Datasheet MT28F400B5WG-8B, MT28F400B5WG-8BET, MT28F400B5WG-8T, MT28F400B5WG-8TET, MT28F400B5WG-6T Datasheet (MICRON)

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Page 1

4Mb

SMART 5 BOOT BLOCK FLASH MEMORY

PRODUCTS AND SPECIFICATIONS DISCUSSED HEREIN ARE SUBJECT TO CHANGE BY MICRON WITHOUT NOTICE.

FLASH MEMORY

MT28F004B5 MT28F400B5

5V Only, Dual Supply (Smart 5)

0.3µm Process Technology

FEATURES

• Seven erase blocks: 16KB/8K-word boot block (protected) Two 8KB/4K-word parameter blocks Four main memory blocks

• Smart 5 technology (B5): 5V ±10% VCC 5V ±10% VPP application/production

programming

12V ±5% VPP compatibility production

programming

• Address access times: 60ns, 80ns

• 100,000 ERASE cycles

• Industry-standard pinouts

• Inputs and outputs are fully TTL-compatible

• Automated write and erase algorithm

• Two-cycle WRITE/ERASE sequence

• Byte- or word-wide READ and WRITE (MT28F400B5, 256K x 16/512K x 8)

• Byte-wide READ and WRITE only (MT28F004B5, 512K x 8)

• TSOP and SOP packaging options

OPTIONS MARKING

• Timing

60ns access -6 80ns access -8 80ns access -8 ET

• Configurations

512K x 8 MT28F004B5 256K x 16/512K x 8 MT28F400B5

• Boot Block Starting Word Address

Top (3FFFFH) T Bottom (00000H) B

• Operating Temperature Range

Commercial (0°C to +70°C) None Extended (-40°C to +85°C) ET

• Packages

Plastic 44-pin SOP (600 mil) SG Plastic 48-pin TSOP Type 1 WG

(12mm x 20mm)

Plastic 40-pin TSOP VG

(10mm x 20mm)

Part Number Example:

MT28F400B5SG-8 T

GENERAL DESCRIPTION

The MT28F004B5 (x8) and MT28F400B5 (x16, x8) are nonvolatile, electrically block-erasable (flash), programmable, read-only memories containing 4,194,304 bits organized as 262,144 words (16 bits) or 524,288 bytes (8 bits). Writing or erasing the device is done with a 5V VPP voltage, while all operations are performed with a 5V VCC. Due to process technology advances, 5V VPP is optimal for application and production programming. For backward compatibility with SmartVoltage technology, 12V VPP is supported for a maximum of 100 cycles and may be connected for up to 100 cumulative hours. These devices are fabricated with Micron’s advanced CMOS floating-gate process.

The MT28F004B5 and MT28F400B5 are organized into seven separately erasable blocks. To ensure that critical firmware is protected from accidental erasure or overwrite, the devices feature a hardware-protected boot block. Writing or erasing the boot block requires either applying a super-voltage to the RP# pin or driving WP# HIGH in addition to executing the normal write or erase sequences. This block may be used to store code implemented in low-level system recovery. The remaining blocks vary in density and are written and erased with no additional security measures.

Please refer to Micron’s Web site (www.micron.com/ flash/htmls/datasheets.html)p for the latest data sheet.

40-Pin TSOP Type I 48-Pin TSOP Type I

44-Pin SOP

Page 2

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SMART 5 BOOT BLOCK FLASH MEMORY

A15 A14 A13 A12 A11 A10

A9 A8

NC NC

WE#

RP#

WP#

NC NC

A17

A7 A6 A5 A4 A3 A2 A1

A16

BYTE# V

DQ15/(A-1) DQ7 DQ14 DQ6 DQ13 DQ5 DQ12 DQ4

DQ11 DQ3 DQ10 DQ2 DQ9 DQ1 DQ8 DQ0

OE# V

CE#

1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24

48 47 46 45 44 43 42 41 40 39 38 37 36 35 34 33 32 31 30 29 28 27 26 25

WP#

A17

CE#

OE#

DQ0

DQ8

DQ1

DQ9

DQ2

DQ10

DQ3

DQ11

RP#

WE#

A10

A11

A12

A13

A14

A15

A16

BYTE#

DQ15/(A-1)

DQ7

DQ14

DQ6

DQ13

DQ5

DQ12

DQ4

PIN ASSIGNMENT (Top View)

40-Pin TSOP Type I

48-Pin TSOP Type I 44-Pin SOP

ORDER NUMBER AND PART MARKING

MT28F400B5SG-6 B MT28F400B5SG-6 T MT28F400B5SG-8 B MT28F400B5SG-8 T MT28F400B5SG-8 BET MT28F400B5SG-8 TET

ORDER NUMBER AND PART MARKING

MT28F400B5WG-6 B MT28F400B5WG-6 T MT28F400B5WG-8 B MT28F400B5WG-8 T MT28F400B5WG-8 BET MT28F400B5WG-8 TET

ORDER NUMBER AND PART MARKING

MT28F004B5VG-6 B MT28F004B5VG-6 T MT28F004B5VG-8 B MT28F004B5VG-8 T MT28F004B5VG-8 BET MT28F004B5VG-8 TET

A16 A15 A14 A13 A12 A11

A9 A8

WE#

RP#

WP#

A18

A7 A6 A5 A4 A3 A2 A1

A17

NC NC

A10

DQ7 DQ6 DQ5 DQ4

DQ3 DQ2 DQ1 DQ0

OE# V

CE#

1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20

40 39 38 37 36 35 34 33 32 31 30 29 28 27 26 25 24 23 22 21

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SMART 5 BOOT BLOCK FLASH MEMORY

FUNCTIONAL BLOCK DIAGRAM

16KB Boot Block

8KB Parameter Block 8KB Parameter Block

96KB Main Block

128KB Main Block

Y - Select Gates

Sense Amplifiers

Write/Erase-Bit

Compare and Verify

Addr.

Buffer/

Latch

Power

(Current)

Control

Addr.

Counter

Command

Execution

Logic

I/O

Control

Logic

Switch/

Pump

Status

Identification

Y -

Decoder

128KB Main Block

X - Decoder/Block Erase Control

Output

Buffer

Input

Buffer

State

Machine

BYTE#

A0–A17/(18)

CE#

OE#

WE#

RP#

DQ15/(A - 1)

MUX

DQ15

DQ8–DQ14

DQ0–DQ7

18 (19)

A-1

(10)

Output

Buffer

Output

Buffer

Input

Buffer

Input

Buffer

Input Data Latch/Mux

WP#

NOTE: 1. Does not apply to MT28F004B5.

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SMART 5 BOOT BLOCK FLASH MEMORY

PIN DESCRIPTIONS

44-PIN SOP 40-PIN TSOP 48-PIN TSOP

NUMBERS NUMBERS NUMBERS SYMBOL TYPE DESCRIPTION

43 9 11 WE# Input Write Enable: Determines if a given cycle is a WRITE cycle. If

WE# is LOW, the cycle is either a WRITE to the command execution logic (CEL) or to the memory array.

2 12 14 WP# Input Write Protect: Unlocks the boot block when HIGH if V

PPH

1 (5V) or V

PPH

2 (12V)

and RP# = VIH during a WRITE or ERASE. Does not affect WRITE or ERASE operation on other blocks.

12 22 26 CE# Input Chip Enable: Activates the device when LOW. When CE# is

HIGH, the device is disabled and goes into standby power mode.

44 10 12 RP# Input Reset/Power-Down: When LOW, RP# clears the status register,

sets the internal state machine (ISM) to the array read mode and places the device in deep power-down mode. All inputs, including CE#, are “Don’t Care,” and all outputs are High-Z. RP# unlocks the boot block and overrides the condition of WP# when at VHH (12V), and must be held at VIH during all other modes of operation.

14 24 28 OE# Input Output Enable: Enables data output buffers when LOW.

When OE# is HIGH, the output buffers are disabled.

33 – 47 BYTE# Input Byte Enable: If BYTE# = HIGH, the upper byte is active through

DQ8-DQ15. If BYTE# = LOW, DQ8-DQ14 are High-Z, and all data is accessed through DQ0-DQ7. DQ15/(A - 1) becomes the least significant address input.

11, 10, 9, 8, 21, 20, 19, 25, 24, 23, A0-A17/ Input Address Inputs: Select a unique, 16-bit word or 8-bit byte. The

7, 6, 5, 4, 18, 17, 16, 22, 21, 20, (A18) DQ15/(A - 1) input becomes the lowest order address when 42, 41, 40, 15, 14, 8, 7, 19, 18, 8, 7, BYTE# = LOW (MT28F400B5) to allow for a selection of an 8- 39, 38, 37, 36, 6, 5, 4, 3, 6, 5, 4, 3, 2, bit byte from the 524,288 available.

