Designed for broadband commercial and industrial applications with
frequencies from 865 to 895 MHz. The high gain and broadband performance
of these devices make them ideal for large -signal, common - source amplifier
applications in 26 volt base station equipment.
• Designed for Maximum Gain and Insertion Phase Flatness
• Excellent Thermal Stability
• Characterized with Series Equivalent Large- Signal Impedance Parameters
• Low Gold Plating Thickness on Leads, 40µ″ Nominal.
RMATI
• RoHS Compliant
• In Tape and Reel. R3 Suffix = 250 Units per 32 mm, 13 inch Reel.
= 1100 mA
DQ
MRF9135LR3
MRF9135LSR3
880 MHz, 135 W, 26 V
LATERAL N- CHANNEL
RF POWER MOSFETs
CASE 465-06, STYLE 1
NI-780
MRF9135LR3
CASE 465A- 06, STYLE 1
NI-780S
MRF9135LSR3
Table 1. Maximum Ratings
RatingSymbolValueUnit
Drain-Source VoltageV
Gate-Source VoltageV
HIVE INF
Total Device Dissipation @ TC = 25°C
Derate above 25°C
Storage Temperature RangeT
Case Operating TemperatureT
Operating Junction TemperatureT
AR
Table 2. Thermal Characteristics
CharacteristicSymbolValue
Thermal Resistance, Junction to CaseR
Table 3. ESD Protection Characteristics
Test ConditionsClass
Human Body Model1 (Minimum)
Machine ModelM2 (Minimum)
Charge Device ModelC7 (Minimum)
1. MTTF calculator available at http://www.freescale.com/rf. Select Tools/Software/Application Software/Calculators to
access the MTTF calculators by product.
DSS
GS
P
stg
θ
D
C
J
JC
- 0.5, +65Vdc
- 0.5, +15Vdc
- 65 to +200°C
298
1.7
150°C
200°C
(1)
0.6°C/W
W
W/°C
Unit
ARCHIVE INFORMATION
Freescale Semiconductor, Inc., 2006, 2008. All rights reserved.
RF Device DataFreescale Semiconductor
MRF9135LR3 MRF9135LSR3
1
Page 2
C
O
O
Table 4. Electrical Characteristics
Characteristic
Off Characteristics
Zero Gate Voltage Drain Leakage Current
(V
= 65 Vdc, VGS = 0 Vdc)
DS
Zero Gate Voltage Drain Leakage Current
= 26 Vdc, VGS = 0 Vdc)
(V
DS
Gate-Source Leakage Current
(V
= 5 Vdc, VDS = 0 Vdc)
GS
On Characteristics
Gate Threshold Voltage
(V
= 10 Vdc, ID = 450 µA)
DS
Gate Quiescent Voltage
(V
= 26 Vdc, ID = 1100 mAdc)
DS
Drain-Source On - Voltage
N
(V
= 10 Vdc, ID = 3 Adc)
GS
Forward Transconductance
(V
= 10 Vdc, ID = 9 Adc)
DS
Dynamic Characteristics
Output Capacitance
(V
= 26 Vdc ± 30 mV(rms)ac @ 1 MHz, VGS = 0 Vdc)
DS
Reverse Transfer Capacitance
(V
= 26 Vdc ± 30 mV(rms)ac @ 1 MHz, VGS = 0 Vdc)
RMATI
HIVE INF
AR
DS
Functional Tests (In Freescale Test Fixture, 50 ohm system) Single - Carrier N- CDMA, 1.2288 MHz Channel Bandwidth Carrier,
PAR = 9.8 dB @ 0.01% Probability on CCDF
f = 865 MHz and 895 MHz; ACPR @ 25 W, 1.23 MHz Bandwidth, 750
kHz Channel Spacing)
Input Return Loss
(V
= 26 Vdc, P
DD
f = 865 MHz and 895 MHz)
= 25 W Avg. N-CDMA, IDQ = 1100 mA,
out
= 25 W Avg. N-CDMA, IDQ = 1100 mA,
out
= 25 W Avg. N-CDMA, IDQ = 1100 mA,
out
= 25 W Avg. N-CDMA, IDQ = 1100 mA,
