge ................................................................. 23
Power-Down ............................................................ 23
Clock Suspend ......................................................... 24
Burst Read/Single Write ......................................... 24
Concurrent Auto Precharge ................................... 25
Truth Table 2 (CKE) ..................................................... 27
Truth Table 3 (Current State, Same Bank) ...................... 28
Truth Table 4 (Current State, Different Bank) ................. 30
Absolute Maximum Ratings ........................................ 32
DC Electrical Characteristics and Operating
Conditions ................................................................ 32
I
DD Specifications and Conditions .............................. 32
Capacitance ................................................................... 33
AC Electrical Characteristics (Timing Table) ............ 33
Timing Waveforms
Initialize and Load Mode Register ......................... 36
Power-Down Mode ................................................. 37
Clock Suspend Mode .............................................. 38
Auto Refresh Mode ................................................. 39
Self Refresh Mode ................................................... 40
Reads
Read – Without Auto Precharge ....................... 41
Read – With Auto Precharge ............................. 42
Single Read – Without Auto Precharge ............ 43
Single Read – With Auto Precharge ................. 44
Alternating Bank Read Accesses ...................... 45
Read – Full-Page Burst ...................................... 46
Read – DQM Operation .................................... 47
Writes
Write – Without Auto Precharge ...................... 48
Write – With Auto Precharge ............................ 49
Single Write – Without Auto Precharge ........... 50
Single Write – With Auto Precharge ................. 51
Alternating Bank Write Accesses ..................... 52
Write – Full-Page Burst ..................................... 53
Write – DQM Operation .................................... 54
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512Mb: x4, x8, x16 SDRAM Micron Technology, Inc., reserves the right to change products or specifications without notice. 512MSDRAM_D.p65 – Rev. D; Pub 1/02 ©2000, Micron Technology, Inc.
512Mb: x4, x8, x16
SDRAM
ADVANCE
FUNCTIONAL BLOCK DIAGRAM
128 Meg x 4 SDRAM
13
RAS#
CAS#
ROW-
ADDRESS
MUX
CLK
CS#
WE#
CKE
CONTROL
LOGIC
COLUMN-
ADDRESS
COUNTER/
LATCH
MODE REGISTER
12
COMMAND
DECODE
A0-A12,
BA0, BA1
DQM
13
ADDRESS REGISTER
15
4096
(x4)
8192
I/O GATING
DQM MASK LOGIC
READ DATA LATCH
WRITE DRIVERS
COLUMN
DECODER
BANK0
MEMORY
ARRAY
(8,192 x 4,096 x 4)
BANK0
ROW-
ADDRESS
LATCH
&
DECODER
8192
SENSE AMPLIFIERS
BANK
CONTROL
LOGIC
DQ0­DQ3
4
4
DATA INPUT
REGISTER
DATA
OUTPUT
REGISTER
4
12
BANK1
BANK2
BANK3
13
12
2
1 1
2
REFRESH
COUNTER
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512Mb: x4, x8, x16 SDRAM Micron Technology, Inc., reserves the right to change products or specifications without notice. 512MSDRAM_D.p65 – Rev. D; Pub 1/02 ©2000, Micron Technology, Inc.
512Mb: x4, x8, x16
SDRAM
ADVANCE
FUNCTIONAL BLOCK DIAGRAM
64 Meg x 8 SDRAM
13
RAS#
CAS#
ROW-
ADDRESS
MUX
CLK
CS#
WE#
CKE
CONTROL
LOGIC
COLUMN­ADDRESS
COUNTER/
LATCH
MODE REGISTER
11
COMMAND
DECODE
A0-A12,
BA0, BA1
DQM
13
ADDRESS REGISTER
15
2048
(x8)
8192
I/O GATING DQM MASK LOGIC READ DATA LATCH
WRITE DRIVERS
COLUMN DECODER
BANK0
MEMORY
ARRAY
(8,192 x 2,048 x 8)
BANK0
ROW-
ADDRESS
LATCH
&
DECODER
8192
SENSE AMPLIFIERS
BANK
CONTROL
LOGIC
DQ0­DQ7
8
8
DATA INPUT
REGISTER
DATA
OUTPUT
REGISTER
8
12
BANK1
BANK2
BANK3
13
11
2
1 1
2
REFRESH
COUNTER
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512Mb: x4, x8, x16 SDRAM Micron Technology, Inc., reserves the right to change products or specifications without notice. 512MSDRAM_D.p65 – Rev. D; Pub 1/02 ©2000, Micron Technology, Inc.
512Mb: x4, x8, x16
SDRAM
ADVANCE
FUNCTIONAL BLOCK DIAGRAM
32 Meg x 16 SDRAM
13
RAS#
CAS#
ROW-
ADDRESS
MUX
CLK
CS#
WE#
CKE
CONTROL
LOGIC
COLUMN-
ADDRESS
COUNTER/
LATCH
MODE REGISTER
10
COMMAND
DECODE
A0-A12,
BA0, BA1
DQML, DQMH
13
ADDRESS REGISTER
15
1024 (x16)
8192
I/O GATING DQM MASK LOGIC
READ DATA LATCH
WRITE DRIVERS
COLUMN
DECODER
BANK0
MEMORY
ARRAY
(8,192 x 1,024 x 16)
BANK0
ROW-
ADDRESS
LATCH
&
DECODER
8192
SENSE AMPLIFIERS
BANK
CONTROL
LOGIC
DQ0­DQ15
16
16
DATA INPUT
REGISTER
DATA
OUTPUT
REGISTER
16
12
BANK1
BANK2
BANK3
13
10
2
2 2
2
REFRESH
COUNTER
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512Mb: x4, x8, x16 SDRAM Micron Technology, Inc., reserves the right to change products or specifications without notice. 512MSDRAM_D.p65 – Rev. D; Pub 1/02 ©2000, Micron Technology, Inc.
512Mb: x4, x8, x16
SDRAM
ADVANCE
PIN DESCRIPTIONS
PIN NUMBERS SYMBOL TYPE DESCRIPTION
38 CLK Input Clock: CLK is driven by the system clock. All SDRAM input signals are
sampled on the positive edge of CLK. CLK also increments the internal burst counter and controls the output registers.
37 CKE Input Clock Enable: CKE activates (HIGH) and deactivates (LOW) the CLK signal.
Deactivating the clock provides PRECHARGE POWER-DOWN and SELF REFRESH operation (all banks idle), ACTIVE POWER-DOWN (row active in any bank) or CLOCK SUSPEND operation (burst/access in progress). CKE is synchronous except after the device enters power-down and self refresh modes, where CKE becomes asynchronous until after exiting the same mode. The input buffers, including CLK, are disabled during power-down and self refresh modes, providing low standby power. CKE may be tied HIGH.
19 CS# Input Chip Select: CS# enables (registered LOW) and disables (registered HIGH)
the command decoder. All commands are masked when CS# is registered HIGH. CS# provides for external bank selection on systems with multiple banks. CS# is considered part of the command code.
18, 17, 16 RAS#, CAS#, Input Command Inputs: RAS#, CAS#, and WE# (along with CS#) define the
WE# command being entered.
39 x4, x8: DQM Input Input/Output Mask: DQM is an input mask signal for write accesses and
an output enable signal for read accesses. Input data is masked when
15, 39 x16: DQML, DQM is sampled HIGH during a WRITE cycle. The output buffers are
DQMH placed in a High-Z state (two-clock latency) when DQM is sampled HIGH
during a READ cycle. On the x4 and x8, DQML (Pin 15) is a NC and DQMH is DQM. On the x16, DQML corresponds to DQ0-DQ7 and DQMH corresponds to DQ8-DQ15. DQML and DQMH are considered same state when referenced as DQM.
20, 21 BA0, BA1 Input Bank Address Inputs: BA0 and BA1 define to which bank the ACTIVE,
READ, WRITE, or PRECHARGE command is being applied.
23-26, 29-34, 22, 35, 36 A0–A12 Input Address Inputs: A0-A12 are sampled during the ACTIVE command (row-
address A0-A12) and READ/WRITE command (column-address A0-A9, A11, A12 [x4]; A0-A9, A11 [x8]; A0-A9 [x16]; with A10 defining auto precharge) to select one location out of the memory array in the respective bank. A10 is sampled during a PRECHARGE command to determine if all banks are to be precharged (A10 [HIGH]) or bank selected by (A10 [LOW]). The address inputs also provide the op-code during a LOAD MODE REGISTER command.
2, 4, 5, 7, 8, 10, 11, 13, 42, DQ0–DQ15 x16: I/O Data Input/Output: Data bus for x16 (4, 7, 10, 13, 15, 42, 45, 48, and 51 are
44, 45, 47, 48, 50, 51, 53 NCs for x8; and 2, 4, 7, 8, 10, 13, 15, 42, 45, 47, 48, 51, and 53 are NCs for x4). 2, 5, 8, 11, 44, 47, 50, 53 DQ0–DQ7 x8: I/O Data Input/Output: Data bus for x8 (2, 8, 47, and 53 are NCs for x4).
5, 11, 44, 50 DQ0–DQ3 x4: I/O Data Input/Output: Data bus for x4.
40 NC No Connect: This pin should be left unconnected.
3, 9, 43, 49 VDDQ Supply DQ Power: Isolated DQ power to the die for improved noise immunity.
6, 12, 46, 52 VSSQ Supply DQ Ground: Isolated DQ ground to the die for improved noise immunity.
1, 14, 27 V
DD
Supply Power Supply: +3.3V ±0.3V.
28, 41, 54 V
SS
Supply Ground.
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512Mb: x4, x8, x16
SDRAM
ADVANCE
FUNCTIONAL DESCRIPTION
In general, the 512Mb SDRAMs (32 Meg x 4 x 4 banks, 16 Meg x 8 x 4 banks, and 8 Meg x 16 x 4 banks) are quad­bank DRAMs that operate at 3.3V and include a synchro­nous interface (all signals are registered on the positive edge of the clock signal, CLK). Each of the x4’s 134,217,728­bit banks is organized as 8,192 rows by 4,096 columns by 4 bits. Each of the x8’s 134,217,728-bit banks is organized as 8,192 rows by 2,048 columns by 8 bits. Each of the x16’s 134,217,728-bit banks is organized as 8,192 rows by 1,024 columns by 16 bits.
Read and write accesses to the SDRAM are burst ori­ented; accesses start at a selected location and continue for a programmed number of locations in a programmed sequence. Accesses begin with the registration of an AC­TIVE command, which is then followed by a READ or WRITE command. The address bits registered coincident with the ACTIVE command are used to select the bank and row to be accessed (BA0 and BA1 select the bank, A0­A12 select the row). The address bits (x4: A0-A9, A11, A12; x8: A0-A9, A11; x16: A0-A9) registered coincident with the READ or WRITE command are used to select the starting column location for the burst access.
Prior to normal operation, the SDRAM must be initial­ized. The following sections provide detailed informa­tion covering device initialization, register definition, command descriptions and device operation.
Initialization
SDRAMs must be powered up and initialized in a predefined manner. Operational procedures other than those specified may result in undefined operation. Once power is applied to VDD and VDDQ (simultaneously) and the clock is stable (stable clock is defined as a signal cycling within timing constraints specified for the clock pin), the SDRAM requires a 100µs delay prior to issuing any command other than a COMMAND INHIBIT or NOP. Starting at some point during this 100µs period and con­tinuing at least through the end of this period, COM­MAND INHIBIT or NOP commands should be applied.
Once the 100µs delay has been satisfied with at least one COMMAND INHIBIT or NOP command having been applied, a PRECHARGE command should be applied. All banks must then be precharged, thereby placing the device in the all banks idle state.
Once in the idle state, two AUTO REFRESH cycles must be performed. After the AUTO REFRESH cycles are complete, the SDRAM is ready for Mode Register pro­gramming. Because the Mode Register will power up in an unknown state, it should be loaded prior to applying any operational command.
Register Definition
MODE REGISTER
The Mode Register is used to define the specific mode of operation of the SDRAM. This definition includes the selection of a burst length, a burst type, a CAS latency, an operating mode and a write burst mode, as shown in Figure 1. The Mode Register is programmed via the LOAD MODE REGISTER command and will retain the stored information until it is programmed again or the device loses power.
Mode Register bits M0-M2 specify the burst length, M3 specifies the type of burst (sequential or interleaved), M4-M6 specify the CAS latency, M7 and M8 specify the operating mode, M9 specifies the write burst mode, and M10 and M11 are reserved for future use. Address A12 (M12) is undefined but should be driven LOW during loading of the Mode Register.
The Mode Register must be loaded when all banks are idle, and the controller must wait the specified time before initiating the subsequent operation. Violating ei­ther of these requirements will result in unspecified op­eration.
Burst Length
Read and write accesses to the SDRAM are burst ori­ented, with the burst length being programmable, as shown in Figure 1. The burst length determines the maxi­mum number of column locations that can be accessed for a given READ or WRITE command. Burst lengths of 1, 2, 4 or 8 locations are available for both the sequential and the interleaved burst types, and a full-page burst is available for the sequential type. The full-page burst is used in conjunction with the BURST TERMINATE com­mand to generate arbitrary burst lengths.
Reserved states should not be used, as unknown op­eration or incompatibility with future versions may re­sult.
When a READ or WRITE command is issued, a block of columns equal to the burst length is effectively selected. All accesses for that burst take place within this block, meaning that the burst will wrap within the block if a boundary is reached. The block is uniquely selected by A1-A9, A11, A12 (x4); A1-A9, A11 (x8); or A1-A9 (x16) when the burst length is set to two; by A2-A9, A11, A12 (x4); A2­A9, A11 (x8) or A2-A9 (x16) when the burst length is set to four; and by A3-A9, A11, A12 (x4); A3-A9, A11 (x8) or A3-A9 (x16) when the burst length is set to eight. The remaining (least significant) address bit(s) is (are) used to select the starting location within the block. Full-page bursts wrap within the page if the boundary is reached.
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512Mb: x4, x8, x16 SDRAM Micron Technology, Inc., reserves the right to change products or specifications without notice. 512MSDRAM_D.p65 – Rev. D; Pub 1/02 ©2000, Micron Technology, Inc.
512Mb: x4, x8, x16
SDRAM
ADVANCE
NOTE: 1. For full-page accesses: y = 4,096 (x4); y = 2,048
(x8); y = 1,024 (x16).
2. For a burst length of two, A1-A9, A11, A12 (x4); A1-A9, A11 (x8); or A1-A9 (x16) select the block­of-two burst; A0 selects the starting column within the block.
3. For a burst length of four, A2-A9, A11, A12 (x4); A2-A9, A11 (x8); or A2-A9 (x16) select the block­of-four burst; A0-A1 select the starting column within the block.
4. For a burst length of eight, A3-A9, A11, A12 (x4); A3-A9, A11 (x8); or A3-A9 (x16) select the block­of-eight burst; A0-A2 select the starting column within the block.
5. For a full-page burst, the full row is selected and A0-A9, A11, A12 (x4); A0-A9, A11 (x8); or A0-A9 (x16) select the starting column.
6. Whenever a boundary of the block is reached within a given sequence above, the following access wraps within the block.
7. For a burst length of one, A0-A9, A11, A12 (x4); A0-A9, A11 (x8); or A0-A9 (x16) select the unique column to be accessed, and Mode Register bit M3 is ignored.