36, 35, 34, 3 2, 1, 40, 13 1, 48, 17

31 – 45 DQ15 Input/ Data I/O: MSB of data when BYTE# = HIGH. Address Input: LSB

(A - 1) Output of address input when BYTE# = LOW during READ or WRITE

operation.

15, 17, 19, 25-28, 32-35 29, 31, 33, DQ0-DQ7 Input/ Data I/Os: Data output pins during any READ operation or 21, 24, 26, 35, 38, 40, Output data input pins during a WRITE. These pins are used to input

28, 30 42, 44 commands to the CEL.

16, 18, 20, – 30, 32, 34, DQ8-DQ14 Input/ Data I/Os: Data output pins during any READ operation or 22, 25, 27, 36, 39, 41, Output data input pins during a WRITE when BYTE# = HIGH. These

29 43 pins are High-Z when BYTE# is LOW.

11113V

Supply Write/Erase Supply Voltage: From a WRITE or ERASE CONFIRM

until completion of the WRITE or ERASE, VPP must be at V

PPH

(5V) or V

PPH

2 (12V)

. VPP = “Don’t Care” during all other

operations.

23 30, 31 37 V

Supply Power Supply: +5V ±10%.

13, 32 23, 39 27, 46 V

Supply Ground.

– 29, 37, 38 9, 10, 15, 16 NC – No Connect: These pins may be driven or left unconnected.

NOTE: 1. For SmartVoltage-compatible production programming, 12V VPP is supported for a maximum of 100 cycles and may

be connected for up to 100 cumulative hours.

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SMART 5 BOOT BLOCK FLASH MEMORY

NOTE: 1. L = VIL (LOW), H = VIH (HIGH), X = VIL or VIH (“Don’t Care”).

2. VPPH = VPPH1 = 5V.

3. Operation must be preceded by ERASE SETUP command.

4. Operation must be preceded by WRITE SETUP command.

5. The READ ARRAY command must be issued before reading the array after writing or erasing.

6. When WP# = VIH, RP# may be at VIH or VHH.

7. VHH = 12V.

8. VID = 12V; may also be read by issuing the IDENTIFY DEVICE command.

9. A1-A8, A10-A17 = VIL.

10. Value reflects DQ8-DQ15.

TRUTH TABLE (MT28F400B5)

FUNCTION RP# CE# OE# WE# WP# BYTE# A0 A9 VPPDQ0-DQ7 DQ8-DQ14 DQ15/A - 1

Standby H H X X X X X X X High-Z High-Z High-Z

RESET L X X X X X X X X High-Z High-Z High-Z

READ

READ (word mode) H L L H X H X X X Data-Out Data-Out Data-Out

READ (byte mode) H L L H X L X X X Data-Out High-Z A - 1

Output Disable H L H H X X X X X High-Z High-Z High-Z

WRITE/ERASE (EXCEPT BOOT BLOCK)

ERASE SETUP H L H L X X X X X 20H X X

ERASE CONFIRM

HLHLXXXXV

PPH

D0H X X

WRITE SETUP H L H L X X X X X 10H/40H X X

WRITE (word mode)

HLHLXHXXV

PPH

Data-In Data-In Data-In

WRITE (byte mode)

HLHLXLXXV

PPH

Data-In X A - 1

READ ARRAY

HLHLXXXXX FFH X X

WRITE/ERASE (BOOT BLOCK)

2, 7

ERASE SETUP H L H L X X X X X 20H X X

ERASE CONFIRM

LHLXXXXV

PPH

D0H X X

ERASE CONFIRM

3, 6

HLHLHXXXV

PPH

D0H X X

WRITE SETUP H L H L X X X X X 10H/40H X X

WRITE (word mode)

LHLXHXXV

PPH

Data-In Data-In Data-In

WRITE (word mode)

4, 6

HLHLHHXXV

PPH

Data-In Data-In Data-In

WRITE (byte mode)

LHLXLXXV

PPH

Data-In X A - 1

WRITE (byte mode)

4, 6

HLHLHLXXV

PPH

Data-In X A - 1

READ ARRAY

HLHLXXXXX FFH X X

DEVICE IDENTIFICATION

8, 9

Manufacturer Compatibility H L L H X H L V

X 89H 00H –

(word mode)

Manufacturer Compatibility H L L H X L L V

X 89H High-Z X

(byte mode)

Device (word mode, top boot)

HL LHXHHVIDX 70H 44H –

Device (byte mode, top boot) H L L H X L H V

X 70H High-Z X

Device (word mode, bottom boot)

HL LHXHHVIDX 71H 44H –

Device (byte mode, bottom boot) H L L H X L H V

X 71H High-Z X

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SMART 5 BOOT BLOCK FLASH MEMORY

NOTE: 1. L = VIL, H = VIH, X = VIL or VIH.

2. VPPH = VPPH1 = 5V.

3. Operation must be preceded by ERASE SETUP command.

4. Operation must be preceded by WRITE SETUP command.

5. The READ ARRAY command must be issued before reading the array after writing or erasing.

6. When WP# = VIH, RP# may be at VIH or VHH.

7. VHH = 12V.

8. VID = 12V; may also be read by issuing the IDENTIFY DEVICE command.

9. A1-A8, A10-A18 = VIL.

TRUTH TABLE (MT28F004B5)

FUNCTION RP# CE# OE# WE# WP# A0 A9 VPP DQ0-DQ7

Standby H H XXXXXXHigh-Z

RESET L XXXXXXXHigh-Z

READ

READ H L L H X X X X Data-Out

Output Disable H L H H X X X X High-Z

WRITE/ERASE (EXCEPT BOOT BLOCK)

ERASE SETUP H L H L X X X X 20H

ERASE CONFIRM

HLHLXXXVPPH D0H

WRITE SETUP H L H L X X X X 10H/40H

WRITE

HLHLXXXVPPH Data-In

READ ARRAY

HLHLXXXX FFH

WRITE/ERASE (BOOT BLOCK)

2, 7

ERASE SETUP H L H L X X X X 20H

ERASE CONFIRM

VHH LHL XXXVPPH D0H

ERASE CONFIRM

3, 6

HLHLHXXVPPH D0H

WRITE SETUP H L H L X X X X 10H/40H

WRITE

VHH LHL XXXVPPH Data-In

WRITE

4, 6

HLHLHXXVPPH Data-In

READ ARRAY

HLHLXXXX FFH

DEVICE IDENTIFICATION

8, 9

Manufacturer Compatibility H L L H X L VID X 89H

Device (top boot) H L L H X H VID X 78H

Device (bottom boot) H L L H X H VID X 79H

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SMART 5 BOOT BLOCK FLASH MEMORY

FUNCTIONAL DESCRIPTION

The MT28F004B5 and MT28F400B5 flash memory incorporate a number of features ideally suited for system firmware. The memory array is segmented into individual erase blocks. Each block may be erased without affecting data stored in other blocks. These memory blocks are read, written and erased with commands to the command execution logic (CEL). The CEL controls the operation of the internal state machine (ISM), which completely controls all WRITE, BLOCK ERASE and VERIFY operations. The ISM protects each memory location from over-erasure and optimizes each memory location for maximum data retention. In addition, the ISM greatly simplifies the control necessary for writing the device in-system or in an external programmer.

The Functional Description provides detailed information on the operation of the MT28F004B5 and MT28F400B5 and is organized into these sections:

• Overview

• Memory Architecture

• Output (READ) Operations

• Input Operations

• Command Set

• ISM Status Register

• Command Execution

• Error Handling

• WRITE/ERASE Cycle Endurance

• Power Usage

• Power-Up

OVERVIEW

SMART 5 TECHNOLOGY (B5)

Smart 5 technology allows maximum flexibility for in-system READ, WRITE and ERASE operations. For 5Vonly systems, WRITE and ERASE operations may be executed with a VPP voltage of 5V. Due to process technology advances, 5V VPP is optimal for application and production programming. For backward compatibility with SmartVoltage technology, 12V VPP is supported for a maximum of 100 cycles and may be connected for up to 100 cumulative hours. However, no performance increase will be realized. For any operation, VCC may be at 5V.

SEVEN INDEPENDENTLY ERASABLE MEMORY BLOCKS

The MT28F004B5 and MT28F400B5 are organized into seven independently erasable memory blocks that allow portions of the memory to be erased without affecting the rest of the memory data. A special boot block is hardware-protected against inadvertent erasure or writing by requiring either a super-voltage on

the RP# pin or driving the WP# pin HIGH. One of these two conditions must exist along with the VPP voltage (5V or 12V) on the V

PP pin before a WRITE or ERASE will

be performed on the boot block. The remaining blocks require that only the V

PP voltage be present on the VPP

pin before writing or erasing.