out
= 25 W Avg. N-CDMA, IDQ = 1100 mA,
out
= 25 W Avg. N-CDMA, IDQ = 1100 mA,
out
= 25 W Avg. N-CDMA, IDQ = 1100 mA,
out
= 25 W Avg. N-CDMA, IDQ = 1100 mA,
out
(TC = 25°C, 50 ohm system unless otherwise noted)
SymbolMinTypMaxUnit
I
DSS
I
DSS
I
GSS
V
GS(th)
V
GS(Q)
V
DS(on)
g
fs
C
oss
C
rss
G
ps
η2225—%
ACPR—-47-45dBc
IRL—- 13.5-9dB
G
ps
η—24—%
ACPR—-46—dBc
IRL—- 12.5—dB
——10µAdc
——1µAdc
——1µAdc
22.84Vdc
3.253.75Vdc
—0.190.4Vdc
—12—S
—109—pF
—4.4—pF
1617.8—dB
—17—dB
ARCHIVE INFORMATION
MRF9135LR3 MRF9135LSR3
2
RF Device Data
Freescale Semiconductor
Page 3
C
O
O
V
GG
+
C9C8C7
B2
B1
V
+++
L1
C18C20 C21
C19
C22L2
+
C23
DD
C11
DUT
C10
Z12
Z11Z10
C13
C12
Z110.105″ x 0.630″ Microstrip
Z120.145″ x 0.630″ Microstrip
Z130.200″ x 0.630″ x 0.220″ Taper
Z140.180″ x 0.220″ Microstrip
Z150.110″ x 0.220″ Microstrip
Z160.200″ x 0.220″ Microstrip
Z170.900″ x 0.080″ Microstrip
Z180.360″ x 0.080″ Microstrip
Z190.410″ x 0.080″ Microstrip
PCBArlon GX- 0300 - 55 - 22, 0.030″
Z15
C14
Z16Z13 Z14Z17Z18Z19
C17
C16C15
, εr = 2.55
INPUT
N
RF
Z1
Z2
C1
Z4
Z3Z8Z9
C2
Z10.430″ x 0.080″ Microstrip
Z20.430″ x 0.080″ Microstrip
Z30.800″ x 0.080″ Microstrip
Z40.200″ x 0.220″ Microstrip
Z50.110″ x 0.220″ Microstrip
Z60.175″ x 0.220″ Microstrip
Z70.200″ x 0.220″ x 0.630″ Taper
Z80.250″ x 0.630″ Microstrip
Z90.050″ x 0.630″ Microstrip
Z100.050″ x 0.630″ Microstrip
Z5Z6Z7
C3
C4
C5
C6
Figure 1. 880 MHz Test Circuit Schematic
RMATI
Table 5. 880 MHz Test Circuit Component Designations and Values
C9, C20, C21, C2210 µF, 35 V Tantalum CapacitorsT491D106K035ASKemet
HIVE INF
C10, C11, C12, C137.5 pF Chip Capacitors100B7R5JP 500XAT C
C1411 pF Chip Capacitor100B110JP 500XAT C
C190.56 µF, 50 V Chip CapacitorC1825C564K5RA7800Kemet
C23470 µF, 63 V Electrolytic CapacitorSME63VB471M12X25LLUnited Chemi- Con
L1, L212.5 nH Coilcraft inductorsA04T-5Coilcraft
AR
WB1, WB210 mil Brass Shim (0.205 x 0.530)RF- Design LabRF- Design Lab
RF
OUTPUT
ARCHIVE INFORMATION
RF Device Data
Freescale Semiconductor
MRF9135LR3 MRF9135LSR3
3
Page 4
C
O
O
C9B1
B2
C23
C8
C20 C21 C22
C19
N
RMATI
C7
L1
C1
Freescale has begun the transition of marking Printed Circuit Boards (PCBs) with the Freescale Semiconductor
signature/logo. PCBs may have either Motorola or Freescale markings during the transition period. These changes will have
no impact on form, fit or function of the current product.
C2
C3
C4
Figure 2. 880 MHz Test Circuit Component Layout
C5
WB1WB2
C6
C10
C12
CUT OUT AREA
C11
C13
C14
C18
L2
C15
C16
MRF9135L
900 MHz
Rev−02
C17
HIVE INF
AR
MRF9135LR3 MRF9135LSR3
4
ARCHIVE INFORMATION
RF Device Data
Freescale Semiconductor
Page 5
C
O
O
TYPICAL CHARACTERISTICS
N
RMATI
19
18.5
18
17.5
IDQ = 1650 mA
1320 mA
19
1830
1725
1620
15−20
14−30
, POWER GAIN (dB)
ps
13−40
G
12−50
11
860
G
ps
η
D
IRL
ACPR
VDD = 26 Vdc
P
= 25 W (Avg.)