Table 1
Burst Definition
M3 = 0
1
2
4
8
Reserved
Reserved
Reserved
Full Page
M3 = 1
1
2
4
8
Reserved
Reserved
Reserved
Reserved
Operating Mode
Standard Operation
All other states reserved
0-0-Defined
-
0
1
Burst Type
Sequential
Interleaved
CAS Latency
Reserved
Reserved
2
3
Reserved
Reserved
Reserved
Reserved
Burst Length
M0
0
1
0
1
0
1
0
1
Burst LengthCAS Latency BT
A9
A7
A6 A5 A4
A3A8A2A1A0
Mode Register (Mx)
Address Bus
9
7
654
382
1
0
M1
0
0
1
1
0
0
1
1
M2
0
0
0
0
1
1
1
1
M3
M4
0
1
0
1
0
1
0
1
M5
0
0
1
1
0
0
1
1
M6
0
0
0
0
1
1
1
1
M6-M0
M8
M7
Op Mode
A10
A11
10
11
Reserved* WB
0
1
Write Burst Mode
Programmed Burst Length
Single Location Access
M9
*Should program
M12, M11, M10 = “0, 0, 0”
to ensure compatibility
with future devices.
A12
12
Figure 1
Mode Register Definition
Burst Type
Accesses within a given burst may be programmed to be either sequential or interleaved; this is referred to as the burst type and is selected via bit M3.
The ordering of accesses within a burst is determined by the burst length, the burst type and the starting col­umn address, as shown in Table 1.
Burst Starting Column Order of Accesses Within a Burst
Length Address Type = Sequential Type = Interleaved
A0
2
00-1 0-1 11-0 1-0
A1 A0
0 0 0-1-2-3 0-1-2-3
4
0 1 1-2-3-0 1-0-3-2 1 0 2-3-0-1 2-3-0-1 1 1 3-0-1-2 3-2-1-0
A2 A1 A0
0 0 0 0-1-2-3-4-5-6-7 0-1-2-3-4-5-6-7 0 0 1 1-2-3-4-5-6-7-0 1-0-3-2-5-4-7-6 0 1 0 2-3-4-5-6-7-0-1 2-3-0-1-6-7-4-5
8
0 1 1 3-4-5-6-7-0-1-2 3-2-1-0-7-6-5-4 1 0 0 4-5-6-7-0-1-2-3 4-5-6-7-0-1-2-3 1 0 1 5-6-7-0-1-2-3-4 5-4-7-6-1-0-3-2 1 1 0 6-7-0-1-2-3-4-5 6-7-4-5-2-3-0-1 1 1 1 7-0-1-2-3-4-5-6 7-6-5-4-3-2-1-0
Full n = A0-A11/9/8
Cn, Cn + 1, Cn + 2
Page
Cn + 3, Cn + 4...
Not Supported
(y) (location 0-y)
Cn - 1,
Cn
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ADVANCE
Operating Mode
The normal operating mode is selected by setting M7 and M8 to zero; the other combinations of values for M7 and M8 are reserved for future use and/or test modes. The programmed burst length applies to both READ and WRITE bursts.
Test modes and reserved states should not be used because unknown operation or incompatibility with fu­ture versions may result.
Write Burst Mode
When M9 = 0, the burst length programmed via M0-M2 applies to both READ and WRITE bursts; when M9 = 1, the programmed burst length applies to READ bursts, but write accesses are single-location (nonburst) accesses.
CAS Latency
The CAS latency is the delay, in clock cycles, between the registration of a READ command and the availability of the first piece of output data. The latency can be set to two or three clocks.
If a READ command is registered at clock edge n, and the latency is m clocks, the data will be available by clock edge n + m. The DQs will start driving as a result of the clock edge one cycle earlier (n + m - 1), and provided that the relevant access times are met, the data will be valid by clock edge n + m. For example, assuming that the clock cycle time is such that all relevant access times are met, if a READ command is registered at T0 and the latency is programmed to two clocks, the DQs will start driving after T1 and the data will be valid by T2, as shown in Figure 2. Table 2 below indicates the operating frequen­cies at which each CAS latency setting can be used.
Reserved states should not be used as unknown op­eration or incompatibility with future versions may re­sult.
Figure 2
CAS Latency
CLK
DQ
T2T1 T3T0
CAS Latency = 3
LZ
D
OUT
t
OH
t
COMMAND
NOPREAD
t
AC
NOP
T4
NOP
DONT CARE
UNDEFINED
CLK
DQ
T2T1 T3T0
CAS Latency = 2
LZ
D
OUT
t
OH
t
COMMAND
NOPREAD
t
AC
NOP
Table 2
CAS Latency
ALLOWABLE OPERATING
FREQUENCY (MHz)
CAS CAS
SPEED LATENCY = 2 LATENCY = 3
-7E 133 143
-75 100 133
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ADVANCE
TRUTH TABLE 1 – COMMANDS AND DQM OPERATION
(Note: 1)
NAME (FUNCTION) CS# RAS# CAS# WE# DQM ADDR DQs NOTES
COMMAND INHIBIT (NOP) H XXXX X X
NO OPERATION (NOP) L H H H X X X
ACTIVE (Select bank and activate row) L L H H X Bank/Row X 3
READ (Select bank and column, and start READ burst) L H L H L/H8Bank/Col X 4
WRITE (Select bank and column, and start WRITE burst) L H L L L/H8Bank/Col Valid 4
BURST TERMINATE L H H L X X Active
PRECHARGE (Deactivate row in bank or banks) L L H L X Code X 5
AUTO REFRESH or SELF REFRESH L L L H X X X 6, 7 (Enter self refresh mode)
LOAD MODE REGISTER L L L L X Op-Code X 2
Write Enable/Output Enable ––––L Active 8
Write Inhibit/Output High-Z ––––H High-Z 8
following the Operation section; these tables provide current state/next state information.
COMMANDS
Truth Table 1 provides a quick reference of available commands. This is followed by a written description of each command. Three additional Truth Tables appear
NOTE: 1. CKE is HIGH for all commands shown except SELF REFRESH.
2. A0-A11 define the op-code written to the Mode Register, and A12 should be driven LOW.
3. A0-A12 provide row address, and BA0, BA1 determine which bank is made active.
4. A0-A9, A11, A12 (x4); A0-A9, A11 (x8); or A0-A9 (x16) provide column address; A10 HIGH enables the auto precharge feature (nonpersistent), while A10 LOW disables the auto precharge feature; BA0, BA1 determine which bank is being read from or written to.
5. A10 LOW: BA0, BA1 determine the bank being precharged. A10 HIGH: All banks precharged and BA0, BA1 are Don’t Care.
6. This command is AUTO REFRESH if CKE is HIGH; SELF REFRESH if CKE is LOW.
7. Internal refresh counter controls row addressing; all inputs and I/Os are “Don’t Care except for CKE.
8. Activates or deactivates the DQs during WRITEs (zero-clock delay) and READs (two-clock delay).
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ADVANCE
COMMAND INHIBIT
The COMMAND INHIBIT function prevents new com­mands from being executed by the SDRAM, regardless of whether the CLK signal is enabled. The SDRAM is effec­tively deselected. Operations already in progress are not affected.
NO OPERATION (NOP)
The NO OPERATION (NOP) command is used to per­form a NOP to an SDRAM which is selected (CS# is LOW). This prevents unwanted commands from being regis­tered during idle or wait states. Operations already in progress are not affected.
LOAD MODE REGISTER
The Mode Register is loaded via inputs A0-A11 (A12 should be driven LOW.) See Mode Register heading in the Register Definition section. The LOAD MODE REGISTER command can only be issued when all banks are idle, and a subsequent executable command cannot be issued until tMRD is met.
ACTIVE
The ACTIVE command is used to open (or activate) a row in a particular bank for a subsequent access. The value on the BA0, BA1 inputs selects the bank, and the address provided on inputs A0-A12 selects the row. This row remains active (or open) for accesses until a PRECHARGE command is issued to that bank. A PRECHARGE command must be issued before opening a different row in the same bank.
READ
The READ command is used to initiate a burst read access to an active row. The value on the BA0, BA1 inputs selects the bank, and the address provided on inputs A0­A9, A11, A12 (x4); A0-A9, A11 (x8); or A0-A9 (x16) selects the starting column location. The value on input A10 determines whether or not auto precharge is used. If auto precharge is selected, the row being accessed will be precharged at the end of the READ burst; if auto precharge is not selected, the row will remain open for subsequent accesses. Read data appears on the DQs subject to the logic level on the DQM inputs two clocks earlier. If a given DQM signal was registered HIGH, the corresponding DQs will be High-Z two clocks later; if the DQM signal was registered LOW, the DQs will provide valid data.
WRITE
The WRITE command is used to initiate a burst write access to an active row. The value on the BA0, BA1 inputs selects the bank, and the address provided on inputs A0­A9, A11, A12 (x4); A0-A9, A11 (x8); or A0-A9 (x16) selects the starting column location. The value on input A10 determines whether or not auto precharge is used. If auto precharge is selected, the row being accessed will be precharged at the end of the WRITE burst; if auto precharge is not selected, the row will remain open for subsequent accesses. Input data appearing on the DQs is written to the memory array subject to the DQM input logic level appearing coincident with the data. If a given DQM signal is registered LOW, the corresponding data will be written to memory; if the DQM signal is registered HIGH, the corresponding data inputs will be ignored, and a WRITE will not be executed to that byte/column location.
PRECHARGE
The PRECHARGE command is used to deactivate the open row in a particular bank or the open row in all banks. The bank(s) will be available for a subsequent row access a specified time (tRP) after the PRECHARGE command is issued. Input A10 determines whether one or all banks are to be precharged, and in the case where only one bank is to be precharged, inputs BA0, BA1 select the bank. Otherwise BA0, BA1 are treated as “Don’t Care.” Once a bank has been precharged, it is in the idle state and must be activated prior to any READ or WRITE commands being issued to that bank.
AUTO PRECHARGE
Auto precharge is a feature which performs the same individual-bank PRECHARGE function described above, without requiring an explicit command. This is accom­plished by using A10 to enable auto precharge in con­junction with a specific READ or WRITE command. A PRECHARGE of the bank/row that is addressed with the READ or WRITE command is automatically performed upon completion of the READ or WRITE burst, except in the full-page burst mode, where auto precharge does not apply. Auto precharge is nonpersistent in that it is either enabled or disabled for each individual READ or WRITE command.
Auto precharge ensures that the precharge is initiated at the earliest valid stage within a burst. The user must not issue another command to the same bank until the precharge time (tRP) is completed. This is determined as if an explicit PRECHARGE command was issued at the earliest possible time, as described for each burst type in the Operation section of this data sheet.
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ADVANCE
BURST TERMINATE
The BURST TERMINATE command is used to trun­cate either fixed-length or full-page bursts. The most recently registered READ or WRITE command prior to the BURST TERMINATE command will be truncated, as shown in the Operation section of this data sheet.
AUTO REFRESH
AUTO REFRESH is used during normal operation of the SDRAM and is analogous to CAS#-BEFORE-RAS# (CBR) REFRESH in conventional DRAMs. This command is nonpersistent, so it must be issued each time a refresh is required. All active banks must be PRECHARGED prior to issuing a AUTO REFRESH comand. The AUTO RE­FRESH command should not be issued until the mini­mum tRP has been met after the PRECHARGE command as shown in the operations section.
The addressing is generated by the internal refresh controller. This makes the address bits “Don’t Care” during an AUTO REFRESH command. The 512Mb SDRAM requires 8,192 AUTO REFRESH cycles every 64ms (tREF), regardless of width option. Providing a distributed AUTO REFRESH command every 7.81µs will meet the refresh requirement and ensure that each row is refreshed. Alter­natively, 8,192 AUTO REFRESH commands can be issued in a burst at the minimum cycle rate (tRC), once every 64ms.
SELF REFRESH
The SELF REFRESH command can be used to retain data in the SDRAM, even if the rest of the system is powered down. When in the self refresh mode, the SDRAM retains data without external clocking. The SELF RE­FRESH command is initiated like an AUTO REFRESH command except CKE is disabled (LOW). Once the SELF REFRESH command is registered, all the inputs to the SDRAM become “Don’t Care” with the exception of CKE, which must remain LOW.
Once self refresh mode is engaged, the SDRAM pro­vides its own internal clocking, causing it to perform its own AUTO REFRESH cycles. The SDRAM must remain in self refresh mode for a minimum period equal to tRAS and may remain in self refresh mode for an indefinite period beyond that.
The procedure for exiting self refresh requires a se­quence of commands. First, CLK must be stable (stable clock is defined as a signal cycling within timing con­straints specified for the clock pin) prior to CKE going back HIGH. Once CKE is HIGH, the SDRAM must have NOP commands issued (a minimum of two clocks) for
t
XSR because time is required for the completion of any
internal refresh in progress.
Upon exiting the self refresh mode, AUTO REFRESH commands must be issued every 7.81µs or less as both SELF REFRESH and AUTO REFRESH utilize the row re­fresh counter.
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Operation
BANK/ROW ACTIVATION
Before any READ or WRITE commands can be issued to a bank within the SDRAM, a row in that bank must be “opened.” This is accomplished via the ACTIVE com­mand, which selects both the bank and the row to be activated (see Figure 3).
After opening a row (issuing an ACTIVE command), a READ or WRITE command may be issued to that row, subject to the tRCD specification. tRCD (MIN) should be divided by the clock period and rounded up to the next whole number to determine the earliest clock edge after the ACTIVE command on which a READ or WRITE com­mand can be entered. For example, a tRCD specification of 20ns with a 125 MHz clock (8ns period) results in 2.5 clocks, rounded to 3. This is reflected in Figure 4, which covers any case where 2 < tRCD (MIN)/tCK - 3. (The same procedure is used to convert other specification limits from time units to clock cycles.)
A subsequent ACTIVE command to a different row in the same bank can only be issued after the previous active row has been “closed” (precharged). The mini­mum time interval between successive ACTIVE com­mands to the same bank is defined by tRC.
A subsequent ACTIVE command to another bank can be issued while the first bank is being accessed, which results in a reduction of total row-access overhead. The minimum time interval between successive ACTIVE com­mands to different banks is defined by tRRD.
Figure 4
Example: Meeting tRCD (MIN) When 2
<<
<<
< tRCD (MIN)/tCK
<<
<<
<
3
CLK
T2T1 T3T0
t
COMMAND
NOPACTIVE
READ or
WRITE
T4
NOP
RCD
DONT CARE
Figure 3
Activating a Specific Row In a
Specific Bank
CS#
WE#
CAS#
RAS#
CKE
CLK
A0-A12
ROW
ADDRESS
HIGH
BA0, BA1
BANK
ADDRESS
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Upon completion of a burst, assuming no other com­mands have been initiated, the DQs will go High-Z. A full­page burst will continue until terminated. (At the end of the page, it will wrap to the start address and continue.)
Data from any READ burst may be truncated with a subsequent READ command, and data from a fixed-length READ burst may be immediately followed by data from a READ command. In either case, a continuous flow of data can be maintained. The first data element from the new burst follows either the last element of a completed burst or the last desired data element of a longer burst that is being truncated. The new READ command should be issued x cycles before the clock edge at which the last desired data element is valid, where x equals the CAS latency minus one. This is shown in Figure 7 for CAS
READs
READ bursts are initiated with a READ command, as
shown in Figure 5.
The starting column and bank addresses are provided with the READ command, and auto precharge is either enabled or disabled for that burst access. If auto precharge is enabled, the row being accessed is precharged at the completion of the burst. For the generic READ com­mands used in the following illustrations, auto precharge is disabled.
During READ bursts, the valid data-out element from the starting column address will be available following the CAS latency after the READ command. Each subse­quent data-out element will be valid by the next positive clock edge. Figure 6 shows general timing for each pos­sible CAS latency setting.