HARDWARE-PROTECTED BOOT BLOCK

This block of the memory array can be erased or

written only when the RP# pin is taken to V

HH or when

the WP# pin is brought HIGH. This provides additional security for the core firmware during in-system firmware updates should an unintentional power fluctuation or system reset occur. The MT28F004B5 and MT28F400B5 are available with the boot block starting at the bottom of the address space (“B” suffix) or the top of the address space (“T” suffix).

SELECTABLE BUS SIZE (MT28F400B5 ONLY)

The MT28F400B5 allows selection of an 8-bit (512K x 8) or 16-bit (256K x 16) data bus for reading and writing the memory. The BYTE# pin is used to select the bus width. In the x16 configuration, control data is read or written only on the lower eight bits (DQ0-DQ7).

Data written to the memory array utilizes all active data pins for the selected configuration. When the x8 configuration is selected, data is written in byte form; when the x16 configuration is selected, data is written in word form.

INTERNAL STATE MACHINE (ISM)

BLOCK ERASE and BYTE/WORD WRITE timing are simplified with an ISM that controls all erase and write algorithms in the memory array. The ISM ensures protection against overerasure and optimizes write margin to each cell.

During WRITE operations, the ISM automatically increments and monitors WRITE attempts, verifies write margin on each memory cell and updates the ISM status register. When BLOCK ERASE is performed, the ISM automatically overwrites the entire addressed block (eliminates overerasure), increments and monitors ERASE attempts, and sets bits in the ISM status register.

ISM STATUS REGISTER

The ISM status register allows an external processor to monitor the status of the ISM during WRITE and ERASE operations. Two bits of the 8-bit status register are set and cleared entirely by the ISM. These bits indicate whether the ISM is busy with a WRITE or ERASE task and when an ERASE has been suspended. Additional error information is set in three other bits: V

PP status, write status and erase status.

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SMART 5 BOOT BLOCK FLASH MEMORY

Figure 1

Memory Address Maps

Top Boot

MT28F004B5/400B5xx-xxT

Bottom Boot

MT28F004B5/400B5xx-xxB

3FFFFh

3E000h 3DFFFh

3D000h

3CFFFh

3C000h

3BFFFh

30000h

2FFFFh

20000h

1FFFFh

10000h

0FFFFh

00000h

16KB Boot Block

8KB Parameter Block

96KB Main Block

128KB Main Block

WORD ADDRESS

7FFFFh

7C000h 7BFFFh

7A000h

79FFFh

78000h

77FFFh

60000h

5FFFFh

40000h

3FFFFh

20000h

1FFFFh

00000h

BYTE ADDRESS

3FFFFh

30000h

2FFFFh

20000h

1FFFFh

10000h

0FFFFh

04000h

03FFFh

03000h

02FFFh

02000h

01FFFh

00000h

128KB Main Block

96KB Main Block

8KB Parameter Block

16KB Boot Block

WORD ADDRESS

7FFFFh

60000h

5FFFFh

40000h

3FFFFh

20000h

1FFFFh

08000h

07FFFh

06000h

05FFFh

04000h

03FFFh

00000h

BYTE ADDRESS

COMMAND EXECUTION LOGIC (CEL)

The CEL receives and interprets commands to the device. These commands control the operation of the ISM and the read path (i.e., memory array, ID register or status register). Commands may be issued to the CEL while the ISM is active. However, there are restrictions on what commands are allowed in this condition. See the Command Execution section for more detail.

DEEP POWER-DOWN MODE

To allow for maximum power conservation, the MT28F004B5 and MT28F400B5 feature a very low current, deep power-down mode. To enter this mode, the RP# pin is taken to VSS ±0.2V. In this mode, the current draw is a maximum of 20µA at 5V V

CC. Entering deep

power-down also clears the status register and sets the ISM to the read array mode.

MEMORY ARCHITECTURE

The MT28F004B5 and MT28F400B5 memory array architecture is designed to allow sections to be erased without disturbing the rest of the array. The array is divided into seven addressable blocks that vary in size and are independently erasable. When blocks rather than the entire array are erased, total device endurance

is enhanced, as is system flexibility. Only the ERASE function is block-oriented. All READ and WRITE operations are done on a random-access basis.

The boot block is protected from unintentional ERASE or WRITE with a hardware protection circuit which requires that a super-voltage be applied to RP# or that the WP# pin be driven HIGH before erasure is commenced. The boot block is intended for the core firmware required for basic system functionality. The remaining six blocks do not require that either of these two conditions be met before WRITE or ERASE operations.

BOOT BLOCK

The hardware-protected boot block provides extra security for the most sensitive portions of the firmware. This 16KB block may only be erased or written when the RP# pin is at the specified boot block unlock voltage (VHH) of 12V or when the WP# pin is VIH. During a WRITE or ERASE of the boot block, the RP# pin must be held at VHH or the WP# pin held HIGH until the ERASE or WRITE is completed. The VPP pin must be at VPPH (5V or 12V) when the boot block is written to or erased.

Page 9

4Mb

SMART 5 BOOT BLOCK FLASH MEMORY

After power-up or RESET, the device will automatically be in the array read mode. All commands and their operations are covered in the Command Set and Command Execution sections.

STATUS REGISTER

Performing a READ of the status register requires the same input sequencing as a READ of the array except that the address inputs are “Don’t Care.” The status register contents are always output on DQ0-DQ7, regardless of the condition of BYTE# on the MT28F400B5. DQ8-DQ15 are LOW when BYTE# is HIGH, and DQ8DQ14 are High-Z when BYTE# is LOW. Data from the status register is latched on the falling edge of OE# or CE#, whichever occurs last. If the contents of the status register change during a READ of the status register, either OE# or CE# may be toggled while the other is held LOW to update the output.

Following a WRITE or ERASE, the device automatically enters the status register read mode. In addition, a READ during a WRITE or ERASE will produce the status register contents on DQ0-DQ7. When the device is in the erase suspend mode, a READ operation will produce the status register contents until another command is issued, while in certain other modes, READ STATUS REGISTER may be given to return to the status register read mode. All commands and their operations are covered in the Command Set and Command Execution sections.

IDENTIFICATION REGISTER

A READ of the two 8-bit device identification registers requires the same input sequencing as a READ of the array. WE# must be HIGH, and OE# and CE# must be LOW. However, ID register data is output only on DQ0-DQ7, regardless of the condition of BYTE# on the MT28F400B5. A0 is used to decode between the two bytes of the device ID register; all other address inputs are “Don’t Care.” When A0 is LOW, the manufacturer compatibility ID is output, and when A0 is HIGH, the device ID is output. DQ8-DQ15 are High-Z when BYTE# is LOW. When BYTE# is HIGH, DQ8-DQ15 are 00H when the manufacturer compatibility ID is read and 44H when the device ID is read.

To get to the identification register read mode, READ IDENTIFICATION may be issued while the device is in certain other modes. In addition, the identification register read mode can be reached by applying a super-voltage (VID) to the A9 pin. Using this method, the ID register can be read while the device is in any mode. Once A9 is returned to VIL or VIH, the device will return to the previous mode.

The MT28F004B5 and MT28F400B5 are available in two configurations and top or bottom boot block. The top boot block version supports processors of the x86 variety. The bottom boot block version is intended for 680X0 and RISC applications. Figure 1 illustrates the memory address maps associated with these two versions.

PARAMETER BLOCKS

The two 8KB parameter blocks store less sensitive and more frequently changing system parameters and also may store configuration or diagnostic coding. These blocks are enabled for erasure when the VPP pin is at VPPH. No super-voltage unlock or WP# control is required.

MAIN MEMORY BLOCKS

The four remaining blocks are general-purpose memory blocks and do not require a super-voltage on RP# or WP# control to be erased or written. These blocks are intended for code storage, ROM-resident applications or operating systems that require insystem update capability.

OUTPUT (READ) OPERATIONS

The MT28F004B5 and MT28F400B5 feature three different types of READs. Depending on the current mode of the device, a READ operation will produce data from the memory array, status register or device identification register. In each of these three cases, the WE#, CE# and OE# inputs are controlled in a similar manner. Moving between modes to perform a specific READ is covered in the Command Execution section.

MEMORY ARRAY

To read the memory array, WE# must be HIGH, and OE# and CE# must be LOW. Valid data will be output on the DQ pins once these conditions have been met and a valid address is given. Valid data will remain on the DQ pins until the address changes, or until OE# or CE# goes HIGH, whichever occurs first. The DQ pins will continue to output new data after each address transition as long as OE# and CE# remain LOW.

The MT28F400B5 features selectable bus widths. When the memory array is accessed as a 256K x 16, BYTE# is HIGH, and data will be output on DQ0-DQ15. To access the memory array as a 512K x 8, BYTE# must be LOW, DQ8-DQ14 are High-Z, and all data is output on DQ0-DQ7. The DQ15/(A - 1) pin becomes the lowest order address input so that 524,288 locations can be read.