out
= 1100 mA
I
DQ
N−CDMA IS−95 Pilot, Sync, Paging
Traffic Codes 8 through 13
f, FREQUENCY (MHz)
Figure 3. Class AB Broadband Circuit
Performance
VDD = 26 Vdc
f1 = 880 MHz, f2 = 880.1 MHz
VDD = 26 Vdc
−20
f1 = 880 MHz, f2 = 880.1 MHz
−30
35
, DRAIN
D
η
EFFICIENCY (%)
−10
−12
−14
ACPR (dBc)
−16
−60
900865870875880885890895
INPUT RETURN LOSS (dB)IRL,
−18
1100 mA
17
, POWER GAIN (dB)
ps
16.5
15.5
880 mA
16
1
P
, OUTPUT POWER (WATTS) PEP
out
G
Figure 4. Power Gain versus Output Power
HIVE INF
−10
VDD = 26 Vdc
−20
I
= 1100 mA
DQ
AR
INTERMODULATION DISTORTION (dBc)IMD,
f1 = 880 MHz, f2 = 880.1 MHz
−30
−40
3rd Order
−50
−60
−70
−80
1
5th Order
7th Order
, OUTPUT POWER (WATTS) PEP
P
out
Figure 6. Intermodulation Distortion Products
versus Output Power
IDQ = 880 mA
−40
1650 mA
−50
INTERMODULATION DISTORTION (dBc)IMD,
−60
10
100
1
P
, OUTPUT POWER (WATTS) PEP
out
1320 mA
1100 mA
10
100
Figure 5. Intermodulation Distortion versus
Output Power
22
2050
1840
G
ps
1630
1420
, POWER GAIN (dB)
ps
G
1210
η
D
10
10
100
1
, OUTPUT POWER (WATTS) AVG.
P
out
10
VDD = 26 Vdc
I
= 1100 mA
DQ
f1 = 880 MHz
100
60
ARCHIVE INFORMATION
, DRAIN EFFICIENCY (%)
D
η
0
Figure 7. Power Gain and Efficiency versus
Output Power
RF Device Data
Freescale Semiconductor
MRF9135LR3 MRF9135LSR3
5
Page 6
C
O
O
TYPICAL CHARACTERISTICS
N
RMATI
HIVE INF
20
1840
1620
140
12−20
, POWER GAIN (dB)
ps
G
10−40
8
1
20
1840
1620
140
12−20
, POWER GAIN (dB)
ps
10−40
G
8−60
6
11
10
)
2
G
ps
η
D
VDD = 26 Vdc
I
= 1100 mA
DQ
f1 = 880 MHz, f2 = 880.1 MHz
IMD
10
, OUTPUT POWER (WATTS) PEP
P
out
Figure 8. Power Gain, Efficiency and IMD
versus Output Power
G
ps
η
D
VDD = 26 Vdc, IDQ = 1100 mA
f = 880 MHz
N−CDMA IS−95 Pilot, Sync, Paging,
ACPR
750 kHz
ALT
1.98 MHz
1
Figure 9. N- CDMA Performance Output Power
Traffic Codes 8 through 13
10
P
, OUTPUT POWER (WATTS) AVG.
out
versus Gain, ACPR, Efficiency
100
60
, DRAIN EFFICIENCY (%)
D
η
−60
60
−80
IMD, INTERMODULATION DISTORTION (dBc)
, DRAIN EFFICIENCY (%)
D
η
ACPR, ADJACENT CHANNEL POWER RATIO (dBc)
AR
MRF9135LR3 MRF9135LSR3
6
10
10
9
10
MTTF FACTOR (HOURS x AMPS
8
10
90
100 110130150170200
This above graph displays calculated MTTF in hours x ampere
drain current. Life tests at elevated temperatures have correlated to
better than ±10% of the theoretical prediction for metal failure. Divide
MTTF factor by I
Figure 10. MTTF Factor versus Junction Temperature
Through 13) 1.2288 MHz Channel Bandwidth
Carriers. ACPR Measured in 30 kHz Bandwidth @
±750 kHz Offset. ALT1 Measured in 30 kHz
Bandwidth @ ±1.98 MHz Offset. PAR = 9.8 dB @
0.01% Probability on CCDF.
0
2468
PEAK−TO−AVERAGE (dB)
Figure 11. Single- Carrier CCDF N -CDMA
−10
−20
−30
−40
−50
−60
(dB)
−70
−80
−90
10
−100
−110
−ALT1 in 30 kHz
Integrated BW
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−ACPR in 30 kHz
Integrated BW
1.2288 MHz
Channel BW
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f, FREQUENCY (MHz)
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+ACPR in 30 kHz
Integrated BW
+ALT1 in 30 kHz
Integrated BW
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2.90.72.21.50−0.7−1.5−2.2−2.9−3.63.6
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Figure 12. Single- Carrier N - CDMA Spectrum
HIVE INF
AR
RF Device Data
Freescale Semiconductor
ARCHIVE INFORMATION
MRF9135LR3 MRF9135LSR3
7
Page 8
C
O
O
N
RMATI
Zo = 2 Ω
V
= 26 V, IDQ =1100 mA, P
DD
f
MHz
Z
source
f = 895 MHz
Z
source
f = 865 MHz
f = 895 MHz
Z
Z
load
load
Ω
f = 865 MHz
= 25 W Avg.