Figure 5
READ Command
Figure 6
CAS Latency
CLK
DQ
T2T1 T3T0
CAS Latency = 3
LZ
D
OUT
t
OH
t
COMMAND
NOPREAD
t
AC
NOP
T4
NOP
DONT CARE
UNDEFINED
CLK
DQ
T2T1 T3T0
CAS Latency = 2
LZ
D
OUT
t
OH
t
COMMAND
NOPREAD
t
AC
NOP
CS#
WE#
CAS#
RAS#
CKE
CLK
COLUMN ADDRESS
A0-A9, A11, A12: x4
A0-A9, A11: x8
A0-A9: x16
A10
BA0,1
HIGH
ENABLE AUTO PRECHARGE
DISABLE AUTO PRECHARGE
BANK
ADDRESS
A12: x4 A11, A12: x8 A9, A11, A12: x16
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SDRAM
ADVANCE
latencies of two and three; data element n + 3 is either the last of a burst of four or the last desired of a longer burst. The 512Mb SDRAM uses a pipelined architecture and therefore does not require the 2n rule associated with a prefetch architecture. A READ command can be initiated
Figure 7
Consecutive READ Bursts
on any clock cycle following a previous READ command. Full-speed random read accesses can be performed to the same bank, as shown in Figure 8, or each subsequent READ may be performed to a different bank.
DONT CARE
NOTE: Each READ command may be to any bank. DQM is LOW.
CLK
DQ
DOUT
n
T2T1 T4T3 T6T5T0
COMMAND
ADDRESS
READ NOP NOP NOP NOP
BANK,
COL n
NOP
BANK, COL b
D
OUT
n + 1
D
OUT
n + 2
D
OUT
n + 3
D
OUT
b
READ
X = 1 cycle
CAS Latency = 2
CLK
DQ
DOUT
n
T2T1 T4T3 T6T5T0
COMMAND
ADDRESS
READ NOP NOP NOP NOP
BANK,
COL n
NOP
BANK,
COL b
D
OUT
n + 1
D
OUT
n + 2
D
OUT
n + 3
D
OUT
b
READ
NOP
T7
X = 2 cycles
CAS Latency = 3
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SDRAM
ADVANCE
Figure 8
Random READ Accesses
CLK
DQ
T2T1 T4T3 T6T5T0
COMMAND
ADDRESS
READ NOP NOP
BANK,
COL n
DONT CARE
D
OUT
n
D
OUT
a
D
OUT
x
D
OUT
m
READ
NOTE: Each READ command may be to any bank. DQM is LOW.
READ READ NOP
BANK,
COL a
BANK,
COL x
BANK, COL m
CLK
DQ
D
OUT
n
T2T1 T4T3 T5T0
COMMAND
ADDRESS
READ NOP
BANK,
COL n
D
OUT
a
D
OUT
x
D
OUT
m
READ READ READ NOP
BANK,
COL a
BANK, COL x
BANK, COL m
CAS Latency = 2
CAS Latency = 3
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SDRAM
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Data from any READ burst may be truncated with a subsequent WRITE command, and data from a fixed­length READ burst may be immediately followed by data from a WRITE command (subject to bus turnaround limitations). The WRITE burst may be initiated on the clock edge immediately following the last (or last de­sired) data element from the READ burst, provided that I/ O contention can be avoided. In a given system design, there may be a possibility that the device driving the input data will go Low-Z before the SDRAM DQs go High­Z. In this case, at least a single-cycle delay should occur between the last read data and the WRITE command.
The DQM input is used to avoid I/O contention, as shown in Figures 9 and 10. The DQM signal must be asserted (HIGH) at least two clocks prior to the WRITE command (DQM latency is two clocks for output buffers)
DONT CARE
READ NOP NOPNOP NOP
DQM
CLK
DQ
D
OUT
n
T2T1 T4T3T0
COMMAND
ADDRESS
BANK, COL n
WRITE
DIN b
BANK, COL b
T5
DS
t
HZ
t
NOTE: A CAS latency of three is used for illustration. The
READ command
may be to any bank, and the WRITE command may be to any bank.
Figure 10
READ to WRITE with Extra Clock Cycle
Figure 9
READ to WRITE
READ NOP NOP
WRITE
NOP
CLK
T2T1 T4T3T0
DQM
DQ
D
OUT
n
COMMAND
DIN b
ADDRESS
BANK,
COL n
BANK,
COL b
DS
t
HZ
t
t
CK
NOTE: A CAS latency of three is used for illustration. The
READ command may be to any bank, and the WRITE command may be to any bank. If a burst of one is used, then DQM is not required.
to suppress data-out from the READ. Once the WRITE command is registered, the DQs will go High-Z (or re­main High-Z), regardless of the state of the DQM signal; provided the DQM was active on the clock just prior to the WRITE command that truncated the READ com­mand. If not, the second WRITE will be an invalid WRITE. For example, if DQM was LOW during T4 in Figure 10, then the WRITEs at T5 and T7 would be valid, while the WRITE at T6 would be invalid.
The DQM signal must be de-asserted prior to the WRITE command (DQM latency is zero clocks for input buffers) to ensure that the written data is not masked. Figure 9 shows the case where the clock frequency allows for bus contention to be avoided without adding a NOP cycle, and Figure 10 shows the case where the additional NOP is needed.
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ADVANCE
Figure 11
READ to PRECHARGE
A fixed-length READ burst may be followed by, or truncated with, a PRECHARGE command to the same bank (provided that auto precharge was not activated), and a full-page burst may be truncated with a PRECHARGE command to the same bank. The PRECHARGE command should be issued x cycles before the clock edge at which the last desired data element is valid, where x equals the CAS latency minus one. This is shown in Figure 11 for each possible CAS latency; data
element n + 3 is either the last of a burst of four or the last desired of a longer burst. Following the PRECHARGE command, a subsequent command to the same bank cannot be issued until tRP is met. Note that part of the row precharge time is hidden during the access of the last data element(s).
In the case of a fixed-length burst being executed to completion, a PRECHARGE command issued at the opti­mum time (as described above) provides the same op-
DONT CARE
CLK
DQ
D
OUT
n
T2T1 T4T3 T6T5T0
COMMAND
ADDRESS
READ NOP NOP NOP NOPNOP
D
OUT
n + 1
D
OUT
n + 2
D
OUT
n + 3
PRECHARGE
ACTIVE
t
RP
T7
NOTE: DQM is LOW.
CLK
DQ
D
OUT
n
T2T1 T4T3 T6T5T0
COMMAND
ADDRESS
READ NOP NOP NOP NOPNOP
D
OUT
n + 1
D
OUT
n + 2
D
OUT
n + 3
PRECHARGE
ACTIVE
t
RP
T7
X = 1 cycle
CAS Latency = 2
CAS Latency = 3
X = 2 cycles
BANK a,
COL n
BANK a,
ROW
BANK
(a or all)
BANK a,
COL n
BANK a,
ROW
BANK
(a or all)
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Figure 12
Terminating a READ Burst
eration that would result from the same fixed-length burst with auto precharge. The disadvantage of the PRECHARGE command is that it requires that the com­mand and address buses be available at the appropriate time to issue the command; the advantage of the PRECHARGE command is that it can be used to truncate fixed-length or full-page bursts.
Full-page READ bursts can be truncated with the BURST TERMINATE command, and fixed-length READ bursts may be truncated with a BURST TERMINATE com­mand, provided that auto precharge was not activated. The BURST TERMINATE command should be issued x cycles before the clock edge at which the last desired data element is valid, where x equals the CAS latency minus one. This is shown in Figure 12 for each possible CAS latency; data element n + 3 is the last desired data ele­ment of a longer burst.
CLK
DQ
DOUT
n
T2T1 T4T3 T6T5T0
COMMAND
ADDRESS
READ NOP NOP NOP NOP
BANK,
COL n
NOP
D
OUT
n + 1
D
OUT
n + 2
D
OUT
n + 3
BURST
TERMINATE
NOP
T7
DONT CARE
NOTE: DQM is LOW.
CLK
DQ
DOUT
n
T2T1 T4T3 T6T5T0
COMMAND
ADDRESS
READ NOP NOP NOP
BANK,
COL n
NOP
D
OUT
n + 1
D
OUT
n + 2
D
OUT
n + 3
BURST
TERMINATE
NOP
X = 1 cycle
CAS Latency = 2
CAS Latency = 3
X = 2 cycles
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WRITEs
WRITE bursts are initiated with a WRITE command,
as shown in Figure 13.
The starting column and bank addresses are provided with the WRITE command, and auto precharge is either enabled or disabled for that access. If auto precharge is enabled, the row being accessed is precharged at the completion of the burst. For the generic WRITE com­mands used in the following illustrations, auto precharge is disabled.
During WRITE bursts, the first valid data-in element will be registered coincident with the WRITE command. Subsequent data elements will be registered on each successive positive clock edge. Upon completion of a fixed-length burst, assuming no other commands have been initiated, the DQs will remain High-Z and any addi­tional input data will be ignored (see Figure 14). A full­page burst will continue until terminated. (At the end of the page, it will wrap to the start address and continue.)
Data for any WRITE burst may be truncated with a subsequent WRITE command, and data for a fixed-length WRITE burst may be immediately followed by data for a WRITE command. The new WRITE command can be issued on any clock following the previous WRITE com­mand, and the data provided coincident with the new command applies to the new command. An example is
Figure 15
WRITE to WRITE
shown in Figure 15. Data n + 1 is either the last of a burst of two or the last desired of a longer burst. The 512Mb SDRAM uses a pipelined architecture and therefore does not require the 2n rule associated with a prefetch archi­tecture. A WRITE command can be initiated on any clock cycle following a previous WRITE command. Full-speed random write accesses within a page can be performed to the same bank, as shown in Figure 16, or each subsequent WRITE may be performed to a different bank.
CLK
DQ
D
IN
n
T2T1 T3T0
COMMAND
ADDRESS
NOP NOPWRITE
D
IN
n + 1
NOP
BANK,
COL n
Figure 14
WRITE Burst
CLK
DQ
T2T1T0
COMMAND
ADDRESS
NOPWRITE WRITE
BANK,
COL n
BANK,
COL b
D
IN
n
D
IN
n + 1
D
IN
b
NOTE: DQM is LOW.
Each WRITE
command may be to any bank.
DONT CARE
Figure 13
WRITE Command
CS#
WE#
CAS#
RAS#
CKE
CLK
COLUMN ADDRESS
A10
HIGH
ENABLE AUTO PRECHARGE
DISABLE AUTO PRECHARGE
A0-A9, A11, A12: x4
A0-A9, A11: x8
A0-A9: x16
A12: x4
A11, A12: x8
A9, A11, A12: x16
BA0, BA, 1
BANK
ADDRESS
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SDRAM
ADVANCE
registered. The auto precharge mode requires a tWR of at least one clock plus time, regardless of frequency. In addition, when truncating a WRITE burst, the DQM sig­nal must be used to mask input data for the clock edge prior to, and the clock edge coincident with, the PRECHARGE command. An example is shown in Figure
18. Data n + 1 is either the last of a burst of two or the last desired of a longer burst. Following the PRECHARGE command, a subsequent command to the same bank cannot be issued until tRP is met. The precharge can be issued coincident with the first coincident clock edge (T2 in Figure 18) on an A1 Version and with the second clock on an A2 Version (Figure 18.)
In the case of a fixed-length burst being executed to completion, a PRECHARGE command issued at the opti­mum time (as described above) provides the same op­eration that would result from the same fixed-length burst with auto precharge. The disadvantage of the PRECHARGE command is that it requires that the com­mand and address buses be available at the appropriate time to issue the command; the advantage of the
Figure 18
WRITE To PRECHARGE
DONT CARE
DQM
CLK
DQ
T2T1 T4T3T0
COMMAND
ADDRESS
BANK a,
COL n
T5
NOPWRITE
PRECHARGE
NOPNOP
D
IN
n
D
IN
n + 1
ACTIVE
t
RP
BANK
(a or all)
t
WR
BANK a,
ROW
DQM
DQ
COMMAND
ADDRESS
BANK a,
COL n
NOPWRITE
PRECHARGE
NOPNOP
D
IN
n
D
IN
n + 1
ACTIVE
t
RP
BANK
(a or all)
t
WR
NOTE: DQM could remain LOW in this example if the WRITE burst is a fixed length of two.
BANK a,
ROW
T6
NOP
NOP
t
WR @ tCLK 15ns
t
WR = tCLK < 15ns
Data for any WRITE burst may be truncated with a subsequent READ command, and data for a fixed-length WRITE burst may be immediately followed by a READ command. Once the READ command is registered, the data inputs will be ignored, and WRITEs will not be executed. An example is shown in Figure 17. Data n + 1 is either the last of a burst of two or the last desired of a longer burst.
Data for a fixed-length WRITE burst may be followed by, or truncated with, a PRECHARGE command to the same bank (provided that auto precharge was not acti­vated), and a full-page WRITE burst may be truncated with a PRECHARGE command to the same bank. The PRECHARGE command should be issued tWR after the clock edge at which the last desired input data element is
Figure 17
WRITE To READ
CLK
DQ
T2T1 T3T0
COMMAND
ADDRESS
NOPWRITE
BANK, COL n
D
IN
n
D
IN
n + 1
D
OUT
b
READ NOP NOP
BANK, COL b
NOP
D
OUT
b + 1
T4 T5
NOTE: The WRITE command may be to any bank, and the READ command
ma
y
be to any bank. DQM is LOW. CAS latency = 2 for illustration.
Figure 16
Random WRITE Cycles
CLK
DQ
D
IN
n
T2T1 T3T0
COMMAND
ADDRESS
WRITE
BANK, COL n
D
IN
a
D
IN
x
D
IN
m
WRITE
WRITE WRITE
BANK,
COL a
BANK,
COL x
BANK, COL m
NOTE: Each WRITE command may be to any bank.
DQM is LOW.
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SDRAM
ADVANCE
PRECHARGE command is that it can be used to truncate fixed-length or full-page bursts.
Fixed-length or full-page WRITE bursts can be trun­cated with the BURST TERMINATE command. When truncating a WRITE burst, the input data applied coinci­dent with the BURST TERMINATE command will be ignored. The last data written (provided that DQM is LOW at that time) will be the input data applied one clock previous to the BURST TERMINATE command. This is
Figure 21
Power-Down
DONT CARE
t
RAS
t
RCD
t
RC
All banks idle
Input buffers gated off
Exit power-down mode.
()(
)
()(
)
()(
)
t
CKS
> t
CKS
COMMAND
NOP ACTIVE
Enter power-down mode.
NOP
CLK
CKE
()(
)
()(
)
Figure 20
PRECHARGE Command
Figure 19
Terminating a WRITE Burst
CLK
DQ
T2T1T0
COMMAND
ADDRESS
BANK,
COL n
WRITE
BURST
TERMINATE
NEXT
COMMAND
DIN
n
(ADDRESS)
(DATA)
NOTE: DQMs are LOW.
shown in Figure 19, where data n is the last desired data element of a longer burst.
PRECHARGE
The PRECHARGE command (see Figure 20) is used to deactivate the open row in a particular bank or the open row in all banks. The bank(s) will be available for a subse­quent row access some specified time (tRP) after the precharge command is issued. Input A10 determines whether one or all banks are to be precharged, and in the case where only one bank is to be precharged, inputs BA0, BA1 select the bank. When all banks are to be precharged, inputs BA0, BA1 are treated as “Don’t Care.” Once a bank has been precharged, it is in the idle state and must be activated prior to any READ or WRITE com­mands being issued to that bank.