Page 10

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SMART 5 BOOT BLOCK FLASH MEMORY

INPUT OPERATIONS

The DQ pins are used either to input data to the array or to input a command to the CEL. A command input issues an 8-bit command to the CEL to control the mode of operation of the device. A WRITE is used to input data to the memory array. The following section describes both types of inputs. More information describing how to use the two types of inputs to write or erase the device is provided in the Command Execution section.

COMMANDS

To perform a command input, OE# must be HIGH, and CE# and WE# must be LOW. Addresses are “Don’t Care” but must be held stable, except during an ERASE CONFIRM (described in a later section). The 8-bit command is input on DQ0-DQ7, while DQ8-DQ15 are “Don’t Care” on the MT28F400B5. The command is latched on the rising edge of CE# (CE#-controlled) or WE# (WE#-controlled), whichever occurs first. The condition of BYTE# on the MT28F400B5 has no effect on a command input.

MEMORY ARRAY

A WRITE to the memory array sets the desired bits to logic 0s but cannot change a given bit to a logic 1 from a logic 0. Setting any bits to a logic 1 requires that the entire block be erased. To perform a WRITE, OE# must be HIGH, CE# and WE# must be LOW, and VPP must be set to VPPH1 or VPPH2. Writing to the boot block also requires that the RP# pin be at VHH or WP# be HIGH. A0A17/(A18) provide the address to be written, while the data to be written to the array is input on the DQ pins. The data and addresses are latched on the rising edge of CE# (CE#-controlled) or WE# (WE#-controlled), whichever occurs first. A WRITE must be preceded by a WRITE SETUP command. Details on how to input data to the array will be covered in the Write Sequence section.

Selectable bus sizing applies to WRITEs as it does to READs on the MT28F400B5. When BYTE# is LOW (byte mode), data is input on DQ0-DQ7, DQ8-DQ14 are High-Z and DQ15 becomes the lowest order address input. When BYTE# is HIGH (word mode), data is input on DQ0-DQ15.

Table 1

Command Set

COMMAND HEX CODE DESCRIPTION

RESERVED 00H This command and all unlisted commands are invalid and should not

be called. These commands are reserved to allow for future feature enhancements.

READ ARRAY FFH Must be issued after any other command cycle before the array can be

read. It is not necessary to issue this command after power-up or RESET.

IDENTIFY DEVICE 90H Allows the device ID and manufacturer compatibility ID to be read. A0 is

used to decode between the manufacturer compatibility ID (A0 = LOW) and device ID (A0 = HIGH).

READ STATUS REGISTER 70H Allows the status register to be read. Please refer to Table 2 for more

information on the status register bits.

CLEAR STATUS REGISTER 50H Clears status register bits 3-5, which cannot be cleared by the ISM.

ERASE SETUP 20H The first command given in the two-cycle ERASE sequence. The ERASE will

not be completed unless followed by ERASE CONFIRM.

ERASE CONFIRM/RESUME D0H The second command given in the two-cycle ERASE sequence. Must follow

an ERASE SETUP command to be valid. Also used during an ERASE SUSPEND to resume the ERASE.

WRITE SETUP 40H or The first command given in the two-cycle WRITE sequence. The write

10H data and address are given in the following cycle to complete the WRITE.

ERASE SUSPEND B0H Requests a halt of the ERASE and puts the device into the erase suspend

mode. When the device is in this mode, only READ STATUS REGISTER, READ ARRAY and ERASE RESUME commands may be executed.

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SMART 5 BOOT BLOCK FLASH MEMORY

COMMAND SET

To simplify writing of the memory blocks, the MT28F004B5 and MT28F400B5 incorporate an ISM that controls all internal algorithms for the WRITE and ERASE cycles. An 8-bit command set is used to control the device. Details on how to sequence commands are provided in the Command Execution section. Table 1 lists the valid commands.

ISM STATUS REGISTER

The 8-bit ISM status register (see Table 2) is polled to check for WRITE or ERASE completion or any related errors. During or following a WRITE, ERASE or ERASE SUSPEND, a READ operation will output the status register contents on DQ0-DQ7 without prior command. While the status register contents are read, the outputs will not be updated if there is a change in the

ISM status unless OE# or CE# is toggled. If the device is not in the write, erase, erase suspend or status register read mode, READ STATUS REGISTER (70H) can be issued to view the status register contents.

All of the defined bits are set by the ISM, but only the ISM and erase suspend status bits are reset by the ISM. The erase, write and V

PP status bits must be cleared

using CLEAR STATUS REGISTER. If the VPP status bit (SR3) is set, the CEL will not allow further WRITE or ERASE operations until the status register is cleared. This allows the user to choose when to poll and clear the status register. For example, the host system may perform multiple BYTE WRITE operations before checking the status register instead of checking after each individual WRITE. Asserting the RP# signal or powering down the device will also clear the status register.

Table 2

Status Register

STATUS

BIT # STATUS REGISTER BIT DESCRIPTION

SR7 ISM STATUS The ISMS bit displays the active status of the state machine during

1 = Ready WRITE or BLOCK ERASE operations. The controlling logic polls this 0 = Busy bit to determine when the erase and write status bits are valid.

SR6 ERASE SUSPEND STATUS Issuing an ERASE SUSPEND places the ISM in the suspend mode

1 = ERASE suspended and sets this and the ISMS bit to “1.” The ESS bit will remain “1” until 0 = ERASE in progress/completed an ERASE RESUME is issued.

SR5 ERASE STATUS ES is set to “1” after the maximum number of ERASE cycles is

1 = BLOCK ERASE error executed by the ISM without a successful verify. ES is only cleared 0 = Successful BLOCK ERASE by a CLEAR STATUS REGISTER command or after a RESET.

SR4 WRITE STATUS WS is set to “1” after the maximum number of WRITE cycles is

1 = WORD/BYTE WRITE error executed by the ISM without a successful verify. WS is only cleared 0 = Successful WORD/ by a CLEAR STATUS REGISTER command or after a RESET.

BYTE WRITE

SR3 VPP STATUS VPPS detects the presence of a VPP voltage. It does not monitor V

1 = No VPP voltage detected continuously, nor does it indicate a valid VPP voltage. The VPP pin is 0 = VPP present sampled for 5V after WRITE or ERASE CONFIRM is given. VPPS must be

cleared by CLEAR STATUS REGISTER or by a RESET.

SR0-2 RESERVED Reserved for future use.

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SMART 5 BOOT BLOCK FLASH MEMORY

COMMAND EXECUTION

Commands are issued to bring the device into different operational modes. Each mode allows specific operations to be performed. Several modes require a sequence of commands to be written before they are reached. The following section describes the properties of each mode, and Table 3 lists all command sequences required to perform the desired operation.

READ ARRAY

The array read mode is the initial state of the device upon power-up and after a RESET. If the device is in any other mode, READ ARRAY (FFH) must be given to return to the array read mode. Unlike the WRITE SETUP command (40H), READ ARRAY does not need to be given before each individual read access.

IDENTIFY DEVICE

IDENTIFY DEVICE (90H) may be written to the CEL to enter the identify device mode. While the device is in this mode, any READ will produce the device ID when A0 is HIGH and manufacturer compatibility ID when A0 is LOW. The device will remain in this mode until another command is given.

Table 3

Command Sequences

BUS 1ST 2ND

CYCLES CYCLE CYCLE

COMMANDS REQ’D OPERATION ADDRESS DATA OPERATION ADDRESS DATA NOTES

READ ARRAY 1 WRITE X FFH 1

IDENTIFY DEVICE 3 WRITE X 90H READ IA ID 2, 3

READ STATUS REGISTER 2 WRITE X 70H READ X SRD 4

CLEAR STATUS REGISTER 1 WRITE X 50H

ERASE SETUP/CONFIRM 2 WRITE X 20H WRITE BA D0H 5, 6

ERASE SUSPEND/RESUME 2 WRITE X B0H WRITE X D0H

WRITE SETUP/WRITE 2 WRITE X 40H WRITE WA WD 6, 7

ALTERNATE WORD/BYTE 2 WRITE X 10H WRITE WA WD 6, 7 WRITE

NOTE: 1. Must follow WRITE or ERASE CONFIRM commands to the CEL in order to enable flash array READ cycles.

2. IA = Identify Address: 00H for manufacturer compatibility ID; 01H for device ID.

3. ID = Identify Data.

4. SRD = Status Register Data.

5. On x16 (X00) devices BA = Block Address (A12-A17), on x8 (00X) devices BA = Block Address (A13-A18).

6. Addresses are “Don’t Care” in first cycle but must be held stable.

7. WA = Address to be written; WD = Data to be written to WA.

WRITE SEQUENCE

Two consecutive cycles are needed to write data to the array. WRITE SETUP (40H or 10H) is given in the first cycle. The next cycle is the WRITE, during which the write address and data are issued and VPP is brought to VPPH. Writing to the boot block also requires that the RP# pin be brought to VHH or that the WP# pin be brought HIGH at the same time VPP is brought to VPPH. The ISM will now begin to write the word or byte. VPP must be held at VPPH until the WRITE is completed (SR7 = 1).

