VLSI COMPONENTS FOR ARINC 429 DATA TRANSMISSION SYSTEMS
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MT34013
MAXIMUM RATINGS (Above which the useful life may be impaired)
Storage Temperature - 65ºC to +150ºC
Temperature (Ambient) under Bias - 55ºC to +125ºC
Supply Voltage VDD -0.3V to + 7V
DC Input Voltage -0.3 to VDD +0.3V
Output Current (Single O/P) 10mA
Output Current (Total O/P) 20mA
ELECTRICAL CHARACTERISTICS over operating range
PARAMETERDESCRIPTION TEST CONDITIONS MIN TYPMAXUNITS
IOHOutput High CurrentVOH=2.8VVDD= 4.5V 1.0
IOLOutput Low CurrentVOL=0.4V 3.2
VIHInput High Voltage 2.4 VCC
VILInput Low Voltage -0.3 0.8
IILInput Load CurrentVSS 40
IOZOutput Leakage Current
CIInput Capacitance
CI/OI/O Capacitance 7 9
ICCSupply Current
0.4V<VO<VCC Output Disabled
Test Frequency = 1.0 MHZ
VCC = MAX. All inputs
HIGH, All inputs open.
-40 40
2 2.6
10
mA
mA
Volts
Volts
uA
uA
pF
pF
mA
ARINC 429 SERIAL INPUT INTERFACE
Interfaces are provided for 8 independent Arinc 429 serial input channels with sufficient digital storage to guarantee
no data is lost provided all 8 channels can be accessed within 230µS.
Channels 0,1 & 2 can be programmed for either high or low speed operation. Channels 3 to 7 are configured for
interfacing to low speed Arinc buses only.
Digital Filtering is incorporated on each decoder input port to prevent word corruption due to noise spikes. (The
duration of reject noise spikes is a function of the basic clock period).
Arinc have suggested that the number of labels available to the user can be increased by either using SDI bits 9 and 10
as extra label bits or by using port identification. Both of these techniques have been accommodated in the design.
DATA DETECTION AND WORD TESTS
Each channel is provided with a 32 bit shift register to hold one complete word. The three channels which are
selectable for either high or low speed operation are additionally provided with a 32 bit buffer register.
Each channel contains hardware to test the following parameters:-
(1)Word length of 32 bits.
(2)Parity:- odd on good words.
(3)Gap:- the presence of a 33rd bit is checked for and the output processing is achieved during the remaining
gap for a valid word.
(4)Interconnection fault (both I/P’s high).
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Prioritised error information for each channel is latched into a 3 bit register with the format indicated in Table 1 and
made available at the user output port.
Channel servicing is carried out on a rotating priority basis, where the last channel serviced is given the lowest
priority, in order to allow full access for each channel.
A facility is provided on the decoder chip to enable individual channels to be tested, which consists of a multi-plexer
on the input to each channel to allow test messages (generated external to the chip) to be injected.
TABLE 1
Prioritorised coded error data.
Bit position relative to first output word see fig.2.
151413
111) Unused
110)
101Interconnection fault (highest priority)
100Channel overrun (causes corruption of following word in that channel.
011Word length error (number of bits not equal to 32).
010Parity error (word received with even parity).
001Service overrun (not all words or bytes accessed) - lowest priority.
000Good word.
USER INTERFACE
Arinc 429 data is read from the decoder chip via an 8 or 16 bit parallel data bus.
Fig 2 illustrates the formatting of the output data relative to the generalised Arinc 429 word format.
Control of the chip is achieved via a four bit control port which provides the user with the facilities outlined in Table
2. The control word is strobed into the chip using the leading edge of the NOT CSTR input providing the required set
up and hold times are met.
N.B. NOT CSTR must be high before NOT RESET is removed.
DATA READY signifies to the user that a word is available and can be accessed by pulling NOT CHIP ENABLE low
and strobing the NOT OUTPUT SELECT line as illustrated in fig .3.
NOT RESET provides the user with a simple means of asynchronously inhibiting the chip. Activating NOT RESET
disables the output buffers and clears DATA READY asynchronously. The internal counters are cleared by holding
NOT RESET low for 2 clock periods. Default options are selected which can be overwritten using the control input
port. The default options are shown below and are selected by pulsing RESET low or by selecting software reset (see
table 2).
• Channel sequencer set to channel 0 for highest priority.
• All channels are set for low speed operation.
• All channels are set for normal reception with no end around test mode.
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NOT CSTR and NOT OS must be high during reset but may go low immediately NOT RESET is removed.
NOT CSTR, LOW min = HIGH min = 1.5T for correct operation CO-3, SET UP TIME = 0, HOLD TIME = 2T min
after NOT CSTR goes low.
NOT CSTR is synchronised by ØIN to give a 0.5T interval strobe pulse. This pulse disables the state decoder O/P’s
allowing 0.5T settling time for the new state to be established before re-enabling the O/P’s. This ensures that data
I/P’s cannot be internally shorted together when changing from test on one channel to another.
1
*T =
/
= 1 clock cycle time of ØIN.
f
A single phase clock must be provided by the user with a frequency in the range of 1.25 - 2.0 MHZ. The chip will
accommodate all the selectable channel speed options available with the clock at any frequency between these limits.
A 3 bit binary code is allocated in the first word of output data to signify which channel has received a message and is
being accessed.
The positioning of the code is shown in fig 2 and has the form shown below:-
1st output word bit number
121110
000Channel 0
001Channel 1
010Channel 2
011Channel 3
100Channel 4
101Channel 5
110Channel 6
111Channel 7
FIG. 1
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TABLE 2 CONTROL WORD CODES
Control bit number
C3C2C1C0
0000Channels 0 to 7 low speed
0001Channel 0 high speed, channels 1 to 7 low speed
0010Channel 1 high speed, channels 0 and 2 to 7 low speed
0011Channels 0 and 1 high speed, channels 2 to 7 low speed
0100 (Channels 0,1 & 2 high speed
(Channels 3 to 7 low speed
0101 (Unused
0110 (
0111Software reset
1000Test Channel 0
MT34013
1001Test Channel 1
1010Test Channel 2
1011Test Channel 3
1100Test Channel 4
1101Test Channel 5
1110Test Channel 6
1111Test Channel 7
Notes
(1)Software reset causes the same action as pulling the RESET line low but once latched into the control register
the chip is held in a quiescent mode. Exit from this mode is achieved by latching in the required channel
speed option.
(2)Exit from the test mode requires restarting the required speed options (i.e. codes 0 to 4) or loading an unused
control mode.
(3)The action of testing a channel does not alter the speed at which is set, also changing between test (i.e. test 1
to test 2) has no effect on channel speed settings.
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FIG. 2 MULTICHANNEL ARINC 429 RECEIVER DATA OUTPUT FORMAT