POWER-DOWN
Power-down occurs if CKE is registered low coinci­dent with a NOP or COMMAND INHIBIT when no ac­cesses are in progress. If power-down occurs when all banks are idle, this mode is referred to as precharge power-down; if power-down occurs when there is a row active in any bank, this mode is referred to as active power-down. Entering power-down deactivates the in­put and output buffers, excluding CKE, for maximum power savings while in standby. The device may not remain in the power-down state longer than the refresh period (64ms) since no refresh operations are performed in this mode.
The power-down state is exited by registering a NOP or COMMAND INHIBIT and CKE HIGH at the desired clock edge (meeting tCKS). (See Figure 21.)
CS#
WE#
CAS#
RAS#
CKE
CLK
A10
HIGH
All Banks
Bank Selected
A0-A9, A11, A12
BA0, BA1
BANK
ADDRESS
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512Mb: x4, x8, x16
SDRAM
ADVANCE
D
IN
COMMAND
ADDRESS
WRITE
BANK, COL n
D
IN
n
NOPNOP
CLK
T2T1 T4T3 T5T0
CKE
INTERNAL
CLOCK
NOP
D
IN
n + 1
D
IN
n + 2
NOTE: For this example, burst length = 4 or greater, and DM
is LOW.
Figure 22
Clock Suspend During WRITE Burst
DONT CARE
CLK
DQ
D
OUT
n
T2T1 T4T3 T6T5T0
COMMAND
ADDRESS
READ NOP NOP NOP
BANK,
COL n
NOP
D
OUT
n + 1
D
OUT
n + 2
D
OUT
n + 3
NOTE: For this example, CAS latency = 2, burst length = 4 or greater, and
DQM is LOW.
CKE
INTERNAL
CLOCK
NOP
Figure 23
Clock Suspend During READ Burst
CLOCK SUSPEND
The clock suspend mode occurs when a column ac­cess/burst is in progress and CKE is registered LOW. In the clock suspend mode, the internal clock is deacti­vated, “freezing” the synchronous logic.
For each positive clock edge on which CKE is sampled LOW, the next internal positive clock edge is suspended. Any command or data present on the input pins at the time of a suspended internal clock edge is ignored; any data present on the DQ pins remains driven; and burst counters are not incremented, as long as the clock is suspended. (See examples in Figures 22 and 23.)
Clock suspend mode is exited by registering CKE HIGH; the internal clock and related operation will re­sume on the subsequent positive clock edge.
BURST READ/SINGLE WRITE
The burst read/single write mode is entered by pro­gramming the write burst mode bit (M9) in the Mode Register to a logic 1. In this mode, all WRITE commands result in the access of a single column location (burst of one), regardless of the programmed burst length. READ commands access columns according to the programmed burst length and sequence, just as in the normal mode of operation (M9 = 0).
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SDRAM
ADVANCE
CONCURRENT AUTO PRECHARGE
An access command to (READ or WRITE) another bank while an access command with auto precharge enabled is executing is not allowed by SDRAMs, unless the SDRAM supports CONCURRENT AUTO PRECHARGE. Micron SDRAMs support CONCURRENT AUTO PRECHARGE. Four cases where CONCURRENT AUTO PRECHARGE occurs are defined below.
READ with auto precharge
1. Interrupted by a READ (with or without auto
precharge): A READ to bank m will interrupt a READ
on bank n, CAS latency later. The PRECHARGE to bank n will begin when the READ to bank m is regis­tered (Figure 24).
2. Interrupted by a WRITE (with or without auto precharge): A WRITE to bank m will interrupt a READ on bank n when registered. DQM should be used two clocks prior to the WRITE command to prevent bus contention. The PRECHARGE to bank n will begin when the WRITE to bank m is registered (Figure 25).
CLK
DQ
DOUT
a
T2T1 T4T3 T6T5T0
COMMAND
READ - AP
BANK n
NOP NOPNOPNOP
D
OUT
a + 1
D
OUT
d
D
OUT
d + 1
NOP
T7
BANK n
CAS Latency = 3 (BANK m)
BANK m
ADDRESS
Idle
NOP
NOTE: DQM is LOW.
BANK n,
COL a
BANK m,
COL d
READ - AP
BANK m
Internal States
t
Page Active READ with Burst of 4 Interrupt Burst, Precharge
Page Active READ with Burst of 4
Precharge
RP - BANK n
t
RP - BANK m
CAS Latency = 3 (BANK n)
Figure 24
READ With Auto Precharge Interrupted by a READ
CLK
DQ
D
OUT
a
T2T1 T4T3 T6T5T0
COMMAND
NOPNOPNOPNOP
D
IN
d + 1
D
IN
d
D
IN
d + 2
D
IN
d + 3
NOP
T7
BANK n
BANK m
ADDRESS
Idle
NOP
DQM
NOTE: 1. DQM is HIGH at T2 to prevent D
OUT
-a+1 from contending with DIN-d at T4.
BANK n,
COL a
BANK m,
COL d
WRITE - AP
BANK m
Internal States
t
Page
Active
READ with Burst of 4 Interrupt Burst, Precharge
Page Active WRITE with Burst of 4
Write-Back
RP -
BANK
n
t
WR -
BANK
m
CAS Latency = 3 (BANK n)
READ - AP
BANK n
1
DONT CARE
Figure 25
READ With Auto Precharge Interrupted by a WRITE
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512Mb: x4, x8, x16
SDRAM
ADVANCE
CLK
DQ
T2T1 T4T3 T6T5T0
COMMAND
WRITE - AP
BANK n
NOPNOPNOPNOP
D
IN
a + 1
D
IN
a
NOP NOP
T7
BANK n
BANK m
ADDRESS
NOTE: 1. DQM is LOW.
BANK n,
COL a
BANK m,
COL d
READ - AP
BANK m
Internal States
t
Page Active WRITE with Burst of 4 Interrupt Burst, Write-Back Precharge
Page Active READ with Burst of 4
t
t
RP - BANK m
D
OUT
d
D
OUT
d + 1
CAS Latency = 3 (BANK m)
RP - BANK n
WR - BANK n
Figure 26
WRITE With Auto Precharge Interrupted by a READ
DONT CARE
CLK
DQ
T2T1 T4T3 T6T5T0
COMMAND
WRITE - AP
BANK n
NOPNOPNOPNOP
D
IN
d + 1
D
IN
d
D
IN
a + 1
D
IN
a + 2
D
IN
a
D
IN
d + 2
D
IN
d + 3
NOP
T7
BANK n
BANK m
ADDRESS
NOP
NOTE: 1. DQM is LOW.
BANK n,
COL a
BANK m,
COL d
WRITE - AP
BANK m
Internal States
t
Page Active WRITE with Burst of 4 Interrupt Burst, Write-Back Precharge
Page Active WRITE with Burst of 4
Write-Back
WR - BANK n
t
RP - BANK n
t
WR - BANK m
Figure 27
WRITE With Auto Precharge Interrupted by a WRITE
WRITE with auto precharge
3. Interrupted by a READ (with or without AUTO PRECHARGE): A READ to bank m will interrupt a WRITE on bank n when registered, with the data-out appearing CAS latency later. The PRECHARGE to bank n will begin after tWR is met, where tWR begins when the READ to bank m is registered. The last valid WRITE to bank n will be data-in registered one clock prior to the READ to bank m (Figure 26).
4. Interrupted by a WRITE (with or without auto precharge): A WRITE to bank m will interrupt a WRITE on bank n when registered. The PRECHARGE to bank n will begin after
t
WR is met, where tWR begins when the WRITE to bank m is registered. The last valid data WRITE to bank n will be data registered one clock prior to a WRITE to bank m (Figure 27).
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SDRAM
ADVANCE
TRUTH TABLE 2 – CKE
(Notes: 1-4)
CKE
n-1
CKE
n
CURRENT STATE COMMAND
n
ACTION
n
NOTES
L L Power-Down X Maintain Power-Down
Self Refresh X Maintain Self Refresh
Clock Suspend X Maintain Clock Suspend
L H Power-Down COMMAND INHIBIT or NOP Exit Power-Down 5
Self Refresh COMMAND INHIBIT or NOP Exit Self Refresh 6
Clock Suspend X Exit Clock Suspend 7
H L All Banks Idle COMMAND INHIBIT or NOP Power-Down Entry
All Banks Idle AUTO REFRESH Self Refresh Entry
Reading or Writing VALID Clock Suspend Entry
H H See Truth Table 3 (page 28)
NOTE: 1. CKEn is the logic state of CKE at clock edge n; CKE
n-1
was the state of CKE at the previous clock edge.
2. Current state is the state of the SDRAM immediately prior to clock edge n.
3. COMMAND
n
is the command registered at clock edge n, and ACTIONn is a result of COMMANDn.
4. All states and sequences not shown are illegal or reserved.
5. Exiting power-down at clock edge n will put the device in the all banks idle state in time for clock edge n + 1 (provided that
t
CKS is met).
6. Exiting self refresh at clock edge n will put the device in the all banks idle state once
t
XSR is met. COMMAND INHIBIT or NOP commands should be issued on any clock edges occurring during the tXSR period. A minimum of two NOP commands must be provided during tXSR period.
7. After exiting clock suspend at clock edge n, the device will resume operation and recognize the next command at clock edge n + 1.
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SDRAM
ADVANCE
TRUTH TABLE 3 – CURRENT STATE BANK n - COMMAND TO BANK n
(Notes: 1-6; notes appear below and on next page)
CURRENT STATE CS# RAS# CAS# WE# COMMAND (ACTION) NOTES
Any H X X X COMMAND INHIBIT (NOP/Continue previous operation)
L H H H NO OPERATION (NOP/Continue previous operation)
L L H H ACTIVE (Select and activate row)
Idle L L L H AUTO REFRESH 7
LLLLLOAD MODE REGISTER 7
L L H L PRECHARGE 11
L H L H READ (Select column and start READ burst) 10
Row Active L H L L WRITE (Select column and start WRITE burst) 10
L L H L PRECHARGE (Deactivate row in bank or banks) 8
Read L H L H READ (Select column and start new READ burst) 10
(Auto L H L L WRITE (Select column and start WRITE burst) 10
Precharge L L H L PRECHARGE (Truncate READ burst, start PRECHARGE) 8
Disabled) L H H L BURST TERMINATE 9
Write L H L H READ (Select column and start READ burst) 10
(Auto L H L L WRITE (Select column and start new WRITE burst) 10
Precharge L L H L PRECHARGE (Truncate WRITE burst, start PRECHARGE) 8
Disabled) L H H L BURST TERMINATE 9
NOTE: 1. This table applies when CKE
n-1
was HIGH and CKEn is HIGH (see Truth Table 2) and after tXSR has been
met (if the previous state was self refresh).
2. This table is bank-specific, except where noted, i.e., the current state is for a specific bank and the commands shown are those allowed to be issued to that bank when in that state. Exceptions are covered in the notes below.
3. Current state definitions:
Idle: The bank has been precharged, and
t
RP has been met.
Row Active: A row in the bank has been activated, and tRCD has been met. No data bursts/accesses and no
register accesses are in progress.
Read: A READ burst has been initiated, with auto precharge disabled, and has not yet terminated or been
terminated.
Write: A WRITE burst has been initiated, with auto precharge disabled, and has not yet terminated or been
terminated.
4. The following states must not be interrupted by a command issued to the same bank. COMMAND INHIBIT or NOP commands, or allowable commands to the other bank should be issued on any clock edge occurring during these states. Allowable commands to the other bank are determined by its current state and Truth Table 3, and according to Truth Table 4.
Precharging: Starts with registration of a PRECHARGE command and ends when
t
RP is met. Once tRP is met, the
bank will be in the idle state.
Row Activating: Starts with registration of an ACTIVE command and ends when tRCD is met. Once tRCD is met, the
bank will be in the row active state.
Read w/Auto
Precharge
Enabled: Starts with registration of a READ command with auto precharge enabled and ends when tRP has
been met. Once tRP is met, the bank will be in the idle state.
Write w/Auto
Precharge
Enabled: Starts with registration of a WRITE command with auto precharge enabled and ends when tRP has
been met. Once tRP is met, the bank will be in the idle state.
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512Mb: x4, x8, x16
SDRAM
ADVANCE
NOTE (continued):
5. The following states must not be interrupted by any executable command; COMMAND INHIBIT or NOP commands must be applied on each positive clock edge during these states.
Refreshing: Starts with registration of an AUTO REFRESH command and ends when
t
RC is met. Once tRC is met,
the SDRAM will be in the all banks idle state.
Accessing Mode
Register: Starts with registration of a LOAD MODE REGISTER command and ends when
t
MRD has been met.
Once tMRD is met, the SDRAM will be in the all banks idle state.
Precharging All: Starts with registration of a PRECHARGE ALL command and ends when tRP is met. Once tRP is met,
all banks will be in the idle state.
6. All states and sequences not shown are illegal or reserved.
7. Not bank-specific; requires that all banks are idle.
8. May or may not be bank-specific; if all banks are to be precharged, all must be in a valid state for precharging.
9. Not bank-specific; BURST TERMINATE affects the most recent READ or WRITE burst, regardless of bank.
10. READs or WRITEs listed in the Command (Action) column include READs or WRITEs with auto precharge enabled and READs or WRITEs with auto precharge disabled.
11. Does not affect the state of the bank and acts as a NOP to that bank.
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SDRAM
ADVANCE
TRUTH TABLE 4 – CURRENT STATE BANK n - COMMAND TO BANK m
(Notes: 1-6; notes appear below and on next page)
CURRENT STATE CS# RAS# CAS# WE# COMMAND (ACTION) NOTES
Any H X X X COMMAND INHIBIT (NOP/Continue previous operation)
L H H H NO OPERATION (NOP/Continue previous operation)
Idle XXXXAny Command Otherwise Allowed to Bank m
Row L L H H ACTIVE (Select and activate row)
Activating, L H L H READ (Select column and start READ burst) 7
Active, or L H L L WRITE (Select column and start WRITE burst) 7
Precharging L L H L PRECHARGE
Read L L H H ACTIVE (Select and activate row)
(Auto L H L H READ (Select column and start new READ burst) 7, 10
Precharge L H L L WRITE (Select column and start WRITE burst) 7, 11
Disabled) L L H L PRECHARGE 9
Write L L H H ACTIVE (Select and activate row)
(Auto L H L H READ (Select column and start READ burst) 7, 12
Precharge L H L L WRITE (Select column and start new WRITE burst) 7, 13
Disabled) L L H L PRECHARGE 9
Read L L H H ACTIVE (Select and activate row)
(With Auto L H L H READ (Select column and start new READ burst) 7, 8, 14
Precharge) L H L L WRITE (Select column and start WRITE burst) 7, 8, 15
L L H L PRECHARGE 9
Write L L H H ACTIVE (Select and activate row)
(With Auto L H L H READ (Select column and start READ burst) 7, 8, 16
Precharge) L H L L WRITE (Select column and start new WRITE burst) 7, 8, 17
L L H L PRECHARGE 9
NOTE: 1. This table applies when CKE
n-1
was HIGH and CKEn is HIGH (see Truth Table 2) and after tXSR has been met (if the
previous state was self refresh).
2. This table describes alternate bank operation, except where noted; i.e., the current state is for bank n and the commands shown are those allowed to be issued to bank m (assuming that bank m is in such a state that the given command is allowable). Exceptions are covered in the notes below.
3. Current state definitions:
Idle: The bank has been precharged, and
t
RP has been met.
Row Active: A row in the bank has been activated, and tRCD has been met. No data bursts/accesses and no
register accesses are in progress.