While the ISM executes the WRITE, the ISM status bit (SR7) will be at “0,” and the device will not respond to any commands. Any READ operation will produce the status register contents on DQ0-DQ7. When the ISM status bit (SR7) is set to a logic 1, the WRITE has been completed, and the device will go into the status register read mode until another command is given.

After the ISM has initiated the WRITE, it cannot be aborted except by a RESET or by powering down the part. Doing either during a WRITE will corrupt the data being written. If only the WRITE SETUP command has been given, the WRITE may be nullified by performing

Page 13

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SMART 5 BOOT BLOCK FLASH MEMORY

a null WRITE. To execute a null WRITE, FFH must be written when BYTE# is LOW, or FFFFH must be written when BYTE# is HIGH. Once the ISM status bit (SR7) has been set, the device will be in the status register read mode until another command is issued.

ERASE SEQUENCE

Executing an ERASE sequence will set all bits within a block to logic 1. The command sequence necessary to execute an ERASE is similar to that of a WRITE. To provide added security against accidental block erasure, two consecutive command cycles are required to initiate an ERASE of a block. In the first cycle, addresses are “Don’t Care,” and ERASE SETUP (20H) is given. In the second cycle, V

PP must be brought to VPPH, an

address within the block to be erased must be issued, and ERASE CONFIRM (D0H) must be given. If a command other than ERASE CONFIRM is given, the write and erase status bits (SR4 and SR5) will be set, and the device will be in the status register read mode.

After the ERASE CONFIRM (D0H) is issued, the ISM will start the ERASE of the addressed block. Any READ operation will output the status register contents on DQ0-DQ7. V

PP must be held at VPPH until the ERASE is

completed (SR7 = 1). Once the ERASE is completed, the device will be in the status register read mode until another command is issued. Erasing the boot block also

requires that either the RP# pin be set to VHH or the WP# pin be held HIGH at the same time VPP is set to VPPH.

ERASE SUSPENSION

The only command that may be issued while an ERASE is in progress is ERASE SUSPEND. This command allows other commands to be executed while pausing the ERASE in progress. Once the device has reached the erase suspend mode, the erase suspend status bit (SR6) and ISM status bit (SR7) will be set. The device may now be given a READ ARRAY, ERASE RESUME or READ STATUS REGISTER command. After READ ARRAY has been issued, any location not within the block being erased may be read. If ERASE RESUME is issued before SR6 has been set, the device will immediately proceed with the ERASE in progress.

ERROR HANDLING

After the ISM status bit (SR7) has been set, the VPP (SR3), write (SR4) and erase (SR5) status bits may be checked. If one or a combination of these three bits has been set, an error has occurred. The ISM cannot reset these three bits. To clear these bits, CLEAR STATUS REGISTER (50H) must be given. If the VPP status bit (SR3) is set, further WRITE or ERASE operations cannot resume until the status register is cleared. Table 4 lists the combination of errors.

Table 4

Status Register Error Decode

STATUS BITS

SR5 SR4 SR3 ERROR DESCRIPTION

0 0 0 No errors

001VPP voltage error

0 1 0 WRITE error

0 1 1 WRITE error, VPP voltage not valid at time of WRITE

1 0 0 ERASE error

1 0 1 ERASE error, VPP voltage not valid at time of ERASE CONFIRM

1 1 0 Command sequencing error or WRITE/ERASE error

1 1 1 Command sequencing error, VPP voltage error, with WRITE and ERASE errors

NOTE: 1. SR3-SR5 must be cleared using CLEAR STATUS REGISTER.

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SMART 5 BOOT BLOCK FLASH MEMORY

WRITE/ERASE CYCLE ENDURANCE

The MT28F004B5 and MT28F400B5 are designed and fabricated to meet advanced firmware storage requirements. To ensure this level of reliability, VPP must be at 5V ±10% during WRITE or ERASE cycles. Due to process technology advances, 5V VPP is optimal for application and production programming. For backward compatibility with SmartVoltage technology, 12V VPP is supported for a maximum of 100 cycles and may be connected for up to 100 cumulative hours. Operation outside these limits may reduce the number of WRITE and ERASE cycles that can be performed on the device.

POWER USAGE

The MT28F004B5 and MT28F400B5 offer several power-saving features that may be utilized in the array read mode to conserve power. Deep power-down mode is enabled by bringing RP# LOW. Current draw (ICC) in this mode is a maximum of 20µA at 5V VCC. When CE# is HIGH, the device will enter standby mode. In this mode, maximum ICC current is 130µA at 5V. If CE# is brought HIGH during a WRITE or ERASE, the ISM will continue to operate, and the device will consume the respective active power until the WRITE or ERASE is completed.

POWER-UP

The likelihood of unwanted WRITE or ERASE operations is minimized since two consecutive cycles are required to execute either operation. However, to reset the ISM and to provide additional protection while V

is ramping, one of the following conditions must be met:

• RP# must be held LOW until VCC is at valid functional level; or

• CE# or WE# may be held HIGH and RP# must be toggled from V

CC-GND-VCC.

After a power-up or RESET, the status register is reset,

and the device will enter the array read mode.

Figure 2

Power-Up/Reset Timing Diagram

VALID

(5V)

Data

Address

UNDEFINED

Note 1

RP#

RWH

NOTE: 1. VCC must be within the valid operating range before RP#

goes HIGH.

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SMART 5 BOOT BLOCK FLASH MEMORY

YES

WRITE 40h or 10h

VPP = 5V

Start

WRITE Word or Byte

Address/Data

STATUS REGISTER

READ

SR7 = 1?

Complete Status Check (optional)

WRITE Complete

Start (WRITE completed)

YES

SR4 = 0?

SR3 = 0?

YES

BYTE/WORD WRITE Error

WRITE Successful

V Error

4, 5

COMPLETE WRITE STATUS-CHECK

SEQUENCE

SELF-TIMED WRITE SEQUENCE

(WORD or BYTE WRITE)

NOTE: 1. Sequence may be repeated for additional BYTE or WORD WRITEs.

2. Complete status check is not required. However, if SR3 = 1, further WRITEs are inhibited until the status register is cleared.

3. Device will be in status register read mode. To return to the array read mode, the FFH command must be issued.

4. If SR3 is set during a WRITE or BLOCK ERASE attempt, CLEAR STATUS REGISTER must be issued before further WRITE or ERASE operations are allowed by the CEL.

5. Status register bits 3-5 must be cleared using CLEAR STATUS REGISTER.

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SMART 5 BOOT BLOCK FLASH MEMORY

Start (ERASE completed)

YES

SR4, 5 = 1?

SR3 = 0?

YES

Command Sequence Error

SR5 = 0?

V ErrorPP

BLOCK ERASE Error

5, 6

ERASE Successful

YES

VPP = 5V

Complete Status Check (optional)

ERASE Complete

YES

Suspend ERASE?

STATUS REGISTER

READ

SR7 = 1?

WRITE 20h

Start

WRITE D0h,

Block Address

Suspend

Sequence

ERASE Resumed

ERASE

Busy

SELF-TIMED BLOCK ERASE SEQUENCE

COMPLETE BLOCK ERASE

STATUS-CHECK SEQUENCE

NOTE: 1. Sequence may be repeated to erase additional blocks.

2. Complete status check is not required. However, if SR3 = 1, further ERASEs are inhibited until the status register is cleared.

3. To return to the array read mode, the FFH command must be issued.

4. Refer to the ERASE SUSPEND flowchart for more information.

5. If SR3 is set during a WRITE or BLOCK ERASE attempt, CLEAR STATUS REGISTER must be issued before further WRITE or ERASE operations are allowed by the CEL.

6. Status register bits 3-5 must be cleared using CLEAR STATUS REGISTER.

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SMART 5 BOOT BLOCK FLASH MEMORY

ERASE SUSPEND/RESUME SEQUENCE

WRITE B0h

(ERASE SUSPEND)

Start (ERASE in progress)

WRITE FFh

(READ ARRAY)

STATUS REGISTER

READ

YES

SR6 = 1?

SR7 = 1?

YES

Done

Reading?