out
Ω
HIVE INF
AR
865
880
895
Z
= Test circuit impedance as measured from
source
Z
= Test circuit impedance as measured
load
Input
Matching
Network
Figure 13. Series Equivalent Source and Load Impedance
1.15 + j0.3
1.25 + j0.5
1.35 + j0.75
gate to ground.
from drain to ground.
Device
Under
Test
Z
source
1.17 - j0.24
1.22 - j0.1
1.32 - j0.07
Z
load
Output
Matching
Network
ARCHIVE INFORMATION
MRF9135LR3 MRF9135LSR3
8
RF Device Data
Freescale Semiconductor
Page 9
C
O
O
N
NOTES
RMATI
HIVE INF
AR
ARCHIVE INFORMATION
RF Device Data
Freescale Semiconductor
MRF9135LR3 MRF9135LSR3
9
Page 10
C
O
O
N
NOTES
RMATI
HIVE INF
AR
ARCHIVE INFORMATION
MRF9135LR3 MRF9135LSR3
10
RF Device Data
Freescale Semiconductor
Page 11
C
O
O
PACKAGE DIMENSIONS
N
RMATI
B
B
(FLANGE)
G
1
2
D
M
bbbB
M
A
T
M
M
N
H
E
AA
(FLANGE)
Q2X
bbbB
3
K
(INSULATOR)
M
bbbB
(LID)
cccB
A
T
M
A
T
C
SEATING
T
PLANE
M
M
M
M
A
T
M
M
CASE 465- 06
ISSUE G
NI- 780
MRF9135LR3
M
M
cccB
aaaB
A
T
M
A
T
(LID)
R
M
(INSULATOR)
S
M
NOTES:
1. DIMENSIONING AND TOLERANCING PER ANSI
Y14.5M−1994.
2. CONTROLLING DIMENSION: INCH.
3. DELETED
4. DIMENSION H IS MEASURED 0.030 (0.762) AWAY
FROM PACKAGE BODY.
DIM MINMAXMINMAX
A 1.335 1.345 33.91 34.16
B 0.380 0.3909.659.91
C 0.125 0.1703.184.32
D 0.495 0.505 12.57 12.83
M
M
F
E 0.035 0.0450.891.14
F 0.003 0.0060.080.15
G1.100 BSC27.94 BSC
H 0.057 0.0671.451.70
K 0.170 0.2104.325.33
M 0.774 0.786 19.66 19.96
N 0.772 0.788 19.60 20.00
Q.118.1383.003.51
R 0.365 0.3759.279.53
1. DIMENSIONING AND TOLERANCING PER ANSI
Y14.5M−1994.
2. CONTROLLING DIMENSION: INCH.
3. DELETED
4. DIMENSION H IS MEASURED 0.030 (0.762) AWAY
FROM PACKAGE BODY.
DIM MINMAXMIN MAX
A 0.805 0.815 20.45 20.70
B 0.380 0.3909.659.91
C 0.125 0.1703.184.32
D 0.495 0.505 12.57 12.83
(LID)
M
A
T
A
T
M
M
M
M
cccB
M
aaaB
R
M
(INSULATOR)
S
M
M
M
A
T
A
T
F
CASE 465A- 06
E 0.035 0.0450.891.14
F 0.003 0.0060.080.15
H 0.057 0.0671.451.70
K 0.170 0.2104.325.33
M 0.774 0.786 19.61 20.02
N 0.772 0.788 19.61 20.02
R 0.365 0.3759.279.53
S 0.365 0.3759.279.52
U−−− 0.040−−−1.02
Z−−− 0.030−−−0.76
aaa0.005 REF0.127 REF
bbb0.010 REF0.254 REF
ccc0.015 REF0.381 REF
STYLE 1:
PIN 1. DRAIN
2. GATE
5. SOURCE
MILLIMETERSINCHES
ARCHIVE INFORMATION
ISSUE H
NI- 780S
MRF9135LSR3
RF Device Data
Freescale Semiconductor
MRF9135LR3 MRF9135LSR3
11
Page 12
C
O
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ARCHIVE INFORMATION
MRF9135LR3 MRF9135LSR3
Document Number: MRF9135L
Rev. 8, 5/2006
12
RF Device Data
Freescale Semiconductor
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