Read: A READ burst has been initiated, with auto precharge disabled, and has not yet terminated or been
terminated.
Write: A WRITE burst has been initiated, with auto precharge disabled, and has not yet terminated or been
terminated.
Read w/Auto
Precharge
Enabled: Starts with registration of a READ command with auto precharge enabled, and ends when tRP has
been met. Once tRP is met, the bank will be in the idle state.
Write w/Auto
Precharge
Enabled: Starts with registration of a WRITE command with auto precharge enabled, and ends when tRP has
been met. Once tRP is met, the bank will be in the idle state.
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512Mb: x4, x8, x16
SDRAM
ADVANCE
NOTE (continued):
4. AUTO REFRESH, SELF REFRESH and LOAD MODE REGISTER commands may only be issued when all banks are idle.
5. A BURST TERMINATE command cannot be issued to another bank; it applies to the bank represented by the current state only.
6. All states and sequences not shown are illegal or reserved.
7. READs or WRITEs to bank m listed in the Command (Action) column include READs or WRITEs with auto precharge enabled and READs or WRITEs with auto precharge disabled.
8. CONCURRENT AUTO PRECHARGE: Bank n will initiate the auto precharge command when its burst has been interrupted by bank ms burst.
9. Burst in bank n continues as initiated.
10. For a READ without auto precharge interrupted by a READ (with or without auto precharge), the READ to bank m will interrupt the READ on bank n, CAS latency later (Figure 7).
11. For a READ without auto precharge interrupted by a WRITE (with or without auto precharge), the WRITE to bank m will interrupt the READ on bank n when registered (Figures 9 and 10). DQM should be used one clock prior to the WRITE command to prevent bus contention.
12. For a WRITE without auto precharge interrupted by a READ (with or without auto precharge), the READ to bank m will interrupt the WRITE on bank n when registered (Figure 17), with the data-out appearing CAS latency later. The last valid WRITE to bank n will be data-in registered one clock prior to the READ to bank m.
13. For a WRITE without auto precharge interrupted by a WRITE (with or without auto precharge), the WRITE to bank m will interrupt the WRITE on bank n when registered (Figure 15). The last valid WRITE to bank n will be data-in registered one clock prior to the READ to bank m.
14. For a READ with auto precharge interrupted by a READ (with or without auto precharge), the READ to bank m will interrupt the READ on bank n, CAS latency later. The PRECHARGE to bank n will begin when the READ to bank m is registered (Figure 24).
15. For a READ with auto precharge interrupted by a WRITE (with or without auto precharge), the WRITE to bank m will interrupt the READ on bank n when registered. DQM should be used two clocks prior to the WRITE command to prevent bus contention. The PRECHARGE to bank n will begin when the WRITE to bank m is registered (Figure 25).
16. For a WRITE with auto precharge interrupted by a READ (with or without auto precharge), the READ to bank m will interrupt the WRITE on bank n when registered, with the data-out appearing CAS latency later. The PRECHARGE to bank n will begin after
t
WR is met, where tWR begins when the READ to bank m is registered. The last valid WRITE to
bank n will be data-in registered one clock prior to the READ to bank m (Figure 26).
17. For a WRITE with auto precharge interrupted by a WRITE (with or without auto precharge), the WRITE to bank m will interrupt the WRITE on bank n when registered. The PRECHARGE to bank n will begin after
t
WR is met, where tWR begins when the WRITE to bank m is registered. The last valid WRITE to bank n will be data registered one clock prior to the WRITE to bank m (Figure 27).
Page 32
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512Mb: x4, x8, x16 SDRAM Micron Technology, Inc., reserves the right to change products or specifications without notice. 512MSDRAM_D.p65 – Rev. D; Pub 1/02 ©2000, Micron Technology, Inc.
512Mb: x4, x8, x16
SDRAM
ADVANCE
DC ELECTRICAL CHARACTERISTICS AND OPERATING CONDITIONS
(Notes: 1, 5, 6; notes appear on page 35) (VDD, VDDQ = +3.3V ±0.3V)
PARAMETER/CONDITION SYMBOL MIN MAX UNITS NOTES
Supply Voltage VDD, VDDQ 3 3.6 V
Input High Voltage: Logic 1; All inputs VIH 2VDD + 0.3 V 22
Input Low Voltage: Logic 0; All inputs VIL -0.3 0.8 V 22
Input Leakage Current: Any input 0V ≤ VIN ≤ VDD II -5 5 µA (All other pins not under test = 0V)
Output Leakage Current: DQs are disabled; IOZ -5 5 µA 0V VOUT VDDQ
Output Levels: VOH 2.4 V26 Output High Voltage (IOUT = -4mA) Output Low Voltage (IOUT = 4mA) VOL 0.4 V 26
ABSOLUTE MAXIMUM RATINGS*
Voltage on VDD, VDDQ Supply
Relative to VSS ....................................... -1V to +4.6V
Voltage on Inputs, NC or I/O Pins
Relative to V
SS ....................................... -1V to +4.6V
Operating Temperature,
T
A
(Commercial) ................................... 0°C to +70°C
Storage Temperature (plastic) ............ -55°C to +150°C
Power Dissipation ................................................... 1W
*Stresses greater than those listed under “Absolute Maximum Ratings” may cause permanent damage to the device. This is a stress rating only, and functional operation of the device at these or any other conditions above those indicated in the operational sections of this specification is not implied. Exposure to absolute maximum rating conditions for extended periods may affect reliability.
MAX
IDD SPECIFICATIONS AND CONDITIONS
(Notes: 1, 5, 6, 11, 13; notes appear on page 35) (VDD, VDDQ = +3.3V ±0.3V)
PARAMETER/CONDITION SYMBOL -7E -75 UNITS NOTES
Operating Current: Active Mode; IDD1 TBD TBD mA 3, 18, Burst = 1; READ or WRITE; tRC = tRC (MIN) 19, 29
Standby Current: Power-Down Mode; IDD2 TBD TBD mA 29 CKE = LOW; All banks idle
Standby Current: Active Mode; CS# = HIGH; IDD3 TBD TBD mA 3, 12, CKE = HIGH; All banks active after tRCD met; 19, 29 No accesses in progress
Operating Current: Burst Mode; Continuous burst; IDD4 TBD TBD mA 3, 18, READ or WRITE; All banks active 19, 29
Auto Refresh Current:
t
RFC = tRFC (MIN) IDD5 TBD TBD mA 3, 12,
CS# = HIGH; CKE = HIGH 18, 19,
t
RFC = 7.81µs IDD6 TBD TBD mA 29,30
Self Refresh Current: CKE 0.2V Standard IDD7 TBD TBD mA 4
Low power (L) IDD7 TBD TBD mA
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512Mb: x4, x8, x16 SDRAM Micron Technology, Inc., reserves the right to change products or specifications without notice. 512MSDRAM_D.p65 – Rev. D; Pub 1/02 ©2000, Micron Technology, Inc.
512Mb: x4, x8, x16
SDRAM
ADVANCE
CAPACITANCE
(Note: 2; notes appear on page 35)
PARAMETER SYMBOL MIN MAX UNITS
Input Capacitance: CLK C
I
1 2.5 3.5 pF
Input Capacitance: All other input-only pins C
I
2 2.5 3.8 pF
Input/Output Capacitance: DQs C
IO
4.0 6.0 pF
AC CHARACTERISTICS -7E -75 PARAMETER SYMBOL MIN MAX MIN MAX UNITS NOTES
Access time from CLK (pos. edge) CL = 3tAC(3) 5.4 5.4 ns 27
CL = 2tAC(2) 5.4 6 ns
Address hold time
t
AH 0.8 0.8 ns
Address setup time
t
AS 1.5 1.5 ns
CLK high-level width
t
CH 2.5 2.5 ns
CLK low-level width
t
CL 2.5 2.5 ns
Clock cycle time CL = 3tCK(3) 7 7.5 ns 23
CL = 2tCK(2) 7.5 10 ns 23
CKE hold time
t
CKH 0.8 0.8 ns
CKE setup time
t
CKS 1.5 1.5 ns
CS#, RAS#, CAS#, WE#, DQM hold time
t
CMH 0.8 0.8 ns
CS#, RAS#, CAS#, WE#, DQM setup time
t
CMS 1.5 1.5 ns
Data-in hold time
t
DH 0.8 0.8 ns
Data-in setup time
t
DS 1.5 1.5 ns
Data-out high-impedance time CL = 3tHZ(3) 5.4 5.4 ns 10
CL = 2tHZ(2) 5.4 6 ns 10
Data-out low-impedance time
t
LZ 1 1 ns
Data-out hold time (load)
t
OH 2.7 2.7 ns
Data-out hold time (no load)
t
OH
N
1.8 1.8 ns 28
ACTIVE to PRECHARGE command
t
RAS 37 120,000 44 120,000 ns
ACTIVE to ACTIVE command period
t
RC 60 66 ns
ACTIVE to READ or WRITE delay
t
RCD 15 20 ns
Refresh period (8,192 rows)
t
REF 64 64 ms
AUTO REFRESH period
t
RFC 66 66 ns
PRECHARGE command period
t
RP 15 20 ns
ACTIVE bank a to ACTIVE bank b command
t
RRD 14 15 ns
Transition time
t
T 0.3 1.2 0.3 1.2 ns 7
WRITE recovery time
t
WR 1 CLK + 1 CLK + 24
7ns 7.5ns 14
14 15 ns 25
Exit SELF REFRESH to ACTIVE command
t
XSR 67 75 ns 20
ELECTRICAL CHARACTERISTICS AND RECOMMENDED AC OPERATING CONDITIONS
(Notes: 5, 6, 8, 9, 11; notes appear on page 35)
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512Mb: x4, x8, x16 SDRAM Micron Technology, Inc., reserves the right to change products or specifications without notice. 512MSDRAM_D.p65 – Rev. D; Pub 1/02 ©2000, Micron Technology, Inc.
512Mb: x4, x8, x16
SDRAM
ADVANCE
AC FUNCTIONAL CHARACTERISTICS
(Notes: 5, 6, 7, 8, 9, 11; notes appear on page 35)
PARAMETER SYMBOL -7E -75 UNITS NOTES
READ/WRITE command to READ/WRITE command
t
CCD 1 1
t
CK 17
CKE to clock disable or power-down entry mode
t
CKED 1 1
t
CK 14
CKE to clock enable or power-down exit setup mode
t
PED 1 1
t
CK 14
DQM to input data delay
t
DQD 0 0
t
CK 17
DQM to data mask during WRITEs
t
DQM 0 0
t
CK 17
DQM to data high-impedance during READs
t
DQZ 2 2
t
CK 17
WRITE command to input data delay
t
DWD 0 0
t
CK 17
Data-in to ACTIVE command
t
DAL 4 5
t
CK 15, 21
Data-in to PRECHARGE command
t
DPL 2 2
t
CK 16, 21
Last data-in to burst STOP command
t
BDL 1 1
t
CK 17
Last data-in to new READ/WRITE command
t
CDL 1 1
t
CK 17
Last data-in to PRECHARGE command
t
RDL 2 2
t
CK 16, 21
LOAD MODE REGISTER command to ACTIVE or REFRESH command
t
MRD 2 2
t
CK 26
Data-out to high-impedance from PRECHARGE command CL = 3tROH(3) 3 3
t
CK 17
CL = 2
t
ROH(2) 2 2
t
CK 17
Page 35
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512Mb: x4, x8, x16 SDRAM Micron Technology, Inc., reserves the right to change products or specifications without notice. 512MSDRAM_D.p65 – Rev. D; Pub 1/02 ©2000, Micron Technology, Inc.
512Mb: x4, x8, x16
SDRAM
ADVANCE
13. IDD specifications are tested after the device is properly initialized.
14. Timing actually specified by tCKS; clock(s) specified as a reference only at minimum cycle rate.
15. Timing actually specified by tWR plus tRP; clock(s) specified as a reference only at minimum cycle rate.
16. Timing actually specified by tWR.
17. Required clocks are specified by JEDEC functional­ity and are not dependent on any timing param­eter.
18. The IDD current will increase or decrease in a proportional amount by the amount the frequency is altered for the test condition.
19. Address transitions average one transition every two clocks.
20. CLK must be toggled a minimum of two times during this period.
21. Based on tCK = 7.5ns for -75 and -7E.
22. VIH overshoot: VIH (MAX) = VDDQ + 2V for a pulse width 3ns, and the pulse width cannot be greater than one third of the cycle rate. VIL undershoot: VIL (MIN) = -2V for a pulse width 3ns.
23. The clock frequency must remain constant (stable clock is defined as a signal cycling within timing constraints specified for the clock pin) during access or precharge states (READ, WRITE, includ­ing tWR, and PRECHARGE commands). CKE may be used to reduce the data rate.
24. Auto precharge mode only. The precharge timing budget (tRP) begins 7.5ns/7ns after the first clock delay, after the last WRITE is executed.
25. Precharge mode only.
26. JEDEC and PC100, PC133 specify three clocks.
27.tAC for -75/-7E at CL = 3 with no load is 4.6ns and is guaranteed by design.
28. Parameter guaranteed by design.
29. For -75, CL = 3, tCK = 7.5ns; For -7E, CL = 2,
t
CK = 7.5ns
30. CKE is HIGH during refresh command period
t
RFC(MIN) else CKE is LOW. The IDD6 limit is actually a nominal value and does not result in a fail value.
NOTES
1. All voltages referenced to VSS.
2. This parameter is sampled. VDD, VDDQ = +3.3V; f = 1 MHz, TA = 25°C; pin under test biased at 1.4V.
3. I
DD is dependent on output loading and cycle
rates.Specified values are obtained with minimum cycle time and the outputs open.
4. Enables on-chip refresh and address counters.
5. The minimum specifications are used only to indicate cycle time at which proper operation over the full temperature range (0°C ≤ TA 70°C) is ensured.
6. An initial pause of 100µs is required after power­up, followed by two AUTO REFRESH commands, before proper device operation is ensured. (VDD and VDDQ must be powered up simultaneously. VSS and VSSQ must be at same potential.) The two AUTO REFRESH command wake-ups should be repeated any time the tREF refresh requirement is exceeded.
7. AC characteristics assume tT = 1ns.
8. In addition to meeting the transition rate specifi­cation, the clock and CKE must transit between VIH and VIL (or between VIL and VIH) in a monotonic manner.
9. Outputs measured at 1.5V with equivalent load:
Q
50pF
10.tHZ defines the time at which the output achieves the open circuit condition; it is not a reference to VOH or VOL. The last valid data element will meet
t
OH before going High-Z.
11. AC timing and IDD tests have VIL = 0V and VIH = 3V, with timing referenced to 1.5V crossover point. If the input transition time is longer than 1 ns, then the timing is referenced at VIL (MAX) and VIH (MIN) and no longer at the 1.5V crossover point.
12. Other input signals are allowed to transition no more than once every two clocks and are otherwise at valid VIH or VIL levels.
Page 36
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512Mb: x4, x8, x16 SDRAM Micron Technology, Inc., reserves the right to change products or specifications without notice. 512MSDRAM_D.p65 – Rev. D; Pub 1/02 ©2000, Micron Technology, Inc.
512Mb: x4, x8, x16
SDRAM
ADVANCE
-7E -75
SYMBOL* MIN MAX MIN MAX UNITS
TIMING PARAMETERS
-7E -75
SYMBOL* MIN MAX MIN MAX UNITS
t
AH 0.8 0.8 ns
t
AS 1.5 1.5 ns
t
CH 2.5 2.5 ns
t
CL 2.5 2.5 ns
t
CK (3) 7 7.5 ns
t
CK (2) 7.5 10 ns
t
CKH 0.8 0.8 ns
INITIALIZE AND LOAD MODE REGISTER
2
*CAS latency indicated in parentheses.