WRITE D0h

(ERASE RESUME)

Resume ERASE

ERASE Completed

VPP = 5V

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SMART 5 BOOT BLOCK FLASH MEMORY

ABSOLUTE MAXIMUM RATINGS*

Voltage on VCC Supply

Relative to VSS ............................... -0.5V to +6V**

Input Voltage Relative to VSS ............... -0.5V to +6V**

PP Voltage Relative to VSS ................ -0.5V to +12.6V

†

RP# or A9 Pin Voltage

Relative to VSS ............................ -0.5V to +12.6V

†

Temperature Under Bias ...................... -40°C to +85°C

Storage Temperature (plastic) ............-55°C to +125°C

Power Dissipation ................................................... 1W

*Stresses greater than those listed under “Absolute Maximum Ratings” may cause permanent damage to the device. This is a stress rating only, and functional operation of the device at these or any other conditions above those indicated in the operational sections of this specification is not implied. Exposure to absolute maximum rating conditions for extended periods may affect reliability. **VCC, input and I/O pins may transition to -2V for <20ns and VCC + 2V for <20ns.

†

Voltage may pulse to -2V for <20ns and 14V for <20ns.

ELECTRICAL CHARACTERISTICS AND RECOMMENDED DC READ OPERATING CONDITIONS

Commercial Temperature (0°C ≤ TA ≤ +70°C) and Extended Temperature (-40°C ≤ TA ≤ +85°C)

PARAMETER/CONDITION SYMBOL MIN MAX UNITS NOTES

5V Supply Voltage VCC 4.5 5.5 V 1

Input High (Logic 1) Voltage, all inputs VIH 2VCC + 0.5 V 1

Input Low (Logic 0) Voltage, all inputs VIL -0.5 0.8 V 1

Device Identification Voltage, A9 VID 11.4 12.6 V 1

VPP Supply Voltage VPP -0.5 12.6 V 1

DC OPERATING CHARACTERISTICS

Commercial Temperature (0°C ≤ TA ≤ +70°C) and Extended Temperature (-40°C ≤ TA ≤ +85°C)

PARAMETER/CONDITION SYMBOL MIN MAX UNITS NOTES

OUTPUT VOLTAGE LEVELS (TTL) VOH1 2.4 – V Output High Voltage (IOH = -2.5mA) 1 Output Low Voltage (IOL = 5.8mA) VOL – 0.45 V

OUTPUT VOLTAGE LEVELS (CMOS) VOH2 VCC - 0.4 – V 1 Output High Voltage (IOH = -100µA)

INPUT LEAKAGE CURRENT Any input (0V ≤ VIN ≤ VCC); IL -1 1 µA All other pins not under test = 0V

INPUT LEAKAGE CURRENT: A9 INPUT IID – 500 µA (11.4V ≤ A9 ≤ 12.6 = VID)

INPUT LEAKAGE CURRENT: RP# INPUT IHH – 500 µA (11.4V ≤ RP# ≤ 12.6 = VHH)

OUTPUT LEAKAGE CURRENT IOZ -10 10 µA (DOUT is disabled; 0V ≤ VOUT ≤ VCC)

NOTE: 1. All voltages referenced to VSS.

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SMART 5 BOOT BLOCK FLASH MEMORY

CAPACITANCE

(TA = 25°C; f = 1 MHz)

PARAMETER/CONDITION SYMBOL MAX UNITS NOTES

Input Capacitance CI 8pF

Output Capacitance CO 12 pF

READ AND STANDBY CURRENT DRAIN

Commercial Temperature (0°C ≤ TA ≤ +70°C) and Extended Temperature (-40°C ≤ TA ≤ +85°C)

PARAMETER/CONDITION SYMBOL MAX UNITS NOTES

READ CURRENT: WORD-WIDE, TTL INPUT LEVELS ICC1 55 mA 1, 2 (CE# = VIL; OE# = VIH; f = 10 MHz; Other inputs = VIL or VIH; RP# = VIH)

READ CURRENT: WORD-WIDE, CMOS INPUT LEVELS (CE# ≤ 0.2V; OE# • VCC - 0.2V; f = 10 MHz; Other inputs ≤ 0.2V ICC2 50 mA 1, 2 or • VCC - 0.2V; RP# • VCC - 0.2V)

READ CURRENT: BYTE-WIDE, TTL INPUT LEVELS ICC3 55 mA 1, 2 (CE# = VIL; OE# = VIH; f = 10 MHz; Other inputs = VIL or VIH; RP# = VIH)

READ CURRENT: BYTE-WIDE, CMOS INPUT LEVELS (CE# ≤ 0.2V; OE# • VCC - 0.2V; f = 10 MHz; Other inputs ≤ 0.2V ICC4 50 mA 1, 2 or • VCC - 0.2V; RP# = VCC - 0.2V)

STANDBY CURRENT: TTL INPUT LEVELS VCC power supply standby current ICC5 2mA (CE# = RP# = VIH; Other inputs = VIL or VIH)

STANDBY CURRENT: CMOS INPUT LEVELS VCC power supply standby current ICC6 130 µA (CE# = RP# = VCC - 0.2V)

DEEP POWER-DOWN CURRENT: VCC SUPPLY (RP# = VSS ±0.2V) ICC8 20 µA

STANDBY OR READ CURRENT: VPP SUPPLY (VPP ≤ 5.5V) IPP1 ±15 µA

DEEP POWER-DOWN CURRENT: VPP SUPPLY (RP# = VSS ±0.2V) IPP2 5µA

NOTE: 1. ICC is dependent on cycle rates.

2. ICC is dependent on output loading. Specified values are obtained with the outputs open.

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SMART 5 BOOT BLOCK FLASH MEMORY

READ TIMING PARAMETERS ELECTRICAL CHARACTERISTICS AND RECOMMENDED AC OPERATING CONDITIONS TEST CONDITION 1

Commercial Temperature (0°C ≤ TA ≤ +70°C) and Extended Temperature (-40°C ≤ TA ≤ +85°C); VCC = +5V ±10%

AC CHARACTERISTICS -6 -8/-8 ET PARAMETER SYMBOL MIN MAX MIN MAX UNITS NOTES

READ cycle time

RC 70 80 ns 1

Access time from CE#

ACE 70 80 ns 1, 2

Access time from OE#

AOE 35 40 ns 1, 2

Access time from address

AA 70 80 ns 1

RP# HIGH to output valid delay

RWH 500 500 ns 1

OE# or CE# HIGH to output in High-Z

OD 20 20 ns 1

Output hold time from OE#, CE# or address change

OH 0 0 ns 1

RP# LOW pulse width

RP 60 60 ns 1

TEST CONDITION 2

(0°C ≤ TA ≤ +70°C; VCC = +5V ±5%)

AC CHARACTERISTICS -6 PARAMETER SYMBOL MIN MAX UNITS NOTES

READ cycle time

RC 60 ns 3

Access time from CE#

ACE 60 ns 2, 3

Access time from OE#

AOE 30 ns 2, 3

Access time from address

AA 60 ns 3

RP# HIGH to output valid delay

RWH 500 ns 3

OE# or CE# HIGH to output in High-Z

OD 15 ns 3

Output hold time from OE#, CE# or address change

OH 0 ns 3

RP# LOW pulse width

RP 60 ns 3

NOTE: 1. Measurements tested under AC Test Condition 1.

2. OE# may be delayed by tACE minus tAOE after CE# falls before tACE is affected.

3. Measurements tested under AC Test Condition 2.

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SMART 5 BOOT BLOCK FLASH MEMORY

TIMING PARAMETERS

Commercial Temperature (0°C ≤ TA ≤ +70°C) Extended Temperature (-40°C ≤ TA ≤ +85°C)

-6 -8/-8 ET

SYMBOL MIN MAX MIN MAX UNITS

tRC3

70 80 ns

tRC4

60 – ns

ACE

70 80 ns

ACE

60 – ns

AOE

35 40 ns

AOE

30 – ns

tAA3

70 80 ns

AC TEST CONDITION 1

Input pulse levels ............................................... 0.4V to 2.4V

Input rise and fall times ................................................ <10ns

Input timing reference level .............................. 0.8V and 2V

Output timing reference level ........................... 0.8V and 2V

Output load ................................. 1 TTL gate and C

L = 100pF

AC TEST CONDITION 2

Input pulse levels ..................................................... 0V to 3V

Input rise and fall times ................................................ <10ns

Input timing reference level ........................................... 1.5V

Output timing reference level ........................................ 1.5V

Output load ................................... 1 TTL gate and C

L = 50pF

WORD-WIDE READ CYCLE

1, 2

VALID DATA

VALID ADDRESS

CE#

A0–A17/(A18)

OE#

DQ0–DQ15

ACE

AOE

WE#

RP#

RWH

DON’T CARE

UNDEFINED

NOTE: 1. BYTE# = HIGH (MT28F400B5 only).