NOTE: 1. The Mode Register may be loaded prior to the AUTO REFRESH cycles if desired.
2. If CS is HIGH at clock high time, all commands applied are NOP, with CKE a “Don’t Care.
3. JEDEC and PC100 specify three clocks.
4. Outputs are guaranteed High-Z after command is issued.
5. A12 should be a LOW at
t
P + 1.
t
CKS 1.5 1.5 ns
t
CMH 0.8 0.8 ns
t
CMS 1.5 1.5 ns
t
MRD
3
22tCK
t
RFC 66 66 ns
t
RP 15 20 ns
t
CH
t
CL
t
CK
CKE
CK
COMMAND
DQ
BA0, BA1
BANK
t
RFC
t
MRD
t
RFC
AUTO REFRESH
AUTO REFRESH
Program Mode Register
1, 3, 4
t
CMH
t
CMS
Precharge all banks
()(
)
()(
)
()(
)
()(
)
t
RP
()(
)
()(
)
t
CKS
Power-up: V
DD
and
CLK stable
T = 100µs
MIN
PRECHARGE NOP
AUTO
REFRESH
NOP
LOAD MODE
REGISTER
ACTIVENOP NOPNOP
()(
)
()(
)
()(
)
()(
)
()(
)
()(
)
AUTO
REFRESH
ALL
BANKS
()(
)
()(
)
()(
)
()(
)
()(
)
()(
)
High-Z
t
CKH
()(
)
()(
)
DQM/
DQML, DQMH
()(
)
()(
)
()(
)
()(
)
()(
)
()(
)
()(
)
()(
)
()(
)
()(
)
()(
)
()(
)
()(
)
()(
)
()(
)
()(
)
()(
)
NOP
()(
)
()(
)
t
CMH
t
CMS
t
CMH
t
CMS
A0-A9, A11, A12
ROW
t
AH
5
t
AS
CODE
()(
)
()(
)
()(
)
()(
)
()(
)
()(
)
()(
)
()(
)
A10
ROW
t
AH
t
AS
CODE
()(
)
()(
)
()(
)
()(
)
ALL BANKS
SINGLE BANK
()(
)
()(
)
()(
)
()(
)
DONT CARE
UNDEFINED
T0 T1 Tn + 1 To + 1 Tp + 1 Tp + 2 Tp + 3
Page 37
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512Mb: x4, x8, x16 SDRAM Micron Technology, Inc., reserves the right to change products or specifications without notice. 512MSDRAM_D.p65 – Rev. D; Pub 1/02 ©2000, Micron Technology, Inc.
512Mb: x4, x8, x16
SDRAM
ADVANCE
TIMING PARAMETERS
-7E -75
SYMBOL* MIN MAX MIN MAX UNITS
t
AH 0.8 0.8 ns
t
AS 1.5 1.5 ns
t
CH 2.5 2.5 ns
t
CL 2.5 2.5 ns
t
CK (3) 7 7.5 ns
NOTE: 1. Violating refresh requirements during power-down may result in a loss of data.
POWER-DOWN MODE
1
t
CH
t
CL
t
CK
Two clock cycles
CKE
CLK
DQ
All banks idle, enter power-down mode
Precharge all
active banks
Input buffers gated off while in
power-down mode
Exit power-down mode
()(
)
()(
)
DONT CARE
t
CKS
t
CKS
COMMAND
t
CMH
t
CMS
PRECHARGE NOP NOP ACTIVENOP
()(
)
()(
)
All banks idle
BA0, BA1
BANK
BANK(S)
()(
)
()(
)
High-Z
t
AH
t
AS
t
CKH
t
CKS
DQM/
DQML, DQMH
()(
)
()(
)
()(
)
()(
)
A0-A9, A11, A12
ROW
()(
)
()(
)
ALL BANKS
SINGLE BANK
A10
ROW
()(
)
()(
)
T0 T1 T2 Tn + 1 Tn + 2
*CAS latency indicated in parentheses.
-7E -75
SYMBOL* MIN MAX MIN MAX UNITS
t
CK (2) 7.5 10 ns
t
CKH 0.8 0.8 ns
t
CKS 1.5 1.5 ns
t
CMH 0.8 0.8 ns
t
CMS 1.5 1.5 ns
Page 38
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512Mb: x4, x8, x16 SDRAM Micron Technology, Inc., reserves the right to change products or specifications without notice. 512MSDRAM_D.p65 – Rev. D; Pub 1/02 ©2000, Micron Technology, Inc.
512Mb: x4, x8, x16
SDRAM
ADVANCE
TIMING PARAMETERS
-7E -75
SYMBOL* MIN MAX MIN MAX UNITS
t
AC (3) 5.4 5.4 ns
t
AC (2) 5.4 6 ns
t
AH 0.8 0.8 ns
t
AS 1.5 1.5 ns
t
CH 2.5 2.5 ns
t
CL 2.5 2.5 ns
t
CK (3) 7 7.5 ns
t
CK (2) 7.5 10 ns
t
CKH 0.8 0.8 ns
CLOCK SUSPEND MODE
1
t
CH
t
CL
t
CK
t
AC
t
LZ
DQM/
DQML, DQMH
CLK
A0-A9, A11, A12
DQ
BA0, BA1
A10
t
OH
D
OUT
m
tAHt
AS
tAHt
AS
t
AH
t
AS
BANK
t
DH
D
OUT
e
t
AC
t
HZ
D
OUT
m + 1
COMMAND
t
CMH
t
CMS
NOPNOP NOP NOPNOPREAD WRITE
DONT CARE
CKE
t
CKStCKH
BANK
COLUMN m
t
DS
D
OUT
e + 1
NOP
t
CKH
t
CKS
t
CMH
t
CMS
2
COLUMN e
2
T0 T1 T2 T3 T4 T5 T6 T7 T8 T9
NOTE: 1. For this example, the burst length = 2, the CAS latency = 3, and AUTO PRECHARGE is disabled.
2. x16: A11 and A12 = Dont Care x8: A12 = Dont Care
*CAS latency indicated in parentheses.
-7E -75
SYMBOL* MIN MAX MIN MAX UNITS
t
CKS 1.5 1.5 ns
t
CMH 0.8 0.8 ns
t
CMS 1.5 1.5 ns
t
DH 0.8 0.8 ns
t
DS 1.5 1.5 ns
t
HZ (3) 5.4 5.4 ns
t
HZ (2) 5.4 6 ns
t
LZ 1 1 ns
t
OH 2.7 2.7 ns
Page 39
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512Mb: x4, x8, x16 SDRAM Micron Technology, Inc., reserves the right to change products or specifications without notice. 512MSDRAM_D.p65 – Rev. D; Pub 1/02 ©2000, Micron Technology, Inc.
512Mb: x4, x8, x16
SDRAM
ADVANCE
AUTO REFRESH MODE
t
CH
t
CL
t
CK
CKE
CLK
DQ
t
RFC RFC
()(
)
()(
)
()(
)
t
RP
()(
)
()(
)
()(
)
()(
)
COMMAND
t
CMH
t
CMS
NOPNOP
()(
)
()(
)
BANK
ACTIVE
AUTO
REFRESH
()(
)
()(
)
NOPNOPPRECHARGE
Precharge all
active banks
AUTO
REFRESH
t
High-Z
BA0, BA1
BANK(S)
()(
)
()(
)
()(
)
()(
)
t
AH
t
AS
t
CKH
t
CKS
()(
)
NOP
()(
)
()(
)
()(
)
()(
)
DQM /
DQML, DQMH
A0-A9, A11, A12
ROW
()(
)
()(
)
ALL BANKS
SINGLE BANK
A10
ROW
()(
)
()(
)
()(
)
()(
)
()(
)
()(
)
()(
)
()(
)
DONT CARE
T0 T1 T2 Tn + 1 To + 1
*CAS latency indicated in parentheses.
-7E -75
SYMBOL* MIN MAX MIN MAX UNITS
t
CKH 0.8 0.8 ns
t
CKS 1.5 1.5 ns
t
CMH 0.8 0.8 ns
t
CMS 1.5 1.5 ns
t
RFC 66 66 ns
t
RP 15 20 ns
TIMING PARAMETERS
-7E -75
SYMBOL* MIN MAX MIN MAX UNITS
t
AH 0.8 0.8 ns
t
AS 1.5 1.5 ns
t
CH 2.5 2.5 ns
t
CL 2.5 2.5 ns
t
CK (3) 7 7.5 ns
t
CK (2) 7.5 10 ns
Page 40
40
512Mb: x4, x8, x16 SDRAM Micron Technology, Inc., reserves the right to change products or specifications without notice. 512MSDRAM_D.p65 – Rev. D; Pub 1/02 ©2000, Micron Technology, Inc.
512Mb: x4, x8, x16
SDRAM
ADVANCE
TIMING PARAMETERS
-7E -75
SYMBOL* MIN MAX MIN MAX UNITS
t
AH 0.8 0.8 ns
t
AS 1.5 1.5 ns
t
CH 2.5 2.5 ns
t
CL 2.5 2.5 ns
t
CK (3) 7 7.5 ns
t
CK (2) 7.5 10 ns
t
CKH 0.8 0.8 ns
SELF REFRESH MODE
t
CH
t
CL
t
CK
t
RP
CKE
CLK
DQ
Enter self refresh mode
Precharge all
active banks
t
XSR
CLK stable prior to exiting
self refresh mode
Exit self refresh mode
(Restart refresh time base)
()(
)
()(
)
()(
)
()(
)
()(
)
DONT CARE
COMMAND
t
CMH
t
CMS
AUTO
REFRESH
PRECHARGE NOP NOP
or COMMAND
INHIBIT
()(
)
()(
)
()(
)
()(
)
BA0, BA1
BANK(S)
()(
)
()(
)
High-Z
t
CKS
AH
AS
AUTO
REFRESH
t
RAS(MIN)
1
()(
)
()(
)
()(
)
()(
)
t
CKH
t
CKS
DQM/
DQML, DQMH
()(
)
()(
)
()(
)
()(
)
tt
A0-A9, A11,A12
()(
)
()(
)
()(
)
()(
)
ALL BANKS
SINGLE BANK
A10
()(
)
()(
)
()(
)
()(
)
()(
)
()(
)
T0 T1 T2 Tn + 1 To + 1 To + 2
()(
)
()(
)
*CAS latency indicated in parentheses.
-7E -75
SYMBOL* MIN MAX MIN MAX UNITS
t
CKS 1.5 1.5 ns
t
CMH 0.8 0.8 ns
t
CMS 1.5 1.5 ns
t
RAS 37 120,000 44 120,000 ns
t
RP 15 20 ns
t
XSR 67 75 ns
NOTES: 1. No maximum time limit for Self Refresh. tRAS(MAX) applies to non-Self Refresh mode.
2.tXSR requires minimum of two clocks regardless of frequency or timing.
Page 41
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512Mb: x4, x8, x16 SDRAM Micron Technology, Inc., reserves the right to change products or specifications without notice. 512MSDRAM_D.p65 – Rev. D; Pub 1/02 ©2000, Micron Technology, Inc.
512Mb: x4, x8, x16
SDRAM
ADVANCE
TIMING PARAMETERS
-7E -75
SYMBOL* MIN MAX MIN MAX UNITS
t
AC (3) 5.4 5.4 ns
t
AC (2) 5.4 6 ns
t
AH 0.8 0.8 ns
t
AS 1.5 1.5 ns
t
CH 2.5 2.5 ns
t
CL 2.5 2.5 ns
t
CK (3) 7 7.5 ns
t
CK (2) 7.5 10 ns
t
CKH 0.8 0.8 ns
t
CKS 1.5 1.5 ns
READ – WITHOUT AUTO PRECHARGE
1
ALL BANKS
t
CH
t
CL
t
CK
t
AC
t
LZ
t
RP
t
RAS
t
RCD
CAS Latency
t
RC
DQM/
DQML, DQMH
CKE
CLK
A0-A9, A11, A12
DQ
BA0, BA1
A10
t
OH
D
OUT
m
t
CMH
t
CMS
t
AH
t
AS
t
AH
t
AS
t
AH
t
AS
ROW
ROW
BANK BANK BANK
ROW
ROW
BANK
t
HZ
t
OH
D
OUT
m + 3
t
AC
t
OH
t
AC
t
OH
t
AC
D
OUT
m + 2D
OUT
m + 1
COMMAND
t
CMH
t
CMS
PRECHARGENOPNOP NOPACTIVE NOP READ NOP ACTIVE
DISABLE AUTO PRECHARGE
SINGLE BANK
DONT CARE
UNDEFINED
t
CKH
t
CKS
COLUMN m
2
T0 T1 T2 T4T3 T5 T6 T7 T8
NOTE: 1. For this example, the burst length = 4, the CAS latency = 2, and the READ burst is followed by a “manual
PRECHARGE.
2. x16: A11 and A12 = Dont Care
x8: A12 = Dont Care
*CAS latency indicated in parentheses.
-7E -75
SYMBOL* MIN MAX MIN MAX UNITS
t
CMH 0.8 0.8 ns
t
CMS 1.5 1.5 ns
t
HZ (3) 5.4 5.4 ns
t
HZ (2) 5.4 6 ns
t
LZ 1 1 ns
t
OH 2.7 2.7 ns
t
RAS 37 120,000 44 120,000 ns
t
RC 60 66 ns
t
RCD 15 20 ns
t
RP 15 20 ns
Page 42
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512Mb: x4, x8, x16 SDRAM Micron Technology, Inc., reserves the right to change products or specifications without notice. 512MSDRAM_D.p65 – Rev. D; Pub 1/02 ©2000, Micron Technology, Inc.
512Mb: x4, x8, x16
SDRAM
ADVANCE
TIMING PARAMETERS
-7E -75
SYMBOL* MIN MAX MIN MAX UNITS
t
AC (3) 5.4 5.4 ns
t
AC (2) 5.4 6 ns
t
AH 0.8 0.8 ns
t
AS 1.5 1.5 ns
t
CH 2.5 2.5 ns
t
CL 2.5 2.5 ns
t
CK (3) 7 7.5 ns
t
CK (2) 7.5 10 ns
t
CKH 0.8 0.8 ns
t
CKS 1.5 1.5 ns
READ – WITH AUTO PRECHARGE
1
ENABLE AUTO PRECHARGE
t
CH
t
CL
t
CK
t
AC
t
LZ
t
RP
t
RAS
t
RCD
CAS Latency
t
RC
DQM/
DQML, DQMH
CKE
CLK
A0-A9, A11, A12
DQ
BA0, BA1
A10
t
OH
D
OUT
m
t
CMH
t
CMS
t
AH
t
AS
t
AH
t
AS
t
AH
t
AS
ROW
ROW
BANK
BANK
ROW
ROW
BANK
DONT CARE
UNDEFINED
t
HZ
t
OH
D
OUT
m + 3
t
AC
t
OH
t
AC
t
OH
t
AC
D
OUT
m + 2D
OUT
m + 1
COMMAND
t
CMH
t
CMS
NOPNOP NOPACTIVE NOP READ NOP ACTIVENOP
t
CKH
t
CKS
COLUMN m
2
T0 T1 T2 T4T3 T5 T6 T7 T8
NOTE: 1. For this example, the burst length = 4, and the CAS latency = 2.
2. x16: A11 and A12 = Dont Care
x8: A12 = Dont Care
*CAS latency indicated in parentheses.