2. Applies to MT28F400B5 only.

3. Measurements tested under AC Test Condition 1, VCC = 5V ±10%.

4. Measurements tested under AC Test Condition 2, VCC = 5V ±5%.

-6 -8/-8 ET

SYMBOL MIN MAX MIN MAX UNITS

tAA4

60 – ns

RWH

500 500 ns

RWH

500 – ns

tOD3

20 20 ns

tOD4

15 – ns

tOH3

00ns

tOH4

0–ns

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SMART 5 BOOT BLOCK FLASH MEMORY

BYTE-WIDE READ CYCLE

VALID DATA

VALID ADDRESS

CE#

(A - 1)–A17/(A18)

OE#

DQ0–DQ7

DON’T CARE

UNDEFINED

ACE

AOE

WE#

RP#

RWH

DQ8–DQ14

HIGH-Z

NOTE: 1. BYTE# = LOW (MT28F400B5 only).

2. Applies to MT28F400B5 only.

3. Measurements tested under AC Test Condition 1, VCC = 5V ±10%.

4. Measurements tested under AC Test Condition 2, VCC = 5V ±5%.

TIMING PARAMETERS

Commercial Temperature (0°C ≤ TA ≤ +70°C) Extended Temperature (-40°C ≤ TA ≤ +85°C)

-6 -8/-8 ET

SYMBOL MIN MAX MIN MAX UNITS

tRC3

70 80 ns

tRC4

60 – ns

ACE

70 80 ns

ACE

60 – ns

AOE

35 40 ns

AOE

30 – ns

tAA3

70 80 ns

-6 -8/-8 ET

SYMBOL MIN MAX MIN MAX UNITS

tAA4

60 – ns

RWH

500 500 ns

RWH

500 – ns

tOD3

20 20 ns

tOD4

15 – ns

tOH3

00ns

tOH4

0–ns

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WRITE/ERASE CURRENT DRAIN

Commercial Temperature (0°C ≤ TA ≤ +70°C) and Extended Temperature (-40°C ≤ TA ≤ +85°C); VCC = +5V ±10%

PARAMETER/CONDITION SYMBOL MAX UNITS NOTES

WORD WRITE CURRENT: VCC SUPPLY ICC9 25 mA 5

WORD WRITE CURRENT: VPP SUPPLY IPP4 20 mA 5

BYTE WRITE CURRENT: VCC SUPPLY ICC10 25 mA 6

BYTE WRITE CURRENT: VPP SUPPLY IPP5 20 mA 6

ERASE CURRENT: VCC SUPPLY ICC11 30 mA

ERASE CURRENT: VPP SUPPLY IPP6 40 mA

ERASE SUSPEND CURRENT: VCC SUPPLY ICC12 10 mA 7 (ERASE suspended)

ERASE SUSPEND CURRENT: VPP SUPPLY IPP7 200 µA (ERASE suspended)

RECOMMENDED DC WRITE/ERASE CONDITIONS

Commercial Temperature (0°C ≤ T

≤ +70°C) and Extended Temperature (-40°C ≤ TA ≤ +85°C); VCC = +5V ±10%

PARAMETER/CONDITION SYMBOL MIN MAX UNITS NOTES

VPP WRITE/ERASE lockout voltage VPPLK – 1.5 V 2

VPP voltage during WRITE/ERASE operation VPPH1 4.5 5.5 V 3

VPP voltage during WRITE/ERASE operation VPPH2 11.4 12.6 V 4

Boot block unlock voltage VHH 11.4 12.6 V

VCC WRITE/ERASE lockout voltage VLKO 2–V

NOTE: 1. WRITE operations are tested at VCC/VPP voltages equal to or less than the previous ERASE, and READ operations are

tested at VCC voltages equal to or less than the previous WRITE.

2. Absolute WRITE/ERASE protection when VPP ≤ VPPLK.

3. When 5V VCC and VPP are used, VCC cannot exceed VPP by more than 500mV during WRITE and ERASE operations.

4. For SmartVoltage-compatible production programming, 12V VPP is supported for a maximum of 100 cycles and may be connected for up to 100 cummulative hours.

5. Applies to MT28F400B5 only.

6. Applies to MT28F004B5 and MT28F400B5 with BYTE = LOW.

7. Parameter is specified when device is not accessed. Actual current draw will be ICC12 (5V VCC) plus read current if a READ is executed while the device is in erase suspend mode.

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SPEED-DEPENDENT WRITE/ERASE AC TIMING CHARACTERISTICS AND RECOMMENDED AC OPERATING CONDITIONS TEST CONDITION 1

Commercial Temperature (0°C ≤ TA ≤ +70°C) and Extended Temperature (-40°C ≤ TA ≤ +85°C); VCC = +5V ±10%

AC CHARACTERISTICS -6 -8/-8 ET PARAMETER SYMBOL MIN MAX MIN MAX UNITS NOTES

WRITE cycle time

WC 70 80 ns

WE# HIGH pulse width

WPH 20 30 ns

CE# HIGH pulse width

CPH 20 30 ns

CE# pulse width

CP 50 50 ns

WE# pulse width

WP 50 50 ns

TEST CONDITION 2

(0°C ≤ TA ≤ +70°C; VCC = +5V ±5%)

AC CHARACTERISTICS -6 PARAMETER SYMBOL MIN MAX UNITS NOTES

WRITE cycle time

WC 60 ns

WE# HIGH pulse width

WPH 20 ns

CE# HIGH pulse width

CPH 20 ns

CE# pulse width

CP 50 ns

WE# pulse width

WP 50 ns

Page 25

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SPEED-DEPENDENT WRITE/ERASE AC TIMING CHARACTERISTICS AND RECOMMENDED AC OPERATING CONDITIONS: WE#-CONTROLLED WRITES

Commercial Temperature (0°C ≤ TA ≤ +70°C) and Extended Temperature (-40°C ≤ TA ≤ +85°C); VCC = +5V ±10% or +5V ±5%

AC CHARACTERISTICS -6/-8/-8 ET PARAMETER SYMBOL MIN MAX UNITS NOTES

Address setup time to WE# HIGH

AS 50 ns

Address hold time from WE# HIGH

AH 0 ns

Data setup time to WE# HIGH

DS 50 ns

Data hold time from WE# HIGH

DH 0 ns

CE# setup time to WE# LOW

CS 0 ns

CE# hold time from WE# HIGH

CH 0 ns

VPP setup time to WE# HIGH

VPS1 200 ns 1

RP# HIGH to WE# LOW delay

RS 500 ns

RP# at VHH or WP# HIGH setup time to WE# HIGH

RHS 100 ns 2

WRITE duration (WORD or BYTE WRITE)

WED1 6 µs 3

Boot BLOCK ERASE duration

WED2 300 ms 2, 3

Parameter BLOCK ERASE duration

WED3 300 ms 3

Main BLOCK ERASE duration

WED4 600 ms 3

WE# HIGH to busy status (SR7 = 0)

WB 200 ns 4

VPP hold time from status data valid

VPH 0 ns 3

RP# at VHH or WP# HIGH hold time from status data valid

RHH 0 ns 2

Boot block relock delay time

REL 100 ns 5

NOTE: 1. Measured with VPP = VPPH1 = 5V.

2. RP# should be held at VHH or WP# held HIGH until boot block WRITE or ERASE is complete.

3. WRITE/ERASE times are measured to valid status register data (SR7 = 1).

4. Polling status register before tWB is met may falsely indicate WRITE or ERASE completion.

5.tREL is required to relock boot block after WRITE or ERASE to boot block.

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WORD/BYTE WRITE AND ERASE DURATION CHARACTERISTICS

PARAMETER TYP MAX UNITS NOTES

Boot/parameter BLOCK ERASE time 0.5 7 s 6

Main BLOCK ERASE time 1.5 14 s 6

Main BLOCK WRITE time (byte mode) 1 – s 6, 7, 8

Main BLOCK WRITE time (word mode) 1 – s 6, 7, 8

SPEED-DEPENDENT WRITE/ERASE AC TIMING CHARACTERISTICS AND RECOMMENDED AC OPERATING CONDITIONS: CE#-CONTROLLED WRITES

Commercial Temperature (0°C ≤ TA ≤ +70°C) and Extended Temperature (-40°C ≤ TA ≤ +85°C); VCC = +5V ±10% or +5V ±5%

AC CHARACTERISTICS -6/-8/-8 ET PARAMETER SYMBOL MIN MAX UNITS NOTES

Address setup time to CE# HIGH

AS 50 ns

Address hold time from CE# HIGH

AH 0 ns

Data setup time to CE# HIGH

DS 50 ns

Data hold time from CE# HIGH

DH 0 ns

WE# setup time to CE# LOW

WS 0 ns

WE# hold time from CE# HIGH

WH 0 ns

VPP setup time to CE# HIGH

VPS1 200 ns 1

RP# HIGH to CE# LOW delay

RS 500 ns

RP# at VHH or WP# HIGH setup time to CE# HIGH

RHS 100 ns 2

WRITE duration (WORD or BYTE WRITE)

WED1 6 µs 3

Boot BLOCK ERASE duration

WED2 300 ms 2, 3

Parameter BLOCK ERASE duration

WED3 300 ms 3

Main BLOCK ERASE duration

WED4 600 ms 3

CE# HIGH to busy status (SR7 = 0)

WB 200 ns 4

VPP hold time from status data valid

VPH 0 ns 3

RP# at VHH or WP# HIGH hold time from status data valid

RHH 0 ns 2

Boot block relock delay time

REL 100 ns 5

NOTE: 1. Measured with VPP = VPPH1 = 5V.