-7E -75
SYMBOL* MIN MAX MIN MAX UNITS
t
CMH 0.8 0.8 ns
t
CMS 1.5 1.5 ns
t
HZ (3) 5.4 5.4 ns
t
HZ (2) 5.4 6 ns
t
LZ 1 1 ns
t
OH 2.7 2.7 ns
t
RAS 37 120,000 44 120,000 ns
t
RC 60 66 ns
t
RCD 15 20 ns
t
RP 15 20 ns
Page 43
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512Mb: x4, x8, x16 SDRAM Micron Technology, Inc., reserves the right to change products or specifications without notice. 512MSDRAM_D.p65 – Rev. D; Pub 1/02 ©2000, Micron Technology, Inc.
512Mb: x4, x8, x16
SDRAM
ADVANCE
SINGLE READ – WITHOUT AUTO PRECHARGE
1
TIMING PARAMETERS
-7E -75
SYMBOL* MIN MAX MIN MAX UNITS
t
AC (3) 5.4 5.4 ns
t
AC (2) 5.4 6 ns
t
AH 0.8 0.8 ns
t
AS 1.5 1.5 ns
t
CH 2.5 2.5 ns
t
CL 2.5 2.5 ns
t
CK (3) 7 7.5 ns
t
CK (2) 7.5 10 ns
t
CKH 0.8 0.8 ns
t
CKS 1.5 1.5 ns
t
CMH 0.8 0.8 ns
t
CMS 1.5 1.5 ns
t
HZ (3) 5.4 5.4 ns
t
HZ (2) 5.4 6 ns
t
LZ 1 1 ns
t
OH 2.7 2.7 ns
t
RAS 37 120,000 44 120,000 ns
t
RC 60 66 ns
t
RCD 15 20 ns
t
RP 15 20 ns
*CAS latency indicated in parentheses.
ALL BANKS
t
CH
t
CL
t
CK
t
AC
t
LZ
t
RP
t
RAS
t
RCD
CAS Latency
t
RC
t
OH
D
OUT
m
t
CMH
t
CMS
t
AH
t
AS
t
AH
t
AS
t
AH
t
AS
ROW
ROW
BANK
BANK(S)
BANK
ROW
ROW
BANK
t
HZ
t
CMH
t
CMS
NOPNOPNOP
PRECHARGE
ACTIVE NOP READ ACTIVE NOP
DISABLE AUTO PRECHARGE
SINGLE BANKS
DONT CARE
UNDEFINED
COLUMN m
2
t
CKH
t
CKS
T0 T1 T2 T3 T4 T5 T6 T7 T8
DQM/
DQML, DQMH
CKE
CLK
A0-A9, A11, A12
DQ
BA0, BA1
A10
COMMAND
-7E -75
SYMBOL* MIN MAX MIN MAX UNITS
NOTE: 1. For this example, the burst length = 1, the CAS latency = 2, and the READ burst is followed by a manual
PRECHARGE.
2. x16: A11 and A12 = Dont Care x8: A12 = Dont Care
Page 44
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512Mb: x4, x8, x16 SDRAM Micron Technology, Inc., reserves the right to change products or specifications without notice. 512MSDRAM_D.p65 – Rev. D; Pub 1/02 ©2000, Micron Technology, Inc.
512Mb: x4, x8, x16
SDRAM
ADVANCE
NOTE: 1. For this example, the burst length = 1, and the CAS latency = 2.
2. x16: A11 and A12 = Dont Care
x8: A12 = Dont Care
3. READ command not allowed else tRAS would be violated
*CAS latency indicated in parentheses.
-7E -75
SYMBOL* MIN MAX MIN MAX UNITS
t
CMH 0.8 0.8 ns
t
CMS 1.5 1.5 ns
t
HZ (3) 5.4 5.4 ns
t
HZ (2) 5.4 6 ns
t
LZ 1 1 ns
t
OH 2.7 2.7 ns
t
RAS 37 120,000 44 120,000 ns
t
RC 60 66 ns
t
RCD 15 20 ns
t
RP 15 20 ns
TIMING PARAMETERS
-7E -75
SYMBOL* MIN MAX MIN MAX UNITS
t
AC (3) 5.4 5.4 ns
t
AC (2) 5.4 6 ns
t
AH 0.8 0.8 ns
t
AS 1.5 1.5 ns
t
CH 2.5 2.5 ns
t
CL 2.5 2.5 ns
t
CK (3) 7 7.5 ns
t
CK (2) 7.5 10 ns
t
CKH 0.8 0.8 ns
t
CKS 1.5 1.5 ns
SINGLE READ – WITH AUTO PRECHARGE
1
ENABLE AUTO PRECHARGE
t
CH
t
CL
t
CK
t
RP
t
RAS
t
RCD
CAS Latency
t
RC
DQM/
DQML, DQMH
CKE
CLK
A0-A9, A11
DQ
BA0, BA1
A10
t
CMH
t
CMS
t
AH
t
AS
t
AH
t
AS
t
AH
t
AS
ROW
ROW
BANK
BANK
ROW
ROW
BANK
DONT CARE
UNDEFINED
t
HZ
t
OH
D
OUT
m
t
AC
COMMAND
t
CMH
t
CMS
NOP
3
READACTIVE NOP NOP
3
ACTIVENOP
t
CKH
t
CKS
COLUMN m
2
T0 T1 T2 T4T3 T5 T6 T7 T8
NOP
NOP
Page 45
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512Mb: x4, x8, x16 SDRAM Micron Technology, Inc., reserves the right to change products or specifications without notice. 512MSDRAM_D.p65 – Rev. D; Pub 1/02 ©2000, Micron Technology, Inc.
512Mb: x4, x8, x16
SDRAM
ADVANCE
TIMING PARAMETERS
-7E -75
SYMBOL* MIN MAX MIN MAX UNITS
t
AC (3) 5.4 5.4 ns
t
AC (2) 5.4 6 ns
t
AH 0.8 0.8 ns
t
AS 1.5 1.5 ns
t
CH 2.5 2.5 ns
t
CL 2.5 2.5 ns
t
CK (3) 7 7.5 ns
t
CK (2) 7.5 10 ns
t
CKH 0.8 0.8 ns
t
CKS 1.5 1.5 ns
ALTERNATING BANK READ ACCESSES
1
ENABLE AUTO PRECHARGE
t
CH
t
CL
t
CK
t
AC
t
LZ
DQM/
DQML, DQMH
CLK
A0-A9, A11, A12
DQ
BA0, BA1
A10
t
OH
D
OUT
m
t
CMH
t
CMS
t
AH
t
AS
t
AH
t
AS
t
AH
t
AS
ROW
ROW
ROW
ROW
DONT CARE
UNDEFINED
t
OH
D
OUT
m + 3
t
AC
t
OH
t
AC
t
OH
t
AC
D
OUT
m + 2D
OUT
m + 1
COMMAND
t
CMH
t
CMS
NOP NOPACTIVE NOP READ NOP ACTIVE
t
OH
D
OUT
b
t
AC
t
AC
READ
ENABLE AUTO PRECHARGE
ROW
ACTIVE
ROW
BANK 0 BANK 0 BANK 3 BANK 3
BANK 0
CKE
t
CKH
t
CKS
COLUMN m
2
COLUMN b
2
T0 T1 T2 T4T3 T5 T6 T7 T8
t
RP - BANK 0
t
RAS - BANK 0
t
RCD - BANK 0
t
RCD - BANK 0
CAS Latency - BANK 0
t
RCD - BANK 1
CAS Latency - BANK 1
t
t
RC - BANK 0
RRD
NOTE: 1. For this example, the burst length = 4, and the CAS latency = 2.
2. x16: A11 and A12 = Dont Care
x8: A12 = Dont Care
*CAS latency indicated in parentheses.
-7E -75
SYMBOL* MIN MAX MIN MAX UNITS
t
CMH 0.8 0.8 ns
t
CMS 1.5 1.5 ns
t
LZ 1 1 ns
t
OH 2.7 2.7 ns
t
RAS 37 120,000 44 120,000 ns
t
RC 60 66 ns
t
RCD 15 20 ns
t
RP 15 20 ns
t
RRD 14 15 ns
Page 46
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512Mb: x4, x8, x16 SDRAM Micron Technology, Inc., reserves the right to change products or specifications without notice. 512MSDRAM_D.p65 – Rev. D; Pub 1/02 ©2000, Micron Technology, Inc.
512Mb: x4, x8, x16
SDRAM
ADVANCE
TIMING PARAMETERS
-7E -75
SYMBOL* MIN MAX MIN MAX UNITS
t
AC (3) 5.4 5.4 ns
t
AC (2) 5.4 6 ns
t
AH 0.8 0.8 ns
t
AS 1.5 1.5 ns
t
CH 2.5 2.5 ns
t
CL 2.5 2.5 ns
t
CK (3) 7 7.5 ns
t
CK (2) 7.5 10 ns
t
CKH 0.8 0.8 ns
READ – FULL-PAGE BURST
1
NOTE: 1. For this example, the CAS latency = 2.
2. x16: A11 and A12 = Dont Care
x8: A12 = Dont Care
3. Page left open; no tRP.
*CAS latency indicated in parentheses.
-7E -75
SYMBOL* MIN MAX MIN MAX UNITS
t
CKS 1.5 1.5 ns
t
CMH 0.8 0.8 ns
t
CMS 1.5 1.5 ns
t
HZ (3) 5.4 5.4 ns
t
HZ (2) 5.4 6 ns
t
LZ 1 1 ns
t
OH 2.7 2.7 ns
t
RCD 15 20 ns
t
CH
t
CL
t
CK
t
AC
t
LZ
t
RCD
CAS Latency
DQM/
DQML, DQMH
CKE
CLK
A0-A9, A11, A12
DQ
BA0, BA1
A10
t
OH
D
OUT
m
t
CMH
t
CMS
t
AH
t
AS
t
AH
t
AS
t
AC
t
OH
D
OUT
m+1
ROW
ROW
t
HZ
t
AC
t
OH
D
OUT
m+1
t
AC
t
OH
D
OUT
m+2
t
AC
t
OH
D
OUT
m-1
t
AC
t
OH
Dout m
Full-page burst does not self-terminate.
Can use BURST TERMINATE command.
()(
)
()(
)
()(
)
()(
)
()(
)
()(
)
()(
)
Full page completed
1,024 (x16) locations within same row 2,048 (x8) locations within same row 4,096 (x4) locations within same row
DONT CARE
UNDEFINED
COMMAND
t
CMH
t
CMS
NOPNOP NOPACTIVE NOP READ NOP BURST TERMNOP NOP
()(
)
()(
)
NOP
()(
)
()(
)
t
AH
t
AS
BANK
()(
)
()(
)
BANK
t
CKH
t
CKS
()(
)
()(
)
()(
)
()(
)
COLUMN m
2
3
T0 T1 T2 T4T3 T5 T6 Tn + 1 Tn + 2 Tn + 3 Tn + 4
Page 47
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512Mb: x4, x8, x16 SDRAM Micron Technology, Inc., reserves the right to change products or specifications without notice. 512MSDRAM_D.p65 – Rev. D; Pub 1/02 ©2000, Micron Technology, Inc.
512Mb: x4, x8, x16
SDRAM
ADVANCE
TIMING PARAMETERS
-7E -75
SYMBOL* MIN MAX MIN MAX UNITS
t
AC (3) 5.4 5.4 ns
t
AC (2) 5.4 6 ns
t
AH 0.8 0.8 ns
t
AS 1.5 1.5 ns
t
CH 2.5 2.5 ns
t
CL 2.5 2.5 ns
t
CK (3) 7 7.5 ns
t
CK (2) 7.5 10 ns
t
CKH 0.8 0.8 ns
READ – DQM OPERATION
1
t
CH
t
CL
t
CK
t
RCD
CAS Latency
DQM/
DQML, DQMH
CKE
CLK
A0-A9, A11, A12
DQ
BA0, BA1
A10
t
CMS
ROW
BANK
ROW
BANK
DONT CARE
UNDEFINED
t
AC
LZ
D
OUT
m
t
OH
D
OUT
m + 3D
OUT
m + 2
t
t
HZ
LZ
t
t
CMH
COMMAND
NOPNOP NOPACTIVE NOP READ NOPNOP NOP
t
HZ
t
AC
t
OH
t
AC
t
OH
t
AH
t
AS
t
CMS
t
CMH
t
AH
t
AS
t
AH
t
AS
t
CKH
t
CKS
ENABLE AUTO PRECHARGE
DISABLE AUTO PRECHARGE
COLUMN m
2
T0 T1 T2 T4T3 T5 T6 T7 T8
NOTE: 1. For this example, the burst length = 4, and the CAS latency = 2.
2. x16: A11 and A12 = Dont Care
x8: A12 = Dont Care
*CAS latency indicated in parentheses.
-7E -75
SYMBOL* MIN MAX MIN MAX UNITS
t
CKS 1.5 1.5 ns
t
CMH 0.8 0.8 ns
t
CMS 1.5 1.5 ns
t
HZ (3) 5.4 5.4 ns
t
HZ (2) 5.4 6 ns
t
LZ 1 1 ns
t
OH 2.7 2.7 ns
t
RCD 15 20 ns
Page 48
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512Mb: x4, x8, x16 SDRAM Micron Technology, Inc., reserves the right to change products or specifications without notice. 512MSDRAM_D.p65 – Rev. D; Pub 1/02 ©2000, Micron Technology, Inc.
512Mb: x4, x8, x16
SDRAM
ADVANCE
WRITE – WITHOUT AUTO PRECHARGE
1
DISABLE AUTO PRECHARGE
t
CH
t
CL
t
CK
t
RP
t
RAS
t
RCD
t
RC
DQM/
DQML, DQMH
CKE
CLK
A0-A9, A11, A12
DQ
BA0, BA1
A10
t
CMH
t
CMS
t
AH
t
AS
ROW
BANK BANK
ROW
BANK
t
DON’T CARE
DIN m
t
DH
t
DS
DIN m + 1 DIN m + 2 DIN m + 3
COMMAND
t
CMH
t
CMS
NOPNOP NOPACTIVE NOP WRITE PRECHARGE
t
AH
t
AS
t
AH
t
AS
t
DH
t
DS
t
DH
t
DS
t
DH
t
DS
SINGLE BANK
t
CKH
t
CKS
COLUMN m
3
2
T0 T1 T2 T4T3 T5 T6 T7 T8 T9
ROW
BANK
ROW
ACTIVE
NOP
WR
NOP
ALL BANKs
NOTE: 1. For this example, the burst length = 4, and the WRITE burst is followed by a “manual PRECHARGE.
2. 14ns to 15ns is required between <DIN m> and the PRECHARGE command, regardless of frequency.
3. x16: A11 and A12 = Dont Care
x8: A12 = Dont Care
*CAS latency indicated in parentheses.
-7E -75
SYMBOL* MIN MAX MIN MAX UNITS
t
CMS 1.5 1.5 ns
t
DH 0.8 0.8 ns
t
DS 1.5 1.5 ns
t
RAS 37 120,000 44 120,000 ns
t
RC 60 66 ns
t
RCD 15 20 ns
t
RP 15 20 ns
t
WR 14 15 ns
TIMING PARAMETERS
-7E -75
SYMBOL* MIN MAX MIN MAX UNITS
t
AH 0.8 0.8 ns
t
AS 1.5 1.5 ns
t
CH 2.5 2.5 ns
t
CL 2.5 2.5 ns
t
CK (3) 7 7.5 ns
t
CK (2) 7.5 10 ns
t
CKH 0.8 0.8 ns
t
CKS 1.5 1.5 ns
t
CMH 0.8 0.8 ns
Page 49
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512Mb: x4, x8, x16 SDRAM Micron Technology, Inc., reserves the right to change products or specifications without notice. 512MSDRAM_D.p65 – Rev. D; Pub 1/02 ©2000, Micron Technology, Inc.
512Mb: x4, x8, x16
SDRAM
ADVANCE
TIMING PARAMETERS
-7E -75
SYMBOL* MIN MAX MIN MAX UNITS
t
AH 0.8 0.8 ns
t
AS 1.5 1.5 ns
t
CH 2.5 2.5 ns
t
CL 2.5 2.5 ns
t
CK (3) 7 7.5 ns
t
CK (2) 7.5 10 ns
t
CKH 0.8 0.8 ns
t
CKS 1.5 1.5 ns
t
CMH 0.8 0.8 ns
WRITE – WITH AUTO PRECHARGE
1
NOTE: 1. For this example, the burst length = 4.
2. x16: A11 and A12 = Dont Care
x8: A12 = Dont Care
*CAS latency indicated in parentheses.
-7E -75
SYMBOL* MIN MAX MIN MAX UNITS
t
CMS 1.5 1.5 ns
t
DH 0.8 0.8 ns
t
DS 1.5 1.5 ns
t
RAS 37 120,000 44 120,000 ns
t
RC 60 66 ns
t
RCD 15 20 ns
t
RP 15 20 ns
t
WR 1 CLK + 1 CLK +
7ns 7.5ns
ENABLE AUTO PRECHARGE
t
CH
t
CL
t
CK
t
RP
t
RAS
t
RCD
t
RC
DQM/
DQML, DQMH
CKE
CLK
A0-A9, A11, A12
DQ
BA0, BA1
A10
t
CMH
t
CMS
t
AH
t
AS
ROW
ROW
BANK BANK
ROW
ROW
BANK
t
WR
DONT CARE
DIN m
t
DH
t
DS
DIN m + 1 DIN m + 2 DIN m + 3
COMMAND
t
CMH
t
CMS
NOPNOP NOPACTIVE NOP WRITE NOP ACTIVE
t
AH
t
AS
t
AH
t
AS
t
DH
t
DS
t
DH
t
DS
t
DH
t
DS
t
CKH
t
CKS
NOP NOP
COLUMN
m
2
T0 T1 T2 T4T3 T5 T6 T7 T8 T9
Page 50
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512Mb: x4, x8, x16 SDRAM Micron Technology, Inc., reserves the right to change products or specifications without notice. 512MSDRAM_D.p65 – Rev. D; Pub 1/02 ©2000, Micron Technology, Inc.
512Mb: x4, x8, x16
SDRAM
ADVANCE
TIMING PARAMETERS
-7E -75
SYMBOL* MIN MAX MIN MAX UNITS
t
AH 0.8 0.8 ns
t
AS 1.5 1.5 ns
t
CH 2.5 2.5 ns
t
CL 2.5 2.5 ns
t
CK (3) 7 7.5 ns
t
CK (2) 7.5 10 ns
t
CKH 0.8 0.8 ns
t
CKS 1.5 1.5 ns
t
CMH 0.8 0.8 ns
SINGLE WRITE – WITHOUT AUTO PRECHARGE
1
t
CMS 1.5 1.5 ns
t
DH 0.8 0.8 ns
t
DS 1.5 1.5 ns
t
RAS 37 120,000 44 120,000 ns
t
RC 60 66 ns
t
RCD 15 20 ns
t
RP 15 20 ns
t
WR 14 15 ns
*CAS latency indicated in parentheses.
DISABLE AUTO PRECHARGE
ALL BANKS
t
CH
t
CL
t
CK
t
RP
t
RAS
t
RCD
t
RC
DQM/
DQML, DQMH
CKE
CLK
A0-A9, A11, A12
DQ
BA0, BA1
A10
t
CMH
t
CMS
t
AH
t
AS
ROW
BANK BANK BANK
ROW
ROW
BANK
t
WR
DIN m
t
DH
t
DS
COMMAND
t
CMH
t
CMS
NOP
4
NOP
4
PRECHARGEACTIVE NOP WRITE ACTIVENOP NOP
t
AH
t
AS
t
AH
t
AS
SINGLE BANK
t
CKH
t
CKS
COLUMN m
3
2
T0 T1 T2 T4T3 T5 T6 T7 T8
DONT CARE
-7E -75
SYMBOL* MIN MAX MIN MAX UNITS
NOTE: 1. For this example, the burst length = 1, and the WRITE burst is followed by a manual PRECHARGE.
2. 14ns to 15ns is required between <DIN m> and the PRECHARGE command, regardless of frequency.
3. x16: A11 and A12 = Dont Care
x8: A12 = Dont Care
4. PRECHARGE command not allowed else tRAS would be violated
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512Mb: x4, x8, x16 SDRAM Micron Technology, Inc., reserves the right to change products or specifications without notice. 512MSDRAM_D.p65 – Rev. D; Pub 1/02 ©2000, Micron Technology, Inc.
512Mb: x4, x8, x16
SDRAM
ADVANCE
TIMING PARAMETERS
-7E -75
SYMBOL* MIN MAX MIN MAX UNITS
t
AH 0.8 0.8 ns
t
AS 1.5 1.5 ns
t
CH 2.5 2.5 ns
t
CL 2.5 2.5 ns
t
CK (3) 7 7.5 ns
t
CK (2) 7.5 10 ns
t
CKH 0.8 0.8 ns
t
CKS 1.5 1.5 ns
t
CMH 0.8 0.8 ns
SINGLE WRITE – WITH AUTO PRECHARGE
1
-7E -75
SYMBOL* MIN MAX MIN MAX UNITS
NOTE: 1. For this example, the burst length = 1, and the WRITE burst is followed by a manual PRECHARGE.
2. 14ns to 15ns is required between <DIN m> and the PRECHARGE command, regardless of frequency.
3. x16: A11 and A12 = Dont Care
x8: A12 = Dont Care
4. WRITE command not allowed else tRAS would be violated
*CAS latency indicated in parentheses.
ENABLE AUTO PRECHARGE
t
CH
t
CL
t
CK
t
RP
t
RAS
t
RCD
3
t
RC
DQM/
DQML, DQMH
CKE
CLK
A0-A9, A11, A12
DQ
BA0, BA1
A10
t
CMH
t
CMS
t
AH
t
AS
ROW
ROW
BANK BANK
ROW
ROW
BANK
t
WR
2
DIN m
COMMAND
t
CMH
t
CMS
NOP
4
NOP
4
NOPACTIVE NOP
4
WRITE
NOP
ACTIVE
t
AH
t
AS
t
AH
t
AS
t
DH
t
DS
t
CKH
t
CKS
NOP NOP
COLUMN m
3
T0 T1 T2 T4T3 T5 T6 T7 T8 T9
DONT CARE
t
CMS 1.5 1.5 ns
t
DH 0.8 0.8 ns
t
DS 1.5 1.5 ns
t
RAS 37 120,000 44 120,000 ns
t
RC 60 66 ns
t
RCD 15 20 ns
t
RP 15 20 ns
t
WR 1 CLK + 1 CLK + ns
7ns 7ns
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512Mb: x4, x8, x16 SDRAM Micron Technology, Inc., reserves the right to change products or specifications without notice. 512MSDRAM_D.p65 – Rev. D; Pub 1/02 ©2000, Micron Technology, Inc.
512Mb: x4, x8, x16
SDRAM
ADVANCE
TIMING PARAMETERS
-7E -75
SYMBOL* MIN MAX MIN MAX UNITS
t
AH 0.8 0.8 ns
t
AS 1.5 1.5 ns
t
CH 2.5 2.5 ns
t
CL 2.5 2.5 ns
t
CK (3) 7 7.5 ns
t
CK (2) 7.5 10 ns
t
CKH 0.8 0.8 ns
t
CKS 1.5 1.5 ns
t
CMH 0.8 0.8 ns
ALTERNATING BANK WRITE ACCESSES
1
t
CH
t
CL
t
CK
CLK
DQ
DONT CARE
DIN m
t
DH
t
DS
DIN m + 1 DIN m + 2 DIN m + 3
COMMAND
t
CMH
t
CMS
NOP NOPACTIVE NOP WRITE NOP NOP ACTIVE
t
DH
t
DS
t
DH
t
DS
t
DH
t
DS
ACTIVE WRITE
DIN b
t
DH
t
DS
DIN b + 1 DIN b + 3
t
DH
t
DS
t
DH
t
DS
ENABLE AUTO PRECHARGE
DQM/
DQML, DQMH
A0-A9, A11, A12
BA0, BA1
A10
t
CMH
t
CMS
tAHt
AS
tAHt
AS
tAHt
AS
ROW
ROW
ROW
ROW
ENABLE AUTO PRECHARGE
ROW
ROW
BANK 0 BANK 0 BANK 1
BANK 0
BANK 1
CKE
t
CKH
t
CKS
DIN b + 2
t
DH
t
DS
COLUMN b
3
COLUMN m
3
t
RP - BANK 0
t
RAS - BANK 0
t
RCD - BANK 0
t
t
RCD - BANK 0
t
WR - BANK 0
WR - BANK 1
t
RCD - BANK 1
t
t
RC - BANK 0
RRD
T0 T1 T2 T3 T4 T5 T6 T7 T8 T9
NOTE: 1. For this example, the burst length = 4.
2. Requires one clock plus time (7ns to 7.5ns) with auto precharge or 14ns to 15ns with PRECHARGE.
3. x16: A11 and A12 = Dont Care
x8: A12 = Dont Care
*CAS latency indicated in parentheses.
-7E -75
SYMBOL* MIN MAX MIN MAX UNITS
t
CMS 1.5 1.5 ns
t
DH 0.8 0.8 ns
t
DS 1.5 1.5 ns
t
RAS 37 120,000 44 120,000 ns
t
RC 60 66 ns
t
RCD 15 20 ns
t
RP 15 20 ns
t
RRD 14 15 ns
t
WR Note 2 Note 2 ns
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512Mb: x4, x8, x16 SDRAM Micron Technology, Inc., reserves the right to change products or specifications without notice. 512MSDRAM_D.p65 – Rev. D; Pub 1/02 ©2000, Micron Technology, Inc.
512Mb: x4, x8, x16
SDRAM
ADVANCE
TIMING PARAMETERS
-7E -75
SYMBOL* MIN MAX MIN MAX UNITS
t
AH 0.8 0.8 ns
t
AS 1.5 1.5 ns
t
CH 2.5 2.5 ns
t
CL 2.5 2.5 ns
t
CK (3) 7 7.5 ns
t
CK (2) 7.5 10 ns
t
CKH 0.8 0.8 ns
WRITE – FULL-PAGE BURST
NOTE: 1. x16: A11 and A12 = Dont Care
x8: A12 = Dont Care
2.tWR must be satisfied prior to PRECHARGE command.
3. Page left open; no tRP.
*CAS latency indicated in parentheses.
-7E -75
SYMBOL* MIN MAX MIN MAX UNITS
t
CKS 1.5 1.5 ns
t
CMH 0.8 0.8 ns
t
CMS 1.5 1.5 ns
t
DH 0.8 0.8 ns
t
DS 1.5 1.5 ns
t
RCD 15 20 ns
t
CH
t
CL
t
CK
t
RCD
DQM/
DQML, DQMH
CKE
CLK
A0-A9, A11, A12
BA0, BA1
A10
t
CMS
t
AH
t
AS
t
AH
t
AS
ROW
ROW
Full-page burst does not self-terminate. Can use BURST TERMINATE command to stop.
2, 3
()(
)
()(
)
()(
)
()(
)
Full page completed
DON’T CARE
COMMAND
t
CMH
t
CMS
NOPNOP NOPACTIVE NOP WRITE BURST TERMNOP NOP
()(
)
()(
)
()(
)
()(
)
DQ
DIN m
t
DH
t
DS
DIN m + 1 DIN m + 2 DIN m + 3
t
DH
t
DS
t
DH
t
DS
t
DH
t
DS
DIN m - 1
t
DH
t
DS
t
AH
t
AS
BANK
()(
)
()(
)
BANK
t
CMH
t
CKH
t
CKS
()(
)
()(
)
()(
)
()(
)
()(
)
()(
)
1,024 (x16) locations within same row
2,048 (x8) locations within same row 4,096 (x4) locations within same row
COLUMN
m
1
T0 T1 T2 T3 T4 T5 Tn + 1 Tn + 2 Tn + 3
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512Mb: x4, x8, x16 SDRAM Micron Technology, Inc., reserves the right to change products or specifications without notice. 512MSDRAM_D.p65 – Rev. D; Pub 1/02 ©2000, Micron Technology, Inc.
512Mb: x4, x8, x16
SDRAM
ADVANCE
TIMING PARAMETERS
-7E -75
SYMBOL* MIN MAX MIN MAX UNITS
t
AH 0.8 0.8 ns
t
AS 1.5 1.5 ns
t
CH 2.5 2.5 ns
t
CL 2.5 2.5 ns
t
CK (3) 7 7.5 ns
t
CK (2) 7.5 10 ns
t
CKH 0.8 0.8 ns
WRITE – DQM OPERATION
1
t
CH
t
CL
t
CK
t
RCD
DQM/
DQML, DQMH
CKE
CLK
A0-A9, A11, A12
DQ
BA0, BA1
A10
t
CMS
t
AH
t
AS
ROW
BANK
ROW
BANK
ENABLE AUTO PRECHARGE
DIN m + 3
t
DH
t
DS
DIN m
DIN m + 2
t
CMH
COMMAND
NOPNOP NOPACTIVE NOP WRITE NOPNOP
DONT CARE
t
CMS
t
CMH
t
DH
t
DS
t
DH
t
DS
t
AH
t
AS
t
AH
t
AS
DISABLE AUTO PRECHARGE
t
CKH
t
CKS
COLUMN m
2
T0 T1 T2 T3 T4 T5 T6 T7
NOTE: 1. For this example, the burst length = 4.
2. x16: A11 and A12 = Dont Care
x8: A12 = Dont Care
*CAS latency indicated in parentheses.
-7E -75
SYMBOL* MIN MAX MIN MAX UNITS
t
CKS 1.5 1.5 ns
t
CMH 0.8 0.8 ns
t
CMS 1.5 1.5 ns
t
DH 0.8 0.8 ns
t
DS 1.5 1.5 ns
t
RCD 15 20 ns
Page 55
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512Mb: x4, x8, x16 SDRAM Micron Technology, Inc., reserves the right to change products or specifications without notice. 512MSDRAM_D.p65 – Rev. D; Pub 1/02 ©2000, Micron Technology, Inc.
512Mb: x4, x8, x16
SDRAM
ADVANCE
54-PIN PLASTIC TSOP (400 mil)
SEE DETAIL A
.80 TYP
0.71
10.16 ±0.08
0.50 ±0.10
PIN #1 ID
DETAIL A
22.22 ±0.08
0.375 ±0.075
1.2 MAX
0.10
0.25
11.76 ±0.10
0.80 TYP
0.15
+0.03
-0.02
0.10
+0.10
-0.05
GAGE PLANE
NOTE: 1. All dimensions in millimeters.
2. Package width and length do not include mold protrusion; allowable mold protrusion is 0.25mm per side.
8000 S. Federal Way, P.O. Box 6, Boise, ID 83707-0006, Tel: 208-368-3900
E-mail: prodmktg@micron.com, Internet: http://www.micron.com, Customer Comment Line: 800-932-4992
Micron is a registered trademark and the Micron logo and M logo are trademarks of Micron Technology, Inc.
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