2. RP# should be held at VHH or WP# held HIGH until boot block WRITE or ERASE is complete.

3. WRITE/ERASE times are measured to valid status register data (SR7 = 1).

4. Polling status register before tWB is met may falsely indicate WRITE or ERASE completion.

5.tREL is required to relock boot block after WRITE or ERASE to boot block.

6. Typical values measured at TA = +25°C.

7. Assumes no system overhead.

8. Typical WRITE times use checkerboard data pattern.

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SMART 5 BOOT BLOCK FLASH MEMORY

DON’T CARE

WED1/2/3/4

AIN

Status

(SR7=1)

[Unlock boot block]

RHS

VPH

WPH

CMD

RHH

CMD/

Data-in

CMD

WRITE SETUP or

ERASE SETUP input

WRITE or ERASE (block)

address asserted, and WRITE data or ERASE

CONFIRM issued

WRITE or ERASE

executed, status register

checked for completion

Command for next

operation issued

[Unlock boot block]

VPS1

Note 1

Status

(SR7=0)

CE#

A0–A17/(A18)

OE#

DQ0–DQ7/

DQ0–DQ15

WE#

RP#

WP#

PPH

PPLK

[5V VPP]

WRITE/ERASE CYCLE

WE#-CONTROLLED WRITE/ERASE

TIMING PARAMETERS

Commercial Temperature (0°C ≤ TA ≤ +70°C) Extended Temperature (-40°C ≤ TA ≤ +85°C)

-6 -8/-8 ET

SYMBOL MIN MAX MIN MAX UNITS

tWC4

70 80 ns

tWC5

60 – ns

WPH

20 30 ns

WPH

20 – ns

tWP4

50 50 ns

tWP5

50 – ns

AS 50 50 ns

AH 0 0 ns

DS 50 50 ns

DH 0 0 ns

CS 0 0 ns

-6 -8/-8 ET

SYMBOL MIN MAX MIN MAX UNITS

NOTE: 1. Address inputs are “Don’t Care” but must be held stable.

2. If BYTE# is LOW, data and command are 8-bit. If BYTE# is HIGH, data is 16-bit and command is 8-bit (MT28F400B5 only).

3. Either RP# at VHH or WP# HIGH unlocks the boot block.

4. Measurements tested under AC Test Condition 1, VCC = 5V ±10%.

5. Measurements tested under AC Test Condition 2, VCC = 5V ±5%.

CH 0 0 ns

VPS1 200 200 ns

RS 500 500 ns

RHS 100 100 ns

WED1 6 6 µs

WED2 300 300 ms

WED3 300 300 ms

WED4 600 600 ms

WB 200 200 ns

VPH 0 0 ns

RHH 0 0 ns

Page 28

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SMART 5 BOOT BLOCK FLASH MEMORY

DON’T CARE

WED1/2/3/4

Status

(SR7=1)

[Unlock boot block]

RHS

VPH

CPH

CMD

RHH

CMD/

Data-in

CMD

WRITE SETUP or

ERASE SETUP input

WRITE or ERASE (block)

address asserted, and

WRITE data or ERASE

CONFIRM issued

WRITE or ERASE

executed, status register

checked for completion

Command for next

operation issued

[5V VPP]

[Unlock boot block]

VPS1

Note 1

Status

(SR7=0)

WE#

A0–A17/(A18)

OE#

DQ0–DQ7/

DQ0–DQ15

CE#

RP#

WP#

PPH

PPLK

WRITE/ERASE CYCLE

CE#-CONTROLLED WRITE/ERASE

WH 0 0 ns

VPS1 200 200 ns

RS 500 500 ns

RHS 100 100 ns

WED1 6 6 µs

WED2 300 300 ms

WED3 300 300 ms

WED4 600 600 ms

WB 200 200 ns

VPH 0 0 ns

RHH 0 0 ns

TIMING PARAMETERS

Commercial Temperature (0°C ≤ TA ≤ +70°C) Extended Temperature (-40°C ≤ TA ≤ +85°C)

-6 -8/-8 ET

SYMBOL MIN MAX MIN MAX UNITS

tWC4

70 80 ns

tWC5

60 – ns

CPH

20 30 ns

CPH

20 – ns

tCP4

50 50 ns

tCP5

50 – ns

AS 50 50 ns

AH 0 0 ns

DS 50 50 ns

DH 0 0 ns

WS 0 0 ns

-6 -8/-8 ET

SYMBOL MIN MAX MIN MAX UNITS

NOTE: 1. Address inputs are “Don’t Care” but must be held stable.

2. If BYTE# is LOW, data and command are 8-bit. If BYTE# is HIGH, data is 16-bit and command is 8-bit (MT28F400B5 only).

3. Either RP# at VHH or WP# HIGH unlocks the boot block.

4. Measurements tested under AC Test Condition 1, VCC = 5V ±10%.

5. Measurements tested under AC Test Condition 2, VCC = 5V ±5%.

Page 29

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SMART 5 BOOT BLOCK FLASH MEMORY

44-PIN PLASTIC SOP

(600 mil)

.016 (0.40) .010 (0.25)

.066 (1.72)

.020 (0.50) .015 (0.38)

.007 (0.18)

.005 (0.13)

.004 (0.10)

.643 (16.34)

.620 (15.74)

DETAIL A

PIN #1 INDEX

(ROTATED 90 CW)

SEE DETAIL A

GAGE PLANE

.0315 (0.80)

1.113 (28.27)

1.107 (28.12)

.010 (0.25)

.499 (12.68) .493 (12.52)

.030 (0.76)

.106 (2.70) MAX

.050 (1.27)

TYP

NOTE: 1. All dimensions in inches (millimeters)

MAX

or typical where noted.

MIN

2. Package width and length do not include mold protrusion; allowable mold protrusion is .01” per side.

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SMART 5 BOOT BLOCK FLASH MEMORY

40-PIN PLASTIC TSOP I

(10mm x 20mm)

DETAIL A

.721 (18.31)

.780 (19.80)

.397 (10.08)

.010 (0.25)

.0197 (0.50)

.010 (0.25)

.007 (0.18)

SEE DETAIL A

.795 (20.20)

.727 (18.47)

.006 (0.15)

TYP

.005 (0.13)

.391 (9.93)

.024 (0.60) .016 (0.40)

.008 (0.20)

.004 (0.10)

.002 (0.05)

.0315 (0.80)

.047 (1.20)

MAX

20 21

.010 (0.25)

PLANE

GAGE

PIN #1 INDEX

NOTE: 1. All dimensions in inches (millimeters)

MAX

or typical where noted.

MIN

2. Package width and length do not include mold protrusion; allowable mold protrusion is .01” per side.

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SMART 5 BOOT BLOCK FLASH MEMORY

48-PIN PLASTIC TSOP I

(12mm x 20mm)

.047 (1.20) MAX

.005 (0.12)

.007 (0.18)

.006 (0.15)

.010 (0.25)

SEE DETAIL A

.0197 (0.50)

TYP

.780 (19.80)

.727 (18.47)

.721 (18.31)

.795 (20.20)

.475 (12.07)

.002 (0.05)

DETAIL A

.016 (0.40)

.024 (0.60)

.0315 (0.80)

.008 (0.20)

.004 (0.10)

.469 (11.91)

.010 (0.25)

PLANE

GAGE

.010 (0.25)

PIN #1 INDEX

NOTE: 1. All dimensions in inches (millimeters)

MAX

or typical where noted.

MIN

2. Package width and length do not include mold protrusion; allowable mold protrusion is .01” per side.

8000 S. Federal Way, P.O. Box 6, Boise, ID 83707-0006, Tel: 208-368-3900

E-mail: prodmktg@micron.com, Internet: http://www.micron.com, Customer Comment Line: 800-932-4992

Micron and the M logo are registered trademarks and the Micron logo is a trademark of Micron Technology, Inc.

Page 32

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SMART 5 BOOT BLOCK FLASH MEMORY

REVISION HISTORY

Rev. B .........................................................................................................................................................................7/02

• Added process technology information to page 1

Datasheet MT28F400B5WG-8B, MT28F400B5WG-8BET, MT28F400B5WG-8T, MT28F400B5WG-8TET, MT28F400B5WG-6T Datasheet (MICRON)

Specifications and Main Features

Frequently Asked Questions

User Manual